CN117490858A - Infrared detector spectrum testing device and method - Google Patents
Infrared detector spectrum testing device and method Download PDFInfo
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
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Abstract
The invention provides an infrared detector spectrum testing device and method, and relates to the field of infrared technology, wherein the device comprises: the high-temperature blackbody and the monochromator are optionally provided with a detected detector or a standard detector, and the upper computer is used for calculating and imaging a relative spectral response curve. The method comprises the following steps: the detected detector is configured to operate before the light outlet of the monochromator; controlling an incident light source to be in a single wave band, and recording spectral response; repeatedly changing the wavelength of the light source for multiple times, and repeatedly recording to obtain a spectral response curve of the detector to be detected; the standard detector is configured to operate before the light outlet hole of the monochromator; repeating the steps to obtain a spectrum response curve of the standard detector; obtaining a relative spectral response curve; obtaining the performance parameters of the detected detector. The infrared detector spectrum testing device and method have universality, are flexible and efficient, and can improve testing efficiency.
Description
Technical Field
The invention relates to the technical field of infrared, in particular to an infrared detector spectrum testing device and method.
Background
An infrared detector is a device capable of sensing and measuring infrared radiation, and can convert infrared radiation into a signal to be output by taking infrared light as a sensing object. The performance test of the digital infrared detector is an important link in the production process, the performance, the working band, the sensitivity, the detection range, the resolution, the characteristic analysis capability, the signal-to-noise ratio, the detection limit information and the like of the detector can be evaluated through the spectrum test, and the matching of an optical system can be optimized, so that the reliability and the repeatability of data can be ensured.
The conventional analog infrared detector has the advantages that the output is analog voltage, and the technology is relatively mature, so that common spectrum testing equipment exists in the market for testing.
In recent years, infrared detectors are widely applied in various fields, and with the continuous development and progress of detector technology, novel digital infrared detectors with digital-to-analog conversion modules integrated on a readout circuit appear: the digital signal processing unit is used for carrying out digital conversion on the preprocessed signals, further analysis and processing are carried out by using a digital signal processing algorithm, and finally digital signals are generated and output.
The position difference of an ADC (analog-digital converter) of the digital infrared detector and different signal output modes, such as parallel multipath output of a pixel-level digital output circuit and differential signal output used by column-level digitization, bring difficulty to the universality and the precision of an infrared spectrum test system and a test method.
For a digitized infrared detector, the ADC may be at the pixel level or at the column level. At the pixel level, each pixel has its own ADC, which allows each pixel to independently digitize its received optical signal. Such a configuration is typically used for high resolution and high sensitivity applications. While at the column level, an entire column of pixels shares one ADC, which makes signal processing more efficient, but may limit the resolution and sensitivity of the detector. Due to the difference in ADC locations, a test system designed for a particular type of digitized infrared detector may not be suitable for another type.
Furthermore, pixel-level digitized output circuitry typically employs parallel multiplexing, which means that multiple pixels can output digitized signals simultaneously. Such parallel processing may increase data processing speed, but may require more complex circuit design and synchronization issues; column level digitization typically uses differential signal outputs, which may enhance the immunity of the signal, but may require more complex signal processing and interpretation.
Because of the above-mentioned differences, existing infrared spectrum test systems and test methods for infrared detectors often require design and optimization for specific types of infrared detectors, which limits their versatility and also increases the complexity of developing and maintaining these test systems.
Disclosure of Invention
In order to overcome the defects of the infrared spectrum testing system and the infrared spectrum testing method of the infrared detector, the invention aims to provide the infrared detector spectrum testing device and the infrared detector spectrum testing method which meet the testing requirements of infrared detectors of different types.
For the infrared detector spectrum testing device, the infrared detector spectrum testing device for solving the technical problems comprises:
a high temperature blackbody for providing an infrared radiation spectrum for infrared detector spectral testing;
the monochromator is used for generating monochromatic light and analyzing and measuring the characteristics of the spectrum;
a detected detector or a standard detector is optionally configured between the high-temperature blackbody and the monochromator;
the measured detector and the standard detector are configured to be connected with a host computer, and the host computer is used for calculating and displaying a relative spectral response curve of the measured detector and the spectral response curve of the standard detector.
As an improvement of the infrared detector spectrum testing device, the standard detector is a non-selective detector with a known spectrum, and is connected with a phase-locked amplifier which is used for reading a response signal of the standard detector when calibrating the spectrum response of the standard detector.
As an improvement of the infrared detector spectrum testing device, a chopper is connected between the high-temperature blackbody and the monochromator, when the standard detector is configured between the high-temperature blackbody and the monochromator, the chopper is opened, and when the detected detector is configured between the high-temperature blackbody and the monochromator, the chopper is closed.
As an improvement of the infrared detector spectrum testing device, the upper computer is in communication connection with the monochromator, the monochromator is connected with the filter wheel, and the upper computer controls the monochromator and the filter wheel to emit infrared light with specified wavelength.
As an improvement of the infrared detector spectrum testing device, the upper computer comprises an acquisition card for acquiring the output signal of the infrared detector.
Compared with the related art, the infrared detector spectrum testing device has the following characteristics: firstly, the spectrum test of the analog infrared detector can be met, and the test requirements of different types of digital infrared detectors can be met, namely the digital infrared detector has universality. And secondly, the testing precision is ensured, and the reliability of the testing result is ensured. Finally, the testing mode and the testing process are flexible and efficient, and the testing efficiency can be improved.
For the infrared detector spectrum testing method, the infrared detector spectrum testing device is adopted by the infrared detector spectrum testing method for solving the technical problems, and comprises the following steps:
the detected detector is configured to operate before the light outlet of the monochromator;
controlling an incident light source to be a single wave band, and recording the spectral response of a detected detector to the light source;
repeatedly changing the wavelength of the light source for multiple times, repeatedly recording the response of the detected detector to the light source, and obtaining a spectral response curve of the detected detector within a set wavelength range;
the standard detector is configured to operate before the light outlet hole of the monochromator;
controlling an incident light source to be in a single wave band, and recording the spectral response of a standard detector to the light source;
repeatedly changing the wavelength of the light source for multiple times, repeatedly recording the response of the detected detector to the light source, and obtaining a spectral response curve of the standard detector within a set wavelength range;
comparing the response curve of the detected detector with the spectrum response curve of the standard detector to obtain a relative spectrum response curve;
and obtaining the performance parameters of the detected detector according to the relative spectrum curve.
As an improvement of the infrared detector spectrum testing method, the spectral response of the detected detector to the light source is obtained by differencing the values of the front and rear output response digital signals of the single-band light source.
As an improvement of the infrared detector spectrum testing method, the spectrum response of the standard detector to the light source is obtained by differencing the values of the front and rear output response digital signals of the single-band light source.
As an improvement to the infrared detector spectral test method, the relative spectral response is obtained by the following formula:
wherein R is test(λ) Indicating the relative spectral response; v (V) test(λ) Representing the absolute spectral response of the detector under test; p (P) (λ) Representing the infrared radiation power of a standard detector at lambda wavelength; r is R std(λ) The spectral response rate of the standard detector is shown as follows; v (V) std(λ) Representing the response of a standard detector.
As an improvement of the infrared detector spectrum testing method, the wavelength range of the set infrared light comprises all response intervals of the corresponding detector.
Compared with the related art, the infrared spectrum testing method has the advantages of high stability, accurate testing, high compatibility and the like when the spectrum response test of the digital infrared detector is realized through the combination of the acquisition configuration of the output of the digital infrared detector and the spectrum testing method of the analog detector, and can meet the spectrum testing work of various digital infrared detectors with different models or analog infrared detectors with output analog-digital conversion circuit boards.
Drawings
FIG. 1 is a schematic diagram of a specific operation mode of an infrared detector according to an embodiment of the present invention;
FIG. 2 is a block diagram of an infrared detector spectrum testing apparatus according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a host computer control according to an embodiment of the present invention;
fig. 4 is a flowchart of a method for testing a spectrum of an infrared detector according to an embodiment of the invention.
Detailed Description
In order to further describe the technical means and effects adopted by the present invention for achieving the intended purpose, the following detailed description of the present invention is given with reference to the accompanying drawings and preferred embodiments.
The steps of the method flow described in the specification and the flow chart shown in the drawings of the specification are not necessarily strictly executed according to step numbers, and the execution order of the steps of the method may be changed. Moreover, some steps may be omitted, multiple steps may be combined into one step to be performed, and/or one step may be decomposed into multiple steps to be performed.
An infrared detector is a device capable of sensing and measuring infrared radiation, and can convert infrared radiation into a signal to be output by taking infrared light as a sensing object. In recent years, infrared detectors are widely applied in various fields, and with the continuous development and progress of detector technology, novel digital infrared detectors with digital-to-analog conversion modules integrated on a readout circuit appear: the digital signal processing unit is used for carrying out digital conversion on the preprocessed signals, further analysis and processing are carried out by using a digital signal processing algorithm, and finally digital signals are generated and output.
The performance test of the digital infrared detector is an important ring in the production process of the digital infrared focal plane detector, and is also a key step for evaluating whether the digital infrared detector can be normally used. The spectrum test is an indispensable part of the performance test of the infrared detector, and through the test evaluation of the spectrum response of the digital infrared detector, the performance of the detector during the period can be evaluated, the working band of the detector is determined, the subsequent sensitivity and the detection range are optimized, the resolution and the characteristic analysis capability of the detector are evaluated, the signal-to-noise ratio and the detection limit information of the detector are evaluated, the matching of an optical system is optimized, the reliability of data is ensured, and the repeatability and the comparability of the data are ensured.
The spectral response is an index for measuring the response degree of the photoelectric conversion device to light with different wavelengths, and the principle is based on the photoelectric effect. The digital infrared detector is similar to the traditional analog infrared detector in principle, and the photoelectric effect is utilized to convert the light energy of infrared light into electronic energy. When infrared light strikes the PN junction or active layer of the infrared detector, the light energy is absorbed, creating electron-hole pairs that, when separated by an applied electric field, produce an electrical current, known as photocurrent. The magnitude of the photocurrent is directly related to the absorption of infrared light by the detector when the incident light energy is the same. The infrared detector adopts a semiconductor material with a specific energy band structure, the material has different absorption characteristics for infrared light in different spectral ranges, the generated photo-generated current is different in magnitude, the digital signal code value generated after being read by the reading circuit is also different, and the spectral response of the detector can be judged according to the signal code value, namely the response magnitude.
Compared with the traditional infrared detector, the working mode of the digital infrared detector is different, referring to fig. 1, fig. 1 is a schematic diagram of a specific working mode of the digital infrared detector according to an embodiment of the present invention, and as shown in the figure, the working mode of the digital infrared detector can be summarized as the following steps:
and (3) target detection: the sensor chip of the digitized infrared detector is capable of sensing infrared radiation from a target, such as an object or a human body.
Signal conversion: the sensor chip converts the infrared radiation into an electrical signal. In this process, the magnitude of the electrical signal is proportional to the intensity of the infrared radiation.
And (3) signal processing: the electric signal is processed by the reading circuit, amplified, filtered and the like so as to facilitate the subsequent data processing.
And (3) data acquisition: the processed electrical signals are fed into a data acquisition system which converts them to digital signals by means of a digitizer (e.g. ADC).
And (3) data processing: the digital signal is fed into a processor or computer for processing. By analyzing these data, the position, shape, size, etc. characteristics of the target can be determined.
Outputting a result: the processed data is output to a display or other device for viewing and analysis by a user.
In a digitized infrared detector, bias voltage and timing signals are critical control signals. The bias voltage is used for setting a reference working point of the detector, and the time sequence signal is used for controlling the operation sequence and the working state of the detector at each time point. These control signals are generated by the drive circuit board and sent to the detector chip to ensure that the detector is functioning properly.
The ADC position difference of the digital infrared detector and different signal output modes, such as parallel multiplexing output of a pixel-level digital output circuit and differential signal output used by column-level digital, bring difficulty to the universality and the accuracy of an infrared spectrum test system and a test method.
For a digitized infrared detector, the ADC may be at the pixel level or at the column level. At the pixel level, each pixel has its own ADC, which allows each pixel to independently digitize its received optical signal. Such a configuration is typically used for high resolution and high sensitivity applications. While at the column level, an entire column of pixels shares one ADC, which makes signal processing more efficient, but may limit the resolution and sensitivity of the detector. Due to the difference in ADC locations, a test system designed for a particular type of digitized infrared detector may not be suitable for another type.
Furthermore, pixel-level digitized output circuitry typically employs parallel multiplexing, which means that multiple pixels can output digitized signals simultaneously. Such parallel processing may increase data processing speed, but may require more complex circuit design and synchronization issues; column level digitization typically uses differential signal outputs, which may enhance the immunity of the signal, but may require more complex signal processing and interpretation.
Because of the above-mentioned differences, existing infrared spectrum test systems and test methods for infrared detectors often require design and optimization for specific types of infrared detectors, which limits their versatility and also increases the complexity of developing and maintaining these test systems.
In order to meet the spectrum test requirement of the digital infrared detector and ensure the production task of the digital infrared detector, a matched digital infrared spectrum test device needs to be designed, and a corresponding digital infrared spectrum test method is developed.
Referring to fig. 2, regarding a digital infrared spectrum testing device, the digital infrared spectrum testing device provided by the embodiment of the invention includes:
the infrared radiation spectrum testing device comprises a high-temperature blackbody, wherein the main function of the high-temperature blackbody is to provide an infrared radiation spectrum for the spectrum testing of the digital infrared detector in a high-temperature mode.
The high-temperature blackbody is connected with a chopper, and the chopper plays a role in modulating light beams.
The chopper is connected with a filter wheel and a monochromator, and the monochromator mainly aims at generating monochromatic light and analyzing light and measuring characteristics. When the infrared focal plane detector is in specific implementation, the filter wheel and the monochromator are matched for use, and the filter wheel is arranged between the infrared focal plane detector window and the blackbody radiation surface, so that the influence of infrared light of other wave bands on a test wave band can be controlled and reduced; the monochromator has the main function of generating monochromatic light.
The monochromator receives infrared radiation generated by the black body and then carries out single-wavelength light splitting to provide the infrared radiation to the detector by switching the grating and adjusting the internal slit, and in the implementation, a standard detector and a detected detector are optionally arranged between the high-temperature black body and the monochromator. The monochromator receives infrared radiation generated by the blackbody and then performs single-wavelength light splitting to provide the infrared radiation to the detector to be detected, so that spectrum test can be completed; the monochromator receives infrared radiation generated by the blackbody and then performs single-wavelength light splitting to provide the infrared radiation for a standard detector, and the single-wavelength light splitting detector is used for detecting the infrared light intensity of the monochromator under a certain wavelength.
In this embodiment, the standard detector is a detector with a known spectrum, and the detector is a non-selective detector with the same response rate in any spectrum, so that the detector can be used for detecting the infrared light intensity of the monochromator under a certain wavelength, and the normalization processing of the spectrum curve of the detected detector can be ensured.
The standard detector is connected with a phase-locked amplifier, and the phase-locked amplifier is mainly used for accurately reading response signals of the standard detector when calibrating spectral responses of the standard detector; the detector to be detected is connected with a detector driving circuit, and the detector driving circuit is used for providing an adaptive power supply voltage, an adaptive bias voltage and an adaptive time sequence signal for the digital infrared detector, so that the digital infrared detector can work stably and generates a digital output signal.
The phase-locked amplifier and the detected detector are selectively connected with the upper computer and the acquisition card, and the acquisition card acquires output signals of the digital infrared detector and inputs the signals into the upper computer. In this embodiment, the acquisition card is a camera-link acquisition card, and is installed in an upper computer, the camera-link acquisition card with a standard transmission protocol acquires an output signal of the digital infrared detector, outputs the digital signal of the digital infrared detector to the inside of the computer for decoding, and displays a digital image in the digital infrared spectrum acquisition software of the upper computer according to a frame, a line and an acquisition trigger signal of the camera-link acquisition card.
Besides the imaging function, the upper computer is also used for sending out control signals to command the monochromator and the filter wheel to send out infrared light with specified wavelength, placing specific spectrum test points, drawing a spectrum response curve, normalizing and outputting front cut-off wavelength, rear cut-off wavelength, G factor and other functions, and particularly as shown in fig. 3, fig. 3 is an upper computer control schematic diagram according to an embodiment of the invention.
In the implementation process, referring to fig. 2-3, the digitized infrared detector operates at a specified operating temperature, and after providing appropriate power supply voltage, bias current and time sequence signals, the device is excited by photons in the infrared light band corresponding to the material to generate current. The digital readout circuit converts the current into a digital signal and outputs the digital signal from the output pin of the detector, so that the response of the detector under the infrared light of the wave band can be obtained by controlling the light source of the incident digital infrared detector to be of a single wave band and then differencing the numerical value of the response digital signal of the emitted single wave band light source before and after the emission of the single wave band light source.
The response in a wavelength range can be counted by continuously slightly changing the wavelength of an incident single-band light source, recording the response difference value and drawing a curve graph, so that after the wavelength range of infrared light contains all response intervals of the detector, the response curve is compared with the spectral response value of a standard detector, and the relative spectral response of the detector to be detected can be calculated, thereby obtaining front and rear cut-off, wavelength range and G factor information.
The spectrum testing device of the digital infrared detector has the following characteristics: firstly, the spectrum test of the analog infrared detector can be met, and the test requirements of different types of digital infrared detectors can be met, namely the digital infrared detector has universality. And secondly, the testing precision is ensured, and the reliability of the testing result is ensured. Finally, the testing mode and the testing process are flexible and efficient, and the testing efficiency can be improved.
Referring to fig. 4, regarding a digital infrared spectrum testing method, an embodiment of the present invention provides a digital infrared spectrum testing method based on a digital infrared spectrum testing device, where the method includes:
s100, configuring the detected detector to operate the detector before the light outlet of the monochromator. In this step, the digitized infrared detector is operated at a specified operating temperature and appropriate supply voltage, bias current and timing signals are provided.
S200, controlling the incident light source to be a single wave band, and recording the response of the detector to the light source. In the step, the light source of the incident digital infrared detector is controlled to be in a single wave band, and then the numerical value of the response digital signal output before and after the emission of the detector to the single wave band light source is recorded.
In particular, the method for calculating the response of the detector under the infrared light of the wave band is to make the numerical value of the response digital signal output by the single wave band light source before and after. The digital readout circuit converts the current into digital signals and outputs the digital signals from the output pin of the detector, so that the response of the detector under the infrared light of the wave band can be obtained by controlling the light source of the incident digital infrared detector to be of a single wave band and then differencing the numerical values of the response digital signals of the front and back output of the light source of the single wave band emitted by the light source.
S300, changing the wavelength of the light source for a plurality of times, and repeating the step S200 to obtain a spectral response curve of the detector to be detected within a set wavelength range. By continuously slightly changing the wavelength of the incident single-band light source, recording the response difference and plotting a curve graph, the response in a wavelength range can be counted, and the wavelength range of the infrared light is ensured to contain all the response intervals of the detector.
S400, the standard detector is configured to operate before the light outlet of the monochromator. Giving appropriate parameters such as voltage, current, etc.
S500, repeating the steps S200-S300 to obtain the response of the standard detector in the set wavelength range.
S600, comparing the response curve of the detected detector with the spectrum response curve of the standard detector to obtain a relative spectrum response curve.
In this step, let the spectral response of the standard detector itself be R std(λ) The response of the standard detector obtained by the test is V std(λ) The curve can be used to calculate the infrared radiation power P at lambda wavelength (λ) :
For the device, when the cavity type blackbody is at the same temperature and the wavelengths are the same, the infrared radiation power P λ Should be identical. Thus, let the absolute spectral response of the detector under test be V test(λ) The relative spectral response is R test(λ) It is also affected by the infrared radiation power of the device, and therefore:
in addition, the calculated relative spectral response is normalized, and the response peak value of the detector in the wave band is set as R max Normalized relative spectral response R of final output out(λ) The method comprises the following steps:
and S700, obtaining information such as front and back cut-off wavelengths, wavelength ranges, G factors and the like according to the relative spectral response curve.
The following is an exemplary description of a long-wave very high-sensitivity pixel-level digital infrared detector, and the digital infrared spectrum testing method in the embodiment of the invention specifically includes the following steps:
A. the temperature of the high-temperature blackbody is set to be 1000 ℃, and a digital infrared detector to be detected is arranged in front of a light outlet hole of a monochromator, and a detector driving circuit is loaded to enable the detector to work normally. And the detector is connected with the camera-link acquisition card through a cable, and an image is acquired by the upper computer.
B. The wavelength of the output light of the monochromator is set to be the peak wavelength of the detected detector by using the software of the upper computer, and the detected digital infrared detector is aligned to the light outlet of the monochromator, so that the bright spots are generated on the output image of the detector under the wavelength.
C. Selecting a test point in spectrum acquisition software, setting the wavelength range to 2000-6000nm, scanning the spectrum acquisition software at 50nm intervals for 2000ms, and clicking a spectrum acquisition button to wait for the test to be completed. After the test is finished, a spectrum curve with the abscissa being wavelength and the ordinate being the response value is drawn on the test software;
D. closing a driving circuit of the detected detector, taking down the detector from the front of the light outlet of the monochromator, placing a standard detector at the light outlet of the monochromator and fixing the standard detector by using a clamp;
E. opening a lock-in amplifier, opening a chopper controller switch arranged in front of the monochromator, and setting the chopper frequency to be 10Hz;
F. clicking the standard detector spectrum test software of the upper computer, and automatically collecting the spectrum response of the standard detector by the software. After the test is finished, a standard spectrum curve with the abscissa being wavelength and the ordinate being the response value is drawn on the test software;
G. the relative spectral response curve, front and back cut-off and G factor of the detected detector are directly calculated by using the relative spectral response calculation function of the spectral test software in the upper computer, so that infrared spectrum test is realized.
The digital infrared spectrum testing method provided by the embodiment of the invention combines the acquisition configuration of the output of the digital infrared detector and the analog detector spectrum testing method, so that the digital infrared detector spectrum response testing is realized, and meanwhile, the digital infrared spectrum testing method has the advantages of high stability, accurate testing, high compatibility and the like, and can meet the spectrum testing work of various digital infrared detectors with different models or analog infrared detectors with output analog-digital conversion circuit boards.
While the invention has been described in connection with specific embodiments thereof, it is to be understood that these drawings are included in the spirit and scope of the invention, it is not to be limited thereto.
Claims (10)
1. An infrared detector spectrum testing device, comprising:
a high temperature blackbody for providing an infrared radiation spectrum for infrared detector spectral testing;
the monochromator is used for generating monochromatic light and analyzing and measuring the characteristics of the spectrum;
a detected detector or a standard detector is optionally configured between the high-temperature blackbody and the monochromator;
the measured detector and the standard detector are configured to be connected with a host computer, and the host computer is used for calculating and displaying a relative spectral response curve of the measured detector and the spectral response curve of the standard detector.
2. The infrared detector spectrum testing apparatus according to claim 1, wherein,
the standard detector is a known spectrum non-selective detector, and is connected with a phase-locked amplifier which is used for reading a response signal of the standard detector when the spectrum response of the standard detector is calibrated.
3. The infrared detector spectrum testing apparatus according to claim 1, wherein,
and a chopper is connected between the high-temperature blackbody and the monochromator, and is opened when a standard detector is arranged between the high-temperature blackbody and the monochromator, and is closed when a detected detector is arranged between the high-temperature blackbody and the monochromator.
4. The infrared detector spectrum testing apparatus according to claim 1, wherein,
the upper computer is in communication connection with the monochromator, the monochromator is connected with a filter wheel, and the upper computer controls the monochromator and the filter wheel to emit infrared light with specified wavelength.
5. The infrared detector spectrum testing apparatus according to claim 1, wherein,
the upper computer comprises an acquisition card for acquiring output signals of the infrared detector.
6. An infrared detector spectrum testing method, characterized in that an infrared detector spectrum testing device as claimed in claims 1-6 is used, comprising the steps of:
the detected detector is configured to operate before the light outlet of the monochromator;
controlling an incident light source to be a single wave band, and recording the spectral response of a detected detector to the light source;
repeatedly changing the wavelength of the light source for multiple times, repeatedly recording the response of the detected detector to the light source, and obtaining a spectral response curve of the detected detector within a set wavelength range;
the standard detector is configured to operate before the light outlet hole of the monochromator;
controlling an incident light source to be in a single wave band, and recording the spectral response of a standard detector to the light source;
repeatedly changing the wavelength of the light source for multiple times, repeatedly recording the response of the detected detector to the light source, and obtaining a spectral response curve of the standard detector within a set wavelength range;
comparing the response curve of the detected detector with the spectrum response curve of the standard detector to obtain a relative spectrum response curve;
and obtaining the performance parameters of the detected detector according to the relative spectrum curve.
7. The method for testing the spectrum of an infrared detector as set forth in claim 6, wherein,
the spectral response of the detector to be detected to the light source is obtained by differencing the values of the front and back output response digital signals of the single-band light source.
8. The method for testing the spectrum of an infrared detector as set forth in claim 6, wherein,
the spectral response of the standard detector to the light source is obtained by differencing the values of the front and back output response digital signals of the single-band light source.
9. The infrared detector spectral testing method of claim 6, wherein the relative spectral response is obtained by the formula:
wherein R is test(λ) Indicating the relative spectral response; v (V) test(λ) Representing the absolute spectral response of the detector under test;
P (λ) representing the infrared radiation power of a standard detector at lambda wavelength; r is R std(λ) The spectral response rate of the standard detector is shown as follows; v (V) std(λ) Representing the response of a standard detector.
10. The method for testing the spectrum of an infrared detector as set forth in claim 6, wherein,
the wavelength range of the set infrared light includes all response intervals of the corresponding detector.
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