CN106199309B - A kind of circuit self-checking circuit and method for ADC sampled data - Google Patents
A kind of circuit self-checking circuit and method for ADC sampled data Download PDFInfo
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- CN106199309B CN106199309B CN201610529768.7A CN201610529768A CN106199309B CN 106199309 B CN106199309 B CN 106199309B CN 201610529768 A CN201610529768 A CN 201610529768A CN 106199309 B CN106199309 B CN 106199309B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Abstract
A kind of circuit self-checking circuit and method for ADC sampled data of the invention, including at least one three state buffer, multiplexer and ADC chip；Each three state buffer Strobe input is connected to microprocessor after being connected respectively with the control signal input of multiplexer, input terminal is connected with the SCK pin of ADC chip respectively, and output end is connected with each data output pins DOUT of ADC chip respectively；Two input terminals of the multiplexer are connected with the BUSY pin of ADC chip and CS pin respectively, data output end of the output end as circuit self-checking circuit；RESET pin, CS pin, CONVST pin and the SCK pin of the ADC chip are connect with microprocessor.The present invention cooperates ADC chip sampling time sequence cleverly by way of external self-test feedback to check ADC chip with the presence or absence of Welding Problems, to judge whether ADC sampled data circuit connects normally.
Description
Technical field
The invention belongs to fields, and in particular to a kind of circuit self-checking circuit and method for ADC sampled data.
Background technique
IC manufacturing industry has become mainstream using smaller and smaller Production of Transistor technique now, with chip package size
Reduction, chip pin spacing is also smaller and smaller, be easier in the welding process occur even weldering, problem of faulty soldering.Product is being thrown
Because also will appear chip pin even weldering, problem of faulty soldering by external environment influence (such as oxidation, burn into is polluted) during fortune.?
ADC sampling is an important sources of device data in electric system secondary protector, it influences the action row of engagement positions
For, once ADC sampled data is abnormal and can not find to would potentially result in serious electric power accident in time.But it is commonly used on existing market
The output of multi-channel synchronous ADC chip sampled data do not include verifying function, therefore can not find to adopt caused by because of Welding Problems
Sample loop fault bring abnormal sample data.
Traditional welding quality detection method again detects suspicious place by multimeter after detecting by an unaided eye, is borrowed
Help X-Ray equipment detection, with the special test equipments such as flying probe tester detect etc. means.However these means can be only applied to give birth to
Produce test in, product is practical put into operation during just it is helpless.
Multi-channel synchronous ADC sampling is generallyd use in electric system secondary protector, this is because electric system two
Voltage, the current signal that secondary protective device needs to acquire are more, and must assure that locking phase relationship.However it leads currently on the market
The multi-channel synchronous ADC chip of stream, such as ADS8555, ADS8556 of TI company, no matter AD7656, AD7606 of ADI company are adopted
With parallel data transmission or serial data transmission all without verifying function, therefore sampled data is different caused by Welding Problems
It can not often find, and this would potentially result in protective device malfunction, cause serious electric power accident.
It visually observes plus multimeter carries out Welding quality test, since point of observation is more, and small and dense collection, it is not easy to see
It examines.If it is the chip that BGA or QFN is encapsulated, pad is not observed visually, does not accomplish the purpose of detection.X-Ray observation
It is suitble to even weldering to check, but rosin joint or lacks weldering and be not easy to check, and also there are also certain injuries to human body for X-Ray equipment.Fly
The detection of needle tester needs to write test program and test file, and complexity is high, and equipment cost is high.These detection schemes are only applicable in
In production test.However because also can by external environment influence (such as oxidation, burn into is polluted) in product whole life cycle
There are chip pin Welding Problems, signal circuit is caused short circuit or open circuit occur.Especially to electric system secondary protector
ADC sampling circuit influence it is bigger, it has directly influenced the action behavior of protective device, may cause protection misoperation or
Refused action.
Summary of the invention
In view of the above-mentioned problems, the present invention proposes a kind of circuit self-checking circuit and method for ADC sampled data, it passes through
The mode of external self-test feedback cooperates ADC chip sampling time sequence cleverly to check that ADC chip whether there is Welding Problems, thus
Judge whether ADC sampled data circuit connects normally.This method is for can quickly position ADC sampled data circuit in production process
Company weldering, problem of faulty soldering, reprocessed immediately to improve the yield rate of product, because aoxidizing, corroding during product puts into operation
Caused by pin Welding Problems one it is found that after can take corresponding alarm measure, severe shadow caused by reducing because of unit exception
Loud and economic loss.
It realizes above-mentioned technical purpose, reaches above-mentioned technical effect, the invention is realized by the following technical scheme:
A kind of circuit self-checking circuit for ADC sampled data, including at least one three state buffer, multiplexer and
ADC chip；Each three state buffer Strobe input connects after being connected respectively with the control signal input of multiplexer
To microprocessor, input terminal is connected with the SCK pin of ADC chip respectively, and output end is defeated with each data of ADC chip respectively
Pin DOUT is connected out, and the number of three state buffer is less than or equal to data output pins DOUT, Mei Gesan on ADC chip
Pin DOUT's state buffer corresponding with one is connected respectively；Two input terminals of the multiplexer respectively with ADC chip
BUSY pin be connected with CS pin, data output end of the output end as circuit self-checking circuit；The ADC chip
RESET pin, CS pin, CONVST pin and SCK pin are connect with microprocessor.
In the circuit self-checking circuit for ADC sampled data, microprocessor chip is by exporting control signal to ADC
The control signal input of chip, three state buffer Strobe input and multiplexer is to constitute different circuit, microprocessor
Chip output self-test signal or clock signal are linked into different circuit by the SCK pin of ADC chip, in the defeated of each circuit
Outlet cooperates the sampling time sequence of ADC chip, compares the self-test signal of input and the self-test signal of output or compare ADC chip
BUSY pin output signal and the signal on CS pin it is whether consistent, check ADC chip whether have damage.
The CS pin of the ADC chip, CONVST pin, SCK pin and data output pins DOUT pin pad be
The structure of main-secondary pad, main-secondary pad is bridged to together by chip pin, only when chip pin and master-pair pad are reliable
Circuit could be connected after welding.
A kind of self checking method of the circuit self-checking circuit for ADC sampled data, comprising the following steps:
Step 1 carries out electrification reset to ADC chip；
Step 2, microprocessor chip by export control signal to ADC chip, three state buffer Strobe input with it is more
The control signal input of path multiplexer is to constitute different circuit, and microprocessor chip exports self-test signal or clock signal is logical
SCK pin is crossed to be linked into different circuit；
Step 3, the output end in each circuit cooperate the sampling time sequence of ADC chip, compare self-test signal and the output of input
Self-test signal or compare ADC chip BUSY pin output signal and the signal on CS pin it is whether consistent, check ADC
Whether chip has damage.
A kind of self checking method of the circuit self-checking circuit for ADC sampled data, when ADC chip is in data sampling conversion
When state, the step 2 and step 3 specifically: microprocessor chip exports high level signal to the CONVST of ADC chip respectively
Pin, the control signal input of CS pin and multiplexer and three state buffer Strobe input constitute the first circuit,
BUSY pin is strobed, and the BUSY_ADC signal of BUSY pin output is high level；Meanwhile three state buffer is enabled, micro- place
Reason device chip exports one group of self-test signal and is linked into the first circuit by the SCK pin of ADC chip, at this time the number of ADC chip
It is high-impedance state, DOUT_OUTPUT signal in the data output pins DOUT of ADC chip according to the DOUT_ADC in output pin DOUT
The pulse self-test signal on SCK pin is presented；When microprocessor chip can successfully capture BUSY_ADC arteries and veins on BUSY pin
Signal is rushed, and input self-test letter on the DOUT_OUTPUT signal on the data output pins DOUT of ADC chip and SCK pin
It is number consistent, show that CONVST pin, SCK pin, BUSY pin, the data output pins DOUT of ADC chip are not broken or short
The case where road, occurs.
A kind of self checking method of the circuit self-checking circuit for ADC sampled data, when ADC chip is in data sampling conversion
State is to when reading ADC sampled data status transition, the step 2 and step 3 specifically: microprocessor chip exports low respectively
Level signal constitutes to CONVST pin, the control signal input of multiplexer and three state buffer Strobe input
Secondary circuit, CS pin are strobed, and CS signal is presented in the BUSY_OUTPUT signal in BUSY pin, and exporting at this time is high level, and three
State buffer is prohibited, and exports high-impedance state, and CS is still maintained at high level, the DOUT_ in the data output pins DOUT of ADC chip
ADC signal is high-impedance state, and high-impedance state is also presented in DOUT_OUTPUT, when microprocessor chip can successfully obtain on BUSY pin
The signal for obtaining CS height variation shows that the CS pin of ADC does not have the situation of open circuit or short circuit.
A kind of self checking method of the circuit self-checking circuit for ADC sampled data reads ADC sampling when ADC chip is in
When data mode, the step 2 and step 3 specifically: microprocessor chip export respectively low level signal to CONVST pin,
CS pin, the control signal input of multiplexer and with three state buffer Strobe input to constitute tertiary circuit, CS draws
Foot is strobed, and the BUSY_OUTPUT signal of the BUSY pin of ADC chip is low level CS signal, microprocessor chip output
Clock signal is linked into second servo loop by the SCK pin of ADC chip, beat of the ADC chip according to the clock signal of input
Sampled data is exported, three state buffer is prohibited, and exports high-impedance state, the DOUT_ on the data output pins DOUT of ADC chip
OUTPUT signal is the DOUT_ADC signal on the data output pins DOUT of ADC chip；When microprocessor chip can be
The signal that CS height variation is successfully obtained on BUSY pin shows that the CS pin of ADC chip is sent out without the situation of open circuit or short circuit
It is raw.
Beneficial effects of the present invention:
A kind of circuit self-checking circuit and method for ADC sampled data of the invention, it passes through external self-test feedback
Mode cooperates ADC chip sampling time sequence cleverly to check ADC chip with the presence or absence of Welding Problems, to judge ADC hits
Whether connected normally according to circuit.This method for can quickly position in production process, weld, rosin joint is asked by the company in ADC sampled data circuit
Topic, is reprocessed immediately to improve the yield rate of product and shorten the scheduling and planning period, more traditional means of testing, side of the present invention
Case has at low cost, debugging rate height, simple operation and other advantages.Because of pin caused by aoxidizing, corrode etc. during product puts into operation
Welding Problems one it is found that after can take corresponding alarm and anti-error measure, real-time is high, can effectively reduce due to unit exception
Caused baneful influence and economic loss.
Detailed description of the invention
Fig. 1 is a kind of schematic illustration of circuit self-checking circuit for ADC sampled data of the invention.
Fig. 2 is the pin welding plate structure schematic of ADC chip of the invention.
Fig. 3 is ADC chip sampled data circuit self-test timing diagram of the invention.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to embodiments, to the present invention
It is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not used to
Limit the present invention.
Application principle of the invention is explained in detail with reference to the accompanying drawing.
A kind of circuit self-checking circuit for ADC sampled data, including at least one three state buffer, multiplexer and
ADC chip；Each three state buffer Strobe input connects after being connected respectively with the control signal input of multiplexer
To microprocessor, input terminal is connected with the SCK pin of ADC chip respectively, and output end is defeated with each data of ADC chip respectively
Pin DOUT is connected out, and the number of three state buffer is less than or equal to data output pins DOUT, Mei Gesan on ADC chip
Pin DOUT's state buffer corresponding with one is connected respectively；Two input terminals of the multiplexer respectively with ADC chip
BUSY pin be connected with CS pin, data output end of the output end as circuit self-checking circuit；The ADC chip
RESET pin, CS pin, CONVST pin and SCK pin are connect with microprocessor.As shown in Figure 1, in one kind of the invention
In embodiment, ADC chip is AD7606 serial data transmission chip, including 2 three state buffers, in other implementations of the invention
It can also include 3 or more three state buffers in example, the number of three state buffer is less than or equal on ADC chip
Data output pins DOUT.
In the circuit self-checking circuit for ADC sampled data, microprocessor chip is by exporting control signal to ADC
The control signal input of chip, three state buffer Strobe input and multiplexer is to constitute different circuit, microprocessor
Chip output self-test signal or clock signal are linked into different circuit by the SCK pin of ADC chip, in the defeated of each circuit
Outlet cooperates the sampling time sequence of ADC chip, compares the self-test signal of input and the self-test signal of output or compare ADC chip
BUSY pin output signal and the signal on CS pin it is whether consistent, check ADC chip whether have damage.
In an embodiment of the present invention, the truth table of three state buffer is as shown in table 1, the truth table of multiplexer
As shown in table 2；
Table 1
| T | O |
| 0 | Z (high resistant) |
| 1 | I |
Table 2
| SEL | O |
| 0 | I0 |
| 1 | I1 |
As shown in Fig. 2, the CS pin of the ADC chip, CONVST pin, SCK pin and data output pins DOUT
Based on pin pad-structure of secondary pad, main-secondary pad is bridged to together by chip pin, only when chip pin and master-
Whether circuit could be connected after secondary pad reliably welds, thus can be connected by circuit and judge whether chip welding is reliable, prevents
Rosin joint.
A kind of self checking method of the circuit self-checking circuit for ADC sampled data, comprising the following steps:
Step 1 carries out electrification reset to ADC chip；
Step 2, microprocessor chip by export control signal to ADC chip, three state buffer Strobe input with it is more
The control signal input of path multiplexer is to constitute different circuit, and microprocessor chip exports self-test signal or clock signal is logical
SCK pin is crossed to be linked into different circuit；
Step 3, the output end in each circuit cooperate the sampling time sequence of ADC chip, compare self-test signal and the output of input
Self-test signal or compare ADC chip BUSY pin output signal and the signal on CS pin it is whether consistent, check ADC
Whether chip has damage.
In Fig. 3 of the invention, RESET#, CONVST, BUSY_ADC, CS#, SCK and DOUTA (B) _ ADC indicate ADC core
Signal on piece pin, BUSY_OUTPUT, DOUTA (B) _ OUTPUT are the signal being connected on microprocessor chip.In Fig. 3
The upper half indicates original ADC chip sampling time sequence figure, and lower half indicates the ADC chip sampling time sequence figure with self-checking function in Fig. 3.
RESET#:ADC reset signal resets ADC chip by microprocessor chip output low level, usually only after the power-up
It resets primary.
CONVST:ADC starts sampled signal, is inputted by microprocessor chip output high level notice ADC chip to it
Analog signals carry out sample conversion.
BUSY_ADC:ADC busy signal is the output signal of ADC chip, indicates current ADC to analog signals
It carries out in sample conversion.
CS#:ADC chip selection signal, low level are effective.The ADC chip is gated by microprocessor chip output low level, thus
It can carry out data read operation.
SCK:ADC serial data interface clock signal carries out reading data behaviour by microprocessor chip output periodic signal
Make.
DOUTA (B) _ ADC:ADC serial data interface data-signal, can be configured to single line or multiline mode, by ADC chip
Sampled data is exported under the triggering of SCK clock edge.When CS# piece is selected as high level output be high-impedance state, when CS# piece be selected as it is low
Output data when level.
DOUTA (B) _ OUTPUT:ADC serial data interface pin and three state buffer pin are commonly connected to microprocessor
The same gauze signal of chip.What it was reacted is ADC serial data interface DOUTA (B) _ ADC output and three state buffer output
Common signal.
BUSY_OUTPUT: multiplexer is connected to the gauze signal of microprocessor chip, can characterize at the time of different
The BUSY signal and CS# signal of ADC chip.
A kind of self checking method of the circuit self-checking circuit for ADC sampled data, when ADC chip is in data sampling conversion
(the A stage in a sampling period), the step 2 and step 3 when state specifically: microprocessor chip exports high electricity respectively
Ordinary mail number is to the CONVST pin of ADC chip, the control signal input of CS pin and multiplexer and three state buffer choosing
Logical input terminal constitutes the first circuit, and the SEL pin of multiplexer is high level, and I1 is selected, and BUSY pin is strobed, BUSY
The BUSY_OUTPUT of pin output is BUSY_ADC signal, is high level；Meanwhile three state buffer is enabled, microprocessor core
Piece exports one group of self-test signal and is linked into the first circuit by the SCK pin of ADC chip, at this time the data output of ADC chip
DOUTA (B) _ ADC in pin DOUT is high-impedance state, DOUTA (B) _ OUTPUT letter in the data output pins DOUT of ADC chip
Number present SCK pin on pulse self-test signal；When microprocessor chip can successfully capture BUSY_ADC on BUSY pin
Pulse signal, and inputted on DOUTA (the B) _ OUTPUT signal and SCK pin on the data output pins DOUT of ADC chip
Self-test signal is consistent, shows that CONVST pin, SCK pin, BUSY pin, the data output pins DOUT of ADC chip do not break
The situation of weldering or short circuit occurs.
A kind of self checking method of the circuit self-checking circuit for ADC sampled data, when ADC chip is in data sampling conversion
State is to when reading ADC sampled data status transition, the step 2 and step 3 specifically: microprocessor chip exports low respectively
Level signal constitutes to CONVST pin, the control signal input of multiplexer and three state buffer Strobe input
Secondary circuit, CS pin are strobed, and CS signal is presented in the BUSY_OUTPUT signal in BUSY pin, and exporting at this time is high level, and three
State buffer is prohibited, and exports high-impedance state, and CS is still maintained at high level, the DOUTA in the data output pins DOUT of ADC chip
(B) _ ADC signal is high-impedance state, and high-impedance state is also presented in DOUTA (B) _ OUTPUT, when microprocessor chip can be in BUSY pin
On successfully obtain the signal of CS height variation, show that the CS pin of ADC have open circuit or short-circuit situation.
A kind of self checking method of the circuit self-checking circuit for ADC sampled data reads ADC sampling when ADC chip is in
When data mode, the step 2 and step 3 specifically: microprocessor chip export respectively low level signal to CONVST pin,
CS pin, the control signal input of multiplexer and with three state buffer Strobe input to constitute tertiary circuit, CS draws
Foot is strobed, and the BUSY_OUTPUT signal of the BUSY pin of ADC chip is low level CS signal, microprocessor chip output
Clock signal is linked into second servo loop by the SCK pin of ADC chip, beat of the ADC chip according to the clock signal of input
Sampled data is exported, three state buffer is prohibited, and exports high-impedance state, the DOUTA on the data output pins DOUT of ADC chip
(B) _ OUTPUT signal is DOUTA (B) _ ADC signal on the data output pins DOUT of ADC chip；Work as microprocessor chip
The signal that CS height variation can be successfully obtained on BUSY pin shows the CS pin of ADC chip without breaking or short circuit
It happens.
To sum up: a kind of circuit self-checking circuit and method for ADC sampled data of the invention, it is returned by external self-test
The mode of feedback cooperates ADC chip sampling time sequence cleverly to check ADC chip with the presence or absence of Welding Problems, to judge that ADC is adopted
Whether sample data loop connects normally.This method is for can quickly position company's weldering, the void in ADC sampled data circuit in production process
Weldering problem is reprocessed immediately to improve the yield rate of product and shorten the scheduling and planning period, more traditional means of testing, this hair
Bright scheme has at low cost, debugging rate height, simple operation and other advantages.Because caused by aoxidizing, corrode etc. during product puts into operation
Pin Welding Problems one it is found that after can take corresponding alarm and anti-error measure, real-time is high, can effectively reduce because equipment is different
Baneful influence and economic loss caused by often.
The above shows and describes the basic principles and main features of the present invention and the advantages of the present invention.The technology of the industry
Personnel are it should be appreciated that the present invention is not limited to the above embodiments, and the above embodiments and description only describe this
The principle of invention, without departing from the spirit and scope of the present invention, various changes and improvements may be made to the invention, these changes
Change and improvement all fall within the protetion scope of the claimed invention.The claimed scope of the invention by appended claims and its
Equivalent thereof.
Claims (7)
1. a kind of circuit self-checking circuit for ADC sampled data, it is characterised in that: including at least one three state buffer, more
Path multiplexer and ADC chip；Each three state buffer Strobe input respectively with the control signal input of multiplexer
Be connected after be connected to microprocessor, input terminal is connected with the SCK pin of ADC chip respectively, output end respectively with ADC chip
Each data output pins DOUT be connected, the number of three state buffer is less than or equal to the data output pins on ADC chip
DOUT, pin DOUT's each three state buffer corresponding with one is connected respectively；Two input terminals of the multiplexer point
It is not connected with the BUSY pin of ADC chip and CS pin, data output end of the output end as circuit self-checking circuit；It is described
RESET pin, CS pin, CONVST pin and the SCK pin of ADC chip are connect with microprocessor.
2. a kind of circuit self-checking circuit for ADC sampled data according to claim 1, it is characterised in that: the use
In the circuit self-checking circuit of ADC sampled data, microprocessor chip is by exporting control signal to ADC chip, Three-State
For the control signal input of device Strobe input and multiplexer to constitute different circuit, microprocessor chip exports self-test letter
Number or clock signal be linked into different circuit by the SCK pin of ADC chip, the output end in each circuit, cooperate ADC core
The sampling time sequence of piece compares the self-test signal of input and the self-test signal of output or compares the defeated of the BUSY pin of ADC chip
Whether signal and the signal on CS pin are consistent out, check whether ADC chip has damage.
3. a kind of circuit self-checking circuit for ADC sampled data according to claim 1, it is characterised in that: the ADC
The CS pin of chip, CONVST pin, SCK pin and data output pins DOUT pin pad based on-structure of secondary pad,
Main-secondary pad is bridged to together by chip pin, and only circuit can just be led after chip pin is reliably welded with master-pair pad
It is logical.
4. a kind of self checking method of circuit self-checking circuit for ADC sampled data according to claim 1, feature exist
In: the following steps are included:
Step 1 carries out electrification reset to ADC chip；
Step 2, microprocessor chip are multiple to ADC chip, three state buffer Strobe input and multichannel by exporting control signal
With the control signal input of device to constitute different circuit, microprocessor chip output self-test signal or clock signal pass through
SCK pin is linked into different circuit；
Step 3, the output end in each circuit, cooperate ADC chip sampling time sequence, compare input self-test signal and output from
Inspection signal or compare ADC chip BUSY pin output signal and the signal on CS pin it is whether consistent, inspection ADC chip
Whether damage is had.
5. a kind of self checking method of circuit self-checking circuit for ADC sampled data according to claim 4, feature exist
In: when ADC chip is in data sampling transition status, the step 2 and step 3 specifically: microprocessor chip difference is defeated
High level signal is to the CONVST pin of ADC chip, CS pin, the control signal input of multiplexer and Three-State out
Device Strobe input constitutes the first circuit, and BUSY pin is strobed, and the BUSY_ADC signal of BUSY pin output is high level；Together
When, three state buffer is enabled, and microprocessor chip exports one group of self-test signal and is linked into the by the SCK pin of ADC chip
In primary Ioops, the sampled data signal DOUT_ADC in the data output pins DOUT of ADC chip is high-impedance state, ADC core at this time
The pulse self-test signal on SCK pin is presented in DOUT_OUTPUT signal in the data output pins DOUT of piece；When microprocessor core
Piece can successfully capture BUSY_ADC pulse signal on BUSY pin, and on the data output pins DOUT of ADC chip
DOUT_OUTPUT signal is consistent with self-test signal is inputted on SCK pin, show the CONVST pin of ADC chip, SCK pin,
BUSY pin, data output pins DOUT do not have to be broken or the situation of short circuit.
6. a kind of self checking method of circuit self-checking circuit for ADC sampled data according to claim 4, feature exist
In: when ADC chip is in data sampling transition status to when reading ADC sampled data status transition, the step 2 and step 3
Specifically: microprocessor chip exports low level signal to the control signal input of CONVST pin, multiplexer respectively
With three state buffer Strobe input to constitute second servo loop, CS pin is strobed, the BUSY_OUTPUT signal in BUSY pin
CS signal is presented, output is high level at this time, and three state buffer is prohibited, and exports high-impedance state, and CS is still maintained at high level, ADC
DOUT_ADC signal in the data output pins DOUT of chip is high-impedance state, and high-impedance state is also presented in DOUT_OUTPUT, when micro- place
Reason device chip can successfully obtain the signal of CS height variation on BUSY pin, show the CS pin of ADC without breaking or short
The case where road, occurs.
7. a kind of self checking method of circuit self-checking circuit for ADC sampled data according to claim 4, feature exist
In: when ADC chip, which is in, reads ADC sampled data state, the step 2 and step 3 specifically: microprocessor chip difference
Export low level signal to CONVST pin, CS pin, multiplexer control signal input and with three state buffer select
Lead to input terminal to constitute tertiary circuit, CS pin is strobed, and the BUSY_OUTPUT signal of the BUSY pin of ADC chip is low electricity
Flat CS signal, microprocessor chip output clock signal are linked into second servo loop by the SCK pin of ADC chip, ADC core
Piece exports sampled data according to the beat of the clock signal of input, and three state buffer is prohibited, and exports high-impedance state, ADC chip
DOUT_OUTPUT signal on data output pins DOUT is the DOUT_ADC letter on the data output pins DOUT of ADC chip
Number；When microprocessor chip can be successfully obtained on BUSY pin CS height variation signal, show the CS pin of ADC chip
There is no the situation of open circuit or short circuit.
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| CN201294607Y (en) * | 2008-11-11 | 2009-08-19 | 青岛海信电器股份有限公司 | Debug circuit |
| CN201562037U (en) * | 2009-12-09 | 2010-08-25 | 泰豪科技股份有限公司 | A/D chip conversion error detection device |
| CN102207535A (en) * | 2010-03-30 | 2011-10-05 | 上海摩波彼克半导体有限公司 | Circuit structure and method for automatically testing analog baseband chip comprising analog-digital converter (ADC) and digital-analog converter (DAC) |
| CN103905043A (en) * | 2012-10-05 | 2014-07-02 | 英飞凌科技股份有限公司 | Test circuit |
| CN104283559A (en) * | 2013-07-03 | 2015-01-14 | 英飞凌科技股份有限公司 | Built-in-self-test for an analog-to-digital converter |
| CN105676116A (en) * | 2016-01-08 | 2016-06-15 | 珠海格力电器股份有限公司 | Device and method for testing servo driver ADC circuit |
| CN105680859A (en) * | 2016-01-29 | 2016-06-15 | 中国科学院微电子研究所 | Built-in self-test (BIST) circuit and testing method of analog to digital converter (ADC) in system on chip (SoC) |
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| CN106199309A (en) | 2016-12-07 |
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