CN106199089B - A kind of anti-strip device for quartz crystal testing head - Google Patents
A kind of anti-strip device for quartz crystal testing head Download PDFInfo
- Publication number
- CN106199089B CN106199089B CN201610886343.1A CN201610886343A CN106199089B CN 106199089 B CN106199089 B CN 106199089B CN 201610886343 A CN201610886343 A CN 201610886343A CN 106199089 B CN106199089 B CN 106199089B
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- Prior art keywords
- outline border
- probe
- inner frame
- frame structure
- screw
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The present invention relates to the test equipment technical fields of quartz crystal, refer in particular to a kind of anti-strip device for quartz crystal testing head.It includes movable outline border and the integration testing plate on movable outline border, the integration testing plate is provided with the probe being connected electrically, inner frame structure is installed in the activity outline border, the inner frame structure is flexibly connected with movable outline border, the inner frame structure is provided with the extension of stretching activity outline border, it is provided with to prevent the pin hole portion of probe strip on the extension, when tested, the activity outline border drives probe through testing product after inner frame structure and pin hole portion.A kind of anti-strip device for quartz crystal testing head provided by the invention, simple in structure, design rationally, effectively prevent probe strip, it prevents bad products from flowing out, extends the service life of probe, ensure device overall stability, the failure rate of device is reduced, improves production efficiency, saves cost.
Description
Technical field
The present invention relates to the test equipment technical field of quartz crystal, refer in particular to a kind of for quartz crystal testing head
Anti- strip device.
Background technology
Quartz-crystal resonator is also known as quartz crystal, is commonly called as crystal oscillator, and main material is crystal, and ingredient SiO2, it is not only
It is preferable optical material, and is important piezoelectric material.With development in science and technology, improvement of living standard, to electronic product
Constantly pursue light weight, it is small, appearance is U.S. the advantages that product.And the piezoelectric effect of quartz-crystal resonator can be electronics
Product provides stable clock signal.To meet existing demand of industrial production, crystal own vol also constantly reduces, could be with intelligence
The electronic product perfect adaptation of change.Quartz crystal smart electronics field effect such as：1. the call of mobile phone, camera shooting, satellite
The functions such as position；2. the engine control of automobile；3. clocking capability of electronic watch etc..Therefrom embody crystal play it is indispensable
Few key player.
During the test, measuring head can drive probe raising and lowering, and probe is in uphill process often by material
Take up together, be so unfavorable for the test of next time, influence service life of probe, at the same material upset after be scattered in the device, it is unfavorable
In the stability of device, increase the failure rate of device.
The content of the invention
The present invention provides a kind of anti-strip device for quartz crystal testing head for problem of the prior art, can be to prevent
Only probe strip extends the service life of probe, ensures device overall stability, improves production efficiency, saves cost.
In order to solve the above-mentioned technical problem, the present invention adopts the following technical scheme that：
A kind of anti-strip device for quartz crystal testing head provided by the invention, including movable outline border and is mounted on
Integration testing plate on movable outline border, the integration testing plate are provided with the probe being connected electrically, pacify in the activity outline border
Equipped with inner frame structure, the inner frame structure is flexibly connected with movable outline border, and the inner frame structure is provided with stretching activity outline border
Extension is provided with to prevent the pin hole portion of probe strip on the extension, and when tested, the activity outline border, which drives, to be visited
Pin tests product after passing through pin hole portion.
Wherein, be respectively arranged on the integration testing plate, movable outline border and inner frame structure the first screw hole, the second screw hole and
Pilot hole, the integration testing plate is sealed by screw and movable outline border, is provided with to slide with inner frame structure on the screw
The sliding slot of dynamic cooperation, the activity outline border are flexibly connected by the sliding slot of screw with inner frame structure.
Wherein, it is provided with the reset bullet for resetting movable outline border between the inner frame structure and the movable outline border
Spring.
Further, the resetting spring is sheathed on screw.
Wherein, the spin for being slidably matched with sliding slot is provided in the pilot hole, when movable outline border acts, inside casing
The sliding slot of structure along screw does opposite up and down motion.
Wherein, uniform intervals are provided with several for positioning the raised line of spin on the sliding slot.
Further, the diameter length at intervals of spin between adjacent raised line.
Wherein, the positioning column through the orientation in pin hole portion for positioning probe is equipped in the pin hole portion.
Wherein, the top of the positioning column is set fluted, and the ball for coordinating with probe is provided on the groove,
When probe passes through pin hole portion, the ball is slidably connected with probe.
Wherein, the upper and lower ends in the pin hole portion are both provided with to prevent the catch of probe strip, are set on the catch
The through hole passed through for probe is equipped with, the diameter of the through hole is equal with the diameter of section of probe.
Beneficial effects of the present invention：
A kind of anti-strip device for quartz crystal testing head provided by the invention, it is simple in structure, design is reasonable, effectively
It prevents probe strip, prevents bad products from flowing out, extend the service life of probe, ensure device overall stability, reduce device
Failure rate, improve production efficiency, save cost.
Description of the drawings
Fig. 1 is a kind of structure diagram of anti-strip device for quartz crystal testing head of the present invention.
Structural representation when Fig. 2 is a kind of probe test of anti-strip device for quartz crystal testing head of the present invention
Figure.
Fig. 3 is the fixation convex block of the present invention and the structure diagram of fixed groove.
Fig. 4 is the inner frame structure of the present invention and the structure diagram of screw cooperation.
Fig. 5 is screw, sliding slot, raised line, the structure diagram of pit of the present invention.
Fig. 6 is the cross section structure schematic diagram in the pin hole portion of the present invention.
Fig. 7 is the structure diagram in the pin hole portion of the present invention.
Reference numeral in Fig. 1 to Fig. 7 includes：
1-activity outline border 2-integration testing, 3-probe of plate
4-inner frame structure, 5-extension, 6-pin hole portion
7-screw, 8-resetting spring, 9-spin
10-sliding slot, 11-raised line, 12-positioning column
13-ball, 14-catch, 15-through hole
16-screw head, 17-screw rod 18-fixation convex block
The 21-the first screw hole of 19-fixed groove, 20-pit
22-the second 23-pilot hole of screw hole.
Specific embodiment
For the ease of the understanding of those skilled in the art, the present invention is made further with reference to embodiment and attached drawing
Bright, the content that embodiment refers to not is limitation of the invention.Detailed retouch is carried out to the present invention below in conjunction with attached drawing 1-7
It states.
A kind of anti-strip device for quartz crystal testing head described in the present embodiment, including movable outline border 1 and peace
Integration testing plate 2 on movable outline border 1, the integration testing plate 2 are provided with the probe 3 being connected electrically, the activity
Inner frame structure 4 is installed, the inner frame structure 4 is flexibly connected with movable outline border 1, and the inner frame structure 4, which is provided with, to be stretched in outline border 1
Go out the extension 5 of movable outline border 1, be provided with to prevent the pin hole portion 6 of 3 strip of probe on the extension 5, when tested,
The activity outline border 1 drives probe 3 to be tested after passing through pin hole portion 6 product.Specifically, as shown in Figure 1, Figure 2, when tested,
Movable outline border 1 drives the action that probe 3 moves up and down, when movable outline border 1 drives probe 3 to pass through inner frame structure 4 and pin hole portion 6
Afterwards, quartz products are tested, when the test is finished, movable outline border 1 can drive probe 3 to move upwards reset, i.e. 3 nothing of probe
By, all through needle passing hole portion 6, the pin hole portion 6 can prevent 3 strip of probe in test or reset, stop that materials and parts enter outside activity
In frame 1 or in inner frame structure 4；Wherein, such as Fig. 7, the upper and lower ends in the pin hole portion 6 are both provided with to prevent 3 strip of probe
Catch 14, the through hole 15 passed through for probe 3, diameter and the probe 3 of the through hole 15 are provided on the catch 14
Diameter of section is equal；Further, the catch 14 effectively can prevent materials and parts from entering in device, and the through hole 15 only allows to visit
Pin 3 passes through.
Such as Fig. 3, Fig. 4, a kind of anti-strip device for quartz crystal testing head described in the present embodiment, the integrated survey
The first screw hole 21, the second screw hole 22 and pilot hole 23, the collection are respectively arranged on test plate (panel) 2, movable outline border 1 and inner frame structure 4
It is sealed by screw 7 and movable outline border 1 into test board 2, it is provided with what is be slidably matched with inner frame structure 4 on the screw 7
Sliding slot 10, the activity outline border 1 are flexibly connected by the sliding slot 10 of screw 7 with inner frame structure 4.Specifically, first screw hole
Fixed groove 19 is provided on 21, wherein, fixed groove 19 is annular groove；First screw hole, 21 and second screw hole 22 is respectively provided with
There is internal thread, the screw 7 includes screw head 16 and screw rod 17, the external screw thread with screw-internal thread fit is provided on the screw rod 17,
The screw head 16 is provided with the fixation convex block 18 coordinated with fixed groove 19；Specifically, when with screw 7 integration testing plate 2 with
When movable outline border 1 is sealed, by rotating pressing screw 7 until the fixation convex block 18 of screw 7 enters the bottom of fixed groove 19,
Illustrate integration testing plate 2 and the movable sealed completion of outline border 1, the screw head 16 of screw 7 is located in the first screw hole 21 at this time, screw
7 screw rod 17 is located at the first screw hole 21, the second screw hole 22 continues to press screw 7 so that integrated with that in pilot hole 23, can prevent
Test board 2 and movable outline border 1 crack；The sliding slot 10 is correspondingly arranged with pilot hole 23, when movable outline border 1 moves, inside casing knot
Structure 4 does relative motion along the sliding slot 10 of screw 7.
As shown in Figure 1, Figure 2, a kind of anti-strip device for quartz crystal testing head described in the present embodiment, the inside casing knot
The resetting spring 8 for resetting movable outline border 1 is provided between structure 4 and the movable outline border 1.Specifically, when movable outline border 1
Drive probe 3 move downward through pin hole portion 6 materials and parts are tested when, the reset bullet between inner frame structure 4 and movable outline border 1
Spring 8 is compressed；After the completion of test, movable outline border 1 rises, while probe 3 is driven to rise, since 8 its own resilient of resetting spring is made
Under, resetting spring 8 stretches, and the power that reduction activity outline border 1 rises reduces loss, can improve work efficiency, extend the work of device
Make the service life.
As shown in Figure 1, Figure 2, a kind of anti-strip device for quartz crystal testing head described in the present embodiment, the reset bullet
Spring 8 is sheathed on screw 7.Specifically, the resetting spring 8 is sheathed in screw 7, and first, it can prevent what resetting spring 8 from pitching
In the case of will not depart from screw 7, prevent resetting spring 8 drops to from influencing device performance in device, ensure device monolithic stability
Property；Second, resetting spring 8 can be caused, each along screw 7, to ensure that the work of resetting spring 8 is steady in the direction compressed and stretched
It is qualitative.
Such as Fig. 4, Fig. 5, a kind of anti-strip device for quartz crystal testing head described in the present embodiment, the pilot hole
The spin 9 being slidably matched with sliding slot 10 is provided in 23, when movable outline border 1 acts, inner frame structure 4 is along screw 7
Sliding slot 10 does opposite up and down motion.Specifically, the spin 9 and the cooperation of sliding slot 10, it is possible to reduce inner frame structure 4 is doing phase
To up and down motion when and screw 7 between friction, reduce friction loss, improve work efficiency, extend the working life of device.
Such as Fig. 4, Fig. 5, a kind of anti-strip device for quartz crystal testing head described in the present embodiment, the sliding slot 10
Upper uniform intervals are provided with several for positioning the raised line 11 of spin 9.Specifically, adjacent raised line 11 forms pit two-by-two
20, when movable outline border 1 drives probe 3 to test downwards or the when of reset, the raised line 11, which can have spin 9, certain to be determined
Position and the effect of support, one pit 20 that a spin 9 can be placed in one of adjacent raised line 11 formation, prevents interior two-by-two
Mount structure 4 is under self gravitation along screw 7 to downslide.
A kind of anti-strip device for quartz crystal testing head described in the present embodiment, the interval between adjacent raised line 11
For the diameter length of spin 9.Specifically, interval is equal with the diameter length of spin 9 can ensure that raised line 11 can stablize support
With withstand spin 9, if diameter length of the interval less than spin 9, spin 9 is possible to sliding directly from raised line 11 adjacent two-by-two
It crosses, without entering in pit 20；If interval easily slides out pit 20 more than the diameter length of spin 9, spin 9, stability is poor；Tool
Body, the size at intervals of a raised line 11 between the spin 9 adjacent two-by-two.
Such as Fig. 6, a kind of anti-strip device for quartz crystal testing head described in the present embodiment, in the pin hole portion 6
It is equipped with the positioning column 12 through the orientation in pin hole portion 6 for positioning probe 3.Specifically, the top shape for the positioning column 12 that ring is set
Into the hole passed through for probe 3, ensure the accuracy that probe 3 works.
A kind of anti-strip device for quartz crystal testing head described in the present embodiment, the top of the positioning column 12 are set
Groove is equipped with, the ball 13 for coordinating with probe 3 is provided on the groove, when probe 3 passes through pin hole portion 6, the rolling
Pearl 13 is slidably connected with probe 3.Specifically, the ball 13 can reduce friction when probe 3 is passed through from pin hole portion 6, reduce
Working loss improves the service life of probe 3.
The above is only present pre-ferred embodiments, not makees limitation in any form to the present invention, although
The present invention is disclosed as above with preferred embodiment, however is not limited to the present invention, any person skilled in the art,
It does not depart from the range of technical solution of the present invention, when the technology contents using the disclosure above make a little change or are modified to equivalent change
The equivalent embodiment of change as long as being without departing from technical solution of the present invention content, refers to according to the technology of the present invention to above example
Any simple modification, equivalent change and modification made, belongs in the range of technical solution of the present invention.
Claims (5)
1. a kind of anti-strip device for quartz crystal testing head, it is characterised in that：Including movable outline border and mounted on work
Integration testing plate on dynamic outline border, the integration testing plate are provided with the probe being connected electrically, are installed in the activity outline border
There is inner frame structure, the inner frame structure is flexibly connected with movable outline border, and the inner frame structure is provided with prolonging for stretching activity outline border
Extending portion is provided with to prevent the pin hole portion of probe strip on the extension, and when tested, the activity outline border drives probe
Product is tested after through pin hole portion；
The first screw hole, the second screw hole and pilot hole, institute are respectively arranged on the integration testing plate, movable outline border and inner frame structure
It is sealed by screw and movable outline border to state integration testing plate, the cunning for being slidably matched with inner frame structure is provided on the screw
Slot, the activity outline border are flexibly connected by the sliding slot of screw with inner frame structure；
The spin for being slidably matched with sliding slot is provided in the pilot hole, when movable outline border acts, inner frame structure along
The sliding slot of screw does opposite up and down motion；
Uniform intervals are provided with several for positioning the raised line of spin on the sliding slot；
The diameter length at intervals of spin between adjacent raised line；
The resetting spring for resetting movable outline border is provided between the inner frame structure and the movable outline border.
2. a kind of anti-strip device for quartz crystal testing head according to claim 1, it is characterised in that：It is described multiple
Position spring pocket is arranged on screw.
3. a kind of anti-strip device for quartz crystal testing head according to claim 1, it is characterised in that：The pin
The positioning column through the orientation in pin hole portion for positioning probe is equipped in hole portion.
4. a kind of anti-strip device for quartz crystal testing head according to claim 3, it is characterised in that：It is described fixed
The top setting of position column is fluted, and the ball for coordinating with probe is provided on the groove, when probe passes through pin hole portion,
The ball is slidably connected with probe.
5. a kind of anti-strip device for quartz crystal testing head according to claim 1, it is characterised in that：The pin
The upper and lower ends of hole portion are both provided with to prevent the catch of probe strip, are provided on the catch and lead to for what probe passed through
Hole, the diameter of the through hole are equal with the diameter of section of probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610886343.1A CN106199089B (en) | 2016-10-10 | 2016-10-10 | A kind of anti-strip device for quartz crystal testing head |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610886343.1A CN106199089B (en) | 2016-10-10 | 2016-10-10 | A kind of anti-strip device for quartz crystal testing head |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106199089A CN106199089A (en) | 2016-12-07 |
| CN106199089B true CN106199089B (en) | 2018-05-22 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610886343.1A Active CN106199089B (en) | 2016-10-10 | 2016-10-10 | A kind of anti-strip device for quartz crystal testing head |
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| CN (1) | CN106199089B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109633399A (en) * | 2018-12-20 | 2019-04-16 | 北京无线电计量测试研究所 | A kind of Testing device of electrical parameter of quartz wafer |
| CN109807804B (en) * | 2018-12-28 | 2020-12-11 | 上海华岭集成电路技术股份有限公司 | Separation device for protecting, loading and unloading test probe |
| CN116400134A (en) * | 2023-01-12 | 2023-07-07 | 广东惠伦晶体科技股份有限公司 | Clock vibration testing device and circuit |
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| EP0508561A1 (en) * | 1991-04-11 | 1992-10-14 | METHODE ELECTRONICS, Inc. | Apparatus for electronically testing printed circuit boards or the like |
| CN1681101A (en) * | 2004-04-09 | 2005-10-12 | 矽统科技股份有限公司 | Detecting head of tester |
| CN200953030Y (en) * | 2006-08-04 | 2007-09-26 | 宏亿国际股份有限公司 | Wafer test card |
| CN103389051A (en) * | 2013-08-09 | 2013-11-13 | 昆山允可精密工业技术有限公司 | Vertical-type wafer shape measuring instrument |
| CN203798842U (en) * | 2014-02-26 | 2014-08-27 | 汇隆电子（金华）有限公司 | Quartz crystal testing head |
| CN204649794U (en) * | 2015-05-07 | 2015-09-16 | 浙江东晶电子股份有限公司 | A kind of measuring head of automatic fine tuning machine |
| CN105390268A (en) * | 2015-12-10 | 2016-03-09 | 合肥市菲力克斯电子科技有限公司 | Processing device for transformer bobbin production |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN206146975U (en) * | 2016-10-10 | 2017-05-03 | 广东惠伦晶体科技股份有限公司 | A prevent area material device for quartz crystal measuring head |
-
2016
- 2016-10-10 CN CN201610886343.1A patent/CN106199089B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0508561A1 (en) * | 1991-04-11 | 1992-10-14 | METHODE ELECTRONICS, Inc. | Apparatus for electronically testing printed circuit boards or the like |
| CN1681101A (en) * | 2004-04-09 | 2005-10-12 | 矽统科技股份有限公司 | Detecting head of tester |
| CN200953030Y (en) * | 2006-08-04 | 2007-09-26 | 宏亿国际股份有限公司 | Wafer test card |
| CN103389051A (en) * | 2013-08-09 | 2013-11-13 | 昆山允可精密工业技术有限公司 | Vertical-type wafer shape measuring instrument |
| CN203798842U (en) * | 2014-02-26 | 2014-08-27 | 汇隆电子（金华）有限公司 | Quartz crystal testing head |
| CN204649794U (en) * | 2015-05-07 | 2015-09-16 | 浙江东晶电子股份有限公司 | A kind of measuring head of automatic fine tuning machine |
| CN105390268A (en) * | 2015-12-10 | 2016-03-09 | 合肥市菲力克斯电子科技有限公司 | Processing device for transformer bobbin production |
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| Publication number | Publication date |
|---|---|
| CN106199089A (en) | 2016-12-07 |
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Denomination of invention: A Material Preventing Device for Quartz Crystal Testing Head Effective date of registration: 20230922 Granted publication date: 20180522 Pledgee: Dongguan Kechuang Financing Guarantee Co.,Ltd. Pledgor: GUANGDONG FAILONG CRYSTAL TECHNOLOGY Co.,Ltd. Registration number: Y2023980058414 |
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