CN217385603U - Probe assembly for impact resistance test of thermistor chip special for variable frequency air conditioner - Google Patents
Probe assembly for impact resistance test of thermistor chip special for variable frequency air conditioner Download PDFInfo
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- CN217385603U CN217385603U CN202221145252.XU CN202221145252U CN217385603U CN 217385603 U CN217385603 U CN 217385603U CN 202221145252 U CN202221145252 U CN 202221145252U CN 217385603 U CN217385603 U CN 217385603U
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- probe
- rod
- thermistor chip
- sleeve
- air conditioner
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Abstract
The utility model discloses a probe assembly for impact resistance test of a thermistor chip special for a variable frequency air conditioner, which comprises a probe sleeve and a probe rod, wherein the probe rod is sleeved inside the probe sleeve, the lower end of the probe rod extends to the outside of the probe sleeve, and the probe rod moves up and down repeatedly along the inner cavity of the probe sleeve; the lower extreme of probe needle bar is connected with the probe needle head that is used for carrying out shock resistance test to the thermistor chip, and the probe needle head moves repeatedly from top to bottom along the probe needle bar for last impact test to the thermistor chip, the utility model discloses be equipped with first spring, second spring, stroke adjusting lever, adjusting nut, first spacing ring and second spacing ring, can adjust the dynamics that the probe needle bar impactes downwards, the while cushions the repeated impact of probe subassembly, improves the stability that the probe subassembly assaulted, improves the accuracy that the thermistor chip shock resistance test.
Description
Technical Field
The utility model belongs to a thermistor chip in technical field, concretely relates to special thermistor chip shock resistance test's of variable frequency air conditioner probe subassembly.
Background
The NTC thermistor chip for the variable frequency air conditioner is a negative temperature coefficient thermistor chip, which is manufactured by using metal oxides such as manganese, cobalt, nickel, copper and the like as main materials and adopting a ceramic process, wherein the metal oxide materials have semiconductor properties, and when the temperature is low, the number of carriers of the oxide materials is small, so that the resistance value is high; the number of carriers is increased along with the rise of the temperature, so that the resistance value is reduced, the variation range of the NTC thermistor at room temperature is 100-1000000 ohms, the temperature coefficient is-2% -6.5%, and the NTC thermistor can be widely used for temperature measurement, temperature control, temperature compensation and the like.
In NTC thermistor chip's production process, need carry out the test of shocking resistance to the thermistor chip, so that the intensity of thermistor chip obtains guaranteeing, when carrying out the test of shocking resistance to the thermistor chip, when needing to use the probe subassembly to carry out the test of shocking resistance to the thermistor chip, current probe subassembly mostly is loop bar formula probe assembly, the impact strength that leads to the probe subassembly can not adjust, simultaneously because the repeated shock test of probe assembly, make the buffering effect of probe assembly poor, influence test stability and test accuracy, for this reason we propose a special thermistor chip of variable frequency air conditioner probe assembly of shocking resistance test.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a special thermistor chip of variable frequency air conditioner probe subassembly of shock resistance test to solve the problem that proposes in the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme: a probe assembly for impact resistance testing of a thermistor chip special for a variable frequency air conditioner comprises a probe sleeve and a probe rod, wherein the probe rod is sleeved inside the probe sleeve, the lower end of the probe rod extends to the outside of the probe sleeve, and the probe rod moves up and down repeatedly along the inner cavity of the probe sleeve;
the lower end of the probe needle rod is connected with a probe needle head used for carrying out impact resistance testing on the thermistor chip, and the probe needle head repeatedly moves up and down along with the probe needle rod and is used for carrying out continuous impact testing on the thermistor chip.
Preferably, a first spring groove is formed in the outer ring of the middle part of the probe rod, and a first spring is sleeved on the outer side of the first spring groove;
the top end of the probe needle rod is provided with a stroke adjusting rod, and a second spring is sleeved on the stroke adjusting rod.
Preferably, the outer side of the stroke adjusting rod is provided with an external thread, and the stroke adjusting rod is spirally connected with an adjusting nut matched with the external thread;
the adjusting nut can compress the elastic force of the second spring.
Preferably, a first limiting ring is arranged at the middle lower part of the inner side of the probe sleeve corresponding to the lower end of the first spring;
and a second limiting ring is arranged at the upper part of the interior of the probe sleeve corresponding to the lower end of the second spring.
Preferably, the upper end of the probe sleeve is provided with a threaded ring seat, the threaded ring seat is spirally connected with a nut cover, and the nut cover is provided with a through hole for the stroke adjusting rod to pass through.
Preferably, the outer side of the lower part of the probe needle rod is provided with symmetrically distributed stroke limiting grooves;
and a stroke limiting block is arranged at the lower part of the inner side of the probe sleeve corresponding to the lower section of the stroke limiting groove.
Preferably, the bottom end of the probe needle rod is provided with a thread groove, and the upper end of the probe needle head is provided with a threaded rod in threaded connection with the thread groove.
Preferably, the lower end of the probe needle head is provided with an impact end head, and the structure of the impact end head is hemispherical.
Compared with the prior art, the beneficial effects of the utility model are that:
1. the utility model discloses be equipped with first spring, second spring, stroke control pole, adjusting nut, first spacing ring and second spacing ring, through rotatory adjusting nut, compress the second spring to the second spacing ring, and then adjust the dynamics that the probe needle pole strikes downwards, when the probe needle pole strikes downwards, first spring compresses through the spacing of first spacing ring, conveniently cushions the repeated impact of probe subassembly, improves the stability that the probe subassembly strikes, improves thermistor chip shock resistance test's accuracy;
2. the utility model is provided with a stroke limiting groove and a stroke limiting block, which can play a role of guiding and moving the probe needle bar in the probe sleeve on one hand and play a role of stroke limiting on the movement of the probe needle bar in the probe sleeve on the other hand, thereby ensuring the normal use of the probe assembly;
3. the utility model discloses be equipped with thread groove and threaded rod, the change is dismantled to the probe syringe needle to the convenience, makes things convenient for later maintenance, prolongs the life of probe subassembly.
Drawings
Fig. 1 is a schematic exploded perspective view of the present invention;
FIG. 2 is a schematic view of the overall three-dimensional structure of the present invention;
fig. 3 is a schematic sectional view of the present invention.
In the figure: 1. a probe sleeve; 101. a threaded ring seat; 102. a stroke stopper; 103. a first limit ring; 104. a second stop collar; 2. A probe needle rod; 201. a first spring groove; 202. a stroke adjusting rod; 203. an external thread; 204. adjusting the nut; 205. a stroke limiting groove; 206. a thread groove; 3. a probe tip; 301. a threaded rod; 302. impacting the end head; 4. a nut cover; 401. a through hole; 5. a first spring; 6. a second spring.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-3, the probe assembly for impact resistance testing of the thermistor chip dedicated for the variable frequency air conditioner of the present invention includes a probe sleeve 1 and a probe rod 2, wherein the probe rod 2 is sleeved inside the probe sleeve 1, the lower end of the probe rod 2 extends to the outside of the probe sleeve 1, and the probe rod 2 repeatedly moves up and down along the inner cavity of the probe sleeve 1;
the lower end of the probe needle rod 2 is connected with a probe needle head 3 used for carrying out impact resistance testing on the thermistor chip, and the probe needle head 3 repeatedly moves up and down along with the probe needle rod 2 and is used for carrying out continuous impact testing on the thermistor chip.
In this embodiment, as shown in fig. 1 to 3, a first spring groove 201 is formed in the middle outer ring of the probe rod 2, and a first spring 5 is sleeved outside the first spring groove 201; a stroke adjusting rod 202 is arranged at the top end of the probe needle rod 2, and a second spring 6 is sleeved on the stroke adjusting rod 202;
the outer side of the stroke adjusting rod 202 is provided with an external thread 203, and the stroke adjusting rod 202 is spirally connected with an adjusting nut 204 matched with the external thread 203; the adjusting nut 204 can compress the elastic force of the second spring 6;
a first limiting ring 103 is arranged at the middle lower part of the inner side of the probe sleeve 1 corresponding to the lower end of the first spring 5;
a second limiting ring 104 is arranged at the upper part of the interior of the probe sleeve 1 corresponding to the lower end of the second spring 6;
the utility model discloses be equipped with first spring 5, second spring 6, stroke adjusting rod 202, adjusting nut 204, first spacing ring 103 and second spacing ring 104, through rotatory adjusting nut 204, compress second spring 6 to second spacing ring 104, and then adjust the dynamics that the probe needle pole 2 assaulted downwards, when the probe needle pole 2 assaults downwards, first spring 5 is spacing and then compress through first spacing ring 103, the convenience is cushioned repeatedly impacting probe assembly, improve the stability that probe assembly assaulted, improve thermistor chip shock-resistance test's accuracy.
In this embodiment, as shown in fig. 1, a threaded ring seat 101 is disposed at an upper end of the probe casing 1, a nut cover 4 is screwed on the threaded ring seat 101, and a through hole 401 for the stroke adjusting rod 202 to pass through is formed in the nut cover 4, so that the probe needle rod 2 can move up and down in the probe casing 1.
In this embodiment, as shown in fig. 1 and 3, the outer side of the lower part of the probe needle rod 2 is provided with symmetrically distributed stroke limiting grooves 205;
a stroke limiting block 102 is arranged at the lower part of the inner side of the probe sleeve 1 corresponding to the lower section of the stroke limiting groove 205;
the utility model discloses be equipped with stroke spacing groove 205 and stroke stopper 102, on the one hand to probe needle bar 2 play the effect that the direction removed in probe sleeve pipe 1, on the other hand can play the spacing effect of stroke to probe needle bar 2 removal in probe sleeve pipe 1, ensures probe assembly's normal use.
In this embodiment, as shown in fig. 1 and 3, a thread groove 206 is formed at the bottom end of the probe needle rod 2, a threaded rod 301 spirally connected with the thread groove 206 is arranged at the upper end of the probe needle head 3, an impact tip 302 is arranged at the lower end of the probe needle head 3, and the impact tip 302 is hemispherical;
the utility model discloses be equipped with thread groove 206 and threaded rod 301, the change is dismantled to probe syringe needle 3 to the convenience, makes things convenient for later maintenance, prolongs the life of probe subassembly.
In summary, the use flow of the probe assembly for the impact resistance test of the thermistor chip dedicated for the inverter air conditioner provided by the embodiment is as follows:
s1: when the probe assembly is used, firstly, the adjusting nut 204 is rotated to compress the second spring 6 to the second limiting ring 104, so that the downward impact force of the probe rod 2 is adjusted to adapt to the test of different impact forces of the thermistor chip;
s2: then the stroke adjusting rod 202 is installed on an impact resistance testing device through a connector, when the probe needle rod 2 impacts downwards, the first spring 5 is compressed through the limiting of the first limiting ring 103, and the repeated impact of the probe assembly is buffered conveniently;
s3: meanwhile, the probe needle rod 2 moves downwards along the stroke limiting block 102 in the probe sleeve 1 according to the stroke limiting groove 205, on one hand, the probe needle rod 2 can move in the probe sleeve 1 in a guiding mode, on the other hand, the probe needle rod 2 can move in the probe sleeve 1 in a stroke limiting mode until the impact end 302 at the lower end of the probe needle head 3 impacts the thermistor chip;
s4: then, the probe shaft 2 is restored by being pushed up upward by the elastic action of the first spring 5 and the second spring 6, and then downward impact is repeated.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (8)
1. The probe assembly for the impact resistance test of the thermistor chip special for the variable frequency air conditioner is characterized by comprising a probe sleeve (1) and a probe rod (2), wherein the probe rod (2) is sleeved inside the probe sleeve (1), the lower end of the probe rod (2) extends to the outside of the probe sleeve (1), and the probe rod (2) repeatedly moves up and down along the inner cavity of the probe sleeve (1);
the lower end of the probe needle rod (2) is connected with a probe needle head (3) used for carrying out impact resistance testing on the thermistor chip, and the probe needle head (3) moves up and down repeatedly along with the probe needle rod (2) and is used for carrying out continuous impact testing on the thermistor chip.
2. The probe assembly for the impact resistance test of the thermistor chip special for the variable frequency air conditioner as claimed in claim 1, wherein: a first spring groove (201) is formed in the outer ring of the middle of the probe rod (2), and a first spring (5) is sleeved on the outer side of the first spring groove (201);
the top end of the probe needle rod (2) is provided with a stroke adjusting rod (202), and a second spring (6) is sleeved on the stroke adjusting rod (202).
3. The probe assembly for the impact resistance test of the thermistor chip special for the variable frequency air conditioner as claimed in claim 2, wherein: an external thread (203) is arranged on the outer side of the stroke adjusting rod (202), and an adjusting nut (204) matched with the external thread (203) is spirally connected to the stroke adjusting rod (202);
the adjusting nut (204) can compress the elastic force of the second spring (6).
4. The probe assembly for the impact resistance test of the thermistor chip special for the variable frequency air conditioner as claimed in claim 2, wherein: a first limiting ring (103) is arranged at the middle lower part of the inner side of the probe sleeve (1) corresponding to the lower end of the first spring (5);
and a second limiting ring (104) is arranged at the upper part of the interior of the probe sleeve (1) corresponding to the lower end of the second spring (6).
5. The probe assembly for the anti-impact test of the thermistor chip special for the variable frequency air conditioner as claimed in claim 2, wherein: the probe sleeve is characterized in that a threaded ring seat (101) is arranged at the upper end of the probe sleeve (1), a nut cover (4) is connected to the threaded ring seat (101) in a threaded mode, and a through hole (401) used for the stroke adjusting rod (202) to penetrate through is formed in the nut cover (4).
6. The probe assembly for the impact resistance test of the thermistor chip special for the variable frequency air conditioner as claimed in claim 1, wherein: the outer side of the lower part of the probe needle rod (2) is provided with symmetrically distributed stroke limiting grooves (205);
and a stroke limiting block (102) is arranged at the lower part of the inner side of the probe sleeve (1) corresponding to the lower section of the stroke limiting groove (205).
7. The probe assembly for the impact resistance test of the thermistor chip special for the variable frequency air conditioner as claimed in claim 1, wherein: the bottom end of the probe needle rod (2) is provided with a thread groove (206), and the upper end of the probe needle head (3) is provided with a threaded rod (301) in threaded connection with the thread groove (206).
8. The probe assembly for the impact resistance test of the thermistor chip special for the variable frequency air conditioner as claimed in claim 1, wherein: the lower extreme of probe syringe needle (3) is equipped with strikes end (302), the structure of striking end (302) is hemisphere, disc or toper.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221145252.XU CN217385603U (en) | 2022-05-13 | 2022-05-13 | Probe assembly for impact resistance test of thermistor chip special for variable frequency air conditioner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221145252.XU CN217385603U (en) | 2022-05-13 | 2022-05-13 | Probe assembly for impact resistance test of thermistor chip special for variable frequency air conditioner |
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| Publication Number | Publication Date |
|---|---|
| CN217385603U true CN217385603U (en) | 2022-09-06 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202221145252.XU Active CN217385603U (en) | 2022-05-13 | 2022-05-13 | Probe assembly for impact resistance test of thermistor chip special for variable frequency air conditioner |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116078702A (en) * | 2023-03-24 | 2023-05-09 | 宁波科联电子有限公司 | Thermistor detection device and automatic sorting machine |
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2022
- 2022-05-13 CN CN202221145252.XU patent/CN217385603U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116078702A (en) * | 2023-03-24 | 2023-05-09 | 宁波科联电子有限公司 | Thermistor detection device and automatic sorting machine |
| CN116078702B (en) * | 2023-03-24 | 2023-08-18 | 宁波科联电子有限公司 | Thermistor detection device and automatic sorting machine |
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