CN116400134A - Clock vibration testing device and circuit - Google Patents
Clock vibration testing device and circuit Download PDFInfo
- Publication number
- CN116400134A CN116400134A CN202310042170.5A CN202310042170A CN116400134A CN 116400134 A CN116400134 A CN 116400134A CN 202310042170 A CN202310042170 A CN 202310042170A CN 116400134 A CN116400134 A CN 116400134A
- Authority
- CN
- China
- Prior art keywords
- probe
- circuit
- seat
- circuit board
- belting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 113
- 239000000523 sample Substances 0.000 claims abstract description 121
- 239000000463 material Substances 0.000 claims description 13
- 238000001914 filtration Methods 0.000 claims description 4
- 238000004519 manufacturing process Methods 0.000 abstract description 7
- 239000013078 crystal Substances 0.000 abstract description 5
- 239000010453 quartz Substances 0.000 abstract description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 4
- 239000003990 capacitor Substances 0.000 description 11
- 238000000034 method Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 230000009471 action Effects 0.000 description 4
- 230000003321 amplification Effects 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000005253 cladding Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention belongs to the technical field of quartz crystal oscillators, and particularly relates to a clock vibration testing device and a clock vibration testing circuit, wherein the clock vibration testing device comprises a Zhong Zhen circuit board, a probe fixing seat and an anti-carrying device, the probe fixing seat is fixedly connected with the Zhong Zhen circuit board, and the Zhong Zhen circuit board is fixed on the anti-carrying device; the anti-belting device comprises an anti-belting seat, a movable gasket arranged in the anti-belting seat and an elastic piece arranged between the movable gasket and the anti-belting seat, wherein a Zhong Zhen circuit board is fixed at the upper end of the anti-belting seat, a limit clamping groove is formed in the lower end of the anti-belting seat, the movable gasket penetrates through the limit clamping groove to extend towards the outside of the anti-belting seat, a test probe is fixed on the Zhong Zhen circuit board and sequentially penetrates through the probe fixing seat and the anti-belting seat and extends to the movable gasket, so that the phenomenon of belting can be effectively avoided, and the test efficiency and the production efficiency are effectively improved.
Description
Technical Field
The invention relates to the technical field of quartz crystal oscillators, in particular to a clock vibration testing device and a circuit.
Background
In the technical field of quartz crystal oscillators, it can be classified into passive and active according to a large category. The active crystal resonator is called a clock oscillator, and is abbreviated as Zhong Zhen. Zhong Zhen is a frequency source device which integrates a quartz crystal resonator having a piezoelectric effect and an oscillating circuit, and is powered, i.e., has a frequency signal output, and is widely used in various consumer electronic systems.
Because Zhong Zhen is complex to actually produce, zhong Zhen has poor performance due to various factors in the production process, so that strict testing is required in the last production process. Currently, a Zhong Zhen test system on the market is generally divided into two test boards, one is used for testing waveform signals and one is used for testing frequency signals, and the two test boards are separately tested, so that a test flow is complicated; in the testing process, as the probes of the testing head are electrified and compress Zhong Zhen products when contacting Zhong Zhenshi, after the testing is completed, the testing head moves upwards and Zhong Zhen products are adhered to the probes of the testing head, zhong Zhen products move upwards together with the testing head, so that a material carrying phenomenon occurs, and the testing efficiency of Zhong Zhen is affected. The existing Zhong Zhen testing device is high in manufacturing cost, and Zhong Zhen specifications capable of being compatible with testing are single. Therefore, it is necessary to design a clock testing device to overcome the defects in the prior art.
Disclosure of Invention
The invention aims to provide a clock vibration testing device and a circuit, and aims to solve the technical problems that a Zhong Zhen testing device in the prior art needs a plurality of testing boards for testing frequency signals and waveform signals, so that the testing process is complicated, and the Zhong Zhen testing device can generate a material carrying phenomenon during testing.
In order to achieve the above purpose, the embodiment of the invention provides a clock vibration testing device, which comprises a Zhong Zhen circuit board, a probe fixing seat and an anti-carrying device, wherein the probe fixing seat is fixedly connected with the Zhong Zhen circuit board, and the Zhong Zhen circuit board is fixed on the anti-carrying device;
the anti-belting device comprises an anti-belting seat, a movable gasket arranged in the anti-belting seat and an elastic piece arranged between the movable gasket and the anti-belting seat, wherein a Zhong Zhen circuit board is fixed at the upper end of the anti-belting seat, a limit clamping groove is formed in the lower end of the anti-belting seat, the movable gasket penetrates through the limit clamping groove to extend towards the outside of the anti-belting seat, and a test probe is fixed on the Zhong Zhen circuit board and sequentially penetrates through the probe fixing seat and the anti-belting seat and extends to the movable gasket.
Optionally, the movable gasket includes gasket boss and gasket connecting plate, the gasket connecting plate set up in the both ends of gasket boss, the gasket connecting plate with prevent the interior bottom butt of taking the seat, the gasket boss with spacing draw-in groove mutually support and connect and to prevent taking the bottom outside of seat to extend, the gasket boss sets up a plurality of boss through-holes, the test probe runs through the boss through-hole.
Optionally, the Zhong Zhen circuit board includes the board core body, be provided with power module, probe module, frequency output module, waveform output module and amplification module on the board core body, the probe module set up in one side of board core body, the waveform output module the amplification module with frequency output module from right to left set up respectively in probe module's left side, power module set up in frequency output module's downside.
Optionally, a plurality of first fixing holes are formed in one side of the board core body, the first fixing holes are located on the upper side and the lower side of the probe module, and the first fixing holes are used for being fixedly connected with the anti-carrying device; a plurality of second fixing holes are further formed in one side of the board core body, the second fixing holes are located between the first fixing holes, and the second fixing holes are used for being fixedly connected with the probe fixing base; the plate core body is further provided with a third fixing hole, the third fixing hole is positioned at the left side of the waveform output module, and the third fixing hole is used for being fixedly connected with an external oscilloscope probe; the other side of the board core body is provided with a plurality of fourth fixing holes, and the fourth fixing holes are used for being fixedly connected with an external test machine.
Optionally, a screw hole is formed at the upper end of the anti-tape material seat, a stud is in threaded connection with the screw hole, the stud penetrates through the Zhong Zhen circuit board, the Zhong Zhen circuit board is in threaded connection with the stud through a nut and is fixed at the upper end of the anti-tape material seat, and the Zhong Zhen circuit board is located between the anti-tape material seat and the nut.
Optionally, a fixing column is arranged on the gasket connecting plate, one end of the elastic piece is sleeved on the fixing column, and the other end of the elastic piece is sleeved on a stud passing through the screw hole and extending to the inside of the anti-belt material seat.
Optionally, the probe fixing base includes unable adjustment base and center piece, the center piece is fixed in unable adjustment base's middle part, the middle part of probe fixing base is equipped with eight probe through-holes, test probe is fixed in Zhong Zhen circuit board and runs through the probe through-hole, the both sides of probe fixing base are provided with the fifth fixed orifices, the fifth fixed orifices be used for with Zhong Zhen circuit board fixed connection.
Optionally, a square groove is arranged at the bottom of the fixing base, the square groove is located below the center block, the length and the width of the square groove are matched with those of the center block, and the depth of the square groove is 1mm.
A clock testing circuit applied to the Zhong Zhen circuit board, comprising:
the power supply circuit comprises a power supply circuit and a filter circuit, wherein the power supply circuit is connected with the filter circuit, the power supply circuit is used for supplying power and enabling control, and the filter circuit is used for filtering power supply;
a probe circuit connected with the power supply circuit, the probe circuit being for connection with Zhong Zhen,
a signal output circuit including a waveform output circuit and a frequency output circuit, the waveform output circuit is connected with the probe circuit, and the waveform output circuit is connected with the waveform output circuit through an amplifying circuit.
Optionally, the probe circuit includes a test probe, a first pin and a fourth pin of the test probe are respectively connected with the power supply circuit, a second pin of the test probe is grounded, a third pin of the test probe is connected with the amplifying circuit and the waveform output circuit, and the Zhong Zhen circuit board is electrically connected with Zhong Zhen through the test probe.
The Zhong Zhen testing device and the circuit provided by the embodiment of the invention have one or more of the following technical schemes:
according to the invention, the Zhong Zhen circuit board is fixed on the anti-carrying device, in the test process, the Zhong Zhen circuit board is pressed down under the action of the external test machine, the movable gasket is retracted towards the inside of the anti-carrying seat, at the moment, the test probe is electrically connected with the contact of Zhong Zhen through the movable gasket, after the test is finished, the external test machine controls the Zhong Zhen circuit board to move upwards, the movable gasket extends out of the anti-carrying seat and separates Zhong Zhen contacted with the probe, and the Zhong Zhen and the probe are prevented from moving upwards simultaneously, so that the carrying phenomenon can be effectively avoided, and the test efficiency and the production efficiency can be effectively improved.
Drawings
Fig. 1 is a front view of a Zhong Zhen testing device according to an embodiment of the present invention in a normal state;
fig. 2 is a front view of a pressed state of a Zhong Zhen testing device according to an embodiment of the present invention;
FIG. 3 is a front view of an anti-belting device according to an embodiment of the present invention;
FIG. 4 is a bottom view of an anti-belting device according to an embodiment of the present invention;
FIG. 5 is a front view of a probe holder according to an embodiment of the present invention;
FIG. 6 is a top view of a probe-holder according to an embodiment of the present invention;
fig. 7 is a schematic diagram of a Zhong Zhen test circuit according to an embodiment of the invention.
Wherein, each reference sign in the figure:
1. zhong Zhen circuit board; 11. A board core body; 111. A first fixing hole;
112. a second fixing hole; 113. A third fixing hole; 114. A fourth fixing hole;
12. a power supply module; 13. A probe module; 131. A test probe;
14. a frequency output module; 15. A waveform output module; 16. An amplifying module;
2. a probe fixing seat; 21. A fixed base; 211. Square grooves;
22. a center block; 23. A probe through hole; 24. A fifth fixing hole;
3. a material-carrying prevention device; 31. An anti-carrying seat; 311. A screw cap;
312. a stud; 32. A removable spacer; 321. A gasket boss;
322. a gasket connecting plate; 323. Fixing the column; 33. An elastic member;
4. a power supply circuit; 41. A power supply circuit; 42. A filter circuit;
5. a probe circuit; 6. A signal output circuit; 61. A waveform output circuit;
62. a frequency output circuit; 7. An amplifying circuit.
Detailed Description
Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are exemplary and intended to illustrate embodiments of the invention and should not be construed as limiting the invention.
In the description of the embodiments of the present invention, it should be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, merely to facilitate description of the embodiments of the present invention and simplify description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the embodiments of the present invention, the meaning of "plurality" is two or more, unless explicitly defined otherwise.
In the embodiments of the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured" and the like are to be construed broadly and include, for example, either permanently connected, removably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the embodiments of the present invention will be understood by those of ordinary skill in the art according to specific circumstances.
In one embodiment of the present invention, as shown in fig. 1 to 7, a clock testing device is provided, which includes a Zhong Zhen circuit board 1, a probe fixing base 2 and a material-carrying prevention device 3. The probe fixing seat 2 is fixedly connected with the Zhong Zhen circuit board 1, and the Zhong Zhen circuit board 1 is fixed on the anti-carrying device 3; the anti-belting device 3 comprises an anti-belting seat 31, a movable gasket 32 arranged in the anti-belting seat 31 and an elastic piece 33 arranged between the movable gasket 32 and the anti-belting seat 31, wherein the Zhong Zhen circuit board 1 is fixed at the upper end of the anti-belting seat 31, a limit clamping groove (not shown) is arranged at the lower end of the anti-belting seat 31, the limit clamping groove is a through groove, the movable gasket 32 penetrates through the limit clamping groove to extend to the outside of the anti-belting seat 31, a test probe 131 is fixed on the Zhong Zhen circuit board 1, and the test probe 131 sequentially penetrates through the probe fixing seat 2 and the anti-belting seat 31 and extends to the movable gasket 32. In this embodiment, the elastic member 33 is a spring.
According to the invention, the Zhong Zhen circuit board 1 is fixed on the anti-taping device 3, in the testing process, the Zhong Zhen circuit board 1 is pressed down under the action of an external test machine, the movable gasket 32 is retracted towards the inside of the anti-taping seat 31, at the moment, the test probe 131 passes through the contact points of the movable gasket 32 and Zhong Zhen to be electrically connected, after the testing is finished, the external test machine controls the Zhong Zhen circuit board 1 to move upwards, the movable gasket 32 extends towards the outside of the anti-taping seat 31 to separate Zhong Zhen contacted with the probe, and the Zhong Zhen and the probe are prevented from moving upwards simultaneously, so that the taping phenomenon can be effectively avoided, and the testing efficiency and the production efficiency can be effectively improved.
Specifically, in another embodiment of the present invention, as shown in fig. 1 to 6, the removable shim 32 includes a shim boss 321 and a shim connecting plate 322. The gasket connecting plate 322 sets up in the both ends of gasket boss 321, and gasket connecting plate 322 and the interior bottom butt of preventing taking seat 31, gasket boss 321 and spacing draw-in groove mutually support and are connected and extend to the bottom outside of preventing taking seat 31, and gasket boss 321 sets up a plurality of boss through-holes (not shown), and test probe 131 runs through the boss through-hole. After the Zhong Zhen circuit board 1 is pressed down, the gasket connecting plate 322 and the gasket boss 321 move upwards to the inside of the anti-tape material seat 31, and meanwhile, the elastic piece 33 is deformed to be in a compressed state, and at the moment, the test probe 131 penetrates through the boss through hole and is exposed out of the bottom of the anti-tape material seat 31, so that the test probes 131 and Zhong Zhen can be electrically connected; when Zhong Zhen circuit board 1 moves up the back, elastic component 33 is the nature state that returns, gasket connecting plate 322 and the inside butt in bottom of preventing taking seat 31, gasket boss 321 stretches out to the outside in the bottom of preventing taking seat 31 from spacing draw-in groove, this spacing draw-in groove restriction gasket boss 321 outwards stretches out the length, prevent that the gasket boss from popping out apart from overlength, will expose the outside test probe 131 in preventing taking seat 31 bottom through boss through-hole cladding in movable gasket 32, cut off the contact of probe and Zhong Zhen, prevent taking the material, can prevent simultaneously that test probe 131 from receiving outside wearing and tearing.
Specifically, in another embodiment of the present invention, as shown in fig. 1 to 6, the Zhong Zhen circuit board 1 includes a board core body 11, and a power supply module 12, a probe module 13, a frequency output module 14, a waveform output module 15, and an amplifying module 16 are provided on the board core body 11. The probe module 13 is disposed at one side of the board core body 11, the waveform output module 15, the amplifying module 16 and the frequency output module 14 are disposed at the left side of the probe module 13 from right to left, and the power supply module 12 is disposed at the lower side of the frequency output module 14.
Further, a plurality of first fixing holes 111 are formed in one side of the board core body 11, the first fixing holes 111 are located on the upper side and the lower side of the probe module 13, and the first fixing holes 111 are fixedly connected with the anti-carrying device 3. A plurality of second fixing holes 112 are further formed in one side of the board core body 11, the second fixing holes 112 are located between the first fixing holes 111, and the second fixing holes 112 are used for being fixedly connected with the probe fixing base 2; the panel core body 11 is also provided with a third fixing hole 113, the third fixing hole 113 is positioned at the left side of the waveform output module 15, and the third fixing hole 113 is used for being fixedly connected with an external oscilloscope probe. The other side of the board core body 11 is provided with a plurality of fourth fixing holes 114, and the fourth fixing holes 114 are used for being fixedly connected with an external test machine. The user can obtain Zhong Zhen waveform signals through the electric connection of the external oscilloscope probe and the waveform output module 15, meanwhile, under the action of the amplifying module 16, signals are amplified in opposite phase and output to the frequency output module 14, zhong Zhen frequency signals are obtained through the electric connection of the external frequency meter and the frequency output module 14, and therefore testing of the waveform signals and the frequency signals is achieved on the Zhong Zhen circuit board 1 at the same time, and the testing efficiency of Zhong Zhen is greatly improved.
Specifically, in another embodiment of the present invention, as shown in fig. 1 to 6, a screw hole (not shown) is provided at the upper end of the anti-taping seat 31, a stud 312 is screwed with the screw hole, the stud 312 penetrates the Zhong Zhen circuit board 1, zhong Zhen circuit board 1 is screwed with the stud 312 by a nut 311, and is fixed at the upper end of the anti-taping seat 31, and the Zhong Zhen circuit board 1 is located between the anti-taping seat 31 and the nut 311. Further, a fixing column 323 is disposed on the gasket connecting plate 322, one end of the elastic member 33 is sleeved on the fixing column 323, and the other end of the elastic member 33 is sleeved on the stud 312 passing through the screw hole and extending to the inside of the anti-tape seat 31. Therefore, the Zhong Zhen circuit board 1 can be stably arranged on the anti-tape material seat 31, and the phenomenon that Zhong Zhen and a probe are in poor contact due to loosening in the pressing process is prevented.
Specifically, in another embodiment of the present invention, as shown in fig. 1 to 6, the probe holder 2 includes a holder base 21 and a center block 22. The center block 22 is fixed in the middle part of unable adjustment base 21, and the middle part of probe fixing base 2 is equipped with eight probe through-holes 23, and test probe 131 is fixed in Zhong Zhen circuit board 1 and runs through probe through-hole 23, and the both sides of probe fixing base 2 are provided with fifth fixed orifices 24, and fifth fixed orifices 24 are used for with Zhong Zhen circuit board 1 fixed connection. The probe fixing seat 2 is mutually matched and screwed with the second fixing piece through the fifth fixing hole 24, so that the probe fixing seat 2 is fixed on the Zhong Zhen circuit board 1. Wherein, the probe fixing seat 2 is integrally arranged in an axisymmetric way. In the present embodiment, the length of the fixing base 21 is 20mm, the width of the fixing base 21 is 7mm, and the height of the fixing base 21 is 3mm; the length of the center block 22 was 6mm, the width of the center block 22 was 7mm, and the height of the center block 22 was 4mm. Further, a square groove 211 is formed in the bottom of the fixing base 21, the square groove 211 is located below the center block 22, the length and width of the square groove 211 are matched with those of the center block 22, and the depth of the square groove 211 is 1mm. And the dimensional tolerance of the probe holder 2 is + -0.1 mm. The probe fixing seat 2 adopts a square frame sinking because the center block 22 is arranged in a large size, so that the bottom of the fixing base 21 is not suitable for the circular sinking in the market. And through being the jumbo size setting with center piece 22, make probe fixing base 2 can be provided with 8 probe holes at the middle part of center piece 22 to can compatible multiple different specification Zhong Zhen's of adaptation test, simple structure, reasonable in design can improve production test efficiency, saves the required cost of test.
The invention also provides a clock vibration testing circuit which is applied to the Zhong Zhen circuit board 1 and comprises a power supply circuit 4, a probe circuit 5, an amplifying circuit 7 and a signal output circuit 6 as shown in fig. 1 to 7. The power supply circuit 4 comprises a power supply circuit 41 and a filter circuit 42, wherein the power supply circuit 41 is connected with the filter circuit 42, the power supply circuit 41 is used for power supply and enabling control, and the filter circuit 42 is used for power supply filtering; the probe circuit 5 is connected to the power supply circuit 4, the probe circuit 5 is connected to the Zhong Zhen, the signal output circuit 6 includes a waveform output circuit 61 and a frequency output circuit 62, the waveform output circuit 61 is connected to the probe circuit 5, and the waveform output circuit 61 is connected to the waveform output circuit 61 through the amplifying circuit 7.
Specifically, in another embodiment of the present invention, as shown in fig. 7, the probe circuit 5 includes a test probe 131. The first pin and the fourth pin of the test probe 131 are respectively connected with the power supply circuit 4, the second pin of the test probe 131 is grounded, and the third pin of the test probe 131 is connected with the amplifying circuit 7 and the waveform output circuit 61. The test probes 131 can be brought into contact with Zhong Zhen to make electrical connection with Zhong Zhen the circuit boards 1 and Zhong Zhen.
Specifically, in another embodiment of the present invention, the waveform output circuit 61 includes a waveform output port J1. The second pin of the waveform output port J1 is connected to the third pin of the test probe 131, the first pin of the waveform output port J1 is grounded, and the waveform output port J1 is used for being connected to an external oscilloscope probe and outputting a waveform signal to an external oscilloscope.
Specifically, in another embodiment of the present invention, as shown in fig. 7, the frequency output circuit 62 includes a frequency output port J2. The first pin of the frequency output port J2 is connected with the amplifying circuit 7, other pins of the frequency output port J2 are grounded, and the frequency output port J2 is connected with an external frequency meter through an SMA wire to output a frequency signal.
Specifically, in another embodiment of the present invention, as shown in fig. 7, the amplifying circuit 7 includes an inverter U2 and a load capacitance CL. One end of the load capacitor CL is connected to the third pin of the test probe 131 and the input end of the inverter U2, and the other end of the load capacitor CL is grounded, and the load capacitor CL is used for simulating an equivalent circuit load in actual use, so that the signal level transmission achieves the optimal effect. The second pin of the inverter U2 is connected with the second pin of the waveform output port J1, and the second pin of the inverter U2 is also connected with the third pin of the test probe 131; the fourth pin of the inverter U2 is connected with the frequency output port J2, wherein the second pin of the inverter U2 is an input pin, the fourth pin of the inverter U2 is an output pin, the third pin of the inverter U2 is grounded, and the fifth pin of the inverter U2 is connected with the power supply circuit 4. In general, the output signal of Zhong Zhen has a relatively low load capacity, and the test frequency and waveform are inaccurate, and the inverter U2 is used for inverting amplification before the test frequency signal, so that the tested data is more accurate. By providing the inverter U2, the Zhong Zhen signal can be amplified in an inverted state and outputted as a frequency signal without affecting the waveform signal of the preceding stage.
Specifically, in another embodiment of the present invention, as shown in fig. 7, the power supply circuit 41 includes a power supply port P1 and a power supply port VCC. The first pin of the power supply port P1 is connected with the first pin of the test probe 131, where the first pin of the power supply port P1 is an enable control pin, so as to implement enable control of the test probe 131 under power supply, thereby performing a test procedure on the clock. The second pin of the power supply port P1 is grounded, the third pin of the power supply port P1 is connected with the power supply port VCC, the power supply port VCC is connected with an external power supply through a power line, and the third pin of the power supply port P1 is also connected with the fourth pin of the test probe 131 to supply power for the test of Zhong Zhen.
Specifically, in another embodiment of the present invention, as shown in fig. 7, the filter circuit 42 includes a first filter capacitor C1 and a second filter capacitor C2. One end of the first filter capacitor C1 is connected with the third pin of the power supply port P1, the other end of the first filter capacitor C1 is grounded, one end of the second filter capacitor C2 is connected with the third pin of the power supply port P1, the other end of the second filter capacitor C2 is grounded, the first filter capacitor C1 and the second filter capacitor C2 are used for filtering of a power supply, direct-current output of the power supply is smooth and stable, test products are protected, and tested data are more accurate.
When the tester is used, under the action of an external tester, the Zhong Zhen circuit board 1 moves downwards, so that the test probe 131 arranged on the Zhong Zhen circuit board 1 can be in contact with Zhong Zhen, the electrical connection between the Zhong Zhen circuit board 1 and the Zhong Zhen is realized, the power supply circuit 4 supplies power to the test probe 131, a Zhong Zhen voltage signal is output to the waveform output port J1, so that the waveform signal is output to an external oscilloscope, the waveform signal is tested, the Zhong Zhen voltage signal is reversely amplified through the inverter U2, the amplified frequency signal is output to the frequency output port J2, the frequency signal is output to the external frequency meter, the frequency signal is tested, whether Zhong Zhen is qualified is judged according to the readings of the external oscilloscope and the external frequency meter, and the frequency and waveform test of Zhong Zhen is finished.
The foregoing is only a preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art, who is within the scope of the present invention, should make equivalent substitutions or modifications according to the technical scheme of the present invention and the inventive concept thereof, and should be covered by the scope of the present invention.
Claims (10)
1. The clock vibration testing device is characterized by comprising a Zhong Zhen circuit board, a probe fixing seat and an anti-carrying device, wherein the probe fixing seat is fixedly connected with the Zhong Zhen circuit board, and the Zhong Zhen circuit board is fixed on the anti-carrying device;
the anti-belting device comprises an anti-belting seat, a movable gasket arranged in the anti-belting seat and an elastic piece arranged between the movable gasket and the anti-belting seat, wherein a Zhong Zhen circuit board is fixed at the upper end of the anti-belting seat, a limit clamping groove is formed in the lower end of the anti-belting seat, the movable gasket penetrates through the limit clamping groove to extend towards the outside of the anti-belting seat, and a test probe is fixed on the Zhong Zhen circuit board and sequentially penetrates through the probe fixing seat and the anti-belting seat and extends to the movable gasket.
2. The clock vibration testing device according to claim 1, wherein the movable gasket comprises a gasket boss and a gasket connecting plate, the gasket connecting plate is arranged at two ends of the gasket boss, the gasket connecting plate is abutted with the inner bottom of the anti-carrying seat, the gasket boss is mutually matched and connected with the limit clamping groove and extends to the outer bottom of the anti-carrying seat, the gasket boss is provided with a plurality of boss through holes, and the test probe penetrates through the boss through holes.
3. The clock testing device according to claim 1, wherein the Zhong Zhen circuit board comprises a board core body, a power supply module, a probe module, a frequency output module, a waveform output module and an amplifying module are arranged on the board core body, the probe module is arranged on one side of the board core body, the waveform output module, the amplifying module and the frequency output module are respectively arranged on the left side of the probe module from right to left, and the power supply module is arranged on the lower side of the frequency output module.
4. The clock testing device according to claim 3, wherein a plurality of first fixing holes are formed in one side of the board core body, the first fixing holes are located on the upper side and the lower side of the probe module, and the first fixing holes are used for being fixedly connected with the anti-carrying device; a plurality of second fixing holes are further formed in one side of the board core body, the second fixing holes are located between the first fixing holes, and the second fixing holes are used for being fixedly connected with the probe fixing base; the plate core body is further provided with a third fixing hole, the third fixing hole is positioned at the left side of the waveform output module, and the third fixing hole is used for being fixedly connected with an external oscilloscope probe; the other side of the board core body is provided with a plurality of fourth fixing holes, and the fourth fixing holes are used for being fixedly connected with an external test machine.
5. The clock testing device of claim 2, wherein the upper end of the anti-tape material seat is provided with a screw hole, a stud is screwed with the screw hole, the stud penetrates through the Zhong Zhen circuit board, the Zhong Zhen circuit board is screwed with the stud through a nut and is fixed at the upper end of the anti-tape material seat, and the Zhong Zhen circuit board is positioned between the anti-tape material seat and the nut.
6. The device for testing clock vibration according to claim 5, wherein the gasket connecting plate is provided with a fixing column, one end of the elastic member is sleeved on the fixing column, and the other end of the elastic member is sleeved on a stud passing through the screw hole and extending into the anti-tape seat.
7. The clock testing device according to claim 1, wherein the probe fixing base comprises a fixing base and a center block, the center block is fixed at the middle part of the fixing base, eight probe through holes are formed in the middle part of the probe fixing base, the test probes are fixed on the Zhong Zhen circuit board and penetrate through the probe through holes, and fifth fixing holes are formed in two sides of the probe fixing base and are fixedly connected with the Zhong Zhen circuit board.
8. The device for testing the clock vibration according to claim 7, wherein a square groove is formed in the bottom of the fixing base, the square groove is located below the center block, the length and the width of the square groove are matched with those of the center block, and the depth of the square groove is 1mm.
9. A clock testing circuit for use with the Zhong Zhen circuit board of any one of claims 1-8, comprising:
the power supply circuit comprises a power supply circuit and a filter circuit, wherein the power supply circuit is connected with the filter circuit, the power supply circuit is used for supplying power and enabling control, and the filter circuit is used for filtering power supply;
a probe circuit connected with the power supply circuit, the probe circuit being for connection with Zhong Zhen,
the signal output circuit comprises a waveform output circuit and a frequency output circuit, the waveform output circuit is connected with the probe circuit, and the waveform output circuit is connected with the waveform output circuit through an amplifying circuit.
10. The clock testing circuit of claim 9, wherein the probe circuit comprises a test probe, a first pin and a fourth pin of the test probe are respectively connected with the power supply circuit, a second pin of the test probe is grounded, a third pin of the test probe is connected with the amplifying circuit and the waveform output circuit, and the Zhong Zhen circuit board is electrically connected with Zhong Zhen through the test probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310042170.5A CN116400134A (en) | 2023-01-12 | 2023-01-12 | Clock vibration testing device and circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310042170.5A CN116400134A (en) | 2023-01-12 | 2023-01-12 | Clock vibration testing device and circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116400134A true CN116400134A (en) | 2023-07-07 |
Family
ID=87016685
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310042170.5A Pending CN116400134A (en) | 2023-01-12 | 2023-01-12 | Clock vibration testing device and circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116400134A (en) |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006058125A (en) * | 2004-08-19 | 2006-03-02 | Fujitsu Ltd | Frequency modulation tester for crystal oscillator and frequency modulation test method |
| CN102565676A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
| CN203616403U (en) * | 2013-11-14 | 2014-05-28 | 天津伍嘉联创科技发展有限公司 | Two-stage multi-station quartz crystal testing mechanism |
| CN204649794U (en) * | 2015-05-07 | 2015-09-16 | 浙江东晶电子股份有限公司 | A kind of measuring head of automatic fine tuning machine |
| CN106199089A (en) * | 2016-10-10 | 2016-12-07 | 广东惠伦晶体科技股份有限公司 | A kind of anti-strip device for quartz crystal testing head |
| CN107290240A (en) * | 2017-07-27 | 2017-10-24 | 江苏集萃有机光电技术研究所有限公司 | QCM and detection method |
| CN109581181A (en) * | 2017-09-29 | 2019-04-05 | 黄蕊 | A kind of on-line measuring device of quartz crystal product |
| CN209727678U (en) * | 2019-04-01 | 2019-12-03 | 上海工程技术大学 | A kind of portable quartz crystal microbalance driving device |
| CN111398705A (en) * | 2020-03-13 | 2020-07-10 | 天津中晟达科技有限公司 | Automatic electric measuring device with computer |
| CN211741340U (en) * | 2019-11-21 | 2020-10-23 | 苏州好博医疗器械有限公司 | Circuit board detection tool with self-checking device |
-
2023
- 2023-01-12 CN CN202310042170.5A patent/CN116400134A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006058125A (en) * | 2004-08-19 | 2006-03-02 | Fujitsu Ltd | Frequency modulation tester for crystal oscillator and frequency modulation test method |
| CN102565676A (en) * | 2012-01-13 | 2012-07-11 | 平湖市电子有限公司 | Automation measuring apparatus for crystal oscillator parameters |
| CN203616403U (en) * | 2013-11-14 | 2014-05-28 | 天津伍嘉联创科技发展有限公司 | Two-stage multi-station quartz crystal testing mechanism |
| CN204649794U (en) * | 2015-05-07 | 2015-09-16 | 浙江东晶电子股份有限公司 | A kind of measuring head of automatic fine tuning machine |
| CN106199089A (en) * | 2016-10-10 | 2016-12-07 | 广东惠伦晶体科技股份有限公司 | A kind of anti-strip device for quartz crystal testing head |
| CN107290240A (en) * | 2017-07-27 | 2017-10-24 | 江苏集萃有机光电技术研究所有限公司 | QCM and detection method |
| CN109581181A (en) * | 2017-09-29 | 2019-04-05 | 黄蕊 | A kind of on-line measuring device of quartz crystal product |
| CN209727678U (en) * | 2019-04-01 | 2019-12-03 | 上海工程技术大学 | A kind of portable quartz crystal microbalance driving device |
| CN211741340U (en) * | 2019-11-21 | 2020-10-23 | 苏州好博医疗器械有限公司 | Circuit board detection tool with self-checking device |
| CN111398705A (en) * | 2020-03-13 | 2020-07-10 | 天津中晟达科技有限公司 | Automatic electric measuring device with computer |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN203117381U (en) | Testing device for radio frequency integrated circuit chip | |
| JPH07225245A (en) | Conductive contact unit | |
| CN203117232U (en) | Novel integrated circuit (IC) simple testing seat | |
| CN116400134A (en) | Clock vibration testing device and circuit | |
| CN211206709U (en) | PCB board test jig | |
| CN210639963U (en) | Signal reflection suppression circuit and display device | |
| CN214895487U (en) | Fuel cell voltage inspection connecting structure and voltage inspection integrated assembly mounting structure | |
| CN202720292U (en) | Testing arrangement used for radio frequency micro packaging tube core | |
| CN112180244B (en) | Support plate type bare chip power amplifier module testing device | |
| KR20070051246A (en) | Probe unit for liquid crystal display inspection equipments | |
| WO2021093330A1 (en) | Probe module | |
| CN216117901U (en) | Crystal oscillator testing device | |
| CN218584902U (en) | Power-on aging device for quartz crystal resonator | |
| CN116482465A (en) | Differential crystal oscillator test circuit and device | |
| CN116482414A (en) | Novel Zhong Zhen fixing base structure | |
| CN218886038U (en) | Surface-mounted crystal oscillator aging device | |
| CN216285398U (en) | Circuit board testing device with probe convenient to overhaul | |
| CN213937858U (en) | Quartz wafer electrode plate | |
| CN217787296U (en) | FT testing device of QFN (quad Flat No-lead) packaged chip | |
| CN201637762U (en) | Quartz crystal testing head device | |
| CN201281749Y (en) | Device for automatically testing relay parameter | |
| CN218601416U (en) | Clock signal supply circuit, chip test circuit and chip test frame | |
| CN202042780U (en) | Circuit converting device for circuit tester | |
| CN214750622U (en) | Clamp for verifying frequency offset performance of crystal | |
| CN110095709A (en) | ICT test fixture |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |