CN106197714B - Test the method that antiskid brake control device high temperature calculates model data - Google Patents
Test the method that antiskid brake control device high temperature calculates model data Download PDFInfo
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- CN106197714B CN106197714B CN201610584291.2A CN201610584291A CN106197714B CN 106197714 B CN106197714 B CN 106197714B CN 201610584291 A CN201610584291 A CN 201610584291A CN 106197714 B CN106197714 B CN 106197714B
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- antiskid brake
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
- G01K7/10—Arrangements for compensating for auxiliary variables, e.g. length of lead
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M99/00—Subject matter not provided for in other groups of this subclass
- G01M99/002—Thermal testing
Abstract
A method of test antiskid brake control device high temperature calculates model data, determines the hyperthermia temperature range during antiskid brake control device use, includes the minimum temperature and maximum temperature of high temperature.The temperature data of antiskid brake control device is tested in each test point in hyperthermia temperature range；Temperature sensor is laid out on high power consumption component；It is controlled without component surface temperature in high-temperature response test process.The high temperature computation model that obtained temperature data is supplied to antiskid brake control device is tested, Modifying model is used for.The present invention corrects the computation model of antiskid brake control device using 8 high temperature side pilots, meets the actual use situation of antiskid brake control device；Extent of amendment covers the use high temperature range of antiskid brake control device, improves the computational accuracy of high temperature computation model, can be used in engineering.
Description
Technical field
It is specifically a kind of in high temperature item the present invention relates to the high temperature fault diagnosis field of civilian airplane in transportation category electronic product
The method that antiskid brake control device high-temperature response is surveyed under part, high-temperature response data are for correcting high temperature model.
Background technology
Antiskid brake control device is the electronic product in airplane brake system, and working power, receiver are provided by aircraft
The wheel rotation speed change electric signal of wheel speed sensor impression, the brake during landing antiskid brake is carried out according to the electric signal
Pressure controls.The antiskid brake control device can be completed normally to land antiskid brake control, take-off line brake control, between wheel
Protection control, ground protection control, the control functions such as wheel rotation stop brake after undercarriage stowage.
The long-term work under the high temperature conditions of antiskid brake control device, will occur failure caused by high temperature.Using calculating
The hot test of machine technical substitution products in kind, can be with the failure of efficient diagnosis electronic product.In order to reduce calculating error, need pair
Computation model is modified,.
The high temperature computation model of antiskid brake control device is established using computer technology, test data need to be used to calculating
Model is modified, and makes the calculating error of high temperature model in prescribed limit.
Foreign current situation：
Foreign countries correct the high temperature model of electronic product using following technology：
1, first part's content is to carry out thermal measurement using the method for complete machine thermal response, to tested electronics under normal temperature condition
Product is powered, after the temperature of electronic product no longer change, with temperature sensor acquire pcb board and shell contact position temperature and
The temperature of housing outer surface, the foundation as corrected Calculation model；
2, the second part is PBC plate heat distributions test：The PBC plates of electronic product are taken out, PBC is applied to monochromatic glue
Measured surface arranges test point on heating device, is powered to tested electronic product under normal temperature condition, waits for the heat itself generated
After amount balance, heat distribution test is carried out with temperature tracer device, the temperature data of each component on PBC is finally obtained, as amendment
The foundation of computation model；
3, using MIL-HDBK-217F, MIL-STD-810F standards carry out low temperature accident analysis.
Using above-mentioned technology, there are following deficiencies for foreign countries：
1, product be powered and normal temperature condition under, survey the temperature of shell, the temperature of actual measurement pcb board and shell contact position,
The temperature adjustmemt high temperature computation model of actual measurement housing outer surface has with the operating temperature of electronic product under the high temperature conditions not to be consistent
Place acts on the warm liter of electronic product because having ignored environment temperature, has ignored electronic product operating temperature rise, therefore after amendment
Error it is big；；
2, MIL-STD-810F is not described the temperature that electronic product is tested under room temperature and power on condition, in prediction on such basis
The influence of high temperature on electronic life of product, is based on insufficient grounds, therefore does not have with the high temperature model that room temperature measured data corrects electronic product
There is sufficient foundation；
3、MIL-HDBK-217F《The estimated handbook of reliability of electronic equipment》Failure rate statistics to electronic product is event substantially
Barrier rate does not distinguish high temperature, low temperature, vibration fault rate and failure in service rate.
Present status in China：
The country uses the temperature of following technical testing electronic product, and corrects high temperature computation model according to test data：
1, using GJB299C《The estimated handbook of electronic product reliability》It is expected that the failure rate of electronic product, but it is electric in standard
The failure rate statistics of sub- product is basic failure rate, does not differentiate between high temperature, low temperature, vibration fault rate；
2, according to GJB150A.3《Hot test》、HB5830.8《High temperature》Carry out high temperature verification；
3, the geo-thermal response test of electronic product：It is powered at normal temperatures to electronic product, applies the maximum of electronic product respectively
Power consumption and common power consumption after waiting for thermal balance, acquire the temperature of each PBC plates and at cabinet contact point and box outer surface center
Data；
4, the heat distribution of PBC plates is tested：PBC plate measured surfaces are applied to single dumb light paint, test is arranged on heating device
Point applies maximum power dissipation and common function respectively under normal temperature condition, and heat is carried out with temperature sensor after temperature no longer changes
Distribution tests finally obtain the temperature data of each component on PBC；
5, in the innovation and creation of ZL 201110310885.1, it is proposed that a kind of determining airplane antiskid braking control box is high
The method of the warm working stress limit.It is 1 DEG C~5 that this method, which uses the heating rate of 25 DEG C/min~60 DEG C/min, heating step-length,
DEG C, the retention time 5min in every step-length, the performance test time is the technical solution of 5min in every step-length, in stepping heating
Underproof temperature data occurs for test antiskid braking control box performance in the process, and first appearing the underproof data of temperature is exactly
The temperature working stress limit achievees the purpose that the determining working stress limit.The temperature of the invention is the environment temperature inside chamber
Degree, does not test the temperature-responsive of antiskid braking control box and its component, which does not solve high power consumption component temperature sound
The problem of answering, technical solution and the present invention are unrelated.
6, in the innovation and creation of ZL 201310169039.1, it is proposed that a kind of test antiskid braking control box high temperature is broken
The method of the bad limit.This method uses the heating rate of 5 DEG C/min~25 DEG C/min, and heating step-length is 5 DEG C, is protected in every step-length
It is 60min to hold the time, and the performance test time is the technical solution of 10min in every step-length, is tested during stepping heats up
Underproof temperature data occurs for antiskid braking control box performance, tests the temperature data of antiskid braking control box loss of function,
The temperature data of antiskid braking control box loss of function is exactly the temperature damage limiting range of stress, reaches the mesh of the determining bursting stress limit
's.For example, the temperature hold-time of the invention is that chamber interior environment temperature reaches 70 DEG C and whole components reach
70 ± 2 DEG C of time difference is 60min.Thermocouple is pasted on heating element, the maximum current of the antiskid braking control box is
0mA~20mA, voltage 28V, maximum power is 0.56 watt, due to self-heating thermogenic action, in 5 DEG C/min~25 DEG C/min
Model of the temperature control at ± 2 DEG C by all components in 60min temperature hold-times may be implemented under ramp rate conditions
In enclosing, and using 60min as the temperature stabilization times in subsequent high temperature step test.First, although the invention is in fever member
Thermocouple has been pasted on device, but does not carry out the overall process test of high-temperature response；Secondly, the maximum hair of the antiskid braking control box
Thermal power is 0.56 watt, and increased temperature of generating heat rises very little；The technical solution of third, the invention solves antiskid braking control box
High temperature Limits properties are the relationship of stepping high temperature and antiskid braking control box gradually loss of function, this technology and first device
The response problem of part temperature at any time is unrelated, and the technical solution and the present invention of the invention are unrelated.The technical scheme is that surveying
Try the high-temperature response of antiskid brake control device and for correcting high temperature computation model.
Using above-mentioned technology, there are following deficiencies for the country：
1, the power consumption of electronic product is not to determine the single factor of high temperature failure, and electronic product is tested under normal temperature condition
Temperature has ignored high ambient temperature and acts on the warm liter of electronic product, judges by accident；
2, GJB150 does not allow the temperature that electronic product is tested in room temperature and power on condition, and high temperature on electronic produces in prediction on such basis
The influence of product, temperature is increased carries out quantitative explanation to the aging effects of electronic product currently without any standard, therefore uses room temperature
Measured data corrects the insufficient foundation of high temperature model of electronic product；
3,201110310885.1 test of invention has obtained the hot operation limiting range of stress of antiskid braking control box, invents
201310169039.1 tests have obtained the low temperature damage limit of antiskid brake control device, this binomial invention does not carry out high temperature
The test of response.
Invention content
To make up the deficiency for not carrying out temperature-responsive test in the prior art, to correct the high-temperature response of high temperature computation model
Data provide foundation, and the present invention proposes a kind of method that test antiskid brake control device high temperature calculates model data.
The present invention detailed process be：
Step 1, the temperature range of the antiskid brake control device high temperature test is determined
The first step determines the maximum temperature of antiskid brake control device high temperature test temperature range
Second step determines the minimum temperature of the antiskid brake control device high temperature test
Identified high temperature test temperature range is 40 DEG C~75 DEG C.Within the scope of temperature test, high temperature test is determined
Step-length is 5 DEG C.
Step 2, test equipment and temperature sensor are selected
The test equipment includes high-temperature test chamber, hygrothermograph, and the sensor is thermocouple.
When selecting test equipment and sensor：
The requirement of I high-temperature test chamber：30 DEG C~125 DEG C of temperature range, heating rate：5 DEG C/min~15 DEG C/min is optional, high
Temperature test box volume 0.5m3~1m3Optionally, testing on chamber door will have observation window, side to have the conducting wire of φ 70mm~φ 100mm
Hole, convenient for temperature sensor signal line, cable are guided to from antiskid brake control device laboratory hygrothermograph and
On power supply, counter.
The requirement of II temperature sensor：Select T-type thermocouple, temperature-measuring range：10 DEG C~180 DEG C, I class precisions, the anti-skidding brake
Have two pieces of circuit boards on truck control device, one piece in order to control plate, another piece be data board.On 12 high power consumption components respectively
Paste a T-type thermocouple；In addition to the installation bottom surface of antiskid brake control device shell, 1 T-type is respectively pasted in remaining 5 outer surface
Thermocouple.
The requirement of III hygrothermograph：U.S.'s Keithley hygrothermograph is selected, is used for the electricity of T-type thermocouple assay
Pressure signal is temperature-responsive data by processing, and now shows the temperature-time curve of each component on computers.
The high power consumption component is the component that power consumption is more than 0.05 watt, and 12 high power consumption components are respectively：Signal
Processor, memory, eight, four tunnel D/A converter, triode, ceramic condenser, programmable logic circuit, microcontroller chip,
16 fixed point DSPs, memory, integrated device, programmable logic circuit and bus transceiver.
Step 3, setup test equipment and antiskid brake control device
I is placed on 1 set of antiskid brake control device in high-temperature test chamber, and each T-type thermocouple is attached to described 12 respectively
On high power consumption component；Respectively paste 1 T in remaining 5 outer surface in addition to the installation bottom surface except antiskid brake control device shell
Type thermocouple,
II draws each T-type thermocouple from the wire guide of high-temperature cabinet, is connected with hygrothermograph；By antiskid brake control
The cable of device processed is drawn from the wire guide of high-temperature cabinet, is connected with power supply, counter.
III closes high temperature chamber door, starts to warm up；20mA electric currents are provided to antiskid brake control device simultaneously, pass through counter
Make antiskid brake control device simulation land during brake/get off the brakes work.
Step 4, it tests
Continuous low temperature response data and temperature time curve in order to obtain do not implement temperature control to component surface；
In the temperature of antiskid brake control device under testing condition of different temperatures, test temperature from 40 DEG C~75 DEG C, according to
The secondary temperature for measuring antiskid brake control device under each temperature spot；A length of 5 DEG C of test step；
Specifically：
I keeps antiskid brake control device in running order；
II draws antiskid brake control device signal wire；The temperature of cryogenic box is dropped into test temperature, is patrolled by humiture
The detection of inspection instrument and the numerical value for recording each test point each point temperature-responsive；The temperature of each test point each point of the temperature-responsive numerical value
Degree-time graph, and while reaching 40 DEG C~75 DEG C of each test points no longer change；The control computer of hygrothermograph is aobvious at this time
Show the numerical value of each point temperature-responsive；Respectively obtain the temperature of antiskid brake control device under 40 DEG C~75 DEG C each points；
So far, completing antiskid brake control device high temperature calculating model needs the test job of data.
The present invention carries out temperature-responsive test according to the high temperature range in antiskid brake control device use, anti-skidding to correct
The high temperature computation model of braking control device provides measured data.
In the present invention：
1, the hyperthermia temperature range during antiskid brake control device use is determined；Selected test point includes high in use
The minimum temperature and maximum temperature of temperature；
2, the temperature data of antiskid brake control device is tested in each test point in hyperthermia temperature range；Temperature passes
Sensor is laid out on high power consumption component；It is controlled without component surface temperature in high-temperature response test process；
3, obtained temperature data purposes is tested：It is supplied to the high temperature computation model of antiskid brake control device, is used for mould
Type amendment.
In order to avoid the error that existing domestic and international technology is generated using room temperature test data amendment high temperature computation model, it is
The high-temperature response data for correcting high temperature computation model are provided, the present invention proposes the test of antiskid brake control device high-temperature data
Method, room temperature is different with high-temperature physics concept, and failure mechanism is different.Therefore the prior art corrects high temperature using room temperature test data
Model hardly results in correct result.
The low temperature computation model that antiskid brake control device is corrected using the technology of the present invention, achieves following implementation result：
1, the relationship between temperature change and test period is there are no under conditions of achievement in research, in order to give amendment high temperature
Model provides adequate data, and high temperature side pilot of the invention is：40℃、45℃、50℃、55℃、60℃、65℃、70℃、75℃
Totally 8 points, contain that high temperature range minimum temperature as defined in HB5830.8 hot test standards is 50 DEG C and maximum temperature is 70
DEG C, the test data of high temperature overall process can be obtained.The reason of the last one point is 75 DEG C is GJB150 regulation hot tests
Tolerance is ± 2 DEG C, there is the case where higher than 70 DEG C during the test, so determining that the last one test point is 75 DEG C；Existing state
Inside and outside technology room temperature test point can not obtain the present invention in the effect using global test in high temperature range.
2, when using existing room temperature point modification method, precision is ± 10%, the ambient temperature range in calculating process
It is exactly：70 ± 7 DEG C, during the work time component maximum temperaturerise reach 125 DEG C, when the calculating error of presence ± 10%, meter
Obtained temperature range is exactly：112.5 DEG C~137.5 DEG C, 140 DEG C of components of actual measurement start to melt, and 110 DEG C of components are also
It can work normally, two kinds of opposite results occur.When using the technology of the present invention, component maximum temperaturerise reaches during the work time
When to 125 DEG C, the temperature range being calculated is：118.75 DEG C~131.25 DEG C, actual measurement component does not go out under the conditions of 132 DEG C
Existing high-temperature damage, realizes the process converted from theoretical research to engineer application.
The present invention is compared with the prior art：
1, overall plan compares：The high temperature computation model of prior art electronic product uses the amendment of a room temperature test point
Method, precision is low, and error is big.The present invention corrects the computation model of antiskid brake control device using 8 high temperature side pilots, meets
The actual use situation of antiskid brake control device；
2, test point quantity compares；The prior art only tests the data of one temperature spot of electronic product room temperature, the present invention from
40 DEG C~75 DEG C are corrected 8 high temperature dots altogether；Extent of amendment covers the use high temperature range of antiskid brake control device, improves
The computational accuracy of high temperature computation model, can be used in engineering.
Description of the drawings
Fig. 1 is the schematic diagram on 5 surfaces of antiskid brake control device shell.
Fig. 2 is the flow chart of the present invention.In figure：
1. front panel；2. first side plate；3. top panel；4. rear panel；5. second side plate.
Specific implementation mode
The present embodiment is a kind of test method of antiskid brake control device high-temperature response, which uses
In civil transport.
The test purpose of the present embodiment：Whether actual measurement performance of antiskid brake control device under different high temperature dots is qualified；
And record the high-temperature data of antiskid brake control device, shell, component under different high temperature side pilots.
The detailed process of the present embodiment is：
Step 1, the temperature range of the antiskid brake control device high temperature test is determined
The first step determines the maximum temperature of antiskid brake control device high temperature test temperature range
According to the high temperature range determined in antiskid brake control device use, with reference to the maximum temperature of HB5830.8 hot tests
It it is 70 DEG C, the tolerance of temperature is ± 2 DEG C, determines that the maximum temperature of test is 75 DEG C, maximum temperature is included for 72 DEG C.
Second step determines the minimum temperature of the antiskid brake control device high temperature test
According to the high temperature range determined in antiskid brake control device use, with reference to the minimum temperature of HB5830.8 hot tests
It it is 50 DEG C, the tolerance of temperature is ± 2 DEG C, determines that the minimum temperature of test is 40 DEG C, high temperature tolerance is included.
Identified high temperature test temperature range is 40 DEG C~75 DEG C.Within the scope of temperature test, high temperature test is determined
Step-length is 5 DEG C.
Step 2, test equipment and temperature sensor are selected
The test equipment includes high-temperature test chamber, hygrothermograph, and the sensor is thermocouple.It is wanted according to following
Ask selection test equipment and sensor.
1, high-temperature test chamber requirement：30 DEG C~125 DEG C of temperature range, heating rate：5 DEG C/min~15 DEG C/min is optional,
High-temperature test chamber volume 0.5m3~1m3Optionally, testing on chamber door will have observation window, side to have leading for φ 70mm~φ 100mm
String holes, convenient for temperature sensor signal line, cable to be guided to the hygrothermograph in laboratory from antiskid brake control device
On power supply, counter.
2, temperature sensor requirement：Select T-type thermocouple, temperature-measuring range：10 DEG C~180 DEG C, I class precisions, the anti-skidding brake
Have two pieces of circuit boards on truck control device, one piece in order to control plate, another piece be data board.On 12 high power consumption components respectively
A T-type thermocouple is pasted, high power consumption component is the component that power consumption is more than 0.05 watt.In antiskid brake control device shell
Respectively paste 1 T-type thermocouple, the temperature for testing antiskid brake control device shell in remaining 5 outer surface in addition to installing bottom surface
Degree；It is 17 to need T-type thermocouple quantity altogether.
12 high power consumption components be respectively signal processor, memory, eight, four tunnel D/A converter, triode,
Ceramic condenser, microcontroller chip, 16 fixed point DSPs, memory, integrated device, can be compiled programmable logic circuit
Journey logic circuit and bus transceiver.
3, hygrothermograph requirement：U.S.'s Keithley hygrothermograph is selected, is used for the electricity of T-type thermocouple assay
Pressure signal is temperature-responsive data by processing, and now shows the temperature-time curve of each component on computers.
Step 3, start test equipment and antiskid brake control device
1,1 set of antiskid brake control device is placed in high-temperature test chamber, 17 T-type thermocouples is attached to 12 height respectively
Power consumption component, and 1 T-type heat is respectively pasted in remaining 5 outer surface in addition to the installation bottom surface except antiskid brake control device shell
Galvanic couple.
2,17 T-type thermocouples are drawn from the wire guide of high-temperature cabinet, is connected with hygrothermograph；By antiskid brake
The cable of control device is drawn from the wire guide of high-temperature cabinet, is connected with power supply, counter.
3, high temperature chamber door is closed, is started to warm up；20mA electric currents are provided to antiskid brake control device simultaneously, pass through counter
Make antiskid brake control device simulation land during brake/get off the brakes work.
Step 4, test process
Continuous high-temperature response data and temperature time curve in order to obtain do not control temperature to component surface.
The first step, the temperature of antiskid brake control device under the conditions of 40 DEG C of test
1) make antiskid brake control device in running order；
2) width that antiskid brake control device is uncapped is 10mm, for drawing signal wire.By the temperature liter of high-temperature cabinet
To 40 DEG C, the numerical value of 17 test point each point temperature-responsives is detected by hygrothermograph and recorded；The temperature-responsive
Numerical value refers to the temperature-time curve of each point in 17 test points, and while reaching 40 DEG C no longer changes.Hygrothermograph at this time
Control computer shows the numerical value of each point temperature-responsive, prompts the work for carrying out next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 high-temperature devices is shown in Table 1.
Test data of the table 1 under 40 DEG C of environment temperature and antiskid brake control device working condition
The temperature test data of 5 panels of antiskid brake control device shell are shown in Table 2, and attached drawing 1 is shown in panel definition.
The temperature of surface of shell when 2 environment temperature of table is 40 DEG C
| Test event | Front panel 1 | First side plate 2 | Top panel 3 | Rear panel 4 | Second side plate 5 |
| Test temperature | 49.4℃ | 51.4℃ | 49.9℃ | 49.7℃ | 72.8℃ |
Second step, the temperature of antiskid brake control device under the conditions of 45 DEG C of test
1) make antiskid brake control device in running order；
2) width that antiskid brake control device is uncapped is 10mm, for drawing signal wire.By the temperature liter of high-temperature cabinet
To 45 DEG C, the numerical value of 17 test point each point temperature-responsives is detected by hygrothermograph and recorded；The temperature-responsive
Numerical value refers to the temperature-time curve of each point in 17 test points, and while reaching 45 DEG C no longer changes.Hygrothermograph at this time
Control computer shows the numerical value of each point temperature-responsive, prompts the work for carrying out next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 high-temperature device test points is shown in Table 3.
Test data of the table 3 under 45 DEG C of environment temperature and antiskid brake control device working condition
The temperature test data of 5 surface test points of antiskid brake control device shell are shown in Table 4.
The temperature of surface of shell when 4 environment temperature of table is 45 DEG C
| Test event | Front panel 1 | First side plate 2 | Top panel 3 | Rear panel 4 | Second side plate 5 |
| Test temperature | 54.5℃ | 56.7℃ | 55℃ | 54.8℃ | 78℃ |
Third walks, the temperature of antiskid brake control device under the conditions of 50 DEG C of test
1) make antiskid brake control device in running order；
2) width that antiskid brake control device is uncapped is 10mm, for drawing signal wire.By the temperature liter of high-temperature cabinet
To 50 DEG C, the numerical value of 17 test point each point temperature-responsives is detected by hygrothermograph and recorded；The temperature-responsive
Numerical value refers to the temperature-time curve of each point in 17 test points, and while reaching 50 DEG C no longer changes.Hygrothermograph at this time
Control computer shows the numerical value of each point temperature-responsive, prompts the work for carrying out next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 high-temperature device test points is shown in Table 5.
Test data of the table 5 under 50 DEG C of environment temperature and antiskid brake control device working condition
The temperature test data of 5 surface test points of antiskid brake control device shell are shown in Table 6.
The temperature of surface of shell when 6 environment temperature of table is 50 DEG C
| Test event | Front panel 1 | First side plate 2 | Top panel 3 | Rear panel 4 | Second side plate 5 |
| Test temperature | 59.5℃ | 61.7℃ | 60.1℃ | 59.8℃ | 83.2℃ |
4th step, the temperature of antiskid brake control device under the conditions of 55 DEG C of test
1) make antiskid brake control device in running order；
2) width that antiskid brake control device is uncapped is 10mm, for drawing signal wire.By the temperature liter of high-temperature cabinet
To 55 DEG C, the numerical value of 17 test point each point temperature-responsives is detected by hygrothermograph and recorded；The temperature-responsive
Numerical value refers to the temperature-time curve of each point in 17 test points, and while reaching 55 DEG C no longer changes.Hygrothermograph at this time
Control computer shows the numerical value of each point temperature-responsive, prompts the work for carrying out next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 high-temperature device test points is shown in Table 7.
Test data of the table 7 under 55 DEG C of environment temperature and antiskid brake control device working condition
The temperature test data of 5 surface test points of antiskid brake control device shell are shown in Table 8.
The temperature of surface of shell when 8 environment temperature of table is 55 DEG C
| Test event | Front panel 1 | First side plate 2 | Top panel 3 | Rear panel 4 | Second side plate 5 |
| Test temperature | 64.5℃ | 66.8℃ | 65.2℃ | 64.8℃ | 88.8℃ |
5th step, the temperature of antiskid brake control device under the conditions of 60 DEG C of test
1) make antiskid brake control device in running order；
2) width that antiskid brake control device is uncapped is 10mm, for drawing signal wire.By the temperature liter of high-temperature cabinet
To 60 DEG C, the numerical value of 17 test point each point temperature-responsives is detected by hygrothermograph and recorded；The temperature-responsive
Numerical value refers to the temperature-time curve of each point in 17 test points, and while reaching 60 DEG C no longer changes.Hygrothermograph at this time
Control computer shows the numerical value of each point temperature-responsive, prompts the work for carrying out next test point.After tested, antiskid brake controls
Device performance is qualified；The temperature of 12 high-temperature device test points is shown in Table 9.
Test data of the table 9 under 60 DEG C of environment temperature and antiskid brake control device working condition
The temperature test data of 5 surface test points of antiskid brake control device shell are shown in Table 10.
The temperature of surface of shell when 10 environment temperature of table is 60 DEG C
| Test event | Front panel 1 | First side plate 2 | Top panel 3 | Rear panel 4 | Second side plate 5 |
| Test temperature | 69.7℃ | 71.9℃ | 70.3℃ | 69.8℃ | 94℃ |
6th step, the temperature of antiskid brake control device under the conditions of 65 DEG C of test
1) make antiskid brake control device in running order；
2) width that antiskid brake control device is uncapped is 10mm, for drawing signal wire.By the temperature liter of high-temperature cabinet
To 65 DEG C, the numerical value of 17 test point each point temperature-responsives is detected by hygrothermograph and recorded；The temperature-responsive
Numerical value refers to the temperature-time curve of each point in 17 test points, and while reaching 65 DEG C no longer changes.Hygrothermograph at this time
Control computer shows the numerical value of each point temperature-responsive, prompts the work for carrying out next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 high-temperature device test points is shown in Table 11.
Test data of the table 11 under 65 DEG C of environment temperature and antiskid brake control device working condition
The temperature test data of 5 surface test points of antiskid brake control device shell are shown in Table 12.
The temperature of surface of shell when 12 environment temperature of table is 65 DEG C
| Test event | Front panel 1 | First side plate 2 | Top panel 3 | Rear panel 4 | Second side plate 5 |
| Test temperature | 75℃ | 77.1℃ | 75.8℃ | 75℃ | 101℃ |
7th step, the temperature of antiskid brake control device under the conditions of 70 DEG C of test
1) make antiskid brake control device in running order；
2) width that antiskid brake control device is uncapped is 10mm, for drawing signal wire.By the temperature liter of high-temperature cabinet
To 70 DEG C, the numerical value of 17 test point each point temperature-responsives is detected by hygrothermograph and recorded；The temperature-responsive
Numerical value refers to the temperature-time curve of each point in 17 test points, and while reaching 70 DEG C no longer changes.Hygrothermograph at this time
Control computer shows the numerical value of each point temperature-responsive, prompts the work for carrying out next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 high-temperature device test points is shown in Table 13.
Test data of the table 13 under 70 DEG C of environment temperature and antiskid brake control device working condition
The temperature test data of 5 surface test points of antiskid brake control device shell are shown in Table 14.
The temperature of surface of shell when 14 environment temperature of table is 70 DEG C
| Test event | Front panel 1 | First side plate 2 | Top panel 3 | Rear panel 4 | Second side plate 5 |
| Test temperature | 80.1℃ | 82.1℃ | 80.8℃ | 80.1℃ | 107℃ |
8th step, the temperature of antiskid brake control device under the conditions of 75 DEG C of test
1) make antiskid brake control device in running order；
2) width that antiskid brake control device is uncapped is 10mm, for drawing signal wire.By the temperature liter of high-temperature cabinet
To 75 DEG C, the numerical value of 17 test point each point temperature-responsives is detected by hygrothermograph and recorded；The temperature-responsive
Numerical value refers to the temperature-time curve of each point in 17 test points, and while reaching 75 DEG C no longer changes.Hygrothermograph at this time
Control computer shows the numerical value of each point temperature-responsive, prompts the work for carrying out next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 high-temperature device test points is shown in Table 15.
Test data of the table 15 under 75 DEG C of environment temperature and antiskid brake control device working condition
The temperature test data of 5 surface test points of antiskid brake control device shell are shown in Table 16.
The temperature of surface of shell when 16 environment temperature of table is 75 DEG C
| Test event | Front panel 1 | First side plate 2 | Top panel 3 | Rear panel 4 | Second side plate 5 |
| Test temperature | 85.7℃ | 87.4℃ | 85.9℃ | 85.5℃ | 112.8℃ |
So far, present invention test achieves the high-temperature response data and temperature-time curve of 1~table of table 16, these data,
Curve is tested for low temperature computation model adjustment scheme is corrected.
So far, completing antiskid brake control device high temperature calculating model needs the test job of data.
Claims (3)
1. a kind of method that test antiskid brake control device high temperature calculates model data, which is characterized in that detailed process is：
Step 1, the temperature range of the antiskid brake control device high temperature test is determined：
The first step determines the maximum temperature of antiskid brake control device high temperature test temperature range；
Second step determines the minimum temperature of the antiskid brake control device high temperature test temperature range：
Identified high temperature test temperature range is 40 DEG C~75 DEG C；Within the scope of temperature test, the step-length of high temperature test is determined
It is 5 DEG C；
Step 2, test equipment and temperature sensor are selected：
The test equipment includes high-temperature test chamber, hygrothermograph, and the temperature sensor is thermocouple；
Step 3, the preparation of test equipment and antiskid brake control device：
I is placed on 1 set of antiskid brake control device in high-temperature test chamber, and each T-type thermocouple is attached to high power consumption component respectively
On；Respectively paste 1 T-type thermocouple in remaining 5 outer surface in addition to the installation bottom surface except antiskid brake control device shell；
II draws each T-type thermocouple from the wire guide of high-temperature test chamber, is connected with hygrothermograph；By antiskid brake control
The signal wire of device processed is drawn from the wire guide of high-temperature test chamber, is connected with power supply, counter；
III closes hot test chamber door, starts to warm up；20mA electric currents are provided to antiskid brake control device simultaneously, pass through counter
Make antiskid brake control device simulation land during brake/get off the brakes work；
Step 4, it tests：
Continuous high-temperature response data and temperature time curve in order to obtain do not implement temperature control to high power consumption component surface
System；
In the temperature of antiskid brake control device under testing condition of different temperatures, test temperature is surveyed successively from 40 DEG C~75 DEG C
Measure the temperature of antiskid brake control device under each temperature spot；A length of 5 DEG C of test step；
Specifically：
I keeps antiskid brake control device in running order；
II draws antiskid brake control device signal wire；The temperature of high-temperature test chamber is raised to test temperature, is patrolled by humiture
The detection of inspection instrument and the numerical value for recording each test point each point temperature-responsive；The temperature-responsive numerical value refers to the Temperature-time of each point
Curve, and while reaching each test point in 40 DEG C~75 DEG C no longer change；The control computer of hygrothermograph is shown respectively at this time
The numerical value of point temperature-responsive；Respectively obtain the temperature of antiskid brake control device under 40 DEG C~75 DEG C each points；
So far, completing antiskid brake control device high temperature calculating model needs the test job of data.
2. the method that test antiskid brake control device high temperature calculates model data as described in claim 1, which is characterized in that choosing
When selecting high-temperature test chamber and temperature sensor：
The requirement of I high-temperature test chamber：30 DEG C~125 DEG C of temperature range, heating rate：5 DEG C/min~15 DEG C/min is optional, high temperature examination
Tryoff volume 0.5m3~1m3Optionally, observation window, side have the conducting wire of φ 70mm~φ 100mm on hot test chamber door
Hole；
The requirement of II temperature sensor：Select T-type thermocouple, temperature-measuring range：10 DEG C~180 DEG C, I class precisions, the antiskid brake control
Have two pieces of circuit boards on device processed, one piece in order to control plate, another piece be data board；It is pasted respectively on 12 high power consumption components
One T-type thermocouple；In addition to the installation bottom surface of antiskid brake control device shell, 1 T-type thermoelectricity is respectively pasted in remaining 5 outer surface
It is even；
The requirement of III hygrothermograph：U.S.'s Keithley hygrothermograph is selected, for believing the voltage of T-type thermocouple assay
Number processing is temperature-responsive data, and shows the temperature-time curve of each high power consumption component on computers.
3. the method that test antiskid brake control device high temperature calculates model data as described in claim 1, which is characterized in that institute
It is the component that power consumption is more than 0.05 watt to state high power consumption component；12 high power consumption components are respectively：Signal processor, storage
Device, eight, four tunnel D/A converter, triode, ceramic condenser, control panel programmable logic circuit, microcontroller chip, 16 it is fixed
Point signal processor, memory, integrated device, data board programmable logic circuit and bus transceiver.
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| CN103294052A (en) * | 2013-05-22 | 2013-09-11 | 西安航空制动科技有限公司 | Method for testing potential failure risks of antiskid braking control boxes by aid of quick temperature variation |
| CN103294050A (en) * | 2013-05-09 | 2013-09-11 | 西安航空制动科技有限公司 | Method for testing high-temperature breaking limit of antiskid brake control box |
| CN103513647A (en) * | 2013-07-10 | 2014-01-15 | 西安航空制动科技有限公司 | Comprehensive environment stress test method of anti-sliding brake control box |
| CN203796540U (en) * | 2014-01-27 | 2014-08-27 | 江苏云飞机械有限公司 | Brake pump testing device capable of displaying pressure in double directions |
| CN104049630A (en) * | 2014-06-10 | 2014-09-17 | 西安航空制动科技有限公司 | Method for testing failure of airplane antiskid brake control box under condition of temperature cycle |
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| US20060045165A1 (en) * | 2004-08-30 | 2006-03-02 | Chan Gary K | Thermal interface material characterization system and method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103294050A (en) * | 2013-05-09 | 2013-09-11 | 西安航空制动科技有限公司 | Method for testing high-temperature breaking limit of antiskid brake control box |
| CN103294052A (en) * | 2013-05-22 | 2013-09-11 | 西安航空制动科技有限公司 | Method for testing potential failure risks of antiskid braking control boxes by aid of quick temperature variation |
| CN103513647A (en) * | 2013-07-10 | 2014-01-15 | 西安航空制动科技有限公司 | Comprehensive environment stress test method of anti-sliding brake control box |
| CN203796540U (en) * | 2014-01-27 | 2014-08-27 | 江苏云飞机械有限公司 | Brake pump testing device capable of displaying pressure in double directions |
| CN104049630A (en) * | 2014-06-10 | 2014-09-17 | 西安航空制动科技有限公司 | Method for testing failure of airplane antiskid brake control box under condition of temperature cycle |
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