CN106197290B - Device based on structure light and digital speckle measurement high temp objects displacement and deformation - Google Patents
Device based on structure light and digital speckle measurement high temp objects displacement and deformation Download PDFInfo
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- CN106197290B CN106197290B CN201610712823.6A CN201610712823A CN106197290B CN 106197290 B CN106197290 B CN 106197290B CN 201610712823 A CN201610712823 A CN 201610712823A CN 106197290 B CN106197290 B CN 106197290B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/167—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by projecting a pattern on the object
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- Length Measuring Devices By Optical Means (AREA)
Abstract
The present invention relates to a kind of based on structure light and digital speckle measurement high temp objects are displaced and the device of deformation, comprising: structure light laser, for exporting monochromatic structure light and being irradiated to testee surface；Laser ranging unit, the distance for obtaining testee surface to photoelectric detection unit；Optical image unit, for the monochromatic structure light image on testee surface to be imaged on photoelectric detection unit；Photoelectric detection unit, for acquiring the image of imaging and being sent to data processing unit；The distance of data processing unit, image and testee surface to the photoelectric detection unit for sending to photoelectric detection unit calculates, and obtains the displacement and deformation of the object being measured at high operating temperatures.The present invention can be used for measuring the displacement and deformation of object at high operating temperatures.
Description
Technical field
The present invention relates to optical technical fields, more particularly to one kind is based on structure light and digital speckle measurement high temperature substrate position
Move the device with deformation.
Background technique
Have the advantages that non-cpntact measurement, measurement of full field, optical path are simple using the information of laser speckle measurement object.
Technology based on laser speckle measurement object space or deformation data has the micro-displacement using laser speckle measurement object, shape
Become, shake etc., but this method is only applicable to the not high object of the temperature closely (less than 2m) in range, for remote
For high temp objects, hot environment is unfavorable for generating stable laser interference figure, and apart from far to laser power it is more demanding,
Common laser is difficult to meet the requirements, and therefore, the method for being currently based on laser speckle is dfficult to apply to telemeasurement high temperature
The displacement and deformation of object.
It can be adapted for the measurement of remote object using simple digital speckle method, as long as guaranteeing the temperature of object not
It is too high, it is easy setting characteristic point.But for remote high temp objects, characteristic point is not easy to be arranged, and number dissipates in this way
Spot method is just difficult to use in the displacement for measuring remote high temp objects.
Summary of the invention
In view of above-mentioned analysis, the present invention is intended to provide a kind of based on structure light and digital speckle measurement high temp objects displacement
With the device of deformation, it is displaced to solve the problems, such as that existing digital speckle method is difficult to tactful remote high temperature problem.
The purpose of the present invention is mainly achieved through the following technical solutions:
The present invention provides a kind of based on structure light and digital speckle measurement high temp objects are displaced and the device of deformation, packet
It includes:
Structure light laser, for exporting monochromatic structure light and being irradiated to testee surface；
Laser ranging unit, the distance for obtaining testee surface to photoelectric detection unit；
Optical image unit, for the monochromatic structure light image on testee surface to be imaged on photoelectric detection unit；
Photoelectric detection unit, for acquiring the image of imaging and being sent to data processing unit；
Data processing unit, image and the testee surface for sending to photoelectric detection unit are visited to photoelectricity
The distance for surveying unit is calculated, and the displacement and deformation of the object being measured at high operating temperatures are obtained.
Further, the structure of the monochromatic structure light is lattice array, and the wave-length coverage of light is 380~760nm.
Further, the pattern of the monochromatic mechanism light is dotted, dot matrix column-shaped, threadiness, linear array column-shaped, annular shape, net
Trellis, strip or cosine strip.
Further, the laser ranging unit and optical image unit and photoelectric detection unit relative position are fixed not
Become.
Further, the photoelectric detection unit is CCD camera or CMOS camera.
Further, the optical image unit specifically includes:
Optical filter, is narrow band filter, and the corresponding wavelength of optical filter transmitance maximum value is the output of structure light laser
The wavelength of monochromatic structure light；
Optical imaging assemblies are object space telecentric imaging system, described for the picture on the testee surface to be imaged onto
On the photosurface of photoelectric detection unit.
Further, the data processing unit specifically includes:
Data reception module for the image of photoelectric detection unit described in real-time reception, and is sent to memory module；It is described
Image includes two parts, and a part is to use P from the image of the testee0It indicates, another part is from described tested
The image of the structure light of object reflection, uses P1It indicates, P0And P1Fusion is on same piece image；
Memory module, the image sent for data receipt unit described in real-time reception and storage；
Data analysis module obtains the quilt for carrying out calculation processing to digital picture based on specific mathematical algorithm
Measure the displacement and deformation of object at high operating temperatures.
Further, the data analysis module is specifically used for, by the P in A image1As fixed reference feature point, choose suitable
When feature sub-image C scanned in image B as references object, based on correlation theory by search B image in C most
Matched subgraph C ' determines image A and image B relative displacement variable quantity or deformation quantity.
The present invention has the beneficial effect that:
The present invention can be used for measuring the displacement and deformation of object at high operating temperatures.
Other features and advantages of the present invention will illustrate in the following description, also, partial become from specification
It obtains it is clear that understand through the implementation of the invention.The objectives and other advantages of the invention can be by written explanation
Specifically noted structure is achieved and obtained in book, claims and attached drawing.
Detailed description of the invention
Attached drawing is only used for showing the purpose of specific embodiment, and is not to be construed as limiting the invention, in entire attached drawing
In, identical reference symbol indicates identical component.
Fig. 1 is the structural schematic diagram of described device of the embodiment of the present invention.
Specific embodiment
Specifically describing the preferred embodiment of the present invention with reference to the accompanying drawing, wherein attached drawing constitutes the application a part, and
Together with embodiments of the present invention for illustrating the principle of the present invention.It is retouched in an attached drawing of the invention or a kind of embodiment
The elements and features stated can be combined with elements and features illustrated in one or more other drawings or embodiments.
It should be noted that in order to understand purpose, being omitted known to unrelated to the invention, those of ordinary skill in the art in attached drawing and explanation
Component and processing expression and description.
As shown in FIG. 1, FIG. 1 is the structural schematic diagrams of described device of the embodiment of the present invention, can specifically include:
Structure light laser 1 is mainly used for exporting monochromatic structure light and is irradiated to testee surface；
Structure light laser 1 exports monochromatic structure light and is irradiated to 2 surface of testee, and the structure of light is lattice array, light
Wave-length coverage be 380~760nm, the pattern of structure light is dotted, dot matrix column-shaped, threadiness, linear array column-shaped, annular shape, grid
The various types structures such as shape, strip, cosine strip (intensity is in cosine distribution).Testee 2 is remote high temp objects, is in
Constant-pressure and high-temperature environment, temperature highest can be to 1800 DEG C, and the distance to photodetector is greater than 2m.
Laser ranging unit 3, be mainly used for obtain testee surface to photoelectric detection unit distance；
Laser ranging unit 3 can be a small industry steam turbine, measurement accuracy 1mm, laser ranging unit 3 and light
It learns image-forming assembly 42 and 5 relative position of photoelectric detection unit immobilizes, testee 2 can be obtained by laser ranging unit
Distance of the surface to photoelectric detection unit 5.
Optical image unit, comprising: optical filter 41 and optical imaging assemblies 42 are mainly used for the list on testee surface
Color structure light image is imaged in photoelectric detection unit；
Wherein, optical filter 41 is narrow band filter, and the corresponding wavelength of 41 transmitance maximum value of optical filter is structure ray laser
The wavelength for the structure light that device 1 exports；
Optical imaging assemblies 42 are object space telecentric imaging system, the picture on 2 surface of testee can be imaged onto institute
On the photosurface for stating photoelectric detection unit 5.
Photoelectric detection unit 5 is mainly used for the image of acquisition imaging and is sent to data processing unit；
Photoelectric detection unit 5 is digital camera, and the primary clustering detector of camera uses cmos detector, cmos detector
Pixel number is greater than 1024*1024；
Data processing unit, comprising: data reception module 61, memory module 62 and data analysis module 63, it is main to use
It calculates, obtains in the distance of image and testee 2 surface to the photoelectric detection unit 5 sent to photoelectric detection unit 5
To the displacement and deformation of object being measured at high operating temperatures.
Wherein, data reception module 61 can be a set of data collecting card equipment, have high speed acquisition and high speed storing function
Can, it is mainly used for the image of photoelectric detection unit described in real-time reception, and be sent to memory module 62；The image includes two
Point, a part is to use P from the image of the testee0It indicates, another part is the knot from testee reflection
The image of structure light, uses P1It indicates, P0And P1Fusion is on same piece image；
Memory module 62 has high speed acquisition and high speed storing, processing function, is mainly used for real-time reception data reception
Block 61 send digital picture and storage；
Data analysis module 63, based on being carried out to digital picture by specific mathematical algorithm (such as mathematical algorithm F)
Calculation processing, obtains the displacement and deformation of the object being measured at high operating temperatures.
In measurement process, the spatial position for the structure light that structure light laser 1 exports is fixed and invariable.When the quilt
When survey object opposed configuration light itself is constant, P0And P1Image will remain unchanged, when object because the reasons such as temperature change are subjected to displacement
Or when deformation, the relative position of object and structure light will change, i.e. P0And P1Relative position variation will occur.In object
Body be subjected to displacement or deformation before and after each acquisition piece image, indicated respectively with A, B, using mathematical algorithm F by the P in A image1
As fixed reference feature point, feature sub-image C appropriate is chosen as references object and is scanned in image B, based on related reason
By by determining image A and image B relative displacement variable quantity or deformation with the most matched subgraph C ' of C in search B image
Amount.
The basic representation of above-mentioned mathematical algorithm F is
In formula: f (xi,yj) indicate A image in C certain point (xi,yj) at gray value；Indicate C ' in B image
Certain pointThe gray value at place；WithRespectively indicate the average gray value of subset C and subset C '.Find out related maximum
Point (x, y) can determine displacement (Δ x, Δ y).
In conclusion the embodiment of the invention provides one kind based on structure light and the displacement of digital speckle measurement high temp objects and
The device of deformation can be used for the deformation and displacement of telemeasurement high temp objects, and the present invention is in Digital Speckle Correlation Method base
Structure ray laser is increased on plinth as feature object, using structure light laser irradiation high temp objects, the light that object itself issues
Spectrum be continuous spectrum, laser be spectrally correspond to a certain wavelength XlasterMonochromatic light, when object is irradiated with a laser, object
λ on the continuous spectrum that body issueslasterIntensity E at position will be changed, it will usually and enhance, at this moment shoots object with camera,
In the suitable situation of optical maser wavelength, the structured light patterns of body surface can be told from image, so that it may pass through number
Image procossing obtains the structured light patterns of body surface, and the change information of body surface is obtained as characteristic pattern.In addition, this
Invention introduces optical filter, avoids the problem that structure light is submerged, the effect of optical filter is will to remove λlasterLight shield in addition falls,
So that only λlasterNeighbouring light can be incident on detector, the structured light patterns of such body surface can blur-free imaging,
Image quality is improved, so that the Comparision of post-digital image procossing is easy.
It will be understood by those skilled in the art that realizing all or part of the process of above-described embodiment method, meter can be passed through
Calculation machine program is completed to instruct relevant hardware, and the program can be stored in computer readable storage medium.Wherein, institute
Stating computer readable storage medium is disk, CD, read-only memory or random access memory etc..
Although the present invention and its advantage has been described in detail it should be appreciated that without departing from by the attached claims
Defined by can carry out various changes, substitution and transformation in the case where the spirit and scope of the present invention.Moreover, the model of the application
Enclose the specific embodiment for being not limited only to process, equipment described in specification, means, method and steps.In the art is common
Technical staff is from the disclosure it will be readily understood that execution and corresponding reality described herein can be used according to the present invention
Apply the essentially identical function of example or process that obtain the result essentially identical with it, that existing and future is to be developed, equipment,
Means, method or step.Therefore, the attached claims purport includes such process, equipment, hand in the range of them
Section, method or step.
The foregoing is only a preferred embodiment of the present invention, but scope of protection of the present invention is not limited thereto,
In the technical scope disclosed by the present invention, any changes or substitutions that can be easily thought of by anyone skilled in the art,
It should be covered by the protection scope of the present invention.
Claims (7)
1. a kind of device based on structure light and digital speckle measurement high temp objects displacement and deformation characterized by comprising
Structure light laser, for exporting monochromatic structure light and being irradiated to testee surface；
Laser ranging unit, the distance for obtaining testee surface to photoelectric detection unit；
Optical image unit, for the monochromatic structure light image on testee surface to be imaged on photoelectric detection unit；
Photoelectric detection unit, for acquiring the image of imaging and being sent to data processing unit；
Data processing unit, image and the testee surface for being sent to photoelectric detection unit to photodetection list
The distance of member is calculated, and the displacement and deformation of the object being measured at high operating temperatures are obtained.
2. the apparatus according to claim 1, which is characterized in that the structure of the monochrome structure light is lattice array, light
Wave-length coverage is 380~760nm.
3. the apparatus according to claim 1, which is characterized in that the pattern of the monochrome mechanism light be dotted, dot matrix column-shaped,
Threadiness, linear array column-shaped, annular shape, latticed, strip or cosine strip.
4. the apparatus according to claim 1, which is characterized in that the laser ranging unit and optical image unit and photoelectricity
Probe unit relative position immobilizes.
5. the apparatus according to claim 1, which is characterized in that the photoelectric detection unit is CCD camera or CMOS phase
Machine.
6. the apparatus according to claim 1, which is characterized in that the optical image unit specifically includes:
Optical filter, is narrow band filter, and the corresponding wavelength of optical filter transmitance maximum value is the monochrome of structure light laser output
The wavelength of structure light；
Optical imaging assemblies are object space telecentric imaging system, for the picture on the testee surface to be imaged onto the photoelectricity
On the photosurface of probe unit.
7. the apparatus according to claim 1, which is characterized in that the data processing unit specifically includes:
Data reception module for the image of photoelectric detection unit described in real-time reception, and is sent to memory module；Described image
Comprising two parts, a part is to use P from the image of the testee0It indicates, another part is from the testee
The image of the structure light of reflection, uses P1It indicates, P0And P1Fusion is on same piece image；
Memory module, the image sent for data receipt unit described in real-time reception and storage；
Data analysis module obtains described be measured for carrying out calculation processing to digital picture based on specific mathematical algorithm
The displacement and deformation of object at high operating temperatures, specifically include, object be subjected to displacement or deformation before and after respectively acquire a width figure
Picture indicates with A, B respectively, using mathematical algorithm F by the P in A image1As fixed reference feature point, selected characteristic subgraph C conduct
References object scans in image B, based on correlation theory by searching in B image with the most matched subgraph C ' of C come really
Determine image A and image B relative displacement variable quantity or deformation quantity；
The basic representation of the mathematical algorithm F is
In formula: f (xi,yj) indicate A image in C certain point (xi,yj) at gray value；Certain of C ' in expression B image
A bitThe gray value at place；WithRespectively indicate the average gray value of subset C and subset C '.
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| FR3066816B1 (en) * | 2017-05-24 | 2020-09-04 | Centre Nat Rech Scient | OPTICAL DEVICE FOR MEASURING THE CURVATURE OF A REFLECTIVE SURFACE |
| RU2665323C1 (en) * | 2017-06-07 | 2018-08-29 | Валентин Викторович Терауд | Sample at the high-temperature impact thereon geometrical parameters and / or deformations measurement method and system for its implementation |
| CN108050955B (en) * | 2017-12-14 | 2019-10-18 | 合肥工业大学 | Filtering method is disturbed based on structured light projection high temperature air relevant to digital picture |
| CN108120665A (en) * | 2017-12-28 | 2018-06-05 | 无锡奥芬光电科技有限公司 | The method and apparatus of monochromatic structure optical test molecule |
| CN108827174A (en) * | 2018-04-26 | 2018-11-16 | 哈尔滨理工大学 | A kind of insulating material of polymer electromechanical deformation monitoring device and monitoring method |
| CN109253696A (en) * | 2018-11-28 | 2019-01-22 | 信利光电股份有限公司 | Equipment based on structural light measurement object size |
| CN111426280A (en) * | 2020-05-08 | 2020-07-17 | 中国科学技术大学 | Two-dimensional DIC optical extensometer out-of-plane compensation device and method based on structured light |
| CN111856480B (en) * | 2020-07-29 | 2023-11-10 | 南京工程学院 | Rapid detection method and detection system for equipment displacement |
| CN111854623B (en) * | 2020-07-29 | 2022-02-11 | 南京工程学院 | Rapid detection method and detection system for micro deformation of object |
| CN112986019A (en) * | 2021-02-01 | 2021-06-18 | 北京工业大学 | Fatigue mechanics test overall process data acquisition system |
| CN113758437B (en) * | 2021-11-05 | 2022-03-18 | 北京创米智汇物联科技有限公司 | Non-contact deformation monitoring system and method |
| CN116839495A (en) * | 2023-06-25 | 2023-10-03 | 深圳市海塞姆科技有限公司 | Deformation vision measurement method based on laser speckle, video extensometer and medium |
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| JP2001141429A (en) * | 1999-11-18 | 2001-05-25 | Japan Atom Energy Res Inst | Base length movable-type surface profile measuring device |
| JP5079402B2 (en) * | 2007-06-25 | 2012-11-21 | 新日本製鐵株式会社 | Method and apparatus for measuring a three-dimensional profile of a light emitting object |
| CN102003946B (en) * | 2010-09-02 | 2012-06-20 | 北京航空航天大学 | High-temperature three-dimensional digital image related measurement system and measurement method |
| CN102608126A (en) * | 2012-02-23 | 2012-07-25 | 中冶连铸技术工程股份有限公司 | On-line detection method and device for surface defects of high-temperature continuously cast bloom |
| CN102840829B (en) * | 2012-09-03 | 2015-07-15 | 北京科技大学 | Manual mark-basedsystem and manual mark-based method for measuring displacement field inside high temperature object area |
| CN103558243B (en) * | 2013-11-19 | 2015-10-07 | 北京航空航天大学 | A kind of high-speed aircraft hot surface full field deformation measure device based on optical means |
| CN104006757B (en) * | 2014-06-13 | 2017-01-11 | 苏州西博三维科技有限公司 | Welding deformation real-time detection system and detection method thereof |
| CN104034263B (en) * | 2014-07-02 | 2016-12-07 | 北京理工大学 | A kind of non-contact measurement method of forging's block dimension |
| CN104457603B (en) * | 2014-08-18 | 2017-02-22 | 清华大学 | Object deformation measurement method under high-temperature environment |
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