CN106197290A - Based on structure light and numeral speckle measurement high temp objects displacement and the device of deformation - Google Patents
Based on structure light and numeral speckle measurement high temp objects displacement and the device of deformation Download PDFInfo
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- CN106197290A CN106197290A CN201610712823.6A CN201610712823A CN106197290A CN 106197290 A CN106197290 A CN 106197290A CN 201610712823 A CN201610712823 A CN 201610712823A CN 106197290 A CN106197290 A CN 106197290A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/167—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by projecting a pattern on the object
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- Length Measuring Devices By Optical Means (AREA)
Abstract
The present invention relates to a kind of based on structure light with numeral speckle measurement high temp objects displacement and the device of deformation, including: structure light laser, it is used for exporting monochromatic structure light and being irradiated to testee surface；Laser ranging unit, for obtaining the testee surface distance to photoelectric detection unit；Optical image unit, for being imaged on photoelectric detection unit by the monochromatic structure light image on testee surface；Photoelectric detection unit, for gathering the image of imaging and being sent to data processing unit；Data processing unit, for the image of sending photoelectric detection unit and described testee surface, the distance to photoelectric detection unit calculates, and obtains the displacement at high operating temperatures of described object being measured and deformation.The present invention may be used for Measuring Object displacement at high operating temperatures and deformation.
Description
Technical field
The present invention relates to optical technical field, particularly relate to one based on structure light and numeral speckle measurement high temperature substrate position
Move and the device of deformation.
Background technology
The information utilizing laser speckle measurement object has non-cpntact measurement, measurement of full field, the simple advantage of optical path.
Technology based on laser speckle measurement object space or deformation data has and utilizes the micro-displacement of laser speckle measurement object, shape
Change, vibrations etc., but this method is only applicable to closely the object that the temperature in the range of (less than 2m) is the highest, at a distance
For high temp objects, hot environment is unfavorable for producing stable laser interference figure, and laser power is far required higher by distance,
Conventional laser instrument is difficult to meet requirement, and therefore, the method being currently based on laser speckle is dfficult to apply to telemeasurement high temperature
The displacement of object and deformation.
Simple digital speckle method is utilized to go for the measurement of remote object, as long as ensureing the temperature of object not
The highest, characteristic point is easily set.But for remote high temp objects, its characteristic point is not easy to arrange, and so numeral dissipates
Speckle method is just difficult to use in the displacement measuring remote high temp objects.
Summary of the invention
In view of above-mentioned analysis, it is desirable to provide one is based on structure light and numeral speckle measurement high temp objects displacement
With the device of deformation, in order to solve the problem that existing digital speckle method is difficult to the remote high temperature problem displacement of strategy.
The purpose of the present invention is mainly achieved through the following technical solutions:
The invention provides a kind of based on structure light with numeral speckle measurement high temp objects displacement and the device of deformation, bag
Include:
Structure light laser, is used for exporting monochromatic structure light and being irradiated to testee surface；
Laser ranging unit, for obtaining the testee surface distance to photoelectric detection unit；
Optical image unit, for being imaged on photoelectric detection unit by the monochromatic structure light image on testee surface；
Photoelectric detection unit, for gathering the image of imaging and being sent to data processing unit；
Data processing unit, for the image of sending photoelectric detection unit and described testee surface to light electrical resistivity survey
The distance surveying unit calculates, and obtains the displacement at high operating temperatures of described object being measured and deformation.
Further, described monochromatic structure light structure be lattice array, the wave-length coverage of light is 380～760nm.
Further, the pattern of described monochromatic mechanism light is point-like, dot matrix column-shaped, wire, linear array column-shaped, circular, net
Trellis, strip or cosine strip.
Further, described laser ranging unit is fixing relative to position with optical image unit and photoelectric detection unit not
Become.
Further, described photoelectric detection unit is CCD camera or CMOS camera.
Further, described optical image unit specifically includes:
Optical filter, for narrow band pass filter, the wavelength that optical filter transmitance maximum is corresponding is the output of structure light laser
The wavelength of monochromatic structure light；
Optical imaging assemblies, for thing side's telecentric imaging system, is used for being imaged onto described by the picture on described testee surface
On the photosurface of photoelectric detection unit.
Further, described data processing unit specifically includes:
Data reception module, for the image of photoelectric detection unit described in real-time reception, and is sent to memory module；Described
Image comprises two parts, and a part is the image from described testee, uses P0Representing, another part is from described tested
The image of the structure light of object reflection, uses P1Represent, P0And P1Merge on same piece image；
Memory module, the image sent for data receipt unit described in real-time reception also stores；
Data analysis module, for digital picture being carried out calculating process based on specific mathematical algorithm, obtains described quilt
Measuring Object displacement at high operating temperatures and deformation.
Further, described data analysis module specifically for, by the P in A image1As fixed reference feature point, choose suitable
When feature sub-image C scan in image B as references object, based on correlation theory by search B image with C
The subimage C ' of coupling determines image A and image B relative displacement variable quantity or deformation quantity.
The present invention has the beneficial effect that:
The present invention may be used for Measuring Object displacement at high operating temperatures and deformation.
Other features and advantages of the present invention will illustrate in the following description, and, becoming from description of part
Obtain it is clear that or understand by implementing the present invention.The purpose of the present invention and other advantages can be by the explanations write
Structure specifically noted in book, claims and accompanying drawing realizes and obtains.
Accompanying drawing explanation
Accompanying drawing is only used for illustrating the purpose of specific embodiment, and is not considered as limitation of the present invention, at whole accompanying drawing
In, identical reference marks represents identical parts.
Fig. 1 is the structural representation of device described in the embodiment of the present invention.
Detailed description of the invention
Specifically describing the preferred embodiments of the present invention below in conjunction with the accompanying drawings, wherein, accompanying drawing constitutes the application part, and
Together with embodiments of the present invention for explaining the principle of the present invention.An accompanying drawing or a kind of embodiment of the present invention are retouched
The element stated and feature can combine with the element shown in one or more other accompanying drawings or embodiment and feature.
It should be noted that, in order to understand purpose, accompanying drawing and explanation eliminate unrelated to the invention, those of ordinary skill in the art are known
Parts and the expression of process and description.
As it is shown in figure 1, Fig. 1 is the structural representation of device described in the embodiment of the present invention, specifically may include that
Structure light laser 1, is mainly used in exporting monochromatic structure light and being irradiated to testee surface；
Structure light laser 1 exports monochromatic structure light and is irradiated to testee 2 surface, and the structure of light is lattice array, light
Wave-length coverage be 380～760nm, the pattern of structure light is point-like, dot matrix column-shaped, wire, linear array column-shaped, circular, grid
The all kinds structures such as shape, strip, cosine strip (intensity is cosine distribution).Testee 2 is remote high temp objects, is in
Constant-pressure and high-temperature environment, temperature is the highest can be to 1800 DEG C, and the distance to photodetector is more than 2m.
Laser ranging unit 3, is mainly used in the distance obtaining testee surface to photoelectric detection unit；
Laser ranging unit 3 can be a small industry steam turbine, and certainty of measurement is 1mm, laser ranging unit 3 and light
Learn image-forming assembly 42 position relative with photoelectric detection unit 5 to immobilize, testee 2 can be obtained by laser ranging unit
Surface is to the distance of photoelectric detection unit 5.
Optical image unit, including: optical filter 41 and optical imaging assemblies 42, it is mainly used in the list on testee surface
Color structure light image is imaged in photoelectric detection unit；
Wherein, optical filter 41 is narrow band pass filter, and the wavelength that optical filter 41 transmitance maximum is corresponding is structure ray laser
The wavelength of the structure light of device 1 output；
Optical imaging assemblies 42 is thing side's telecentric imaging system, the picture on described testee 2 surface can be imaged onto institute
State on the photosurface of photoelectric detection unit 5.
Photoelectric detection unit 5, is mainly used in gathering the image of imaging and being sent to data processing unit；
Photoelectric detection unit 5 is digital camera, and the primary clustering detector of camera uses cmos detector, cmos detector
Pixel count is more than 1024*1024；
Data processing unit, including: data reception module 61, memory module 62 and data analysis module 63, mainly use
In the image sending photoelectric detection unit 5 and testee 2 surface, the distance to photoelectric detection unit 5 calculates,
To object being measured displacement at high operating temperatures and deformation.
Wherein, data reception module 61, can be a set of data acquisition card apparatus, possesses high speed acquisition and high speed storing merit
Can, it is mainly used in the image of photoelectric detection unit described in real-time reception, and is sent to memory module 62；This image comprises two
Point, a part is the image from described testee, uses P0Representing, another part is the knot reflected from described testee
The image of structure light, uses P1Represent, P0And P1Merge on same piece image；
Memory module 62, possesses high speed acquisition and high speed storing, process function, is mainly used in real-time reception data reception
Block 61 send digital picture and store；
Data analysis module 63, based on carrying out digital picture based on specific mathematical algorithm (such as mathematical algorithm F)
Calculation processes, and obtains the displacement at high operating temperatures of described object being measured and deformation.
During measuring, the locus of the structure light of structure light laser 1 output is changeless.When described quilt
When survey object opposed configuration light own is constant, P0And P1Image will keep constant, be subjected to displacement because of reasons such as variations in temperature when object
Or during deformation, object will change with the relative position of structure light, i.e. P0And P1Relative change in location will occur.At thing
Body is subjected to displacement or respectively gathers piece image before and after deformation, represents with A, B respectively, uses mathematical algorithm F by the P in A image1
As fixed reference feature point, choose suitable feature sub-image C and scan in image B as references object, based on relevant reason
Opinion determines image A and image B relative displacement variable quantity or deformation by the subimage C ' mated most with C in search B image
Amount.
The basic representation of above-mentioned mathematical algorithm F is
In formula: f (xi,yj) represent certain point (x of C in A imagei,yj) gray value at place；Represent C ' in B image
Certain pointThe gray value at place；WithRepresent subset C and subset C respectively ' average gray value.Find out relevant maximum
(x y), i.e. can determine that displacement (Δ x, Δ y) to point.
In sum, embodiments provide a kind of based on structure light and numeral speckle measurement high temp objects displacement and
The device of deformation, may be used for deformation and the displacement of telemeasurement high temp objects, and the present invention is at digital speckle method base
Add structure ray laser on plinth and irradiate high temp objects, the light that object itself sends as feature object, employing structure ray laser
Spectrum be continuous spectrum, laser is the most corresponding a certain wavelength XlasterMonochromatic light, when object is irradiated with a laser, thing
λ on the continuous spectrum that body sendslasterIntensity E of position will change, it will usually strengthens, at this moment shoots object with camera,
In the case of optical maser wavelength is suitable, the structured light patterns of body surface can be told from image, it is possible to by numeral
Image procossing, obtains the structured light patterns of body surface, obtains the change information of body surface as characteristic pattern.It addition, this
Invention introduces optical filter, it is to avoid the problem that structure light is submerged, the effect of optical filter is by except λlasterLight shield in addition falls,
Make only λlasterNear light can incide detector, the structured light patterns of such body surface can blur-free imaging,
Improve image quality so that the Comparision of post-digital image procossing is easy.
It will be understood by those skilled in the art that all or part of flow process realizing above-described embodiment method, can be by meter
Calculation machine program instructs relevant hardware and completes, and described program can be stored in computer-readable recording medium.Wherein, institute
Stating computer-readable recording medium is disk, CD, read-only store-memory body or random store-memory body etc..
Although the present invention of being described in detail and advantage thereof it should be appreciated that without departing from by appended claim
Various change can be carried out in the case of the spirit and scope of the present invention limited, substitute and convert.And, the model of the application
Enclose the process described by description of being not limited only to, equipment, means, the specific embodiment of method and steps.Common in this area
Technical staff will readily appreciate that from the disclosure, can use execution and corresponding reality described herein according to the present invention
Execute the essentially identical function of example or obtain the result essentially identical with it, the process that existing and future is the most to be developed, equipment,
Means, method or step.Therefore, appended claim is intended in the range of them include such process, equipment, hands
Section, method or step.
The above, the only present invention preferably detailed description of the invention, but protection scope of the present invention is not limited thereto,
Any those familiar with the art in the technical scope that the invention discloses, the change that can readily occur in or replacement,
All should contain within protection scope of the present invention.
Claims (8)
1. one kind based on structure light and numeral speckle measurement high temp objects displacement and the device of deformation, it is characterised in that including:
Structure light laser, is used for exporting monochromatic structure light and being irradiated to testee surface；
Laser ranging unit, for obtaining the testee surface distance to photoelectric detection unit；
Optical image unit, for being imaged on photoelectric detection unit by the monochromatic structure light image on testee surface；
Photoelectric detection unit, for gathering the image of imaging and being sent to data processing unit；
Data processing unit, for the image of sending photoelectric detection unit and described testee surface to photodetection list
The distance of unit calculates, and obtains the displacement at high operating temperatures of described object being measured and deformation.
Device the most according to claim 1, it is characterised in that described monochromatic structure light structure be lattice array, light
Wave-length coverage is 380～760nm.
Device the most according to claim 1, it is characterised in that the pattern of described monochromatic mechanism light be point-like, dot matrix column-shaped,
Wire, linear array column-shaped, circular, latticed, strip or cosine strip.
Device the most according to claim 1, it is characterised in that described laser ranging unit and optical image unit and photoelectricity
Probe unit immobilizes relative to position.
Device the most according to claim 1, it is characterised in that described photoelectric detection unit is CCD camera or CMOS phase
Machine.
Device the most according to claim 1, it is characterised in that described optical image unit specifically includes:
Optical filter, for narrow band pass filter, the wavelength that optical filter transmitance maximum is corresponding is the monochrome of structure light laser output
The wavelength of structure light；
Optical imaging assemblies, for thing side's telecentric imaging system, is used for the picture on described testee surface is imaged onto described photoelectricity
On the photosurface of probe unit.
Device the most according to claim 1, it is characterised in that described data processing unit specifically includes:
Data reception module, for the image of photoelectric detection unit described in real-time reception, and is sent to memory module；Described image
Comprising two parts, a part is the image from described testee, uses P0Representing, another part is from described testee
The image of the structure light of reflection, uses P1Represent, P0And P1Merge on same piece image；
Memory module, the image sent for data receipt unit described in real-time reception also stores；
Data analysis module, for digital picture being carried out calculating process based on specific mathematical algorithm, obtains described measured
Object displacement at high operating temperatures and deformation.
Device the most according to claim 7, it is characterised in that described data analysis module specifically for, by A image
P1As fixed reference feature point, choose suitable feature sub-image C and scan in image B as references object, based on relevant
The theoretical subimage C ' by mating most with C in search B image determines image A and image B relative displacement variable quantity or shape
Variable.
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| CN108120665A (en) * | 2017-12-28 | 2018-06-05 | 无锡奥芬光电科技有限公司 | The method and apparatus of monochromatic structure optical test molecule |
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| CN108827174A (en) * | 2018-04-26 | 2018-11-16 | 哈尔滨理工大学 | A kind of insulating material of polymer electromechanical deformation monitoring device and monitoring method |
| CN109253696A (en) * | 2018-11-28 | 2019-01-22 | 信利光电股份有限公司 | Equipment based on structural light measurement object size |
| CN110799800A (en) * | 2017-05-24 | 2020-02-14 | 国家科学研究中心 | Method for measuring the curvature of a reflecting surface and associated optical device |
| CN111426280A (en) * | 2020-05-08 | 2020-07-17 | 中国科学技术大学 | Two-dimensional DIC optical extensometer out-of-plane compensation device and method based on structured light |
| CN111856480A (en) * | 2020-07-29 | 2020-10-30 | 南京工程学院 | Rapid detection method and detection system for equipment displacement |
| CN111854623A (en) * | 2020-07-29 | 2020-10-30 | 南京工程学院 | Rapid detection method and detection system for micro deformation of object |
| CN112986019A (en) * | 2021-02-01 | 2021-06-18 | 北京工业大学 | Fatigue mechanics test overall process data acquisition system |
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| CN116839495A (en) * | 2023-06-25 | 2023-10-03 | 深圳市海塞姆科技有限公司 | Deformation vision measurement method based on laser speckle, video extensometer and medium |
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| CN110799800A (en) * | 2017-05-24 | 2020-02-14 | 国家科学研究中心 | Method for measuring the curvature of a reflecting surface and associated optical device |
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| CN108050955A (en) * | 2017-12-14 | 2018-05-18 | 合肥工业大学 | Based on structured light projection and the relevant high temperature air disturbance filtering method of digital picture |
| CN108050955B (en) * | 2017-12-14 | 2019-10-18 | 合肥工业大学 | Filtering method is disturbed based on structured light projection high temperature air relevant to digital picture |
| CN108120665A (en) * | 2017-12-28 | 2018-06-05 | 无锡奥芬光电科技有限公司 | The method and apparatus of monochromatic structure optical test molecule |
| CN108827174A (en) * | 2018-04-26 | 2018-11-16 | 哈尔滨理工大学 | A kind of insulating material of polymer electromechanical deformation monitoring device and monitoring method |
| CN109253696A (en) * | 2018-11-28 | 2019-01-22 | 信利光电股份有限公司 | Equipment based on structural light measurement object size |
| CN111426280A (en) * | 2020-05-08 | 2020-07-17 | 中国科学技术大学 | Two-dimensional DIC optical extensometer out-of-plane compensation device and method based on structured light |
| CN111856480A (en) * | 2020-07-29 | 2020-10-30 | 南京工程学院 | Rapid detection method and detection system for equipment displacement |
| CN111854623A (en) * | 2020-07-29 | 2020-10-30 | 南京工程学院 | Rapid detection method and detection system for micro deformation of object |
| CN111854623B (en) * | 2020-07-29 | 2022-02-11 | 南京工程学院 | Rapid detection method and detection system for micro deformation of object |
| CN111856480B (en) * | 2020-07-29 | 2023-11-10 | 南京工程学院 | Rapid detection method and detection system for equipment displacement |
| CN112986019A (en) * | 2021-02-01 | 2021-06-18 | 北京工业大学 | Fatigue mechanics test overall process data acquisition system |
| CN113758437A (en) * | 2021-11-05 | 2021-12-07 | 北京创米智汇物联科技有限公司 | Non-contact deformation monitoring system and method |
| CN116839495A (en) * | 2023-06-25 | 2023-10-03 | 深圳市海塞姆科技有限公司 | Deformation vision measurement method based on laser speckle, video extensometer and medium |
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