CN106154157A - Adjustable surge load testing apparatus for electromagnetic relay - Google Patents
Adjustable surge load testing apparatus for electromagnetic relay Download PDFInfo
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- CN106154157A CN106154157A CN201610875918.XA CN201610875918A CN106154157A CN 106154157 A CN106154157 A CN 106154157A CN 201610875918 A CN201610875918 A CN 201610875918A CN 106154157 A CN106154157 A CN 106154157A
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- electromagnetic relay
- surge
- resistance
- control
- circuit
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
- G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
Abstract
The present invention provides a kind of adjustable surge load testing apparatus for electromagnetic relay, wherein, device includes: test operation terminal, control/Acquisition Circuit, surge load generating unit, surge load generating unit connects one to one with electromagnetic relay, wherein, test operation terminal is for issuing experiment control order to described control/Acquisition Circuit, and is received the contact current sample information of electromagnetic relay by control/Acquisition Circuit and surge load generating unit；Control/Acquisition Circuit exports surge current for regulating the resistance of described surge load generating unit according to experiment control order to electromagnetic relay；Surge load generating unit for exporting the surge current of predefined size under the control of described control/Acquisition Circuit to electromagnetic relay, and the described contact current sample information of electromagnetic relay of sampling feeds back to described test operation terminal by described control/Acquisition Circuit.The present invention can accurately test the Surge handling capability of electromagnetic relay.
Description
Technical field
The present invention relates to electromagnetic relay technical field, particularly relate to electromagnetic relay electrical contact performance analysis of experiments dress
Put, specifically, it is simply that a kind of adjustable surge load testing apparatus for electromagnetic relay.
Background technology
Owing to electromagnetic relay has the irreplaceable advantage of a series of solid electronic device, such as: high conversion level, the most defeated
Entering output ratio etc., it is widely used in fields such as Industry Control, communication, electric power, and electromagnetic relay is mainly used in control system
Power supply and the break-make of signal.
During actually used electromagnetic relay, owing to side circuit existing distributed inductance and electric capacity, electromagnetism
Transient overvoltage can be produced during relay contact opening and closing or cross stream, thus causing electromagnetic relay contact to occur transient state arc erosion to be subject to
Damage or adhesion was lost efficacy, affect the electric life of electromagnetic relay product.Thus, by surge test, electromagnetic relay product is resisted
Surge capacity carries out testing, it is significant to analyze.
At present, the research affected relay contact for surge at home and abroad has been subjected to extensive concern, but, also do not have
Special assay device is had according to the requirement of testing program plurality of electromagnetic relay test part to carry out surge test automatically, and instead
Feedback Test Information, existing surge test device is primarily present following shortcoming:
1, the surge current time is controlled by the discharge and recharge time of adjustment capacitor mostly, and precision is the highest, is carrying out
The relation of quantitative description surge current time and electric life it is difficult to during analysis of experiments；
2, need to change or multiple electromagnetic relay testpieces experimental condition when the surge test condition in testing program
Time inconsistent, needing to carry out each surge test equipment one by one manual adjustment, test efficiency is low；
3, during surge test, the monitoring to contact voltage/current waveform needs to be realized by equipment such as oscillographs,
It is difficult to plurality of electromagnetic relay test part is carried out surge test simultaneously, and is not easy in testing crew real time inspection process of the test
The Test Information of each testpieces；
4, circuit structure is fixed, it is difficult to flexible expansion, when testpieces quantity exceedes equipment permission quantity, needs to test people
The manual switching of member is also tested in batches, and test is time-consuming long.
Therefore, those skilled in the art urgently research and develop one and can close between quantitative description surge current time and electric life
The high efficiency surge experimental provision of system.
Summary of the invention
In view of this, the technical problem to be solved in the present invention is to provide a kind of adjustable surge for electromagnetic relay to bear
Carrying assay device, solving existing surge test device cannot the asking of relation between quantitative description surge current time and electric life
Topic.
In order to solve above-mentioned technical problem, the detailed description of the invention of the present invention provides a kind of adjustable for electromagnetic relay
Surge load testing apparatus, including: multiple control/Acquisition Circuit that test operation terminal is connected with described test operation terminal,
And the multiple surges load generating unit being connected with described control/Acquisition Circuit, described surge load generating unit and electromagnetism
Relay connects one to one, and wherein, described test operation terminal is for issuing experiment control life to described control/Acquisition Circuit
Order, and the contact current sampling of generating unit reception electromagnetic relay is loaded by described control/Acquisition Circuit and described surge
Information；Described control/Acquisition Circuit for regulating the resistance of described surge load generating unit according to described experiment control order
Resistance thus to electromagnetic relay export surge current；Described surge load generating unit is in described control/Acquisition Circuit
Control under to electromagnetic relay output predefined size surge current, and electromagnetic relay of sampling described contact current sampling
Information feeds back to described test operation terminal by described control/Acquisition Circuit.
According to the above-mentioned detailed description of the invention of the present invention, for the adjustable surge load testing apparatus of electromagnetic relay
At least have the advantages that realize to surge current time of multiple electromagnetic relay testpieces, surge interval time and
The independence of surge number of times controls；It is automatically finished the surge test of multiple electromagnetic relay testpieces, and shows each electricity in real time
The surge test persistent period of magnetic relay testpieces, completed surge number of times and contact current waveform；Can be to an electricity
Magnetic relay testpieces individually carries out surge load test, it is also possible to multiple electromagnetic relays carry out independent trials condition simultaneously
Surge load test, accurately test the Surge handling capability of electromagnetic relay；Support the phase to each electromagnetic relay testpieces
Close monitoring in real time and looking into of Test Information (such as: surge test persistent period, completed surge number of times and contact current waveform)
Ask, it is possible to according to the requirement of different tests scheme, plurality of electromagnetic relay contact is carried out surge load test simultaneously, improve
Test efficiency.
It is to be understood that above-mentioned general description and detailed description below be merely illustrative and illustrative, it is not
The scope that the present invention to be advocated can be limited.
Accompanying drawing explanation
Following appended accompanying drawing is a part for the description of the present invention, and it depicts the example embodiment of the present invention, institute
Accompanying drawing is used for illustrating the principle of the present invention together with the description of description.
A kind of adjustable surge load testing apparatus for electromagnetic relay that Fig. 1 provides for the specific embodiment of the invention
Schematic block diagram；
The schematic block diagram of a kind of control/Acquisition Circuit that Fig. 2 provides for the specific embodiment of the invention；
A kind of surge load generating unit circuit theory diagrams that Fig. 3 provides for the specific embodiment of the invention；
Surge load is sent out by a kind of processor that Fig. 4 provides for the specific embodiment of the invention by control/Acquisition Circuit
The schematic diagram that raw unit is controlled.
Detailed description of the invention
For making the purpose of the embodiment of the present invention, technical scheme and advantage clearer, below will with accompanying drawing and in detail
Narration clearly illustrates the spirit of disclosed content, and any skilled artisan is understanding present invention
After embodiment, when the technology that can be taught by present invention, being changed and modify, it is without departing from the essence of present invention
God and scope.
The schematic description and description of the present invention is used for explaining the present invention, but not as a limitation of the invention.
It addition, the element/component of same or like label is used to represent same or like portion used in drawings and the embodiments
Point.
About " first " used herein, " second " ... etc., censure order or the meaning of cis-position the most especially, also
It is not used to limit the present invention, its element described with constructed term only for difference or operation.
About direction used herein term, such as: upper and lower, left and right, front or rear etc., it is only the side with reference to accompanying drawing
To.Therefore, the direction term of use is used to illustrate not for limiting this creation.
About " comprising " used herein, " including ", " having ", " containing " etc., it is the term of opening, i.e.
Mean including but not limited to.
About used herein " and/or ", including the arbitrary of described things or all combine.
About term used herein " substantially ", " about " etc., in order to modify any can be with the quantity of microvariations or mistake
Difference, but this slight variations or error can't change its essence.It is said that in general, the microvariations modified of this type of term or error
Scope can be 20% in some embodiments, can be 10% in some embodiments, can be in some embodiments 5% or its
His numerical value.It will be understood by those skilled in the art that the aforementioned numerical value mentioned can adjust according to actual demand, be not limited thereto.
Some is in order to describe the word of the application by lower or discuss in the other places of this description, to provide art technology
Personnel are about guiding extra in the description of the present application.
A kind of adjustable surge load testing apparatus for electromagnetic relay that Fig. 1 provides for the specific embodiment of the invention
Schematic block diagram, as it is shown in figure 1, this adjustable surge load testing apparatus includes: test operation terminal 1 and multiple described examination
Test control/Acquisition Circuit 2 that operation terminal 1 connects and the surge load generating unit 3 being connected with electromagnetic relay；Adjustable surge
Load testing apparatus completes the surge load test to electromagnetic relay.
As it can be seen, adjustable surge load testing apparatus specifically includes that test operation terminal 1 is (mainly by host computer 11 He
Processor 12 forms), multiple control/Acquisition Circuit 3, multiple surge load generating unit 3.Host computer 11, processor 12 and control
System/Acquisition Circuit 3 is described in detail below:
(1) host computer 11
Described host computer 11 is specifically as follows the PC equipped with test management software, and PC passes through CAN and processor
12 connect, and PC sends surge test condition setting command by CAN to described processor 12, and it is logical that PC is additionally operable to display
Cross the electromagnetic relay surge load test information of processor 12 feedback that CAN receives；In the specific embodiment of the present invention,
Surge test condition setting command include each described surge load the surge current time of generating unit, surge interval time and
Surge number of times；Described surge load test information include each described surge load generating unit the surge test persistent period,
Completed surge number of times and electromagnetic relay testpieces contact current sample information.
(2) processor 12
In the specific embodiment of the present invention, processor 12 can use STM32 single-chip microcomputer, processor 12 to be used for receiving upper
The surge test condition setting command that machine 11 sends, and feed back the surge load test information of electromagnetic relay testpieces；Described
Processor 12 is additionally operable to control multiple surge load generating unit 3 wanting according to surge test condition by control/Acquisition Circuit 2
Ask and export surge current to plurality of electromagnetic relay.
(3) control/Acquisition Circuit 2
Described control/Acquisition Circuit 2 is for receiving the control command that described processor 12 sends, and passes through surge by order
The electromagnetic relay specified is tested by load generating unit 3；Control/Acquisition Circuit 2 is additionally operable to during surge test
The contact current sample information of monitoring electromagnetic relay, and the contact current sample information monitored is fed back to processor 12.
The schematic block diagram of a kind of control/Acquisition Circuit that Fig. 2 provides for the specific embodiment of the invention, as in figure 2 it is shown,
Each control/Acquisition Circuit 2 includes that a plate selects 21, main control unit of circuit, 23, line of 22, data acquisition circuit
Circle drive circuit 24, each control/Acquisition Circuit 2 can connect 8 surge load generating units 3.Wherein, described plate selects circuit
The signal input part that enables of 21 is connected with the circuit selection signal output pin of described processor 12；The number of described main control unit 22
Being connected according to the data output pins of acquisition controlling I/O mouth with described data acquisition circuit 23, the coil of described main control unit 22 drives
The dynamic I/O mouth that controls is connected with the control input port of described coil driver 24, the CS port of described main control unit 22, IN end
Mouth and OUT terminal mouth are connected with data acquisition I/O mouth with the control of described processor 12；Described main control unit 22, described data acquisition
The power input of collector 23 and described coil driver 24 all selects circuit 21 to be connected with described plate.
Referring again to Fig. 2, plate selects circuit 21 main by the first relay 211, audion the 212, first resistance 213 and second
Resistance 214 forms.Wherein, the first relay 211 has coil 2111 and normally opened contact 2112, the coil of the first relay 211
2111 and normally opened contact 2112 shorted on one end after be connected with positive source VCC, the normally opened contact 2112 of the first relay 211
The other end is connected with the power input of main control unit 22, data acquisition circuit 23 and coil driver 24；First relay
The other end of the coil 2111 of 211 is connected with the colelctor electrode of audion 212, the grounded emitter of audion 212, audion 212
Emitter stage and base stage between be connected by the first resistance 213 and the second resistance 214, the first resistance 213 and the second resistance 214 it
Between node be the enable signal input part that plate selects circuit 21, plate selects the enable signal input part of circuit 21 and described processor 12
A circuit selection signal output pin be connected.
Data acquisition circuit 23 includes bleeder circuit, follow circuit and A/D conversion chip (not illustrating in figure), and surge loads
The E port of generating unit 3 is connected to the input pin of A/D conversion chip, A/D conversion chip by bleeder circuit, follow circuit
Output pin be connected with one group of data acquisition control I/O mouth of main control unit 22；In the specific embodiment of the present invention, follow electricity
Road is mainly made up of LF356, and A/D conversion chip can be AD9220.
Coil driver 24 can be made up of transistor array ULN2803,8 control input ports of transistor array
Control I/O mouth with one group of coil drive of main control unit 22 to be connected, 8 output ports of transistor array respectively with 8 surges
The D port of load generating unit 3 is connected.
Main control unit 22 can use fpga chip EP2C35F484, one group of data acquisition control I/O of main control unit 22
Mouth connects the data output pins of data acquisition circuit 23, and one group of coil drive of main control unit 22 controls I/O mouth and connects coil
One group of control of the control input port of drive circuit 24, the CS port of main control unit 22, IN port and OUT terminal mouth and processor 12
System is connected with data acquisition I/O mouth.
A kind of surge load generating unit circuit theory diagrams that Fig. 3 provides for the specific embodiment of the invention, see Fig. 3,
The specific embodiment of surge load generating unit 3 is as follows:
Surge load generating unit 3 specifically include the 3rd resistance 31, the 4th resistance 32, the 5th resistance 33, metal-oxide-semiconductor 34, the
Six resistance 35 and the 7th resistance 36, wherein, the 3rd resistance 31, its one end is by the dynamic circuit connector stationary contact of A port with electromagnetic relay
Connecting, the other end is connected with B port；4th resistance 32, its one end is connected with B port, other end ground connection；5th resistance 33, its
One end is connected with A port；Metal-oxide-semiconductor 34, its drain electrode is connected with the other end of described 5th resistance 33, and base stage is connected with C port, source
Pole is connected with E port；6th resistance 35, its one end is connected with the drain electrode of described metal-oxide-semiconductor 34, the other end and described metal-oxide-semiconductor 34
Source electrode connects；7th resistance 36, its one end is connected with the source electrode of described metal-oxide-semiconductor 34, other end ground connection.
In the specific embodiment of the present invention, the resistance of the 3rd resistance 31 is 7500 ohm；The resistance of described 4th resistance 32
It it is 1000 ohm；The resistance of described 5th resistance 33 is 5.6 ohm；The resistance of described 6th resistance 35 is 22 ohm；Described
The resistance of seven resistance 36 is 0.1 ohm.
Surge load generating unit 3 is electric to electromagnetic relay output surge for the instruction according to control/Acquisition Circuit 2
Stream；Surge load generating unit 3 is additionally operable to the coil of the order-driven correspondence electromagnetic relay according to control/Acquisition Circuit 2 (i.e.
Coiling), make electromagnetic relay operate；During described surge load generating unit 3 is additionally operable to electromagnetic relay surge test
Contact current sample；Described surge load generating unit 3 is also by the resistance of regulation the 5th resistance the 33, the 6th resistance 35
Value thus control the size of surge current.
Surge load is sent out by a kind of processor that Fig. 4 provides for the specific embodiment of the invention by control/Acquisition Circuit
The schematic diagram that raw unit is controlled, shown in Fig. 4, surge is loaded by the processor 12 shown in Fig. 4 by control/Acquisition Circuit 2
The schematic diagram that generating unit 3 is controlled illustrates, and in Fig. 3, the A port (i.e. terminal A) of surge load generating unit 3 connects
Electromagnetic relay testpieces dynamic circuit connector stationary contact 4-1, is used for controlling described electromagnetic relay moving together contact group 4-1,4-3 surge current
Break-make；In Fig. 3 surge load generating unit 3 B port (i.e. terminal B) connect control/Acquisition Circuit 2 Bi (i=1,2 ...
8) port, for feeding back the level state of electromagnetic relay dynamic circuit connector stationary contact；In Fig. 3, C port (i.e. terminal C) connection controls/adopts
Ci (i=1,2 ... the 8) port of collector 2, for receiving the described control/Acquisition Circuit 2 control signal to metal-oxide-semiconductor 34；Fig. 3
Middle D port (i.e. terminal D) connects Di (i=1,2 ... the 8) port of control/Acquisition Circuit 2, for according to described control/collection electricity
The action of electromagnetic relay is controlled by the control command of road 2 output；In Fig. 3, E port (i.e. terminal E) connects control/collection
Ei (i=1,2 ... the 8) port of circuit 2, moves for exporting electromagnetic relay to described control/Acquisition Circuit 2 in process of the test
Close the sampled voltage of contact sets；First end of described 3rd resistance 31 and the first end of described 5th resistance 33 and one electricity
The dynamic circuit connector stationary contact of magnetic relay connects；First end ground connection GND of described 4th resistance 32；Second end of described 3rd resistance 31
It is connected with terminal B with the second end of described 4th resistance 32；Second end of described 5th resistance 33 and described 6th resistance 35
The drain electrode of the first end and metal-oxide-semiconductor 34 connects；Second end of described 6th resistance 35 and the first end of described 7th resistance 36 and institute
The source electrode stating metal-oxide-semiconductor 34 connects；Second end ground connection GND of described 7th resistance 36；(resistance is 7500 Europe to described 3rd resistance 31
Nurse) constitute bleeder circuit with described 4th resistance 32 (resistance is 1000 ohm), for electromagnetic relay dynamic circuit connector stationary contact electricity
Pressure carries out dividing potential drop, and the incoming level making voltage swing meet described control/Acquisition Circuit 2 requires (control/Acquisition Circuit 2 defeated
Entering level demand is 3.3V), it is specially described when dynamic circuit connector stationary contact level is 28V, bleeder circuit is connected :+28V → dynamic circuit connector is touched
Point group → described 3rd resistance 31 → described 4th resistance 32 → GND, terminal B at level be equal to 28V/ (7.5K Ω+1K Ω) ×
(1K Ω) ≈ 3.3V, when dynamic circuit connector stationary contact level is 0V, bleeder circuit disconnects, and at terminal B, level is 0V；Described 5th resistance
33, described 6th resistance 35 and described metal-oxide-semiconductor 34 control electromagnetic relay moving together contact group for the level state according to terminal C
Surge current break-make；Described 7th resistance 36 (resistance is 0.1 ohm) is for adopting the electric current flowing through moving together contact group
Sample.
Electromagnetic relay part specifically includes that
For carrying out the electromagnetic relay testpieces of surge load test, quantity can according to actual needs and described surge bear
Carry the quantity flexible design of generating unit.
As shown in Figure 4, it is described in detail as a example by the surge load test of electromagnetic relay 1,9: at test operation eventually
End arranges surge test condition (the surge load surge current time 5ms of generating unit 1, surge interval 10ms, surge number of times
2000 times；The surge load surge current time 10ms of generating unit 9, surge are spaced 10ms, surge number of times 1000 times), test
Surge test condition is sent to processor by CAN by operation terminal；Processor enable EN1, EN2, CS1, CS2 port it
After, respectively the experimental condition of electromagnetic relay testpieces 1,9 is sent to control/Acquisition Circuit 1 and by OUT1, OUT2 port
The IN port of control/Acquisition Circuit 2, and send on-test order.For electromagnetic relay testpieces 1 (9): control/gather
The C1 port output high level of circuit 1 (2), the metal-oxide-semiconductor in described surge load generating unit 1 (9) is by the 6th resistance (22 Europe
Nurse) short circuit；The D1 port output high level of described control/Acquisition Circuit 1 (2), electromagnetic relay (9) beginning action, described control
System/Acquisition Circuit 1 (2) starts the voltage data of the terminal E to surge load generating unit 1 (9) and carries out continuous acquisition；When described
When control/Acquisition Circuit 1 (2) detects the terminal B level of surge load generating unit 1 (9) by low uprising, port C1 keeps defeated
Going out high level 5ms (10ms), surge loop turns in the process :+28V → moving together contact group → the 5th resistance (5.6 ohm)
→ metal-oxide-semiconductor → described 5th resistance (0.1 ohm) → GND, loop current is equal to 28V/ (5.6 Ω+0.1 Ω) ≈ 5A；Then, end
Mouth C1 output low level, described metal-oxide-semiconductor disconnects, and described 6th resistance accesses loop, and load circuit turns on :+28V → moving together contact
Group → described 5th resistance (5.6 ohm) → described 6th resistance (22 ohm) → described 7th resistance (0.1 ohm) → GND,
Loop current is 28V/ (5.6 Ω+22 Ω+0.1 Ω) ≈ 1A, and described control/Acquisition Circuit 1 (2) stops surge load
The voltage data collection of the terminal E of unit 1 (9)；Electromagnetic relay testpieces 1 (9) completes a surge test, and described control/
The voltage data of the terminal E of the surge collected load generating unit 1 (9) is fed back to by Acquisition Circuit 1 (2) by OUT terminal mouth
The IN1 port of described processor；The surge number of times of electromagnetic relay 1 (9) is added 1 by described processor, and by CAN by electricity
The surge number of times of magnetic relay 1 (9) and the voltage data of terminal E feed back to test operation terminal, and test operation terminal is by terminal E
Voltage data be converted into the current waveform of electromagnetic relay 1 (9) moving together contact group, and surge test information is shown；
After the C1 port of described control/Acquisition Circuit 1 (2) continues output low level 10ms, carry out surge test next time；Until it is complete
Becoming 2000 (1000 times) surge number of times, control/Acquisition Circuit 1 (2) returns to off-test information, described place to described processor
Reason device stops enabling EN1, EN2, CS1, CS2 port, and the surge test of electromagnetic relay 1 (9) completes.The electromagnetism of the present embodiment continues
Electrical equipment has simple circuit, low cost with adjustable surge load testing apparatus, can carry out flexible expansion, test according to testing program
Process is without the feature such as manual operation, stable performance.
In sum, the above embodiment of the present invention the most also has the advantages that
1, the present invention can arrange surge test bar according to electromagnetic relay surge test requirement by test operation terminal
Part, thus automatically, the surge current time of one or more groups electromagnetic relay contact independently controlled and surge test number of times, can
Perform to organize testing program more simultaneously, save test period；2, host computer can be with the surge test letter of real-time reception processor feedback
Breath, it is simple to testing crew is inquired about；3, circuit structure of the present invention is succinct, low cost, expansible, process of the test is full-automatic, manually does
Pre-few, multiple electromagnetic relays can be carried out surge test simultaneously, reduce experimentation cost.
The present invention provides a kind of adjustable surge load testing apparatus for electromagnetic relay, it is achieved simultaneously to multiple electromagnetism
The independence of the surge current time of relay test part, surge interval time and surge number of times controls；It is automatically finished multiple electricity
The surge test of magnetic relay, and show the surge test persistent period of each electromagnetic relay, completed surge in real time
Number and contact current waveform；One electromagnetic relay individually can be carried out surge load test, it is also possible to multiple electromagnetism are continued
Electrical equipment carries out the surge load test of independent trials condition simultaneously, accurately tests the Surge handling capability of electromagnetic relay；It is right to support
The correlation test information of each electromagnetic relay is (such as: surge test persistent period, completed surge number of times and contact current ripple
Shape) in real time monitoring and inquiry, it is possible to according to the requirement of different tests scheme, plurality of electromagnetic relay contact carried out simultaneously wave
Gush load test, improve test efficiency.
One of ordinary skill in the art will appreciate that: accompanying drawing is the schematic diagram of an embodiment, module in accompanying drawing or
Flow process is not necessarily implemented necessary to the present invention.
One of ordinary skill in the art will appreciate that: the module in device in embodiment can describe according to embodiment divides
It is distributed in the device of embodiment, it is also possible to carry out respective change and be disposed other than in one or more devices of the present embodiment.On
The module stating embodiment can merge into a module, it is also possible to is further split into multiple submodule.
The above-mentioned embodiment of the present invention can be implemented in various hardware, Software Coding or both combinations.Such as, this
Bright embodiment is alternatively and performs said method in data signal processor (Digital Signal Processor, DSP)
Program code.The present invention can also refer to computer processor, digital signal processor, microprocessor or field-programmable gate array
The several functions that row (Field Programmable Gate Array, FPGA) perform.Above-mentioned process can be configured according to the present invention
Device performs particular task, and it defines machine-readable software code or the firmware generation of the ad hoc approach that the present invention discloses by execution
Code completes.Software code or firmware code can be developed into different program languages and different forms or form.It is alternatively
Different target platform composing software codes.But, the software code performing task according to the present invention configures generation with other types
The different code pattern of code, type and language are without departing from spirit and scope of the invention.
Above example only in order to technical scheme to be described, is not intended to limit；Although with reference to previous embodiment
The present invention is described in detail, it will be understood by those within the art that: it still can be to previous embodiment
Described technical scheme is modified, or wherein portion of techniques feature is carried out equivalent；And these are revised or replace
Change, do not make the essence of appropriate technical solution depart from the spirit and scope of embodiment of the present invention technical scheme.
Claims (10)
1. the adjustable surge load testing apparatus for electromagnetic relay, it is characterised in that this device includes: test operation
Multiple control/Acquisition Circuit (2) that terminal (1) is connected with described test operation terminal (1), and electric with described control/collection
Multiple surges that road (2) connects load generating unit (3), described surge load generating unit (3) and electromagnetic relay one a pair
Should connect, wherein,
Described test operation terminal (1) is for issuing experiment control order to described control/Acquisition Circuit (2), and passes through described
Control/Acquisition Circuit (2) and described surge load generating unit (3) receive the contact current sample information of electromagnetic relay；
Described control/Acquisition Circuit (2) is for regulating described surge load generating unit (3) according to described experiment control order
Resistance thus to electromagnetic relay export surge current；
Described surge load generating unit (3) is for exporting to electromagnetic relay under the control of described control/Acquisition Circuit (2)
The surge current of predefined size, and the described contact current sample information of electromagnetic relay of sampling is by described control/collection electricity
Road (2) feeds back to described test operation terminal (1).
2. the adjustable surge load testing apparatus for electromagnetic relay as claimed in claim 1, it is characterised in that described examination
Test operation terminal (1) to specifically include:
Host computer (11), is used for arranging surge experiment parameter and showing contact current waveform；And
Processor (12), is connected with described host computer (11), for generating experiment control order according to described surge experiment parameter.
3. the adjustable surge load testing apparatus for electromagnetic relay as claimed in claim 2, it is characterised in that on described
Position machine (11) is PC；Described processor (12) is STM32 single-chip microcomputer.
4. the adjustable surge load testing apparatus for electromagnetic relay as claimed in claim 2, it is characterised in that described control
System/Acquisition Circuit (2) specifically includes: plate selects circuit (21), main control unit (22), data acquisition circuit (23) and coil drive electricity
Road (24), wherein,
Described plate selects the enable signal input part of circuit (21) to connect with the circuit selection signal output pin of described processor (12)
Connect；
The data acquisition control I/O mouth of described main control unit (22) connects with the data output pins of described data acquisition circuit (23)
Connecing, the coil drive of described main control unit (22) controls the control input port of I/O mouth and described coil driver (24) even
Connect, the control of the CS port of described main control unit (22), IN port and OUT terminal mouth and described processor (12) and data acquisition I/
O mouth connects；
The power input of described main control unit (22), described data acquisition circuit (23) and described coil driver (24) is equal
Select circuit (21) to be connected with described plate.
5. the adjustable surge load testing apparatus for electromagnetic relay as claimed in claim 4, it is characterised in that described plate
Circuit (21) is selected to farther include:
First relay (211), has coil (2111) and normally opened contact (2112), and one end of described coil (2111) is with described
It is connected with positive source after the shorted on one end of normally opened contact (2112)；
Audion (212), its colelctor electrode is connected with the other end of described coil (2111), its grounded emitter；
First resistance (213), one end is connected with the base stage of described audion (212), the other end and the electricity of described processor (12)
Road selects signal output pin to connect；And
Second resistance (214), one end is connected with the emitter stage of described audion (212), the other end and described processor (12)
Circuit selection signal output pin connects.
6. the adjustable surge load testing apparatus for electromagnetic relay as claimed in claim 4, it is characterised in that described wave
Gush load generating unit (3) to specifically include:
3rd resistance (31), its first end is connected with the dynamic circuit connector stationary contact of electromagnetic relay；
4th resistance (32), its first end is connected with the second end of described 3rd resistance (31), the second end ground connection；
5th resistance (33), its first end is connected with the dynamic circuit connector stationary contact of electromagnetic relay；
Metal-oxide-semiconductor (34), its drain electrode is connected with the second end of described 5th resistance (33), base stage and described control/Acquisition Circuit (2)
CiPort connects, source electrode and the E of described control/Acquisition Circuit (2)iPort connects；
6th resistance (35), its first end is connected with the drain electrode of described metal-oxide-semiconductor (34), the second end and the source of described metal-oxide-semiconductor (34)
Pole connects；And
7th resistance (36), its first end is connected with the source electrode of described metal-oxide-semiconductor (34), the second end ground connection.
7. the adjustable surge load testing apparatus for electromagnetic relay as claimed in claim 6, it is characterised in that described the
The resistance of three resistance (31) is 7500 ohm；The resistance of described 4th resistance (32) is 1000 ohm；Described 5th resistance (33)
Resistance be 5.6 ohm；The resistance of described 6th resistance (35) is 22 ohm；The resistance of described 7th resistance (36) is 0.1 Europe
Nurse.
8. the adjustable surge load testing apparatus for electromagnetic relay as claimed in claim 6, it is characterised in that described master
Control unit (22) is fpga chip；Described coil driver (24) is transistor array, and the control of described transistor array is defeated
Entering end to be connected with the coil drive control I/O mouth of described main control unit (22), the output port of described transistor array passes through institute
State surge load generating unit (3) to be connected with electromagnetic relay coil (W).
9. the adjustable surge load testing apparatus for electromagnetic relay as claimed in claim 6, it is characterised in that described number
Farther include according to Acquisition Circuit (23): bleeder circuit (231), follow circuit (232) and A/D conversion chip (233), wherein,
The E port of described surge load generating unit (3) is connected to described A/D by described bleeder circuit, described follow circuit
The data acquisition control of the input pin of conversion chip, the output pin of described A/D conversion chip and described main control unit (22)
I/O mouth connects.
10. the adjustable surge load testing apparatus for electromagnetic relay as claimed in claim 6, it is characterised in that described
First end of the 4th resistance (32) is connected with described main control unit (22).
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| CN110794278B (en) * | 2019-10-23 | 2020-10-27 | 浙江大学 | SiC MOSFET surge performance test method |
| CN113552475A (en) * | 2020-04-24 | 2021-10-26 | 贵州振华群英电器有限公司（国营第八九一厂） | Current surge test device |
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