CN106130669B - A kind of microwave amplifier hot reflection function test device and method - Google Patents

A kind of microwave amplifier hot reflection function test device and method Download PDF

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CN106130669B
CN106130669B CN201610524492.3A CN201610524492A CN106130669B CN 106130669 B CN106130669 B CN 106130669B CN 201610524492 A CN201610524492 A CN 201610524492A CN 106130669 B CN106130669 B CN 106130669B
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receivers
amplifier
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mrow
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CN106130669A (en
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杨保国
年夫顺
王尊峰
李树彪
梁胜利
黎明敏
曹志英
李卓明
张庆龙
赵立军
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CLP Kesiyi Technology Co Ltd
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CETC 41 Institute
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/29—Performance testing

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  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Amplifiers (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The invention discloses a kind of microwave amplifier hot reflection function test device and method, belongs to testing field, including frequency reference module, the first signal source, secondary signal source, local vibration source, receiver, coupler, circulator and load.The reverse input source of the present invention is identical with forward direction input source frequency, and parameter testing more hot than frequency deviation method is more accurate；Do not need two source locking phases and carry out phase place control, complicated calibration is not needed, hardware condition requires low, quick to test the parameter such as microwave amplifier hot reflection function and amplifier gain, input matching, reverse isolation, cold reflection function, test process more convenient and quicker.

Description

A kind of microwave amplifier hot reflection function test device and method
Technical field
The invention belongs to testing field, and in particular to a kind of microwave amplifier hot reflection function test device and method.
Background technology
Microwave device part hot reflection function is also known as hot S22, it is defeated in the operating condition to weigh the microwave device parts such as amplifier Go out matching, be to come one of amplifier application and the difficult point of test and focus this year.
Conventional method has frequency deviation method and phase place method.Frequency deviation method requires that test frequency and amplifier output frequency have Certain frequency difference, and can not be too small, it is greater than 10 times of intermediate-frequency bandwidths, therefore its test has certain error, is not real； The problem of phase place method is to need the relative phase in two sources of Network Analyzer controllable, and the phase for rotating reverse input source is carried out Fitting solves, therefore high to hardware requirement standard, and test process complexity is cumbersome.
The content of the invention
For above-mentioned technical problem present in prior art, the present invention proposes a kind of microwave amplifier hot reflection letter Number test device and method, it is reasonable in design, the deficiencies in the prior art are overcome, reversely input source frequency zero deflection, will to hardware Ask low, test process is simpler.
To achieve these goals, the present invention adopts the following technical scheme that：
A kind of microwave amplifier hot reflection function test device, including frequency reference module, the first signal source, the second letter Number source, local vibration source, receiver, coupler, circulator and load；
The frequency reference module, it is configurable for providing reference for the first signal source, secondary signal source and local vibration source Frequency signal；
First signal source, is configurable for provide pumping signal by amplifier；
The secondary signal source, it is configurable for provide reverse energization signal by amplifier；
The local vibration source, it is configurable for providing local oscillation signal for receiver；
The receiver, including for test the first signal source output signal R1 receivers, for test by measuring The A receivers of the righting reflex signal of big device, the R2 receivers of the output signal for testing secondary signal source and for surveying Examination is by the output signal of amplifier and the B receivers of backscattered signal；
The receiver is mainly made up of frequency mixing module, A/D sampling modules and IF process module；
The frequency mixing module, local oscillation signal caused by the signal and local vibration source of receiver will be entered by, which being configurable for, is carried out Mixing output intermediate-freuqncy signal；
The A/D sampling modules, it is configurable for intermediate-freuqncy signal carrying out sample conversion into data signal；
The IF process module, it is configurable for handling data signal, calculates the amplitude and phase of reception signal；
The coupler, including the first coupler, the second coupler and the 3rd coupler；
First coupler, it is configurable for connecing from the pumping signal coupling unit signal feeding R1 of the first signal source Receipts machine, and it is sent into A receivers from by the righting reflex signal coupling unit signal of amplifier；
Second coupler, it is configurable for the reverse energization signal coupling unit signal feeding from secondary signal source R2 receivers；
3rd coupler, it is configurable for from by the output signal of amplifier and backscattered signal coupling Part signal is sent into B receivers；
The circulator, it is configurable for being loaded onto by the output signal of amplifier and backscattered signal negative Carry, and the reverse energization signal loading that secondary signal source is exported is to by the output end of amplifier；
The load, it is configurable for absorbing by the output signal and backscattered signal of amplifier；
Frequency reference module is the first signal source, secondary signal source and local vibration source provide reference frequency signal；
First signal source output drive signal, wherein sub-fraction pumping signal are coupled into R1 by the first coupler Receiver, most of pumping signal is passed through to be entered by amplifier by the input of amplifier, wherein caused righting reflex Signal passes through to be exported by the input of amplifier, and A receivers, caused output signal are coupled into by the first coupler By being coupled into B receptions by the 3rd coupler by the output end output of amplifier, wherein sub-fraction output signal Machine, most of output signal are loaded onto load by circulator and are supported absorption；
Secondary signal source exports reverse energization signal, and wherein sub-fraction reverse energization signal passes through the coupling of the second coupler Conjunction enters R2 receivers, and most of reverse energization signal enters by circulator, the 3rd coupler, by the output end of amplifier By amplifier, caused backscattered signal and output signal by the output end of amplifier by being exported, wherein a small portion Point backscattered signal and output signal are coupled into B receivers by the 3rd coupler, most of backscattered signal and Output signal is loaded onto load by circulator and is supported absorption；
Into the signal in R1 receivers, R2 receivers, A receivers and B receivers respectively with local vibration source caused by local oscillator Mixing output intermediate-freuqncy signal to A/D sampling module, A/D sampling module of the signal Jing Guo frequency mixing module is sampled intermediate-freuqncy signal Data signal is converted into export to IF process module；IF process module is handled data signal, and letter is received at calculating Number amplitude and phase.
In addition, the present invention is it is also mentioned that a kind of microwave amplifier hot reflection function method of testing, this method is using as above institute A kind of microwave amplifier hot reflection function test device stated, is carried out in accordance with the following steps：
Step 1：Calibrate R1 receivers, R2 receivers, A receivers and B receivers；
Step 2：Open the first signal source, close secondary signal source；The biography of amplifier is tested by the first signal source forcing Defeated characteristic, now remember that R1 receivers and B receiver readings are respectively R1' and B ', if being by the output response vector of amplifier X ', now B '=X '；
Step 3：Keep the first signal source to work, open secondary signal source, now remember that R1 receivers, R2 receivers and B connect The reading of receipts machine is respectively R1、R2And B, if now the output response vector of amplifier is X, then have：
X+HotS22*R2=B (1)；
Wherein, HotS22For hot reflection function, HotS22*R2For backscattered signal value；
Step 4：Line translation is entered to formula (1), obtained
I.e.
Because X/R1=X '/R '1, then hot reflection function HotS22For：
In addition, the present invention is also mentioned that the method for testing of a kind of microwave amplifier gain, input matching and cold reflection function, This method is comprised the following steps using a kind of microwave amplifier hot reflection function test device as described above：
Step 1：Calibrate R1 receivers, R2 receivers, A receivers and B receivers；
Step 2：Open the first signal source, close secondary signal source；The increasing of amplifier is tested by the first signal source forcing Benefit and input matching properties, the reading for now remembering R1 receivers, B receivers and A receivers is respectively R1', B ' and A', then be tested The gain of amplifier is
It is by the input matching of amplifier
Step 3：The first signal source is closed, opens secondary signal source；By secondary signal source forcing by the cold of amplifier State reflective function characteristic, now remember that R2 receivers and B receiver readings are respectively R2" and B ", by the cold reflection of amplifier Function is
Advantageous effects caused by the present invention：
The present invention proposes a kind of microwave amplifier hot reflection function test device and method, compared with prior art, The reverse input source (secondary signal source) of the present invention is identical with the frequency of positive input source (the first signal source), more hot than frequency deviation method Parameter testing is more accurate；Do not need the first signal source and secondary signal source Liang Ge sources locking phase and carry out phase place, therefore Hardware requirement is low, and test process is simpler.
Brief description of the drawings
Fig. 1 is a kind of hardware elementary diagram of microwave amplifier hot reflection function test device of the present invention.
Embodiment
Below in conjunction with the accompanying drawings and embodiment is described in further detail to the present invention：
Embodiment 1：
A kind of microwave amplifier hot reflection function test device, including frequency reference module, the first signal source, the second letter Number source, local vibration source, receiver, coupler, circulator and load；
The frequency reference module, it is configurable for providing reference for the first signal source, secondary signal source and local vibration source Frequency signal；
First signal source, is configurable for provide pumping signal by amplifier；
The secondary signal source, it is configurable for provide reverse energization signal by amplifier；
The local vibration source, it is configurable for providing local oscillation signal for receiver；
The receiver, including for test the first signal source output signal R1 receivers, for test by measuring The A receivers of the righting reflex signal of big device, the R2 receivers of the output signal for testing secondary signal source and for surveying Examination is by the output signal of amplifier and the B receivers of backscattered signal；
The receiver is mainly made up of frequency mixing module, A/D sampling modules and IF process module；
The frequency mixing module, local oscillation signal caused by the signal and local vibration source of receiver will be entered by, which being configurable for, is carried out Mixing output intermediate-freuqncy signal；
The A/D sampling modules, it is configurable for intermediate-freuqncy signal carrying out sample conversion into data signal；
The IF process module, it is configurable for handling data signal, calculates the amplitude and phase of reception signal；
The coupler, including the first coupler, the second coupler and the 3rd coupler；
First coupler, it is configurable for connecing from the pumping signal coupling unit signal feeding R1 of the first signal source Receipts machine, and it is sent into A receivers from by the righting reflex signal coupling unit signal of amplifier；
Second coupler, it is configurable for the reverse energization signal coupling unit signal feeding from secondary signal source R2 receivers；
3rd coupler, it is configurable for from by the output signal of amplifier and backscattered signal coupling Part signal is sent into B receivers；
The circulator, it is configurable for being loaded onto by the output signal of amplifier and backscattered signal negative Carry, and the reverse energization signal loading that secondary signal source is exported is to by the output end of amplifier；
The load, it is configurable for absorbing by the output signal and backscattered signal of amplifier；
Frequency reference module is the first signal source, secondary signal source and local vibration source provide reference frequency signal；
First signal source output drive signal, wherein sub-fraction pumping signal are coupled into R1 by the first coupler Receiver, most of pumping signal is passed through to be entered by amplifier by the input of amplifier, wherein caused righting reflex Signal passes through to be exported by the input of amplifier, and A receivers, caused output signal are coupled into by the first coupler By being coupled into B receptions by the 3rd coupler by the output end output of amplifier, wherein sub-fraction output signal Machine, most of output signal are loaded onto load by circulator and are supported absorption；
Secondary signal source exports reverse energization signal, and wherein sub-fraction reverse energization signal passes through the coupling of the second coupler Conjunction enters R2 receivers, and most of reverse energization signal enters by circulator, the 3rd coupler, by the output end of amplifier By amplifier, caused backscattered signal and output signal by the output end of amplifier by being exported, wherein a small portion Point backscattered signal and output signal are coupled into B receivers by the 3rd coupler, most of backscattered signal and Output signal is loaded onto load by circulator and is supported absorption；
Into the signal in R1 receivers, R2 receivers, A receivers and B receivers respectively with local vibration source caused by local oscillator Mixing output intermediate-freuqncy signal to A/D sampling module, A/D sampling module of the signal Jing Guo frequency mixing module is sampled intermediate-freuqncy signal Data signal is converted into export to IF process module；IF process module is handled data signal, and letter is received at calculating Number amplitude and phase.
Embodiment 2：
On the basis of above-described embodiment, the present invention is also mentioned that a kind of microwave amplifier hot reflection function method of testing, Quickly test for carrying out microwave device part hot reflection function, carry out in accordance with the following steps：
Step 1：Calibrate R1 receivers, R2 receivers, A receivers and B receivers；
Step 2：Open the first signal source, close secondary signal source；The biography of amplifier is tested by the first signal source forcing Defeated characteristic, now remember that R1 receivers and B receiver readings are respectively R1' and B ', if being by the output response vector of amplifier X ', now B '=X '；
Step 3：Keep the first signal source to work, open secondary signal source, now remember that R1 receivers, R2 receivers and B connect The reading of receipts machine is respectively R1、R2And B, if now the output response vector of amplifier is X, then have：
X+HotS22*R2=B (1)；
Wherein, HotS22For hot reflection function, HotS22*R2For backscattered signal value；
Step 4：Line translation is entered to formula (1), obtained
I.e.
Because X/R1=X '/R1', then hot reflection function HotS22For：
Embodiment 3：
On the basis of above-described embodiment, the present invention is it is also mentioned that a kind of microwave amplifier gain, input matching and cold conditions are anti- The method of testing of function is penetrated, for carrying out microwave amplifier gain, input matching and the quick test of cold reflection function, including Following steps：
Step 1：Calibrate R1 receivers, R2 receivers, A receivers and B receivers；
Step 2：Open the first signal source, close secondary signal source；The increasing of amplifier is tested by the first signal source forcing Benefit and input matching properties, the reading for now remembering R1 receivers, B receivers and A receivers is respectively R1', B ' and A', then be tested The gain of amplifier is
It is by the input matching of amplifier
Step 3：The first signal source is closed, opens secondary signal source；By secondary signal source forcing by the cold of amplifier State reflective function characteristic, now remember that R2 receivers and B receiver readings are respectively R2" and B ", by the cold reflection of amplifier Function is
The reverse input source (secondary signal source) of the present invention is identical with the frequency of positive input source (the first signal source), than frequency The hot parameter testing of inclined method is more accurate；Do not need the first signal source and secondary signal source Liang Ge sources locking phase and carry out phase rotation Turn, therefore hardware requirement is low, test process is simpler.
Certainly, described above is not limitation of the present invention, and the present invention is also not limited to the example above, this technology neck The variations, modifications, additions or substitutions that the technical staff in domain is made in the essential scope of the present invention, it should also belong to the present invention's Protection domain.

Claims (3)

  1. A kind of 1. microwave amplifier hot reflection function test device, it is characterised in that：Including frequency reference module, the first signal Source, secondary signal source, local vibration source, receiver, coupler, circulator and load；
    The frequency reference module, it is configurable for providing reference frequency for the first signal source, secondary signal source and local vibration source Signal；
    First signal source, is configurable for provide pumping signal by amplifier；
    The secondary signal source, it is configurable for provide reverse energization signal by amplifier；
    The local vibration source, it is configurable for providing local oscillation signal for receiver；
    The receiver, including for test the first signal source output signal R1 receivers, for test by amplifier The A receivers of righting reflex signal, R2 receivers of output signal for testing secondary signal source and for testing quilt The output signal of amplifier and the B receivers of backscattered signal；
    The receiver is mainly made up of frequency mixing module, A/D sampling modules and IF process module；
    The frequency mixing module, it is configurable for be mixed into local oscillation signal caused by the signal and local vibration source of receiver Export intermediate-freuqncy signal；
    The A/D sampling modules, it is configurable for intermediate-freuqncy signal carrying out sample conversion into data signal；
    The IF process module, it is configurable for handling data signal, calculates the amplitude and phase of reception signal；
    The coupler, including the first coupler, the second coupler and the 3rd coupler；
    First coupler, it is configurable for being sent into R1 receptions from the pumping signal coupling unit signal of the first signal source Machine, and it is sent into A receivers from by the righting reflex signal coupling unit signal of amplifier；
    Second coupler, it is configurable for connecing from the reverse energization signal coupling unit signal feeding R2 in secondary signal source Receipts machine；
    3rd coupler, it is configurable for from by the output signal of amplifier and backscattered signal coupling unit Signal is sent into B receivers；
    The circulator, it is configurable for that load will be loaded onto by the output signal of amplifier and backscattered signal, And the reverse energization signal loading for exporting secondary signal source is to by the output end of amplifier；
    The load, it is configurable for absorbing by the output signal and backscattered signal of amplifier；
    Frequency reference module is the first signal source, secondary signal source and local vibration source provide reference frequency signal；
    First signal source output drive signal, wherein sub-fraction pumping signal are coupled into R1 receptions by the first coupler Machine, most of pumping signal is passed through to be entered by amplifier by the input of amplifier, wherein caused righting reflex signal By being exported by the input of amplifier, A receivers are coupled into by the first coupler, caused output signal is passed through Exported by the output end of amplifier, wherein sub-fraction output signal is coupled into B receivers by the 3rd coupler, greatly Part output signal is loaded onto load by circulator and is supported absorption；
    Secondary signal source exports reverse energization signal, wherein sub-fraction reverse energization signal being coupled into by the second coupler Enter R2 receivers, most of reverse energization signal enters tested by circulator, the 3rd coupler, by the output end of amplifier Amplifier, caused backscattered signal and output signal are passed through to be exported by the output end of amplifier, and wherein sub-fraction is anti- To reflected signal and output signal B receivers, most of backscattered signal and output are coupled into by the 3rd coupler Signal is loaded onto load by circulator and is supported absorption；
    Into the signal in R1 receivers, R2 receivers, A receivers and B receivers respectively with local vibration source caused by local oscillation signal Intermediate-freuqncy signal is carried out sample conversion by mixing output intermediate-freuqncy signal to A/D sampling modules, the A/D sampling modules by frequency mixing module Exported into data signal to IF process module；IF process module is handled data signal, reception signal at calculating Amplitude and phase.
  2. A kind of 2. microwave amplifier hot reflection function method of testing, it is characterised in that：Using one kind as claimed in claim 1 Microwave amplifier hot reflection function test device, is carried out in accordance with the following steps：
    Step 1：Calibrate R1 receivers, R2 receivers, A receivers and B receivers；
    Step 2：Open the first signal source, close secondary signal source；The transmission that amplifier is tested by the first signal source forcing is special Property, now remember that R1 receivers and B receiver readings are respectively R1' and B ', if being X ' by the output response vector of amplifier, this When B '=X '；
    Step 3：Keep the first signal source to work, open secondary signal source, now remember R1 receivers, R2 receivers and B receivers Reading be respectively R1、R2And B, if now the output response vector of amplifier is X, then have：
    X+HotS22*R2=B (1)；
    Wherein, HotS22For hot reflection function, HotS22*R2For backscattered signal value；
    Step 4：Line translation is entered to formula (1), obtained
    I.e.
    Because X/R1=X '/R1', then hot reflection function HotS22For：
    <mrow> <msub> <mi>HotS</mi> <mn>22</mn> </msub> <mo>=</mo> <mfrac> <msub> <mi>R</mi> <mn>1</mn> </msub> <msub> <mi>R</mi> <mn>2</mn> </msub> </mfrac> <mrow> <mo>(</mo> <mfrac> <mi>B</mi> <msub> <mi>R</mi> <mn>1</mn> </msub> </mfrac> <mo>-</mo> <mfrac> <msup> <mi>X</mi> <mo>&amp;prime;</mo> </msup> <mrow> <msup> <msub> <mi>R</mi> <mn>1</mn> </msub> <mo>&amp;prime;</mo> </msup> </mrow> </mfrac> <mo>)</mo> </mrow> <mo>.</mo> </mrow>
  3. A kind of 3. method of testing of microwave amplifier gain, input matching and cold reflection function, it is characterised in that：Using such as power Profit requires a kind of microwave amplifier hot reflection function test device described in 1, comprises the following steps：
    Step 1：Calibrate R1 receivers, R2 receivers, A receivers and B receivers；
    Step 2：Open the first signal source, close secondary signal source；By the first signal source forcing be tested amplifier gain and Matching properties are inputted, the reading for now remembering R1 receivers, B receivers and A receivers is respectively R1', B ' and A', then be tested amplification The gain of device is
    <mrow> <mi>G</mi> <mo>=</mo> <mfrac> <msup> <mi>B</mi> <mo>&amp;prime;</mo> </msup> <mrow> <msup> <msub> <mi>R</mi> <mn>1</mn> </msub> <mo>&amp;prime;</mo> </msup> </mrow> </mfrac> <mo>;</mo> </mrow>
    It is by the input matching of amplifier
    <mrow> <msub> <mi>S</mi> <mn>11</mn> </msub> <mo>=</mo> <mfrac> <msup> <mi>A</mi> <mo>&amp;prime;</mo> </msup> <mrow> <msup> <msub> <mi>R</mi> <mn>1</mn> </msub> <mo>&amp;prime;</mo> </msup> </mrow> </mfrac> <mo>;</mo> </mrow>
    Step 3：The first signal source is closed, opens secondary signal source；It is anti-by the cold conditions of amplifier by secondary signal source forcing Function characteristic is penetrated, now remembers that R2 receivers and B receiver readings are respectively R2" and B ", by the cold reflection function of amplifier For
    <mrow> <msub> <mi>S</mi> <mn>22</mn> </msub> <mo>=</mo> <mfrac> <msup> <mi>B</mi> <mrow> <mo>&amp;prime;</mo> <mo>&amp;prime;</mo> </mrow> </msup> <mrow> <msup> <msub> <mi>R</mi> <mn>2</mn> </msub> <mrow> <mo>&amp;prime;</mo> <mo>&amp;prime;</mo> </mrow> </msup> </mrow> </mfrac> <mo>.</mo> </mrow>
CN201610524492.3A 2016-07-05 2016-07-05 A kind of microwave amplifier hot reflection function test device and method Active CN106130669B (en)

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CN102156139B (en) * 2011-04-08 2012-08-22 浙江大学 Method and system for measuring passive intermodulation generation point of microwave device by using electromagnetic wave phase
US9506953B2 (en) * 2012-01-18 2016-11-29 Ut-Battelle, Llc High speed high dynamic range high accuracy measurement system
CN103675448B (en) * 2013-12-16 2017-04-19 中国电子科技集团公司第四十一研究所 Vector measurement method for passive intermodulation interference
CN104506258B (en) * 2014-11-04 2017-07-11 中国电子科技集团公司第四十一研究所 A kind of passive cross modulation test method of pulse regime
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