CN107300682A - A kind of lattice gauge source power calibration method for introducing matching amendment - Google Patents

A kind of lattice gauge source power calibration method for introducing matching amendment Download PDF

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Publication number
CN107300682A
CN107300682A CN201710477874.XA CN201710477874A CN107300682A CN 107300682 A CN107300682 A CN 107300682A CN 201710477874 A CN201710477874 A CN 201710477874A CN 107300682 A CN107300682 A CN 107300682A
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mrow
msub
source
port
power
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庄志远
杨保国
李树彪
郭永瑞
袁国平
杨明飞
蔡洪坤
安洋
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CETC 41 Institute
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

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  • General Physics & Mathematics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

The present invention proposes a kind of lattice gauge source power calibration method for introducing matching amendment, comprises the following steps:The first step:Reset vector Network Analyzer;Second step:Carry out single port calibration and obtain directional error coefficient, source matching error coefficient, skin tracking error coefficient;3rd step:Port i is connected into power meter;4th step:Record the setting value and power meter reading of source power;5th step:Calculate the source calibration factor;6th step:Measured piece is connected, the true reflectance factor of measured piece is obtained;7th step:Utilize the source power of measured piece reflectance factor corrective networks instrument;8th step:Complete amendment.The mismatch error between source and power probe is eliminated present invention introduces the lattice gauge source power calibration method of matching amendment, the port mismatch error in measured piece test process is eliminated, improves the precision of calibration, improve the test accuracy to power sensitive device.

Description

A kind of lattice gauge source power calibration method for introducing matching amendment
Technical field
The present invention relates to technical field of measurement and test, more particularly to a kind of lattice gauge source power calibration side for introducing matching amendment Method.
Background technology
During due to device detection it is more and more the need for consider nonlinear characteristic, itself characteristic is also under certain power Realize, so using lattice gauge to this kind of device detection when, it is necessary to accurately control source power output.
As shown in figure 1, vector network analyzer (abbreviation lattice gauge) carries out S parameter test, it is internal comprising radiofrequency signal Source (RF Source1 and RF Source2), reference receiver (a1, a2), measuring receiver (b1, b2), reference channel coupler The parts such as (Ref Channel Couplers), TCH test channel coupler (Test Channel Couplers).Carrying out power , it is necessary to be calibrated to radiofrequency signal source power during measurement.
Prior art is as follows:
It is typically that power meter is first connected to instrument port when carrying out source power calibration to vector network analyzer On (port1, port2), the deviation (SCF) of record lattice gauge signal source set value of the power and the power meter number of degrees, then to deviation The amendment of signal source power is carried out, correction model is as shown in Figure 2.
Existing scheme regards the signal source and receiver of vector network analyzer as linear, have ignored measuring receiver The matching at end, causes calibration error, because any mismatch between source and power probe can all produce error, moreover, even Connect measured piece to carry out in test process, due to measured piece and the mismatch of lattice gauge port, the input power ratio of measured piece can be made Desired value is small.
The content of the invention
To solve above-mentioned deficiency of the prior art, the present invention proposes a kind of lattice gauge source power for introducing matching amendment Calibration method.
The technical proposal of the invention is realized in this way:
A kind of lattice gauge source power calibration method for introducing matching amendment, comprises the following steps:
The first step:Reset vector Network Analyzer;
Second step:Carry out single port calibration and obtain directional error coefficient, source matching error coefficient, skin tracking error system Number;
3rd step:Port i is connected into power meter;
4th step:Record the setting value a of source powervsWith power meter reading Pmeas
5th step:Calculate source calibration factor S CF;
6th step:Measured piece is connected, the true reflectance factor of measured piece is obtained;
7th step:Utilize the source power of measured piece reflectance factor corrective networks instrument;
8th step:Complete amendment.
Alternatively, in the second step, directional error coefficient, source matching error coefficient, skin tracking error coefficient Acquisition process is, it is necessary to decomposite reference receiver error and forward power transmission error, and single port error is introduced, and error is closed System is as follows:
Edp=EdEpr
Wherein, EdpTo decompose rear port i directional error;ErpTo decompose rear port i skin tracking error;EdFor end Mouth i directional error;ErFor port i skin tracking error;EsFor port i source matching error;EprFor port i source power Error of the test set to reference receiver;EpsFor the error of port i source power test set to measured piece input.
Alternatively, in the 5th step, source calibration factor S CF acquisition process, when access power timing:
Wherein, aiaFor the signal of port i input power meter;avsThe setting value set for lattice gauge source power;EpsFor end Error of the mouth i source power test set to measured piece input;Δ Src is the difference of source setting value and test set incidence value;EsFor Lattice gauge port i source matching error;ΓpsFor the reflectance factor of power meter;
After signal ingoing power meter, the amendment of the power meter number of degrees is carried out by equation below (3):
Wherein, PmeasFor power meter reading;PabsTo flow into the power inside power meter;Δ PM is the power meter calibration factor;
From formula (3), power meter reading is also by amendment, PmeasWith aiaIt is equal;
The source calibration factor is SCF, there is following calculation formula:
Alternatively, the 6th step, after connection measured piece, first by single port amendment, obtains the true of measured piece Reflectance factor:
Wherein, Sii_corIt is measured piece in port i reflectance factor correction value, SiimIt is lattice gauge to measured piece reflectance factor Measured value.
Alternatively, followed by the 7th step, a is correctedvs, to eliminate the mismatch of measured piece and lattice gauge port, make input Signal to measured piece is equal to setting value, and correction formula is as follows:
Wherein, avs_corFor the correction result of source power setting value.
The beneficial effects of the invention are as follows:
(1) mismatch that the lattice gauge source power calibration method of introducing matching amendment is eliminated between source and power probe is missed Difference, eliminates the port mismatch error in measured piece test process;
(2) lattice gauge internal signal sources link model is refined, the single port error model of lattice gauge is added, work( The matching of rate meter and measured piece is taken into account, and improves the precision of calibration, improves the test accuracy to power sensitive device.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing There is the accompanying drawing used required in technology description to be briefly described, it should be apparent that, drawings in the following description are only this Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can be with Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is dual-port vector network analyzer theory diagram;
Fig. 2 is existing power calibration signal flow graph;
The flow chart for the lattice gauge source power calibration method that Fig. 3 corrects for the introducing matching of the present invention;
Fig. 4 is complete source power calibration signal flow graph of the invention;
Fig. 5 is the signal flow diagram for accessing measured piece of the invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete Site preparation is described, it is clear that described embodiment is only a part of embodiment of the invention, rather than whole embodiments.It is based on Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under the premise of creative work is not made Embodiment, belongs to the scope of protection of the invention.
It is contemplated that vector network analyzer carry out source power calibration when, no longer error model is regarded as it is linear, and It is to consider instrument internal and the matching problem of measured piece, lattice gauge internal signal sources link model is refined, adds network The single port error model of instrument, takes into account the matching of power meter and measured piece, improves the precision of calibration, improves quick to power The test accuracy of inductor component.
As shown in figure 3, the lattice gauge source power calibration method of the introducing matching amendment of the present invention comprises the following steps:
The first step:Reset vector Network Analyzer;
Second step:Carry out single port calibration and obtain directional error coefficient, source matching error coefficient, skin tracking error system Number;
3rd step:Port i be connected into power meter (port i be lattice gauge in need calibration any one port);
4th step:Record the setting value a of source powervsWith power meter reading Pmeas
5th step:Calculate source calibration factor S CF;
6th step:Measured piece is connected, the true reflectance factor of measured piece is obtained;
7th step:Utilize the source power of measured piece reflectance factor corrective networks instrument;
8th step:Complete amendment.
In above-mentioned second step, 3 error coefficients (directional error coefficient, source matching error coefficient, skin tracking error systems Number) acquisition process, it is necessary to first the error model flow chart of lattice gauge is refined, decomposite reference receiver error and just Introduced to power transmission error, and by single port error model.
Signal flow diagram after improving is as shown in figure 4, the calibration method of the present invention introduces single port error, so error is closed System is as follows:
Edp=EdEpr
Wherein, EdpTo decompose rear port i directional error;ErpTo decompose rear port i skin tracking error;EdFor end Mouth i directional error;ErFor port i skin tracking error;EsFor port i source matching error;EprFor port i source power Error of the test set to reference receiver;EpsFor the error of port i source power test set to measured piece input.
In above-mentioned 5th step, source calibration factor S CF acquisition process, as shown in figure 4, when access power timing:
Wherein, aiaFor the signal of port i input power meter;avsThe setting value set for lattice gauge source power;EpsFor end Error of the mouth i source power test set to measured piece input;Δ Src is the difference of source setting value and test set incidence value;EsFor Lattice gauge port i source matching error;ΓpsFor the reflectance factor of power meter.
After signal ingoing power meter, the amendment of the power meter number of degrees is carried out by equation below (3):
Wherein, PmeasFor power meter reading;PabsTo flow into the power inside power meter;Δ PM is the power meter calibration factor.
From formula (3), power meter reading is also by amendment, it is believed that PmeasWith aiaIt is equal.Remember source calibration The factor is SCF, there is following calculation formula:
Above-mentioned 6th step, access measured piece signal flow diagram as shown in figure 5, connection measured piece after, first by single-ended Mouth amendment, obtains the true reflectance factor of measured piece:
Wherein, Sii_corIt is measured piece in port i reflectance factor correction value, the S in as Fig. 5ii;SiimFor lattice gauge pair The measured value of measured piece reflectance factor.
Followed by the 7th step, a is then correctedvs, to eliminate the mismatch of measured piece and lattice gauge port, make to be input to by The signal for surveying part is equal to setting value, and correction formula is as follows:
Wherein, avs_corFor the correction result of source power setting value.
The mismatch between source and power probe is eliminated present invention introduces the lattice gauge source power calibration method of matching amendment Error, eliminates the port mismatch error in measured piece test process, and lattice gauge internal signal sources link model is refined, The single port error model of lattice gauge is added, the matching of power meter and measured piece is taken into account, the precision of calibration is improved, improved To the test accuracy of power sensitive device.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all essences in the present invention God is with principle, and any modification, equivalent substitution and improvements made etc. should be included in the scope of the protection.

Claims (5)

1. a kind of lattice gauge source power calibration method for introducing matching amendment, it is characterised in that comprise the following steps:
The first step:Reset vector Network Analyzer;
Second step:Carry out single port calibration and obtain directional error coefficient, source matching error coefficient, skin tracking error coefficient;
3rd step:Port i is connected into power meter;
4th step:Record the setting value a of source powervsWith power meter reading Pmeas
5th step:Calculate source calibration factor S CF;
6th step:Measured piece is connected, the true reflectance factor of measured piece is obtained;
7th step:Utilize the source power of measured piece reflectance factor corrective networks instrument;
8th step:Complete amendment.
2. a kind of lattice gauge source power calibration method for introducing matching amendment as claimed in claim 1, it is characterised in that
In the second step, directional error coefficient, source matching error coefficient, the acquisition process of skin tracking error coefficient are needed Reference receiver error and forward power transmission error are decomposited, and single port error is introduced, error relationship is as follows:
Edp=EdEpr
<mrow> <msub> <mi>E</mi> <mrow> <mi>r</mi> <mi>p</mi> </mrow> </msub> <mo>=</mo> <mfrac> <mrow> <msub> <mi>E</mi> <mi>r</mi> </msub> <msub> <mi>E</mi> <mrow> <mi>p</mi> <mi>r</mi> </mrow> </msub> </mrow> <msub> <mi>E</mi> <mrow> <mi>p</mi> <mi>s</mi> </mrow> </msub> </mfrac> <mo>-</mo> <mo>-</mo> <mo>-</mo> <mrow> <mo>(</mo> <mn>1</mn> <mo>)</mo> </mrow> </mrow>
Wherein, EdpTo decompose rear port i directional error;ErpTo decompose rear port i skin tracking error;EdFor port i Directional error;ErFor port i skin tracking error;EsFor port i source matching error;EprSurveyed for port i source power Error of the examination collection to reference receiver;EpsFor the error of port i source power test set to measured piece input.
3. a kind of lattice gauge source power calibration method for introducing matching amendment as claimed in claim 1, it is characterised in that
In 5th step, source calibration factor S CF acquisition process, when access power timing:
<mrow> <mfrac> <msub> <mi>a</mi> <mrow> <mi>i</mi> <mi>a</mi> </mrow> </msub> <msub> <mi>a</mi> <mrow> <mi>v</mi> <mi>s</mi> </mrow> </msub> </mfrac> <mo>=</mo> <mfrac> <mrow> <msub> <mi>E</mi> <mrow> <mi>p</mi> <mi>s</mi> </mrow> </msub> <mi>&amp;Delta;</mi> <mi>S</mi> <mi>r</mi> <mi>c</mi> </mrow> <mrow> <mn>1</mn> <mo>-</mo> <msub> <mi>E</mi> <mi>s</mi> </msub> <mo>&amp;CenterDot;</mo> <msub> <mi>&amp;Gamma;</mi> <mrow> <mi>p</mi> <mi>s</mi> </mrow> </msub> </mrow> </mfrac> <mo>-</mo> <mo>-</mo> <mo>-</mo> <mrow> <mo>(</mo> <mn>2</mn> <mo>)</mo> </mrow> </mrow>
Wherein, aiaFor the signal of port i input power meter;avsThe setting value set for lattice gauge source power;EpsFor port i Error of the source power test set to measured piece input;Δ Src is the difference of source setting value and test set incidence value;EsFor network Instrument port i source matching error;ΓpsFor the reflectance factor of power meter;
After signal ingoing power meter, the amendment of the power meter number of degrees is carried out by equation below (3):
<mrow> <msub> <mi>P</mi> <mrow> <mi>m</mi> <mi>e</mi> <mi>a</mi> <mi>s</mi> </mrow> </msub> <mo>=</mo> <mfrac> <mrow> <msub> <mi>P</mi> <mrow> <mi>a</mi> <mi>b</mi> <mi>s</mi> </mrow> </msub> <mi>&amp;Delta;</mi> <mi>P</mi> <mi>M</mi> </mrow> <mrow> <mn>1</mn> <mo>-</mo> <mo>|</mo> <msub> <mi>&amp;Gamma;</mi> <mrow> <mi>p</mi> <mi>s</mi> </mrow> </msub> <msup> <mo>|</mo> <mn>2</mn> </msup> </mrow> </mfrac> <mo>-</mo> <mo>-</mo> <mo>-</mo> <mrow> <mo>(</mo> <mn>3</mn> <mo>)</mo> </mrow> </mrow>
Wherein, PmeasFor power meter reading;PabsTo flow into the power inside power meter;Δ PM is the power meter calibration factor;
From formula (3), power meter reading is also by amendment, PmeasWith aiaIt is equal;
The source calibration factor is SCF, there is following calculation formula:
<mrow> <mi>S</mi> <mi>C</mi> <mi>F</mi> <mo>=</mo> <msub> <mi>E</mi> <mrow> <mi>p</mi> <mi>s</mi> </mrow> </msub> <mi>&amp;Delta;</mi> <mi>S</mi> <mi>r</mi> <mi>c</mi> <mo>=</mo> <mfrac> <mrow> <msub> <mi>P</mi> <mrow> <mi>m</mi> <mi>e</mi> <mi>a</mi> <mi>s</mi> </mrow> </msub> <mo>&amp;CenterDot;</mo> <mrow> <mo>(</mo> <mn>1</mn> <mo>-</mo> <msub> <mi>E</mi> <mi>s</mi> </msub> <mo>&amp;CenterDot;</mo> <msub> <mi>&amp;Gamma;</mi> <mrow> <mi>p</mi> <mi>s</mi> </mrow> </msub> <mo>)</mo> </mrow> </mrow> <msub> <mi>a</mi> <mrow> <mi>v</mi> <mi>s</mi> </mrow> </msub> </mfrac> <mo>-</mo> <mo>-</mo> <mo>-</mo> <mrow> <mo>(</mo> <mn>4</mn> <mo>)</mo> </mrow> <mo>.</mo> </mrow>
4. a kind of lattice gauge source power calibration method for introducing matching amendment as claimed in claim 1, it is characterised in that
6th step, after connection measured piece, first by single port amendment, obtains the true reflectance factor of measured piece:
<mrow> <msub> <mi>S</mi> <mrow> <mi>i</mi> <mi>i</mi> <mo>_</mo> <mi>c</mi> <mi>o</mi> <mi>r</mi> </mrow> </msub> <mo>=</mo> <mfrac> <mrow> <msub> <mi>S</mi> <mrow> <mi>i</mi> <mi>i</mi> <mi>m</mi> </mrow> </msub> <mo>-</mo> <msub> <mi>E</mi> <mi>d</mi> </msub> </mrow> <mrow> <msub> <mi>E</mi> <mi>r</mi> </msub> <mo>+</mo> <msub> <mi>E</mi> <mi>s</mi> </msub> <mo>&amp;CenterDot;</mo> <mrow> <mo>(</mo> <msub> <mi>S</mi> <mrow> <mi>i</mi> <mi>i</mi> <mi>m</mi> </mrow> </msub> <mo>-</mo> <msub> <mi>E</mi> <mi>d</mi> </msub> <mo>)</mo> </mrow> </mrow> </mfrac> <mo>-</mo> <mo>-</mo> <mo>-</mo> <mrow> <mo>(</mo> <mn>5</mn> <mo>)</mo> </mrow> </mrow>
Wherein, Sii_corIt is measured piece in port i reflectance factor correction value, SiimSurvey for lattice gauge to measured piece reflectance factor Value.
5. a kind of lattice gauge source power calibration method for introducing matching amendment as claimed in claim 4, it is characterised in that connect down Come, carry out the 7th step:
Correct avs, to eliminate the mismatch of measured piece and lattice gauge port, the signal for being input to measured piece is equal to setting value, amendment Formula is as follows:
<mrow> <msub> <mi>a</mi> <mrow> <mi>v</mi> <mi>s</mi> <mo>_</mo> <mi>c</mi> <mi>o</mi> <mi>r</mi> </mrow> </msub> <mo>=</mo> <mfrac> <mrow> <msub> <mi>a</mi> <mrow> <mi>v</mi> <mi>s</mi> </mrow> </msub> <mrow> <mo>(</mo> <mrow> <mn>1</mn> <mo>-</mo> <msub> <mi>E</mi> <mi>s</mi> </msub> <msub> <mi>S</mi> <mrow> <mi>u</mi> <mo>_</mo> <mi>c</mi> <mi>o</mi> <mi>r</mi> </mrow> </msub> </mrow> <mo>)</mo> </mrow> </mrow> <mrow> <mi>S</mi> <mi>C</mi> <mi>F</mi> </mrow> </mfrac> <mo>-</mo> <mo>-</mo> <mo>-</mo> <mrow> <mo>(</mo> <mn>6</mn> <mo>)</mo> </mrow> </mrow>
Wherein, avs_corFor the correction result of source power setting value.
CN201710477874.XA 2017-06-09 2017-06-09 A kind of lattice gauge source power calibration method for introducing matching amendment Pending CN107300682A (en)

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CN110568283A (en) * 2019-08-12 2019-12-13 中电科仪器仪表有限公司 Active device intermodulation test device and test method
CN113376452A (en) * 2021-05-26 2021-09-10 中电科思仪科技股份有限公司 Noise source calibration system and calibration method based on vector network analyzer
CN113376452B (en) * 2021-05-26 2022-08-09 中电科思仪科技股份有限公司 Noise source calibration system and calibration method based on vector network analyzer
CN114487970A (en) * 2022-03-31 2022-05-13 南京派格测控科技有限公司 Multi-port automatic calibration method and system suitable for radio frequency test machine
CN114487970B (en) * 2022-03-31 2022-06-24 南京派格测控科技有限公司 Multi-port automatic calibration method and system suitable for radio frequency test machine
CN115356541A (en) * 2022-07-04 2022-11-18 广东健博通科技股份有限公司 Multi-port antenna scattering parameter measuring method
CN115356541B (en) * 2022-07-04 2023-09-05 广东健博通科技股份有限公司 Multi-port antenna scattering parameter measurement method

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Application publication date: 20171027