CN106102873B - 用于电离样品的质谱分析探针和系统 - Google Patents

用于电离样品的质谱分析探针和系统 Download PDF

Info

Publication number
CN106102873B
CN106102873B CN201480076440.3A CN201480076440A CN106102873B CN 106102873 B CN106102873 B CN 106102873B CN 201480076440 A CN201480076440 A CN 201480076440A CN 106102873 B CN106102873 B CN 106102873B
Authority
CN
China
Prior art keywords
probe
substrate
paper
voltage
mass spectrometry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201480076440.3A
Other languages
English (en)
Chinese (zh)
Other versions
CN106102873A (zh
Inventor
罗伯特·格雷厄姆·库克斯
D·萨卡尔
塔拉皮·普拉迪普
R·玛拉亚南
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Indian Institute of Technology Madras
Purdue Research Foundation
Original Assignee
Indian Institute of Technology Madras
Purdue Research Foundation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Indian Institute of Technology Madras, Purdue Research Foundation filed Critical Indian Institute of Technology Madras
Priority to CN201910835375.2A priority Critical patent/CN110648894B/zh
Publication of CN106102873A publication Critical patent/CN106102873A/zh
Application granted granted Critical
Publication of CN106102873B publication Critical patent/CN106102873B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/18—Printed circuits structurally associated with non-printed electric components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0013—Miniaturised spectrometers, e.g. having smaller than usual scale, integrated conventional components

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201480076440.3A 2013-12-30 2014-12-22 用于电离样品的质谱分析探针和系统 Active CN106102873B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910835375.2A CN110648894B (zh) 2013-12-30 2014-12-22 用于电离样品的质谱分析探针和系统

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
IN6137/CHE/2013 2013-12-30
IN6137CH2013 2013-12-30
US201461926713P 2014-01-13 2014-01-13
US61/926,713 2014-01-13
PCT/US2014/071856 WO2015100221A2 (en) 2013-12-28 2014-12-22 Mass spectrometry probes and systems for ionizing a sample

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN201910835375.2A Division CN110648894B (zh) 2013-12-30 2014-12-22 用于电离样品的质谱分析探针和系统

Publications (2)

Publication Number Publication Date
CN106102873A CN106102873A (zh) 2016-11-09
CN106102873B true CN106102873B (zh) 2019-09-24

Family

ID=53479776

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201480076440.3A Active CN106102873B (zh) 2013-12-30 2014-12-22 用于电离样品的质谱分析探针和系统
CN201910835375.2A Active CN110648894B (zh) 2013-12-30 2014-12-22 用于电离样品的质谱分析探针和系统

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201910835375.2A Active CN110648894B (zh) 2013-12-30 2014-12-22 用于电离样品的质谱分析探针和系统

Country Status (5)

Country Link
US (3) US10395913B2 (https=)
EP (2) EP3089811B1 (https=)
JP (2) JP6577950B2 (https=)
CN (2) CN106102873B (https=)
WO (1) WO2015100221A2 (https=)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8207497B2 (en) 2009-05-08 2012-06-26 Ionsense, Inc. Sampling of confined spaces
US8822949B2 (en) 2011-02-05 2014-09-02 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems
WO2013184320A1 (en) * 2012-06-06 2013-12-12 Purdue Research Foundation Ion focusing
EP3014647B1 (en) * 2013-06-25 2018-12-19 Purdue Research Foundation Mass spectrometry analysis of microorganisms in samples
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US10656157B2 (en) 2014-09-24 2020-05-19 Purdue Research Foundation Rare event detection using mass tags
JP6631132B2 (ja) * 2015-09-30 2020-01-15 東ソー株式会社 イオン化合物のイオン変換方法及びイオン変換装置
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
CN113834869B (zh) 2016-09-02 2024-12-06 得克萨斯大学体系董事会 收集探针及其使用方法
US10056218B1 (en) 2017-02-17 2018-08-21 Savannah River Nuclear Solutions, Llc Graphene/graphite-based filament for thermal ionization
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
EP3717901A4 (en) 2017-11-27 2021-08-25 Board Of Regents, The University Of Texas System MINIMALLY INVASIVE DETECTION PROBE AND METHOD OF USING IT
US10825673B2 (en) 2018-06-01 2020-11-03 Ionsense Inc. Apparatus and method for reducing matrix effects
US11264228B2 (en) 2018-10-09 2022-03-01 Savannah River Nuclear Solutions, Llc Method of making a carbon filament for thermal ionization
CN109187713B (zh) * 2018-10-17 2020-12-22 湖南师范大学 负载纸基、其制备方法和离子源及其应用
EP3914891B1 (en) 2019-01-25 2026-04-01 Board of Regents, The University of Texas System Apparatus for cleaning and/or exchanging medical devices
WO2021086778A1 (en) 2019-10-28 2021-05-06 Ionsense Inc. Pulsatile flow atmospheric real time ionization
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization
US12390811B1 (en) * 2020-06-17 2025-08-19 The United States Of America, As Represented By The Secretary Of The Navy Sampling platform apparatus
US11635353B2 (en) * 2020-06-17 2023-04-25 The United States Of America, As Represented By The Secretary Of The Navy Sample collection device
US12409451B1 (en) * 2020-06-17 2025-09-09 The United States Of America, As Represented By The Secretary Of The Navy Sampling platform system
US11688596B2 (en) 2021-02-12 2023-06-27 Lawrence Livermore National Security, Llc Systems and methods lattice spray substrates for mass spectrometry
CN113109416B (zh) * 2021-04-20 2022-06-14 清华大学 一种激素的快速高通量质谱检测装置及方法

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4663230A (en) 1984-12-06 1987-05-05 Hyperion Catalysis International, Inc. Carbon fibrils, method for producing same and compositions containing same
US6452167B1 (en) * 1998-05-20 2002-09-17 Sandia National Laboratories Miniature quadrupole mass spectrometer having a cold cathode ionization source
CA2301451A1 (en) * 2000-03-20 2001-09-21 Thang T. Pham Method for analysis of analytes by mass spectrometry
US7368708B2 (en) * 2000-05-25 2008-05-06 Agilent Technologies, Inc. Apparatus for producing ions from an electrospray assembly
US6803568B2 (en) 2001-09-19 2004-10-12 Predicant Biosciences, Inc. Multi-channel microfluidic chip for electrospray ionization
US6958475B1 (en) * 2003-01-09 2005-10-25 Colby Steven M Electron source
US7579077B2 (en) 2003-05-05 2009-08-25 Nanosys, Inc. Nanofiber surfaces for use in enhanced surface area applications
US6891156B2 (en) 2003-04-30 2005-05-10 Perkin Elmer Instruments Llc Sample plate for matrix-assisted laser desorption and ionization mass spectrometry
US6885010B1 (en) * 2003-11-12 2005-04-26 Thermo Electron Corporation Carbon nanotube electron ionization sources
JP4370510B2 (ja) * 2003-12-25 2009-11-25 努 升島 質量分析用エレクトロスプレーイオン化ノズル
JP2007535106A (ja) * 2004-04-27 2007-11-29 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 試料分析へのカーボンナノチューブの利用
EP1913800A4 (en) * 2005-07-27 2016-09-21 Wisconsin Alumni Res Found NANOELECTROMECHANICAL AND MICROELECTROMECHANICAL SENSORS AND ANALYZERS
WO2007120373A2 (en) * 2006-01-26 2007-10-25 Sionex Corporation Differential mobility spectrometer analyzer and pre-filter apparatus, methods and systems
US7884359B2 (en) * 2006-06-09 2011-02-08 The United States Of America As Represented By The Secretary Of The Navy Integrally gated carbon nanotube ionizer device
WO2008103733A2 (en) * 2007-02-20 2008-08-28 Applied Nanotech, Inc. Gas ionizer
WO2009023361A2 (en) 2007-06-01 2009-02-19 Purdue Research Foundation Discontinuous atmospheric pressure interface
WO2009042079A2 (en) * 2007-09-21 2009-04-02 Sionex Corporation Non-radioactive ion sources with ion flow control
EP2425448B1 (en) * 2009-04-30 2019-12-04 Purdue Research Foundation Ion generation using wetted porous material
KR101094453B1 (ko) * 2009-06-11 2011-12-15 고려대학교 산학협력단 전자 방출원의 제조방법 및 이를 적용한 전자소자의 제조방법
US8841454B2 (en) * 2009-07-17 2014-09-23 Exxonmobil Research And Engineering Company Functionalized carbon nanostructures which are soluble in hydrocarbons and method for preparation
US8207496B2 (en) * 2010-02-05 2012-06-26 Thermo Finnigan Llc Multi-needle multi-parallel nanospray ionization source for mass spectrometry
US20110223085A1 (en) * 2010-03-12 2011-09-15 E. I. Du Pont De Nemours And Company Carbon dioxide capture with ionic liquid electrospray
BR112013017419B1 (pt) 2011-01-05 2021-03-16 Purdue Research Foundation sistema e método para analisar uma amostra e método para ionizar uma amostra
WO2012167126A1 (en) 2011-06-03 2012-12-06 Purdue Research Foundation Ion generation using modified wetted porous materials
WO2012170301A1 (en) 2011-06-04 2012-12-13 Purdue Research Foundation (Prf) Cassettes, systems, and methods for ion generation using wetted porous materials
JP5771458B2 (ja) * 2011-06-27 2015-09-02 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
CN102324375B (zh) * 2011-07-22 2013-12-04 中国科学院上海有机化学研究所 一种质谱纳喷雾电极及其制作方法和应用
CN102522311A (zh) * 2011-10-20 2012-06-27 中国科学院上海有机化学研究所 一种纳喷雾电极及其制作方法和应用
BR112015018484A2 (pt) * 2013-01-31 2017-07-18 Purdue Research Foundation métodos de analisar o petróleo bruto

Also Published As

Publication number Publication date
EP3089811B1 (en) 2019-11-06
US10559455B2 (en) 2020-02-11
JP2017502467A (ja) 2017-01-19
JP6577950B2 (ja) 2019-09-18
US20160314956A1 (en) 2016-10-27
US10991564B2 (en) 2021-04-27
WO2015100221A3 (en) 2015-12-17
JP2022002214A (ja) 2022-01-06
EP3667701A2 (en) 2020-06-17
US10395913B2 (en) 2019-08-27
EP3089811A2 (en) 2016-11-09
US20190355567A1 (en) 2019-11-21
CN110648894A (zh) 2020-01-03
WO2015100221A2 (en) 2015-07-02
CN106102873A (zh) 2016-11-09
EP3667701A3 (en) 2020-07-29
US20200168446A1 (en) 2020-05-28
EP3089811A4 (en) 2017-07-26
CN110648894B (zh) 2022-05-13

Similar Documents

Publication Publication Date Title
US10991564B2 (en) Mass spectrometry probes and systems for ionizing a sample
Narayanan et al. Molecular ionization from carbon nanotube paper
US8933398B2 (en) Ion generation using wetted porous material
US10714323B2 (en) Zero voltage mass spectrometry probes and systems
WO2005104179A2 (en) Use of carbon nanotubes (cnts) for analysis of samples
US7413907B2 (en) Carbon nanotubes and their derivatives as matrix elements for the matrix-assisted laser desorption mass spectrometry of biomolecules and sequencing using associated fragmentation
Xia et al. Analysis of compounds dissolved in nonpolar solvents by electrospray ionization on conductive nanomaterials
JP6947887B2 (ja) 試料をイオン化するための質量分析プローブおよびシステム
Morozov Generation of biologically active nano-aerosol by an electrospray-neutralization method
CN105575755B (zh) 一种基于导电纳米材料的电喷雾质谱装置及其实现电喷雾质谱分析的方法

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant