CN106057629B - A kind of existing fringing field photoelectronic imaging instrument - Google Patents
A kind of existing fringing field photoelectronic imaging instrument Download PDFInfo
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- CN106057629B CN106057629B CN201610597107.8A CN201610597107A CN106057629B CN 106057629 B CN106057629 B CN 106057629B CN 201610597107 A CN201610597107 A CN 201610597107A CN 106057629 B CN106057629 B CN 106057629B
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- pole plate
- plate
- imaging instrument
- fringing field
- photoelectronic imaging
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The present invention provides a kind of existing fringing field photoelectronic imaging instrument.The existing fringing field photoelectronic imaging instrument includes laser action area, free flight pipe and the detector set gradually along charging particle movement direction, the laser action area includes at least four pole plates set successively with respect to parallel interval along charging particle movement direction, formed with electrical potential difference between the two neighboring pole plate, and in the laser action area, the direction of the electrical potential difference is identical.The beneficial effects of the present invention are：The existing fringing field photoelectronic imaging instrument realizes apparatus measures process in the case where pole plate combined potential difference similarly configures and keeps existing fringing field, so that in the measurement process of research light and material effect, greatly reduce measuring instrument in itself the change of test substance property is caused with electric field.
Description
Technical field
The present invention relates to a kind of existing fringing field photoelectronic imaging instrument.
Background technology
Current existing fringing field photoelectronic imaging instrument is to be designed by Dutch scientist Eppink and Parker in 1997 at present
Invention, they under certain optimization voltage configuration, form ion lens, realization pair by designing three pieces of pole plates with circular hole
It is focused, is then collected by the detector of tof tube rear end, such as Fig. 1 with identical speed but the charged particle of diverse location
It is shown.The setting of the wherein three pieces pole plates with circular hole is as follows：P1 is repeller pole plate, and P2 is to accelerate pole pole plate, and P3 is earthing pole
Pole plate.By varying repeller pole plate P1 and the voltage of acceleration pole pole plate P2, the focusing electric field based on ion lens is formed, is such as schemed
Shown in 2.Ion lens effect under, the Focusing of charged particles of diverse location on a point of detector, which greatly enhances
The resolution ratio of Velocity map ion imaging, as shown in Figure 3.
However, the photoelectronic imaging instrument based on tri-electrode design current at present, due to pole plate number very little, is realized again
Focusing to charged particle, the combined potential difference for causing demand is realized on this three pieces of pole plates, so that the electric field between causing pole plate
Intensity is very high.For example, three pieces of plate designs voltages of the photoelectronic imaging instrument based on tri-electrode design as above are as follows：On the whole
The electrical potential difference of demand is 4000V, and repeller P1 is -4000V, and it is -2790V to accelerate pole P2, and earth polar P3 is 0V.Because repeller P1
Electrical potential difference with accelerating pole P2 has reached 1210V, and accelerates pole P2 and the electrical potential difference of earth polar P3 to reach 2790V, thus causes
Electric field strength between pole plate is very high.Photoelectronic imaging instrument is the mechanism of action for Study of Laser and material.And at present
There is enough evidences to prove that the property of material under the action of an external electric field will change, electric field cause the possibility of the change of physical property to
The mechanism of measurement laser and material effect brings very big uncertainty.
Therefore, it is necessary to propose a kind of existing fringing field photoelectronic imaging instrument that can reduce electric field strength between pole plate.
The content of the invention
It is an object of the invention to provide a kind of existing fringing field photoelectronic imaging instrument that can reduce electric field strength between pole plate.
Technical scheme is as follows：A kind of existing fringing field photoelectronic imaging instrument is included along charging particle movement direction successively
Laser action area, free flight pipe and the detector of setting, it is characterised in that the laser action area includes transporting along charged particle
At least four pole plates that dynamic direction is set with respect to parallel interval successively, formed with electrical potential difference between the two neighboring pole plate, and
In the laser action area, the direction of the electrical potential difference is identical.
Preferably, each pole plate is the circular pole plate that central part separates circular hole, and the outside diameter of each pole plate
It is identical.
Preferably, the laser action area includes first set successively with respect to parallel interval along charging particle movement direction
Pole plate, the second pole plate, tri-electrode, quadripolar plate, the 5th pole plate and sextupole plate, second pole plate, the tri-electrode,
The quadripolar plate, the 5th pole plate are identical with the internal diameter of the sextupole plate, and are all higher than the internal diameter of first pole plate.
Preferably, the pole plate close to described free flight pipe one end is grounded.
Preferably, the free flight pipe is metal circular pipe.
The beneficial effects of the present invention are：The existing fringing field photoelectronic imaging instrument similarly configures lower reality in pole plate combined potential difference
Show apparatus measures process and kept existing fringing field so that in the measurement process of research light and material effect, greatly reduce measuring instrument
Device in itself the change of test substance property is caused with electric field.
Brief description of the drawings
Fig. 1 is the structure diagram of the photoelectronic imaging instrument of the prior art；
Fig. 2 is the ion lens Potential Distributing design sketch of photoelectronic imaging instrument shown in Fig. 1；
The photoelectronic focusing that it is 4eV for the kinetic energy that is distributed with certain position that Fig. 3, which is photoelectronic imaging instrument shown in Fig. 1,
The schematic diagram of effect；
Fig. 4 is the structure diagram of existing fringing field photoelectronic imaging instrument provided by the invention；
Fig. 5 is the ion lens Potential Distributing design sketch of the instrument of existing fringing field photoelectronic imaging shown in Fig. 4；
The photoelectron that it is 4eV for the kinetic energy that is distributed with certain position that Fig. 6, which is the instrument of existing fringing field photoelectronic imaging shown in Fig. 4,
Focusing effect schematic diagram.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, with reference to the accompanying drawings and embodiments, it is right
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
The description of specific distinct unless the context otherwise, the present invention in element and component, the shape that quantity both can be single
Formula exists, and form that can also be multiple exists, and the present invention is defined not to this.It is appreciated that art used herein
Language "and/or" is related to and covers one of associated Listed Items or one or more of any and all possible combination.
Please refer to Fig. 4 and Fig. 5, Fig. 4 is the structure diagram of existing fringing field photoelectronic imaging instrument provided by the invention, figure
5 be the ion lens Potential Distributing design sketch of the instrument of existing fringing field photoelectronic imaging shown in Fig. 4.The existing fringing field photoelectronic imaging instrument
100 laser action area 10, free flight pipe 20 and detectors 30, Yi Jiyu including being set gradually along charging particle movement direction
The voltage-regulating circuit 40 that the laser action area 10 is electrically connected.Preferably, the detector 30 is MCP＆PS (Micro-
Channel Plate＆Phorsphor Screen, microchannel plate ＆ phosphorescent screen) detector.Wherein, the free flight pipe 20 is
Metal circular pipe with higher magnetic permcability, and for providing moving conduit, the detector 30 for the charged particle after focusing on
For collecting and detecting the charged particle by the free flight pipe 20.For example, the size of the free flight pipe 20 can be with
It is 960mm, outside diameter 1000mm, thickness 20mm for internal diameter.
In the existing fringing field photoelectronic imaging instrument 100, charged particle is focused by the laser action area 10, and
The moving conduit provided through the free flight pipe 20, so as to reach the detector 30, and then is collected and detects.
The laser action area 10 includes at least four set successively with respect to parallel interval along charging particle movement direction
Pole plate, formed with electrical potential difference between the two neighboring pole plate, and in the laser action area 10, the direction of the electrical potential difference
It is identical, moreover, the pole plate close to described 20 one end of free flight pipe is grounded.Preferably, centered on each pole plate is equal
Portion separates the circular pole plate of circular hole, and the outside diameter of each pole plate is identical.For example, the thickness of each pole plate is
20mm, outside diameter are 1000mm.Moreover, the spacing between the two neighboring pole plate is equal, and it is 200mm.
In the present embodiment, the laser action area 10 can include along charging particle movement direction successively it is relatively flat in the ranks
Every the first pole plate 11 of setting, the second pole plate 12, tri-electrode 13, quadripolar plate 14, the 5th pole plate 15 and sextupole plate 16.Its
In, the ground connection of sextupole plate 16 is set.Moreover, second pole plate 12, the tri-electrode 13, the quadripolar plate 14,
5th pole plate 15 is identical with the internal diameter of the sextupole plate 16, and is all higher than the internal diameter of first pole plate 11.For example, institute
State the interior of the second pole plate 12, the tri-electrode 13, the quadripolar plate 14, the 5th pole plate 15 and the sextupole plate 16
Footpath can be 200mm, and the internal diameter of first pole plate 11 is 40mm.
In the laser action area 10, first pole plate 11, second pole plate 12, the tri-electrode are utilized
13rd, the quadripolar plate 14, the 5th pole plate 15 and the sextupole plate 16 share the electricity in the laser action area 10 jointly
Potential difference, so that the electrical potential difference between the two neighboring pole plate diminishes, avoids the electric field strength between the pole plate too high,
And cause test substance property to change, and then increase the measuring uncertainty of photoelectronic imaging instrument.
If for example, the electrical potential difference in the laser action area 10 is 4000V, the voltage after optimization is：Described
One pole plate 11 is 4000V, and second pole plate 12 is 3450V, and the tri-electrode 13 is 2400V, and the quadripolar plate 14 is
1600V, the 5th pole plate 15 is 800V and the sextupole plate 16 is 0V.Wherein, the sextupole plate 16 is grounded.
Therefore, the electric field strength in centre position is only 2.75V/ between first pole plate 11 and second pole plate 12
Mm, the electric field strength in centre position is only 5.25V/mm between second pole plate 12 and the tri-electrode 13.Described
The electric field strength in centre position is only 2.0V/mm between tri-electrode 13 and the quadripolar plate 14,14 He of quadripolar plate
The electric field strength in centre position is only 2.0V/mm between 5th pole plate 15, the 5th pole plate 15 and the sextupole
The electric field strength in centre position is only 2.0V/mm between plate 16.
Referring to Fig. 6, it is that the instrument of existing fringing field photoelectronic imaging shown in Fig. 4 is 4eV for the kinetic energy being distributed with certain position
Photoelectronic focusing effect schematic diagram.Existing fringing field photoelectronic imaging instrument 100 provided in this embodiment is to Focusing of charged particles
Effect is identical with existing photoelectronic imaging instrument, that is, has the imaging effect identical with existing photoelectronic imaging instrument.
It should be noted that in photoelectronic imaging instrument in the prior art, if charged particle can be very good to focus on
In detector, then the electric field strength in centre position is between the repeller pole plate of photoelectronic imaging instrument and acceleration pole pole plate
63.3V/mm, accelerates the electric field strength in centre position between pole pole plate and repeller pole plate to reach 117.5V/mm.Therefore,
Compared to the photoelectronic imaging instrument of the prior art, under the premise of identical focal imaging effect is kept, low electricity provided in this embodiment
The electric field strength of field photoelectronic imaging instrument 100 substantially reduces.
Compared to the prior art, existing fringing field photoelectronic imaging instrument 100 provided by the invention identical is matched somebody with somebody in pole plate combined potential difference
Putting down, which realizes apparatus measures process, keeps existing fringing field so that in the measurement process of research light and material effect, greatly reduces
Measuring instrument in itself the change of test substance property is caused with electric field.
It is obvious to a person skilled in the art that the invention is not restricted to the details of above-mentioned one exemplary embodiment, Er Qie
In the case of without departing substantially from spirit or essential attributes of the invention, the present invention can be realized in other specific forms.Therefore, no matter
From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the present invention is by appended power
Profit requires rather than described above limits, it is intended that all in the implication and scope of the equivalency of claim by falling
Change is included in the present invention.Any reference numeral in claim should not be considered as to the involved claim of limitation.
Moreover, it will be appreciated that although the present specification is described in terms of embodiments, not each embodiment is only wrapped
Containing an independent technical solution, this narrating mode of specification is only that those skilled in the art should for clarity
Using specification as an entirety, the technical solutions in the various embodiments may also be suitably combined, forms those skilled in the art
It is appreciated that other embodiment.
Claims (3)
1. a kind of existing fringing field photoelectronic imaging instrument, including set gradually along charging particle movement direction laser action area, freedom
Tof tube and detector, it is characterised in that the laser action area include along charging particle movement direction successively it is relatively flat in the ranks
Formed with electrical potential difference between at least four pole plates of setting, the two neighboring pole plate, and in the laser action area, institute
The direction for stating electrical potential difference is identical；
The laser action area includes the first pole plate, the second pole set successively with respect to parallel interval along charging particle movement direction
Plate, tri-electrode, quadripolar plate, the 5th pole plate and sextupole plate, second pole plate, the tri-electrode, the quadrupole
Plate, the 5th pole plate are identical with the internal diameter of the sextupole plate, and are all higher than the internal diameter of first pole plate.
2. existing fringing field photoelectronic imaging instrument according to claim 1, it is characterised in that close to described free flight pipe one end
The pole plate ground connection.
3. existing fringing field photoelectronic imaging instrument according to claim 1, it is characterised in that the free flight pipe is round metal
Shape pipe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610597107.8A CN106057629B (en) | 2016-07-26 | 2016-07-26 | A kind of existing fringing field photoelectronic imaging instrument |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610597107.8A CN106057629B (en) | 2016-07-26 | 2016-07-26 | A kind of existing fringing field photoelectronic imaging instrument |
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| CN106057629A CN106057629A (en) | 2016-10-26 |
| CN106057629B true CN106057629B (en) | 2018-04-13 |
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| CN108281345B (en) * | 2018-02-28 | 2023-09-08 | 南京信息工程大学 | Polar plate tunable photoelectronic imager and method thereof |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101571509A (en) * | 2008-04-29 | 2009-11-04 | 周畅 | Ion imaging shielding electrode system |
| CN103762149A (en) * | 2013-12-31 | 2014-04-30 | 华中科技大学 | Device for improving electron velocity imaging resolution |
| CN203967029U (en) * | 2014-07-18 | 2014-11-26 | 大连华扬科技有限公司 | A kind of ion focusing lens for velocity imaging |
| CN104934288A (en) * | 2015-05-12 | 2015-09-23 | 南京信息工程大学 | High time resolution ion speed imager based on tetra-pole plate design |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN205863133U (en) * | 2016-07-26 | 2017-01-04 | 南京信息工程大学 | A kind of low electric field photoelectronic imaging instrument |
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2016
- 2016-07-26 CN CN201610597107.8A patent/CN106057629B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101571509A (en) * | 2008-04-29 | 2009-11-04 | 周畅 | Ion imaging shielding electrode system |
| CN103762149A (en) * | 2013-12-31 | 2014-04-30 | 华中科技大学 | Device for improving electron velocity imaging resolution |
| CN203967029U (en) * | 2014-07-18 | 2014-11-26 | 大连华扬科技有限公司 | A kind of ion focusing lens for velocity imaging |
| CN104934288A (en) * | 2015-05-12 | 2015-09-23 | 南京信息工程大学 | High time resolution ion speed imager based on tetra-pole plate design |
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| CN106057629A (en) | 2016-10-26 |
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