CN205863133U - A kind of low electric field photoelectronic imaging instrument - Google Patents
A kind of low electric field photoelectronic imaging instrument Download PDFInfo
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- CN205863133U CN205863133U CN201620794118.0U CN201620794118U CN205863133U CN 205863133 U CN205863133 U CN 205863133U CN 201620794118 U CN201620794118 U CN 201620794118U CN 205863133 U CN205863133 U CN 205863133U
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- pole plate
- electric field
- imaging instrument
- low electric
- photoelectronic imaging
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Abstract
This utility model provides a kind of low electric field photoelectronic imaging instrument.Described low electric field photoelectronic imaging instrument includes laser action district, free flight line pipe and the detector set gradually along charging particle movement direction, described laser action district includes the most opposing parallel spaced at least four pole plate along charging particle movement direction, it is formed with electric potential difference between adjacent two described pole plates, and in described laser action district, the direction of described electric potential difference is identical.The beneficial effects of the utility model are: described low electric field photoelectronic imaging instrument achieves apparatus measures process under pole plate combined potential difference similarly configures and keeps low electric field, make during the measurement of research light and material effect, greatly reduce measuring instrument institute band electric field own and cause the change of test substance character.
Description
Technical field
This utility model relates to a kind of low electric field photoelectronic imaging instrument.
Background technology
The most current low electric field photoelectronic imaging instrument is in design in 1997 by Holland scientist Eppink and Parker
Invention, they are by designing the pole plate of three pieces of band circular holes, under certain optimization voltage configuration, form ion lens, it is achieved right
But the charged particle with identical speed diverse location is focused, and is then collected by the detector of tof tube rear end, such as Fig. 1
Shown in.Wherein the pole plate of three pieces of band circular holes be provided that P1 is repeller pole plate, P2 is to accelerate pole pole plate, and P3 is earthing pole
Pole plate.By changing repeller pole plate P1 and accelerating the voltage of pole pole plate P2, form focusing electric field based on ion lens, such as figure
Shown in 2.Under ion lens effect, the Focusing of charged particles of diverse location, on a point of detector, which greatly enhances
The resolution of Velocity map ion imaging, as shown in Figure 3.
But, the most current photoelectronic imaging instrument based on tri-electrode design, due to pole plate number very little, realize again
Focusing to charged particle, the combined potential difference causing demand realizes on these three pieces of pole plates, thus causes the electric field between pole plate
Intensity is the highest.Such as, three pieces of plate designs voltages of photoelectronic imaging instrument based on tri-electrode design as above are as follows: on the whole
The electric potential difference of demand is 4000V, and repeller P1 is-4000V, and accelerating pole P2 is-2790V, and earth polar P3 is 0V.Because repeller P1
Reach 1210V with the electric potential difference accelerating pole P2, and the electric potential difference accelerating pole P2 and earth polar P3 has reached 2790V, thus results in
Electric field intensity between pole plate is the highest.Photoelectronic imaging instrument is used to the mechanism of action of Study of Laser and material.And the most
The character under material electric field action outside will change to have enough evidences to prove, what electric field caused the change of physical property may be to
Laser Measurement brings the biggest uncertainty with the mechanism of material effect.
Therefore, it is necessary to propose a kind of to reduce the low electric field photoelectronic imaging instrument of electric field intensity between pole plate.
Utility model content
The purpose of this utility model is to provide a kind of low electric field photoelectron that can reduce electric field intensity between pole plate to become
As instrument.
The technical solution of the utility model is as follows: a kind of low electric field photoelectronic imaging instrument includes along charging particle movement direction
Laser action district, free flight line pipe and the detector set gradually, it is characterised in that described laser action district includes along band electrochondria
The most opposing parallel spaced at least four pole plate of the sub-direction of motion, is formed with electromotive force between adjacent two described pole plates
Difference, and in described laser action district, the direction of described electric potential difference is identical.
Preferably, each described pole plate is central part and separates the circular pole plate of circular hole, and the external diameter of each described pole plate
Identical.
Preferably, described laser action district includes along charging particle movement direction the most opposing parallel spaced first
Pole plate, the second pole plate, tri-electrode, quadripolar plate, the 5th pole plate and six types of severe debility disease plate, described second pole plate, described tri-electrode,
Described quadripolar plate, described 5th pole plate are identical with the internal diameter of described six types of severe debility disease plate, and are all higher than the internal diameter of described first pole plate.
Preferably, near the described pole plate ground connection of described free flight line pipe one end.
Preferably, described free flight line pipe is metal circular pipe.
The beneficial effects of the utility model are: described low electric field photoelectronic imaging instrument similarly configures in pole plate combined potential difference
Under achieve apparatus measures process and keep low electric field so that during the measurement of research light and material effect, greatly reduce survey
Measuring appratus institute band electric field own causes the change of test substance character.
Accompanying drawing explanation
Fig. 1 is the structural representation of the photoelectronic imaging instrument of prior art；
Fig. 2 is the ion lens Potential Distributing design sketch of photoelectronic imaging instrument shown in Fig. 1；
Fig. 3 is that photoelectronic imaging instrument shown in Fig. 1 is for having the photoelectronic focusing that kinetic energy is 4eV of certain position distribution
The schematic diagram of effect；
Fig. 4 is the structural representation of the low electric field photoelectronic imaging instrument that this utility model provides；
Fig. 5 is the ion lens Potential Distributing design sketch of low electric field photoelectronic imaging instrument shown in Fig. 4；
Fig. 6 is that low electric field photoelectronic imaging instrument shown in Fig. 4 is for having the photoelectron that kinetic energy is 4eV of certain position distribution
The schematic diagram of focusing effect.
Detailed description of the invention
In order to make the purpose of this utility model, technical scheme and advantage clearer, below in conjunction with accompanying drawing and enforcement
Example, is further elaborated to this utility model.Should be appreciated that specific embodiment described herein is only in order to explain
This utility model, is not used to limit this utility model.
The description of specific distinct unless the context otherwise, the element in this utility model and assembly, quantity both can be single
Presented in, it is also possible to presented in multiple, this is not defined by this utility model.It is appreciated that institute herein
The term "and/or" used relates to and contains the one or more of any and institute in the Listed Items being associated likely
Combination.
It is the structural representation of the low electric field photoelectronic imaging instrument that this utility model provides please refer to Fig. 4 and Fig. 5, Fig. 4
Figure, Fig. 5 is the ion lens Potential Distributing design sketch of low electric field photoelectronic imaging instrument shown in Fig. 4.Described low electric field photoelectron
Imager 100 includes laser action district 10, free flight line pipe 20 and the detector 30 set gradually along charging particle movement direction,
And the voltage-regulating circuit 40 electrically connected with described laser action district 10.Preferably, described detector 30 is MCP&PS
(Micro-channel Plate&Phorsphor Screen, microchannel plate & phosphorescent screen) detector.Wherein, described free flight
Line pipe 20 is to have the metal circular pipe of higher magnetic permcability, and for providing moving conduit for the charged particle after focusing on, described
Detector 30 is for collecting and detecting the charged particle by described free flight line pipe 20.Such as, described free flight line pipe 20
Size can be internal diameter be 960mm, external diameter is 1000mm, and thickness is 20mm.
In described low electric field photoelectronic imaging instrument 100, charged particle is focused by described laser action district 10, and
The moving conduit provided through described free flight line pipe 20, thus arrive described detector 30, and then be collected and detect.
Described laser action district 10 includes the most opposing parallel spaced at least four along charging particle movement direction
Pole plate, is formed with electric potential difference between adjacent two described pole plates, and in described laser action district 10, the direction of described electric potential difference
Identical, and, near the described pole plate ground connection of described free flight line pipe 20 one end.Preferably, centered by each described pole plate is equal
Portion separates the circular pole plate of circular hole, and the external diameter of each described pole plate is identical.Such as, the thickness of each described pole plate is
20mm, external diameter is 1000mm.And, the spacing between adjacent two described pole plates is equal, and is 200mm.
In the present embodiment, described laser action district 10 can include along the most opposing parallel of charging particle movement direction
Every first pole plate the 11, second pole plate 12 arranged, tri-electrode 13, quadripolar plate the 14, the 5th pole plate 15 and six types of severe debility disease plate 16, institute
State the interior of the second pole plate 12, described tri-electrode 13, described quadripolar plate 14, described 5th pole plate 15 and described six types of severe debility disease plate 16
Footpath is identical, and is all higher than the internal diameter of described first pole plate 11.Such as, described second pole plate 12, described tri-electrode 13, described
The internal diameter of quadripolar plate 14, described 5th pole plate 15 and described six types of severe debility disease plate 16 can be 200mm, and described first pole plate 11 is interior
Footpath is 40mm.
In described laser action district 10, utilize described first pole plate 11, described second pole plate 12, described tri-electrode
13, the electricity in described laser action district 10 shared jointly by described quadripolar plate 14, described 5th pole plate 15 and described six types of severe debility disease plate 16
Potential difference, so that the electric potential difference between adjacent two described pole plates diminishes, it is to avoid the electric field intensity between described pole plate is the highest,
And cause test substance character to change, and then increase the measuring uncertainty of photoelectronic imaging instrument.
Such as, if the electric potential difference in described laser action district 10 is 4000V, then the voltage after optimizing is: described the
One pole plate 11 is 4000V, and described second pole plate 12 is 3450V, and described tri-electrode 13 is 2400V, and described quadripolar plate 14 is
1600V, described 5th pole plate 15 is 800V and described six types of severe debility disease plate 16 is 0V.Wherein, described six types of severe debility disease plate 16 ground connection.
Therefore, between described first pole plate 11 and described second pole plate 12, the electric field intensity in centre position is only 2.75V/
Mm, between described second pole plate 12 and described tri-electrode 13, the electric field intensity in centre position is only 5.25V/mm.Described
Between tri-electrode 13 and described quadripolar plate 14, the electric field intensity in centre position is only 2.0V/mm, described quadripolar plate 14 He
Between described 5th pole plate 15, the electric field intensity in centre position is only 2.0V/mm, described 5th pole plate 15 and described six types of severe debility disease
Between plate 16, the electric field intensity in centre position is only 2.0V/mm.
Refer to Fig. 6, be low electric field photoelectronic imaging instrument shown in Fig. 4 for having the kinetic energy of certain position distribution be 4eV
The schematic diagram of photoelectronic focusing effect.The low electric field photoelectronic imaging instrument 100 that the present embodiment provides is to Focusing of charged particles
Effect is identical with existing photoelectronic imaging instrument, i.e. has the imaging effect identical with existing photoelectronic imaging instrument.
It should be noted that in photoelectronic imaging instrument in the prior art, if charged particle can well focus on
At detector, then between repeller pole plate and the acceleration pole pole plate of photoelectronic imaging instrument, the electric field intensity in centre position is
63.3V/mm, accelerates the electric field intensity in centre position between pole pole plate and repeller pole plate and has reached 117.5V/mm.Therefore,
Compared to the photoelectronic imaging instrument of prior art, under keeping identical focal imaging effect premise, the low electricity that the present embodiment provides
The electric field intensity of field photoelectronic imaging instrument 100 is substantially reduced.
Compared to prior art, the low electric field photoelectronic imaging instrument 100 that this utility model provides is in pole plate combined potential difference phase
Low electric field is kept so that during the measurement of research light and material effect, greatly with achieving apparatus measures process under configuration
Reduce measuring instrument institute band electric field own and cause the change of test substance character.
It is obvious to a person skilled in the art that this utility model is not limited to the details of above-mentioned one exemplary embodiment, and
And in the case of without departing substantially from spirit or essential attributes of the present utility model, it is possible to realize this practicality in other specific forms new
Type.Therefore, no matter from the point of view of which point, all should regard embodiment as exemplary, and be nonrestrictive, this practicality is new
The scope of type is limited by claims rather than described above, it is intended that by the containing of equivalency in claim that fall
All changes in justice and scope are included in this utility model.Should not be considered as any reference in claim limiting
Involved claim.
Although moreover, it will be appreciated that this specification is been described by according to embodiment, but the most each embodiment only wraps
Containing an independent technical scheme, this narrating mode of description is only that for clarity sake those skilled in the art should
Description can also be formed those skilled in the art through appropriately combined as an entirety, the technical scheme in each embodiment
May be appreciated other embodiments.
Claims (5)
1. a low electric field photoelectronic imaging instrument, including the laser action district set gradually along charging particle movement direction, freedom
Tof tube and detector, it is characterised in that described laser action district includes along the most opposing parallel of charging particle movement direction
Every at least four pole plate arranged, between adjacent two described pole plates, it is formed with electric potential difference, and in described laser action district, institute
The direction stating electric potential difference is identical.
Low electric field photoelectronic imaging instrument the most according to claim 1, it is characterised in that each described pole plate is central part
The separately circular pole plate of circular hole, and the external diameter of each described pole plate is identical.
Low electric field photoelectronic imaging instrument the most according to claim 2, it is characterised in that described laser action district includes along band
The most opposing parallel spaced first pole plate of the charged particle direction of motion, the second pole plate, tri-electrode, quadripolar plate, the 5th
Pole plate and six types of severe debility disease plate, described second pole plate, described tri-electrode, described quadripolar plate, described 5th pole plate and the described 6th
The internal diameter of pole plate is identical, and is all higher than the internal diameter of described first pole plate.
Low electric field photoelectronic imaging instrument the most according to claim 1, it is characterised in that near described free flight line pipe one end
Described pole plate ground connection.
Low electric field photoelectronic imaging instrument the most according to claim 4, it is characterised in that described free flight line pipe is round metal
Shape pipe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620794118.0U CN205863133U (en) | 2016-07-26 | 2016-07-26 | A kind of low electric field photoelectronic imaging instrument |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620794118.0U CN205863133U (en) | 2016-07-26 | 2016-07-26 | A kind of low electric field photoelectronic imaging instrument |
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| CN205863133U true CN205863133U (en) | 2017-01-04 |
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| CN201620794118.0U Expired - Fee Related CN205863133U (en) | 2016-07-26 | 2016-07-26 | A kind of low electric field photoelectronic imaging instrument |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106057629A (en) * | 2016-07-26 | 2016-10-26 | 南京信息工程大学 | Low electric field optoelectronic imager |
-
2016
- 2016-07-26 CN CN201620794118.0U patent/CN205863133U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106057629A (en) * | 2016-07-26 | 2016-10-26 | 南京信息工程大学 | Low electric field optoelectronic imager |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170104 Termination date: 20180726 |
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| CF01 | Termination of patent right due to non-payment of annual fee |