CN105978759B - A kind of time-delay measuring method and device - Google Patents
A kind of time-delay measuring method and device Download PDFInfo
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- CN105978759B CN105978759B CN201610491235.4A CN201610491235A CN105978759B CN 105978759 B CN105978759 B CN 105978759B CN 201610491235 A CN201610491235 A CN 201610491235A CN 105978759 B CN105978759 B CN 105978759B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
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Abstract
The invention discloses a kind of time-delay measuring method and devices.In the present invention, switching equipment is connected between first node and second node on EVC, first to fourth switching equipment is included at least in the switching equipment connected, when carrying out latency measurement, according to the latency measurement frame for being sent to the second switching equipment from the first switching equipment, measurement obtains the first EVC point-to-point time delay between the first switching equipment and the second switching equipment；According to the latency measurement frame for being sent to the 4th switching equipment from third switching equipment, measurement obtains the 2nd EVC point-to-point time delay between third switching equipment and the 4th switching equipment；According to the first EVC point-to-point time delay and the 2nd EVC point-to-point time delay, determine that EVC point-to-point time delay correction value, EVC point-to-point time delay correction value can be used to be modified delay measurements.The accuracy of latency measurement can be improved in the present invention.
Description
Technical field
The present invention relates to field of communication technology more particularly to a kind of time-delay measuring methods and device.
Background technique
It is empty that Metro Ethernet Forum (Metro Ethernet Forum, abbreviation MEF) 10.2 defines point-to-point Ethernet
It connects in (Ethernet Virtual Connection, abbreviation EVC), ethernet frame is from one end user-network interface (User
Network Interface, abbreviation UNI) arrive other end UNI latency measurement standard.As shown in Figure 1, some ethernet frame
First bit of frame head be t1 at the time of issued from customer edge CE-1, the last one bit of postamble enters peer user
It is t2 at the time of edge device CE-2, then Δ t=t2-t1 is One Way Delay of the frame on this EVC.
Ethernet delay measurement (Ethernet Delay Measurement, abbreviation ETH-DM) function is based on international electricity
The basic function for believing alliance ITU-T Y.1731 standard, is divided into unidirectional ETH-DM and two kinds of two-way ETH-DM, by matching on EVC
Set maintenance entity group (Maintenance Entity Group, abbreviated as MEG) and maintenance boundary point (Maintenance End
Point, abbreviation MEP), the time difference that both ends MEP sends and receives is calculated to carry out latency measurement.
In two-way ETH-DM, MEP 1 sends the frame for having ETH-DM information, i.e. time delay measured message (Delay
Measurement Message, DMM), it carries TxTimeStampf；MEP 2 with 1 equity of MEP with ETH-DM to return
Complex information frame, i.e. latency measurement response (Delay Measurement Reply, DMR) protocol Data Unit (Protocol
Data Unit, abbreviation PDU) responded, reply frame in have replicated from ETH-DM information come TxTimeStampf and
The sending time TxTimeStampb of receiving time RxTimef, the ETH-DM return information frame of DMM.MEP 1 receives the ETH-DM
TxTimeStampf is compared by return information frame with the receiving time RxTimeb of ETH-DM return information frame, and as the following formula
Carry out the measurement of bidirectional frame time delay and bidirectional frame Delay Variation: frame time delay=RxTimeb-TxTimeStampf.
For two-way ETH-DM method, from NNI (Network-Network when DMM message reaches remote equipment
Interface, abbreviation NNI) mouth is just looped back, and does not calculate distal end UNI mouthfuls of time delay, cause to test out it is two-way when
Prolong inaccuracy.As shown in Figure 1, being initiated between the two MEP after configuring the port UNI1 and the port UNI2 to the MEP in maintenance domain
Delay testing is issued by the DMM message that DEV-1 equipment issues from NNI1 mouthfuls, is passed through go-between and is reached opposite end NNI2 postoral ring
It returns, backtracking reaches NNI1 mouthfuls, and entirely process has calculated 4 UNI mouthfuls of time delays less back and forth, therefore when leading to Ethernet point-to-point
Prolong measurement inaccuracy.
Summary of the invention
The embodiment of the invention provides a kind of time-delay measuring method and devices, to improve the accuracy of latency measurement.
Time-delay measuring method provided in an embodiment of the present invention, applied to include first node and second node EVC in,
It is connected with switching equipment between the first node and second node, first to fourth is included at least in the switching equipment connected
Switching equipment, which comprises
According to the latency measurement frame for being sent to the second switching equipment from the first switching equipment, measurement obtains the first switching equipment
And the second the first EVC point-to-point time delay between switching equipment；
According to the latency measurement frame for being sent to the 4th switching equipment from third switching equipment, measurement obtains third switching equipment
And the 4th the 2nd EVC point-to-point time delay between switching equipment；
According to the first EVC point-to-point time delay and the 2nd EVC point-to-point time delay, determine that EVC point-to-point time delay is repaired
Positive value.
Optionally, the third switching equipment and the 4th switching equipment are located at first switching equipment and described
Between two switching equipment.
Optionally, first is each configured on the UNI of the UNI of first switching equipment and second switching equipment
Grade safeguards the MEP in domain, and the first EVC point-to-point time delay is between the MEP in described the first estate maintenance domain that measurement obtains
The two-way time delay of EVC point-to-point；
The second grade dimension is each configured on the UNI of the UNI of the third switching equipment and the 4th switching equipment
The MEP in domain is protected, the 2nd EVC point-to-point time delay is the EVC point between the MEP in second grade maintenance domain that measurement obtains
To the two-way time delay of point.
Optionally, according to the latency measurement frame for being sent to the second switching equipment from the first switching equipment, measurement obtains described
First EVC point-to-point time delay, comprising:
Respectively according to the latency measurement frame for the N kind different length for being sent to the second switching equipment from the first switching equipment, survey
Measure the first EVC point-to-point time delay corresponding to every kind of frame length in N kind frame length, wherein N is the integer greater than 1；
According to the latency measurement frame for being sent to the 4th switching equipment from third switching equipment, measurement obtains the 2nd EVC
Point-to-point time delay, comprising:
Respectively according to the latency measurement for the N kind different length for being sent to the 4th switching equipment from third switching equipment
Frame, measurement obtain the 2nd EVC point-to-point time delay corresponding to every kind of frame length in N kind frame length；
According to the first EVC point-to-point time delay and the 2nd EVC point-to-point time delay, determine that EVC point-to-point time delay is repaired
Positive value, comprising:
The first EVC point-to-point time delay according to corresponding to the N kind frame length and the 2nd EVC point-to-point time delay respectively, really
EVC point-to-point time delay correction value corresponding to fixed this kind of frame length.
Optionally it is determined that after EVC point-to-point time delay correction value corresponding to the N kind frame length, further includes:
According to EVC point-to-point time delay correction value corresponding to the N kind frame length, EVC point-to-point time delay correction value is obtained
Curve；
Corresponding to the frame length determined except the N kind frame length according to the EVC point-to-point time delay correction value curve
EVC point-to-point time delay correction value.
Optionally, further includes: according between the switching equipment quantity and the tested node connected between tested node
EVC point-to-point time delay correction value, the EVC point-to-point delay measurements of the tested node are modified, after obtaining amendment
The tested node between EVC point-to-point time delay.
Optionally, according to following formula, EVC point-to-point time delay correction value is determined:
Wherein, Δ T is the EVC point-to-point time delay correction value between tested node, is connected between the N tested node
The quantity of switching equipment, x are the UNI time delay of a switching equipment, and T1 is the first EVC point-to-point time delay, and T2 is described the
Two EVC point-to-point time delays；Wherein, T1 and T2 is the two-way time delay of EVC point-to-point.
Latency measurement device provided in an embodiment of the present invention, applied to the Ethernet void for including first node and second node
It connects in EVC, is connected with switching equipment between the first node and second node, is at least wrapped in the switching equipment connected
Containing first to fourth switching equipment, described device includes:
First obtains module, when for obtaining the first EVC point-to-point between the first switching equipment and the second switching equipment
Prolong, the first EVC point-to-point time delay is surveyed according to the latency measurement frame for being sent to the second switching equipment from the first switching equipment
It measures；
Second obtains module, when for obtaining the 2nd EVC point-to-point between third switching equipment and the 4th switching equipment
Prolong, the 2nd EVC point-to-point time delay is surveyed according to the latency measurement frame for being sent to the 4th switching equipment from third switching equipment
It measures；
Determining module, for determining EVC according to the first EVC point-to-point time delay and the 2nd EVC point-to-point time delay
Point-to-point time delay correction value.
Optionally, the first EVC point-to-point time delay that the first acquisition module is got obtains in the following manner:
Respectively according to the latency measurement frame for the N kind different length for being sent to the second switching equipment from the first switching equipment, measurement obtains N kind
First EVC point-to-point time delay corresponding to every kind of frame length in frame length, wherein N is the integer greater than 1；
The 2nd EVC point-to-point time delay that the second acquisition module is got obtains in the following manner: root respectively
According to the latency measurement frame for the N kind different length for being sent to the 4th switching equipment from third switching equipment, measurement obtains N kind frame
2nd EVC point-to-point time delay corresponding to every kind of frame length in length；
The determining module is specifically used for: respectively the first EVC point-to-point time delay according to corresponding to the N kind frame length and
2nd EVC point-to-point time delay determines EVC point-to-point time delay correction value corresponding to this kind of frame length.
Optionally, the determining module is also used to:
After determining EVC point-to-point time delay correction value corresponding to the N kind frame length, according to N kind frame length institute
Corresponding EVC point-to-point time delay correction value obtains EVC point-to-point time delay correction value curve；
Corresponding to the frame length determined except the N kind frame length according to the EVC point-to-point time delay correction value curve
EVC point-to-point time delay correction value.
Optionally, further includes: correction module, for according to being tested between node the switching equipment quantity that connects and described
EVC point-to-point time delay correction value between tested node, repairs the EVC point-to-point delay measurements of the tested node
Just, the EVC point-to-point time delay between the revised tested node is obtained.
Optionally, the determining module is specifically used for: according to following formula, determine EVC point-to-point time delay correction value:
Wherein, Δ T is the EVC point-to-point time delay correction value between tested node, is connected between the N tested node
The quantity of switching equipment, x is user=network interface UNI time delay of a switching equipment, when T1 is the first EVC point-to-point
Prolong, T2 is the 2nd EVC point-to-point time delay；Wherein, T1 and T2 is the two-way time delay of EVC point-to-point.
In the above embodiment of the present invention, switching equipment, company of institute are connected between the first node and second node on EVC
First to fourth switching equipment is included at least in the switching equipment connect, when carrying out latency measurement, according to from the first switching equipment
It is sent to the latency measurement frame of the second switching equipment, measurement obtains first between the first switching equipment and the second switching equipment
EVC point-to-point time delay；According to the latency measurement frame for being sent to the 4th switching equipment from third switching equipment, measurement obtains third friendship
The 2nd EVC point-to-point time delay between exchange device and the 4th switching equipment；According to the first EVC point-to-point time delay and described
Two EVC point-to-point time delays determine EVC point-to-point time delay correction value.Due to using two-stage EVC point between different switching equipment
To a latency measurement, therefore can be according to the obtained first EVC point-to-point time delay of two-stage EVC point-to-point latency measurement and second
EVC point-to-point time delay calculates EVC point-to-point time delay correction value, when so that the time delay correction value introducing the UNI of switching equipment
Prolong, EVC point-to-point time delay correction value can be used to be modified delay measurements, and then with do not consider UNI in the prior art
Mouth time delay is compared, and the accuracy of latency measurement is improved.
Detailed description of the invention
Fig. 1 is Ethernet point-to-point latency measurement topological structure schematic diagram in the prior art；
Fig. 2 is the latency measurement topological structure schematic diagram in the embodiment of the present invention
Fig. 3 is latency measurement flow diagram provided in an embodiment of the present invention；
Fig. 4 is latency measurement schematic illustration provided in an embodiment of the present invention；
Fig. 5 is the corresponding relationship curve synoptic diagram of the frame length-UNI time delay in the embodiment of the present invention；
Fig. 6 is the structural schematic diagram of latency measurement device provided in an embodiment of the present invention.
Specific embodiment
The embodiment of the present invention provides a kind of accuracy that two-way latency measurement is improved by correction algorithm.The present invention is implemented
Example is applicable to heterogeneous networks framework, Ethernet point-to-point latency measurement is particularly suitable for, with two-way ETH- in the prior art
DM is compared, and can make that time delay measures are more acurrate, more meet the definition of MEF10.2.
Below by taking Ethernet point-to-point latency measurement as an example, the embodiment of the present invention is described in detail in conjunction with attached drawing.
As shown in Fig. 2, 4 can be used first for measuring the time delay between first node and second node on EVC
Switching equipment (such as interchanger, figure in be expressed as DEV-1 to DEV-4), several cables or optical fiber, build test as shown in Figure 2
Open up benefit, wherein this 4 switching equipment (DEV-1, DEV-3, DEV-4, DEV- is sequentially connected between first node and second node
2) it, is connected between switching equipment by cable or optical fiber.
In order to make time delay measures meet ITU-T Y.1731 standard requirements, above-mentioned switching equipment, which can be, has initiation
And respond the function of Y.1731 service-level agreement (Service-Level Agreement, abbreviation SLA) operation of latency measurement
Interchanger.
(cable or optical fiber are longer, influence on measurement accuracy for influence in view of the length of cable or optical fiber to measurement accuracy
It is bigger), in order to guarantee measurement accuracy, the length of used cable or optical fiber can be limited in a certain range, such as less than etc.
In 1m.In this way, the propagation delay time as brought by cable or optical fiber can be ignored, typically, which can be according to medium class
Type and measuring accuracy require to determine.
High-grade maintenance domain is configured on two switching equipment of outer layer, inferior grade dimension is configured on two switching equipment of internal layer
Domain is protected, configures the MEP in affiliated maintenance domain on the uni port of each switching equipment respectively.For example, as shown in Fig. 2, in DEV-1
With the maintenance domain of configuration level 5 (level 5) on DEV-2, the maintenance of configuration level 3 (level 3) on DEV-3 and DEV-4
Domain, wherein level 5 is higher than level 3.The UP MEP 501 that level 5 is configured on the UNI1 of DEV-1, DEV-2's
The UP MEP 502 that level 5 is configured on UNI2, configures the UP MEP 303 of level 3, in DEV-4 on the UNI3 of DEV-3
UNI4 on configure level 3 UP MEP 304.Certainly, inferior grade maintenance can also be configured on two switching equipment of outer layer
Domain configures high-grade maintenance domain on two switching equipment of internal layer.
In general, SLA can be signed between operator and user in order to ensure that user can enjoy the network service of certain mass
Agreement.In order to effectively fulfil SLA agreement, operator needs to affix one's name to SLA feature measurement network performance in upper side, and to measure knot
Fruit is as the foundation guaranteed user performance.SLA characteristic configures SLA by choosing two nodes, wherein and makees on a node
Industry, and execution is dispatched, to achieve the purpose that point-to-point transmission network performance detects.Before configuring SLA, need the equipment that detects it
Between dispose Connectivity Fault Management (Connectivity Fault Management, abbreviation CFM).SLA measures application scenarios solution
Release as follows: if Switch A and Switch B are two switching equipment in diverse geographic location, and user wishes to know
Network performance between the two switching equipment of road then can configure SLA operation in Switch A, and destination address is Switch B,
Network performance measurement is carried out by schedule job.SLA homework type is DM (Delay Measurement) operation, for carrying out
Time delay, jitter test.
Based on the application scenarios of above-mentioned SLA agreement, in the embodiment of the present invention, can be risen from MEP configuration concurrency on DEV-1
501 are directed toward the SLA operation (being depicted below as SLA 1) of MEP 502 on DEV-2, and configuration concurrency rises from MEP 303 on DEV-3
It is directed toward the SLA operation (being depicted below as SLA 2) of MEP 304 on DEV-4.The test content of 2 operation of 1 operation of SLA and SLA is
Two-way time delay and shake, the test protocol message of sending are DMM, and the frame length of protocol massages is configurable.For example, the frame length of DMM
The frame length range of ether network packet be can refer to configure, for example, the frame length configurable range of DMM is 64 bytes to 9600 bytes.
It is configured based on above-mentioned SLA operation, Fig. 3 schematically illustrates time-delay measuring method stream provided in an embodiment of the present invention
Journey, which may include following steps:
Step 301: according to the latency measurement frame for being sent to DEV-2 from DEV-1, measurement is obtained between DEV-1 and DEV-2
First EVC point-to-point time delay T1.More specifically, measured obtained T1 is the NNI 2 on UNI 1 to DEV-2 on DEV-1
Two-way time delay.
In the step, after SLA1 job initiation, MEP 502 of the MEP 501 on DEV-2 on DEV-1 sends DMM 1,
The time t1 of the DMM 1 is sent in the DMM comprising ETH-DM information and MEP 501.The NNI 2 of the DMM 1 arrival DEV-2
Afterwards, DEV-2 is configured according to SLA operation, may include t1, t2 and t3 in the DMM 2 by 2 loopback DMM 2 of NNI, wherein t2 is
NNI 2 receives the time of DMM 1, and t3 is the time that NNI 2 sends DDM 2.MEP 501 on DEV-1 is received in time t4
After DMM 2, the two-way ETH-DM time delay between MEP 501 and MEP 502: T1=t4-t1 can be calculated according to t1 and t4.
That is, the measurement result of 1 operation of SLA is T1.
Step 302: according to the latency measurement frame for being sent to DEV-4 from DEV-3, measurement is obtained between DEV-3 and DEV-4
2nd EVC point-to-point time delay T2.More specifically, measured obtained T2 is the NNI 4 on UNI 3 to DEV-4 on DEV-3
Two-way time delay.
In the step, after 2 job initiation of SLA, MEP 304 of the MEP 303 on DEV-4 on DEV-2 sends DMM 3,
The time t5 of the DMM 3 is sent in the DMM comprising ETH-DM information and MEP 303.The NNI 4 of the DMM 3 arrival DEV-4
Afterwards, DEV-4 is configured according to SLA operation, may include t5, t6 and t7 in the DMM 4 by 4 loopback DMM 4 of NNI, wherein t5 is
NNI 4 receives the time of DMM 3, and t3 is the time that NNI 4 sends DDM 4.MEP 303 on DEV-3 is received in time t8
After DMM 4, the two-way ETH-DM time delay between MEP 303 and MEP 304: T2=t8-t5 can be calculated according to t5 and t8.
That is, the measurement result of 2 operation of SLA is T2.
Step 303: according to above-mentioned T1 and T2, determining EVC point-to-point time delay correction value.
Specifically, it may be determined that go out the EVC point-to-point time delay correction value between two nodes.The two nodes can be
First node and second node are stated, other two test-purpose sections as the increased switching equipment of test-purpose are also possible to
Point.The time delay correction value is for being modified delay measurements, to improve latency measurement accuracy.
Specifically, shorter in the cable and fiber lengths for considering to use, in the negligible situation of propagation delay time, according to
Above-mentioned T1 and T2 a UNI time delay of calculated switching equipment may be expressed as:
EVC point-to-point time delay correction value between two nodes may be expressed as:
Wherein, N is the quantity of the switching equipment connected between two nodes.For example, for above-mentioned first node and second
For node, due to being connected to 4 interchangers between the two nodes, then the EVC point-to-point time delay between the two nodes is repaired
Positive value may be expressed as:
Δ T=4 × x=T1-2 × T2 ... ... ... ... (3)
In above-mentioned process shown in Fig. 3, the execution sequence of step 301 and step 302 is not strict with.
It is subsequent when carrying out business transmission, can be according to the EVC point-to-point time delay correction value that above-mentioned formula 2 is calculated, to
Two-way delay measurements between one node and second node are modified, and following formula such as specifically can be used and be modified:
T1 '=T1+4x ... ... ... ... ... (4)
Certainly, the EVC point-to-point delay measurements on EVC between any two node can also be modified, to improve
Latency measurement precision.
For example, including node A and node B on EVC, M are connected between node A and node B, and (M is whole more than or equal to 4
Number) interchanger, the computational accuracy of a UNI time delay in system testing can be further improved in the increase of M number herein, but
It is that will increase testing cost, typical M is set as 4.In the exchange that the node A interchanger connected and node B are connected
The maintenance domain of same levels is configured on machine, and configures the MEP in affiliated maintenance domain on the uni port of the two interchangers, is based on
Above-mentioned configuration measures the two-way time delay of EVC point-to-point between node A and node B, obtains measured value T.Further, root
According to the interchanger quantity M connected between node A and node B an and interchanger UNI time delay x, according to the following formula to above-mentioned measurement
Value T is modified:
T '=T+M × x ... ... ... ... ... (5)
Further, it is contemplated that measurement process may introduce error, in the embodiment of the present invention, after obtaining UNI time delay,
Error correction can be also carried out to the UNI time delay, such as on the basis of the UNI time delay that measurement obtains, by the UNI time delay and one
Error amount is added (value of the error amount, which may be positive, to be negative), and then can carry out error to time delay correction value
Amendment.
Wherein, which can be empirically determined, be also possible to be obtained according to emulation testing.As one
Example, a kind of method determining the error amount according to emulation testing are:
Tester can be separately connected on first node and second node.Tester, which can be selected, has transmitting-receiving ethernet frame
And count the tester of transmitting-receiving time delay function.The service message of a length of L of particular frame is sent by the tester, transmission bandwidth is less than
The total bandwidth of EVC can not generate congestion in this way.The length of the latency measurement frame of the SLA 1 and SLA2 of configuration is also L.Record is surveyed
The test result T2 for trying the test result T1, SLA 2 of the One Way Delay T3 and SLA 1 of instrument statistics calculates x by formula 1
The x value of calculating is substituted into formula 9, verifies its accuracy, the error after carrying out time delay amendment for T1, with actual value T3 × 2 by value
It is as follows:
Δ=[(T1+4x)/2-T3]/T3 ... ... ... ... ... (6)
The principle of above-mentioned time-delay measuring method shown in Fig. 3 is as described below:
In the embodiment of the present invention, the time delay that an Ethernet service message passes through an equipment is logically splitted into two
Point: the time delay of the part UNI is x, and the time delay of the part NNI is y, as shown in Figure 4.Wherein, in time delay provided in an embodiment of the present invention
In measurement method, it can not have to consider exchange chip media access control (Media Access Control, abbreviation MAC) layer
Time delay caused by (such as MAC relay entity, MAC relay entity) be attributed to x part or be attributed to the part y because
If belonging to the part y, it can be balanced out by formula below, if belonging to the part x, when influencing to be embodied in final
Prolong in correction value.
Based on above-mentioned fractionation, the value of T1 and T2 can be as follows respectively:
T1=(y+x+y+y+x+y) × 2=8y+4x ... ... ... (7)
T2=(y+y) × 2=4y ... ... ... ... ... ... (8)
According to the definition of MEF10.2, the EVC point-to-point One Way Delay from UNI1 to UNI2 is T3, and value is as follows:
T3=x+y+x+y+y+x+y+x=4y+4x ... ... ... ... (9)
T3 and T1 is compared, T1 is two-way time delay, and T3 is One Way Delay, and wherein error is as follows:
T3 × 2=8y+8x=T1+4x ... ... ... ... ... ... (10)
As formula 10 it is found that two-way time delay measured by 1 operation of SLA lacks 4 x than 2 times of practical One Way Delay.
The value of x can be obtained in convolution 7 and formula 8, as shown below:
By above-mentioned formula 11, the relationship between x and measurement result value T1, T2 can be derived, it can realize and utilize two
The time delay value that SLA operation obtains calculates UNI time delay, using the UNI time delay value as the amendment between first node and second node
The calculating parameter of value, thus the EVC point-to-point time delay correction value being calculated between first node and second node, and then to this two
EVC point-to-point delay measurements between a node are modified, and obtain practical two-way time delay value.
Further, it is contemplated that switching equipment generallys use store-and-forward mechanism, and UNI mouthfuls of time delay size is with frame length L's
Change and change, correspondingly, above-mentioned time delay correction value also changes with the change of frame length L.
Based on this, in some embodiments of the invention, can take frame length L respectively is N number of value (N is the integer greater than 1),
According to previous embodiment, the measurement of SLA 1 is carried out for every kind of frame length and SLA 2 is measured, surveyed according to the measurement of SLA 1 and SLA 2
Amount result calculates time delay correction value corresponding to the frame length.Wherein, the value of N can be 64 bytes between 9600 bytes
Discrete value or successive value.When it is implemented, the value of the N kind frame length can be determined according to the frame length needed for practical business.
Since time delay correction value is come out based on UNI time-delay calculation, further, it is determined that N kind frame length institute is right
After the UNI time delay answered, can also the UNI time delay according to corresponding to this N kind frame length, obtain UNI time lag curve, further
Ground, according to the time delay correction value curve between available two nodes of UNI time lag curve.For example, every carry out one-shot measurement, it can
The data of one group of UNI time delay value and frame length L value are obtained, pair of frame length Yu UNI time delay can be obtained according to this corresponding relationship in this way
Answer relation curve.It is x value measured under L1, L2 and L3: x1, x2 and x3, Yi Jigen that Fig. 5, which shows latency measurement frame frame length,
According to this 3 groups of x values and the obtained L-x corresponding relationship curve of L value.
Further, when can determine UNI corresponding to the frame length except this N kind frame length according to the UNI time lag curve
Prolong.For example, as shown in figure 5, L1 and L2 is two discrete values, in this case, can according to the L1 and L2 corresponding x1 of institute and
X2 determines the slope between A point and B point, according to the slope, when determining UNI corresponding to the frame length of L1 and L2 between the two
Prolong value, and then time delay correction value can be determined according to the UNI time delay value.Certainly, according to identical principle, can also according to when
Prolong correction value curve and determines time delay correction value corresponding to frame length except this N kind frame length.
Further, it is contemplated that measurement process may introduce error, in the embodiment of the present invention, after obtaining UNI time delay,
Can also error correction be carried out to the UNI time delay value, and then time delay correction value can be calculated according to revised UNI time delay value.
For example on the basis of the UNI time delay that measurement obtains, which is added (error amount with an error amount
Value, which may be positive, to be negative).Wherein, which can be empirically determined, be also possible to be surveyed according to emulation
What examination obtained.
As an example, a kind of method determining the error amount according to emulation testing is:
Tester can be separately connected on first node and second node.Tester, which can be selected, has transmitting-receiving ethernet frame
And count the tester of transmitting-receiving time delay function.The service message of a length of L of particular frame is sent by the tester, transmission bandwidth is less than
The total bandwidth of EVC can not generate congestion in this way.The length of the latency measurement frame of the SLA 1 and SLA2 of configuration is also L.Record is surveyed
The test result T2 for trying the test result T1, SLA 2 of the One Way Delay T3 and SLA 1 of instrument statistics calculates x by formula 1
The x value of calculating is substituted into formula 9, verifies its accuracy by value, after carrying out time delay amendment for T1, is calculated and actual value T3 × 2
Error delta.In the corresponding Δ of all frame lengths, Δ max is maximized as missing to the corresponding time delay correction value of any frame length
The modified error correction values of difference.
By above description as can be seen that in the above embodiment of the present invention, first node and second node on EVC it
Between be connected with switching equipment, in the switching equipment connected include at least first to fourth switching equipment, carry out latency measurement
When, according to the latency measurement frame for being sent to the second switching equipment from the first switching equipment, measurement obtains the first switching equipment and the
The first EVC point-to-point time delay between two switching equipment；According to the time delay for being sent to the 4th switching equipment from third switching equipment
Frame is measured, measurement obtains the 2nd EVC point-to-point time delay between third switching equipment and the 4th switching equipment；According to described first
EVC point-to-point time delay and the 2nd EVC point-to-point time delay determine EVC point-to-point time delay correction value.Due in different exchanges
Two-stage EVC point-to-point latency measurement is used between equipment, therefore can be according to two-stage EVC point-to-point latency measurement obtained first
EVC point-to-point time delay and the 2nd EVC point-to-point time delay calculate EVC point-to-point time delay correction value, so that the time delay correction value introduces
The UNI time delay of switching equipment, EVC point-to-point time delay correction value can be used to be modified delay measurements, so with it is existing
Have and do not consider that UNI mouthfuls of time delays are compared in technology, improves the accuracy of latency measurement.
Need to illustrate is upper, and above embodiments are to be connected with 4 switching equipment between first node and second node and be
Example description, the embodiment of the present application is not limited to that the switching equipment quantity between first node and second node, only
To be more than 4 switching equipment, above-mentioned principle can also be used and determine switching equipment UNI time delay, and then determine that EVC point-to-point time delay is repaired
Positive value.
Embodiment for a clearer understanding of the present invention carries out the embodiment of the present invention below with reference to concrete application scene detailed
Thin description.
In the latency measurement preparation stage: preparing two testers (tester 1 and tester 2), 4 gigabit switch, 5 pairs
The optical fiber and gigabit optical module of 1m long.The Tester-1 mouth of tester 1 optical fiber is connected with the UNI1 of interchanger DEV-1 mouth；It hands over
The NNI1 mouth of DEV-1 of changing planes is connected with optical fiber with the UNI3 of interchanger DEV-3；The NNI3 mouth of interchanger DEV-3 optical fiber and friendship
Change planes DEV-4 NNI4 mouth be connected；The UNI4 mouth of interchanger DEV-4 is connected with the NNI2 of interchanger 2DEV-2 mouth with optical fiber；It hands over
The UNI2 mouth of 2DEV-2 of changing planes is connected with optical fiber with the Tester-2 of tester 2 mouth, and composition is shown in Fig. 2 to open up benefit.
In latency measurement configuration phase: the UP MEP of configuring maintenance domain grade level 5 on the UNI1 of interchanger DEV-1
501, the UP MEP 502 of level 5 is configured on the UNI2 of interchanger DEV-2, is configured on the UNI3 of interchanger DEV-3
The UP MEP 303 of level 3 configures the UP MEP 304 of level 3 on the UNI4 of interchanger DEV-4.Match on DEV-1
The SLA operation (SLA 1) that MEP 502 on DEV-2 is directed toward from MEP 501 is set and initiates, configuration concurrency rises from MEP on DEV-3
303 are directed toward the SLA operation (SLA2) of MEP 304 on DEV-4.SLA operation trials content be two-way time delay and shake, sending
Test protocol message is DMM, and the frame length of protocol massages is configured to 64bytes (byte).
In the latency measurement stage: it is 64 bytes, the business of rate 100Mbps that the Tester-1 mouth of tester 1, which sends frame length L,
Message, DEV-1 and DEV-3 dispatch SLA 1 and SLA 2 respectively.It checks the delay statistics of tester, records T3 value；Check SLA 1
With the test result of SLA 2: T1 and T2 value.According to x value corresponding to the 64 byte frame lengths of calculating of formula 1, x=(T1-2 × T2)/4；
X value is substituted into formula 4, calculates error delta=[(T1+4x)/2-T3]/T3.
Modification service message frame length L be respectively 128bytes, 256bytes, 512bytes, 1024bytes,
1280bytes、1518bytes、2048bytes、3072bytes、4096bytes、5120bytes、6144bytes、
7168bytes, 8192bytes, 9216bytes, 9600bytes modify frame length and the corresponding business of SLA protocol massages DMM
Message frame length is equal, is repeated in above-mentioned latency measurement process (the above-mentioned latency measurement stage is shown in concrete operations), measures and calculate
Maximum Δ value, is denoted as Δ max by each corresponding x value of typical case's frame length and Δ value out.
In time delay measures output stage: using frame length L as abscissa, x value be ordinate, each typical case frame length L with
Its corresponding x value is drawn as scatter plot, is connected between adjacent two o'clock with line, can measure according to the method for the embodiment of the present invention multiple
The slope value between each frame length and x value is obtained after the data of frame length.In practical application, numerical value is acquired by test of many times, it can
To find out that entire figure is substantially linear.Calculate the slope k of line between every two point.Discrete adjacent of available every two
Approximate x value corresponding to any one frame length between frame length.
For typical frame length, x is measured value, and the x of 64bytes frame length is denoted as x1, and the x of 128bytes frame length is denoted as x2,
And so on, the x of 9600bytes frame length is denoted as x16.Slope between x1 and x2 is denoted as k1, and so on, x15 and x16 it
Between slope be denoted as k15.
For section frame length, x is calculated value, if the UNI time delay of the section 65-127 frame length is x=x1+k1* (L-64), according to
Secondary to analogize, the UNI time delay of the section 9217-9599 frame length is x=x15+k15* (L-9216).
In this way, just obtain the UNI mouth time delay of all frame lengths between 64-9600, and then when being obtained according to UNI mouthfuls of time-delay calculations
Prolong correction value.Description according to an embodiment of the present invention is as can be seen that be usually integral multiple between UNI mouthfuls of time delays and time delay correction value
Relationship (i.e. the latter be the former integral multiple).
The stage is corrected in time delay: when the frame length of DMM takes different value, being modified in actual test result, for example, can
The time delay value measured is modified with formula 2, and provides estimation error range ± Δ max.
Based on the same technical idea, the embodiment of the invention also provides a kind of latency measurement devices.
It is the structural schematic diagram of latency measurement device provided in an embodiment of the present invention referring to Fig. 6.The device can be realized aforementioned
The latency measurement process that embodiment provides.As shown, the device can include: first, which obtains module 601, second, obtains module
602, determining module 603 further may also include correction module 604, in which:
First obtains module 601, for obtaining the first EVC point-to-point between the first switching equipment and the second switching equipment
Time delay, the first EVC point-to-point time delay are according to the latency measurement frame for being sent to the second switching equipment from the first switching equipment
What measurement obtained；
Second obtains module 602, for obtaining the 2nd EVC point-to-point between third switching equipment and the 4th switching equipment
Time delay, the 2nd EVC point-to-point time delay are according to the latency measurement frame for being sent to the 4th switching equipment from third switching equipment
What measurement obtained；
Determining module 603, for determining according to the first EVC point-to-point time delay and the 2nd EVC point-to-point time delay
EVC point-to-point time delay correction value.
Optionally, the first EVC point-to-point time delay that the first acquisition module 601 is got obtains in the following manner:
Respectively according to the latency measurement frame for the N kind different length for being sent to the second switching equipment from the first switching equipment, measurement obtains N kind
First EVC point-to-point time delay corresponding to every kind of frame length in frame length, wherein N is the integer greater than 1.Second obtains module
602 the 2nd EVC point-to-point time delays got obtain in the following manner: basis is sent to from third switching equipment respectively
The latency measurement frame of the N kind different length of 4th switching equipment, measurement obtain in N kind frame length corresponding to every kind of frame length
The 2nd EVC point-to-point time delay.Determining module 603 can be specifically used for: respectively first according to corresponding to the N kind frame length
EVC point-to-point time delay and the 2nd EVC point-to-point time delay, determine EVC point-to-point time delay correction value corresponding to this kind of frame length.
Optionally it is determined that module 603 can also be used in: determining that EVC point-to-point time delay corresponding to the N kind frame length is corrected
After value, according to EVC point-to-point time delay correction value corresponding to the N kind frame length, it is bent to obtain EVC point-to-point time delay correction value
Line；EVC point corresponding to the frame length determined except the N kind frame length according to the EVC point-to-point time delay correction value curve
To a time delay correction value.
Optionally, correction module 604 can be used for according to the switching equipment quantity and the quilt connected between tested node
The EVC point-to-point time delay correction value between node is surveyed, the EVC point-to-point delay measurements of the tested node are modified,
Obtain the EVC point-to-point time delay between the revised tested node.
Optionally it is determined that module 604 can be specifically used for: according to following formula, determine EVC point-to-point time delay correction value:
Wherein, Δ T is the EVC point-to-point time delay correction value between tested node, is connected between the N tested node
The quantity of switching equipment, x is user=network interface UNI time delay of a switching equipment, when T1 is the first EVC point-to-point
Prolong, T2 is the 2nd EVC point-to-point time delay；Wherein, T1 and T2 is the two-way time delay of EVC point-to-point.
In conclusion the embodiment of the present invention is safeguarded that domain makes the difference and is calculated the time delay of the specific frame length of certain chip and repair by nested
Positive value, then time delay amendment is carried out with test result of the formula to SLA, former delay measurements are substituted with revised result, are made double
The definition for more meeting MEF10.2 to time delay, the practical time delay error with service message reduce.It is obtained using the embodiment of the present invention
Time delay correction value is additivity amendment, is not the amendment of multiplying property, will not influence the test result of shake (jitter).The embodiment of the present invention
The method of offer is suitable for not supporting to extract the chip of UNI mouthful of MAC layer clock information, and only amendment delay testing is as a result, not shadow
Ring bottom layer realization.
The present invention be referring to according to the method for the embodiment of the present invention, the process of equipment (system) and computer program product
Figure and/or block diagram describe.It should be understood that every one stream in flowchart and/or the block diagram can be realized by computer program instructions
The combination of process and/or box in journey and/or box and flowchart and/or the block diagram.It can provide these computer programs
Instruct the processor of general purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices to produce
A raw machine, so that being generated by the instruction that computer or the processor of other programmable data processing devices execute for real
The device for the function of being specified in present one or more flows of the flowchart and/or one or more blocks of the block diagram.
These computer program instructions, which may also be stored in, is able to guide computer or other programmable data processing devices with spy
Determine in the computer-readable memory that mode works, so that it includes referring to that instruction stored in the computer readable memory, which generates,
Enable the manufacture of device, the command device realize in one box of one or more flows of the flowchart and/or block diagram or
The function of being specified in multiple boxes.
These computer program instructions also can be loaded onto a computer or other programmable data processing device, so that counting
Series of operation steps are executed on calculation machine or other programmable devices to generate computer implemented processing, thus in computer or
The instruction executed on other programmable devices is provided for realizing in one or more flows of the flowchart and/or block diagram one
The step of function of being specified in a box or multiple boxes.
Although preferred embodiments of the present invention have been described, it is created once a person skilled in the art knows basic
Property concept, then additional changes and modifications may be made to these embodiments.So it includes excellent that the following claims are intended to be interpreted as
It selects embodiment and falls into all change and modification of the scope of the invention.
Obviously, various changes and modifications can be made to the invention without departing from essence of the invention by those skilled in the art
Mind and range.In this way, if these modifications and changes of the present invention belongs to the range of the claims in the present invention and its equivalent technologies
Within, then the present invention is also intended to include these modifications and variations.
Claims (9)
1. a kind of time-delay measuring method, applied to include first node and second node Ethernet virtual connections EVC in, feature
It is, is connected with switching equipment between the first node and second node, the is included at least in the switching equipment connected
One to the 4th switching equipment, third switching equipment and the 4th switching equipment be located at the first switching equipment and the second switching equipment it
Between, which comprises
According to the latency measurement frame for being sent to the second switching equipment from the first switching equipment, measurement obtains the first switching equipment and the
The first EVC point-to-point time delay between two switching equipment；
According to the latency measurement frame for being sent to the 4th switching equipment from third switching equipment, measurement obtains third switching equipment and the
The 2nd EVC point-to-point time delay between four switching equipment；
According to the first EVC point-to-point time delay and the 2nd EVC point-to-point time delay, according to following formula, determine that EVC point arrives
Point time delay correction value:
Wherein, Δ T is the EVC point-to-point time delay correction value between tested node, the exchange that N is connected between the tested node
The quantity of equipment, x are the UNI time delay of a switching equipment, and T1 is the first EVC point-to-point time delay, and T2 is the 2nd EVC
Point-to-point time delay；Wherein, T1 and T2 is the two-way time delay of EVC point-to-point.
2. the method as described in claim 1, which is characterized in that the user-network interface UNI of first switching equipment and
The maintenance boundary point MEP in the first estate maintenance domain, the first EVC point are each configured on the UNI of second switching equipment
It is the two-way time delay of EVC point-to-point between the MEP in described the first estate maintenance domain that measurement obtains to time delay；
The second grade maintenance domain is each configured on the UNI of the UNI of the third switching equipment and the 4th switching equipment
MEP, the 2nd EVC point-to-point time delay be measurement obtain second grade maintenance domain MEP between EVC point-to-point
Two-way time delay.
3. the method as described in claim 1, which is characterized in that be sent to the second switching equipment according to from the first switching equipment
Latency measurement frame, measurement obtain the first EVC point-to-point time delay, comprising:
Respectively according to the latency measurement frame for the N kind different length for being sent to the second switching equipment from the first switching equipment, measure
The first EVC point-to-point time delay corresponding to every kind of frame length into N kind frame length, wherein N is the integer greater than 1；
According to the latency measurement frame for being sent to the 4th switching equipment from third switching equipment, measurement obtains the 2nd EVC point and arrives
Point time delay, comprising:
Respectively according to the latency measurement frame for the N kind different length for being sent to the 4th switching equipment from third switching equipment, survey
Measure the 2nd EVC point-to-point time delay corresponding to every kind of frame length in N kind frame length；
According to the first EVC point-to-point time delay and the 2nd EVC point-to-point time delay, EVC point-to-point time delay correction value is determined,
Include:
The first EVC point-to-point time delay according to corresponding to the N kind frame length and the 2nd EVC point-to-point time delay respectively, determining should
EVC point-to-point time delay correction value corresponding to kind frame length.
4. method as claimed in claim 3, which is characterized in that determine EVC point-to-point time delay corresponding to the N kind frame length
After correction value, further includes:
According to EVC point-to-point time delay correction value corresponding to the N kind frame length, EVC point-to-point time delay correction value curve is obtained；
EVC point corresponding to the frame length determined except the N kind frame length according to the EVC point-to-point time delay correction value curve
To a time delay correction value.
5. the method as described in claim 1, which is characterized in that further include:
According to the EVC point-to-point time delay amendment between the switching equipment quantity and the tested node connected between tested node
Value, is modified the EVC point-to-point delay measurements of the tested node, obtains between the revised tested node
EVC point-to-point time delay.
6. a kind of latency measurement device, applied to include first node and second node Ethernet virtual connections EVC in, feature
It is, is connected with switching equipment between the first node and second node, the is included at least in the switching equipment connected
One to the 4th switching equipment, third switching equipment and the 4th switching equipment be located at the first switching equipment and the second switching equipment it
Between, described device includes:
First obtains module, for obtaining the first EVC point-to-point time delay between the first switching equipment and the second switching equipment, institute
Stating the first EVC point-to-point time delay is that basis is obtained from the latency measurement frame measurement that the first switching equipment is sent to the second switching equipment
's；
Second obtains module, for obtaining the 2nd EVC point-to-point time delay between third switching equipment and the 4th switching equipment, institute
Stating the 2nd EVC point-to-point time delay is that basis is obtained from the latency measurement frame measurement that third switching equipment is sent to the 4th switching equipment
's；
Determining module is used for according to the first EVC point-to-point time delay and the 2nd EVC point-to-point time delay, according to following public affairs
Formula determines EVC point-to-point time delay correction value:
Wherein, Δ T is the EVC point-to-point time delay correction value between tested node, the exchange that N is connected between the tested node
The quantity of equipment, x are the UNI time delay of a switching equipment, and T1 is the first EVC point-to-point time delay, and T2 is the 2nd EVC
Point-to-point time delay；Wherein, T1 and T2 is the two-way time delay of EVC point-to-point.
7. device as claimed in claim 6, which is characterized in that the first EVC point-to-point that the first acquisition module is got
Time delay obtains in the following manner: long according to the N kind difference for being sent to the second switching equipment from the first switching equipment respectively
The latency measurement frame of degree, measurement obtain the first EVC point-to-point time delay corresponding to every kind of frame length in N kind frame length, wherein N
For the integer greater than 1；
The 2nd EVC point-to-point time delay that gets of second acquisition module obtains in the following manner: respectively according to from
Third switching equipment is sent to the latency measurement frame of the N kind different length of the 4th switching equipment, and measurement obtains N kind frame length
In the 2nd EVC point-to-point time delay corresponding to every kind of frame length；
The determining module is specifically used for: the first EVC point-to-point time delay and second according to corresponding to the N kind frame length respectively
EVC point-to-point time delay determines EVC point-to-point time delay correction value corresponding to this kind of frame length.
8. device as claimed in claim 7, which is characterized in that the determining module is also used to:
After determining EVC point-to-point time delay correction value corresponding to the N kind frame length, according to corresponding to the N kind frame length
EVC point-to-point time delay correction value, obtain EVC point-to-point time delay correction value curve；
EVC point corresponding to the frame length determined except the N kind frame length according to the EVC point-to-point time delay correction value curve
To a time delay correction value.
9. device as claimed in claim 6, which is characterized in that further include:
Correction module, for according to the EVC being tested between the switching equipment quantity connected between node and the tested node
Point-to-point time delay correction value is modified the EVC point-to-point delay measurements of the tested node, obtains revised described
EVC point-to-point time delay between tested node.
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| CN108199913B (en) * | 2017-12-18 | 2020-10-20 | 瑞斯康达科技发展股份有限公司 | Method and equipment for realizing time delay test |
| CN109309544B (en) * | 2018-08-13 | 2020-05-12 | 烽火通信科技股份有限公司 | Method and system for improving timestamp precision in time delay measurement |
| CN110858811B (en) | 2018-08-24 | 2022-01-18 | 华为技术有限公司 | Method for measuring time delay and network equipment |
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