CN105957819A - Diode braiding appearance inspection tool and method thereof - Google Patents
Diode braiding appearance inspection tool and method thereof Download PDFInfo
- Publication number
- CN105957819A CN105957819A CN201610500603.7A CN201610500603A CN105957819A CN 105957819 A CN105957819 A CN 105957819A CN 201610500603 A CN201610500603 A CN 201610500603A CN 105957819 A CN105957819 A CN 105957819A
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- China
- Prior art keywords
- diode
- braid
- dashpot
- gathering sill
- pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
- H01L22/26—Acting in response to an ongoing measurement without interruption of processing, e.g. endpoint detection, in-situ thickness measurement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to the field of diode production, in particular to a diode braiding appearance inspection tool. The diode braiding appearance inspection tool comprises a flat plate, wherein slope surfaces are designed on two sides of the upper part of the flat plate respectively; a guide groove is formed in the flat plate; an auxiliary guide groove is formed in the bottom of the middle of the guide groove; a first buffer groove is formed in one side of the middle of the guide groove; a second buffer groove is formed in one side of the middle of the auxiliary guide groove; and the first buffer groove and the second buffer groove are designed in parallel side by side. The diode braiding appearance inspection tool has the advantages of simple and smart design and use convenience, diodes are prevented from wearing out during inspection due to the structural design of the diode braiding appearance inspection tool, and the diodes are also extremely quick to change, so that the work efficiency is greatly improved.
Description
Technical field
The present invention relates to diode production field, be specifically related to a kind of diode braid appearance test frock and method thereof.
Background technology
During diode braid appearance test in the past, the most rationally auxiliary detection instrument, checks the most on the table,
Inspection, slides to opposite side braid from workbench side, and diode slips over from desktop, and diode has abrasion, above print
Word can be ground unclear, uses the later stage and brings very big inconvenience, and it is the most very inconvenient to change the best diode.
Summary of the invention
In order to solve the problems referred to above, the present invention proposes a kind of diode braid appearance test frock and method thereof, design
The most ingenious, easy to use, it is to avoid wear and tear during inspection diode, and it is the most quick to change diode.
In order to reach foregoing invention purpose, the present invention proposes techniques below scheme:
A kind of diode braid appearance test frock, it includes flat board, and washer both sides are respectively designed with slope, on flat board
Face is designed with gathering sill, and gathering sill central bottom has side in the middle of auxiliary gathering sill, gathering sill and has the first dashpot, auxiliary
In the middle of gathering sill, side has the second dashpot, the first dashpot and the design of the second dashpot side by side parallel.
Described diode braid appearance test frock entirety uses plastics integral production to form.
Described auxiliary gathering sill end positions is respectively designed to horn-like port.
The first described dashpot is half oval shape groove.
The second described dashpot is half oval shape groove.
A kind of diode braid appearance test method, is characterized in particular in following steps,
1) first diode braid horizontally enters in gathering sill from the flat board side of diode braid appearance test frock, diode
The chip of plastic packaging be positioned at middle auxiliary gathering sill, diode pin is supported on gathering sill bottom surface,
2) each diode in gathering sill is checked, find the best the taking out from braid of diode appearance, more renew
Diode,
3) take out the diode that outward appearance is the best, the best diode is moved on to the first dashpot and the second dashpot position, manually
Diode is moved up, and braid entirety remains stationary as, and the pin on the upside of diode moves in the first dashpot, plastic packaging simultaneously
Chip move in the second dashpot, the pin on the downside of diode just takes out from braid, and then diode is the most overall
Moving down, diode upper end pin just takes out from braid, and such diode entirety is taken out,
4) diode more renewed, braid entirety remains stationary as, and new diode upper end pin is inserted in braid, then two pole
Pipe moves on the whole, and on the upside of diode, pin moves to the first dashpot, the chip of plastic packaging moves to the second dashpot simultaneously
In, the pin on the downside of diode is just directed at braid, and diode entirety moves down, and the pin on the downside of diode is inserted in braid, more
Change.
It is an advantage of the invention that design is the most ingenious, easy to use, the design of diode braid appearance test tool structure keeps away
Inspection-free abrasion diode when testing, and it is the most quick to change diode, substantially increases work efficiency.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of the present invention.
Fig. 2 is the centre position sectional view of the present invention.
Detailed description of the invention
1-2 referring to the drawings, a kind of diode braid appearance test frock, it includes that flat board 1, washer both sides set respectively
In respect of slope 2, being designed with gathering sill 3 above flat board 1, gathering sill 3 central bottom has auxiliary gathering sill 4, in the middle of gathering sill 3
Side has the first dashpot 5, and the auxiliary middle side of gathering sill 4 has the second dashpot 6, the first dashpot 5 and the second buffering
Groove 6 side by side parallel designs.Both sides design slope, prevents from scratching diode, prevents from injuring human body especially, safe and reliable.
Described diode braid appearance test frock entirety uses plastics integral production to form.Use plastic material, system
Make low cost, light.
Described auxiliary gathering sill 4 end positions is respectively designed to horn-like port 7.Avoid port position abrasion diode
Lettering in plastic packaging outer package.
The first described dashpot is half oval shape groove.
The second described dashpot is half oval shape groove.
A kind of diode braid appearance test method, is characterized in particular in following steps,
1) first diode braid horizontally enters in gathering sill from the flat board side of diode braid appearance test frock, diode
The chip of plastic packaging be positioned at middle auxiliary gathering sill, diode pin is supported on gathering sill bottom surface,
2) each diode in gathering sill is checked, find the best the taking out from braid of diode appearance, more renew
Diode,
3) take out the diode that outward appearance is the best, the best diode is moved on to the first dashpot and the second dashpot position, manually
Diode is moved up, and braid entirety remains stationary as, and the pin on the upside of diode moves in the first dashpot, plastic packaging simultaneously
Chip move in the second dashpot, the pin on the downside of diode just takes out from braid, and then diode is the most overall
Moving down, diode upper end pin just takes out from braid, and such diode entirety is taken out,
4) diode more renewed, braid entirety remains stationary as, and new diode upper end pin is inserted in braid, then two pole
Pipe moves on the whole, and on the upside of diode, pin moves to the first dashpot, the chip of plastic packaging moves to the second dashpot simultaneously
In, the pin on the downside of diode is just directed at braid, and diode entirety moves down, and the pin on the downside of diode is inserted in braid, more
Change.
Claims (6)
1. a diode braid appearance test frock, it is characterised in that it includes that flat board, washer both sides are respectively designed with
Slope, washer is designed with gathering sill, and gathering sill central bottom has an auxiliary gathering sill, and in the middle of gathering sill, side has the
One dashpot, in the middle of auxiliary gathering sill, side has the second dashpot, the first dashpot and the design of the second dashpot side by side parallel.
Diode braid appearance test frock the most according to claim 1, it is characterised in that outside described diode braid
Seeing inspection frock entirety uses plastics integral production to form.
Diode braid appearance test frock the most according to claim 1, it is characterised in that described auxiliary gathering sill two
End position is respectively designed to horn-like port.
Diode braid appearance test frock the most according to claim 1, it is characterised in that the first described dashpot is
Half oval shape groove.
Diode braid appearance test frock the most according to claim 1, it is characterised in that the second described dashpot is
Half oval shape groove.
6. a diode braid appearance test method, is characterized in particular in following steps,
First diode braid horizontally enters in gathering sill from the flat board side of diode braid appearance test frock, diode
The chip of plastic packaging is positioned at middle auxiliary gathering sill, and diode pin is supported on gathering sill bottom surface,
Each diode in gathering sill is checked, finds the best the taking out from braid of diode appearance, more renew
Diode,
Take out the diode that outward appearance is the best, the best diode is moved on to the first dashpot and the second dashpot position, manually handle
Diode moves up, and braid entirety remains stationary as, the pin on the upside of diode moves in the first dashpot, simultaneously plastic packaging
Chip moves in the second dashpot, and the pin on the downside of diode just takes out from braid, then diode more overall to
Lower movement, diode upper end pin just takes out from braid, and such diode entirety is taken out,
The diode more renewed, braid entirety remains stationary as, and new diode upper end pin is inserted in braid, then diode
Move on the whole, on the upside of diode, pin moves to the first dashpot, in the chip of plastic packaging moves to the second dashpot simultaneously,
Pin on the downside of diode is just directed at braid, and diode entirety moves down, and the pin on the downside of diode is inserted in braid, has changed
Become.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610500603.7A CN105957819B (en) | 2016-06-30 | 2016-06-30 | Diode braid appearance test tooling and its method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610500603.7A CN105957819B (en) | 2016-06-30 | 2016-06-30 | Diode braid appearance test tooling and its method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105957819A true CN105957819A (en) | 2016-09-21 |
| CN105957819B CN105957819B (en) | 2018-11-16 |
Family
ID=56902046
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610500603.7A Active CN105957819B (en) | 2016-06-30 | 2016-06-30 | Diode braid appearance test tooling and its method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105957819B (en) |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0963730A (en) * | 1995-08-30 | 1997-03-07 | Nec Corp | Ic socket |
| JPH11199041A (en) * | 1998-01-14 | 1999-07-27 | Advanced Display Inc | Storing shed and storing method |
| JP2000124271A (en) * | 1998-10-15 | 2000-04-28 | Sony Corp | Defect inspection apparatus |
| CN200983370Y (en) * | 2006-11-29 | 2007-11-28 | 佛山市国星光电科技有限公司 | Package structure of LED special for side in back light source |
| CN201583561U (en) * | 2009-12-31 | 2010-09-15 | 郑晓明 | Measuring clamp of side surface pin LED |
| CN202093132U (en) * | 2011-05-31 | 2011-12-28 | 常州佳讯光电产业发展有限公司 | Wearproof lettering manual fast brushing and detecting device |
| CN103476236A (en) * | 2012-09-06 | 2013-12-25 | 上野精机株式会社 | Braid strip unit and electric component detection apparatus |
| CN104908998A (en) * | 2015-04-14 | 2015-09-16 | 中山市智牛电子有限公司 | Guide method for electronic elements connected in belt shape |
| CN105606993A (en) * | 2016-03-02 | 2016-05-25 | 太仓思比科微电子技术有限公司 | Hand-operated single-chip microcomputer chip testing device and operation method thereof |
-
2016
- 2016-06-30 CN CN201610500603.7A patent/CN105957819B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0963730A (en) * | 1995-08-30 | 1997-03-07 | Nec Corp | Ic socket |
| JPH11199041A (en) * | 1998-01-14 | 1999-07-27 | Advanced Display Inc | Storing shed and storing method |
| JP2000124271A (en) * | 1998-10-15 | 2000-04-28 | Sony Corp | Defect inspection apparatus |
| CN200983370Y (en) * | 2006-11-29 | 2007-11-28 | 佛山市国星光电科技有限公司 | Package structure of LED special for side in back light source |
| CN201583561U (en) * | 2009-12-31 | 2010-09-15 | 郑晓明 | Measuring clamp of side surface pin LED |
| CN202093132U (en) * | 2011-05-31 | 2011-12-28 | 常州佳讯光电产业发展有限公司 | Wearproof lettering manual fast brushing and detecting device |
| CN103476236A (en) * | 2012-09-06 | 2013-12-25 | 上野精机株式会社 | Braid strip unit and electric component detection apparatus |
| CN104908998A (en) * | 2015-04-14 | 2015-09-16 | 中山市智牛电子有限公司 | Guide method for electronic elements connected in belt shape |
| CN105606993A (en) * | 2016-03-02 | 2016-05-25 | 太仓思比科微电子技术有限公司 | Hand-operated single-chip microcomputer chip testing device and operation method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105957819B (en) | 2018-11-16 |
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