CN105955793B - Automatic chip code writing and reading equipment and chip code writing and reading method - Google Patents
Automatic chip code writing and reading equipment and chip code writing and reading method Download PDFInfo
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- CN105955793B CN105955793B CN201610502306.6A CN201610502306A CN105955793B CN 105955793 B CN105955793 B CN 105955793B CN 201610502306 A CN201610502306 A CN 201610502306A CN 105955793 B CN105955793 B CN 105955793B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/44—Arrangements for executing specific programs
- G06F9/445—Program loading or initiating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Abstract
The invention relates to the technical field of printer consumables, in particular to automatic chip code writing and reading equipment and a chip code writing and reading method. Comprises a rack component, a feeding component and a code writing and reading component; the feeding assembly comprises a feeding tray capable of moving in a first direction of the rack assembly, and the code writing and reading assembly comprises a writing and reading wharf assembly capable of moving in a second direction of the rack assembly; the writing and reading wharf assembly comprises a functional main board, the functional main board comprises a printed circuit board, a main control circuit arranged on the printed circuit board and a plurality of probes arranged on the printed circuit board along the second direction, and the functional main board is used for writing and reading codes through the contact of the probes with writing and reading code contact points of code chips to be written and read placed in the feeding tray when the writing and reading wharf assembly moves relative to the feeding tray in the second direction; the main control circuit is provided with a probe interface module which is electrically connected with the probe. The structure of the code writing and reading equipment is simplified, and automatic code writing and reading tests on chips in batches are realized.
Description
Technical Field
The invention relates to the technical field of consumable materials of printers, in particular to automatic chip code writing and reading equipment and a chip code writing and reading method for writing, reading and testing a consumable chip.
Background
At present, equipment for writing, reading and testing consumable chips mainly comprises a single chip code writing and reading instrument, ten pieces of code writing and reading instruments and a hand-push type or pneumatic transmission fifty pieces of code writing and reading instrument.
Fifty-even writing and reading code instruments connect the needle plate with the main control board by using a flat cable, and the needle plate and the probe are connected in a winding mode and are in a separated layout mode. The main problems with this model are: the instrument installation and connection circuit are complex and the maintenance difficulty is high; the writing and reading test can result in unstable writing and is easy to generate data writing errors and test error random reports. In addition, although the fifty-one chips on the whole board can be written and read at a time by the hand-push type or pneumatic transmission code writing and reading instrument, the code writing and reading operation is divided into five steps, and each step completes the code writing and reading of ten chips. The hand-push type or pneumatic transmission fifty-one chip code writing and reading instrument is consistent with the packaging specification of a whole chip board with 50 chips on the whole chip board, and accords with the unification of production specifications, but adopts a mode of changing the chip placement position to achieve the code writing and reading purposes of all chips on the whole chip board. The operation flow and the system structure are complex, the working efficiency is not obviously improved, the requirement on the positioning accuracy is high, and the positioning errors among the steps are easy to cause accumulation and amplification.
Disclosure of Invention
The invention provides a chip automatic code writing and reading device for solving the technical problems, which comprises a rack assembly, a feeding assembly and a code writing and reading assembly; the feeding assembly comprises a feeding tray capable of moving in a first direction of the rack assembly, and the writing and reading code assembly comprises a writing and reading wharf assembly capable of moving in a second direction of the rack assembly; the method is characterized in that: the writing and reading wharf component comprises a functional main board, wherein the functional main board comprises a printed circuit board, a main control circuit arranged on the printed circuit board and a plurality of probes arranged on the printed circuit board along a second direction, and the probes are used for respectively contacting with writing and reading code contact points of code chips to be written and read placed in the feeding tray to write and read codes when the writing and reading wharf component moves relative to the feeding tray in the second direction; the main control circuit is provided with a probe interface module which is electrically connected with the probe.
The invention adopts a probe interface module to connect the probe and the main control circuit, and integrates the probe and the main control circuit on the same printed circuit board. The needle plate is omitted, so that the connection of the needle plate and the ports between the code writing and reading contact and between the main control circuit and the needle plate is omitted, the structure is clear, and the stability is greatly improved. The problems that the manufacturing and installation workload of the instrument is large, the module is complex, the maintenance is difficult and the like can be well solved, the code writing stability is improved, and the error rate is reduced.
Preferably, the master control circuit comprises a master control unit, a slave control unit and a storage module for storing write-read code data; the slave control unit is electrically connected with the main control unit, the storage module is electrically connected with the main control unit, the slave control unit is provided with a driving module, and the probe interface module is arranged between the driving module and the probe. The whole chip board and the position of the chip are not required to be changed, and the code writing and reading operations of all the chips to be written and read on the whole chip board can be completed through one-time operation.
Preferably, the slave control unit is provided with a test module, and the probe connection module is arranged between the test module and the probe. The test is carried out before and after the code writing and reading operation, so that the error rate of the code writing and reading operation is reduced, and the error check can be carried out when the code writing and reading operation is in error.
Preferably, the memory module includes an SD memory card connected to the main control unit through an SD card slot. The SD card is adopted to have data information needing to be written into the chip, the modular design provides convenience for equipment maintenance and upgrading, and the data upgrading efficiency and correctness are improved.
Preferably, the feeding assembly further comprises a feeding guide rail, a feeding cylinder controller and a first direction position sensor, wherein the feeding guide rail, the feeding cylinder controller and the first direction position sensor are arranged along a first direction; the feeding tray is connected with the feeding guide rail in a sliding mode, an output shaft of the feeding air cylinder is connected with the feeding tray, and the feeding air cylinder controller is electrically connected with the feeding air cylinder; the main control unit is provided with an interface module, the feeding cylinder controller is connected with the main control unit through the interface module, and the first direction position sensor is connected with the main control unit through the interface module. The code writing and reading assembly further comprises a code writing and reading guide rail, a code writing and reading cylinder controller and a second direction position sensor, wherein the code writing and reading guide rail, the code writing and reading cylinder controller and the second direction position sensor are arranged along a second direction; the writing and reading wharf assembly is arranged on the writing and reading guide rail in a sliding mode, an output shaft of the writing and reading air cylinder is connected to the writing and reading wharf assembly, the writing and reading air cylinder controller is electrically connected with the writing and reading air cylinder, the writing and reading air cylinder controller is connected with the main control unit through the interface module, and the second direction position sensor is connected with the main control unit through the interface module. The full automation of the whole chip code writing and reading process is realized, manual intervention is not needed, and the production efficiency is greatly improved. And, adopt the cylinder as drive arrangement, the probe can be adjusted as required with the contact force between the code contact of writing and reading of waiting to write and read the code chip to keep unanimous, avoid the contact force undersize can lead to the chip to write and read a yard contact failure, the contact force is too big to have the damage to the chip.
Preferably, the first direction position sensor is a photoelectric pair tube, and the second direction position sensor is a photoelectric pair tube. When the position is judged, the mechanical structure is not damaged, and the service life is long.
Preferably, the feeding tray comprises a chip whole board mounting groove for mounting a chip whole board, and the writing and reading wharf assembly comprises a functional main board mounting part for mounting the functional main board; the whole chip board mounting groove comprises a whole chip board limiting part, and the functional mainboard mounting part comprises a functional mainboard positioning part. The functional main board aiming at different whole chips can be replaced according to production requirements, so that the compatibility of equipment is improved, and the production cost is reduced.
Preferably, the code writing and reading assembly comprises a retest button arranged on the rack assembly, and the retest button is electrically connected with the main control unit and used for driving the code writing and reading assembly to rewrite codes through the main control unit.
Preferably, the code writing and reading assembly comprises a touch display screen arranged on the rack assembly, and the touch display screen is connected with the main control unit through the interface module.
The invention also provides a chip code writing and reading method, which is used for the chip automatic code writing and reading equipment, and the chip automatic code writing and reading equipment comprises a rack assembly, a feeding assembly and a code writing and reading assembly. The method is characterized by comprising the following steps:
a1 The feeding assembly drives the feeding tray to move from a first feeding tray position to a second feeding tray position in the first direction of the rack assembly
A2 The write-read code assembly drives the write-read dock assembly to move from a first write-read dock assembly position to a second write-read dock assembly position in a second direction of the rack assembly;
a3 The main control unit of the writing and reading wharf assembly writes and reads codes on a code chip to be written and read through each slave control unit; and each slave control unit feeds back the code writing and reading result of each code writing and reading chip to the master control unit, and the master control unit outputs the code writing and reading result.
When the feeding tray is located at the second feeding position and the writing and reading wharf component is located at the second writing and reading wharf component, the probes on the writing and reading code component are respectively in electric contact with the writing and reading code contacts of the to-be-written and reading code chip placed in the feeding tray.
The writing and reading code result at least comprises:
operation result information indicating whether the code writing and reading operation is successful;
and the error code information represents the operation of code writing and reading failure and error codes corresponding to error types encountered in the code writing and reading process. Showing whether the code writing and reading operations of each chip are successful or not, and indicating the error type when an error occurs.
Preferably, the code writing and reading operation includes:
a31 Testing before code writing, including chip circuit detection, equipment code writing function detection, and communication detection;
a32 Code table writing step, code table writing is performed on the chip.
Preferably, the code writing and reading operation includes:
a33 Code table reading step of detecting whether the code table written in step a 32) is correct.
Preferably, the code writing and reading operation includes:
a34 Post-code-writing test steps including chip-external device function detection, and communication detection.
The operation can reduce the error rate of the code writing and reading operation on one hand, and can quickly and accurately judge the error link when in error on the other hand.
Preferably, whether the feeding tray reaches a second feeding tray position is monitored through a first direction position sensor installed in the first direction; and monitoring whether the code writing and reading assembly reaches a second code writing and reading position through a second direction position sensor arranged in the second direction.
Preferably, the writing and reading code result further comprises: error type information, a specific error type corresponding to the error code. The specific information of the error code is displayed while the code is displayed, so that the error reason is more intuitive when being searched and analyzed.
Preferably, if in the step A3), the code writing and reading result of at least one chip to be written and read indicates that the code writing and reading operation fails, the retest step is performed:
b1 The write-read code assembly drives the write-read dock assembly to move from the second write-read dock assembly position to the first write-read dock assembly position in a second direction of the rack assembly;
b2 The write-read code assembly drives the write-read dock assembly to move from a first write-read dock assembly position to a second write-read dock assembly position in a second direction of the rack assembly;
b3 The master control unit of the writing and reading wharf assembly writes and reads codes of a code chip to be written and read through each slave control unit; and each slave control unit feeds back the code writing and reading result of each code writing and reading chip to the master control unit, and the master control unit outputs the code writing and reading result. The efficiency of writing and reading code operation can be improved, and the test correctness can be improved.
Preferably, the retesting step further comprises:
b4 The write-read code assembly drives the write-read dock assembly to move from the second write-read dock assembly position to the first write-read dock assembly position in a second direction of the rack assembly;
b5 The feed assembly drives the feed tray to move from the second feed tray position to the first feed tray position in the first direction of the frame assembly.
Preferably, if in the step A3), the code writing and reading results of all the code chips to be written and read indicate that the code writing and reading operations are successful, the following steps are continued:
a4 The write-read code assembly drives the write-read dock assembly to move from the second write-read dock assembly position to the first write-read dock assembly position in a second direction of the rack assembly;
a5 The feed assembly drives the feed tray to move from the second feed tray position to the first feed tray position in the first direction of the frame assembly.
Preferably, the feeding assembly drives the feeding tray to move in the first direction of the rack assembly through a feeding cylinder; and the code writing and reading assembly drives the code writing and reading wharf assembly to move in the second direction of the rack assembly through the code writing and reading cylinder.
Drawings
Fig. 1 is a first structural diagram of a chip code writing and reading device.
Fig. 2 is a schematic structural diagram of a chip code writing and reading device.
Fig. 3 is a third schematic structural diagram of a chip code writing and reading device.
Fig. 4 is a functional motherboard system diagram.
FIG. 5 is a flow chart of the write and read code streams.
Detailed Description
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings. Referring to fig. 1-3, an automatic code writing and reading device for chips includes a rack assembly, a feeding assembly, and a code writing and reading assembly.
The feeding assembly comprises a feeding tray 11, a feeding guide rail 12 arranged along the horizontal direction, a feeding cylinder 13, a feeding cylinder controller and a horizontal direction position sensor (photoelectric geminate transistor in the embodiment). The feeding tray 11 is connected with the feeding guide rail 12 in a sliding mode, an output shaft of the feeding air cylinder is connected with the feeding tray, and the feeding air cylinder controller is electrically connected with the feeding air cylinder. The feeding tray 11 includes a chip whole plate mounting groove 112 for mounting the chip whole plate 111, and the chip whole plate mounting groove 112 includes a chip whole plate stopper. The whole chip plate is provided with a chip to be written and read, the whole chip plate is arranged in the whole chip plate mounting groove 112 and is fixed through the whole chip plate limiting part, and the feeding tray 11 can move in the horizontal direction of the rack assembly with the whole chip plate 111.
The code writing and reading assembly comprises a writing and reading wharf assembly 21, a functional main board 211, a code writing and reading guide rail 212 arranged along the vertical direction, a code writing and reading cylinder 213, a code writing and reading cylinder controller, a vertical direction position sensor (in the embodiment, an optoelectronic pair tube), a retest button 215 arranged on the rack assembly, and a touch liquid crystal screen 216 arranged on the rack assembly. The reading and writing wharf assembly 21 is slidably arranged on the reading and writing code guide rail 212, an output shaft of the reading and writing code cylinder is connected to the reading and writing wharf assembly, and the reading and writing code cylinder controller is electrically connected with the reading and writing code cylinder. Write-read head assembly 21 includes a functional motherboard mount 214 for mounting functional motherboard 211. The functional motherboard mounting member includes a functional motherboard positioning portion. The functional main board corresponding to the whole chip board can be installed in the functional main installation part and fixed with the functional main board positioning part. So that the write-read dock assembly 21 can carry the functional motherboard 211 for movement in the vertical direction of the rack assembly.
As shown in fig. 4, the function board includes a printed circuit board, a main control circuit provided on the printed circuit board, and a plurality of probes 2111 provided on the printed circuit board in the vertical direction. The probes correspond to the code writing and reading contacts of all chips to be written and read on the whole chip board one by one. In this embodiment, the whole chip board is a chip having fifty codes to be written and read, and each chip having 9 code contacts to be written and read. The functional main board is integrated with 50 × 9=450 probes, and the probes correspond to the code writing and reading contacts of each code writing and reading chip on the whole chip board respectively. When the functional main board 211 moves toward the feeding tray 11 along with the writing and reading dock assembly 12 in the vertical direction, the functional main board 211 approaches toward the whole chip board and is respectively contacted with the writing and reading contacts of all the chips to be written and read placed in the feeding tray 11 through the probes.
The main control circuit comprises a main control unit, a slave control unit, a storage module for storing data of writing and reading codes, a power supply module, an interface module, a network port module and a probe interface module connected with a probe:
a main control unit: for core flow control, communication with slave control units, data processing, etc.
A probe interface module: is arranged between the slave control unit and the probe for connecting the probe. The port drive of each chip to be written and read is independent IO drive, that is, the whole chip adopts a parallel drive mode, and the probe interface package is consistent with the chip to be written and read.
The slave control unit: the probe interface module is arranged between the driving module and the probe and between the testing module and the probe. The five slave control units are electrically connected with the master control unit, and the master control unit and the slave control units are communicated by adopting a multi-machine serial port. The five slave control units respectively drive the ten code chips to be written and read through the driving module and the testing module, and the code chips to be written and read are subjected to code writing and reading tests.
A power supply module: receiving 15-24V DC power input, and converting into 5V power and 3.3V power output respectively. The 5V power supply is mainly used for supplying power to the touch liquid crystal display, and the 3.3V power supply is mainly used for supplying power to the main control circuit and other peripheral circuits.
A storage module: the SD memory card connected to the main control unit through the SD card slot is mainly used for storing code table data and code data required by the code chip to be written and read during code writing.
A network port module: the method is used for online updating with a subsequent server, and can realize the intelligent operation of a production line.
An interface module: the method comprises the following steps: the liquid crystal serial port module is used for connecting the touch liquid crystal screen and driving the touch liquid crystal screen to perform data interaction; the photoelectric switch interface input module is used for in-place signals of photoelectric pair tubes; and the completion signal output interface module is used for outputting a switching signal of a result to the feeding cylinder controller and the code writing and reading cylinder controller after the code writing is completed, and driving the cylinders to perform corresponding actions.
The retest button is electrically connected with the main control unit, and the code writing and reading component can be driven by the main control unit to rewrite and read codes of the chips on the whole chip board.
The feeding tray can move between a first feeding tray position and a second feeding tray position along a feeding guide rail arranged in the horizontal direction under the driving of the feeding air cylinder. The write-read wharf assembly can be driven by the write-read code cylinder to move between a first write-read wharf assembly position and a second write-read wharf assembly position along the write-read code guide rail arranged in the vertical direction. The second feeding tray is positioned right below the second writing and reading wharf assembly, the first writing and reading wharf assembly is positioned right above the second writing and reading wharf assembly, and the first feeding tray is positioned in front of the second feeding tray.
Before the equipment is not started, the feeding tray is located at the first feeding tray position, and the writing and reading wharf component is located at the first writing and reading wharf component position. And installing the whole chip plate loaded with the chip to be written and read in the feeding tray, and fixing the whole chip plate through a limiting piece of the whole chip plate. And then starting the equipment, and testing the code writing and reading of the chip on the whole chip board:
a1 The main control unit receives a starting signal of the equipment and outputs a signal to the gift-feeding cylinder controller, and the feed cylinder of the feed cylinder controller drives the feed tray loaded with the whole chip plate to move from the first feed tray position to the second feed tray position in the horizontal direction; when the photoelectric pair tube arranged on the feeding guide rail detects that the feeding tray reaches the position of a second feeding tray, a signal is output to the main control unit; the main control unit stops the feeding cylinder through the feeding cylinder controller, and simultaneously starts the code writing and reading cylinder of the code writing and reading assembly through the code writing and reading cylinder controller.
A2 Write-read code cylinder drives write-read dock assembly carrying functional main board to move from first write-read dock assembly position to second write-read dock assembly position in vertical direction; when the photoelectric geminate transistors arranged on the code writing and reading guide rails detect that the code writing and reading wharf assembly reaches the position of the second code writing and reading wharf assembly, a signal is output to the main control unit, and the main control unit stops the code writing and reading cylinder through the code writing and reading cylinder controller. At the moment, the probes on the code writing and reading assembly are respectively in electric contact with the code writing and reading contacts of the code to be written and read chip placed in the feeding tray.
A3 A master control unit of the writing and reading wharf assembly controls each slave control unit to write and read codes of a code chip to be written and read in a multi-machine serial port communication mode; and each slave control unit feeds back the code writing and reading result of each code writing and reading chip to the master control unit, and the master control unit outputs the code writing and reading result. If the code writing and reading result of at least one code chip to be written and read indicates that the code writing and reading operation fails in the code writing and reading operation process, performing a retest step; otherwise, continue with step A4).
A4 The main control unit starts the code writing and reading cylinder through the code writing and reading cylinder controller, and the code writing and reading cylinder drives the writing and reading wharf assembly to move from the position of the second writing and reading wharf assembly to the position of the first writing and reading wharf assembly in the vertical direction.
A5 The main control unit starts the feeding cylinder through the feeding cylinder controller, and the feeding cylinder drives the feeding tray to move from the second feeding tray position to the first feeding tray position in the horizontal direction. At this time, all the chips to be written with the codes on the whole chip board have successfully completed the code writing and reading test, and can be taken out from the feeding tray.
If the code writing and reading result of at least one code chip to be written and read indicates that the code writing and reading operation fails in the code writing and reading operation process, the retest step is carried out:
b1 The main control unit starts the code writing and reading cylinder through the code writing and reading cylinder controller, and the code writing and reading cylinder drives the writing and reading wharf assembly to move from the position of the second writing and reading wharf assembly to the position of the first writing and reading wharf assembly in the vertical direction. The probes of the functional main board are separated from the code writing and reading contacts of the chip to be written and read on the whole chip board.
B2 The main control unit starts the code writing and reading cylinder through the code writing and reading cylinder controller, and the code writing and reading cylinder drives the writing and reading wharf assembly to move from the first writing and reading wharf assembly position to the second writing and reading wharf assembly position in the vertical direction. And the probes of the functional main board are contacted with the code writing and reading contact points of the chip to be written and read on the whole chip board again.
B3 A master control unit of the writing and reading wharf assembly controls each slave control unit to write and read codes of a code chip to be written and read in a multi-machine serial port communication mode; and each slave control unit feeds back the code writing and reading result of each code writing and reading chip to the master control unit, and the master control unit outputs the code writing and reading result.
B4 The main control unit starts the code writing and reading cylinder through the code writing and reading cylinder controller, and the code writing and reading cylinder drives the writing and reading wharf assembly to move from the position of the second writing and reading wharf assembly to the position of the first writing and reading wharf assembly in the vertical direction.
B5 The main control unit starts the feeding cylinder through the feeding cylinder controller, and the feeding cylinder drives the feeding tray to move from the second feeding tray position to the first feeding tray position in the horizontal direction. At this time, if the code writing and reading result indicates that all the chips are successfully operated, the code writing and reading test is successfully completed on all the chips to be written and read on the whole chip board, and the chips can be taken out from the feeding tray. And if the code writing and reading result still shows that the chip fails to write and read the code, indicating that a bad chip exists.
The code writing and reading result specifically comprises: chip information, data information written to the chip, and operation result information, error code information, and error type information. Wherein:
and the operation result information represents the information whether the code writing and reading operation is successful or not.
And the error code information represents the operation of failed code writing and reading and error codes corresponding to the error types encountered in the code writing and reading process.
Error type information, a specific error type corresponding to the error code.
The code writing and reading result is output and displayed through the touch liquid crystal screen, and the operation result and the error information are integrated together to be output and displayed, so that the operation method is more visual.
The code writing and reading operation comprises the following steps:
a31 Testing before code writing, including chip circuit detection (COB detection), device code writing function detection (DEBUG write fixed code table), and communication detection (normal command detection, CP detection);
a32 Code table writing step, performing code table writing (DEBUG writing) on the chip.
A33 Code table reading step of detecting whether the code table written in step a 32) is correct (DEBUG read code).
A34 Post-code-writing test steps including off-chip device function detection (sensor detection), and communication detection (normal command code reading).
Although the embodiments of the present invention have been described with reference to the accompanying drawings, those skilled in the art may make various changes or modifications within the scope of the appended claims.
Claims (16)
1. A chip automatic code writing and reading device comprises a rack assembly, a feeding assembly and a code writing and reading assembly; the feeding assembly comprises a feeding tray capable of moving in a first direction of the rack assembly, and the code writing and reading assembly comprises a writing and reading wharf assembly capable of moving in a second direction of the rack assembly; the method is characterized in that: the writing and reading wharf component comprises a functional main board, wherein the functional main board comprises a printed circuit board, a main control circuit arranged on the printed circuit board and a plurality of probes arranged on the printed circuit board along a second direction, and the probes are used for respectively contacting with writing and reading code contact points of a code chip to be written and read placed in the feeding tray to write and read codes when the writing and reading wharf component moves relative to the feeding tray in the second direction; the main control circuit is provided with a probe interface module which is electrically connected with the probe;
the main control circuit comprises a main control unit, a slave control unit and a storage module for storing data of read-write codes; the slave control unit is electrically connected with the main control unit, the storage module is electrically connected with the main control unit, the slave control unit is provided with a driving module, and the probe interface module is arranged between the driving module and the probe;
the feeding assembly further comprises a feeding guide rail, a feeding cylinder controller and a first direction position sensor, wherein the feeding guide rail, the feeding cylinder controller and the first direction position sensor are arranged along a first direction; the feeding tray is connected with the feeding guide rail in a sliding mode, an output shaft of the feeding air cylinder is connected with the feeding tray, and the feeding air cylinder controller is electrically connected with the feeding air cylinder; the main control unit is provided with an interface module, the feeding cylinder controller is connected with the main control unit through the interface module, and the first direction position sensor is connected with the main control unit through the interface module;
the code writing and reading assembly further comprises a code writing and reading guide rail, a code writing and reading cylinder controller and a second direction position sensor, wherein the code writing and reading guide rail, the code writing and reading cylinder controller and the second direction position sensor are arranged along a second direction; the writing and reading wharf assembly is arranged on the writing and reading guide rail in a sliding mode, an output shaft of the writing and reading air cylinder is connected to the writing and reading wharf assembly, the writing and reading air cylinder controller is electrically connected with the writing and reading air cylinder, the writing and reading air cylinder controller is connected with the main control unit through the interface module, and the second direction position sensor is connected with the main control unit through the interface module.
2. The automatic code writing and reading equipment for the chips according to claim 1, wherein: the slave control unit is provided with a test module, and the probe interface module is arranged between the test module and the probe.
3. The automatic code writing and reading equipment for the chips according to claim 1, wherein: the memory module includes an SD memory card connected to the main control unit through an SD card slot.
4. The apparatus for automatically writing and reading codes on a chip according to any one of claims 1 to 3, wherein: the first direction position sensor is a photoelectric pair tube, and the second direction position sensor is a photoelectric pair tube.
5. The apparatus for automatically writing and reading codes on a chip according to any one of claims 1 to 3, wherein: the feeding tray comprises a chip whole plate mounting groove for mounting a chip whole plate, and the writing and reading wharf component comprises a functional main plate mounting part for mounting the functional main plate; the whole chip board mounting groove comprises a whole chip board limiting part, and the functional mainboard mounting part comprises a functional mainboard positioning part.
6. The automatic code writing and reading device for chips according to claim 5, wherein: the code writing and reading assembly comprises a retest button arranged on the rack assembly, and the retest button is electrically connected with the main control unit and used for driving the code writing and reading assembly to rewrite codes through the main control unit.
7. The automatic code writing and reading device for chips according to any one of claims 1 to 3, wherein: the code writing and reading assembly comprises a touch display screen arranged on the rack assembly, and the touch display screen is connected with the main control unit through the interface module.
8. A chip code writing and reading method is used for automatic chip code writing and reading equipment, and the automatic chip code writing and reading equipment comprises a rack assembly, a feeding assembly and a code writing and reading assembly; the method is characterized by comprising the following steps:
a1 The feeding assembly drives the feeding tray to move from a first feeding tray position to a second feeding tray position in the first direction of the rack assembly;
a2 The write-read code assembly drives its write-read dock assembly to move from a first write-read dock assembly position to a second write-read dock assembly position in a second direction of the rack assembly;
a3 The master control unit of the writing and reading wharf assembly writes and reads codes of a code chip to be written and read through each slave control unit; each slave control unit feeds back a code writing and reading result of each code chip to be written and read to the master control unit, and the master control unit outputs the code writing and reading result;
wherein the content of the first and second substances,
when the feeding tray is located at the second feeding tray position and the writing and reading wharf component is located at the second writing and reading wharf component position, the probes on the writing and reading code component are respectively in electric contact with the writing and reading code contacts of the to-be-written and reading code chip placed in the feeding tray;
the writing and reading code result at least comprises:
operation result information indicating whether the code writing and reading operation is successful;
error code information, which represents the operation of failed code writing and reading and error codes corresponding to the error types encountered in the process of code writing and reading;
if the code writing and reading result of at least one code chip to be written and read in the step A3) shows that the code writing and reading operation fails, the retest step is carried out:
b1 The write-read code assembly drives the write-read dock assembly to move from the second write-read dock assembly position to the first write-read dock assembly position in a second direction of the rack assembly;
b2 The write-read code assembly drives the write-read wharf assembly to move from a first write-read wharf assembly position to a second write-read wharf assembly position in a second direction of the rack assembly;
b3 The main control unit of the writing and reading wharf assembly writes and reads codes on a code chip to be written and read through each slave control unit; and each slave control unit feeds back the code writing and reading result of each code writing and reading chip to the master control unit, and the master control unit outputs the code writing and reading result.
9. The chip code writing and reading method according to claim 8, wherein: the code writing and reading operation comprises the following steps:
a31 Testing before code writing, including chip circuit detection, equipment code writing function detection, and communication detection;
a32 Code table writing step, performing code table writing to the chip.
10. The chip code writing and reading method according to claim 9, wherein: the code writing and reading operation comprises the following steps:
a33 Code table reading step of detecting whether the code table written in step a 32) is correct.
11. The method for writing and reading the code on the chip as claimed in claim 10, wherein: the code writing and reading operation comprises the following steps:
a34 Post-code-writing test steps including chip-external device function detection, and communication detection.
12. The chip code writing and reading method according to claim 8, wherein: monitoring whether the feeding tray reaches a second feeding tray position through a first direction position sensor installed in the first direction; and monitoring whether the code writing and reading assembly reaches a second code writing and reading position through a second direction position sensor arranged in the second direction.
13. The chip code writing and reading method according to claim 8, wherein: the writing and reading code result further comprises:
error type information, a specific error type corresponding to the error code.
14. The chip code writing and reading method according to claim 8, wherein: the retesting step further comprises:
b4 The write-read code assembly drives the write-read wharf assembly to move from the second write-read wharf assembly position to the first write-read wharf assembly position in the second direction of the rack assembly;
b5 The feed assembly drives the feed tray to move from the second feed tray position to the first feed tray position in the first direction of the frame assembly.
15. The chip code writing and reading method according to claim 8, wherein:
if the code writing and reading results of all the chips to be written and read in the step A3) indicate that the code writing and reading operations are successful, the following steps are continued:
a4 The write-read code assembly drives the write-read dock assembly to move from the second write-read dock assembly position to the first write-read dock assembly position in a second direction of the rack assembly;
a5 The feed assembly drives the feed tray to move from the second feed tray position to the first feed tray position in the first direction of the frame assembly.
16. A method for writing and reading a code on a chip according to any one of claims 8 to 15, wherein:
the feeding assembly drives the feeding tray to move in a first direction of the rack assembly through a feeding cylinder;
and the code writing and reading assembly drives the code writing and reading wharf assembly to move in the second direction of the rack assembly through the code writing and reading cylinder.
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| CN108318799B (en) * | 2017-01-17 | 2020-10-27 | 崇碁科技股份有限公司 | Chip burning test equipment and method |
| CN207096971U (en) * | 2017-06-30 | 2018-03-13 | 杭州旗捷科技有限公司 | A kind of consumable chip data rewriting equipment |
| CN108447806A (en) * | 2018-03-30 | 2018-08-24 | 杭州旗捷科技有限公司 | Chip automated production equipment, system and method |
| CN113619285B (en) * | 2020-05-08 | 2022-10-14 | 珠海纳思达企业管理有限公司 | Upgrading and resetting device for chip |
| CN114062890A (en) * | 2020-08-10 | 2022-02-18 | 杭州旗捷科技有限公司 | Chip test mainboard, chip test equipment and chip test method |
| CN113900009A (en) * | 2021-09-26 | 2022-01-07 | 杭州旗捷科技有限公司 | Automatic chip testing system and chip testing method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6505138B1 (en) * | 1999-10-28 | 2003-01-07 | Credence Systems Corporation | Function-based control interface for integrated circuit tester prober and handler devices |
| CN102988054A (en) * | 2012-11-23 | 2013-03-27 | 东华大学 | Device and method for intelligentized measurement of human body by flexible wireless electronic measuring tape |
| CN206097090U (en) * | 2016-06-30 | 2017-04-12 | 杭州旗捷科技有限公司 | Automatic write -read sign indicating number equipment of chip |
-
2016
- 2016-06-30 CN CN201610502306.6A patent/CN105955793B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6505138B1 (en) * | 1999-10-28 | 2003-01-07 | Credence Systems Corporation | Function-based control interface for integrated circuit tester prober and handler devices |
| CN102988054A (en) * | 2012-11-23 | 2013-03-27 | 东华大学 | Device and method for intelligentized measurement of human body by flexible wireless electronic measuring tape |
| CN206097090U (en) * | 2016-06-30 | 2017-04-12 | 杭州旗捷科技有限公司 | Automatic write -read sign indicating number equipment of chip |
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