CN105866656B - A kind of control module circuit for more pin chip open-short circuits - Google Patents
A kind of control module circuit for more pin chip open-short circuits Download PDFInfo
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- CN105866656B CN105866656B CN201610152244.0A CN201610152244A CN105866656B CN 105866656 B CN105866656 B CN 105866656B CN 201610152244 A CN201610152244 A CN 201610152244A CN 105866656 B CN105866656 B CN 105866656B
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- matrix switch
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a kind of control module circuits for more pin chip open-short circuits, by power supply power supply, control module circuit includes slave computer, matrix switch module and test circuit, matrix switch module includes several submodules, each submodule includes several matrix switch chips, each matrix switch chip includes several TCH test channels, and the control signal input of matrix switch chip is connected with slave computer, and the TCH test channel of matrix switch chip is connected with test circuit.Control module circuit for more pin chip open-short circuits solves the problems, such as that the measurement capability of the IC chip containing a myriad of pin is insufficient, substantially increases measurement efficiency；The cost of measurement is set to substantially reduce by rolling shaft design, the efficiency of test further increases.
Description
Technical field
The present invention relates to a kind of test circuits, refer in particular to a kind of control module for more pin chip open-short circuits
Circuit.
Background technology
O/S is tested（open short test）, i.e. open-short circuit.IC chip is in encapsulation process due to core
Be between piece and packaging pin with very thin gold thread be connected, and may cause during lashing wire line pin short circuit or
Open circuit, therefore introduce O/S test module test chips and open short-circuit state.This module usually can all be put test program most before
Face or individually test, pass through the package quality of OS test verifications IC.It develops at present and the open-short circuit tester of production can be tested
Number of pins generally at most at tens or so, the testing time of single pin also wants 5ms or so, with the integrated level of current IC
Higher and higher and encapsulation technology promotion needs number of pins to be tested and testing efficiency all cannot have been opened by existing at present
Short-circuit test equipment is met.When test pin numbers are more（Thousands of）, the module design of tester, circuit are designed and
Programming Control is all a no small test.China Patent Publication No. CN103543368A, publication date on January 29th, 2014, name
A kind of integrated circuit OS test machines referred to as are disclosed in the patent of invention of " integrated circuit open circuit/short circuit test method and test machine ",
Including control unit, power module, test jack, sweep test module, indicating module and control button；Test jack is for inserting
Put IC；Sweep test module includes current occuring circuit, ON-OFF control circuit and circuit for testing voltage, and current occuring circuit is used
In providing definite value electric current to the pin of IC by test jack, ON-OFF control circuit is used to control the pin ground connection of IC, and voltage is surveyed
Try the voltage that circuit is used for test pin；Control button is cut for controlling test machine between scanning recognition pattern and test pattern
It changes；Control unit is used to obtain the pin distribution table of non-defective unit IC under scanning recognition pattern, and in test mode to IC to be measured
It carries out open circuit/short circuit test and exports fail message to carry out fail message instruction to indicating module.It is disadvantageous in that, the invention
Still same time test single pin, cannot meet actual testing requirement.
Invention content
The purpose of the present invention is overcome in the prior art more pin chip open-short circuit times it is longer, cannot meet existing
The more IC chip of pin actual test demand defect, provide and a kind of being used for more pin chip open-short circuits
Control module circuit.
The purpose of the present invention is be achieved by following technical proposals：
A kind of control module circuit for more pin chip open-short circuits, by power supply power supply, control module circuit packet
Slave computer, matrix switch module and test circuit are included, matrix switch module includes several submodules, if each submodule includes
Dry matrix switch chip, each matrix switch chip includes several TCH test channels, and the control signal of matrix switch chip is defeated
Enter end with slave computer to be connected, the TCH test channel of matrix switch chip is connected with test circuit.When starting test, power supply is given down
Position machine, matrix switch module and test circuit power supply, the address by slave computer output and control signal data control selections tool
The matrix switch chip being opened or closed required for body, the address of output and control signal are believed by the control of matrix switch chip
Number input terminal receives, and then the TCH test channel of corresponding matrix switch chip is connected to test circuit is tested.
As a preferred embodiment, the power input of matrix switch chip is set there are one electric capacity of voltage regulation, matrix switch core
The ground terminal of piece is set there are one electric capacity of voltage regulation.The design of electric capacity of voltage regulation increases the stability of entire circuit.
As a preferred embodiment, the RESET input of matrix switch chip is set there are one electric capacity of voltage regulation, matrix switch core
The chip select input end of piece is set there are one electric capacity of voltage regulation.The design of electric capacity of voltage regulation increases the stability of entire circuit.
As a preferred embodiment, control module circuit further includes the axis of rolling, and axis of rolling outer surface is used for equipped with several
The slot of fixed matrix switch chip, matrix switch chip are fixedly connected by being clamped with slot with the axis of rolling, and slot is along rolling
Moving axis is axial arranged, and slot is equipped with the connection for making slave computer be connected with the control signal input of matrix switch chip
Device；Axis of rolling inner surface is equipped with internal spline, and thimble is additionally provided in the internal spline axis of rolling, is set above thimble there are one electromagnet,
Thimble end is far from internal spline when thimble is adsorbed with electromagnet, and thimble end connects with internal spline when thimble is not adsorbed with electromagnet
It touches, electromagnet is also electrically connected with control device.When control module circuit does not work, electromagnet no power, thimble connects with internal spline
It touches, splined shaft is blocked by thimble and will not be rotated；When control circuit works, electromagnet is powered, and thimble is adsorbed by electromagnet,
Thimble is detached from internal spline, and splined shaft can rotate.This design can be made by the rolling of the axis of rolling slave computer from it is different
The control signal input of matrix switch chip be connected, and slave computer only need to be connected with communication apparatus without with
The control signal input of each matrix switch chip is connected, and rotating slave computer by the axis of rolling can automatically and communication apparatus
It is connected, cost is greatly saved, the efficiency of test further increases.
The invention has the advantages that the control module circuit for more pin chip open-short circuits is solved containing pole
The problem of the measurement capability deficiency of the IC chip of big quantity pin, substantially increases measurement efficiency；Pass through the axis of rolling
Design makes the cost of measurement substantially reduce, and the efficiency of test further increases.The present invention is easily achieved, is highly practical.
Description of the drawings
Fig. 1 is a kind of circuit theory connection figure of the present invention；
Fig. 2 is that the structure that the present invention rolls shaft portion is to scheme.
Wherein：1, slave computer, 2, matrix switch module, 3, submodule, 4, matrix switch chip, 5, control signal input
End, 6, TCH test channel, 7, test circuit, 8, the axis of rolling, 9, internal spline, 10, thimble.
Specific implementation mode
The present invention is further described with reference to the accompanying drawings and examples.
Embodiment：A kind of control module circuit for more pin chip open-short circuits, by power supply power supply, circuit is former
Connection figure is managed as shown in Figure 1, including slave computer 1, matrix switch module 2 and test circuit 7, matrix switch module includes 2 sons
Module 3, each submodule include 8 matrix switch chips 4, and each matrix switch chip includes 16 TCH test channels 6, and matrix is opened
The control signal input 5 for closing chip is connected with slave computer, and the TCH test channel of matrix switch chip is connected with test circuit.
The power input of matrix switch chip is set there are one electric capacity of voltage regulation, and the ground terminal of matrix switch chip sets that there are one voltage stabilizing electricity
Hold.The RESET input of matrix switch chip is set there are one electric capacity of voltage regulation, and the chip select input end of matrix switch chip is equipped with one
A electric capacity of voltage regulation.
When starting test, power supply is powered to slave computer, matrix switch module and test circuit, the address exported by slave computer
And the specific required matrix switch chip being opened or closed of control signal data control selections, the address of output and control
Signal is received by the control signal input of matrix switch chip, the then TCH test channel of corresponding matrix switch chip and test
Circuit communication is tested.In the present embodiment, single matrix switch chip includes 16 TCH test channels, therefore single matrix switch
Chip can control the break-make of 16 test circuits.And a matrix switch module includes 2 submodules, each submodule includes
8 matrix switch chips, entire control module circuit can control the break-make of 256 test circuits.More, slave computer can be with
Multiple matrix switch modules are controlled, if slave computer controls 10 matrix switch modules, entire control module can control 2560
The break-make of a test circuit.
Control module circuit for more pin chip open-short circuits further includes the axis of rolling, the structural schematic diagram of the axis of rolling
As shown in Fig. 2, axis of rolling outer surface is equipped with the slot that several are used for fixed matrix switch chip, slot matrix switch chip is logical
Cross to be clamped with slot and be fixedly connected with the axis of rolling, slot is axial arranged along the axis of rolling, slot be equipped with for make slave computer and
The communication apparatus that the control signal input of matrix switch chip is connected；Axis of rolling inner surface is equipped with internal spline, internal spline rolling
Be additionally provided with thimble in moving axis, set above thimble there are one electromagnet, when thimble is adsorbed with electromagnet thimble end far from internal spline,
Thimble end is in contact with internal spline when thimble is not adsorbed with electromagnet, and electromagnet is also electrically connected with control device.
When control module circuit does not work, electromagnet no power, thimble is contacted with internal spline, and splined shaft is blocked not by thimble
It can rotate；When control circuit works, electromagnet is powered, and thimble is adsorbed by electromagnet, and thimble is detached from internal spline, spline
Axis can rotate.This design can be such that slave computer believes from the control of different matrix switch chips by the rolling of the axis of rolling
Number input terminal is connected, and slave computer only needs the control being connected with communication apparatus without with each matrix switch chip
Signal input part is connected, and rotating slave computer by the axis of rolling can be connected with communication apparatus automatically, and cost is greatly saved,
The efficiency of test further increases.
Claims (1)
1. a kind of control module circuit for more pin chip open-short circuits, by power supply power supply, characterized in that including bottom
Machine, matrix switch module and test circuit, matrix switch module include several submodules, and each submodule includes several squares
Battle array switch chip, each matrix switch chip includes several TCH test channels, the control signal input of matrix switch chip with
Slave computer is connected, and the TCH test channel of matrix switch chip is connected with test circuit；The power input of matrix switch chip
If there are one electric capacity of voltage regulation, the ground terminal of matrix switch chip sets that there are one electric capacity of voltage regulation；The reset of matrix switch chip inputs
End is set there are one electric capacity of voltage regulation, and the chip select input end of matrix switch chip sets that there are one electric capacity of voltage regulation；For more pin chips
The control module circuit of open-short circuit further includes the axis of rolling, and axis of rolling outer surface is equipped with several and is used for fixed matrix switch core
The slot of piece, slot matrix switch chip are fixedly connected by being clamped with slot with the axis of rolling, and slot is along axis of rolling axial direction cloth
It sets, slot is equipped with the communication apparatus for making slave computer be connected with the control signal input of matrix switch chip；It rolls
Axis inner surface is equipped with internal spline, and thimble is additionally provided in the internal spline axis of rolling, sets that there are one electromagnet, thimble and electromagnetism above thimble
Thimble end is far from internal spline when iron adsorbs, and thimble end is in contact with internal spline when thimble is not adsorbed with electromagnet, electromagnet
Also it is electrically connected with control device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610152244.0A CN105866656B (en) | 2016-03-17 | 2016-03-17 | A kind of control module circuit for more pin chip open-short circuits |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610152244.0A CN105866656B (en) | 2016-03-17 | 2016-03-17 | A kind of control module circuit for more pin chip open-short circuits |
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| Publication Number | Publication Date |
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| CN105866656A CN105866656A (en) | 2016-08-17 |
| CN105866656B true CN105866656B (en) | 2018-10-02 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106526362A (en) * | 2016-10-25 | 2017-03-22 | 上海移远通信技术股份有限公司 | Test system of wireless communication module |
| CN108020775A (en) * | 2017-12-07 | 2018-05-11 | 渭南师范学院 | Integrated circuit DC parameter I-V curve tests system |
| CN108957290A (en) * | 2018-06-27 | 2018-12-07 | 四川斐讯信息技术有限公司 | A kind of SCM Based chip method for detecting short circuit and system |
| CN110763981B (en) * | 2019-11-13 | 2023-05-09 | 苏州华兴源创科技股份有限公司 | Integrated circuit chip inspection system and method |
| CN110763983A (en) * | 2019-11-19 | 2020-02-07 | 无锡中微爱芯电子有限公司 | Open short circuit detection circuitry based on special interface chip |
| CN110954804B (en) * | 2019-12-19 | 2021-11-02 | 上海御渡半导体科技有限公司 | Device and method for accurately diagnosing cBit array faults in batch |
| CN115881204B (en) * | 2023-03-08 | 2023-05-26 | 苏州萨沙迈半导体有限公司 | Test mode reset circuit and chip |
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| CN101949990A (en) * | 2010-09-25 | 2011-01-19 | 苏州华芯微电子股份有限公司 | IC pin open short circuit test method |
| CN103105578A (en) * | 2012-12-28 | 2013-05-15 | 苏州瀚瑞微电子有限公司 | Testing system of universal chip |
| CN103698654A (en) * | 2013-12-28 | 2014-04-02 | 珠海全志科技股份有限公司 | Open circuit short circuit test device and test method of chip base pin |
| CN205608123U (en) * | 2016-03-17 | 2016-09-28 | 杭州长川科技股份有限公司 | A control module circuit for having more pin chip division short -circuit test |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN100529779C (en) * | 2005-03-12 | 2009-08-19 | 鸿富锦精密工业（深圳）有限公司 | Line open-short circuit tester |
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- 2016-03-17 CN CN201610152244.0A patent/CN105866656B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2906633Y (en) * | 2005-11-08 | 2007-05-30 | 佛山市顺德区顺达电脑厂有限公司 | Socket test module |
| CN101949990A (en) * | 2010-09-25 | 2011-01-19 | 苏州华芯微电子股份有限公司 | IC pin open short circuit test method |
| CN103105578A (en) * | 2012-12-28 | 2013-05-15 | 苏州瀚瑞微电子有限公司 | Testing system of universal chip |
| CN103698654A (en) * | 2013-12-28 | 2014-04-02 | 珠海全志科技股份有限公司 | Open circuit short circuit test device and test method of chip base pin |
| CN205608123U (en) * | 2016-03-17 | 2016-09-28 | 杭州长川科技股份有限公司 | A control module circuit for having more pin chip division short -circuit test |
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| CN105866656A (en) | 2016-08-17 |
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