CN105762019A - LCP base material RF MEMS switch preparation method - Google Patents

LCP base material RF MEMS switch preparation method Download PDF

Info

Publication number
CN105762019A
CN105762019A CN201610148997.4A CN201610148997A CN105762019A CN 105762019 A CN105762019 A CN 105762019A CN 201610148997 A CN201610148997 A CN 201610148997A CN 105762019 A CN105762019 A CN 105762019A
Authority
CN
China
Prior art keywords
lcp
substrate
lcp substrate
processed
photoresist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201610148997.4A
Other languages
Chinese (zh)
Other versions
CN105762019B (en
Inventor
党元兰
赵飞
徐亚新
刘晓兰
梁广华
陈雨
庄治学
唐小平
周拥华
李朝
刘志斌
李可
龚孟磊
刘颖
何超
邢伯仑
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CETC 54 Research Institute
Original Assignee
CETC 54 Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CETC 54 Research Institute filed Critical CETC 54 Research Institute
Priority to CN201610148997.4A priority Critical patent/CN105762019B/en
Publication of CN105762019A publication Critical patent/CN105762019A/en
Application granted granted Critical
Publication of CN105762019B publication Critical patent/CN105762019B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H49/00Apparatus or processes specially adapted to the manufacture of relays or parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Micromachines (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

The invention relates to the MEMS device manufacture field, especially an LCP (Liquid Crystal Polymer) base material RF MEMS switch preparation method which mainly comprises the steps of: substrate cleaning, copper-clad surface gold plating and aftertreatment, dry treatment before sputtering, LCP substrate and rigid substrate gapless recombination before photoetching, CPW figure manufacturing, silicon dioxide insulating layer manufacturing on RF transmission lines, sacrificial layer manufacturing, film microbridge manufacturing, sacrificial layer release, etc. The LCP base material RF MEMS switch has the characteristics of lower insert loss and driving voltage and higher yield and isolation, and flexible LCP substrate flatness in a processing process can be well maintained.

Description

A kind of RF mems switch preparation method of LCP base material
Technical field
The present invention relates to MEMS and manufacture field, the RFMEMS particularly to a kind of LCP base material switchs preparation method.
Background technology
LCP (liquid-crystal compounds) is New-generation microwave/millimeter wave substrate and system encapsulating material, there is dielectric constant and loss is little, use frequency range big (DC~110GHz), lightweight, thermostability and anti-flammability are strong, linear expansion coefficient is little, good corrosion resistance, flexible, collapsible, multiple structure forming temperature low (285 DEG C), passive device and active chip can together with the characteristic such as encapsulation, these characteristics have agreed with microwave/millimeter wave system to lighter, less, the demand that higher performance and lower cost direction are developed, thus in microwave/millimeter wave system, shown wide application prospect.
Compared with the RFMEMS switch that silicon materials make, LCP base material RFMEMS switch has less loss, better processes compatibility.Owing to LCP is flexible parent metal, the RFMEMS switch processing the micron-scale with movable member on flexible parent metal is the huge challenge that MEMS manufacturing industry faces.
Summary of the invention
It is an object of the invention to provide the higher flexible LCP base material RFMEMS of a kind of yield rate and switch preparation method.
The object of the present invention is achieved like this, and the RFMEMS of a kind of LCP base material switchs preparation method, it is characterised in that comprise the following steps:
(1) the LCP substrate that one side covers copper is carried out processing;
(2) the LCP substrate after step (1) being processed covers copper face and carries out electrogilding;
(3) the LCP substrate after step (2) being processed is sent in dry plasma etch machine, with carbon tetrafluoride and oxygen without copper face, LCP substrate is carried out dry process;
(4) the LCP substrate after step (3) being processed is sent in magnetic control platform, without sputtering titanium tungsten golden membranous layer on copper face;
(5) the LCP substrate after step (4) being processed takes out, and with photoresist the rigid substrate of the gilding of LCP substrate Yu surfacing is carried out gapless compound;
(6), on the titanium tungsten golden membranous layer of the LCP substrate after step (5) processes, CPW figure is prepared;
(7) the LCP substrate after step (6) processes is sent in dry plasma etch machine, with argon, CPW figure is carried out dry process;LCP substrate surface growth layer of silicon dioxide after treatment again;
(8) the LCP substrate surface after step (7) processes, with photoresist the silicon dioxide being in below film micro-bridge is covered, and the position beyond covering is carried out wet etching, then carry out process of removing photoresist, RF transmission line is formed silicon dioxide insulating layer;
(9) on the LCP substrate after step (8) processes, with photoresist all sites being in beyond film micro-bridge bridge pier is covered, send in magnetic control platform, sputter golden membranous layer;
(10) the LCP substrate after step (9) being processed takes out, with photoresist the position beyond film micro-bridge is covered, again film micro-bridge being carried out gold-plated thickening, the photoresist this step covered afterwards carries out remove photoresist process and wet etching treatment, obtains film micro-bridge;
(11) the LCP substrate after step (10) being processed, carries out sacrifice layer release, and sacrifice layer includes the photoresist in step (5) and the photoresist in step (9);
Complete the preparation of LCP base material RFMEMS switch.
Wherein, described in step (5), with photoresist the rigid substrate of the gilding of LCP substrate Yu surfacing is carried out gapless compound, specifically includes following steps:
(501) the LCP electroplating substrate gold face spin coating photoresist processed in step (5), is placed on 100 DEG C~150 DEG C hot plates and toasts 2min~5min;
(502) on the LCP substrate after step (501) processes, gland rigid substrate after rigid substrate upper press cover briquetting, heated baking 10min~15min, from hot plate, LCP substrate and rigid substrate removed and be cooled to room temperature;
(503) LCP substrate and rigid substrate after step (502) being processed are again placed on 100 DEG C~150 DEG C hot plates, after gland briquetting heated baking 10min~15min, LCP substrate and rigid substrate are removed and be cooled to room temperature from hot plate.
Wherein, the cleaning treatment described in step (1) comprises the following steps:
(101) cover copper LCP substrate 5min~10min with the M6319US cleanout fluid ultrasonic cleaning one side of 50 DEG C~70 DEG C, wash afterwards;
(102) the LCP substrate (101) processed is with the dilute hydrochloric acid ultrasonic cleaning 0.5min~1.5min of 5%~10%, washes afterwards.
Wherein, the LCP substrate described in step (2) covers copper face electrogilding and comprises the following steps:
(201) the LCP substrate after step (1) being processed covers copper face electrogilding, washes after plating;
(202) the LCP substrate isopropanol soaking and washing 5min~10min after step (201) being processed, nitrogen dries up afterwards;
(203) the LCP substrate after step (202) being processed is placed in the hot plate upper press cover glass plate baking 60min~120min of 200 DEG C~250 DEG C.
Wherein, the rigid substrate described in step (5) includes glass plate, silicon chip and ceramic wafer.
Advantages of the present invention:
The present invention is using flexible LCP single-side coated copper plate as baseplate material, by gold-plated to covering copper face, it is ensured that copper face is not oxidized;Processed by dry plasma etch, improve sputtered layer and without the adhesion between copper face;By LCP substrate and rigid substrate being carried out the methods such as gapless compound before photoetching, it is achieved the good maintenance of flexible LCP substrate flatness, and this recombination process need not by complex device, easy and simple to handle, flexible, and yield rate is high;Prepared by microbridge on the introducing of silicon dioxide layer, sacrifice layer on RF transmission line below CPW figure parcel plating thickening, microbridge, sacrifice layer release etc., it is thus achieved that LCP base material RFMEMS switchs preparation method, having the beneficial effect that of acquirement preferably
(1) on flexible LCP base material, Capacitive RF MEMS switch is successfully processed;
(2) yield rate is higher;
(3) insertion loss and driving voltage are relatively low etc..
Accompanying drawing explanation
Fig. 1 is LCP base material RFMEMS switch structure diagram.
Detailed description of the invention
Below, in conjunction with Fig. 1, the invention will be further described.
The RFMEMS of a kind of LCP base material switchs preparation method, described LCP base material RFMEMS switch includes switch base material, is positioned at the CPW figure and film micro-bridge 8 that switch on base material, switch base material includes LCP base material 1, back copper foil 2 and layer gold thereon 3, CPW figure includes RF transmission line 5 and is positioned at the ground wire 4 of RF transmission line both sides, specifically includes following steps:
(1) after covering copper LCP substrate 5min~10min with the M6319US cleanout fluid ultrasonic cleaning one side of 50 DEG C~70 DEG C, washing;Again with, after the dilute hydrochloric acid ultrasonic cleaning 0.5min~1.5min of 5%~10%, washing;
(2) the LCP substrate after step (1) being processed covers copper face electrogilding, washing, with isopropanol soaking and washing 5min~10min, dries up with nitrogen.Be placed on 200 DEG C~250 DEG C hot plate upper press cover glass plate baking 60min~120min;
(3) the LCP substrate after step (2) being processed is sent in dry plasma etch machine, with carbon tetrafluoride and oxygen treatments applied substrate without copper face 2min~5min;
(4) the LCP substrate after step (3) being processed is sent in magnetic control platform, without sputtering titanium tungsten golden membranous layer on copper face;
(5) the LCP electroplating substrate gold face spin coating photoresist after step (4) processes, it is placed on 100 DEG C~150 DEG C hot plates and toasts 2min~5min, rigid substrate (rigid substrate can be glass plate, silicon chip and ceramic wafer) that gland surfaces is smooth at rigid substrate upper press cover briquetting, after heated baking 10min~15min, from hot plate, LCP substrate and rigid substrate removed and be cooled to room temperature.Again LCP substrate and rigid substrate are placed on 100 DEG C~150 DEG C hot plates, after gland briquetting heated baking 10min~15min, from hot plate, LCP substrate and rigid substrate are removed and be cooled to room temperature;
(6) the LCP substrate titanium tungsten golden membranous layer face after step (5) being processed carries out plasma treatment, cover in CPW figure the position beyond the bargraphs needing plating to thicken with photoresist, afterwards bargraphs is carried out gold-plated thickening, then carries out process of removing photoresist.With photoresist all lines positions of CPW figure are covered, afterwards position beyond CPW figure is carried out wet etching, then carry out process of removing photoresist, obtain CPW figure;
(7) the LCP substrate after step (6) being processed is sent in dry plasma etch machine, with argon, CPW figure is carried out dry process;LCP substrate surface growth layer of silicon dioxide after treatment again;
(8) the LCP substrate surface after step (7) processes, with photoresist the silicon dioxide being in below film micro-bridge is covered, and the position beyond covering is carried out wet etching, then carry out process of removing photoresist, RF transmission line is formed silicon dioxide insulating layer 6;
(9) on the LCP substrate after step (8) processes, with sol evenning machine spin coating photoresist, left at room temperature 30min~60min;Afterwards front baking, exposure, development, produce the photoetching offset plate figure that bridge pier 7 position is exposed;Afterwards LCP substrate is placed on the hot plate of 100 DEG C~150 DEG C, toasts 20min~40min, obtain sacrifice layer;Again LCP substrate is sent in magnetic control platform, at whole surface sputtering golden membranous layer;
(10) the LCP substrate after step (9) being processed takes out, with photoresist the position beyond film micro-bridge is covered, again film micro-bridge being carried out gold-plated thickening, the photoresist this step covered afterwards carries out remove photoresist process and wet etching treatment, obtains film micro-bridge;
(11) the LCP substrate after step (10) being processed is put in the liquid that removes photoresist and is soaked, and carries out the supersound process of 1min~2min in immersion process;Take out LCP substrate, place into soaking and washing 3 times~5 times in hot deionized water;Take out LCP substrate, put in isopropanol and soak, immersion process carries out the supersound process of 1min;Take out LCP substrate, put in the chamber of critical point drying instrument, carry out carbon dioxide supercritical fluid drying, complete sacrifice layer release;
Complete the preparation of LCP base material RFMEMS switch.
In embodiment, we in aforementioned manners application and preparation in the RFMEMS switch of≤20GHz, and the correlated performance of exemplar is tested, performance indications are: in≤20GHz frequency range, insertion loss≤0.2dB, return loss≤-20dB, isolation >=20dB, driving voltage 30V~50V.

Claims (5)

1. the RFMEMS of a LCP base material switchs preparation method, it is characterised in that comprise the following steps:
(1) the LCP substrate that one side covers copper is carried out processing;
(2) the LCP substrate after step (1) being processed covers copper face and carries out electrogilding;
(3) the LCP substrate after step (2) being processed is sent in dry plasma etch machine, with carbon tetrafluoride and oxygen without copper face, LCP substrate is carried out dry process;
(4) the LCP substrate after step (3) being processed is sent in magnetic control platform, without sputtering titanium tungsten golden membranous layer on copper face;
(5) the LCP substrate after step (4) being processed takes out, and with photoresist the rigid substrate of the gilding of LCP substrate Yu surfacing is carried out gapless compound;
(6), on the titanium tungsten golden membranous layer of the LCP substrate after step (5) processes, CPW figure is prepared;
(7) the LCP substrate after step (6) being processed is sent in dry plasma etch machine, with argon, CPW figure is carried out dry process;LCP substrate surface growth layer of silicon dioxide after treatment again;
(8) the LCP substrate surface after step (7) processes, with photoresist the silicon dioxide being in below film micro-bridge is covered, and the position beyond covering is carried out wet etching, then carry out process of removing photoresist, RF transmission line is formed silicon dioxide insulating layer;
(9) on the LCP substrate after step (8) processes, with photoresist all sites being in beyond film micro-bridge bridge pier is covered, send in magnetic control platform, sputter golden membranous layer;
(10) the LCP substrate after step (9) being processed takes out, with photoresist the position beyond film micro-bridge is covered, again film micro-bridge being carried out gold-plated thickening, the photoresist this step covered afterwards carries out remove photoresist process and wet etching treatment, obtains film micro-bridge;
(11) the LCP substrate after step (10) being processed, carries out sacrifice layer release, and sacrifice layer includes the photoresist in step (5) and the photoresist in step (9);
Complete the preparation of LCP base material RFMEMS switch.
2. the RFMEMS of a kind of LCP base material according to claim 1 switchs preparation method, it is characterized in that: described in step (5), with photoresist the rigid substrate of the gilding of LCP substrate Yu surfacing is carried out gapless compound, specifically include following steps:
(501) the LCP electroplating substrate gold face spin coating photoresist processed in step (5), is placed on 100 DEG C~150 DEG C hot plates and toasts 2min~5min;
(502) on the LCP substrate after step (501) processes, gland rigid substrate after rigid substrate upper press cover briquetting, heated baking 10min~15min, from hot plate, LCP substrate and rigid substrate removed and be cooled to room temperature;
(503) LCP substrate and rigid substrate after step (502) being processed are again placed on 100 DEG C~150 DEG C hot plates, after gland briquetting heated baking 10min~15min, LCP substrate and rigid substrate are removed and be cooled to room temperature from hot plate.
3. the RFMEMS of a kind of LCP base material according to claim 1 switchs preparation method, it is characterised in that: the cleaning treatment described in step (1) comprises the following steps:
(101) cover copper LCP substrate 5min~10min with the M6319US cleanout fluid ultrasonic cleaning one side of 50 DEG C~70 DEG C, wash afterwards;
(102) the LCP substrate (101) processed is with the dilute hydrochloric acid ultrasonic cleaning 0.5min~1.5min of 5%~10%, washes afterwards.
4. the RFMEMS of a kind of LCP base material according to claim 1 switchs preparation method, it is characterised in that: the LCP substrate described in step (2) covers copper face electrogilding and comprises the following steps:
(201) the LCP substrate after step (1) being processed covers copper face electrogilding, washes after plating;
(202) the LCP substrate isopropanol soaking and washing 5min~10min after step (201) being processed, nitrogen dries up afterwards;
(203) the LCP substrate after step (202) being processed is placed in the hot plate upper press cover glass plate baking 60min~120min of 200 DEG C~250 DEG C.
5. the RFMEMS of a kind of LCP base material according to claim 1 switchs preparation method, it is characterised in that: the rigid substrate described in step (5) includes glass plate, silicon chip and ceramic wafer.
CN201610148997.4A 2016-03-16 2016-03-16 A kind of RF mems switch preparation methods of LCP base materials Active CN105762019B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610148997.4A CN105762019B (en) 2016-03-16 2016-03-16 A kind of RF mems switch preparation methods of LCP base materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610148997.4A CN105762019B (en) 2016-03-16 2016-03-16 A kind of RF mems switch preparation methods of LCP base materials

Publications (2)

Publication Number Publication Date
CN105762019A true CN105762019A (en) 2016-07-13
CN105762019B CN105762019B (en) 2018-01-30

Family

ID=56333293

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610148997.4A Active CN105762019B (en) 2016-03-16 2016-03-16 A kind of RF mems switch preparation methods of LCP base materials

Country Status (1)

Country Link
CN (1) CN105762019B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106486427A (en) * 2016-11-21 2017-03-08 成都嘉纳海威科技有限责任公司 A kind of package casing based on LCP substrate and preparation method
CN107324273A (en) * 2017-06-12 2017-11-07 中国电子科技集团公司第五十四研究所 A kind of method for packing of the MEMS based on LCP multiple-level stack technologies
CN108133869A (en) * 2017-12-25 2018-06-08 苏州希美微纳系统有限公司 Prepare the method and micro electro-mechanical system switch of high-performance radio-frequency micro electro-mechanical system switch

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060216654A1 (en) * 2004-06-30 2006-09-28 University Of South Florida Method for Etching Microchannel Networks within Liquid Crystal Polymer Substrates
CN102105390A (en) * 2008-07-28 2011-06-22 罗伯特·博世有限公司 Encapsulation, MEMS and method of selective encapsulation
CN102107848A (en) * 2009-12-25 2011-06-29 华东光电集成器件研究所 Method of manufacturing suspension radio frequency switch
CN103972612A (en) * 2014-04-01 2014-08-06 苏州锟恩电子科技有限公司 Parallel contact-type RF MEMS (radio frequency micro electromechanical system) switch
CN104662630A (en) * 2012-09-20 2015-05-27 贺利实公司 Mems switches and other miniaturized devices having encapsulating enclosures, and processes for fabricating same

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060216654A1 (en) * 2004-06-30 2006-09-28 University Of South Florida Method for Etching Microchannel Networks within Liquid Crystal Polymer Substrates
CN102105390A (en) * 2008-07-28 2011-06-22 罗伯特·博世有限公司 Encapsulation, MEMS and method of selective encapsulation
CN102107848A (en) * 2009-12-25 2011-06-29 华东光电集成器件研究所 Method of manufacturing suspension radio frequency switch
CN104662630A (en) * 2012-09-20 2015-05-27 贺利实公司 Mems switches and other miniaturized devices having encapsulating enclosures, and processes for fabricating same
CN103972612A (en) * 2014-04-01 2014-08-06 苏州锟恩电子科技有限公司 Parallel contact-type RF MEMS (radio frequency micro electromechanical system) switch

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
NICKOLAS KINGSLEY,GEORGE E.PONCHAK,JOHN PAPAPOLYMEROU: "Reconfigurable RF MEMS Phased Array Antenna Integrated Within a Liquid Crystal Polymer(LCP) System-on-Package", 《IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION》 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106486427A (en) * 2016-11-21 2017-03-08 成都嘉纳海威科技有限责任公司 A kind of package casing based on LCP substrate and preparation method
CN107324273A (en) * 2017-06-12 2017-11-07 中国电子科技集团公司第五十四研究所 A kind of method for packing of the MEMS based on LCP multiple-level stack technologies
CN107324273B (en) * 2017-06-12 2019-02-19 中国电子科技集团公司第五十四研究所 A kind of packaging method of the MEMS device based on LCP multiple-level stack technology
CN108133869A (en) * 2017-12-25 2018-06-08 苏州希美微纳系统有限公司 Prepare the method and micro electro-mechanical system switch of high-performance radio-frequency micro electro-mechanical system switch

Also Published As

Publication number Publication date
CN105762019B (en) 2018-01-30

Similar Documents

Publication Publication Date Title
CN103140026B (en) ceramic copper-clad plate and preparation method thereof
CN104217831B (en) A kind of preparation method of ltcc substrate high-precision surface resistance
CN102107848B (en) Method of manufacturing suspension radio frequency switch
CN105762019A (en) LCP base material RF MEMS switch preparation method
TWI671832B (en) Method of providing an electronic device and electronic device thereof
CN108666325A (en) A kind of preparation method of TFT substrate, TFT substrate and display device
US10204933B2 (en) Thin film transistor and method for manufacturing the same, and display panel
EP2786645A1 (en) Method of providing an electronic device structure and related electronic device structures
CN104752161A (en) Method for improving appearance quality of rear surface of thin sheet
CN114613584B (en) Etching method for soft magnetic material and soft magnetic strip
CN110713169A (en) Method for improving flatness of polyimide sacrificial layer in radio frequency MEMS switch
US10979013B2 (en) Method of manufacturing piezoelectric thin film resonator on non-silicon substrate
CN104150434B (en) A kind of preparation method of millimeter wave RF mems switch
CN103840243A (en) Flexible coplanar waveguide manufacturing method
CN105097431A (en) Wafer front protecting method
US20210225903A1 (en) Etching method, manufacturing method of thin film transistor, process device and display device
CN115504430B (en) Low-temperature preparation method of organic dielectric layer of MEMS electronic device
CN103985948A (en) Low-loss manufacturing method of quartz probe
CN103996618A (en) Manufacturing method for TFT electrode lead
CN114447552B (en) Novel micro-strip circulator based on MEMS (micro-electromechanical systems) process and processing method thereof
CN107640735B (en) A kind of manufacturing method of functionization RF MEMS Switches
CN107177866B (en) The method of micro- radio frequency T shape power splitter is prepared in metallic substrates
CN212434616U (en) Semiconductor structure
Llamas-Garro et al. A planar high-$ Q $ micromachined monolithic half-coaxial transmission-line filter
CN100573959C (en) Preparation method of organic thin film transistor with patterned active layer

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant