CN105758626A - Testing system for measuring ultra-narrow line width of 852 nm semiconductor laser unit based on delayed self-heterodyne method - Google Patents

Testing system for measuring ultra-narrow line width of 852 nm semiconductor laser unit based on delayed self-heterodyne method Download PDF

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CN105758626A
CN105758626A CN201610302697.7A CN201610302697A CN105758626A CN 105758626 A CN105758626 A CN 105758626A CN 201610302697 A CN201610302697 A CN 201610302697A CN 105758626 A CN105758626 A CN 105758626A
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semiconductor laser
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关宝璐
杨嘉炜
潘冠中
刘振扬
李鹏涛
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Beijing University of Technology
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Abstract

基于延时自外差法测量852nm半导体激光器超窄线宽测试系统,属于半导体光电子技术领域。包括:半导体激光器、第一3dB耦合器、延时多模光纤、声光移频器、第二3dB耦合器、光电探测器和频谱仪组成;半导体激光器输出端口为FC/PC的光纤接口,通过法兰盘将半导体激光器与第一3dB耦合器的输入端口相连接;第一3dB耦合器输出为两路,一路通过法兰盘连接延时多模光纤,另一路通过法兰盘连接声光移频器;第二3dB耦合器把延时多模光纤的输出与声光移频器的输出合为一路;第二3dB耦合器的输出端连接光电探测器,光电探测器的输出端使用BNC射频线与频谱仪相连接。可测量852nm半导体激光器的线宽,保证测试系统的精确度。

The invention relates to a test system for measuring the ultra-narrow line width of 852nm semiconductor lasers based on the time-delay self-heterodyne method, which belongs to the field of semiconductor optoelectronic technology. Including: semiconductor laser, first 3dB coupler, delayed multimode fiber, acousto-optic frequency shifter, second 3dB coupler, photodetector and spectrum analyzer; the output port of semiconductor laser is FC/PC fiber interface, through The flange connects the semiconductor laser with the input port of the first 3dB coupler; the output of the first 3dB coupler is two-way, one is connected to the delay multimode fiber through the flange, and the other is connected to the acousto-optic shifter through the flange. The second 3dB coupler combines the output of the time-delayed multimode fiber with the output of the acousto-optic frequency shifter; the output of the second 3dB coupler is connected to the photodetector, and the output of the photodetector uses a BNC radio frequency connected to the spectrum analyzer. It can measure the line width of 852nm semiconductor laser to ensure the accuracy of the test system.

Description

基于延时自外差法测量852nm半导体激光器超窄线宽测试系统Measurement system for ultra-narrow linewidth of 852nm semiconductor laser based on time-delay self-heterodyne method

技术领域technical field

本发明涉及窄线宽半导体激光器线宽的测试系统,属于半导体光电子技术领域,具体涉及一种852nm窄线宽半导体激光器的线宽测试系统。The invention relates to a test system for the line width of a semiconductor laser with a narrow line width, belonging to the technical field of semiconductor optoelectronics, in particular to a line width test system for a semiconductor laser with a narrow line width of 852nm.

背景技术Background technique

窄线宽半导体激光器因其线宽窄、噪声低、抗电磁干扰强等性能,广泛应用于光纤传感、石油勘探、管道监控、激光雷达和海底通信以及其他高精度光谱测量领域。其中852nm窄线宽半导体激光器主要应用于铯原子频谱、短程通信等领域,对激光器的线宽要求越来越高。频带宽度是光源单色性的量度,单色性越好,相干时间越长。因此,精确测量这些激光器的线宽对于评价单频激光器的性能很有必要。Narrow-linewidth semiconductor lasers are widely used in optical fiber sensing, oil exploration, pipeline monitoring, lidar and submarine communications, and other high-precision spectral measurement fields due to their narrow linewidth, low noise, and strong anti-electromagnetic interference. Among them, the 852nm narrow linewidth semiconductor laser is mainly used in the fields of cesium atomic spectrum and short-range communication, and the requirements for the linewidth of the laser are getting higher and higher. Bandwidth is a measure of the monochromaticity of the light source, the better the monochromaticity, the longer the coherence time. Therefore, accurate measurement of the linewidth of these lasers is necessary to evaluate the performance of single-frequency lasers.

光谱线宽的测量方法大致有三种:光谱仪测量法、F-P干涉法、拍频法光谱仪的测量精度约为100GHz,F-P干涉法测量精度约为100MHz,而拍频法精度则可以达到100kHz以下。外差法是测量很窄线宽较理想的方法,可以得到比较满意的分辨率。There are roughly three methods for measuring spectral linewidth: spectrometer measurement, F-P interferometry, and beat frequency method. The heterodyne method is an ideal method for measuring very narrow line width, and can obtain a relatively satisfactory resolution.

激光器线宽测试领域普遍集中在1310nm与1550nm半导体激光器,由于受到波长限制,针对波段为852nm的半导体激光器超窄线宽测试相对较少,传统窄线宽测试系统不再适用于特殊波段的激光器线宽测试。然而,852nm的激光器需求也日益增加,所以针对特殊波段的超窄线宽测试系统有着相当广阔的应用前景。The field of laser line width testing is generally concentrated on 1310nm and 1550nm semiconductor lasers. Due to the limitation of wavelength, there are relatively few ultra-narrow line width tests for semiconductor lasers with a wavelength of 852nm. The traditional narrow line width test system is no longer suitable for laser lines with special bands. wide test. However, the demand for 852nm lasers is also increasing day by day, so the ultra-narrow linewidth test system for special wavebands has a very broad application prospect.

发明内容Contents of the invention

本发明的目的在于提供了一种852nm窄线宽激光器的线宽测试系统。核心结构为传统Mach-Zehnder干涉仪系统,从激光器发出的光经过3dB耦合器,使得一路入射光分成两路,将其中一路光用光纤延时,而另一光路通过移频器进行移频。延时与移频的光路再经过一个3dB耦合器使两路光相拍,经光电转换,在频谱分析仪上得到相拍后的光电流谱线,从延时光电流谱线确定出激光器线宽。本发明的测试系统测试的线宽精度可达到100kHz以下。The object of the present invention is to provide a line width testing system of an 852nm narrow line width laser. The core structure is a traditional Mach-Zehnder interferometer system. The light emitted from the laser passes through a 3dB coupler, so that one incident light is divided into two paths, one of which is delayed by an optical fiber, and the other optical path is shifted by a frequency shifter. The time-delayed and frequency-shifted optical path passes through a 3dB coupler to make the two paths of light phase-patterned. After photoelectric conversion, the photocurrent spectral line after phase-patterning is obtained on the spectrum analyzer, and the laser line is determined from the delayed photocurrent spectral line. width. The accuracy of line width tested by the test system of the present invention can reach below 100kHz.

区别于其他的激光器线宽测试系统,本发明适用于工作波长在852nm的激光器线宽的测量,国内鲜有实验室去搭建同波长的激光器线宽测试系统。此外,本发明所使用的传输光纤均为多模光纤,证明了多模光纤也可用于光纤延时自外差测试系统。此外,由于传输852nm激光的光纤多模光纤价格高昂,经过公式推导,延时光纤越长,可探测的线宽精度越高。但是,越长的延时光纤,所造成损耗也将增大。我们权衡了精度、损耗与成本的利害关系,最后我们用相对较短的多模光纤用来延时,并且满足测试要求。Different from other laser line width testing systems, the present invention is applicable to the measurement of laser line width with working wavelength at 852nm, and there are few laboratories in China to build laser line width testing systems with the same wavelength. In addition, the transmission optical fibers used in the present invention are all multimode optical fibers, which proves that the multimode optical fibers can also be used in the fiber delay self-heterodyne test system. In addition, due to the high price of multimode optical fiber for transmitting 852nm laser, the formula deduces that the longer the delay fiber, the higher the accuracy of the detectable line width. However, the longer the delay fiber, the loss will also increase. We weighed the stakes of accuracy, loss, and cost, and finally we used a relatively short multimode fiber for delay and met the test requirements.

一种852nm窄线宽半导体激光器线宽测试系统,主要包括:An 852nm narrow linewidth semiconductor laser linewidth test system, mainly including:

半导体激光器(1)、第一3dB耦合器(2)、延时多模光纤(3)、声光移频器(4)、第二3dB耦合器(5)、光电探测器(6)和频谱仪(7)组成;Semiconductor laser (1), first 3dB coupler (2), time-delay multimode fiber (3), acousto-optic frequency shifter (4), second 3dB coupler (5), photodetector (6) and spectrum Instrument (7) composition;

半导体激光器输出端口为FC/PC的光纤接口,通过法兰盘将半导体激光器与第一3dB耦合器的输入端口相连接;第一3dB耦合器输出为两路,一路通过法兰盘连接延时多模光纤,另一路通过法兰盘连接声光移频器;第二3dB耦合器把延时多模光纤的输出与声光移频器的输出合为一路;第二3dB耦合器的输出端连接光电探测器,光电探测器的输出端使用BNC射频线与频谱仪相连接。The output port of the semiconductor laser is the fiber interface of FC/PC, and the semiconductor laser is connected to the input port of the first 3dB coupler through the flange; Mode fiber, the other way is connected to the acousto-optic frequency shifter through the flange; the second 3dB coupler combines the output of the delayed multimode fiber with the output of the acousto-optic frequency shifter; the output of the second 3dB coupler is connected to A photodetector, the output end of the photodetector is connected with the spectrum analyzer through a BNC radio frequency line.

所述半导体激光器为852nm窄线宽半导体激光器,激射波长为852nm,出光面镀有反射率小于0.01%的减反膜,另一面镀有反射率大于90%的高反膜;The semiconductor laser is an 852nm narrow-linewidth semiconductor laser, the lasing wavelength is 852nm, the light-emitting surface is coated with an anti-reflection film with a reflectivity less than 0.01%, and the other side is coated with a high-reflection film with a reflectivity greater than 90%;

所述的第一3dB耦合器和第二3dB耦合器,分光比同为50/50,光纤类型是多模光纤,光纤接头为FC/PC;The first 3dB coupler and the second 3dB coupler have the same splitting ratio of 50/50, the fiber type is multimode fiber, and the fiber connector is FC/PC;

所述的多模延时光纤,工作波长在850-852nm,延时光纤损耗为3.5dB/km,纤芯直径为50μm,纤芯的折射率为1.5,光纤接头为FC/PC;The multimode time-delay fiber has a working wavelength of 850-852nm, a time-delay fiber loss of 3.5dB/km, a core diameter of 50 μm, a core refractive index of 1.5, and an optical fiber connector of FC/PC;

所述的声光移频器为针对850nm设计的移频器,工作介质为TeO2,工作中心波长为850-852nm,移频值为100MHz,最大插入损耗为2dB;The acousto-optic frequency shifter is a frequency shifter designed for 850nm, the working medium is TeO 2 , the working center wavelength is 850-852nm, the frequency shift value is 100MHz, and the maximum insertion loss is 2dB;

所述的光电探测器探测为固定增益硅探测器,探测材料为Si,工作波长范围从200nm到1100nm,在850-852nm处的响应度为0.35A/W,带宽为150MHz,具有固定的增益模块,放大倍数达到5000倍;The photodetector detection is a fixed gain silicon detector, the detection material is Si, the working wavelength range is from 200nm to 1100nm, the responsivity at 850-852nm is 0.35A/W, the bandwidth is 150MHz, and it has a fixed gain module , the magnification reaches 5000 times;

所述的频谱分析仪用于射频信号的频域分析,基于快速傅里叶变换,通过傅里叶运算将被测信号分解成分立的频率分量处理后获得频谱分布图,带宽为100kHz-3.6GHz,分辨率达到了100Hz。The spectrum analyzer is used for frequency domain analysis of radio frequency signals. Based on fast Fourier transform, the measured signal is decomposed into discrete frequency components through Fourier operation to obtain a spectrum distribution map with a bandwidth of 100kHz-3.6GHz. , the resolution reaches 100Hz.

所述的第一3dB耦合器是将激光器的输出光分成两路;所述的多模光纤用于延时;所述的声光移频器用于移频;所述的第二3dB耦合器是将移频与延时的光路进行拍频;所述的光电探测器将光信号转化为电信号,并将电信号放大;所述的频谱仪将得到光电流谱线,并通过光电流谱线确定出激光器的线宽。该测试系统精度可达到100kHz,并且拍频位于非零频的中频附近,避免周边环境对系统带来的低频干扰,从而降低系统误差、提高测量精度。The first 3dB coupler divides the output light of the laser into two paths; the multimode fiber is used for time delay; the acousto-optic frequency shifter is used for frequency shifting; the second 3dB coupler is Beat the frequency-shifted and time-delayed optical path; the photodetector converts the optical signal into an electrical signal and amplifies the electrical signal; the spectrum analyzer will obtain the photocurrent spectral line and pass the photocurrent spectral line Determine the linewidth of the laser. The accuracy of the test system can reach 100kHz, and the beat frequency is located near the non-zero intermediate frequency to avoid low-frequency interference from the surrounding environment to the system, thereby reducing system errors and improving measurement accuracy.

本发明所带来的有益效果如下:The beneficial effects brought by the present invention are as follows:

可以测量852nm半导体激光器的线宽,并在尽可能减少延时光纤长度的情况下,保证测试系统的精确度,理论上可测的最小线宽约为100kHz,同时节省了成本。It can measure the linewidth of 852nm semiconductor lasers, and ensure the accuracy of the test system while reducing the length of the delay fiber as much as possible. The minimum measurable linewidth in theory is about 100kHz, while saving costs.

附图说明Description of drawings

图1是852nm窄线宽半导体激光器线宽的测试系统示意图;Figure 1 is a schematic diagram of a test system for the linewidth of a semiconductor laser with a narrow linewidth of 852nm;

图1中:1、半导体激光器,2、第一3dB耦合器,3、多模延时光纤,4、声光移频器,5、第二3dB耦合器,6、光电探测器,7、频谱仪。In Fig. 1: 1, semiconductor laser, 2, first 3dB coupler, 3, multimode time-delay fiber, 4, acousto-optic frequency shifter, 5, second 3dB coupler, 6, photodetector, 7, spectrum instrument.

图2是852nm窄线宽半导体激光器线宽测试频谱图,激光器线宽为100kHz,中心波长为852nm时测试的频谱图。Figure 2 is a test spectrum diagram of the linewidth of a semiconductor laser with a narrow linewidth of 852nm. The spectrum diagram tested when the laser linewidth is 100kHz and the center wavelength is 852nm.

具体实施方式detailed description

如图1所示,一种852nm窄线宽半导体激光器线宽的测试系统,主要包括852nm半导体激光器,第一3dB耦合器,多模延时光纤,声光移频器,第二3dB耦合器,光电探测器,频谱分析仪;As shown in Figure 1, a test system for the line width of a 852nm narrow linewidth semiconductor laser mainly includes an 852nm semiconductor laser, a first 3dB coupler, a multimode delay fiber, an acousto-optic frequency shifter, a second 3dB coupler, Photodetectors, spectrum analyzers;

下面结合图1介绍实现852nm窄线宽半导体激光器线宽的测试系统的方法;Introduce below in conjunction with Fig. 1 the method for realizing the testing system of 852nm narrow-linewidth semiconductor laser linewidth;

步骤1、852nm窄线宽半导体激光器输出端口为FC/PC的光纤接口,通过法兰盘将激光器与第一3dB耦合器的输入端口相连接;Step 1. The output port of the 852nm narrow-linewidth semiconductor laser is an optical fiber interface of FC/PC, and the laser is connected to the input port of the first 3dB coupler through a flange;

步骤2、第一3dB耦合器输出为两路,一路通过法兰盘连接多模延时光纤,另一路通过法兰盘连接声光移频器。此外,声光移频器需要外加24V的工作电源为其供电;Step 2. There are two outputs of the first 3dB coupler, one is connected to the multimode delay fiber through the flange, and the other is connected to the acousto-optic frequency shifter through the flange. In addition, the acousto-optic frequency shifter needs to be powered by an additional 24V working power supply;

步骤3、用第二3dB耦合器把多模延时光纤与声光移频器的输出合为一路;Step 3, using the second 3dB coupler to combine the output of the multimode delay fiber and the acousto-optic frequency shifter;

步骤4、第二3dB耦合器的输出端连接光电探测器,光电探测器需要12V直流稳压电源为其供电;Step 4. The output end of the second 3dB coupler is connected to the photodetector, and the photodetector needs a 12V DC regulated power supply to power it;

步骤5、光电探测器的输出端使用BNC射频线与频谱分析仪相连接;Step 5, the output end of the photodetector is connected with the spectrum analyzer using a BNC radio frequency line;

步骤6、打开频谱仪,中心频率设置在100MHz,在频谱仪的显示屏上调整波形,在中心峰值下降3dB处,读出此处的谱线宽度,这个宽度为半导体激光器的线宽的两倍。因此只需要测量光电流的谱线宽度,就可以准确得到被测激光器的线宽。Step 6. Turn on the spectrum analyzer, set the center frequency at 100MHz, adjust the waveform on the display screen of the spectrum analyzer, and read the spectral line width at the point where the central peak value drops by 3dB, which is twice the line width of the semiconductor laser . Therefore, it is only necessary to measure the spectral linewidth of the photocurrent to accurately obtain the linewidth of the measured laser.

Claims (7)

1. a 852nm narrow linewidth semiconductor laser live width test system, it is characterised in that specifically include that
Semiconductor laser (1), the first three-dB coupler (2), multimode time delay optical fiber (3), acousto-optic frequency shifters (4), the second three-dB coupler (5), photodetector (6) and audiofrequency spectrometer (7) composition;
Semiconductor laser output port is the optical fiber interface of FC/PC, is connected by the input port of semiconductor laser and the first three-dB coupler by ring flange;First three-dB coupler is output as two-way, and ring flange of leading up to connects time delay multimode fibre, and ring flange of separately leading up to connects acousto-optic frequency shifters;Second three-dB coupler is combined into a road the output of multimode time delay optical fiber and the output of acousto-optic frequency shifters;The outfan of the second three-dB coupler connects photodetector, and the outfan of photodetector uses BNC radio frequency line to be connected with audiofrequency spectrometer.
2. a kind of 852nm narrow linewidth semiconductor laser live width test system described in claim 1, it is characterized in that, described semiconductor laser is 852nm narrow linewidth semiconductor laser, excitation wavelength is 852nm, exiting surface is coated with the reflectance antireflective film less than 0.01%, and another side is coated with the reflectance high-reflecting film more than 90%.
3. a kind of 852nm narrow linewidth semiconductor laser live width test system described in claim 1, it is characterised in that the first described three-dB coupler and the second three-dB coupler, splitting ratio is all 50/50, and fiber type is multimode fibre, and fibre-optical splice is FC/PC.
4. a kind of 852nm narrow linewidth semiconductor laser live width test system described in claim 1, it is characterised in that multimode time delay optical fiber, operation wavelength is at 850-852nm, and time delay optical fiber loss is 3.5dB/km, and core diameter is 50 μm, the refractive index of fibre core is 1.5, and fibre-optical splice is FC/PC.
5. a kind of 852nm narrow linewidth semiconductor laser live width test system described in claim 1, it is characterised in that described acousto-optic frequency shifters is the frequency shifter for 850nm design, and working media is TeO2, operating central wavelength is 850-852nm, and shift frequency value is 100MHz, and maximum insertion is 2dB.
6. a kind of 852nm narrow linewidth semiconductor laser live width test system described in claim 1, it is characterized in that, photodetector detection is fixed gain silicon detector, detection material is Si, operating wavelength range is from 200nm to 1100nm, and the responsiveness at 850-852nm place is 0.35A/W, and bandwidth is 150MHz, having fixing gain module, amplification reaches 5000 times.
7. a kind of 852nm narrow linewidth semiconductor laser live width test system described in claim 1, it is characterized in that, described audiofrequency spectrometer is for the frequency-domain analysis of radiofrequency signal, based on Fourier transformation, frequency spectrum profile is obtained after discrete frequency component process being resolved in measured signal by Fourier's computing, bandwidth is 100kHz-3.6GHz, and resolution reaches 100Hz.
CN201610302697.7A 2016-05-09 2016-05-09 Testing system for measuring ultra-narrow line width of 852 nm semiconductor laser unit based on delayed self-heterodyne method Pending CN105758626A (en)

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Cited By (14)

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CN108020824A (en) * 2017-11-28 2018-05-11 中国科学院电子学研究所 The method that SAL signal coherencies based on local oscillator digital delay are kept
CN108155540A (en) * 2017-12-28 2018-06-12 浙江嘉莱光子技术有限公司 A kind of detecting system of single-frequency laser mode hopping
CN108519163A (en) * 2018-04-16 2018-09-11 浙江大学 Analog Direct Modulation Optical Carrier Radio Frequency Link Device Based on Chirp Measurement Feedback Control
CN109238658A (en) * 2018-09-12 2019-01-18 电子科技大学 The measurement method and device of the delay parameter of light delay device
CN109613408A (en) * 2019-02-01 2019-04-12 深圳供电局有限公司 Discharge detector
CN110118643A (en) * 2019-04-17 2019-08-13 华中科技大学 A kind of the laser linewidth measurement method and device of the extraction of power spectrum bicharacteristic parameter
CN111189619A (en) * 2020-01-10 2020-05-22 全球能源互联网研究院有限公司 Device and method for measuring laser tuning precision
CN111351569A (en) * 2020-02-22 2020-06-30 山西大学 Device and method for measuring line width of continuous laser
CN112129491A (en) * 2020-10-23 2020-12-25 南京航空航天大学 Optical fiber time delay measurement method and device based on single optical frequency comb interference
CN112432767A (en) * 2020-10-26 2021-03-02 中国电子科技集团公司第二十九研究所 Method and device for measuring wavelength drift range of laser based on optical delay self-heterodyne
CN113091901A (en) * 2021-04-08 2021-07-09 雄安创新研究院 Wavelength coding laser spectrum line width testing device and testing method thereof
WO2021227992A1 (en) * 2020-05-09 2021-11-18 中国科学院国家授时中心 Apparatus and method for measuring laser linewidth based on cyclic self-heterodyne method
CN114427956A (en) * 2022-01-26 2022-05-03 重庆大学 System and method for measuring intrinsic linewidth of swept-frequency laser based on fractional Fourier transform
CN117073990A (en) * 2023-10-16 2023-11-17 常州灵动芯光科技有限公司 Linewidth testing system and method for narrow linewidth laser

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Cited By (20)

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Publication number Priority date Publication date Assignee Title
CN108020824A (en) * 2017-11-28 2018-05-11 中国科学院电子学研究所 The method that SAL signal coherencies based on local oscillator digital delay are kept
CN108020824B (en) * 2017-11-28 2021-08-13 中国科学院电子学研究所 A method for maintaining the coherence of SAL signal based on local oscillator digital delay
CN108155540A (en) * 2017-12-28 2018-06-12 浙江嘉莱光子技术有限公司 A kind of detecting system of single-frequency laser mode hopping
CN108519163A (en) * 2018-04-16 2018-09-11 浙江大学 Analog Direct Modulation Optical Carrier Radio Frequency Link Device Based on Chirp Measurement Feedback Control
CN109238658A (en) * 2018-09-12 2019-01-18 电子科技大学 The measurement method and device of the delay parameter of light delay device
CN109613408A (en) * 2019-02-01 2019-04-12 深圳供电局有限公司 Discharge detector
CN110118643B (en) * 2019-04-17 2020-10-16 华中科技大学 A laser linewidth measurement method and device for extracting dual characteristic parameters of power spectrum
CN110118643A (en) * 2019-04-17 2019-08-13 华中科技大学 A kind of the laser linewidth measurement method and device of the extraction of power spectrum bicharacteristic parameter
CN111189619B (en) * 2020-01-10 2022-06-03 全球能源互联网研究院有限公司 Device and method for measuring laser tuning precision
CN111189619A (en) * 2020-01-10 2020-05-22 全球能源互联网研究院有限公司 Device and method for measuring laser tuning precision
CN111351569A (en) * 2020-02-22 2020-06-30 山西大学 Device and method for measuring line width of continuous laser
WO2021227992A1 (en) * 2020-05-09 2021-11-18 中国科学院国家授时中心 Apparatus and method for measuring laser linewidth based on cyclic self-heterodyne method
CN112129491A (en) * 2020-10-23 2020-12-25 南京航空航天大学 Optical fiber time delay measurement method and device based on single optical frequency comb interference
CN112432767A (en) * 2020-10-26 2021-03-02 中国电子科技集团公司第二十九研究所 Method and device for measuring wavelength drift range of laser based on optical delay self-heterodyne
CN112432767B (en) * 2020-10-26 2022-11-29 中国电子科技集团公司第二十九研究所 Method and device for measuring wavelength drift range of laser based on optical delay self-heterodyne
CN113091901A (en) * 2021-04-08 2021-07-09 雄安创新研究院 Wavelength coding laser spectrum line width testing device and testing method thereof
CN114427956A (en) * 2022-01-26 2022-05-03 重庆大学 System and method for measuring intrinsic linewidth of swept-frequency laser based on fractional Fourier transform
CN114427956B (en) * 2022-01-26 2022-11-18 重庆大学 Frequency sweep laser intrinsic line width measuring system and method based on fractional Fourier transform
CN117073990A (en) * 2023-10-16 2023-11-17 常州灵动芯光科技有限公司 Linewidth testing system and method for narrow linewidth laser
CN117073990B (en) * 2023-10-16 2024-01-26 常州灵动芯光科技有限公司 Linewidth testing system and method for narrow linewidth laser

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