CN105739589B - A kind of automatic method for repairing and regulating of temperature coefficient for reference circuit - Google Patents
A kind of automatic method for repairing and regulating of temperature coefficient for reference circuit Download PDFInfo
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- CN105739589B CN105739589B CN201610310883.5A CN201610310883A CN105739589B CN 105739589 B CN105739589 B CN 105739589B CN 201610310883 A CN201610310883 A CN 201610310883A CN 105739589 B CN105739589 B CN 105739589B
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- reference circuit
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
- G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
- G05F1/567—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation
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- Automation & Control Theory (AREA)
- Analogue/Digital Conversion (AREA)
Abstract
The invention belongs to field of analog integrated circuit technical field, more particularly to a kind of automatic method for repairing and regulating of the temperature coefficient for reference circuit.The method of the present invention is mainly：The operating temperature of reference circuit is adjusted to by low-temperature working pattern by peripheral temperature control module, the value that traversal trims signal by 5, and gather the output valve of corresponding reference circuit, the operating temperature of reference circuit is adjusted to by hot operation pattern by peripheral temperature control module, the value that traversal trims signal by 5, and gathering the output valve of corresponding reference circuit, the high temperature values obtained with collection subtract low-temperature values, and choose the corresponding control signal of minimum value as trimming value.Beneficial effects of the present invention are, without additional reference voltage, operation to be trimmed without additional complexity, and the drift (including drift that a reference source is produced during production, encapsulation, use) that can be produced to each stage of reference voltage is trimmed.
Description
Technical field
The invention belongs to field of analog integrated circuit technical field, more particularly to a kind of temperature for reference circuit
The automatic method for repairing and regulating of coefficient.
Background technology
Reference circuit can produce one to be widely deployed in dc-dc not with the reference voltage of temperature drift,
In adc circuit, low differential voltage linear voltage stabilizer circuit and other analog circuits.Low-power consumption is increasingly turned to as circuit is used
Institute, high performance reference voltage source is by more extensive demand.Reference voltage source from being designed into production, then to practice process
In, performance can progressively decay, and voltage accuracy can drift about.In order to overcome these problems, produced in the design of reference circuit
Cheng Zhong, it will usually which addition trims circuit.
Existing benchmark trims mode, is divided on the time and can be divided into from trimming:Trimmed after trimming and encapsulate before encapsulation.Encapsulation
Before to trim refer to that after the completion of chip production, chip is still under nude film state, by testing PAD, reference output voltage is entered
Row test, according to test result, changes corresponding temperature coefficient, corrects output voltage；Its main mode have laser cutting and
Electric fuse.This mode that trims needs cumbersome operation and supplementary instrument, and laser cutting mode is relatively costly.Repaiied before encapsulation
Tune is mainly used in the amendment to process drift.But during follow-up chip manufacture, such as encapsulation operation still can be to benchmark electricity
The temperature coefficient on road produces influence.At this moment it is accomplished by adding and other trims circuit.
Trimmed after encapsulation and realized mainly by electric fuse or some erasable memory cell.Wherein electric fuse is irreversible device
Part, can only once be trimmed.And erasable memory cell internal state can rewrite, this mode is repeatable to reference circuit
Trimmed.When electricity is trimmed generally on chip after encapsulation, first allow under chip operation repairing mode transfer formula, by exporting Pin pin
To be compared with external reference voltage outside reference voltage output to piece, it is defeated to be input into Pin pin by chip again according to comparative result
Enter and trim signal, realize the correction to reference voltage.This mode can overcome influence of the following process to fiducial temperature coefficient.
But its shortcoming is complex operation, while reference voltage needs to export to outside chip being compared, this can introduce extra parasitism
Parameter, influence is brought on the accuracy of reference voltage.Meanwhile, reference circuit during practice, with device aging or
The change of person's use environment, output accuracy can still drift about, and trimming mode above cannot correct these changes.
The content of the invention
To be solved by this invention, aiming above mentioned problem, a kind of of proposition can voluntarily adjust temperature coefficient
A reference source framework.
To achieve the above object, the present invention is adopted the following technical scheme that：
A kind of automatic method for repairing and regulating of temperature coefficient for reference circuit, it is characterised in that including：
Set 5 and trim control signal for trimming the temperature coefficient of reference circuit, described 5 trim signal and respectively lead to
The resistance size for trimming resistance of overpower management and control reference circuit, described 5 trim signal respectively Control_1,
Control_2、Control_3、Control_4、Control_5；It is then further comprising the steps of：
A. the operating temperature of reference circuit is adjusted to by low-temperature working pattern by peripheral temperature control module, 5 is trimmed
Signal is set to 00000, the output valve of the now reference circuit of being sampled by sampling hold circuit, and the output valve obtained by sampling is led to
Cross after amplifying circuit and analog-to-digital conversion device and be converted into 6 bits and preserved, two obtained by when signal is 00000 will be trimmed
System number is stored in the register that address is L00000；
B. the value that 5 trim signal plus 1 and repeat step a, until the binary system obtained by when signal is 11111 will be trimmed
After number is stored in the register that address is L11111, into step c；The address of register also Jia 1 accordingly in the step；
C. the operating temperature of reference circuit is adjusted to by hot operation pattern by peripheral temperature control module, 5 is trimmed
Signal is set to 00000, the output valve of the now reference circuit of being sampled by sampling hold circuit, and the output valve obtained by sampling is led to
Cross after amplifying circuit and analog-to-digital conversion device and be converted into 6 bits and preserved, two obtained by when signal is 00000 will be trimmed
System number is stored in the register that address is H00000；
D. the value that 5 trim signal plus 1 and repeat step c, until the binary system obtained by when signal is 11111 will be trimmed
After number is stored in the register that address is H11111, into step e；The address of register also Jia 1 accordingly in the step；
E. the value in register is read, and does following treatment：Address will be stored in and be stored in ground for the data of H0000 are subtracted
Location is the data of L0000, and acquisition result is R0000, subtraction is repeated after plus 1 by address value and is up to acquisition is stored in address
The data of H11111 are subtracted after being stored in the data R1111 that address is L11111, and the data of R0000 to R11111 are compared
And minimum value is selected, it is expressed as Rmin；
F. by Rmin corresponding 5 trim the incoming control circuit of signal value, for adjust trim resistance.
Beneficial effects of the present invention are, without additional reference voltage, operation to be trimmed without additional complexity, can be to benchmark electricity
The drift (including drift that a reference source is produced during production, encapsulation, use) of each stage generation is pressed to be trimmed.
Brief description of the drawings
Fig. 1 is traditional reference source circuit；
Fig. 2 is conventional first order reference voltage variation with temperature curve；
Fig. 3 is self-adjusting a reference source framework proposed by the present invention；
Fig. 4 is register schematic diagram；
Fig. 5 is analog-digital converter schematic diagram.
Specific embodiment
Below in conjunction with the accompanying drawings, technical scheme is described in detail：
Typical band-gap reference circuit is as shown in Figure 1.The reference circuit includes, triode Q1、Q2, resistance R1、R2And R3, fortune
Put A1.By amplifier A1Clamping action so that X points and Y point current potentials are equal.Then flow through resistance R3On electric current
Wherein, n is the number ratio of Q1 and Q2；VT=kT/q is thermal voltage, and k is Boltzmann constant, and q is unit electronics
Electric charge, T is absolute temperature.The output voltage of so whole reference circuit is represented by
Wherein, triode Q2Base stage is to emitter voltage VBE2It is with temperature relation
VBE=Vg00-λT+C(T) (3)
Wherein λ is the unrelated constant of temperature, and C (T) is VBEHigh-order temperature term.As can be seen that triode BE junction voltages include one
Rank subzero temperature amount and high-order subzero temperature amount.Thermal voltage VTRelation with temperature is
As can be seen that thermal voltage VTIt is proportional with temperature.Therefore, by adjusting triode Q1And Q2Dimension scale, and
Resistance R2And R3Resistance ratio, with positive temperature voltage VTGo to compensate VBESubzero temperature amount, output voltage V can be reducedOUTClosed with temperature
Connection relation, realizes single order temperature compensated reference source.
Conventional first order datum curve is similar to parabolic curve, such as Fig. 2.Curve V in figure0In temperature T1Place obtains the electricity of maximum
Pressure value V (T1), while in temperature TlowAnd ThighPlace's magnitude of voltage is equal, there is V0(Tlow)=V0(Thigh)。
In actual production and application process, process drift, packages and devices are aging etc., and reason can cause that reference voltage is inclined
From curve V0.When positive temperature voltage compensation is not enough, reference voltage is less than normal baseline voltage, such as figure V at high temperature1, now have
V0(Tlow) ＞ V0(Thigh) (5)
When positive temperature voltage compensation is excessive, reference voltage is higher than normal baseline voltage at high temperature, such as figure V2, now have
V0(Tlow) ＜ V0(Thigh) (6)
So, in actual reference circuit, can be by comparing in temperature spot TlowAnd ThighThe magnitude of voltage at place is sentenced
Determine whether reference voltage drifts about.
Dotted portion is resistance R in Fig. 12Practical circuit diagram, circuit include resistance R2_0With trim resistance R2_1To R2_5。
Resistance R2_1To R2_5Controlled whether to access electricity by metal-oxide-semiconductor MN1 to MN5 by control signal Control_1 to Control_5 respectively
Road.In the case where benchmark drifts about, can be by readjusting resistance R2Resistance, reference voltage is recovered normal.
Work as V0(Tlow)=V0(Thigh) when, it is possible to determine that reference voltage is zero warm a reference source.
Specific self-adjusting benchmark framework is as shown in figure 3, comprising band-gap reference module (BGR), sampling/keep module (S/
H), amplification module, ADC quantization modules (ADC), high and low register group module (High Register, Low Register) has
Limit state machine module (FSM AND OPTIMIZATION) and control circuit module (CONTROL CIRCUITRY).Clock signal
(Ext.CLK) provided by external clock reference.
Band-gap reference module concrete structure comprising 5 as shown in figure 1, trim signal Control_1 to Control_5.Often
The individual signal that trims controls corresponding NMOS tube, for adjusting resistance R2Resistance.R2Resistance amount to 32 kinds of states.Every kind of state
The waveform that one reference voltage of correspondence is varied with temperature.By relatively more every kind of voltage waveform in TlowAnd ThighVoltage under temperature spot
The size of value, it may be determined that optimal to trim signal value.Self-adjusting benchmark specific works method of the invention is as follows：
First, the operating temperature of reference circuit is adjusted to by peripheral temperature control module by Tlow.5bit is trimmed into signal
(Control_1-Control_5) it is set to 00000.Sample/hold circuit sampling now reference voltage output valve VBG.Sampled value
VBG becomes 6 bit binary value by amplifying circuit and analog-digital converter, and is stored in register group Low Register.Then
5bit is trimmed into signal and is set to 00001, sampling reference voltage output valve VBG now, and be quantified as 6 for binary numeral, deposited
Enter register group Low Register.It is 00010,00011 that set 5bit trims signal successively ..., 11111, by corresponding base
Quasi- magnitude of voltage is stored in register group Low Register, as shown in Figure 4.The data for being stored in low register group are followed successively by L
(00000), L (00001) ..., L (XXXXX) ..., L (11111).
Then, reference circuit is warming up to Thigh, in the same way, the reference voltage sampled successively at this temperature is put
6 bit binary value are quantified as greatly, register High Register are stored in.The data for being stored in high register group are followed successively by H
(00000),H(00001),…,H(XXXXX),….,H(11111)。
Respectively in temperature spot TLowAnd ThighUnder, after 32 set, sampling, quantifying and storing operation, register group
Low Register and High Register are stored in partial data.Afterwards, finite state machine module is read in low register group high
Data, and do subtraction process, i.e. V (Thigh)-V(Tlow), corresponding result of calculation is R (00000) to R (11111).Respectively
Data to R (00000) to R (11111) are compared two-by-two, select minimum value R (XXXXX), the corresponding benchmark electricity of the result
Pressure is closer to the waveform V in Fig. 2 with the waveform of temperature0, i.e. V0(Tlow)=V0(Thigh).Corresponding 5bit data are incoming
Control circuit, trims resistance R2, now corresponding reference voltage is zero warm benchmark.
In each start-up course or under idle condition, by internal logic control, automatic running is once trimmed chip
Operation.This mode that trims covers the drift that reference voltage is likely to occur in each stage, makes chip operationally defeated always
Go out high-precision reference voltage.
In Fig. 3, the reference voltage V of digital analog converterOCould be arranged to the average value of reference voltage V BG.Reference voltage VO's
Acquisition modes are as follows：Self-adjusting a reference source before operation trim, by finite state machine module output signal to controlling circuit,
Set control signal Control_1 to Control_5 is 00000 to 11111 successively, the output voltage sampled under every kind of state
VBG, chooses the average value of VBG as VOFinal output, i.e. the reference point of analog-digital converter.
In Fig. 4, sampled voltage VBG is converted to the data signal of 6bit and is stored in register by analog-digital converter, is quantified
Precision isWherein, VPPIt is the peak-to-peak value of quantized signal, the quantified precision of the converter determines the detection essence of reference circuit
Degree：
The minimum that the 5bit for controlling circuit to include trims signal deciding reference circuit and can realize trims step-length and is
Δ VBG represents that the maximum that reference power supply can be realized in Fig. 1 trims scope.
When the precision of analog-digital converter is sufficiently high, condition is met
Wherein α is the natural number of non-zero.Whole the final of a reference source framework that trim trims precision and is
When the precision of analog-digital converter is not enough, i.e.,
Through over-sampling/holding, quantify, after subtraction operation, in numerical value R (00000) to R (11111), it may appear that many numbers
The equal minimum value of value, that is, exist and multigroup trim control signal while meeting V (THigh)-V(TLow) minimum.At this moment need to add
Extra determination module is used to determine final output to the signal value of control circuit that simplest way to be that multiple minimums occurring
In the case of value, the minimum signal input of signal numerical value to control circuit will be trimmed, completion trims operation.But in such case
Under, the precision that actually trims of reference circuit is less than
This kind of self-adjusting a reference source framework mainly carries out trimming behaviour in chip start-up course or under chip idle condition
Make, while temperature change is slower during trimming, so whole trimming operates and need not be completed within the time quickly, mould
The quantization speed of number converter can be very low, and this greatly reduces the design difficulty of analog-digital converter.
Claims (1)
1. the automatic method for repairing and regulating of a kind of temperature coefficient for reference circuit, it is characterised in that including：
Set 5 and trim control signal for trimming the temperature coefficient of reference circuit, described 5 trim signal and respectively pass through work(
The resistance size for trimming resistance of rate management and control reference circuit, described 5 trim signal respectively Control_1, Control_
2、Control_3、Control_4、Control_5；It is then further comprising the steps of：
A. the operating temperature of reference circuit is adjusted to by low-temperature working pattern by peripheral temperature control module, signal is trimmed by 5
00000 is set to, the output valve of the now reference circuit of being sampled by sampling hold circuit, and by the output valve obtained by sampling by putting
6 bits are converted into after big circuit and analog-to-digital conversion device to be preserved, will trim the binary system obtained by when signal is 00000
Number is stored in the register that address is L00000；
B. the value that 5 trim signal plus 1 and repeat step a, until the binary number that will be trimmed obtained by when signal is 11111 is protected
After there is the register that address is L11111, into step c；
C. the operating temperature of reference circuit is adjusted to by hot operation pattern by peripheral temperature control module, signal is trimmed by 5
00000 is set to, the output valve of the now reference circuit of being sampled by sampling hold circuit, and by the output valve obtained by sampling by putting
6 bits are converted into after big circuit and analog-to-digital conversion device to be preserved, will trim the binary system obtained by when signal is 00000
Number is stored in the register that address is H00000；
D. the value that 5 trim signal plus 1 and repeat step c, until the binary number that will be trimmed obtained by when signal is 11111 is protected
After there is the register that address is H11111, into step e；
E. the value in register is read, and does following treatment：The data that address is H0000 will be stored in subtract and be stored in address and be
The data of L0000, acquisition result is R0000, subtraction is repeated after plus 1 by address value and is up to acquisition is stored in address
The data of H11111 subtract be stored in address be L11111 data, obtain result be R1111 after, by R0000 to R11111's
Data are compared and select minimum value, are expressed as Rmin；
F. by Rmin corresponding 5 trim the incoming control circuit of signal value, for adjust trim resistance.
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| CN107992149B (en) * | 2016-10-27 | 2020-02-07 | 中芯国际集成电路制造(上海)有限公司 | Trimming method and trimming device of voltage band gap circuit |
| CN108121378B (en) * | 2016-11-30 | 2023-09-08 | 华润微集成电路(无锡)有限公司 | Intelligent temperature control circuit with temperature control point capable of being adjusted and adjustment method |
| CN108664069B (en) * | 2017-03-31 | 2019-12-31 | 上海东软载波微电子有限公司 | Calibration method and device of band-gap reference circuit |
| CN108052154B (en) * | 2018-02-05 | 2023-08-01 | 成都信息工程大学 | High-order low-temperature drift band gap reference circuit without operational amplifier |
| CN108733128B (en) * | 2018-05-22 | 2020-02-18 | 电子科技大学 | Trimming code value generating circuit with ultra-low power consumption |
| CN108491023B (en) * | 2018-05-22 | 2020-04-14 | 电子科技大学 | Low-power-consumption high-precision current reference circuit |
| CN108736875B (en) * | 2018-05-22 | 2020-05-01 | 电子科技大学 | Trimming code value generating circuit |
| CN108536210B (en) * | 2018-07-10 | 2023-04-28 | 成都信息工程大学 | Smooth temperature compensation band gap reference source circuit |
| CN110262614B (en) * | 2019-07-15 | 2020-06-23 | 中国科学院上海微系统与信息技术研究所 | Reference voltage temperature coefficient trimming method and device and terminal |
| CN112650639A (en) * | 2020-12-18 | 2021-04-13 | 中国电子科技集团公司第四十七研究所 | Trimming system capable of achieving automatic trimming of sensor |
| CN112859997B (en) * | 2021-02-03 | 2022-08-23 | 北京中电华大电子设计有限责任公司 | Self-calibration circuit structure of band-gap reference voltage three-temperature TRIM |
| TWI789192B (en) * | 2021-12-29 | 2023-01-01 | 新唐科技股份有限公司 | Die test system and test method thereof |
| CN115373459B (en) * | 2022-08-12 | 2023-08-29 | 北京伽略电子股份有限公司 | Low-temperature drift band gap reference circuit |
| CN116204030A (en) * | 2023-03-16 | 2023-06-02 | 普冉半导体(上海)股份有限公司 | Trimming method of reference voltage |
| CN116015304B (en) * | 2023-03-30 | 2023-06-20 | 成都信息工程大学 | Analog trigger asynchronous time sequence circuit based on differential output of annular amplifier |
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| CN201845252U (en) * | 2010-11-23 | 2011-05-25 | 安肯(北京)微电子技术有限公司 | Repair and adjusting circuit of high-precision band-gap reference voltage source chip |
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| FR2728689A1 (en) * | 1994-12-23 | 1996-06-28 | Sgs Thomson Microelectronics | RESISTANCE CALIBRATION CIRCUIT |
| JP5867065B2 (en) * | 2011-12-22 | 2016-02-24 | 株式会社ソシオネクスト | Step-down power supply circuit |
| CN102662425B (en) * | 2012-06-07 | 2014-03-05 | 电子科技大学 | Digital correction band gap-based reference circuit |
| KR20140023749A (en) * | 2012-08-17 | 2014-02-27 | 에스케이하이닉스 주식회사 | Reference voltage generation circuit of semiconductor apparatus |
| CN104391534B (en) * | 2014-11-20 | 2015-12-23 | 无锡中感微电子股份有限公司 | High-precision low difference voltage regulator |
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| CN201845252U (en) * | 2010-11-23 | 2011-05-25 | 安肯(北京)微电子技术有限公司 | Repair and adjusting circuit of high-precision band-gap reference voltage source chip |
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