CN105737982B - 一种光热偏转光谱检测装置及检测方法 - Google Patents
一种光热偏转光谱检测装置及检测方法 Download PDFInfo
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- CN105737982B CN105737982B CN201610118093.7A CN201610118093A CN105737982B CN 105737982 B CN105737982 B CN 105737982B CN 201610118093 A CN201610118093 A CN 201610118093A CN 105737982 B CN105737982 B CN 105737982B
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- 238000001514 detection method Methods 0.000 title claims abstract description 118
- 238000004611 spectroscopical analysis Methods 0.000 title claims abstract description 23
- 238000012360 testing method Methods 0.000 claims abstract description 46
- 230000003287 optical effect Effects 0.000 claims abstract description 41
- 238000010521 absorption reaction Methods 0.000 claims abstract description 14
- 230000005540 biological transmission Effects 0.000 claims description 8
- 238000009738 saturating Methods 0.000 claims description 4
- 230000010355 oscillation Effects 0.000 claims description 3
- 238000002310 reflectometry Methods 0.000 claims description 3
- 241000208340 Araliaceae Species 0.000 claims 1
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 claims 1
- 235000003140 Panax quinquefolius Nutrition 0.000 claims 1
- 235000008434 ginseng Nutrition 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 abstract description 5
- 230000003321 amplification Effects 0.000 abstract description 3
- 238000003199 nucleic acid amplification method Methods 0.000 abstract description 3
- 238000004458 analytical method Methods 0.000 abstract description 2
- 230000000694 effects Effects 0.000 abstract description 2
- 238000010438 heat treatment Methods 0.000 abstract 1
- 239000010408 film Substances 0.000 description 29
- 238000000034 method Methods 0.000 description 6
- 239000010409 thin film Substances 0.000 description 5
- 238000005086 pumping Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 238000001727 in vivo Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000012788 optical film Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201610118093.7A CN105737982B (zh) | 2016-03-02 | 2016-03-02 | 一种光热偏转光谱检测装置及检测方法 |
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CN201610118093.7A CN105737982B (zh) | 2016-03-02 | 2016-03-02 | 一种光热偏转光谱检测装置及检测方法 |
Publications (2)
Publication Number | Publication Date |
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CN105737982A CN105737982A (zh) | 2016-07-06 |
CN105737982B true CN105737982B (zh) | 2018-06-15 |
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CN201610118093.7A Active CN105737982B (zh) | 2016-03-02 | 2016-03-02 | 一种光热偏转光谱检测装置及检测方法 |
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Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106596410A (zh) * | 2016-11-22 | 2017-04-26 | 西安工程大学 | 一种光偏转快速检测活性污泥性质的方法 |
TWI633307B (zh) | 2017-07-29 | 2018-08-21 | 中原大學 | 光熱偏折熱量測系統 |
CN107607614A (zh) * | 2017-09-18 | 2018-01-19 | 重庆交通大学 | 一种基于涡流加热偏转光谱的钢结构缺陷检测装置及方法 |
CN108226040A (zh) * | 2018-01-12 | 2018-06-29 | 南开大学 | 一种二维材料光热效应的测定方法和装置 |
CN109211792A (zh) * | 2018-09-07 | 2019-01-15 | 中国工程物理研究院激光聚变研究中心 | 光热吸收测试系统和光热吸收测试方法 |
CN111964580B (zh) * | 2020-07-30 | 2022-02-11 | 广东工业大学 | 一种基于光杠杆的薄膜位置与角度的检测装置及方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4591272A (en) * | 1983-12-27 | 1986-05-27 | Board Of Regents Acting On Behalf Of University Of Michigan | Photothermal deflection densitometer for thin layer chromatography |
CN1616948A (zh) * | 2004-12-01 | 2005-05-18 | 中国科学院上海技术物理研究所 | 一种用于光学材料微弱吸收测量的设备及方法 |
CN101082537A (zh) * | 2007-07-12 | 2007-12-05 | 中国科学院光电技术研究所 | 一种测量光学薄膜吸收损耗的方法 |
CN103712960A (zh) * | 2013-12-26 | 2014-04-09 | 无锡利弗莫尔仪器有限公司 | 一种采用级联锁相检测的光热检测装置及其检测方法 |
CN104502068A (zh) * | 2014-12-30 | 2015-04-08 | 工业和信息化部电子第五研究所 | 一种用于检测光学元件弱吸收的装置及方法 |
CN104849245A (zh) * | 2015-06-01 | 2015-08-19 | 南京先进激光技术研究院 | 一种吸收腔式激光击穿检测装置 |
-
2016
- 2016-03-02 CN CN201610118093.7A patent/CN105737982B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4591272A (en) * | 1983-12-27 | 1986-05-27 | Board Of Regents Acting On Behalf Of University Of Michigan | Photothermal deflection densitometer for thin layer chromatography |
CN1616948A (zh) * | 2004-12-01 | 2005-05-18 | 中国科学院上海技术物理研究所 | 一种用于光学材料微弱吸收测量的设备及方法 |
CN101082537A (zh) * | 2007-07-12 | 2007-12-05 | 中国科学院光电技术研究所 | 一种测量光学薄膜吸收损耗的方法 |
CN103712960A (zh) * | 2013-12-26 | 2014-04-09 | 无锡利弗莫尔仪器有限公司 | 一种采用级联锁相检测的光热检测装置及其检测方法 |
CN104502068A (zh) * | 2014-12-30 | 2015-04-08 | 工业和信息化部电子第五研究所 | 一种用于检测光学元件弱吸收的装置及方法 |
CN104849245A (zh) * | 2015-06-01 | 2015-08-19 | 南京先进激光技术研究院 | 一种吸收腔式激光击穿检测装置 |
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Application publication date: 20160706 Assignee: Nanjing Zhongke Raycham Technology Co., Ltd. Assignor: NANJING INSTITUTE OF ADVANCED LASER TECHNOLOGY Contract record no.: 2019320000075 Denomination of invention: Photo-thermal deflection spectrum detection device and detection method Granted publication date: 20180615 License type: Common License Record date: 20190415 |
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Effective date of registration: 20210201 Address after: 241200 Chungu 3D Printing Industrial Park, Fanchang Economic Development Zone, Wuhu City, Anhui Province Patentee after: Anhui Zhongke Spring Valley Laser Industry Technology Research Institute Co.,Ltd. Address before: 210038 A building, Longgang science and Technology Park, Heng Yuan Road, Nanjing economic and Technological Development Zone, Nanjing, Jiangsu Patentee before: NANJING INSTITUTE OF ADVANCED LASER TECHNOLOGY |
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