CN105717078A - 基于基准点的相关显微术 - Google Patents
基于基准点的相关显微术 Download PDFInfo
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- CN105717078A CN105717078A CN201510959643.3A CN201510959643A CN105717078A CN 105717078 A CN105717078 A CN 105717078A CN 201510959643 A CN201510959643 A CN 201510959643A CN 105717078 A CN105717078 A CN 105717078A
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- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
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- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
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Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Biomedical Technology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Molecular Biology (AREA)
- General Engineering & Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Microscoopes, Condenser (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/579,056 US9368321B1 (en) | 2014-12-22 | 2014-12-22 | Fiducial-based correlative microscopy |
| US14/579056 | 2014-12-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105717078A true CN105717078A (zh) | 2016-06-29 |
Family
ID=54849802
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510959643.3A Pending CN105717078A (zh) | 2014-12-22 | 2015-12-21 | 基于基准点的相关显微术 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9368321B1 (https=) |
| EP (1) | EP3037862A1 (https=) |
| JP (1) | JP2016119300A (https=) |
| CN (1) | CN105717078A (https=) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109416325A (zh) * | 2017-02-01 | 2019-03-01 | 伊鲁米那股份有限公司 | 具有在非直线布局中的基准的系统和方法 |
| CN111239085A (zh) * | 2019-03-06 | 2020-06-05 | 南昌工程学院 | 基于深度学习的显微视觉伺服控制方法 |
| US11262307B2 (en) | 2017-02-01 | 2022-03-01 | Illumina, Inc. | System and method with reflective fiducials for locating or registering locations receiving biological samples in successive cycles of fluorescent imaging |
| US11427868B2 (en) | 2017-02-01 | 2022-08-30 | Illumina, Inc. | System and method with fiducials of non-closed shapes |
| US11835460B2 (en) | 2017-02-01 | 2023-12-05 | Illumina, Inc. | System and method with fiducials having offset layouts |
| US11896944B2 (en) | 2017-02-01 | 2024-02-13 | Illumina, Inc. | System and method with fiducials responding to multiple excitation frequencies |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11676794B2 (en) | 2017-03-17 | 2023-06-13 | United Kingdom Research And Innovation | Super-resolution microscopy |
| GB201704275D0 (en) * | 2017-03-17 | 2017-05-03 | Science And Tech Facilities Council | Super-resolution microscopy |
| US10589360B2 (en) | 2018-06-17 | 2020-03-17 | Arevo, Inc. | Systems of articles of manufacture with corresponding fiducial marks and dimensional variations |
| JP7110383B2 (ja) * | 2018-10-19 | 2022-08-01 | 株式会社日立ハイテク | アライメントシステム及び位置合わせ用シール |
| JP6901510B2 (ja) * | 2019-02-19 | 2021-07-14 | 日本電子株式会社 | 観察方法、画像処理装置、および電子顕微鏡 |
| WO2020186029A1 (en) * | 2019-03-14 | 2020-09-17 | Applied Materials, Inc. | Identifying fiducial markers in microscope images |
| CN110865058A (zh) * | 2019-11-21 | 2020-03-06 | 成都博奥独立医学实验室有限公司 | 激光微阵列芯片扫描仪的浓度梯度荧光校准片及校准方法 |
| US11551906B1 (en) * | 2021-06-30 | 2023-01-10 | Fei Company | Time-gated detection, dual-layer SPAD-based electron detection |
| WO2024242993A2 (en) * | 2023-05-19 | 2024-11-28 | Yale University | Systems and methods for subvoxel sem based volume electron microscopy |
| WO2024261804A1 (ja) * | 2023-06-19 | 2024-12-26 | 日本電信電話株式会社 | マーカ、位置合わせ装置、及び位置合わせ方法 |
| EP4679056A1 (en) * | 2024-07-08 | 2026-01-14 | Fei Company | Method for creating a sample for use in a charged particle microscope |
Citations (5)
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|---|---|---|---|---|
| CN1820346A (zh) * | 2003-05-09 | 2006-08-16 | 株式会社荏原制作所 | 基于带电粒子束的检查装置及采用了该检查装置的器件制造方法 |
| WO2006127692A2 (en) * | 2005-05-23 | 2006-11-30 | Hess Harald F | Optical microscopy with phototransformable optical labels |
| US20100231922A1 (en) * | 2006-12-21 | 2010-09-16 | Howard Hughes Medical Institute | Three-dimensional interferometric microscopy |
| CN103367085A (zh) * | 2012-04-05 | 2013-10-23 | Fei公司 | 提供深度分辨图像的带电粒子显微镜 |
| CN103994987A (zh) * | 2013-02-19 | 2014-08-20 | Fei公司 | 荧光标记的原位再活化 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3746186B2 (ja) * | 2000-05-12 | 2006-02-15 | 株式会社日立製作所 | 試料台及びその試料台を備えた走査電子顕微鏡 |
| WO2010045271A1 (en) * | 2008-10-14 | 2010-04-22 | Joshua Victor Aller | Target and method of detecting, identifying, and determining 3-d pose of the target |
| US9104903B2 (en) * | 2012-03-16 | 2015-08-11 | University Of Utah Research Foundation | Microscopy visualization |
| JP6353450B2 (ja) * | 2012-09-07 | 2018-07-04 | カール・ツァイス・エックス−レイ・マイクロスコピー・インコーポレイテッドＣａｒｌ Ｚｅｉｓｓ Ｘ−Ｒａｙ Ｍｉｃｒｏｓｃｏｐｙ， Ｉｎｃ． | 共焦点ｘ線蛍光・ｘ線コンピュータ断層撮影複合システムおよび方法 |
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2014
- 2014-12-22 US US14/579,056 patent/US9368321B1/en active Active
-
2015
- 2015-12-14 EP EP15199728.5A patent/EP3037862A1/en not_active Withdrawn
- 2015-12-15 JP JP2015243742A patent/JP2016119300A/ja active Pending
- 2015-12-21 CN CN201510959643.3A patent/CN105717078A/zh active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1820346A (zh) * | 2003-05-09 | 2006-08-16 | 株式会社荏原制作所 | 基于带电粒子束的检查装置及采用了该检查装置的器件制造方法 |
| WO2006127692A2 (en) * | 2005-05-23 | 2006-11-30 | Hess Harald F | Optical microscopy with phototransformable optical labels |
| US20100231922A1 (en) * | 2006-12-21 | 2010-09-16 | Howard Hughes Medical Institute | Three-dimensional interferometric microscopy |
| CN103367085A (zh) * | 2012-04-05 | 2013-10-23 | Fei公司 | 提供深度分辨图像的带电粒子显微镜 |
| CN103994987A (zh) * | 2013-02-19 | 2014-08-20 | Fei公司 | 荧光标记的原位再活化 |
Non-Patent Citations (1)
| Title |
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| GAVIN E. MURPHY ET AL.: "Correlative 3D imaging of Whole Mammalian Cells with Light and Electron Microscopy", 《J STRUCT BIOL.》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109416325A (zh) * | 2017-02-01 | 2019-03-01 | 伊鲁米那股份有限公司 | 具有在非直线布局中的基准的系统和方法 |
| US11249025B2 (en) | 2017-02-01 | 2022-02-15 | Illumina, Inc. | System and method with fiducials in non-rectilinear layouts |
| US11262307B2 (en) | 2017-02-01 | 2022-03-01 | Illumina, Inc. | System and method with reflective fiducials for locating or registering locations receiving biological samples in successive cycles of fluorescent imaging |
| US11427868B2 (en) | 2017-02-01 | 2022-08-30 | Illumina, Inc. | System and method with fiducials of non-closed shapes |
| US11835460B2 (en) | 2017-02-01 | 2023-12-05 | Illumina, Inc. | System and method with fiducials having offset layouts |
| US11896944B2 (en) | 2017-02-01 | 2024-02-13 | Illumina, Inc. | System and method with fiducials responding to multiple excitation frequencies |
| CN111239085A (zh) * | 2019-03-06 | 2020-06-05 | 南昌工程学院 | 基于深度学习的显微视觉伺服控制方法 |
| CN111239085B (zh) * | 2019-03-06 | 2022-11-22 | 南昌工程学院 | 基于深度学习的显微视觉伺服控制方法 |
Also Published As
| Publication number | Publication date |
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| US9368321B1 (en) | 2016-06-14 |
| US20160181060A1 (en) | 2016-06-23 |
| JP2016119300A (ja) | 2016-06-30 |
| EP3037862A1 (en) | 2016-06-29 |
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