CN105676102B - The method and device in neutron single-particle effect device sensitivity section is obtained using FOM - Google Patents
The method and device in neutron single-particle effect device sensitivity section is obtained using FOM Download PDFInfo
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- CN105676102B CN105676102B CN201410676788.8A CN201410676788A CN105676102B CN 105676102 B CN105676102 B CN 105676102B CN 201410676788 A CN201410676788 A CN 201410676788A CN 105676102 B CN105676102 B CN 105676102B
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Abstract
The present invention provides a kind of method and devices that neutron single-particle effect device sensitivity section is obtained using FOM, comprising: carries out ground simulating using predetermined radiation source, obtains the observation σ in Sensitive Apparatus sensitivity sectionObservation, and monitor the single particle effect number of errors N of Sensitive Apparatus in experimentend；The Sensitive Apparatus sensitivity section value σ that will be calculated using FOM methodFOMWith the observation σ in Sensitive Apparatus sensitivity sectionObservationDivision operation is carried out, the first confactor is obtained；The Sensitive Apparatus sensitivity section value σ that will be obtained using the test of Rosetta true environmentRosettaWith the observation σ in Sensitive Apparatus sensitivity sectionObservationDivision operation is carried out, the second confactor is obtained；The value of modifying factor is calculated according to the first confactor, the calculating of the second confactor and single particle effect number of errors；Using modifying factor to the observation σ in the sensitive section of Sensitive ApparatusIt is defaultIt is modified.The present invention can obtain the sensitive section of atmospheric neutron single particle effect Sensitive Apparatus under true environment, provide important evidence for the protection and evaluation of airborne electronic equipment.
Description
Technical field
The present invention relates to microelectronics technology more particularly to a kind of utilization FOM acquisition neutron single-particle effect device are quick
Feel the method and device in section.
Background technique
There are the high energy atmospheric neutrons of 1MeV~1000MeV in place environment, have storage organization complexity microelectronics
The airborne electronic equipment of device will necessarily be met in the place environment that flying height is 3000~20000 meters every about small
When 300~18000 1MeV~1000MeV every square centimeter high energy atmospheric neutron, single particle effect is generated, to influence electricity
The reliability of sub- equipment.Single particle effect sensitivity characteristic of the device in Neutron Environment is characterized with sensitive section in the world.But
It is the sensitive cross-section data under true environment not yet domestic at present, and flight test higher cost.Therefore, pass through ground
Simulation test becomes one of effectively evaluating device atmospheric neutron single particle effect sensitivity characteristic method.
The country, the test pill that can be used for carrying out ground simulation test is 14MeV neutron emitter, still, due to the neutron
Source is monoenergetic neutrons, and the energy of neutron is not single energy under true environment, therefore, utilizes existing 14MeV neutron spoke
Penetrating the sensitive section of Sensitive Apparatus obtained by the simulation test of source progress, sensitive section still exists with true environment Sensitive Apparatus
Certain error, it can not be directly used in sensitivity characteristic of the characterization Sensitive Apparatus under true environment, and then lead to not standard
Safety analysis really is carried out to Sensitive Apparatus in airborne electronic equipment.
Summary of the invention
In order to solve the above technical problems, obtaining neutron single-particle effect device sensitivity using FOM the invention proposes a kind of
The method and device in section obtains atmospheric neutron single-particle under true environment and imitates by correcting the test data of predetermined radiation source
The sensitive section of Sensitive Apparatus is answered, and then realizes that meeting with high-energy neutron in place environment to airborne electronic equipment carries out needle
To property protection and evaluation.
The present invention provides a kind of method for obtaining neutron single-particle effect device sensitivity section using FOM, this method packets
It includes:
Ground simulating is carried out using predetermined radiation source, obtains the Sensitive Apparatus sensitivity section under predetermined radiation source radiation
Observation σObservation, and monitor the single particle effect number of errors N of Sensitive Apparatus in the simulated experimentend；
The Sensitive Apparatus sensitivity section value σ that will be calculated using FOM methodFOMWith described under predetermined radiation source radiation
The observation σ in Sensitive Apparatus sensitivity sectionObservationDivision operation is carried out, the first confactor is obtained；
The Sensitive Apparatus sensitivity section value σ that will be obtained using the test of Rosetta true environmentRosettaWith described in predetermined spoke
Penetrate the observation σ in Sensitive Apparatus sensitivity section under source radiationObservationDivision operation is carried out, the second confactor is obtained；
Modifying factor is calculated according to first confactor, the second confactor and the single particle effect number of errors
The value of son；
According to the value of the modifying factor to the observation in the sensitive section of Sensitive Apparatus under predetermined radiation source radiation
σObservationIt is modified.
Preferably, the Sensitive Apparatus sensitivity section value σ that will be calculated using FOM methodFOMWith described in predetermined spoke
Penetrate the observation σ in Sensitive Apparatus sensitivity section under source radiationObservationDivision operation is carried out, the first confactor is obtained, specifically includes:
Obtain the pre-set Sensitive Apparatus sensitivity section value σ being calculated using FOM methodFOM；
Calculate the Sensitive Apparatus sensitivity section value σ being calculated using FOM methodFOMWith described in predetermined radiation source
Radiate the observation σ in lower Sensitive Apparatus sensitivity sectionObservationRatio, as the first confactor.
Preferably, the Sensitive Apparatus sensitivity section value σ that will be obtained using the test of Rosetta true environmentRosettaWith
The observation σ in the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationDivision operation is carried out, the second confactor is obtained,
It specifically includes:
Obtain the pre-set Sensitive Apparatus sensitivity section value obtained using the test of Rosetta true environment
σRosetta；
Calculate the Sensitive Apparatus sensitivity section value σ obtained using the test of Rosetta true environmentRosettaWith it is described
The observation σ in Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationRatio, as the second confactor.
Preferably, described according to first confactor, the second confactor and the single particle effect mistake
Number calculates the value of modifying factor, specifically includes:
According to the measurement accuracy computation model computational accuracy factor a in sensitive section；
The ratio that first confactor and the second confactor calculate is calculated, accelerated factor A is obtainedβ；
According to the accelerated factor Aβ, dilution of precision a and the single particle effect number of errors calculate modifying factor A,
Formula is as follows:
Preferably, the dilution of precision a is 1.96.
Preferably, the value according to the modifying factor is to described sensitive section of Sensitive Apparatus under predetermined radiation source radiation
The observation σ in faceObservationIt is modified, specifically:
Calculate the observation σ of the modifying factor and the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservation's
Product obtains the sensitive section σ of atmospheric neutron single particle effect Sensitive Apparatus0, formula is as follows:
σ0=σObservation×A。
Correspondingly, the invention also provides a kind of device for obtaining neutron single-particle effect device sensitivity section using FOM,
Described device includes:
Module is obtained, for carrying out ground simulating using predetermined radiation source, is obtained quick under predetermined radiation source radiation
The observation σ in inductor component sensitivity sectionObservation, and the single particle effect for obtaining Sensitive Apparatus in the simulated experiment monitored is wrong
Accidentally number Nend；
First computing module, the Sensitive Apparatus sensitivity section value σ that will be calculated using FOM methodFOMWith described predetermined
Radiate the observation σ in Sensitive Apparatus sensitivity section under source radiationObservationDivision operation is carried out, the first confactor is obtained；
Second computing module, the Sensitive Apparatus sensitivity section value for the test of Rosetta true environment will to be used to obtain
σRosettaWith the observation σ in the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationDivision operation is carried out, obtains second
Confactor；
Modifying factor sub-acquisition module, for according to first confactor, the second confactor and the single-particle
The value of effect number of errors calculating modifying factor；
Correction module, for sensitive to the Sensitive Apparatus under predetermined radiation source radiation according to the value of the modifying factor
The observation σ in sectionObservationIt is modified.
Preferably, first computing module includes:
First acquisition unit, it is sensitive for obtaining the pre-set Sensitive Apparatus being calculated using FOM method
Section value σFOM；
First computing unit, for calculating the Sensitive Apparatus sensitivity section value σ being calculated using FOM methodFOMWith
The observation σ in the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationRatio, as the first confactor.
Preferably, second computing module includes:
Second acquisition unit, for obtaining the pre-set sensitivity obtained using the test of Rosetta true environment
Device sensitivity section value σRosetta；
Second computing unit is cut for calculating the Sensitive Apparatus sensitivity obtained using the test of Rosetta true environment
Face amount σRosettaWith the observation σ in the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationRatio, as second
Confactor.
Preferably, the modifying factor sub-acquisition module includes:
Third computing unit, for the measurement accuracy computation model computational accuracy factor a according to sensitive section；
4th computing unit, the ratio calculated for calculating first confactor and the second confactor, is added
Fast factors Aβ；
5th computing unit, for according to the accelerated factor Aβ, dilution of precision a and the single particle effect mistake
Number calculates modifying factor A, and formula is as follows:
Using the method and device proposed by the present invention for obtaining neutron single-particle effect device sensitivity section using FOM, benefit
With the method for FOM, the sensitive section for testing neutron single-particle effect Sensitive Apparatus under predetermined radiation source obtained is carried out
Amendment obtains the sensitive section of atmospheric neutron single particle effect Sensitive Apparatus under true environment, accurately obtains sensitivity and takes device
Failure rate, and then realize that meeting with high-energy neutron in place environment to airborne electronic equipment carries out specific aim protection and comment
Valence.
Detailed description of the invention
The features and advantages of the present invention will be more clearly understood by referring to the accompanying drawings, and attached drawing is schematically without that should manage
Solution is carries out any restrictions to the present invention, in the accompanying drawings:
Fig. 1 is that a kind of of the proposition of the embodiment of the present invention one utilizes FOM to obtain neutron single-particle effect device sensitivity section
Method flow diagram；
Fig. 2 is that a kind of of the proposition of the embodiment of the present invention two utilizes FOM to obtain neutron single-particle effect device sensitivity section
Apparatus module figure.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
In attached drawing, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described embodiment is
A part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art
Every other embodiment obtained without making creative work, shall fall within the protection scope of the present invention.
Airborne electronic equipment with storage organization complexity microelectronic component flying height (3000~20000 meters) from
The about high energy atmosphere of 300~18000 1MeV~1000MeV every square centimeter per hour will necessarily be met in right space environment
Neutron.These high-energy neutrons can penetrate cabin skin, beat kernel instruction control unit or critical data in airborne electronic equipment
In storage unit, soft error and hard fault are generated, leads to navigate (navigation neceiver), radar-probing system (active phased array thunder
Up to), data network (the AFDX network switch), communication (optical fiber/bus), high speed computer system, avionic device, start
Machine (FADEC), telex system, automatic Pilot technology, flight alarm, display screen, other flight systems containing electronic device etc.
There is blank screen, crash, resets, restarts, loss of data, ordering the safety hazards such as loss.In order to establish protection and appraisement system,
Firstly the need of the sensitive section for obtaining atmospheric neutron single particle effect Sensitive Apparatus under true environment.In this regard, the invention proposes
A kind of method and device obtaining neutron single-particle effect device sensitivity section using FOM.
Fig. 1 is that a kind of of the proposition of the embodiment of the present invention one utilizes FOM to obtain neutron single-particle effect device sensitivity section
Method flow diagram, as shown in Figure 1, method includes the following steps:
S101 carries out ground simulating using predetermined radiation source, and it is quick to obtain the Sensitive Apparatus under predetermined radiation source radiation
Feel the observation σ in sectionObservation, and monitor the single particle effect number of errors N of Sensitive Apparatus in the simulated experimentend。
Preferably, use 14MeV neutron emitter as predetermined radiation source in the embodiment of the present invention, in 14MeV neutron spoke
Penetrate the observation σ in Sensitive Apparatus sensitivity section under source radiationObservationFor σ14MeV。
It is domestic to carry out ground simulation test with the neutron emitter of 14MeV energy at present, to obtain sensitive cross-section data,
In the embodiment of the present invention, ground simulation test is irradiated by 14MeV neutron emitter, is obtained in 14MeV neutron emitter
Radiate the observation σ in lower Sensitive Apparatus sensitivity section14MeV, operating voltage and static current of lcd are recorded by monitoring device, readback is simultaneously
With the single particle effect number of errors N of the Sensitive Apparatus occurred in predose readback Documents Comparison statistical simulation experimentend。
S102, the Sensitive Apparatus sensitivity section value σ that will be calculated using FOM methodFOMWith described in predetermined radiation source spoke
Penetrate the observation σ in lower Sensitive Apparatus sensitivity sectionObservationDivision operation is carried out, the first confactor is obtained.
S103, the Sensitive Apparatus sensitivity section value σ that will be obtained using the test of Rosetta true environmentRosettaWith it is described
The observation σ in Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationDivision operation is carried out, the second confactor is obtained.
S104 is calculated according to first confactor, the second confactor and the single particle effect number of errors
The value of modifying factor.
S105, the sight according to the value of the modifying factor to the sensitive section of Sensitive Apparatus under predetermined radiation source radiation
Measured value σObservationIt is modified, specifically: it calculates the modifying factor and the Sensitive Apparatus sensitivity under predetermined radiation source radiation is cut
The observation σ in faceObservationProduct, obtain the sensitive section σ of atmospheric neutron single particle effect Sensitive Apparatus0, formula is as follows:
σ0=σObservation×A。
In embodiments of the present invention, using 14MeV neutron emitter as predetermined radiation source, in 14MeV neutron emitter
Radiate the observation σ in lower Sensitive Apparatus sensitivity sectionObservationFor σ14MeV, sensor that step S102 will be calculated using FOM method
Part sensitivity section value σFOMWith the observation σ in the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationDivision operation is carried out,
The first confactor is obtained, is specifically included: it is sensitive to obtain the pre-set Sensitive Apparatus being calculated using FOM method
Section value σFOM；Calculate the Sensitive Apparatus sensitivity section value σ being calculated using FOM methodFOMWith described in 14MeV neutron
Radiate the observation σ in Sensitive Apparatus sensitivity section under source radiation14MeVRatio, as the first confactor A3, specific to calculate public affairs
Formula are as follows:
σ14MeV: the observation in the Sensitive Apparatus sensitivity section that 14MeV neutron emitter obtains.Unit: cm2/bit。
σFOM: the Sensitive Apparatus section value being calculated using FOM method.Unit: cm2/bit。
Charged particle in space radiation environment will lead to the semiconductor devices in Spacecraft Electronic system and single-particle occur
Effect seriously affects reliability and the service life of spacecraft.Single particle effect is that spacecraft occurs on space orbit, but a large amount of
Development test work be to be carried out on ground.Device needed for Spacecraft guidance and control anti-single particle effect capability assessment foundation be
Ground simulation test result.FOM (Figure of Merit, i.e. quality factor) method is calculated in ground simulation test at present
The short-cut method of the in-orbit single event upset rate of device, to overturn sensitivity parameter conveniently and efficiently calculator according to limited device
The in-orbit overturning rate of part.
In embodiments of the present invention, using 14MeV neutron emitter as predetermined radiation source, in 14MeV neutron emitter
Radiate the observation σ in lower Sensitive Apparatus sensitivity sectionObservationFor σ14MeV, step S103 will be using the test acquisition of Rosetta true environment
Sensitive Apparatus sensitivity section value σRosettaWith the observation σ in the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservation
Division operation is carried out, the second confactor is obtained, specifically includes: being obtained pre-set described using the examination of Rosetta true environment
Test the Sensitive Apparatus sensitivity section value σ of acquisitionRosetta；Calculate the sensor obtained using the test of Rosetta true environment
Part sensitivity section value σRosettaWith the observation σ in the Sensitive Apparatus sensitivity section under 14MeV neutron irradiation source radiation14MeV's
Ratio, as the second confactor A4, specific formula for calculation are as follows:
σRosetta: the sensitive section value for the Sensitive Apparatus that the test of Rosetta true environment obtains, unit: cm2/bit。
In embodiments of the present invention, step S104 is according to first confactor, the second confactor and the list
Particle effect number of errors calculates the value of modifying factor, specifically includes:
According to the measurement accuracy computation model computational accuracy factor a in sensitive section；
The ratio that first confactor and the second confactor calculate is calculated, accelerated factor A is obtainedβ, specific to calculate
Formula are as follows:
According to the accelerated factor Aβ, dilution of precision a and the single particle effect number of errors calculate modifying factor A,
Formula is as follows:
Wherein, the dilution of precision a is 1.96.
For under not reproducible sampling instances, level of signifiance α=0.05, when confidence level CL=1- α=0.95, according to
The definition of confidence interval, then the measurement accuracy computation model in sensitive section is as follows:
Formula 1
Known to:
And
Wherein, N is atmospheric neutron simple grain effect error sample quantity, unit: a；B is that atmospheric neutron single particle effect is quick
Inductor component bit digit, unit: a；The dilution of precision a is preferably 1.96.
Fig. 2 is that a kind of of the proposition of the embodiment of the present invention two utilizes FOM to obtain neutron single-particle effect device sensitivity section
Apparatus module figure, as shown in Fig. 2, described device includes:
Module 201 is obtained, for carrying out ground simulating using predetermined radiation source, is obtained under predetermined radiation source radiation
The observation σ in Sensitive Apparatus sensitivity sectionObservation, and obtain the single particle effect of Sensitive Apparatus in the simulated experiment monitored
Number of errors Nend；
First computing module 202, the Sensitive Apparatus sensitivity section value σ that will be calculated using FOM methodFOMWith it is described
The observation σ in Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationDivision operation is carried out, the first confactor is obtained；
Second computing module 203, the Sensitive Apparatus sensitivity section value for the test of Rosetta true environment will to be used to obtain
σRosettaWith the observation σ in the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationDivision operation is carried out, obtains second
Confactor；
Modifying factor sub-acquisition module 204, for according to first confactor, the second confactor and the simple grain
Sub- effect number of errors calculates the value of modifying factor；
Correction module 205, for the value according to the modifying factor to the Sensitive Apparatus under predetermined radiation source radiation
The observation σ in sensitive section14MeVIt is modified.
Using 14MeV neutron emitter as predetermined radiation source in the embodiment of the present invention, in 14MeV neutron irradiation source radiation
The observation σ in lower Sensitive Apparatus sensitivity sectionObservationFor σ14MeV。
The first computing module 202 in the embodiment of the present invention includes:
First acquisition unit, it is sensitive for obtaining the pre-set Sensitive Apparatus being calculated using FOM method
Section value σFOM；
First computing unit, for calculating the Sensitive Apparatus sensitivity section value σ being calculated using FOM methodFOMWith
The observation σ in the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationRatio, as the first confactor.
The second computing module 203 in the embodiment of the present invention includes:
Second acquisition unit, for obtaining the pre-set sensitivity obtained using the test of Rosetta true environment
Device sensitivity section value σRosetta；
Second computing unit is cut for calculating the Sensitive Apparatus sensitivity obtained using the test of Rosetta true environment
Face amount σRosettaWith the observation σ in the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationRatio, as second
Confactor.
Modifying factor sub-acquisition module 204 in the embodiment of the present invention includes:
Third computing unit, for the measurement accuracy computation model computational accuracy factor a according to sensitive section；
4th computing unit, the ratio calculated for calculating first confactor and the second confactor, is added
Fast factors Aβ；
5th computing unit, for according to the accelerated factor Aβ, dilution of precision a and the single particle effect mistake
Number calculates modifying factor A, and formula is as follows:
It is proposed by the present invention using FOM obtain neutron single-particle effect device sensitivity section method and device, have with
It is lower the utility model has the advantages that
The present invention overcomes the sensitivities of Sensitive Apparatus obtained by the simulation test carried out using domestic existing predetermined radiation source
The problem of there is a certain error in the sensitive section of section and true environment Sensitive Apparatus, by the method using existing FOM,
The sensitive section for testing neutron single-particle effect Sensitive Apparatus under predetermined radiation source obtained is modified, true ring is obtained
The sensitive failure rate for taking device is accurately obtained, and then is realized in the sensitive section of atmospheric neutron single particle effect Sensitive Apparatus under border
High-energy neutron is met in place environment to airborne electronic equipment and carries out specific aim protection and evaluation.
Through the above description of the embodiments, those skilled in the art can be understood that the present invention can lead to
Hardware realization is crossed, the mode of necessary general hardware platform can also be added to realize by software.Based on this understanding, this hair
Bright technical solution can be embodied in the form of software products, which can store in a non-volatile memories
In medium (can be CD-ROM, USB flash disk, mobile hard disk etc.), including some instructions are used so that a computer equipment (can be
Personal computer, server or network equipment etc.) execute method described in each embodiment of the present invention.
It will be appreciated by those skilled in the art that attached drawing is the schematic diagram of a preferred embodiment, module or stream in attached drawing
Journey is not necessarily implemented necessary to the present invention.
It will be appreciated by those skilled in the art that the module in device in embodiment can describe be divided according to embodiment
It is distributed in the device of embodiment, corresponding change can also be carried out and be located in one or more devices different from the present embodiment.On
The module for stating embodiment can be merged into a module, can also be further split into multiple submodule.
Disclosed above is only several specific embodiments of the invention, and still, the present invention is not limited to this, any ability
What the technical staff in domain can think variation should all fall into protection scope of the present invention.
Claims (3)
1. a kind of method for obtaining neutron single-particle effect device sensitivity section using FOM characterized by comprising
Ground simulating is carried out using predetermined radiation source, obtains the sight in the Sensitive Apparatus sensitivity section under predetermined radiation source radiation
Measured value σObservation, and monitor the single particle effect number of errors N of Sensitive Apparatus in the simulated experimentend；
The Sensitive Apparatus sensitivity section value σ that will be calculated using FOM methodFOMWith the sensitivity under predetermined radiation source radiation
The observation σ in device sensitivity sectionObservationDivision operation is carried out, the first confactor is obtained；
The Sensitive Apparatus sensitivity section value σ that will be obtained using the test of Rosetta true environmentRosettaWith described in predetermined radiation source
Radiate the observation σ in lower Sensitive Apparatus sensitivity sectionObservationDivision operation is carried out, the second confactor is obtained；
Modifying factor is calculated according to first confactor, the second confactor and the single particle effect number of errors
Value, specifically includes:
According to the measurement accuracy computation model computational accuracy factor a in sensitive section；
The ratio that first confactor and the second confactor calculate is calculated, accelerated factor A is obtainedβ；
According to the accelerated factor Aβ, dilution of precision a and the single particle effect number of errors calculate modifying factor A, formula is such as
Under:
According to the value of the modifying factor to the observation σ in the sensitive section of Sensitive Apparatus under predetermined radiation source radiationObservationInto
Row amendment, specifically:
Calculate the observation σ of the modifying factor and the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationMultiply
Product, obtains the sensitive section σ of atmospheric neutron single particle effect Sensitive Apparatus0, formula is as follows:
σ0=σObservation×A。
2. the method according to claim 1 for obtaining neutron single-particle effect device sensitivity section using FOM, feature exist
In the dilution of precision a is 1.96.
3. a kind of device for obtaining neutron single-particle effect device sensitivity section using FOM, which is characterized in that described device packet
It includes:
Module is obtained, for carrying out ground simulating using predetermined radiation source, obtains the sensor under predetermined radiation source radiation
The observation σ in part sensitivity sectionObservation, and obtain the single particle effect mistake of Sensitive Apparatus in the simulated experiment monitored
Number Nend；
First computing module, the Sensitive Apparatus sensitivity section value σ that will be calculated using FOM methodFOMWith described in predetermined radiation
The observation σ in Sensitive Apparatus sensitivity section under source radiationObservationDivision operation is carried out, the first confactor is obtained；
Second computing module, the Sensitive Apparatus sensitivity section value σ for the test of Rosetta true environment will to be used to obtainRosettaWith
The observation σ in the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationDivision operation is carried out, the second confactor is obtained；
Modifying factor sub-acquisition module, for according to first confactor, the second confactor and the single particle effect
Number of errors calculates the value of modifying factor, specifically includes:
According to the measurement accuracy computation model computational accuracy factor a in sensitive section；
The ratio that first confactor and the second confactor calculate is calculated, accelerated factor A is obtainedβ；
According to the accelerated factor Aβ, dilution of precision a and the single particle effect number of errors calculate modifying factor A, formula is such as
Under:
Correction module, for the value according to the modifying factor to the sensitive section of Sensitive Apparatus under predetermined radiation source radiation
Observation σObservationIt is modified, specifically:
Calculate the observation σ of the modifying factor and the Sensitive Apparatus sensitivity section under predetermined radiation source radiationObservationMultiply
Product, obtains the sensitive section σ of atmospheric neutron single particle effect Sensitive Apparatus0, formula is as follows:
σ0=σObservation×A。
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| CN112765869A (en) * | 2021-01-05 | 2021-05-07 | 北京航空航天大学 | Event rate estimation method integrating complete cross section and modified energy spectrum model |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101887088A (en) * | 2009-05-14 | 2010-11-17 | 北京圣涛平试验工程技术研究院有限责任公司 | Method and system for evaluating single-particle effect index of satellite device |
| CN102169022A (en) * | 2010-12-31 | 2011-08-31 | 中国航天科技集团公司第五研究院第五一○研究所 | Experiment method for pulsed laser single event upset cross section |
| CN102968562A (en) * | 2012-11-22 | 2013-03-13 | 北京圣涛平试验工程技术研究院有限责任公司 | Method for determining single-event upset rate on basis of historical data |
| CN102999666A (en) * | 2012-11-26 | 2013-03-27 | 西北核技术研究所 | Single even effect cross section obtaining method based on simulation |
| CN103605835A (en) * | 2013-10-31 | 2014-02-26 | 上海卫星工程研究所 | Design evaluation method of spacecraft system-level anti-single particles |
| CN103729503A (en) * | 2013-12-23 | 2014-04-16 | 中国空间技术研究院 | Device in-orbit single event upset rate predicating method based on composite sensitive volume model |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7408336B2 (en) * | 2005-10-26 | 2008-08-05 | International Business Machines Corporation | Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component |
-
2014
- 2014-11-21 CN CN201410676788.8A patent/CN105676102B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101887088A (en) * | 2009-05-14 | 2010-11-17 | 北京圣涛平试验工程技术研究院有限责任公司 | Method and system for evaluating single-particle effect index of satellite device |
| CN102169022A (en) * | 2010-12-31 | 2011-08-31 | 中国航天科技集团公司第五研究院第五一○研究所 | Experiment method for pulsed laser single event upset cross section |
| CN102968562A (en) * | 2012-11-22 | 2013-03-13 | 北京圣涛平试验工程技术研究院有限责任公司 | Method for determining single-event upset rate on basis of historical data |
| CN102999666A (en) * | 2012-11-26 | 2013-03-27 | 西北核技术研究所 | Single even effect cross section obtaining method based on simulation |
| CN103605835A (en) * | 2013-10-31 | 2014-02-26 | 上海卫星工程研究所 | Design evaluation method of spacecraft system-level anti-single particles |
| CN103729503A (en) * | 2013-12-23 | 2014-04-16 | 中国空间技术研究院 | Device in-orbit single event upset rate predicating method based on composite sensitive volume model |
Non-Patent Citations (2)
| Title |
|---|
| 星载电子系统高能质子单粒子翻转率计算;薛玉雄 等;《航天器环境工程》;20050831;第22卷(第4期);第192-201页 |
| 空间轨道单粒子翻转率预估方法研究;贺朝会;《空间科学学报》;20010731;第21卷(第3期);第266-273页 |
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