CN105652916B - Temperature of processor control circuit - Google Patents
Temperature of processor control circuit Download PDFInfo
- Publication number
- CN105652916B CN105652916B CN201610007267.2A CN201610007267A CN105652916B CN 105652916 B CN105652916 B CN 105652916B CN 201610007267 A CN201610007267 A CN 201610007267A CN 105652916 B CN105652916 B CN 105652916B
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- Prior art keywords
- temperature
- processor
- summing elements
- switch
- control circuit
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Control Of Temperature (AREA)
Abstract
The present invention relates to temperature control digital circuit technique field, more particularly to a kind of temperature of processor control circuit.The temperature of processor control circuit includes data signal summing elements, analog signal summing elements and temperature control unit, change of the temperature control unit based on the temperature of processor, control the switch of the data signal summing elements and analog signal summing elements, so that when the temperature of processor is more than or equal to the threshold value of setting, data signal summing elements are closed, and simulation cumulative signal is provided to the processor by analog signal summing elements;Temperature of processor control circuit provided by the invention, pass through change of the temperature control unit based on temperature of processor, control the switch of data signal summing elements and the analog signal summing elements, so as to realize that both switchings use, at utmost reduce processor workload, temperature is reduced, so as to reduce electric current, reduces power consumption.
Description
Technical field
The present invention relates to temperature control digital circuit technique field, more particularly to a kind of temperature of processor control circuit.
Background technology
With the constantly improve of touch screen technology, its verification platform processor such as FPGA, ARM scheduling algorithm scale constantly expands
Greatly, operand is increasing.Touch-screen verification platform of the prior art does not have monitoring temperature mechanism temporarily, at the cumulative aspect of signal
More structures being used alone using analogue integrator (simulation summing elements) or digital summing elements.Single simulation summing elements or
Multiple exclusive uses of digital summing elements so that device bears pressure and gradually increased, and causes itself temperature under the conditions of high-speed cruising
The lasting rise of degree, when chip is in a certain critically weighted, electric current can increase sharply suddenly, and temperature explosion type rises, in this situation
Current surge, IC operation irregularities, or even the damage of itself irrecoverability can be caused.Even if can recover after IC power-off, can also influence
Normal testing process, interrupt test work.
As shown in figure 1, it is conventional temperature of processor monitoring system.Wherein, data acquisition unit gathers temperature-sensitive electricity in real time
Magnitude of voltage corresponding to resistance, the data signal after conversion is exported to the data comparing unit of processor, by with preset temperature
Point compares, and realizes that temperature judges, comparative result is sent to other logic control parts by control signal output unit.This structure
Use the single structure of digital summing elements so that device bears pressure and gradually increased, and causes itself temperature under the conditions of high-speed cruising
The lasting rise of degree, causes IC operation irregularities, causes major injury, influence test job efficiency.
The content of the invention
(1) technical problems to be solved
It is of the prior art to overcome the technical problem to be solved in the present invention is to provide a kind of temperature of processor control circuit
Touch-screen verification platform does not have monitoring temperature mechanism temporarily, how cumulative single using simulation summing elements or numeral at the cumulative aspect of signal
The structure that member is used alone so that device bears pressure and gradually increased, and own temperature persistently raises under the conditions of causing high-speed cruising,
Cause IC operation irregularities, cause major injury, influence test job efficiency.
(2) technical scheme
To solve the above problems, the embodiments of the invention provide a kind of temperature of processor control circuit, including:
Data signal summing elements, it is arranged inside the processor;
Analog signal summing elements, it is arranged at outside the processor;
And temperature control unit;
Wherein, the data signal summing elements, for tired according to the external input signal of processor generation numeral
Plus signal;
The analog signal summing elements, for generating simulation cumulative signal according to the external input signal, and by institute
State simulation cumulative signal and be supplied to the processor;
Change of the temperature control unit based on the temperature of processor, control the data signal summing elements and
The switch of the analog signal summing elements so that when the temperature of the processor is more than or equal to the threshold value of setting, institute
The closing of data signal summing elements is stated, simulation cumulative signal is provided to the processor by the analog signal summing elements;When
When the temperature of the processor is less than the threshold value of setting, the analog signal summing elements are closed, and are added up by the data signal
Unit provides digital cumulative signal to the processor.
Preferably, the temperature control unit includes temperature detecting unit and switch control unit;
Wherein, the temperature detecting unit is used to detecting the change of the temperature of processor, and according to the temperature with it is described
The relation of threshold value, corresponding control signal is provided to the switch control unit;
The switch control unit controls the data signal summing elements and the simulation according to the control signal
The switch of signal summing elements.
Preferably, the temperature detecting unit includes thermistor and build-out resistor;
Wherein, the first end of the thermistor is connected to the first reference voltage, the second end connection of the thermistor
In the first end of the build-out resistor, the second end of the build-out resistor is connected to the second reference voltage, the thermistor
Connecting node between the first end of second end and the build-out resistor provides control signal to the switch control unit.
Preferably, the build-out resistor is arranged at the inside of the processor.
Preferably, the build-out resistor is arranged at the outside of the processor.
Preferably, second reference voltage is provided by the processor.
Preferably, the switch control unit includes switching switch, and it receives the control signal of the temperature detecting unit,
And the switch of the data signal summing elements and the analog signal summing elements is controlled according to the control signal.
Preferably, the temperature of processor control circuit is used for touch-screen detection circuit, and the switching switch touches to be described
Touch untapped switch in screen detection circuit.
Preferably, the temperature of processor control circuit is used for touch-screen detection circuit, and the switching switch is answered for timesharing
The switch used in circuit is detected with the touch-screen.
Preferably, the temperature of processor control circuit is used for touch-screen detection circuit, and the switching switch touches to be described
Touch the independent switch of screen detection circuit external.
(3) beneficial effect
The present invention provides a kind of temperature of processor control circuit, passes through change of the temperature control unit based on temperature of processor
Change, control the switch of data signal summing elements and the analog signal summing elements, so as to realize that both switchings use,
Processor workload is at utmost reduced, reduces temperature, so as to reduce electric current, reduces power consumption.
Brief description of the drawings
Fig. 1 is temperature of processor control circuit structural representation of the embodiment of the present invention;
Fig. 2 is temperature of processor control circuit structural representation of the embodiment of the present invention;
Fig. 3 is that temperature control summing elements of the embodiment of the present invention based on thermistor NTC switch touch-screen verification platform system
The schematic diagram of organization plan one;
Fig. 4 is that temperature control summing elements of the embodiment of the present invention based on thermistor NTC switch touch-screen verification platform system
The schematic diagram of organization plan two;
Fig. 5 is that the temperature control summing elements switching touch-screen verification platform based on NTC thermistor is enabling the cumulative list of simulation
Workflow diagram when first;
Fig. 6 is that the temperature control summing elements switching touch-screen verification platform based on NTC thermistor is enabling the cumulative list of numeral
Workflow diagram when first.
Embodiment
Below in conjunction with the accompanying drawings and embodiment that the present invention is described in detail is as follows.
As shown in Fig. 2 the present invention's provides a kind of temperature of processor control circuit, including:
Data signal summing elements, it is arranged inside the processor;
Analog signal summing elements, it is arranged at outside the processor;
And temperature control unit;
Wherein, the data signal summing elements, for tired according to the external input signal of processor generation numeral
Plus signal;
Wherein, analog signal summing elements, for generating simulation cumulative signal according to the external input signal, and by institute
State simulation cumulative signal and be supplied to the processor;
Change of the temperature control unit based on the temperature of processor, control data signal summing elements and described
The switch of analog signal summing elements so that when the temperature of the processor is more than or equal to the threshold value of setting, the number
Word signal summing elements are closed, and simulation cumulative signal is provided to the processor by the analog signal summing elements;When described
When the temperature of processor is less than the threshold value of setting, the analog signal summing elements are closed, by the data signal summing elements
Digital cumulative signal is provided to the processor.
Wherein, the temperature control unit includes temperature detecting unit and switch control unit;
The temperature detecting unit is used for the change for detecting the temperature of processor, and according to the temperature and the threshold value
Relation, corresponding control signal is provided to the switch control unit;
The switch control unit controls the data signal summing elements and the simulation according to the control signal
The switch of signal summing elements.
The temperature detecting unit includes thermistor and build-out resistor;
Wherein, the first end of the thermistor is connected to the first reference voltage, the second end connection of the thermistor
In the first end of the build-out resistor, the second end of the build-out resistor is connected to the second reference voltage, the thermistor
Connecting node between the first end of second end and the build-out resistor provides control signal to the switch control unit.
Build-out resistor in the present embodiment is arranged at the inside of the processor, can also be arranged at the outside of processor.
The first reference voltage in the present embodiment can be grounded, and the second reference voltage is provided by the processor.
Wherein, the switch control unit includes switching switch, and it receives the control signal of the temperature detecting unit, and
The switch of the data signal summing elements and the analog signal summing elements is controlled according to the control signal.
The temperature of processor control circuit is used for touch-screen detection circuit, and the switching switch detects for the touch-screen
Untapped switch in circuit.
Temperature of processor control circuit in the present embodiment is used for touch-screen detection circuit, and the switching switch is answered for timesharing
The switch used in circuit is detected with the touch-screen.
Temperature of processor control circuit is used for touch-screen detection circuit, and the switching switch detects circuit for the touch-screen
Outside independent switch.
The application that the temperature of processor control circuit is used for touch-screen detection circuit is described in detail below.
As shown in figure 3, the temperature control summing elements switching touch-screen verification platform system architecture scheme based on thermistor NTC
One.Wherein, build-out resistor is outside addition resistance;Bold portion represents realizes switching by the switch being multiplexed in detection circuit,
Dotted portion represents realizes switching by switching untapped switch inside IC.
Fig. 4 is the temperature control summing elements switching touch-screen verification platform system architecture scheme two based on thermistor NTC.Its
In, build-out resistor is to contain resistance inside processor;Bold portion represents realizes switching by the switch being multiplexed in detection circuit,
Dotted portion represents realizes switching by switching untapped switch inside IC.
NTC thermistor (NTC is used in the present embodiment:Negative Temperature Coefficient) realize temperature
Degree monitoring, the reduction of its resistance is raised with temperature.Before the work of touch-screen verification platform, it need to make according to device operand and actually
With environment, the critically weighted of processor is confirmed by specifically testing, thermistor characteristic curve is compareed and determines the temperature spot pair
Answer resistance, you can obtain switching SW1 startup voltage.This magnitude of voltage by for controlling switch SW1 opening and closing to complete
Simulate the switching of summing elements and digital summing elements.The electrical voltage point VCC of NTC thermistor is by processor power supply outgoing management list
Member control output, register configuration can be changed by programming, the startup of switch is set according to selected switch IC databook
Electrical voltage point, to be matched with different type switch, make circuit design more flexible.The introducing of switch, thermistor is set single
Temperature spot, it is possible to realize the switching of summing elements, it is not necessary to use the circuit structure shown in Fig. 1:Processor calls data to adopt
Collection gathers magnitude of voltage corresponding to thermistor in real time, realizes that summing elements switch by difference comparsion, mitigates processor workload.
Simultaneously in testing touch screen platform, capacitor charge and discharge operation is carried out using on-off circuit, can time-sharing multiplex wherein some detection
Switch uses as summing elements switching, additionally due to including multiple switch inside existing switch IC, and can realize point more
Vertical enabled control, untapped switch (SW1 of solid structure in compares figure 3) in IC can also be borrowed and realize temperature control.Temperature-sensitive electricity
The build-out resistor of resistance outside can add (as shown in Figure 3), directly can also be realized using the digital regulation resistance inside processor
(as shown in Figure 4).
It is processor specific workflow figure in the present embodiment shown in Fig. 6 such as Fig. 5.Wherein, Fig. 5 is to be based on NTC temperature-sensitives
Workflow diagram of the temperature control summing elements switching touch-screen verification platform of resistance when enabling simulation summing elements.With temperature
Rise, NTC resistances reduce, and work as T>During T0, VEN1:1->0, SW1 disconnects, and starts analogue integrator (simulation summing elements), its
In, T:Current Temperatures point, T0:Non- critically weighted, VEN1:Switch SW1 and enable voltage.
Fig. 6 is that the temperature control summing elements switching touch-screen verification platform based on NTC thermistor is enabling the cumulative list of numeral
Workflow diagram when first.As temperature reduces, the rise of NTC resistances, work as T<During T0, VEN1:0->1, SW1 closure, starts numeral
Summing elements, wherein, T:Current Temperatures point, T0:Non- critically weighted, VEN1:Switch SW1 and enable voltage.
Concrete operating principle is as follows:The resistance value of NTC thermistor reduces after temperature of processor rise, closely faces when being reduced to
During boundary's temperature spot, its voltage output enables EN1 effectively (1->0), switch SW1 to disconnect, the digital summing elements inside processor close
Close, test platform enters simulation accumulation mode, and signal NTC_F=1 is produced while SW1 disconnects, and processor receives NTC_F signals
After close digital summing elements, delay a period of time, wait simulation is cumulative to complete, V exported under this patternINTo simulate and being worth, directly
Tap into and carry out analog-to-digital conversion into data acquisition unit, the data signal after conversion carries out the subsequent operations such as FFT.When temperature reduces
When, the resistance value increase of NTC thermistor, the invalid (0- of EN1>1), switch SW1 to close, NTC_F=0, the mould inside processor
Intend summing elements to close, test platform enters digital accumulation mode, input signal VINInto data acquisition unit, after analog-to-digital conversion
Data signal be admitted to digital summing elements and add up, output digital sum value carries out the subsequent operations such as FFT.Both combinations make
With, alleviate processor burden, it is too high to avoid temperature.
Temperature of processor control circuit provided in an embodiment of the present invention, has the following advantages that:
(1) circuit structure is implemented in combination with temperature control using switch with thermistor, without the real-time collecting temperature data of processor,
Real-time summing elements switching, reduces processor workload;
(2) circuit structure is simplified, and it is i.e. achievable that minimum structure of controlling temperature only needs to add NTC thermistor, remaining device or can
It is unused using IC remainders, or can time-sharing multiplex;
(3) combining analogue integrator and digital summing elements are realized, both switchings use, and reduce processor workload,
Temperature is reduced, so as to reduce electric current, reduces power consumption.
(4) thermistor reference voltage is exported by processor in circuit structure, can be more by programming modification register value
Change, therefore can switch and match with different type so that circuit design is more flexible.
(5) switching used in circuit structure switch need it is outside add, can be in time-sharing multiplex wherein touch-screen detection circuit
Switch or switch IC inside it is untapped switch realize switching, reduce the introducing of component.
Embodiment of above is merely to illustrate the present invention, and not limitation of the present invention, about the common of technical field
Technical staff, without departing from the spirit and scope of the present invention, it can also make a variety of changes and modification, thus it is all
Equivalent technical scheme falls within scope of the invention, and scope of patent protection of the invention should be defined by the claims.
Claims (10)
- A kind of 1. temperature of processor control circuit, it is characterised in that including:Data signal summing elements, it is arranged inside the processor;Analog signal summing elements, it is arranged at outside the processor;And temperature control unit;Wherein, the data signal summing elements, for according to the cumulative letter of the external input signal of processor generation numeral Number;The analog signal summing elements, for generating simulation cumulative signal according to the external input signal, and by the mould Intend cumulative signal and be supplied to the processor;Change of the temperature control unit based on the temperature of processor, control data signal summing elements and described The switch of analog signal summing elements so that when the temperature of the processor is more than or equal to the threshold value of setting, the number Word signal summing elements are closed, and simulation cumulative signal is provided to the processor by the analog signal summing elements;When described When the temperature of processor is less than the threshold value of setting, the analog signal summing elements are closed, by the data signal summing elements Digital cumulative signal is provided to the processor.
- 2. temperature of processor control circuit as claimed in claim 1, it is characterised in thatThe temperature control unit includes temperature detecting unit and switch control unit;Wherein, the temperature detecting unit is used for the change for detecting the temperature of processor, and according to the temperature and the threshold value Relation, provide corresponding control signal to the switch control unit;The switch control unit controls the data signal summing elements and the analog signal according to the control signal The switch of summing elements.
- 3. temperature of processor control circuit as claimed in claim 2, it is characterised in thatThe temperature detecting unit includes thermistor and build-out resistor;Wherein, the first end of the thermistor is connected to the first reference voltage, and the second end of the thermistor is connected to institute State the first end of build-out resistor, the second end of the build-out resistor is connected to the second reference voltage, and the second of the thermistor Connecting node between end and the first end of the build-out resistor provides control signal to the switch control unit.
- 4. temperature of processor control circuit as claimed in claim 3, it is characterised in thatThe build-out resistor is arranged at the inside of the processor.
- 5. temperature of processor control circuit as claimed in claim 3, it is characterised in thatThe build-out resistor is arranged at the outside of the processor.
- 6. temperature of processor control circuit as claimed in claim 3, it is characterised in thatSecond reference voltage is provided by the processor.
- 7. temperature of processor control circuit as claimed in claim 2, it is characterised in thatThe switch control unit includes switching and switched, and it receives the control signal of the temperature detecting unit, and according to described Control signal controls the switch of the data signal summing elements and the analog signal summing elements.
- 8. temperature of processor control circuit as claimed in claim 7, it is characterised in thatThe temperature of processor control circuit is used for touch-screen detection circuit, and the switching switch detects circuit for the touch-screen In untapped switch.
- 9. temperature of processor control circuit as claimed in claim 7, it is characterised in thatThe temperature of processor control circuit is used for touch-screen detection circuit, and the switching switch is touch-screen described in time-sharing multiplex The switch used in detection circuit.
- 10. temperature of processor control circuit as claimed in claim 7, it is characterised in thatThe temperature of processor control circuit is used for touch-screen detection circuit, and the switching switch detects circuit for the touch-screen Outside independent switch.
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CN201610007267.2A CN105652916B (en) | 2016-01-06 | 2016-01-06 | Temperature of processor control circuit |
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CN106023507A (en) * | 2016-06-23 | 2016-10-12 | 黑龙江正基消防工程有限公司 | Fire fighting control system fire alarm controller based on integrated touch screen machine |
CN108255348B (en) * | 2018-01-29 | 2021-09-14 | 京东方科技集团股份有限公司 | Signal accumulation mode switching circuit and touch screen detection circuit |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5619422A (en) * | 1992-12-18 | 1997-04-08 | Hitachi Koki Company Limited | Rotor temperature control system |
US6091255A (en) * | 1998-05-08 | 2000-07-18 | Advanced Micro Devices, Inc. | System and method for tasking processing modules based upon temperature |
CN1294333A (en) * | 1999-10-21 | 2001-05-09 | 神基科技股份有限公司 | Heat radiating control system of computer |
CN1606724A (en) * | 2002-03-15 | 2005-04-13 | 英特尔公司 | Processor temperature control interface |
CN201210281Y (en) * | 2008-05-30 | 2009-03-18 | 研华股份有限公司 | Overheat breaker device for central processing unit |
CN103197747A (en) * | 2012-01-04 | 2013-07-10 | 三星电子株式会社 | Temperature management circuit, system on chip including the same, and method of managing temperature |
CN103376869A (en) * | 2012-04-28 | 2013-10-30 | 华为技术有限公司 | Temperature feedback control system and method for DVFS (Dynamic Voltage Frequency Scaling) |
CN105094251A (en) * | 2014-05-23 | 2015-11-25 | 西安中兴新软件有限责任公司 | Intelligent temperature control device, intelligent temperature control method and terminal |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6965840B2 (en) * | 2001-07-09 | 2005-11-15 | Sis-Tech Applications, L.P. | Dual sensor process temperature switch having a high-diagnostic one-out-of-two voting architecture |
TWI246392B (en) * | 2003-11-19 | 2005-12-21 | Shuttle Inc | Temperature measurement method and apparatus thereof |
CN103135634A (en) * | 2013-01-18 | 2013-06-05 | 上海交通大学 | Temperature control method and device for polymerase chain reaction biochip |
CN104635886A (en) * | 2013-11-15 | 2015-05-20 | 鸿富锦精密工业(武汉)有限公司 | VRM temperature adjusting system and method |
CN104331102B (en) * | 2014-09-18 | 2016-06-15 | 杭州电子科技大学 | Laser temperature control circuit based on TEC |
-
2016
- 2016-01-06 CN CN201610007267.2A patent/CN105652916B/en not_active Expired - Fee Related
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5619422A (en) * | 1992-12-18 | 1997-04-08 | Hitachi Koki Company Limited | Rotor temperature control system |
US6091255A (en) * | 1998-05-08 | 2000-07-18 | Advanced Micro Devices, Inc. | System and method for tasking processing modules based upon temperature |
CN1294333A (en) * | 1999-10-21 | 2001-05-09 | 神基科技股份有限公司 | Heat radiating control system of computer |
CN1606724A (en) * | 2002-03-15 | 2005-04-13 | 英特尔公司 | Processor temperature control interface |
CN201210281Y (en) * | 2008-05-30 | 2009-03-18 | 研华股份有限公司 | Overheat breaker device for central processing unit |
CN103197747A (en) * | 2012-01-04 | 2013-07-10 | 三星电子株式会社 | Temperature management circuit, system on chip including the same, and method of managing temperature |
CN103376869A (en) * | 2012-04-28 | 2013-10-30 | 华为技术有限公司 | Temperature feedback control system and method for DVFS (Dynamic Voltage Frequency Scaling) |
CN105094251A (en) * | 2014-05-23 | 2015-11-25 | 西安中兴新软件有限责任公司 | Intelligent temperature control device, intelligent temperature control method and terminal |
Non-Patent Citations (1)
Title |
---|
基于硬件策略控制中央处理器温度的研究;魏绍蓉;《学术技术》;20120131;第49-51页 * |
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