CN105652916A - Processor temperature control circuit - Google Patents
Processor temperature control circuit Download PDFInfo
- Publication number
- CN105652916A CN105652916A CN201610007267.2A CN201610007267A CN105652916A CN 105652916 A CN105652916 A CN 105652916A CN 201610007267 A CN201610007267 A CN 201610007267A CN 105652916 A CN105652916 A CN 105652916A
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- Prior art keywords
- processor
- temperature
- switch
- summing elements
- control circuit
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
Abstract
The invention relates to the technical field of temperature control digital circuits and particularly relates to a processor temperature control circuit. The processor temperature control circuit comprises a digital signal accumulation unit, an analog signal accumulation unit and a temperature control unit. The temperature control unit controls the on/off states of the digital signal accumulation unit and the analog signal accumulation unit based on the temperature variation of a processor. In this way, when the temperature of the processor is larger than or equal to a preset threshold, the digital signal accumulation unit is switched off. At the same time, the analog signal accumulation unit provides an analog accumulative signal to the processor. According to the technical scheme of the processor temperature control circuit, the temperature control unit controls the on/off states of the digital signal accumulation unit and the analog signal accumulation unit based on the temperature variation of the processor, so that the digital signal accumulation unit and the analog signal accumulation unit are switched to be put to use. Therefore, the workload of the processor is reduced maximally. The temperature of the processor is reduced, so that the current is reduced. The power consumption is lowered.
Description
Technical field
The present invention relates to temperature control digital circuit technique field, particularly relate to a kind of temperature of processor control circuit.
Background technology
Constantly perfect along with touch screen technology, its verification platform processor such as FPGA, ARM scheduling algorithm scale constantly expands, and operand is increasing. Touch screen verification platform of the prior art does not have monitoring temperature mechanism temporarily, the structure that many employings analogue integrator (simulation summing elements) or numeral summing elements are used alone in signal is cumulative. Single simulation summing elements or numeral the multiple of summing elements are used alone, make device bear pressure to be gradually increased, when causing high-speed cruising, own temperature continues to raise, when chip is in a certain critically weighted, electric current can increase sharply suddenly, temperature explosion type rises, current surge, IC operation irregularity, the even damage of self irrecoverability can be caused in this situation. Even if can recover after IC power-off, also affecting normal testing process, interrupt test works.
As it is shown in figure 1, monitor system for conventional temperature of processor. Wherein, the magnitude of voltage that data acquisition unit Real-time Collection critesistor is corresponding, by the data comparing unit of the digital signal output after conversion to processor, by comparing with preset temperature spot, realizing temperature to judge, comparative result is sent to other logic control parts by control signal output unit. This structure uses the numeral independent structure of summing elements so that device bears pressure and is gradually increased, and when causing high-speed cruising, own temperature continues to raise, and causes IC operation irregularity, causes major injury, affects test job efficiency.
Summary of the invention
(1) to solve the technical problem that
The technical problem to be solved in the present invention is to provide a kind of temperature of processor control circuit, to overcome touch screen verification platform of the prior art there is no monitoring temperature mechanism temporarily, the structures adopting simulation summing elements or numeral summing elements to be used alone in signal is cumulative more, make device bear pressure to be gradually increased, when causing high-speed cruising, own temperature continues to raise, cause IC operation irregularity, cause major injury, affect test job efficiency.
(2) technical scheme
For solving the problems referred to above, embodiments provide a kind of temperature of processor control circuit, including:
Digital signal summing elements, is arranged at inside described processor;
Analogue signal summing elements, it is arranged at outside described processor;
And, temperature control unit;
Wherein, described digital signal summing elements, generate numeral cumulative signal for the external input signal according to described processor;
Described analogue signal summing elements, for generating simulation cumulative signal according to described external input signal, and is supplied to described processor by described simulation cumulative signal;
Described temperature control unit is based on the change of described temperature of processor, control described digital signal summing elements and the switch of described analogue signal summing elements, make when the temperature of described processor is more than or equal to the threshold value set, described digital signal summing elements is closed, described analogue signal summing elements provide simulation cumulative signal to described processor; When the temperature of described processor is less than the threshold value set, described analogue signal summing elements is closed, described digital signal summing elements provide numeral cumulative signal to described processor.
Preferably, described temperature control unit includes temperature detecting unit and switch control unit;
Wherein, described temperature detecting unit is for detecting the change of described temperature of processor, and the relation according to this temperature Yu described threshold value, provides corresponding control signal to described switch control unit;
Described switch control unit controls the switch of described digital signal summing elements and described analogue signal summing elements according to described control signal.
Preferably, described temperature detecting unit includes critesistor and build-out resistor;
Wherein, first end of described critesistor is connected to the first reference voltage, second end of described critesistor is connected to the first end of described build-out resistor, second end of described build-out resistor is connected to the second reference voltage, and the connection node between the second end and first end of described build-out resistor of described critesistor provides control signal to described switch control unit.
Preferably, described build-out resistor is arranged at the inside of described processor.
Preferably, described build-out resistor is arranged at the outside of described processor.
Preferably, described second reference voltage is provided by described processor.
Preferably, described switch control unit includes switching switch, and it receives the control signal of described temperature detecting unit, and controls the switch of described digital signal summing elements and described analogue signal summing elements according to described control signal.
Preferably, described temperature of processor control circuit is used for touch screen testing circuit, and described switching switch is untapped switch in described touch screen testing circuit.
Preferably, described temperature of processor control circuit is used for touch screen testing circuit, the described switching switch switch for having used in touch screen testing circuit described in time-sharing multiplex.
Preferably, described temperature of processor control circuit is used for touch screen testing circuit, and described switching switch is the independent switch outside described touch screen testing circuit.
(3) beneficial effect
The present invention provides a kind of temperature of processor control circuit, by the temperature control unit change based on temperature of processor, control the switch of digital signal summing elements and described analogue signal summing elements, thus the switching realizing both uses, at utmost reduce processor workload, reducing temperature, thus reducing electric current, reducing power consumption.
Accompanying drawing explanation
Fig. 1 is embodiment of the present invention temperature of processor control circuit structural representation;
Fig. 2 is embodiment of the present invention temperature of processor control circuit structural representation;
Fig. 3 is embodiment of the present invention temperature control summing elements switching touch screen verification platform system structure scheme one schematic diagram based on critesistor NTC;
Fig. 4 is embodiment of the present invention temperature control summing elements switching touch screen verification platform system structure scheme two schematic diagram based on critesistor NTC;
Fig. 5 is based on the temperature control summing elements switching touch screen verification platform of the NTC thermistor workflow diagram when enabling simulation summing elements;
Fig. 6 is based on the temperature control summing elements switching touch screen verification platform of the NTC thermistor workflow diagram when enabling numeral summing elements.
Detailed description of the invention
Below in conjunction with drawings and Examples, that the present invention is described in detail is as follows.
As in figure 2 it is shown, the present invention's provides a kind of temperature of processor control circuit, including:
Digital signal summing elements, is arranged at inside described processor;
Analogue signal summing elements, it is arranged at outside described processor;
And, temperature control unit;
Wherein, described digital signal summing elements, generate numeral cumulative signal for the external input signal according to described processor;
Wherein, analogue signal summing elements, for generating simulation cumulative signal according to described external input signal, and described simulation cumulative signal is supplied to described processor;
Temperature control unit is based on the change of described temperature of processor, control described digital signal summing elements and the switch of described analogue signal summing elements, make when the temperature of described processor is more than or equal to the threshold value set, described digital signal summing elements is closed, described analogue signal summing elements provide simulation cumulative signal to described processor; When the temperature of described processor is less than the threshold value set, described analogue signal summing elements is closed, described digital signal summing elements provide numeral cumulative signal to described processor.
Wherein, described temperature control unit includes temperature detecting unit and switch control unit;
Described temperature detecting unit is for detecting the change of described temperature of processor, and the relation according to this temperature Yu described threshold value, provides corresponding control signal to described switch control unit;
Described switch control unit controls the switch of described digital signal summing elements and described analogue signal summing elements according to described control signal.
Described temperature detecting unit includes critesistor and build-out resistor;
Wherein, first end of described critesistor is connected to the first reference voltage, second end of described critesistor is connected to the first end of described build-out resistor, second end of described build-out resistor is connected to the second reference voltage, and the connection node between the second end and first end of described build-out resistor of described critesistor provides control signal to described switch control unit.
Build-out resistor in the present embodiment is arranged at the inside of described processor, it is also possible to be arranged at the outside of processor.
The first reference voltage in the present embodiment can ground connection, the second reference voltage is provided by described processor.
Wherein, described switch control unit includes switching switch, and it receives the control signal of described temperature detecting unit, and controls the switch of described digital signal summing elements and described analogue signal summing elements according to described control signal.
Described temperature of processor control circuit is used for touch screen testing circuit, and described switching switch is untapped switch in described touch screen testing circuit.
Temperature of processor control circuit in the present embodiment is used for touch screen testing circuit, the described switching switch switch for having used in touch screen testing circuit described in time-sharing multiplex.
Temperature of processor control circuit is used for touch screen testing circuit, and described switching switch is the independent switch outside described touch screen testing circuit.
This temperature of processor control circuit application for touch screen testing circuit is described in detail below.
As it is shown on figure 3, the temperature control summing elements based on critesistor NTC switches touch screen verification platform system structure scheme one. Wherein, build-out resistor is outside interpolation resistance; Bold portion represents and realizes switching by the switch in multiplexing testing circuit, and dotted portion represents and realizes switching by the internal untapped switch of switch IC.
Fig. 4 is based on the temperature control summing elements switching touch screen verification platform system structure scheme two of critesistor NTC. Wherein, build-out resistor is containing resistance inside processor; Bold portion represents and realizes switching by the switch in multiplexing testing circuit, and dotted portion represents and realizes switching by the internal untapped switch of switch IC.
The present embodiment uses NTC thermistor (NTC:NegativeTemperatureCoefficient) realize monitoring temperature, raise its resistance with temperature and reduce. Before touch screen verification platform works, need to according to device operand and practical service environment, by specifically testing the critically weighted confirming processor, comparison critesistor characteristic curve determines this temperature spot correspondence resistance, can obtain the startup voltage of switch SW1. This magnitude of voltage will be used for controlling the switching opening and having closed simulation summing elements and numeral summing elements of switch SW1. The electrical voltage point VCC of NTC thermistor is controlled output by processor power supply outgoing management unit, can pass through to program change register configuration, data book according to selected switch IC arranges the startup electrical voltage point of switch, to mate with dissimilar switch, makes circuit design more flexible. The introducing of switch, critesistor is arranged single temperature spot, just can realize the switching of summing elements, the circuit structure shown in Fig. 1 need not be used: processor calls the magnitude of voltage that data acquisition Real-time Collection critesistor is corresponding, realize summing elements switching by difference comparsion, alleviate processor workload. Simultaneously in testing touch screen platform, on-off circuit is used to carry out capacitor charge and discharge operation, can use as summing elements switching by time-sharing multiplex wherein certain detection switch, additionally due to existing switch IC is internal comprises multiple switch more, and discrete enable can be realized control, it is also possible to use untapped switch in IC (in comparison Fig. 3 the SW1 of solid structure) and realize temperature control. The build-out resistor of critesistor outside can add (as shown in Figure 3), it is also possible to directly uses the digital regulation resistance within processor to realize (as shown in Figure 4).
As shown in Fig. 5, Fig. 6, for processor specific works flow process figure in the present embodiment. Wherein, Fig. 5 is based on the temperature control summing elements switching touch screen verification platform of the NTC thermistor workflow diagram when enabling simulation summing elements. Along with temperature raise, NTC resistance reduce, as T > T0 time, VEN1:1-> 0, SW1 disconnect, start analogue integrator (simulation summing elements), wherein, T: Current Temperatures point, T0: non-critically weighted, VEN1: switch SW1 enable voltage.
Fig. 6 is based on the temperature control summing elements switching touch screen verification platform of the NTC thermistor workflow diagram when enabling numeral summing elements.Along with temperature reduces, NTC resistance raises, and when T<during T0, VEN1:0->1, SW1 closes, starts numeral summing elements, wherein, T: Current Temperatures point, T0: non-critically weighted, VEN1: switch SW1 enables voltage.
Specific works principle is as follows: after temperature of processor rising, the resistance value of NTC thermistor reduces, when being reduced near critical temperature spot, the output of its voltage enables EN1 effectively (1-> 0), and switch SW1 disconnects, and the digital summing elements within processor is closed, test platform enters simulation accumulation mode, SW1 produces signal NTC_F=1 while disconnecting, and processor cuts out numeral summing elements after receiving NTF signal, postpone a period of time, wait that simulation has added up, under this pattern, export VINFor simulating and value, being directly entered data acquisition unit and carry out analog digital conversion, the digital signal after conversion carries out the subsequent operations such as FFT. When the temperature decreases, the resistance value of NTC thermistor increases, EN1 invalid (0-> 1), switch SW1 Guan Bi, NTC_F=0, and the simulation summing elements within processor is closed, and test platform enters numeral accumulation mode, inputs signal VINEntering data acquisition unit, the digital signal after analog digital conversion is admitted to numeral summing elements and adds up, and output digital sum value carries out the subsequent operations such as FFT. Both combination uses, alleviate processor burden, it is to avoid temperature is too high.
The temperature of processor control circuit that the embodiment of the present invention provides, has the advantage that
(1) circuit structure uses switch and critesistor to be implemented in combination with temperature control, and without processor Real-time Collection temperature data, real-time summing elements switches, and reduces processor workload;
(2) circuit structure is simplified, and minimum structure of controlling temperature only needs to add NTC thermistor and can realize, and all the other devices maybe can use IC remainder unused, or can time-sharing multiplex;
(3) realizing in conjunction with analogue integrator and numeral summing elements, both switchings use, and reduce processor workload, reduce temperature, thus reducing electric current, reduce power consumption.
(4) in circuit structure, critesistor reference voltage is exported by processor, can change by programming amendment register value, therefore can mate with dissimilar switch so that circuit design is more flexible.
(5) switching switch used in circuit structure needs outside interpolation, switch in time-sharing multiplex wherein touch screen testing circuit or the internal untapped switch of switch IC can realize switching, reduce the introducing of components and parts.
Embodiment of above is merely to illustrate the present invention; and it is not limitation of the present invention; those of ordinary skill about technical field; without departing from the spirit and scope of the present invention; can also make a variety of changes and modification; therefore all equivalent technical schemes fall within scope of the invention, and the scope of patent protection of the present invention should be defined by the claims.
Claims (10)
1. a temperature of processor control circuit, it is characterised in that including:
Digital signal summing elements, is arranged at inside described processor;
Analogue signal summing elements, is arranged at outside described processor;
And, temperature control unit;
Wherein, described digital signal summing elements, generate numeral cumulative signal for the external input signal according to described processor;
Described analogue signal summing elements, for generating simulation cumulative signal according to described external input signal, and is supplied to described processor by described simulation cumulative signal;
Described temperature control unit is based on the change of described temperature of processor, control described digital signal summing elements and the switch of described analogue signal summing elements, make when the temperature of described processor is more than or equal to the threshold value set, described digital signal summing elements is closed, described analogue signal summing elements provide simulation cumulative signal to described processor; When the temperature of described processor is less than the threshold value set, described analogue signal summing elements is closed, described digital signal summing elements provide numeral cumulative signal to described processor.
2. temperature of processor control circuit as claimed in claim 1, it is characterised in that
Described temperature control unit includes temperature detecting unit and switch control unit;
Wherein, described temperature detecting unit is for detecting the change of described temperature of processor, and the relation according to this temperature Yu described threshold value, provides corresponding control signal to described switch control unit;
Described switch control unit controls the switch of described digital signal summing elements and described analogue signal summing elements according to described control signal.
3. temperature of processor control circuit as claimed in claim 2, it is characterised in that
Described temperature detecting unit includes critesistor and build-out resistor;
Wherein, first end of described critesistor is connected to the first reference voltage, second end of described critesistor is connected to the first end of described build-out resistor, second end of described build-out resistor is connected to the second reference voltage, and the connection node between the second end and first end of described build-out resistor of described critesistor provides control signal to described switch control unit.
4. temperature of processor control circuit as claimed in claim 3, it is characterised in that
Described build-out resistor is arranged at the inside of described processor.
5. temperature of processor control circuit as claimed in claim 3, it is characterised in that
Described build-out resistor is arranged at the outside of described processor.
6. temperature of processor control circuit as claimed in claim 3, it is characterised in that
Described second reference voltage is provided by described processor.
7. temperature of processor control circuit as claimed in claim 2, it is characterised in that
Described switch control unit includes switching switch, and it receives the control signal of described temperature detecting unit, and controls the switch of described digital signal summing elements and described analogue signal summing elements according to described control signal.
8. temperature of processor control circuit as claimed in claim 7, it is characterised in that
Described temperature of processor control circuit is used for touch screen testing circuit, and described switching switch is untapped switch in described touch screen testing circuit.
9. temperature of processor control circuit as claimed in claim 7, it is characterised in that
Described temperature of processor control circuit is used for touch screen testing circuit, the described switching switch switch for having used in touch screen testing circuit described in time-sharing multiplex.
10. temperature of processor control circuit as claimed in claim 7, it is characterised in that
Described temperature of processor control circuit is used for touch screen testing circuit, and described switching switch is the independent switch outside described touch screen testing circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610007267.2A CN105652916B (en) | 2016-01-06 | 2016-01-06 | Temperature of processor control circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610007267.2A CN105652916B (en) | 2016-01-06 | 2016-01-06 | Temperature of processor control circuit |
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| CN105652916A true CN105652916A (en) | 2016-06-08 |
| CN105652916B CN105652916B (en) | 2017-12-01 |
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| CN201610007267.2A Expired - Fee Related CN105652916B (en) | 2016-01-06 | 2016-01-06 | Temperature of processor control circuit |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106023507A (en) * | 2016-06-23 | 2016-10-12 | 黑龙江正基消防工程有限公司 | Fire fighting control system fire alarm controller based on integrated touch screen machine |
| CN108255348A (en) * | 2018-01-29 | 2018-07-06 | 京东方科技集团股份有限公司 | A kind of signal adds up mode switching circuit, touch screen detection circuit |
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| CN105652916B (en) | 2017-12-01 |
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Granted publication date: 20171201 Termination date: 20220106 |