CN105628986A - Detection probe production method of reducing cost - Google Patents

Abstract

The present invention discloses a detection probe production method of reducing cost. When a probe is produced, a probe head, a spring, a probe sleeve and a probe tail are simplified, and the two ends of the spring extend out of a connection segment, thereby saving the probe head, the probe tail and the probe sleeve. The advantage of the present invention is that: the structure of the probe is simplified, thereby reducing the raw material purchase and production cost greatly, and being able to save about 70% cost.

Description

A kind of detection probe production method reducing cost

Technical field

The present invention relates to a kind of production method reducing cost.

Background technology

Chip IC detection probe, core technology still rests in offshore company's hands, and domestic production manufacturer plays an active part in research and development, but only sub-fraction successfully produces. Its complicated structure is made up of spring, probe, probe tail, 4 parts of probe sleeve, because IC detection probe is very tiny, so assembling and mounting process requirement height, thus the production cost forming probe is high.

Summary of the invention

Goal of the invention: for the problems referred to above, it is an object of the invention to provide a kind of detection probe production method in the premise decline low cost not affecting test performance.

The syringe needle of probe, spring, probe sleeve, four parts of probe tail, when producing, are simplified, spring both end extension are gone out linkage section, saves probe, probe tail and probe sleeve by technical scheme: a kind of detection probe production method reducing cost.

Beneficial effect: compared with prior art, it is an advantage of the invention that and simplify probe structure, thus significantly reducing materials procurement and production cost, about can save the cost of 70%.

Detailed description of the invention

Below in conjunction with specific embodiment, it is further elucidated with the present invention, it should be understood that these embodiments are merely to illustrate the present invention rather than restriction the scope of the present invention, after having read the present invention, the amendment of the various equivalent form of values of the present invention is all fallen within the application claims limited range by those skilled in the art.

Having a lot of chip in IC chip testing field is not high especially to the requirement of test spring probe, such as power management chip, LED constant current source chip, 555 clock chips etc., but these chip application are in various electronics field, so chip shipment amount is huge, testing cost is more sensitive.

A kind of detection probe production method reducing cost of the present invention, when producing, the syringe needle of probe, spring, probe sleeve, four parts of probe tail are simplified, change the shape of spring, spring both end extension is gone out linkage section, saves probe, probe tail and probe sleeve. Complicated probe structure is simplified by the present invention as far as possible, not affecting the premise decline low production cost of test performance, about can save the cost of 70%.

Claims (1)

1. the detection probe production method reducing cost, it is characterized in that: when producing, the syringe needle of probe, spring, probe sleeve, four parts of probe tail are simplified, spring both end extension is gone out linkage section, saves probe, probe tail and probe sleeve.