CN105628497A - Mark line marking ruler - Google Patents
Mark line marking ruler Download PDFInfo
- Publication number
- CN105628497A CN105628497A CN201510991685.5A CN201510991685A CN105628497A CN 105628497 A CN105628497 A CN 105628497A CN 201510991685 A CN201510991685 A CN 201510991685A CN 105628497 A CN105628497 A CN 105628497A
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- CN
- China
- Prior art keywords
- scale
- trilateral
- vertical plate
- angle
- sample
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/06—Special adaptations of indicating or recording means
- G01N3/062—Special adaptations of indicating or recording means with mechanical indicating or recording means
Abstract
The invention discloses a mark line marking ruler. The marking ruler comprises a vertical plate, a horizontal plate and a triangular scale connected with the horizontal plate, wherein the position where the overhung angle of the triangular scale is located is the to-be-marked position of a test sample. In this way, when measurement is performed, the triangular scale of the corresponding size is selected, a mark is left on the test sample by slightly rotating the overhung angle of the triangular scale, and therefore needed marking on the to-be-marked position is achieved. According to the device, the size of the triangular scale and the set position are determined according to the size of the to-be-tested test sample, and the size of the triangular scale is precise, so that a mark marked on the test sample is precise; in addition, the measurement efficiency is improved compared with microscope measurement.
Description
Technical field
The present invention relates to metallurgical technology field, mark wire tag chi in particular to one.
Background technology
Fracture toughness is tested, according to each standard-required, the precrack length of sample d/2, d//4,3d//4 (d is sample thickness) place being measured after test, position corresponding to d//2 of sample, d//4,3d//4 (d/ is sample thickness) place is position to be marked.
The mark mode of above-mentioned three positions is by prior art: 1, by vernier callipers directly in the enterprising row labels of sample, but it is relatively big that the method can make the measured place, tip of vernier callipers produce abrasion, inaccurate by the precision of the vernier callipers label size after abrasion; 2, measuring a value with microscope, directly determine the position of d//2, d//4,3d//4 by reading size, but this kind of metering system is consuming time too long, efficiency is low; 3, marking with a label creating after determining size by vernier callipers, when marking in this way, vernier callipers is moved, and affects the measuring accuracy of size, and stroke line is relatively thick, is had a certain impact the position measuring precrack.
Therefore, how to improve the precision of the position mark of crackle, ensure its efficiency of measurement simultaneously, the technical problem that written those skilled in the art are urgently to be resolved hurrily.
Summary of the invention
In view of this, the present invention provides a kind of mark wire tag chi, to improve the precision of the position mark of crackle, ensures its efficiency of measurement simultaneously.
For achieving the above object, the present invention provides following technical scheme:
A kind of mark wire tag chi, it is characterised in that, comprising:
The vertical plate can fitted with sample end face;
Leveling board connected vertically with described vertical plate, the bearing of trend of described leveling board is parallel with the thickness bearing of trend of described sample;
The trilateral scale being connected with described leveling board, a wherein limit of described trilateral scale is connected with described leveling board, and the unsettled position, angle of described trilateral scale is the position to be marked of described sample.
Preferably, the distance between described trilateral scale is unsettled angle and described vertical plate is n1/ 4d, d are sample thickness, n1It is 1,2 or 3.
Preferably, comprise at least two described trilateral scales, distance between the outstanding angle of described trilateral scale and described vertical plate of described vertical plate is 1/4d or 1/2d, and the distance between the unsettled angle of adjacent described trilateral scale be 1/4d or 1/2d, d is sample thickness.
Preferably, the unsettled angle of described trilateral scale is provided with diamond head.
Preferably, described leveling board is provided with for the slideway that described trilateral scale coordinates.
Preferably, described vertical plate and described leveling board are welded to connect.
As can be seen from technique scheme, mark wire tag chi provided by the invention, comprise vertical plate, leveling board and trilateral scale, the position, angle that wherein trilateral scale is unsettled is described sample position to be marked, so, when measuring, select the trilateral scale of corresponding size, rotate the unsettled angle of trilateral scale a little, on sample, just leave mark line, thus realize the position to be marked to needing and mark. The device that this scheme provides, determining the size of trilateral scale by the size of sample to be tested and arrange position, owing to the size of trilateral scale is accurate, the mark line being therefore marked on sample is also accurate, and measure relative to microscope, it is to increase the efficiency measured.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, it is briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
The structural representation of the mark wire tag chi of the first embodiment that Fig. 1 provides for the embodiment of the present invention;
The structural representation of the mark wire tag chi of the first embodiment that Fig. 2 provides for the embodiment of the present invention;
The structural representation of the mark wire tag chi of the 2nd kind of embodiment that Fig. 3 provides for the embodiment of the present invention;
The structural representation of the mark wire tag chi of the 2nd kind of embodiment that Fig. 4 provides for the embodiment of the present invention;
Wherein, in Fig. 1 to Fig. 4:
Vertical plate 1, leveling board 2, trilateral scale 3, first trilateral scale 3-1, the 2nd trilateral scale 3-2, the 3rd trilateral scale 3-3, sample thickness d.
Embodiment
The present invention discloses a kind of mark wire tag chi, to improve the precision of the position mark mark of crackle, ensures its efficiency of measurement simultaneously.
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only the present invention's part embodiment, instead of whole embodiments. Based on the embodiment in the present invention, those of ordinary skill in the art, not making other embodiments all obtained under creative work prerequisite, belong to the scope of protection of the invention.
Refer to Fig. 1 to Fig. 4, the structural representation of the mark wire tag chi of the first embodiment that Fig. 1 provides for the embodiment of the present invention, the structural representation of the mark wire tag chi of the first embodiment that Fig. 2 provides for the embodiment of the present invention, the structural representation of the mark wire tag chi of the 2nd kind of embodiment that Fig. 3 provides for the embodiment of the present invention, the structural representation of the mark wire tag chi of the 2nd kind of embodiment that Fig. 4 provides for the embodiment of the present invention.
The present invention discloses a kind of mark wire tag chi, comprises vertical plate 1, leveling board 2 and trilateral scale 3, wherein,
Vertical plate 1 can be fitted with sample end face;
Leveling board 2 is connected with vertical plate 1 and is arranged vertically, and the bearing of trend of leveling board 2 is parallel with the thickness bearing of trend of sample, and corresponding vertical plate 1 is vertical with the thickness bearing of trend of sample;
Trilateral scale 3 is connected with leveling board 2, and a wherein limit of trilateral scale 3 is connected with leveling board 2. The unsettled position, angle of trilateral scale 3 is the position to be marked of sample.
So, when sample is measured, the end face of vertical plate 1 with sample 1 is fitted, select corresponding trilateral scale 3, distance such as the angle of selecting trilateral unsettled and vertical plate is 1/4d, rotating mark wire tag chi a little makes trilateral scale leave mark line on sample, it is possible to obtain the mark line of sample in 1/4d position.
It should be noted that, in this embodiment, the distance between the outstanding angle of trilateral scale 3 and vertical plate 1 is set in advance good, it is possible to select corresponding trilateral scale 3 according to the one-tenth-value thickness 1/10 of sample.
In this embodiment, it provides two kinds of embodiments, it is described to the concrete set-up mode marking wire tag chi in two kinds of embodiments below,
In the first embodiment, the distance between the angle that the trilateral scale 3 of mark wire tag chi is unsettled and vertical plate 1 is n/4d, d is sample thickness, and n is 1,2 or 3. So, select the trilateral scale 3 of corresponding size, distance such as the unsettled angle and vertical plate of selecting trilateral scale 3 is 1/4d, rotating mark wire tag chi a little makes trilateral scale 3 leave mark line on sample, the mark line of sample in the position to be marked of 1/4d can be obtained, as shown in Figure 1; Select the distance between the unsettled angle of trilateral scale 3 and vertical plate 1 to be 3/4d, then the position corresponding to unsettled angle of trilateral scale 3 is the position to be marked of sample 3/4d; The trilateral scale corresponding when selecting n=2, then the position to be marked for sample 1/2d that the unsettled angle of this trilateral scale 3 marks, as shown in Figure 2.
In the 2nd kind of embodiment, this mark wire tag chi comprises three trilateral scales, distance between the outstanding angle of trilateral scale and vertical plate 1 of vertical plate 1 is 1/4d, and the distance between the unsettled angle of adjacent trilateral scale be 1/4d, d is sample thickness.
By the data arranging the different combination place needs in position of trilateral scale, distance between the unsettled angle of the trilateral scale of close vertical plate and vertical plate 1 is 1/4d, this trilateral scale is the first trilateral scale 3-1, the trilateral scale adjacent with first trilateral scale 3-1 is the 2nd trilateral scale 3-2, distance between the unsettled angle of the 2nd trilateral scale 3-2 and the unsettled angle of the first trilateral scale 3-1 is 1/4d, then distance between the unsettled angle of the 2nd trilateral scale 3-2 and vertical plate 1 is 1/2d, another trilateral scale adjacent with the 2nd trilateral scale 3-2 is the 3rd trilateral scale 3-3, distance between the unsettled angle of the 3rd trilateral scale 3-3 and the unsettled angle of the 2nd trilateral scale 3-2 is 1/4d, then distance between the unsettled angle of the 3rd trilateral scale 3-3 and vertical plate 1 is 3/4d. so, the position to be marked of 1/4d, 1/2d and 3/4d of sample can be marked by three triangular marker chis.
It should be noted that, in this embodiment, trilateral scale 3 preferably isosceles triangle scale, isosceles triangle scale is 10mm for the length of the end being connected with leveling board 2. Certainly, do not get rid of the other forms of trilateral scale of employing yet.
In addition, in this embodiment, to comprise the mark wire tag chi of three trilateral scales, the mark wire tag chi in the 2nd kind of embodiment is described, certainly, the array mode selecting other according to actual demand is not got rid of yet, as, comprise two trilateral scales, wherein first trilateral scale 3 is near vertical plate 1, and the distance between its unsettled angle and vertical plate 1 is 1/4d, distance between the unsettled angle of the trilateral scale 3 adjacent with first trilateral scale 3 and the unsettled angle of first trilateral scale 3 is 1/2d, so, the position corresponding to unsettled angle of first trilateral scale 3 is the position to be marked of sample 1/4d, the position corresponding to unsettled angle of the 2nd trilateral scale 3 is the position to be marked of sample 3/4d, as shown in Figure 4, or first trilateral scale unsettled angle and vertical plate between distance be 1/2d, distance between the unsettled angle of the 2nd trilateral scale and the unsettled angle of the first trilateral scale is 1/4d, so, the position corresponding to unsettled angle of the first trilateral scale is the position to be marked of the 1/2d of sample, the position corresponding to unsettled angle of the 2nd trilateral scale is the position to be marked of sample 3/4d.
It should be noted that, for convenience of description, diabolo scale has carried out naming again in this embodiment, does not also get rid of the naming method adopting other, and the anomia of trilateral scale is as the foundation limiting protection domain.
In order to ensure the working strength of trilateral scale 3, it is preferable that, the unsettled angle of trilateral scale 3 is provided with diamond head.
Being provided with on leveling board 2 and the slideway that trilateral scale 3 coordinates, trilateral scale 3 can in interior slip, it is preferable that, trilateral scale 3 slideway shrink-fit, avoids trilateral scale 3 to slide arbitrarily in slideway.
It should be noted that, in this embodiment, after trilateral scale 3 slides and puts in place, it is relative with leveling board fixing, and so, when marking, the position that arranges of trilateral scale 3 maintains static, and ensure that can the accuracy of scribing position.
What need to illustrate further is, in this embodiment, in order to increase the suitability of mark wire tag chi further, leveling board 2 is provided with scale marks, as required trilateral scale 3 can be slided, when the scale marks corresponding to leveling board 2 when the reference line of trilateral scale 3 coincides, now set square scale 3 motion puts in place, and the position corresponding to unsettled angle of trilateral scale 3 is the position to be marked of sample. So, coordinating by scale marks and trilateral scale 3, it is possible to corresponding position to be marked can be marked by slip trilateral scale 3, the accuracy of mark line position is ensured.
In this scheme, vertical plate 1 and leveling board 2 are welded to connect, or vertical plate 1 is one-body molded with leveling board 2.
The size of the trilateral scale 3 provided in this scheme is accurate, treat mark position by accurate in size trilateral scale 3 to mark, thus ensure that the precision of mark line, after trilateral scale 3 damages, can change by diabolo scale 3 in time, avoid measuring accuracy being impacted, and only need to change trilateral scale 3 in Renewal process, reduce cost accordingly. Obtain mark position by trilateral scale 3 combination, measures with respect to microscope, it is to increase the speed of measurement.
To the above-mentioned explanation of the disclosed embodiments, professional and technical personnel in the field are enable to realize or use the present invention. To be apparent for those skilled in the art to the multiple amendment of these embodiments, General Principle as defined herein can without departing from the spirit or scope of the present invention, realize in other embodiments. Therefore, the present invention can not be limited in these embodiments shown in this article, but be met the widest scope consistent with principle disclosed herein and features of novelty.
Claims (6)
1. a mark wire tag chi, it is characterised in that, comprising:
The vertical plate (1) can fitted with sample end face;
With described vertical plate (1) leveling board connected vertically (2), the bearing of trend of described leveling board (2) is parallel with the thickness bearing of trend of described sample;
The trilateral scale (3) being connected with described leveling board (2), a wherein limit of described trilateral scale (3) is connected with described leveling board (2), and the position, angle that described trilateral scale (3) is unsettled is the position to be marked of described sample.
2. mark wire tag chi according to claim 1, it is characterised in that, the distance between the angle that described trilateral scale is unsettled and described vertical plate (1) is n1/ 4d, d are sample thickness, n1It is 1,2 or 3.
3. mark wire tag chi according to claim 1, it is characterized in that, comprise at least two described trilateral scales, distance between the outstanding angle of the described trilateral scale (3) of close described vertical plate (1) and described vertical plate (1) is 1/4d or 1/2d, and the distance between the unsettled angle of adjacent described trilateral scale (3) be 1/4d or 1/2d, d is sample thickness.
4. mark wire tag chi according to the arbitrary item of claims 1 to 3, it is characterised in that, the unsettled angle of described trilateral scale (3) is provided with diamond head.
5. mark wire tag chi according to claim 4, it is characterised in that, described leveling board (1) is provided with for the slideway that described trilateral scale (3) coordinates.
6. mark wire tag chi according to claim 1, it is characterised in that, described vertical plate (1) and described leveling board (2) are welded to connect.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510991685.5A CN105628497A (en) | 2015-12-24 | 2015-12-24 | Mark line marking ruler |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510991685.5A CN105628497A (en) | 2015-12-24 | 2015-12-24 | Mark line marking ruler |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105628497A true CN105628497A (en) | 2016-06-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510991685.5A Pending CN105628497A (en) | 2015-12-24 | 2015-12-24 | Mark line marking ruler |
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| CN (1) | CN105628497A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112683170A (en) * | 2020-12-28 | 2021-04-20 | 荣旗工业科技(苏州)股份有限公司 | Method for detecting soldering position precision of soldering tin |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2037670U (en) * | 1988-07-27 | 1989-05-17 | 徐林 | Pocket drawing rule for fitters |
| CN2056504U (en) * | 1989-09-21 | 1990-04-25 | 刘宣伟 | Vernier divider caliper for hole |
| CN2119998U (en) * | 1991-07-11 | 1992-10-28 | 王建华 | Marking-out calliper gauge for work |
| CN201132451Y (en) * | 2007-12-27 | 2008-10-15 | 高雪晴 | Novel measuring rule |
| CN202229686U (en) * | 2011-06-23 | 2012-05-23 | 张锐 | Multifunctional pitch-row vernier caliper |
| CN205262341U (en) * | 2015-12-24 | 2016-05-25 | 西南铝业（集团）有限责任公司 | Mark line portrayal chi |
-
2015
- 2015-12-24 CN CN201510991685.5A patent/CN105628497A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2037670U (en) * | 1988-07-27 | 1989-05-17 | 徐林 | Pocket drawing rule for fitters |
| CN2056504U (en) * | 1989-09-21 | 1990-04-25 | 刘宣伟 | Vernier divider caliper for hole |
| CN2119998U (en) * | 1991-07-11 | 1992-10-28 | 王建华 | Marking-out calliper gauge for work |
| CN201132451Y (en) * | 2007-12-27 | 2008-10-15 | 高雪晴 | Novel measuring rule |
| CN202229686U (en) * | 2011-06-23 | 2012-05-23 | 张锐 | Multifunctional pitch-row vernier caliper |
| CN205262341U (en) * | 2015-12-24 | 2016-05-25 | 西南铝业（集团）有限责任公司 | Mark line portrayal chi |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112683170A (en) * | 2020-12-28 | 2021-04-20 | 荣旗工业科技(苏州)股份有限公司 | Method for detecting soldering position precision of soldering tin |
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Application publication date: 20160601 |