CN105607925A - Processor on-chip FLASH program burning method and burning system - Google Patents

Processor on-chip FLASH program burning method and burning system Download PDF

Info

Publication number
CN105607925A
CN105607925A CN201510953688.XA CN201510953688A CN105607925A CN 105607925 A CN105607925 A CN 105607925A CN 201510953688 A CN201510953688 A CN 201510953688A CN 105607925 A CN105607925 A CN 105607925A
Authority
CN
China
Prior art keywords
processor
pin
chip flash
test
sam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201510953688.XA
Other languages
Chinese (zh)
Other versions
CN105607925B (en
Inventor
李焱
刘明忠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Clou Electronics Co Ltd
Original Assignee
Shenzhen Clou Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Clou Electronics Co Ltd filed Critical Shenzhen Clou Electronics Co Ltd
Priority to CN201510953688.XA priority Critical patent/CN105607925B/en
Publication of CN105607925A publication Critical patent/CN105607925A/en
Application granted granted Critical
Publication of CN105607925B publication Critical patent/CN105607925B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00Arrangements for software engineering
    • G06F8/60Software deployment
    • G06F8/61Installation

Abstract

The present invention relates to a processor on-chip FLASH program burning method and burning system. The method comprises: attaching a processor to a preset substrate to obtain a target plate, and introducing an ERASE pin, a VCC pin and a UART pin of the target plate; erasing data of an on-chip FLASH of the processor by means of the ERASE pin; by means of the VCC pin, powering down and rebooting the processor of which the FLASH is erased; downloading an SAM-BA from a ROM of the processor that is powered down and rebooted to an RAM of the processor, and running the SAM-BA; and communicating with the SAM-BA in the RAM by means of the URAT pin, and sending a received target program to the on-chip FLASH of the processor. By adopting the form of first attaching and then burning, cold solder joint caused by deformation of the pin is avoided, and furthermore a PC is not required in the whole burning process; and the structure is simple, the one-click operation is convenient, and the on-chip FLASH programming efficiency is improved.

Description

Processor in-chip FLASH burning program method and programming system
Technical field
The present invention relates to singlechip technology field, particularly relate to a kind of processor in-chip FLASH burning programMethod and programming system.
Background technology
The in-chip FLASH of processor can be stored data, and user can be by specific modification of program FLASHThe data of the inside storage. Conventionally need to programme to the in-chip FLASH of processor, for example ATMELAT91SAM series processors.
In ATMELAT91SAM series processors ROM, be all solidified with a short and small Bootstrap Commissioning Program,Can in processor, download SAM-BA by this Bootstrap Commissioning Program. SAM-BA is that a kind of download compiledJourney instrument, it can pass through serial ports, USB, JTAG mouth to ATMELAT91SAM series processorsFLASH programming in sheet and outside sheet, also can by graphic interface check On-Chip peripheral state andRAM/FLASH content.
The method common two of traditional programming of the in-chip FLASH to ATMELAT91SAM series processorsKind, the first is to carry out burning by SEGGERTOOLS by JTAG emulator, adopts first paster to reburnRecord scheme, by the software control procedure on PC (PersonalComputer personal computer) to completingTarget Board after paster carries out programming, and this method cannot depart from PC, highly professional and complex operation. TheTwo kinds is to adopt special chip burner to burn sheet, adopts the first burning scheme of paster again, this method conventionally need byProcessor chips are pressed on chip carrier, and it is low that the problem that runs into pin loose contact easily causes burning sheet success rate,And press the process of processor chips easily to cause pin deformation, and when paster, being prone to rosin joint, defect rate is high. CauseThis, the in-chip FLASH programming efficiency of traditional ATMELAT91SAM series processors is low.
Summary of the invention
Based on this, be necessary for the problems referred to above, the processor in-chip FLASH that a kind of programming efficiency is high is providedBurning program method and programming system.
A kind of processor in-chip FLASH burning program method, comprises the steps:
Processor is affixed on to default substrate and obtains Target Board, and draw described Target Board ERASE pin,VCC pin and UART pin;
Wipe the in-chip FLASH data of described processor by described ERASE pin;
By described VCC pin, the described processor of wiping after in-chip FLASH data is carried out to power-off restarting;
The ROM of the described processor by described UART pin from power-off restarting downloads SAM-BA extremelyThe RAM of described processor also moves described SAM-BA;
By the described SAM-BA communication in described UART pin and described RAM, by the target receivingProgram is sent to the in-chip FLASH of described processor.
Above-mentioned processor in-chip FLASH burning program method, is affixed on default substrate by processor and obtains Target Board,ERASE pin, VCC pin and the UART pin of drawing Target Board, after completing paster, pass through ERASEPin is wiped the in-chip FLASH data of processor, downloads SAM-BA to processor from the ROM of processorRAM and move SAM-BA, by the SAM-BA communication in UART pin and RAM, will connectThe target program of receiving is sent to the in-chip FLASH of processor, thereby complete processor in-chip FLASHProgramming. By adopting the form of burning sheet after first paster, avoid pin to produce deformation and the rosin joint that causes, simultaneouslyWhole burning process is without using PC, simple in structure, and operating in a key is convenient, has improved in-chip FLASHProgramming efficiency.
A kind of programming system, comprises treating apparatus, the first communication interface and second communication interface, described processingDevice connects described the first communication interface and described second communication interface, and described second communication interface is for connectingOn Target Board ERASE pin, VCC pin and UART pin, described Target Board will be by processingDevice is affixed on default substrate and obtains;
Described treating apparatus is by described the first communication interface receiving target file, and according to described file destinationObtain target program, described treating apparatus is wiped institute by described second communication interface through described ERASE pinState the data of the in-chip FLASH of processor, and through described VCC pin, described processor is carried out to power-off weightOpen, download SAM-BA to described processor through described UART pin from the ROM of described processorRAM also moves described SAM-BA, and described treating apparatus passes through described second communication interface through described UARTDescribed SAM-BA communication in pin and described RAM, exports described target program to described processorIn-chip FLASH.
Above-mentioned programming system, treating apparatus passes through the first communication interface receiving target file, and according to target literary compositionPart obtains target program, treating apparatus by second communication interface in ERASE pin is wiped the sheet of processorFLASH data, and processor is carried out to power-off restarting through VCC pin, through UART pin from processorROM download SAM-BA to the RAM of processor and move SAM-BA through UART pin, thenSAM-BA communication in UART pin and RAM, realizes the sheet that target program is exported to processorInterior FLASH, thus the programming of processor in-chip FLASH completed. By adopting the shape of burning sheet after first pasterFormula, avoids pin to produce deformation and the rosin joint that causes, and whole burning process is without using PC, structure letter simultaneouslySingle, operating in a key is convenient, has improved in-chip FLASH programming efficiency.
Brief description of the drawings
Fig. 1 is the flow chart of processor in-chip FLASH burning program method of the present invention in an embodiment;
Fig. 2 is the flow chart of processor in-chip FLASH burning program method of the present invention in another embodiment;
Fig. 3 is the flow chart of applying processor in-chip FLASH burning program method of the present invention in an application examples;
Fig. 4 is the module map of programming system of the present invention in an embodiment;
Fig. 5 is the module map of programming system of the present invention in another embodiment;
Fig. 6 is the structural representation of programming system in an application examples.
Detailed description of the invention
With reference to figure 1, the processor in-chip FLASH burning program method in one embodiment of the invention, comprise asLower step.
S110: processor is affixed on to default substrate and obtains Target Board, and draw Target Board ERASE pin,VCC pin and UART pin. By ERASE pin, VCC being drawn completing after the paster of processorPin and UART pin are drawn, and facilitate follow-up connection to use ERASE pin, VCC pin and UART to drawPin, avoids because pin is too much, the meticulous contact inconvenience causing of pin.
Default substrate is pcb board, and Target Board has referred to the PCB of the installation of processor paster and each components and partsPlate. Processor can be ATMELAT91SAM series processors. By ATMELAT91SAM series placeReason device is affixed on Target Board, by Target Board is carried out to communication connection, can realize and ATMELThe communication of AT91SAM series processors.
The ERASE pin of Target Board is for carrying out wiping of data to the in-chip FLASH of processor; TargetThe VCC pin of plate is used for connecting power input powers to Target Board, thereby powers to processor; Target BoardUART pin comprise TX pin and RX pin, can carry out communication with processor by UART pin.
Particularly, in the present embodiment, step S110 is specially, and processor is affixed on to default substrate and obtains targetPlate, and draw ERASE pin, VCC pin and the UART pin of Target Board with the form of pad. WelderingThe contact area of dish is larger, can realize easily and being connected of corresponding pin. More specifically, the present embodimentIn, step S110 can also draw the GND pin of Target Board, by GND ground connection.
S130: the in-chip FLASH data of wiping processor by ERASE pin.
After wiping in-chip FLASH data, processor in-chip FLASH is blank, facilitates follow-up in sheetFLASH programmes.
In an embodiment, with reference to figure 2, before step S130, also comprise step S120 therein.
S120: judge whether to receive burning instruction. If so, perform step S130.
Burning instruction is the instruction that the notice inputted of user starts burning, can be to input by button operation.Accordingly, can be by having judged whether that button operation judges whether to receive burning instruction, if detectButton operation, represents that user inputs burning instruction, execution step S130, otherwise be failure to actuate. Be appreciated thatIn other embodiment, can be also to adopt other modes to carry out the input of burning instruction, for example pass through intelligenceThe inputs such as energy terminal.
S150: the processor of wiping after in-chip FLASH data is carried out to power-off restarting by VCC pin.
Stop to the operating voltage of VCC pin input processor processor power-off; Defeated to VCC pinEnter the operating voltage of processor, processor work. Processor is carried out after power-off restarting, and processor detectsIn-chip FLASH is blank, thereby guiding is from ROM (Read-OnlyMemory read-only storage) automaticallyStart.
S170: download SAM-BA extremely from the ROM of the processor after power-off restarting by UART pinThe RAM of reason device also moves SAM-BA.
SAM-BA is a kind of programming tool of downloading. Processor power-off restarting guides automatically from ROM starts,Can download the RAM of SAM-BA to processor from the ROM of processor by the boot in ROM,After having downloaded, jumping to SAM-BA carries out.
S190: by the SAM-BA communication in UART pin and RAM, the target program of reception is sent outDeliver to the in-chip FLASH of processor. So far, completed the programming of processor in-chip FLASH.
In an embodiment, with reference to figure 2, after step S190, also comprise step S210 and step thereinS230。
S210: send test instruction to processor by UART pin.
Test instruction is carried out test operation for control processor, and processor is according to the program of burning in FLASHMove test.
In an embodiment, with reference to figure 2, after step S190, before step S210, also comprise step thereinRapid S200.
S200: processor is carried out to power-off restarting by VCC pin.
Before processor is sent to test instruction, processor is carried out to power-off restarting. Power-off restarting can be guaranteedProcessor receives test signal and tests with up-to-date state, improves the accuracy of test.
S230: test by UART pin receiving processor the test data obtaining according to test instruction,And obtain test result according to test data.
Move test by sending test instruction control processor to processor, thereby obtain test result.So, can after in-chip FLASH programming, directly complete test, simple to operate, practical, reliability is high.
In an embodiment, with reference to figure 2, after step S230, also comprise step S250 therein.
S250: according to test result output notice information.
Announcement information can comprise qualified information and defective information. Wherein, qualified information is according to test knotAfter fruit judges test passes, export, defective information is exported after judging test failure according to test result.Announcement information can be exported by signal lamp, and for example, when test passes, control signal lamp shows green, surveysTry when defective, control signal lamp shows red, thereby user can learn test according to the color of signal lampResult. Be appreciated that in other embodiment, announcement information can also adopt other modes to export, exampleAs voice broadcast.
In an embodiment, after step S250, also comprise step: test result is exported and shown therein.For example, can be to export test result to touch display screen to show, so, user just can directly be led toCross touch display screen and check test result, convenient and swift.
In an embodiment, after step S250, also comprise step therein: obtain the Quick Response Code of Target Board,By the Quick Response Code corresponding stored of test data and Target Board. So, can facilitate user in the future to enter processorThe inquiry of row test result.
Above-mentioned processor in-chip FLASH burning program method, is affixed on default substrate by processor and obtains Target Board,ERASE pin, VCC pin and the UART pin of drawing Target Board, after completing paster, pass through ERASEPin is wiped the in-chip FLASH data of processor, downloads SAM-BA to processor from the ROM of processorRAM and move SAM-BA, by the SAM-BA communication in UART pin and RAM, will connectThe target program of receiving is sent to the in-chip FLASH of processor, thereby complete processor in-chip FLASHProgramming. By adopting the form of burning sheet after first paster, avoid pin to produce deformation and the rosin joint that causes, simultaneouslyWhole burning process is without using PC, simple in structure, and operating in a key is convenient, has improved in-chip FLASHProgramming efficiency.
With reference to figure 3, it is the flow chart to the programming of processor in-chip FLASH in an application examples. Wherein, burn sheetTesting integrated machine is to load the device that uses above-mentioned processor in-chip FLASH burning program method, test point bagDraw together ERASE pin, VCC pin, UART pin and GND pin that Target Board is drawn, burn built-in testingAll-in-one withstands the communication of each pin realization and Target Board by thimble.
With reference to figure 4, the programming system in one embodiment of the invention, comprises that treating apparatus 110, the first communication connectMouth 120 and second communication interface 130, treating apparatus 110 connects the first communication interface 120 and second communication connectsMouth 130, second communication interface 130 is for ERASE pin (not shown), the VCC of linking objective plate 200Pin (not shown) and UART pin (not shown), Target Board 200 is by being affixed on processor in default basePlate obtains.
Treating apparatus 110 passes through the first communication interface 120 receiving target files, and obtains according to file destinationTarget program, treating apparatus 110 is wiped the sheet of processor through ERASE pin by second communication interface 130Interior FLASH data, and through VCC pin, processor is carried out to power-off restarting, now in processor detection lugFLASH is blank, thereby guiding starts from ROM automatically. Treating apparatus 110 through UART pin fromThe ROM of reason device downloads SAM-BA to the RAM of processor and moves SAM-BA, passes through second communicationThe SAM-BA communication of interface 130 in UART pin and RAM, export target program is to processorIn-chip FLASH. So far complete the programming of processor in-chip FLASH.
Wherein, default substrate is pcb board, and Target Board 200 fingers complete processor paster and each components and partsThe pcb board of installing, the processor of paster can be ATMELAT91SAM series processors. By ATMELAT91SAM series processors is affixed on Target Board 200, by Target Board is carried out to communication connection, canRealize the communication with ATMELAT91SAM series processors.
Particularly, in the present embodiment, by the ERASE pin of Target Board 200, VCC pin and UARTPin is drawn with pad form. ERASE pin is for carrying out the wiping of data to the in-chip FLASH of processorRemove; VCC pin is used for connecting power input powers to Target Board, thereby powers to processor; UARTPin comprises TX pin and RX pin, can carry out communication with processor by UART pin. Connecing of padTactile area is larger, can realize easily and being connected of corresponding pin. More specifically, in the present embodiment, alsoCan draw the GND pin of Target Board 200, by GND ground connection.
In an embodiment, treating apparatus 110 is also for passing through second communication interface 130 through UART thereinPin output test instruction is to processor, and control processor is tested according to test instruction, treating apparatus 110Test and obtain according to test instruction through UART pin receiving processor by second communication interface 130Test data, and obtain test result according to test data. By sending test instruction control place to processorReason device moves test, thereby obtains test result. So, can be directly complete after in-chip FLASH programmingBecome test, simple to operate, practical, reliability is high.
Therein in an embodiment, before treating apparatus 110 sends test instruction, also for drawing by VCCPin carries out power-off restarting to processor. Therefore, guarantee that processor receives test signal with up-to-date state and goes forward side by sideRow test, improves the accuracy of test.
In an embodiment, the first communication interface 120 is USB interface therein. Treating apparatus 110 passes through USBInterface receiving target program, certainly, treating apparatus 110 also can upgrade treating apparatus 110 by USB interfaceInterior program of storing itself. Particularly, USB interface can be supported the file destination of BIN file format. ExampleAs, in the present embodiment, by the target program that needs programming be placed on USB flash disk Samba under catalogue, by filename moreChange Object.bin into, USB flash disk is plugged, treating apparatus 110 reads target program automatically, and is kept at selfFLASH in.
Particularly, in the present embodiment, the ERASE that second communication interface 130 withstands Target Board by thimble drawsPin, VCC pin and UART pin are connected, and realize the communication with Target Board 200.
In an embodiment, with reference to figure 5, programming system also comprises the signal lamp that connects treating apparatus 110 therein140, treating apparatus 110 according to the instruction of test result output notice to signal lamp 140, signal lamp 140 basesNotification instruction output notice information.
Announcement information can comprise qualified information and defective information. Wherein, qualified information is according to test knotAfter fruit judges test passes, export, defective information is exported after judging test failure according to test result.Signal lamp 140 is exported different announcement informations by showing different colors. For example, notification instruction correspondence is closedWhen lattice information, control signal lamp 140 shows green, when the corresponding defective information of notification instruction, and control signalLamp 140 shows red, thereby user can learn test result according to the color of signal lamp 140. Can manageSeparate, in other embodiment, announcement information can also adopt other modes to export, for example voice broadcast.
In an embodiment, with reference to figure 5, programming system also comprises the demonstration dress that connects treating apparatus 110 thereinPut 150, treating apparatus 110 exports test result to display unit 150 and shows. So, Yong HubianCan directly check test result by touch display screen, convenient and swift.
Display unit 150 can be touch display screen. User not only can see by touch display screen in real timeTest result, also can check instruction by touch display screen input, enquiry of historical data.
In an embodiment, with reference to figure 5, programming system also comprises the button that connects treating apparatus 110 therein160, user inputs burning instruction to treating apparatus 110 by button 160, controls treating apparatus 110 and carries outBurning operation. The i.e. operation to the programming of processor in-chip FLASH of burning operation. Therein in an embodiment,With reference to figure 5, programming system also comprises the supply unit 170 that connects treating apparatus 110, supply unit 170 usePower in giving treating apparatus 110.
In an embodiment, with reference to figure 5, programming system also comprises the storage dress that connects treating apparatus 110 thereinPut 180, treating apparatus 110 is also for obtaining the Quick Response Code of Target Board, treating apparatus 110 by test data andThe Quick Response Code of Target Board exports storage device 180 to and stores. So, can facilitate in the future user to locatingReason device 200 carries out the inquiry of test result.
With reference to figure 6, be the structural representation of programming system in an application examples, wherein, treating apparatus 110 adoptsCPU, ERASE, VCC, GND, UART communication interface represent second communication interface 130, burning systemSystem can be realized the in-chip FLASH programming of processor 200 and test integrated, simple to operate.
Above-mentioned programming system, treating apparatus 110 is by the first communication interface 120 receiving target files, and rootObtain target program according to file destination, treating apparatus 110 passes through second communication interface 130 through ERASE pinWipe the in-chip FLASH data of processor 200, and through VCC pin, processor 200 is carried out to power-off weightOpen, download SAM-BA to the RAM of processor operation through UART pin from the ROM of processorSAM-BA is through UART pin, and the then SAM-BA communication in UART pin and RAM, realizesTarget program is exported to the in-chip FLASH of processor, thereby complete the programming of processor in-chip FLASH.By adopting the form of burning sheet after first paster, avoid pin to produce deformation and the rosin joint that causes, simultaneously whole burningRecord process is without using PC, simple in structure, and operating in a key is convenient, has improved in-chip FLASH programming effectRate.
Each technical characterictic of the above embodiment can combine arbitrarily, for making to describe succinctly, not rightThe all possible combination of each technical characterictic in above-described embodiment is all described, but, as long as these skillsThere is not contradiction in the combination of art feature, is all considered to be the scope that this description is recorded.
The above embodiment has only expressed several embodiment of the present invention, and it describes comparatively concrete and detailed,But can not therefore be construed as limiting the scope of the patent. It should be pointed out that for this areaThose of ordinary skill, without departing from the inventive concept of the premise, can also make some distortion and changeEnter, these all belong to protection scope of the present invention. Therefore, the protection domain of patent of the present invention should be with appended powerProfit requires to be as the criterion.

Claims (10)

1. a processor in-chip FLASH burning program method, is characterized in that, comprises the steps:
Processor is affixed on to default substrate and obtains Target Board, and draw described Target Board ERASE pin,VCC pin and UART pin;
Wipe the in-chip FLASH data of described processor by described ERASE pin;
By described VCC pin, the described processor of wiping after in-chip FLASH data is carried out to power-off restarting;
The ROM of the described processor by described UART pin from power-off restarting downloads SAM-BA extremelyThe RAM of described processor also moves described SAM-BA;
By the described SAM-BA communication in described UART pin and described RAM, by the target receivingProgram is sent to the in-chip FLASH of described processor.
2. processor in-chip FLASH burning program method according to claim 1, is characterized in that,Described by the described SAM-BA communication in described UART pin and described RAM, by the target receivingProgram also comprises after being sent to the in-chip FLASH of described processor:
Send test instruction to described processor by described UART pin;
Receive described processor by described UART pin and test the survey obtaining according to described test instructionExamination data, and obtain test result according to described test data.
3. processor in-chip FLASH burning program method according to claim 2, is characterized in that,Described by the described SAM-BA communication in described UART pin and described RAM, by the target receivingAfter program is sent to the in-chip FLASH of described processor, described transmission test instruction to described processor itBefore, also comprise:
By described VCC pin, described processor is carried out to power-off restarting.
4. processor in-chip FLASH burning program method according to claim 2, is characterized in that,Describedly receive described processor by described UART pin and test the survey obtaining according to described test instructionExamination data, and after obtaining test result according to described test data, also comprise:
According to described test result output notice information.
5. processor in-chip FLASH burning program method according to claim 1, is characterized in that,Before described in-chip FLASH data of wiping described processor by described ERASE pin, also comprise:
Judge whether to receive burning instruction;
If so, carry out the described in-chip FLASH number of wiping described processor by described ERASE pinAccording to step.
6. a programming system, is characterized in that, comprises treating apparatus, the first communication interface and second communicationInterface, described treating apparatus connects described the first communication interface and described second communication interface, and described second is logicalLetter interface is for ERASE pin, VCC pin and the UART pin of linking objective plate, described Target BoardObtain by processor being affixed on to default substrate;
Described treating apparatus is by described the first communication interface receiving target file, and according to described file destinationObtain target program, described treating apparatus is wiped institute by described second communication interface through described ERASE pinState the in-chip FLASH data of processor, and through described VCC pin, described processor carried out to power-off restarting,Download the RAM of SAM-BA to described processor through described UART pin from the ROM of described processorAnd moving described SAM-BA, described treating apparatus passes through described second communication interface through described UART pinWith the described SAM-BA communication in described RAM, export described target program to the sheet of described processorFLASH。
7. programming system according to claim 6, is characterized in that, described treating apparatus is also for logicalCross described second communication interface through described UART pin output test instruction to described processor, described in controlProcessor is tested according to described test instruction, and described treating apparatus passes through described second communication interface through instituteState UART pin and receive described processor and test the test data obtaining according to described test instruction, andObtain test result according to described test data.
8. programming system according to claim 7, is characterized in that, also comprises and connects described processing dressThe signal lamp of putting, described treating apparatus is according to extremely described signal lamp of described test result output notice instruction, instituteState signal lamp according to described notification instruction output notice information.
9. programming system according to claim 7, is characterized in that, also comprises and connects described processing dressThe display unit of putting, described treating apparatus exports described test result to described display unit and shows.
10. programming system according to claim 6, is characterized in that, also comprises and connects described processingThe button of device, user to described treating apparatus, controls described processing by described key-press input burning instructionDevice is carried out burning operation.
CN201510953688.XA 2015-12-16 2015-12-16 Processor in-chip FLASH burning program method and programming system Active CN105607925B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510953688.XA CN105607925B (en) 2015-12-16 2015-12-16 Processor in-chip FLASH burning program method and programming system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510953688.XA CN105607925B (en) 2015-12-16 2015-12-16 Processor in-chip FLASH burning program method and programming system

Publications (2)

Publication Number Publication Date
CN105607925A true CN105607925A (en) 2016-05-25
CN105607925B CN105607925B (en) 2019-06-18

Family

ID=55987879

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510953688.XA Active CN105607925B (en) 2015-12-16 2015-12-16 Processor in-chip FLASH burning program method and programming system

Country Status (1)

Country Link
CN (1) CN105607925B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109683039A (en) * 2018-12-21 2019-04-26 苏州思必驰信息科技有限公司 Off-line test method and system for electronic product
CN111381838A (en) * 2018-12-28 2020-07-07 新唐科技股份有限公司 Data writing method, burning system, data updating method and storage device
CN113138777A (en) * 2021-04-09 2021-07-20 长芯盛(武汉)科技有限公司 Low-cost universal multi-path programming device and programming method suitable for various programming protocols

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060195833A1 (en) * 2005-02-25 2006-08-31 Inventec Corporation Data-burning method and system thereof based on auto-detection of computer platform
US20080234955A1 (en) * 2006-03-31 2008-09-25 International Business Machines Corporation Uniform Power Density Across Processor Cores at Burn-In
CN101865976A (en) * 2009-04-14 2010-10-20 鸿富锦精密工业(深圳)有限公司 Boundary scanning test system and test method
CN102024129A (en) * 2009-09-22 2011-04-20 三星电子株式会社 Data writing method of embedded equipment
CN202383659U (en) * 2011-10-26 2012-08-15 惠州市亿能电子有限公司 Program downloading system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060195833A1 (en) * 2005-02-25 2006-08-31 Inventec Corporation Data-burning method and system thereof based on auto-detection of computer platform
US20080234955A1 (en) * 2006-03-31 2008-09-25 International Business Machines Corporation Uniform Power Density Across Processor Cores at Burn-In
CN101865976A (en) * 2009-04-14 2010-10-20 鸿富锦精密工业(深圳)有限公司 Boundary scanning test system and test method
CN102024129A (en) * 2009-09-22 2011-04-20 三星电子株式会社 Data writing method of embedded equipment
CN202383659U (en) * 2011-10-26 2012-08-15 惠州市亿能电子有限公司 Program downloading system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109683039A (en) * 2018-12-21 2019-04-26 苏州思必驰信息科技有限公司 Off-line test method and system for electronic product
CN111381838A (en) * 2018-12-28 2020-07-07 新唐科技股份有限公司 Data writing method, burning system, data updating method and storage device
CN111381838B (en) * 2018-12-28 2023-09-01 新唐科技股份有限公司 Data writing method, burning system, data updating method and storage device
CN113138777A (en) * 2021-04-09 2021-07-20 长芯盛(武汉)科技有限公司 Low-cost universal multi-path programming device and programming method suitable for various programming protocols
CN113138777B (en) * 2021-04-09 2022-02-01 长芯盛(武汉)科技有限公司 Low-cost universal multi-path programming device and programming method suitable for various programming protocols

Also Published As

Publication number Publication date
CN105607925B (en) 2019-06-18

Similar Documents

Publication Publication Date Title
CN103399809B (en) Board method of testing and test device
CN105182371A (en) GNSS product automatic test method based on function test
CN104483959A (en) Fault simulation and test system
CN105607925A (en) Processor on-chip FLASH program burning method and burning system
CN104318882A (en) Display module testing equipment
CN104965725B (en) A kind of full-automatic firmware programming method of embedded device based on SD card
CN103997683A (en) System for using set-top-box platform to realize customizable Flash CD-ROM recorder and method thereof
CN101593903B (en) Test backboard, backboard-based loading method and backboard-based testing method
WO2020057084A1 (en) Display module test platform
CN112333057B (en) Intelligent household equipment distribution network testing method and device, executive machine and storage medium
CN108170494B (en) Application program starting method and starting system for intelligent terminal
CN101706550B (en) Method for testing mainboard
CN106950875B (en) Embedded programmer and tooling system thereof
CN106909480A (en) A kind of embedded system cross debugging method and apparatus
CN102654838A (en) Software upgrading device and method for stage lamp
CN110968329A (en) Burner and operation method and burning system thereof
CN205620994U (en) Embedded equipment processing apparatus
CN214586871U (en) Communication adapter device
CN207148816U (en) A kind of program burn writing system and electronic equipment
CN114255712B (en) Display method and display device
CN108459232A (en) touch screen test device and method
CN114138312A (en) Upgrade test method, device, electronic equipment and computer readable storage medium
CN111414283B (en) Automatic test system and automatic test method thereof
CN207164519U (en) A kind of embedded programming device and its fixture system
CN201886461U (en) Testing card capable of testing main boards in different sizes

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant