CN105606630B - 导弹外壳无损检测系统和方法 - Google Patents
导弹外壳无损检测系统和方法 Download PDFInfo
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- CN105606630B CN105606630B CN201610046079.0A CN201610046079A CN105606630B CN 105606630 B CN105606630 B CN 105606630B CN 201610046079 A CN201610046079 A CN 201610046079A CN 105606630 B CN105606630 B CN 105606630B
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- millimeter wave
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- 238000001514 detection method Methods 0.000 title claims abstract description 27
- 238000000034 method Methods 0.000 title claims description 18
- 238000012545 processing Methods 0.000 claims abstract description 38
- 238000009659 non-destructive testing Methods 0.000 claims description 26
- 238000006243 chemical reaction Methods 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 7
- 230000008878 coupling Effects 0.000 claims description 6
- 238000010168 coupling process Methods 0.000 claims description 6
- 238000005859 coupling reaction Methods 0.000 claims description 6
- 238000007689 inspection Methods 0.000 claims description 6
- 238000012360 testing method Methods 0.000 claims description 3
- 230000003321 amplification Effects 0.000 claims description 2
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 2
- 230000001066 destructive effect Effects 0.000 claims 3
- 238000003384 imaging method Methods 0.000 abstract description 63
- 230000005540 biological transmission Effects 0.000 abstract description 4
- 238000010276 construction Methods 0.000 abstract 1
- 230000000007 visual effect Effects 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 16
- 238000011161 development Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 230000001427 coherent effect Effects 0.000 description 4
- 230000010354 integration Effects 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- 230000009466 transformation Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011982 device technology Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000000779 smoke Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
- G01N22/02—Investigating the presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
- G01S13/88—Radar or analogous systems specially adapted for specific applications
- G01S13/89—Radar or analogous systems specially adapted for specific applications for mapping or imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/005—Prospecting or detecting by optical means operating with millimetre waves, e.g. measuring the black losey radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/10—Detecting, e.g. by using light barriers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3303—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object fixed; source and detector move
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/646—Specific applications or type of materials flaws, defects
Landscapes
- Physics & Mathematics (AREA)
- Remote Sensing (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Radar, Positioning & Navigation (AREA)
- Geophysics (AREA)
- Electromagnetism (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Computer Networks & Wireless Communication (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Radar Systems Or Details Thereof (AREA)
Abstract
Description
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610046079.0A CN105606630B (zh) | 2015-12-28 | 2016-01-22 | 导弹外壳无损检测系统和方法 |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201511006153 | 2015-12-28 | ||
CN2015110061538 | 2015-12-28 | ||
CN201610046079.0A CN105606630B (zh) | 2015-12-28 | 2016-01-22 | 导弹外壳无损检测系统和方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN105606630A CN105606630A (zh) | 2016-05-25 |
CN105606630B true CN105606630B (zh) | 2018-03-06 |
Family
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Family Applications (1)
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CN201610046079.0A Active CN105606630B (zh) | 2015-12-28 | 2016-01-22 | 导弹外壳无损检测系统和方法 |
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Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109358320B (zh) * | 2018-08-30 | 2021-08-31 | 江苏慧光电子科技有限公司 | 数据生成方法和系统及其存储介质 |
SG10202004777YA (en) * | 2020-05-21 | 2021-12-30 | Wavescan Tech Pte Ltd | System and method for portable microwave instrument for high-resolution, contactless non-destructive imaging |
CN113433210B (zh) * | 2021-06-24 | 2022-07-29 | 广东工业大学 | 一种无损检测的太赫兹线阵雷达扫描成像系统及方法 |
CN113514832A (zh) * | 2021-07-28 | 2021-10-19 | 吉林大学 | 基于毫米波雷达sar成像的金属探伤装置及方法 |
WO2023211360A1 (en) * | 2022-04-28 | 2023-11-02 | Wavescan Technologies Pte. Ltd. | A milli meter (mm) wave imaging system for non-destructive testing and deploying methods thereof |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7822263B1 (en) * | 2005-12-28 | 2010-10-26 | Prokoski Francine J | Method and apparatus for alignment, comparison and identification of characteristic tool marks, including ballistic signatures |
CN104303073A (zh) * | 2011-12-22 | 2015-01-21 | 雀莱斯企业股份有限公司 | 远距离毫米波表面成像雷达系统 |
CN104375141A (zh) * | 2013-08-15 | 2015-02-25 | 同方威视技术股份有限公司 | 毫米波三维全息扫描成像设备及检查方法 |
CN104751338A (zh) * | 2015-02-25 | 2015-07-01 | 广定科技(上海)有限公司 | 一种人体生态数据采集系统 |
CN204555851U (zh) * | 2014-12-31 | 2015-08-12 | 叶松 | 芯片化的毫米波收发系统 |
-
2016
- 2016-01-22 CN CN201610046079.0A patent/CN105606630B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7822263B1 (en) * | 2005-12-28 | 2010-10-26 | Prokoski Francine J | Method and apparatus for alignment, comparison and identification of characteristic tool marks, including ballistic signatures |
CN104303073A (zh) * | 2011-12-22 | 2015-01-21 | 雀莱斯企业股份有限公司 | 远距离毫米波表面成像雷达系统 |
CN104375141A (zh) * | 2013-08-15 | 2015-02-25 | 同方威视技术股份有限公司 | 毫米波三维全息扫描成像设备及检查方法 |
CN204555851U (zh) * | 2014-12-31 | 2015-08-12 | 叶松 | 芯片化的毫米波收发系统 |
CN104751338A (zh) * | 2015-02-25 | 2015-07-01 | 广定科技(上海)有限公司 | 一种人体生态数据采集系统 |
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CN105606630A (zh) | 2016-05-25 |
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Effective date of registration: 20211103 Address after: 518102 room 404, building 37, chentian Industrial Zone, chentian community, Xixiang street, Bao'an District, Shenzhen, Guangdong Province Patentee after: Shenzhen Huaxun ark Photoelectric Technology Co.,Ltd. Address before: 518102 East floor, building 37, chentian Industrial Zone, Baotian 1st Road, Xixiang, Bao'an District, Shenzhen, Guangdong Patentee before: SHENZHEN VICTOOTH TERAHERTZ TECHNOLOGY Co.,Ltd. Patentee before: SHENZHEN THZ SCIENCE AND TECHNOLOGY INNOVATION INSTITUTE |
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Effective date of registration: 20240722 Address after: Room 430, Building 37, Chentian Industrial Zone, Baotian 1st Road, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province 518100 Patentee after: Shenzhen Zhongtou Huaxun Terahertz Technology Co.,Ltd. Country or region after: China Address before: 518102 room 404, building 37, chentian Industrial Zone, chentian community, Xixiang street, Bao'an District, Shenzhen, Guangdong Province Patentee before: Shenzhen Huaxun ark Photoelectric Technology Co.,Ltd. Country or region before: China |