CN105548347A - Method for detecting defects in conductor based on electromagnetic induction principle - Google Patents
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Abstract
本发明涉及一种基于电磁感应原理的导体中缺陷探测方法，其特征在于，所述方法包括：步骤1，将小永磁体置于待测导体附近，使磁场渗透到所述待测导体中；步骤2，使所述小磁体与待测导体之间产生相对运动；步骤3，测量由微颗粒或缺陷时引起的待测导体周围的感应磁场的变化；步骤4，通过所述感应磁场变化确定所述微颗粒或缺陷的特征。本发明基于电磁感应原理的导体中缺陷探测方法，电磁学原理清晰；测量仪机构简单；测量准确度高；测量效率高；并且不要求待测试样导磁，因而适用范围更为广泛。
The invention relates to a method for detecting defects in a conductor based on the principle of electromagnetic induction, characterized in that the method comprises: step 1, placing a small permanent magnet near the conductor to be tested, so that the magnetic field penetrates into the conductor to be tested; Step 2, causing relative movement between the small magnet and the conductor to be tested; Step 3, measuring the change of the induced magnetic field around the conductor to be tested caused by the microparticle or defect; Step 4, determining by the change of the induced magnetic field Characterization of the microparticle or defect. The method for detecting defects in conductors based on the electromagnetic induction principle of the present invention has clear electromagnetic principles, simple measuring instrument mechanism, high measurement accuracy and high measurement efficiency, and does not require magnetic conduction of samples to be tested, so the scope of application is wider.
Description
技术领域technical field
本发明涉及一种基于电磁感应原理的导体中缺陷探测方法，尤其涉及一种导电材料中的微颗粒或异质缺陷的监测与检测。The invention relates to a method for detecting defects in conductors based on the principle of electromagnetic induction, in particular to the monitoring and detection of micro particles or heterogeneous defects in conductive materials.
背景技术Background technique
在生产过程中，导电材料由于制备工艺或在使役过程产生的缺陷，如氧化物、氮化物、硫化物等颗粒或裂纹缺陷、气孔等缺陷，它们的存在往往会严重影响导电材料的使用安全。例如，电缆线中的杂质既严重降低了导体材料的机械强度，也会通过导电属性的改变增大电阻，产生额外的焦耳热，从而削弱导电性能和使用寿命。显而易见，对微颗粒或缺陷进行有效的探测和监测具有重要的生产意义。In the production process, the defects of conductive materials due to the preparation process or service process, such as oxides, nitrides, sulfides and other particles or crack defects, pores and other defects, their existence often seriously affects the use safety of conductive materials. For example, the impurities in the cable not only seriously reduce the mechanical strength of the conductor material, but also increase the resistance through the change of the conductive property, and generate additional Joule heat, thereby weakening the conductive performance and service life. Obviously, effective detection and monitoring of microparticles or defects has important production significance.
传统的涡流检测方法一般由激励线圈和接收线圈组成。在激励线圈中通入交流电，根据安培定律在其周围产生感应磁场，它可渗透到待测导体中，由于输入电流的时谐特性在导体中产生涡电流，进一步地，涡电流在导体周围产生感应磁场，当导体中存在异质缺陷时，上述的涡电流及其周围的感应磁场都会发生变化，可由接收线圈的阻抗变化探知到导体周围感应磁场的变化，进而获得缺陷的特征信息。涡流检测方法中的线圈由于由导线螺旋缠绕而成的结构特点，线圈尺寸一般为数毫米，很难再进一步减小尺寸，因而测量精度受到限制；其次，由于通过接受线圈测量的量为阻抗，而空间变化的感应磁场为矢量，因而存在所谓的提离效应，这是传统的涡电流法存在的不足。本发明克服了上述不足。The traditional eddy current detection method generally consists of an exciting coil and a receiving coil. An alternating current is passed into the excitation coil, and an induced magnetic field is generated around it according to Ampere's law, which can penetrate into the conductor to be tested, and an eddy current is generated in the conductor due to the time-harmonic characteristic of the input current, and further, an eddy current is generated around the conductor Induced magnetic field, when there are heterogeneous defects in the conductor, the above-mentioned eddy current and the induced magnetic field around it will change, and the change of the induced magnetic field around the conductor can be detected by the impedance change of the receiving coil, and then the characteristic information of the defect can be obtained. Due to the structural characteristics of the coil in the eddy current detection method, the coil size is generally a few millimeters, and it is difficult to further reduce the size, so the measurement accuracy is limited; secondly, because the quantity measured by the receiving coil is impedance, and The spatially varying induced magnetic field is a vector, so there is a so-called lift-off effect, which is a deficiency of the traditional eddy current method. The present invention overcomes the above disadvantages.
发明内容Contents of the invention
本发明的目的是针对现有技术的缺陷，提供一种基于电磁感应原理的导体中缺陷探测方法，使小永磁体与待测导体之间产生相对运动,由麦克斯韦的电磁场理论可知在导体中将产生涡电流，由于微颗粒和导体之间电导率的差异，根据安培定律,涡电流在空间产生的感应磁场也会发生相应的变化，利用磁阻效应直接探这种空间磁场的变化。The object of the present invention is to aim at the defect of prior art, provide a kind of defect detection method in the conductor based on the principle of electromagnetic induction, make the relative movement between the small permanent magnet and the conductor to be tested, know from Maxwell's electromagnetic field theory that in the conductor When eddy current is generated, due to the difference in conductivity between microparticles and conductors, according to Ampere's law, the induced magnetic field generated by eddy current in space will also change accordingly, and the magnetoresistance effect is used to directly explore the change of this space magnetic field.
为实现上述目的，本发明提供了一种基于电磁感应原理的导体中缺陷探测方法，所述方法包括：In order to achieve the above object, the present invention provides a method for detecting defects in conductors based on the principle of electromagnetic induction, the method comprising:
步骤1，将小永磁体置于待测导体附近，使磁场渗透到所述待测导体中；Step 1, placing a small permanent magnet near the conductor to be tested, so that the magnetic field penetrates into the conductor to be tested;
步骤2，使所述小磁体与待测导体之间产生相对运动；Step 2, causing relative movement between the small magnet and the conductor to be measured;
步骤3，测量由微颗粒或缺陷时引起的待测导体周围的感应磁场的变化；Step 3, measuring the change of the induced magnetic field around the conductor to be tested caused by the microparticles or defects;
步骤4，通过所述感应磁场变化确定所述微颗粒或缺陷的特征。Step 4, determining the characteristics of the microparticles or defects through the change of the induced magnetic field.
进一步的，所述步骤1中所述小永磁体产生空间分布的静磁场，并且渗透到待测导体中；所述小永磁体的磁化方向垂直于待测导体表面，或所述小永磁体与待测导体之间不接触。Further, the small permanent magnet in the step 1 generates a spatially distributed static magnetic field and penetrates into the conductor to be tested; the magnetization direction of the small permanent magnet is perpendicular to the surface of the conductor to be tested, or the small permanent magnet is in contact with the surface of the conductor to be tested There is no contact between the conductors to be tested.
进一步的，所述步骤2具体为，固定所述小永磁体，使所述待测导体运动；或固定所述待测导体，使所述小永磁体运动。Further, the step 2 specifically includes fixing the small permanent magnet to make the conductor to be tested move; or fixing the conductor to be tested to make the small permanent magnet move.
进一步的，所述步骤2中的相对运动具体为速度为常数的线性运动或角速度为常数的圆周运动。Further, the relative motion in step 2 is specifically a linear motion with a constant velocity or a circular motion with a constant angular velocity.
进一步的，所述步骤3中采用基于磁阻效应的传感器测量空间感应磁场的变化。Further, in the step 3, a sensor based on the magnetoresistance effect is used to measure the change of the space-induced magnetic field.
进一步的，所述步骤4中的磁场变化的脉冲数目为微颗粒或异质缺陷的数目。Further, the pulse number of the magnetic field change in the step 4 is the number of micro-particles or heterogeneous defects.
进一步的，所述步骤4中的磁场变化的量越大，则微颗粒或异质缺陷的尺寸越大。Further, the greater the amount of change of the magnetic field in step 4, the greater the size of the microparticles or heterogeneous defects.
进一步的，所述步骤4中的磁场变化所产生的脉冲信号与微颗粒或异质缺陷相对应。Further, the pulse signal generated by the change of the magnetic field in step 4 corresponds to micro-particles or heterogeneous defects.
进一步的，所述步骤2、3中，改变所述相对运动的速度，获得微颗粒或异质缺陷在导体中的深度信息。Further, in the steps 2 and 3, the speed of the relative movement is changed to obtain the depth information of the micro-particles or heterogeneous defects in the conductor.
本发明基于电磁感应原理的导体中缺陷探测方法，电磁学原理清晰；测量仪机构简单；测量准确度高；测量效率高；并且不要求待测试样导磁，因而适用范围更为广泛。The method for detecting defects in conductors based on the electromagnetic induction principle of the present invention has clear electromagnetic principles, simple measuring instrument mechanism, high measurement accuracy, high measurement efficiency, and does not require magnetic conduction of the sample to be tested, so the scope of application is wider.
附图说明Description of drawings
图1A为本发明基于电磁感应原理的导体中缺陷探测方法的测量原理示意图之一；1A is one of the schematic diagrams of the measurement principle of the method for detecting defects in conductors based on the principle of electromagnetic induction in the present invention;
图1B为本发明基于电磁感应原理的导体中缺陷探测方法的测量原理示意图之二；FIG. 1B is the second schematic diagram of the measurement principle of the method for detecting defects in conductors based on the principle of electromagnetic induction in the present invention;
图1C为本发明基于电磁感应原理的导体中缺陷探测方法的测量原理示意图之三；Fig. 1C is the third schematic diagram of the measurement principle of the method for detecting defects in conductors based on the principle of electromagnetic induction in the present invention;
图1D为本发明基于电磁感应原理的导体中缺陷探测方法的测量原理示意图之四；1D is the fourth schematic diagram of the measurement principle of the method for detecting defects in conductors based on the principle of electromagnetic induction in the present invention;
图1E为本发明基于电磁感应原理的导体中缺陷探测方法的测量原理示意图之五；FIG. 1E is the fifth schematic diagram of the measurement principle of the method for detecting defects in conductors based on the principle of electromagnetic induction according to the present invention;
图1F为本发明基于电磁感应原理的导体中缺陷探测方法的测量原理示意图之六；FIG. 1F is the sixth schematic diagram of the measurement principle of the method for detecting defects in conductors based on the principle of electromagnetic induction according to the present invention;
图1G为本发明基于电磁感应原理的导体中缺陷探测方法的测量原理示意图之七；Fig. 1G is the seventh schematic diagram of the measurement principle of the method for detecting defects in conductors based on the principle of electromagnetic induction in the present invention;
图1H为本发明基于电磁感应原理的导体中缺陷探测方法的测量原理示意图之八；FIG. 1H is the eighth schematic diagram of the measurement principle of the method for detecting defects in conductors based on the principle of electromagnetic induction according to the present invention;
图2为本发明基于电磁感应原理的导体中缺陷探测方法的流程图；Fig. 2 is the flow chart of the defect detection method in the conductor based on the principle of electromagnetic induction of the present invention;
图3为本发明基于电磁感应原理的导体中缺陷探测方法的示意图。FIG. 3 is a schematic diagram of the method for detecting defects in conductors based on the principle of electromagnetic induction according to the present invention.
图4A是使用本发明基于电磁感应原理的导体中缺陷探测方法的测量信号示意图之一；Fig. 4A is one of the measurement signal schematic diagrams using the method for detecting defects in conductors based on the principle of electromagnetic induction of the present invention;
图4B是使用本发明基于电磁感应原理的导体中缺陷探测方法的测量信号示意图之二。FIG. 4B is the second schematic diagram of measurement signals using the method for detecting defects in conductors based on the principle of electromagnetic induction of the present invention.
具体实施方式detailed description
下面通过附图和实施例，对本发明的技术方案做进一步的详细描述。The technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings and embodiments.
本发明的基本原理如下：由小尺寸、可设计形状的永磁体提供一个局部的静磁场使小永磁体与待测导体试样之间产生相对运动,The basic principle of the present invention is as follows: a local static magnetic field is provided by a permanent magnet with a small size and a designable shape Make relative movement between the small permanent magnet and the conductor sample to be tested,
如图1A所示,在导体中建立一个电磁敏感区，范围约为小磁体尺寸的三倍，所有的电磁参量变化主要集中在该敏感区内。根据欧姆定律，在导体中产生电流方向相反的一对涡电流环如图1B所示；根据安培定律，涡电流在其周围产生感应磁场如图1C所示；空间磁场可表示为矢量和的形式：如图1D所示。As shown in Figure 1A, an electromagnetic sensitive area is established in the conductor, the range is about three times the size of the small magnet, and all the electromagnetic parameter changes are mainly concentrated in this sensitive area. According to Ohm's law, a pair of eddy current loops with opposite current directions are generated in the conductor As shown in Figure 1B; according to Ampere's law, eddy currents generate an induced magnetic field around them As shown in Figure 1C; the spatial magnetic field can be expressed as a vector sum: As shown in Figure 1D.
图1E示出了当微颗粒随导体运动进入电磁敏感区时的情形；由于微颗粒或异质缺陷与待测导体之间电导率的差异，导体中的涡电流环大小及分布将发生变化，如图1F所示；相应地，涡电流在其周围产生的感应磁场也将发生变化，如图1G所示；区域的空间磁场变化为如图1H所示。Figure 1E shows the situation when the microparticles move into the electromagnetically sensitive area with the conductor; due to the difference in conductivity between the microparticles or heterogeneous defects and the conductor to be tested, the eddy current loop in the conductor The size and distribution will change, as shown in Figure 1F; correspondingly, the induced magnetic field generated by the eddy current around it will also change, as shown in Figure 1G; the spatial magnetic field of the region changes as As shown in Figure 1H.
显见，空间磁场的变化量与微颗粒或异质缺陷之间存在着对应关系。由于上述物理量均为场量的变化，因而可测的空间磁场变化可反映出微颗粒或异质缺陷的空间形状、尺寸以及数量特征。Obviously, the variation of the spatial magnetic field There is a corresponding relationship with micro-particles or heterogeneous defects. Since the above physical quantities are all changes in field quantities, the measurable changes in the spatial magnetic field can reflect the spatial shape, size and quantity characteristics of micro-particles or heterogeneous defects.
图2为本发明基于电磁感应原理的导体中缺陷探测方法的流程图，如图所示，本发明包括如下步骤：Fig. 2 is the flow chart of the defect detection method in the conductor based on the electromagnetic induction principle of the present invention, as shown in the figure, the present invention comprises the following steps:
步骤101，将小永磁体置于待测导体附近，使磁场渗透到待测导体中；Step 101, placing a small permanent magnet near the conductor to be tested, so that the magnetic field penetrates into the conductor to be tested;
具体的，步骤1中步骤1中小永磁体提供空间分布的静磁场，并且渗透到待测导体中，为了获得更大的磁场渗透效果，小永磁体的磁化方向垂直于待测导体表面。或者小永磁体提供空间分布的静磁场，并且渗透到待测导体中，为了获得更大的磁场渗透效果，小永磁体与待测导体之间的距离在保证没有机械接触的条件下尽可能小。Specifically, in step 1, the small permanent magnet provides a spatially distributed static magnetic field and penetrates into the conductor to be tested. In order to obtain a greater magnetic field penetration effect, the magnetization direction of the small permanent magnet is perpendicular to the surface of the conductor to be tested. Or the small permanent magnet provides a spatially distributed static magnetic field and penetrates into the conductor to be tested. In order to obtain a greater magnetic field penetration effect, the distance between the small permanent magnet and the conductor to be tested should be as small as possible without mechanical contact. .
步骤102，使小磁体与待测导体之间产生相对运动；Step 102, generating relative motion between the small magnet and the conductor to be tested;
具体的，本步骤具体为，固定所述小永磁体，使待测导体运动；或固定待测导体，使小永磁体运动。Specifically, this step is as follows: fixing the small permanent magnet to make the conductor to be tested move; or fixing the conductor to be tested to make the small permanent magnet move.
另外，相对运动具体为速度为常数的线性运动或角速度为常数的圆周运动。In addition, the relative motion is specifically a linear motion with a constant velocity or a circular motion with a constant angular velocity.
如图3本发明基于电磁感应原理的导体中缺陷探测方法的示意图所示，采用旋转机构实现相对运动的一种方式，包括固定在驱动装置1上的待测导体试样2，置于待测导体2表面的永磁体3，以及布置在所述永磁体3附近的磁阻传感器4，磁阻传感器在永磁体附近有多种排布方式，未一一画出，以及与磁阻传感器4相连的数据采集系统5，测距传感器6，待测导体内的微颗粒7。As shown in Figure 3, the schematic diagram of the method for detecting defects in conductors based on the principle of electromagnetic induction of the present invention, a method of using a rotating mechanism to achieve relative motion includes a conductor sample 2 to be tested fixed on the drive device 1, placed in the The permanent magnet 3 on the surface of the conductor 2, and the magnetoresistive sensor 4 arranged near the permanent magnet 3, the magnetoresistive sensor has multiple arrangements near the permanent magnet, not drawn one by one, and connected to the magnetoresistive sensor 4 The data acquisition system 5, the distance measuring sensor 6, and the microparticles 7 in the conductor to be measured.
步骤103，测量由微颗粒或缺陷时引起的待测导体周围的感应磁场的变化；Step 103, measuring the change of the induced magnetic field around the conductor to be tested caused by the microparticles or defects;
步骤中采用基于磁阻效应的传感器测量空间感应磁场的变化。当的磁场发生变化时，则表明待测试样中存在微颗粒或异质缺陷，获得测量信号示意图，如图4A所示，为无缺陷时的信号，如图4B所示，是有缺陷时的信号。In the step, a sensor based on the magnetoresistance effect is used to measure the change of the space-induced magnetic field. When the magnetic field changes, it indicates that there are microparticles or heterogeneous defects in the sample to be tested, and the schematic diagram of the measurement signal is obtained, as shown in Figure 4A, which is the signal when there is no defect, and as shown in Figure 4B, when there is a defect signal of.
步骤104，通过感应磁场变化确定微颗粒或缺陷的特征。Step 104, determining the characteristics of the microparticles or defects by inducing the change of the magnetic field.
本步骤中的磁场变化的脉冲数目为微颗粒或异质缺陷的数目。磁场变化的量越大，则微颗粒或异质缺陷的尺寸越大。磁场变化所引起的脉冲信号与微颗粒或异质缺陷在时空上存在一一对应关系，可以反推出微颗粒或异质缺陷在导体中的空间位置和空间分布。The pulse number of magnetic field change in this step is the number of micro-particles or heterogeneous defects. The larger the amount of change in the magnetic field, the larger the size of the microparticles or heterogeneous defects. There is a one-to-one correspondence between the pulse signal caused by the change of the magnetic field and the microparticle or heterogeneous defect in time and space, and the spatial position and spatial distribution of the microparticle or heterogeneous defect in the conductor can be deduced inversely.
可选的，通过改变相对运动速度，可获得微颗粒或异质缺陷在导体中的深度信息。可探测的微颗粒或异质缺陷的尺度为微米级。Optionally, by changing the relative motion speed, the depth information of micro-particles or heterogeneous defects in the conductor can be obtained. Detectable microparticles or heterogeneous defects are on the micron scale.
本发明基于电磁感应原理的导体中缺陷探测方法，具有以下特点和优点：The method for detecting defects in conductors based on the principle of electromagnetic induction in the present invention has the following characteristics and advantages:
1、本发明方法由小永磁体提供磁场，小永磁体尺寸可以做的更小，电磁敏感区可以更小，可探测微米级的微颗粒或异质缺陷，较传统的涡电流方法的测量精度有大幅提高；1. The method of the present invention provides a magnetic field by a small permanent magnet. The size of the small permanent magnet can be made smaller, and the electromagnetic sensitive area can be smaller. It can detect micron-sized particles or heterogeneous defects, and the measurement accuracy of the traditional eddy current method is higher than that of the traditional eddy current method. There has been a substantial increase;
2、本发明中通过磁阻效应探测的空间磁场的变化，克服了传统涡电流法中的提离效应；矢量场的变化使探测的信息更为丰富，可获得更多微颗粒或异质缺陷的特征信息；2. The change of the spatial magnetic field detected by the magnetoresistance effect in the present invention overcomes the lift-off effect in the traditional eddy current method; the change of the vector field makes the detected information more abundant, and more microparticles or heterogeneous defects can be obtained feature information;
3、根据本发明方法设计测量仪，结构简单，检测效率高，易于实现自动化和小型化，可以应用到更多的领域和环境中。3. The measuring instrument designed according to the method of the present invention has simple structure, high detection efficiency, easy automation and miniaturization, and can be applied to more fields and environments.
以上所述的具体实施方式，对本发明的目的、技术方案和有益效果进行了进一步详细说明，所应理解的是，以上所述仅为本发明的具体实施方式而已，并不用于限定本发明的保护范围，凡在本发明的精神和原则之内，所做的任何修改、等同替换、改进等，均应包含在本发明的保护范围之内。The specific embodiments described above have further described the purpose, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above descriptions are only specific embodiments of the present invention and are not intended to limit the scope of the present invention. Protection scope, within the spirit and principles of the present invention, any modification, equivalent replacement, improvement, etc., shall be included in the protection scope of the present invention.
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