CN105548211B - Glass substrate scratches the lookup method of the generation position of defect - Google Patents
Glass substrate scratches the lookup method of the generation position of defect Download PDFInfo
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- CN105548211B CN105548211B CN201511022761.8A CN201511022761A CN105548211B CN 105548211 B CN105548211 B CN 105548211B CN 201511022761 A CN201511022761 A CN 201511022761A CN 105548211 B CN105548211 B CN 105548211B
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
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Abstract
The invention discloses the lookup methods that a kind of glass substrate scratches the generation position of defect, including step 1: the first position that each processing apparatus is contacted with glass substrate on determining production line, obtains the first coordinate value of the first position；Step 2: determining the second position for scratching defect on glass substrate in the downstream of production line, second coordinate value of the second position in the width direction of glass substrate is obtained；Step 3: determining the process where the first coordinate value identical with the second coordinate value, if the quantity of the process where the first coordinate value is n, wherein n >=2, then carry out the 4th step；Step 4: glass substrate is rotated horizontally 180 ° by the upturned position between two neighboring process；Step 5: determining whether the third place for scratching defect on glass substrate is identical as the second position again in the downstream of production line；Above-mentioned 4th step and the 5th step are repeated, to obtain the generation position for scratching defect.
Description
Technical field
The present invention relates to glass substrate production technical fields, and in particular, to a kind of glass substrate scratches the generation of defect
The lookup method of position.
Background technique
Glass substrate production line is longer, and each process often will appear scuffing, and previous scuffing game method is that basis is drawn
Hurt coordinate and search corresponding position using gage measuring in each process, the method is searched to scratch to be accurately determined to scratch and be generated
Process, entire countermeasure process is cumbersome, and the countermeasure time is longer, seriously affects production capacity.It is to influence liquid that it is longer, which to scratch the countermeasure time,
One of the factor of most critical of crystal glass substrate production line production capacity, glass can be promoted with the countermeasure time indirectly by reducing to scratch to search
Substrate production line production capacity.
Summary of the invention
The object of the present invention is to provide the lookup method that a kind of glass substrate scratches the generation position of defect, the lookup methods
The generation position that glass substrate scratches defect can quickly and accurately be searched.
According to an aspect of the present invention, a kind of lookup method of the generation position of glass substrate scuffing defect is provided,
The length direction of middle glass substrate is the direction of transfer of production line, and the width direction of glass substrate is the transverse direction of production line,
Wherein, this method comprises:
Step 1: determining the first position that each processing apparatus is contacted with glass substrate on production line, this first is obtained
Set the first coordinate value in the transverse direction of production line；
Step 2: determining the second position for scratching defect on glass substrate in the downstream of production line, the second position is obtained
The second coordinate value in the width direction of glass substrate, and the second position is not or not the center of the width direction of glass substrate
On line；
Step 3: the process where the first coordinate value identical with second coordinate value is determined, if the first coordinate value institute
The quantity of process be only one, then the first position is determined according to first coordinate value, to obtain the scuffing defect
Position is generated, if the quantity of the process where first coordinate value is n, wherein n >=2, then carry out the 4th step；
Step 4: glass substrate is rotated horizontally 180 ° by the upturned position between two neighboring process, wherein when n is
When even number, the quantity of the process where first coordinate value of the upturned position upstream and downstream is equal, when n is odd number
When, the quantity difference of the process where first coordinate value of the upturned position upstream and downstream is 1；
Step 5: determining the third place for scratching defect on glass substrate whether with described the again in the downstream of production line
Two positions are identical, if they are the same, then judge that the generation position for scratching defect is located in the downstream process of the upturned position；If
Difference, and the third place and the second position are symmetrical about the center line of the width direction of glass substrate, and third position
It sets symmetrical about the horizontal center line of glass substrate with the second position, then it is described to judge that the generation position for scratching defect is located at
In the upstream process of upturned position；
Step 6: judge the process where first coordinate value in the upturned position upstream or downstream quantity whether
It is one, if one, then the first position is determined according to first coordinate value, obtains the generation position of the scuffing defect
It sets, if not one, then above-mentioned 4th step and the 5th step are repeated, to obtain the generation position for scratching defect.
Optionally, in the second step and the 5th step, by the surface of the glass substrate described in halogen light irradiation to divide
The second position and the third place are not obtained.
According to another aspect of the present invention, a kind of lookup method of the generation position of glass substrate scuffing defect is provided,
The length direction of middle glass substrate is the direction of transfer of production line, and the width direction of glass substrate is the transverse direction of production line,
It is characterized in that, this method comprises:
Step 1: determining the first position that each processing apparatus is contacted with glass substrate on production line, this first is obtained
Set the first coordinate value in the transverse direction of production line；
Step 2: determining the second position for scratching defect on glass substrate in the downstream of production line, the second position is obtained
The second coordinate value in the width direction of glass substrate, and the second position is not or not the center of the width direction of glass substrate
On line；
Step 3: glass substrate is rotated horizontally 180 ° by the upturned position between two neighboring process；
Step 4: determining the third place for scratching defect on glass substrate whether with described the again in the downstream of production line
Two positions are identical, if they are the same, then judge that the generation position for scratching defect is located in the downstream process of the upturned position；If
Difference, and the third place and the second position are symmetrical about the center line of the width direction of glass substrate, then judge institute
The generation position for stating scuffing defect is located in the upstream process of the upturned position；
Step 5: judge the process where first coordinate value in the upturned position upstream or downstream quantity whether
It is one, if one, then the first position is determined according to first coordinate value, obtains the generation position of the scuffing defect
It sets, if not one, then above-mentioned third step and the 4th step are repeated, to obtain the generation position for scratching defect.
Optionally, in the third step, the upturned position be located at the intermediate process of all process steps front end or after
End, or positioned at the middle position of all process steps.
Optionally, successively include upper piece process, scribing process from upstream to downstream on the production line, break disconnected process, grind
Grinder sequence, process of prewetting, cleaning process, detection process and packaging process, in the third step, the upturned position is located at institute
Grinding process is stated between process of prewetting.
Optionally, in the second step and the 4th step, by the surface of the glass substrate described in halogen light irradiation to divide
The second position and the third place are not obtained.
Through the above technical solutions, by counting and confirming the first coordinate value identical with second coordinate value institute first
All process steps, preliminary latch glass substrate scratch defect generation process range, then, by above-mentioned operation
Between position adjacent two process between by glass substrate rotate horizontally 180 °, and the downstream of production line again determine glass
The third place of defect is scratched on substrate, it is whether identical by comparing the third place and the second position, to judge to scratch
The generation position of defect is located in upstream or the downstream process of upturned position, can be quickly quasi- by repeating aforesaid operations
The generation position that glass substrate scratches defect really is searched, reduces and scratches lookup and countermeasure time, can be improved glass substrate
The production capacity of production line.
Other features and advantages of the present invention will the following detailed description will be given in the detailed implementation section.
Specific embodiment
In the present invention, in the absence of explanation to the contrary, the noun of locality used such as " upstream, downstream " is usually opposite
It is downstream towards the flow direction of glass substrate, away from glass substrate specifically for the transmission direction of glass substrate
Flow direction is upstream.
As a kind of preferred embodiment provided by the invention, the lookup side of the generation position of defect is scratched in glass substrate
In method, wherein the length direction of glass substrate is the direction of transfer of production line, and the width direction of glass substrate is the cross of production line
To direction, wherein this method comprises:
Step 1: determining the first position that each processing apparatus is contacted with glass substrate on production line, this first is obtained
Set the first coordinate value in the transverse direction of production line；
Step 2: determining the second position for scratching defect on glass substrate in the downstream of production line, the second position is obtained
The second coordinate value in the width direction of glass substrate, and the second position is not or not the center of the width direction of glass substrate
On line；
Step 3: the process where the first coordinate value identical with second coordinate value is determined, if the first coordinate value institute
The quantity of process be only one, then the first position is determined according to first coordinate value, to obtain the scuffing defect
Position is generated, if the quantity of the process where first coordinate value is n, wherein n >=2, then carry out the 4th step；
Step 4: glass substrate is rotated horizontally 180 ° by the upturned position between two neighboring process, wherein when n is
When even number, the quantity of the process where first coordinate value of the upturned position upstream and downstream is equal, when n is odd number
When, the quantity difference of the process where first coordinate value of the upturned position upstream and downstream is 1；
In the 4th step, glass substrate can manually be rotated horizontally by the operator for having dressed cleaning supplies
180 °, naturally it is also possible to by special mechanical equipment to glass substrate carry out rotate horizontally 180 °, the invention is not limited in this regard,
Among all belonging to the scope of protection of the present invention.
Step 5: determining the third place for scratching defect on glass substrate whether with described the again in the downstream of production line
Two positions are identical, if they are the same, then judge that the generation position for scratching defect is located in the downstream process of the upturned position；If
Difference, and the third place and the second position are symmetrical about the center line of the width direction of glass substrate, then judge institute
The generation position for stating scuffing defect is located in the upstream process of the upturned position；
Step 6: judge the process where first coordinate value in the upturned position upstream or downstream quantity whether
It is one, if one, then the first position is determined according to first coordinate value, obtains the generation position of the scuffing defect
It sets, if not one, then above-mentioned 4th step and the 5th step are repeated, to obtain the generation position for scratching defect.
That is, counting and confirming all process steps where the first coordinate value identical with second coordinate value first, tentatively
The process range for the generation that locking glass substrate scratches defect then passes through adjacent two in the middle position of above-mentioned operation
Glass substrate is rotated horizontally 180 ° between a process, and is determined again in the downstream of production line and scratches defect on glass substrate
The third place, it is whether identical by comparing the third place and the second position, to judge to scratch the generation position position of defect
In the upstream of upturned position or downstream process, by repeating aforesaid operations, glass substrate can be quickly and accurately searched
The generation position of defect is scratched, reduces and scratches lookup and countermeasure time, can be improved the production capacity of the production line of glass substrate.
Since the light of halogen lamp is yellow, and the penetration power of halogen lamp is stronger, for convenient for quickly searching on glass substrate
The generation position for scratching defect, in the second step and the 5th step, by the table for being irradiated to the glass substrate with halogen lamp
Face to obtain the second position and the third place respectively.
Since there may be in the face A (front) of glass substrate and/or the face B of glass substrate for the scuffing defect of glass substrate
(back side), in this way, in the first step: can determine that the face A and the face B of each processing apparatus and glass substrate on production line connect respectively
The first position of touching, and first coordinate value of the first position in the transverse direction of production line is obtained respectively；
In second step, when the scuffing defect of the glass substrate of confirmation is formed in the face A or the face B, above-mentioned side can be passed through
Method searches the generation position of the scuffing defect of glass substrate, when the scuffing defect of the glass substrate of confirmation is formed in the face A and the face B
When, since the face A of glass substrate is only in contact with the scribing process of production line, grinding process and cleaning process, and glass base
Upper piece process, the scribing process that are sequentially arranged on the face B of plate and production line from upstream to downstream break disconnected process, are grinding process, pre-
Wet process, cleaning process, detection process and packaging process are likely to generate contact.In other words, the face A of glass substrate and production
The contact point of the processing apparatus of line is less.Therefore, stroke formed on the face A of glass substrate can be searched first with the above method
Hurt the generation position of defect, aforesaid way is then recycled to search the generation position of the scuffing defect formed on the face B of glass substrate
It sets.
Wherein, in the specific location for each process equipment being in contact on searching production line with the face B of glass substrate, due to
Process of prewetting is located substantially at the middle position of above-mentioned all process steps, and is open end, carries out rotating horizontally 180 ° to glass gradual change
It is more convenient, therefore, glass substrate can be rotated first between grinding process and process of prewetting, next, then pressing
It is continued to search according to the above method.
As another preferred embodiment provided by the invention, the lookup of the generation position of defect is scratched in glass substrate
In method, wherein the length direction of glass substrate is the direction of transfer of production line, and the width direction of glass substrate is production line
Transverse direction, wherein this method comprises:
Step 1: determining the first position that each processing apparatus is contacted with glass substrate on production line, this first is obtained
Set the first coordinate value in the transverse direction of production line；
Step 2: determining the second position for scratching defect on glass substrate in the downstream of production line, the second position is obtained
The second coordinate value in the width direction of glass substrate, and the second position is not or not the center of the width direction of glass substrate
On line；
Step 3: glass substrate is rotated horizontally 180 ° by the upturned position between two neighboring process；
Step 4: determining the third place for scratching defect on glass substrate whether with described the again in the downstream of production line
Two positions are identical, if they are the same, then judge that the generation position for scratching defect is located in the downstream process of the upturned position；If
Difference, and the third place and the second position are symmetrical about the center line of the width direction of glass substrate, then judge institute
The generation position for stating scuffing defect is located in the upstream process of the upturned position；
Step 5: judge the process where first coordinate value in the upturned position upstream or downstream quantity whether
It is one, if one, then the first position is determined according to first coordinate value, obtains the generation position of the scuffing defect
It sets, if not one, then above-mentioned third step and the 4th step are repeated, to obtain the generation position for scratching defect.
Preferably, in the third step, the upturned position be located at the intermediate process of all process steps front end or after
End, or positioned at the middle position of all process steps.
Illustrate above-mentioned preferred embodiment so that the quantity of all process steps is n, when n is even number, " all works herein
The middle position of sequence " refers to, is located at the n-th/2 between (n/2+1) a process, and when n is odd number, herein is " all
The front end or rear end of the intermediate process of process " refer to, be located at (n-1)/2 process and (n+1)/2 process it
Between or be located at (n+1)/2 between (n+3)/2 process.
It optionally, since process of prewetting is located substantially at the middle position of above-mentioned all process steps, and is open end, gradually to glass
Change rotate horizontally 180 ° it is more convenient, from upstream to downstream successively include on the production line upper piece process, scribing process,
Disconnected process, grinding process, process of prewetting, cleaning process, detection process and packaging process are broken, it is described to turn in the third step
Indexing is setting between the grinding process and process of prewetting.
Optionally, in the second step and the 4th step, by the surface of the glass substrate described in halogen light irradiation to divide
The second position and the third place are not obtained.
The preferred embodiment of the present invention has been described above in detail, still, during present invention is not limited to the embodiments described above
Detail within the scope of the technical concept of the present invention can be with various simple variants of the technical solution of the present invention are made, this
A little simple variants all belong to the scope of protection of the present invention.
It is further to note that specific technical features described in the above specific embodiments, in not lance
In the case where shield, can be combined in any appropriate way, in order to avoid unnecessary repetition, the present invention to it is various can
No further explanation will be given for the combination of energy.
In addition, various embodiments of the present invention can be combined randomly, as long as it is without prejudice to originally
The thought of invention, it should also be regarded as the disclosure of the present invention.
Claims (6)
1. a kind of glass substrate scratches the lookup method of the generation position of defect, wherein the length direction of glass substrate is production line
Direction of transfer, the width direction of glass substrate is the transverse direction of production line, which is characterized in that this method comprises:
Step 1: determining the first position that each processing apparatus is contacted with glass substrate on production line, obtains the first position and exist
The first coordinate value in the transverse direction of production line；
Step 2: determining the second position for scratching defect on glass substrate in the downstream of production line, the second position is obtained in glass
The second coordinate value in the width direction of glass substrate, and the second position is not in the center line of the width direction of glass substrate
On；
Step 3: the process where the first coordinate value identical with second coordinate value is determined, where first coordinate value
The quantity of process include the case where one and n, wherein n >=2, if the quantity of the process where the first coordinate value is only one
It is a, then the first position is determined according to first coordinate value, to obtain the generation position of the scuffing defect, if described first sits
The quantity of process where scale value is n, wherein n >=2, then carries out the 4th step；
Step 4: glass substrate is rotated horizontally 180 ° by the upturned position between two neighboring process, wherein when n is even number
When, the quantity of the process where first coordinate value of the upturned position upstream and downstream is equal, when n is odd number, institute
The quantity difference for stating the process where first coordinate value of upturned position upstream and downstream is 1；
Step 5: the downstream of production line again determine glass substrate on scratch defect the third place whether with the second
Set it is identical, if they are the same, then judge it is described scratch defect generation position be located in the downstream process of the upturned position；If no
Together, and the third place and the second position are symmetrical about the center line of the width direction of glass substrate, then described in judgement
The generation position for scratching defect is located in the upstream process of the upturned position；
Step 6: whether the quantity for judging the process where first coordinate value in the upturned position upstream or downstream is one
It is a, if one, then the first position is determined according to first coordinate value, to obtain the generation position of the scuffing defect, if
It is not one, then repeats above-mentioned 4th step and the 5th step, obtains the generation position for scratching defect.
2. the lookup method that glass substrate according to claim 1 scratches the generation position of defect, which is characterized in that in institute
State in second step and the 5th step, by the surface of the glass substrate described in halogen light irradiation with obtain respectively the second position and
The third place.
3. a kind of glass substrate scratches the lookup method of the generation position of defect, wherein the length direction of glass substrate is production line
Direction of transfer, the width direction of glass substrate is the transverse direction of production line, which is characterized in that this method comprises:
Step 1: determining the first position that each processing apparatus is contacted with glass substrate on production line, obtains the first position and exist
The first coordinate value in the transverse direction of production line；
Step 2: determining the second position for scratching defect on glass substrate in the downstream of production line, the second position is obtained in glass
The second coordinate value in the width direction of glass substrate, and the second position is not in the center line of the width direction of glass substrate
On；
Step 3: glass substrate is rotated horizontally 180 ° by the upturned position between two neighboring process；
Step 4: the downstream of production line again determine glass substrate on scratch defect the third place whether with the second
Set it is identical, if they are the same, then judge it is described scratch defect generation position be located in the downstream process of the upturned position；If no
Together, and the third place and the second position are symmetrical about the center line of the width direction of glass substrate, then described in judgement
The generation position for scratching defect is located in the upstream process of the upturned position；
Step 5: whether the quantity for judging the process where first coordinate value in the upturned position upstream or downstream is one
It is a, if one, then the first position is determined according to first coordinate value, to obtain the generation position of the scuffing defect, if
It is not one, then repeats above-mentioned third step and the 4th step, obtains the generation position for scratching defect.
4. the lookup method that glass substrate according to claim 3 scratches the generation position of defect, which is characterized in that in institute
It states in third step, the upturned position is located at the front end of the intermediate process of all process steps and perhaps rear end or is located at all process steps
Middle position.
5. the lookup method that glass substrate according to claim 3 scratches the generation position of defect, which is characterized in that described
Successively include upper piece process, scribing process from upstream to downstream on production line, break disconnected process, grinding process, process of prewetting, cleaning
Process, detection process and packaging process, in the third step, the upturned position is located at the grinding process and process of prewetting
Between.
6. the lookup method that glass substrate according to claim 3 scratches the generation position of defect, which is characterized in that in institute
State in second step and the 4th step, by the surface of the glass substrate described in halogen light irradiation with obtain respectively the second position and
The third place.
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| CN113837528B (en) * | 2021-08-04 | 2024-03-22 | 山西光兴光电科技有限公司 | Method for determining position of station causing defect on surface of substrate glass |
| CN114252457A (en) * | 2022-03-01 | 2022-03-29 | 潍坊佳昇光电科技有限公司 | Method for analyzing scratch reasons of carrier plate glass |
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Denomination of invention: Searching method for generation position of scratching defect of glass substrate Effective date of registration: 20200713 Granted publication date: 20190219 Pledgee: Beijing State Owned Financial Leasing Co., Ltd Pledgor: WUHU TUNGHSU PHOTOELECTRIC SCIENCE AND TECHNOLOGY Co.,Ltd. Registration number: Y2020990000738 |