CN105510816B - Relay debugs machine automatically - Google Patents
Relay debugs machine automatically Download PDFInfo
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- CN105510816B CN105510816B CN201510851357.5A CN201510851357A CN105510816B CN 105510816 B CN105510816 B CN 105510816B CN 201510851357 A CN201510851357 A CN 201510851357A CN 105510816 B CN105510816 B CN 105510816B
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- debugging
- relay
- slip base
- automatic
- contact spring
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
- G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
A kind of relay debugs machine automatically.Mainly solve existing relay debugging handwork, work efficiency is low, high labor cost, debugging performance it is unstable the problem of.It is characterized in that：The rack is equipped with the feed arrangement of parallel arrangement, drawing mechanism, and automatic debugging device is equipped between the feed arrangement and drawing mechanism；The automatic debugging device includes debugging mechanism, material grabbing mechanism, static contact spring piece mechanism for testing, movable contact spring mechanism for testing, overtravel automatic detection mechanism；The automatic debugging device is controlled work by controller.It the advantage is that the automatic debugging of realization, realize more machines of one man operation, work efficiency is high, and properties of product are stablized after debugging.
Description
Technical field
The present invention relates to adaptive polarizing memory voltage time constant field, and machine is debugged automatically more particularly to a kind of relay.
Background technology
As electrical equipment continues to develop, use of the relay on electrical equipment is also more and more extensive.And relay
The service life and stability that parameter testing quality is directly used to relay, the at present parameter testing of relay are substantially to make by hand
Industry, Ren Yuanduo, efficiency is low, and it is unstable to debug properties of product by hand.
The content of the invention
In order to overcome the shortcomings of background technology, the present invention provides a kind of relay and debugs machine automatically, solves existing relay
The problem of debugging handwork, work efficiency is low, high labor cost, unstable debugging performance.
The technical solution adopted in the present invention：A kind of relay debugs machine, including rack automatically, and the rack is equipped with flat
Feed arrangement, the drawing mechanism of row arrangement, are equipped with automatic debugging device between the feed arrangement and drawing mechanism；
The automatic debugging device include debugging mechanism, material grabbing mechanism, static contact spring piece mechanism for testing, movable contact spring mechanism for testing,
Overtravel automatic detection mechanism；The automatic debugging device is controlled work by controller.
The debugging mechanism is arranged on the centre position between feed arrangement, drawing mechanism, including test panel, test
Seat, positioning fixture, the test panel center are equipped with the locating slot being adapted with relay, and the test bench is arranged on test surfaces
Below plate, and it is corresponding with locating slot；The test bench is connected with the first driving cylinder that test bench can be driven to move up and down.
The material grabbing mechanism includes support fixed seat, and the support fixed seat is equipped with the first slide, first slide
It is equipped with the first slip base, first slip base past polyslip on the first slide by motor driving energy；Described first slides
Move seat to be equipped with feeding clamp, go out material clamp, the feeding clamp and the spacing gone out between material clamp are equal to feed arrangement center
The distance between debugging mechanism center；First slip base and feeding clamp, go out to be equipped between material clamp and can drive charging
Fixture, go out the second driving cylinder that material clamp moves up and down.
The static contact spring piece mechanism for testing is arranged on the wherein side of debugging mechanism, including the first fixed seat, and described first is solid
Reservation is equipped with the second slide, and second slide is equipped with the second slip base, and the second slip base one end connection the 3rd is driven
To take offence cylinder, the first servomotor is additionally provided with second slip base, first servomotor is drivingly connected the first debugging set,
First debugging is arranged with the first debugging rod corresponding with relay static contact spring piece.
The movable contact spring mechanism for testing is arranged on the opposite side of debugging mechanism, including the second fixed seat, and described second fixes
Seat is equipped with the 3rd slide, and the 3rd slide is equipped with the 3rd slip base, the 4th driving of the 3rd slip base one end connection
Cylinder, the second servomotor is additionally provided with the 3rd slip base, and second servomotor is drivingly connected the second debugging set, institute
State the second debugging and be arranged with the second debugging rod corresponding with relay movable reed.
The overtravel automatic detection mechanism includes stent, and the stent is equipped with the 5th driving cylinder, and the described 5th drives
Cylinder of taking offence is drivingly connected test patch corresponding with relay iron.
The defective products drawing mechanism with drawing mechanism parallel arrangement is additionally provided with the outside of the drawing mechanism.
The feed arrangement is additionally provided with detent mechanism corresponding with automatic debugging device, and the detent mechanism, which includes positioning, to be kept off
Plate and the 6th driving cylinder for driving positioning baffle.
The automatic debugging device is equipped with 6 groups altogether.
The beneficial effects of the invention are as follows：Using above scheme, surveyed by debugging mechanism, static contact spring piece mechanism for testing, movable contact spring
Test-run a machine structure, overtravel automatic detection mechanism, respectively can debug relay pin, static contact spring piece, movable contact spring automatically, and pass through
Material grabbing mechanism carries out fast and accurately feeding to relay, so as to fulfill the automatic debugging efforts of relay, not only work efficiency
Height, and debug performance and stablize accurately.
Brief description of the drawings
Fig. 1 is positive structure diagram of the embodiment of the present invention.
Fig. 2 is overlooking the structure diagram of the embodiment of the present invention.
Fig. 3 is side structure schematic view of the embodiment of the present invention.
Fig. 4 is the structure diagram of automatic debugging device of the embodiment of the present invention.
Fig. 5 is the structure diagram of material grabbing mechanism of the embodiment of the present invention.
Fig. 6 is the structure diagram of debugging mechanism of the embodiment of the present invention.
Fig. 7 is the structure diagram of static contact spring piece mechanism for testing of the embodiment of the present invention.
Fig. 8 is the structure diagram of movable contact spring mechanism for testing of the embodiment of the present invention.
Fig. 9 is the structure diagram of overtravel automatic detection mechanism structure of the embodiment of the present invention.
Figure 10 is the structure enlargement diagram of A in Fig. 2.
1- racks in figure, 2- feed arrangements, 3- drawing mechanisms, 4- automatic debugging devices, 41- debugging mechanism, 411- tests
Panel, 4111- locating slots, 412- test benches, 413- positioning fixtures, 414- first drive cylinder, 42- material grabbing mechanisms, 421- branch
Support fixed seat, the first slides of 422-, the first slip bases of 423-, 424- feeding clamps, 425- go out material clamp, and 426- second drives gas
Cylinder, 43- static contact spring piece mechanism for testing, the first fixed seats of 431-, the second slides of 432-, the second slip bases of 433-, 434- the 3rd drive
Cylinder, the first servomotors of 435-, the debugging sets of 436- first, 437- first debug rod, 44- movable contact spring mechanism for testing, 441- the
Two fixed seats, the 3rd slides of 442-, the 3rd slip bases of 443-, 444- 4 wheel drivens are taken offence cylinder, the second servomotors of 445-, 446-
Two debugging sets, 447- second debug rod, 45- overtravel automatic detection mechanisms, 451- stents, the driving cylinders of 452- the 5th, 453-
Test patch, 5- defective products drawing mechanisms, 6- detent mechanisms, 61- positioning baffles, the driving cylinders of 62- the 6th.
Embodiment
Embodiments of the present invention is further illustrated below in conjunction with the accompanying drawings：
As shown in the figure, a kind of relay debugs machine, including rack 1 automatically, the rack 1 is equipped with the charging of parallel arrangement
Device 2, drawing mechanism 3, are equipped with 6 groups of automatic debugging devices 4 between the feed arrangement 2 and drawing mechanism 3.
Each group automatic debugging device is separate, can be with separate operaton, also can 6 groups of operations at the same time.
The automatic debugging device includes debugging mechanism 41, material grabbing mechanism 42, static contact spring piece mechanism for testing 43, movable contact spring test
Mechanism 44, overtravel automatic detection mechanism 45；The automatic debugging device 4 is controlled work by PLC controller, completely real
Now automatic debugging, realizes more machines of one man operation, and work efficiency is high, and properties of product are stablized after debugging.
As shown in the figure, the debugging mechanism 41 is arranged on the centre position between feed arrangement 2, drawing mechanism 3, including survey
Panel 411, test bench 412, positioning fixture 413 are tried, 411 center of test panel is equipped with the locating slot being adapted with relay
4111, the test bench 412 is arranged on the lower section of test panel 411, and corresponding with locating slot 4111；The test bench 412 connects
It is connected to the first driving cylinder 414 that test bench 412 can be driven to move up and down.
Relay to be debugged can be admitted in the locating slot 4111 of test panel 411 under the work of material grabbing mechanism 42,
Since locating slot is adapted with relay, so as to realize the accurate positionin of relay, at this time positioning fixture 413 can clamp after
Electric appliance, the test bench 412 rises under the action of the driving of bottom first cylinder 414 accurately debugs relay, not only
It is simple in structure, and can precise positioning, improve operational efficiency, reduction scraps.
Wherein described 4111 opening of locating slot sets chamfering, is further ensured that relay can be admitted in locating slot.
As shown in the figure, the material grabbing mechanism 42 includes support fixed seat 421, the support fixed seat 421 is equipped with first
Slide 422, first slide 422 are equipped with the first slip base 423, and first slip base 423 passes through 427 driving energy of motor
Toward polyslip on the first slide 422；First slip base 423 is equipped with feeding clamp 424, goes out material clamp 425, it is described into
Material clamp 424 and the spacing gone out between material clamp 425 are equal to the distance between feed arrangement center and debugging mechanism center；It is described
First slip base 423 and feeding clamp 424, go out to be equipped between material clamp 425 and can drive feeding clamp 424, go out on material clamp 425
Second driving cylinder 426 of lower movement.
Feeding clamp 424 with going out material clamp 425 while acting, clamp relay to be detected and send to debugging by feeding clamp 424
While mechanism 41, go out material clamp 425 and then clamp to have debugged the relay of end and send to drawing mechanism, realize the same of charging discharging
Step property, further improves work efficiency, and first slip base is moved through driving stepper motor, stable, effect
Rate is high.
In addition, feeding clamp 424, go out material clamp 425, positioning fixture 413 is to drive clip action by cylinder, real
Now clamp relay.
As shown in the figure, the wherein side of debugging mechanism 41 sets static contact spring piece mechanism for testing 43, the static contact spring piece mechanism for testing
Including the first fixed seat 431, first fixed seat 431 is equipped with the second slide 432, and second slide 432 is equipped with the
Two slip bases 433,433 one end of the second slip base connection the 3rd drive cylinder 434, are also set on second slip base 433
There is the first servomotor 435, first servomotor 435 is drivingly connected the first debugging set 436, the first debugging set 436
Equipped with the corresponding with relay static contact spring piece first debugging rod 437.
While testing relay haptic element, the 3rd driving cylinder 434 can promote the second slip base 433 to advance,
The first debugging rod 437 is contacted with static contact spring piece, static contact spring piece is debugged, test equipment signal is converted into digital signal by PLC
Control servomotor is precisely debugged, and is not only simple in structure, and debugging is accurate, and work efficiency is high.
As shown in the figure, the opposite side of debugging mechanism 41 then sets movable contact spring mechanism for testing 44, the movable contact spring mechanism for testing
Including the second fixed seat 441, second fixed seat 441 is equipped with the 3rd slide 442, and the 3rd slide 442 is equipped with the
Three slip bases 443, described 3rd slip base, 443 one end connection 4 wheel driven are taken offence cylinder 444, are also set on the 3rd slip base 443
There is the second servomotor 445, second servomotor 445 is drivingly connected the second debugging set 446, the second debugging set 446
Equipped with the corresponding with relay movable reed second debugging rod 447.
While testing relay haptic element, 4 wheel driven take offence cylinder 444 promote the 3rd slip base 443 advance, make
Second debugging rod 447 is contacted with movable contact spring, movable contact spring is debugged, test equipment signal is converted into digital signal control by PLC
Servomotor processed is precisely debugged, and is not only simple in structure, and debugging is accurate, and work efficiency is high.
In addition, the first servomotor 435,445 single motion of the second servomotor are no more than 3 times and total action frequency does not surpass
Cross 20 times, reduce movable contact spring variation, it is ensured that product parameters, make consistency of performance more preferable, so as to fulfill the self-protection to product
Function.
As shown in the figure, the wherein side of the debugging mechanism 41 is additionally provided with overtravel automatic detection mechanism 45, it is described super
Stroke automatic detection mechanism 45 includes stent 451, and the stent is equipped with the 5th driving cylinder 452, the 5th driving cylinder
452 are drivingly connected test patch 453 corresponding with relay iron.5th driving cylinder 452 can push to test patch 453 with after
Electric appliance iron core carries out engaged test.
Wherein, the driving cylinder fixes patch, the contiguous block and the 5th driving by a contiguous block and mounting blocks
Cylinder connects, its upper surface is equipped with a mounting groove, described to test in 454 clamping mounting groove of patch, by fixed block with being connected
The bolt fastening of block, realizes the fixation of test patch.This structure is not only simple, but also easy for assemble or unload.
As shown in the figure, the outside of the drawing mechanism 3 is additionally provided with the defective products drawing mechanism being arranged in parallel with drawing mechanism 3
5, relay can distinguish non-defective unit and defective products after test, and non-defective unit is then sent to drawing mechanism, is sent out by drawing mechanism 3,
Defective products is then sent to defective products drawing mechanism 5, is sent out by defective products drawing mechanism 5, it is achieved thereby that non-defective unit and defective products
Automatic classification.
As shown in the figure, the feed arrangement 3 is additionally provided with detent mechanism 6 corresponding with automatic debugging device 4, pass through localization machine
Structure, can realize relay charging positioning so that material grabbing mechanism can accurately capture relay.The detent mechanism 6 includes fixed
Position baffle 61 and the 6th driving cylinder 62 for driving positioning baffle 61, relay to be detected advance on feed arrangement 3, position
Baffle advances under the action of the 6th driving cylinder, and can block relay, does not allow it to move on, makees so as to fulfill positioning
With.
Embodiment is not construed as the limitation to invention, but any spiritual improvements introduced based on the present invention, all Ying Ben
Within the protection domain of invention.
Claims (6)
1. a kind of relay debugs machine, including rack automatically（1）, it is characterised in that：The rack（1）It is equipped with parallel arrangement
Feed arrangement（2）, drawing mechanism（3）, the feed arrangement（2）With drawing mechanism（3）Between be equipped with automatic debugging device（4）；
The automatic debugging device includes debugging mechanism（41）, material grabbing mechanism（42）, static contact spring piece mechanism for testing（43）, movable contact spring survey
Test-run a machine structure（44）, overtravel automatic detection mechanism（45）；The automatic debugging device（4）Work is controlled by controller；
The debugging mechanism（41）It is arranged on feed arrangement（2）, drawing mechanism（3）Between, including test panel（411）, test
Seat（412）, positioning fixture（413）, the test panel（411）Center is equipped with the locating slot being adapted with relay（4111）,
The test bench（412）It is arranged on test panel（411）Lower section, and and locating slot（4111）It is corresponding；The test bench（412）
Test bench can be driven by being connected with（412）The the first driving cylinder moved up and down（414）；
The static contact spring piece mechanism for testing（43）It is arranged on debugging mechanism（41）Wherein side, including the first fixed seat（431）, institute
State the first fixed seat（431）It is equipped with the second slide（432）, second slide（432）It is equipped with the second slip base（433）,
Second slip base（433）The 3rd driving cylinder of one end connection（434）, second slip base（433）On be additionally provided with first
Servomotor（435）, first servomotor（435）It is drivingly connected the first debugging set（436）, the first debugging set
（436）Equipped with the corresponding with relay static contact spring piece first debugging rod（437）；
The movable contact spring mechanism for testing（44）It is arranged on debugging mechanism（41）Opposite side, including the second fixed seat（441）, it is described
Second fixed seat（441）It is equipped with the 3rd slide（442）, the 3rd slide（442）It is equipped with the 3rd slip base（443）, institute
State the 3rd slip base（443）One end connection 4 wheel driven is taken offence cylinder（444）, the 3rd slip base（443）On be additionally provided with second and watch
Take motor（445）, second servomotor（445）It is drivingly connected the second debugging set（446）, the second debugging set（446）
Equipped with the corresponding with relay movable reed second debugging rod（447）.
2. relay according to claim 1 debugs machine automatically, it is characterised in that：The material grabbing mechanism（42）Including support
Fixed seat（421）, the support fixed seat（421）It is equipped with the first slide（422）, first slide（422）It is equipped with the
One slip base（423）, first slip base（423）Pass through motor（427）Driving energy is in the first slide（422）It is upper reciprocal sliding
Move；
First slip base（423）It is equipped with feeding clamp（424）, go out material clamp（425）, the feeding clamp（424）With
Go out material clamp（425）Between spacing be equal to the distance between feed arrangement center and debugging mechanism center；
First slip base（423）With feeding clamp（424）, go out material clamp（425）Between be equipped with can drive feeding clamp
（424）, go out material clamp（425）The the second driving cylinder moved up and down（426）.
3. relay according to claim 1 debugs machine automatically, it is characterised in that：The overtravel automatic detection mechanism
（45）Including stent（451）, the stent is equipped with the 5th driving cylinder（452）, the 5th driving cylinder（452）Driving connects
Connect test patch corresponding with relay iron（453）.
4. relay according to claim 1 debugs machine automatically, it is characterised in that：The drawing mechanism（3）Outside also
It is equipped with and drawing mechanism（3）The defective products drawing mechanism of parallel arrangement（5）.
5. relay according to claim 1 debugs machine automatically, it is characterised in that：The feed arrangement（3）Be additionally provided with
Automatic debugging device（4）Corresponding detent mechanism（6）, the detent mechanism（6）Including positioning baffle（61）And driving positioning
Baffle（61）The 6th driving cylinder（62）.
6. relay according to claim 1 debugs machine automatically, it is characterised in that：The automatic debugging device（4）Set altogether
There are 6 groups.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510851357.5A CN105510816B (en) | 2015-11-30 | 2015-11-30 | Relay debugs machine automatically |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510851357.5A CN105510816B (en) | 2015-11-30 | 2015-11-30 | Relay debugs machine automatically |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105510816A CN105510816A (en) | 2016-04-20 |
| CN105510816B true CN105510816B (en) | 2018-05-15 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510851357.5A Active CN105510816B (en) | 2015-11-30 | 2015-11-30 | Relay debugs machine automatically |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105938781B (en) * | 2016-06-30 | 2017-11-17 | 浙江美硕电气科技股份有限公司 | Driving electromagnetic relay debugs machine automatically |
| CN106842007B (en) * | 2017-01-03 | 2019-07-05 | 黄山思贝乔机器人自动化设备有限公司 | A kind of relay automatic detecting machine |
| CN108051738B (en) * | 2018-02-09 | 2024-01-26 | 太仓神明电子有限公司 | Relay detection device and detection method |
| CN113257626A (en) * | 2021-05-12 | 2021-08-13 | 欣大电气有限公司 | Automatic adjusting machine |
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| JPH01184481A (en) * | 1988-01-18 | 1989-07-24 | Toshiba Corp | Synthetic testing device for breaker |
| CN102411124A (en) * | 2011-08-02 | 2012-04-11 | 广东威恒输变电工程有限公司 | Mechanical property test device for special breaker |
| CN102680891A (en) * | 2012-06-15 | 2012-09-19 | 东莞市三友联众电器有限公司 | Electronic detection device for detecting over-travel value of finished product relay |
| CN103529383A (en) * | 2012-02-29 | 2014-01-22 | 温州奔龙自动化科技有限公司 | Automatic testing device |
| AU2014265085A1 (en) * | 2013-12-05 | 2015-06-25 | General Electric Company | Points machine monitoring system and method |
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2015
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|---|---|---|---|---|
| JPH01184481A (en) * | 1988-01-18 | 1989-07-24 | Toshiba Corp | Synthetic testing device for breaker |
| CN102411124A (en) * | 2011-08-02 | 2012-04-11 | 广东威恒输变电工程有限公司 | Mechanical property test device for special breaker |
| CN103529383A (en) * | 2012-02-29 | 2014-01-22 | 温州奔龙自动化科技有限公司 | Automatic testing device |
| CN102680891A (en) * | 2012-06-15 | 2012-09-19 | 东莞市三友联众电器有限公司 | Electronic detection device for detecting over-travel value of finished product relay |
| AU2014265085A1 (en) * | 2013-12-05 | 2015-06-25 | General Electric Company | Points machine monitoring system and method |
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| 以批生产一致性为目标的航天继电器关键部件的确定及优化;邓杰 等;《机电元件》;20110630(第3期);第27-32、46页 * |
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| CN105510816A (en) | 2016-04-20 |
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Address after: 325603 Zhejiang Province, Wenzhou City Industrial Zone Yueqing beibaixiang town of witherite Applicant after: Zhejiang United States Shuo electric Polytron Technologies Inc Address before: 325603 Zhejiang Province, Wenzhou City Industrial Zone Yueqing beibaixiang town of witherite Applicant before: Yueqing Meishuo Electric Co., Ltd. |
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Address after: No.158, wei12 Road, Yueqing Economic Development Zone, Yueqing City, Wenzhou City, Zhejiang Province 325600 Patentee after: ZHEJIANG MEISHUO ELECTRIC TECHNOLOGY Co.,Ltd. Address before: 325603 Chongshi Industrial Zone, beibaixiang Town, Yueqing City, Wenzhou City, Zhejiang Province Patentee before: ZHEJIANG MEISHUO ELECTRIC TECHNOLOGY Co.,Ltd. |