CN105467331B - A kind of multichannel isolated form electronic load and Test System On Power Aging - Google Patents
A kind of multichannel isolated form electronic load and Test System On Power Aging Download PDFInfo
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- CN105467331B CN105467331B CN201510796736.9A CN201510796736A CN105467331B CN 105467331 B CN105467331 B CN 105467331B CN 201510796736 A CN201510796736 A CN 201510796736A CN 105467331 B CN105467331 B CN 105467331B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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Abstract
The invention discloses a kind of multichannel isolated form electronic loads, including main microprocessor, serial ports and multiple channel units, main microprocessor is communicated by serial ports and host computer, main microprocessor is also connect with multiple channel units, channel unit includes photoelectric isolation communication circuit, from microprocessor, high speed D/A converter, band carries mode switching circuit, switch driving circuit, switching tube, current detection circuit, voltage detecting circuit, speed A/D converter and inspection leakage resistance, main microprocessor sends parameter setting instruction by photoelectric isolation communication circuit to from microprocessor, from microprocessor according to the setting instruction control D/A converter setting with the current value or voltage value carried.Invention additionally discloses a kind of Test System On Power Agings.The multichannel isolated form electronic load and Test System On Power Aging for implementing the present invention, have the advantages that：Improve test non-isolated power supply safety, the reliability of system operation is higher, cost is relatively low.
Description
Technical field
The present invention relates to burn-in test field, more particularly to a kind of multichannel isolated form electronic load and power source aging test
System.
Background technology
With the development of lighting engineering, LED (light emitting diode) enters lighting area in recent years, with its energy-saving and environmental protection and
The advantages that long lifespan, is just gradually replacing traditional incandescent lamp bulb, becomes the mainstream of illuminator, while also giving LED illumination lamp
Core-LED drive power brings exploding in market demand.In the application technology of LED drive power, non-isolated LED drives
Dynamic power supply is small with its, efficient and of low cost etc. many merits, becomes the mainstream power supply of LED illumination lamp." it is non-every
From " refer to carrying out electrical isolation not over transformer between ac input end (thermally) and load end (cold), but have
There is identical current path.The circuit diagram of typical non-isolated LED drive power (hereinafter referred to as non-isolated power supply) is such as
Shown in Fig. 1.Fig. 2 is the circuit diagram of typical electronic load circuit in traditional technology.
Electronic load is the detecting instrument of power source products indispensability, but traditional electronic load is generally used for isolation electricity
Source, and non-isolated power supply is due to the particularity of its circuit framework, if can equally be met using traditional electronic load to do test
To following Railway Project：
First, due between the AC input and load of non-isolated power supply be not present transformer, can not accomplish output with
In isolation and insulation electrically between input, and the operation panel of traditional electronic load, communication interface and power section are electric
Also electrical isolation is had no between road, and when for testing non-isolated power supply, the possibility of electric shock can be brought to operator.
Second, when testing non-isolated power supply using traditional electronic load, it is difficult to be monitored, and be difficult to by computer
Networking can when serious because the Leakage Current of non-isolated power supply can pass through electronic load and the RS232 interface of computer constitutes circuit
Damage the RS232 interface even computer main board of electronic load, computer.It is the aging vehicle that is thus made of traditional electronic load, old
Change the aging testing systems such as room, also can be only applied to isolated power supply, to non-isolated power supply and be not suitable for.
Third can not use separate unit electronic load to test more non-isolated power supplies simultaneously.Although traditional electronic load has
There are multiple channels a bit, but be not electrical isolation on hardware circuit between channel and channel, but belong to total ground framework, if making
More non-isolated power supplies are tested with separate unit electronic load simultaneously, it will cause to generate voltage between tested power supply or electric current is mutually dry
It disturbs, this interference can cause the constant-current circuit of tested power supply itself not normal so that test result is inaccurate, or even be easy to cause short
Component therein is damaged on road.The reliability for resulting in system operation in this way is not high.
The design of traditional electronic load is used mainly for departments such as research and development and quality control, and it is expensive, the throwing of equipment
It is higher to enter cost, being unable to meet production producer, a hundreds of or even thousands of power supplys are carried out at the same time burn-in test to electronic load number easily
Demand in amount.Conditional electronic load can only be used in parallel to extend bearing power into row of channels under CC (constant current) pattern,
Under other patterns under especially CV (constant pressure) pattern parallel connection due to can not conductance cause load because of overcurrent damage.
Invention content
The technical problem to be solved in the present invention is, is asked in the presence of safety for the above-mentioned test non-isolated power supply of the prior art
Topic, the reliability of system operation is high, the higher defect of cost, provide a kind of safety improving test non-isolated power supply,
The reliability of system operation is higher, lower-cost multichannel isolated form electronic load and Test System On Power Aging.
The technical solution adopted by the present invention to solve the technical problems is：A kind of multichannel isolated form electronic load is constructed,
Including main microprocessor, serial ports and multiple channel units, the main microprocessor is communicated by the serial ports and host computer, described
Main microprocessor is also connect with the multiple channel unit, and the channel unit includes photoelectric isolation communication circuit, from microprocessor
Device, high speed D/A converter, band carry mode switching circuit, switch driving circuit, switching tube, current detection circuit, voltage detecting electricity
Road, speed A/D converter and inspection leakage resistance, the main microprocessor is by the photoelectric isolation communication circuit to described from Wei Chu
It manages device and sends parameter setting instruction, it is described to be connect from microprocessor with the high speed D/A converter, for being set according to the parameter
It sets instruction and controls the high speed D/A converter setting with the current value or voltage value carried, the band carries the input of mode switching circuit
End is connect with the output end of the high speed D/A converter, and output end passes through the switch driving circuit and the one of the switching tube
End connection, the other end of the switching tube are connect with the inspection leakage resistance and current detection circuit respectively, the current detecting electricity
Road is also connect with the speed A/D converter, for the current value of the tested power supply of detection to be sent to the ultra high speed A/D conversion
Device, the voltage detecting circuit are connect with the speed A/D converter, for the output voltage for the tested power supply that will be detected
Value is sent to the speed A/D converter, and the speed A/D converter carries out analog-to-digital conversion to the current value and output voltage values
After be sent to it is described from microprocessor.
In multichannel isolated form electronic load of the present invention, the photoelectric isolation communication circuit includes the first photoelectricity
Coupler, the second photoelectrical coupler, the first current-limiting resistance, the second pull-up resistor, third pull-up resistor and the 4th current-limiting resistance, institute
It includes the first light emitting diode and the first phototriode to state the first photoelectrical coupler, and second photoelectrical coupler includes second
Light emitting diode and the second phototriode, the main microprocessor include serial ports transmitting terminal and serial ports receiving terminal, described from micro-
Processor includes serial ports transmitting terminal and serial ports receiving terminal, the serial ports transmitting terminal of the main microprocessor and first light-emitting diodes
The cathode of pipe connects, and the anode of first light emitting diode is connect with first current-limiting resistance, first photosensitive three pole
The collector of pipe is connect with described from the serial ports receiving terminal of microprocessor, and the collector of first phototriode also passes through institute
State third pull-up resistor connection power supply, the emitter ground connection of first phototriode, the string from microprocessor
Mouth transmitting terminal is connect with the cathode of second light emitting diode, and the anode of second light emitting diode passes through the described 4th and limits
Leakage resistance connects the power supply, and the serial ports of the collector of second phototriode respectively with the main microprocessor connects
Receiving end is connected with the second pull-up resistor, the emitter ground connection of second phototriode.
Further include channel separation power supply circuit, the channel in multichannel isolated form electronic load of the present invention
Isolation power supply circuit includes PWM controller, isolating transformer and power supply unit, and the isolating transformer includes input winding and more
One end of a output winding, the input winding is connect with one end of the PWM controller, and the other end is controlled with the PWM
The other end of device connects, and said supply unit includes multiple power supply subelements, and the power supply subelement includes diode and electrolysis
One end of capacitance, the output winding is connect with the anode of the diode, the cathode of the diode respectively with the electrolysis
The anode of capacitance is connected with power supply, and the other end of the output winding and the cathode of the electrolytic capacitor are grounded.
In multichannel isolated form electronic load of the present invention, the switching tube is metal-oxide-semiconductor, the grid of the metal-oxide-semiconductor
Pole is connect with the switch driving circuit, and the drain electrode of the metal-oxide-semiconductor is connect with the anode of the tested power supply, the metal-oxide-semiconductor
Source electrode is connect by the inspection leakage resistance with the cathode of the tested power supply.
Further include connecting, being used for the main microprocessor in multichannel isolated form electronic load of the present invention
The matrix keyboard input operation instruction, and connect with the main microprocessor, for showing the current value and output voltage
The liquid crystal display of value.
Further include connecting, being used for the main microprocessor in multichannel isolated form electronic load of the present invention
The address code configuration switch of address coding is set.
Further include radiator fan and control circuit in multichannel isolated form electronic load of the present invention, it is described to dissipate
Hot-air fan is connect with the main microprocessor, and the control circuit is connect with the radiator fan, for controlling the radiation air
Fan is turned on and off.
Further include heatsink temperature detection circuit in multichannel isolated form electronic load of the present invention, it is described to dissipate
Backing temperature sensing circuit connect with the main microprocessor, the temperature for detecting cooling fin.
The invention further relates to a kind of Test System On Power Agings, including host computer, interface convertor, communication bus, power supply
Power supply unit, multiple electronic loads and multiple tested power supplys, the host computer are connect with the interface convertor, the interface conversion
Device is connect by the communication bus with multiple electronic loads, the power supply unit respectively with multiple electronic loads
It connects, for being powered, the electronic load is equipped with multiple channels, and each channel is all connected with a tested power supply, institute
It is any one in above-mentioned arbitrary multichannel isolated form electronic load to state electronic load.
Further include switching surge controller and AC power in Test System On Power Aging of the present invention, it is described
Interface convertor is also connect by the communication bus with the switching surge controller, the switching surge controller also with institute
The tested power supply connection having.
The multichannel isolated form electronic load and Test System On Power Aging for implementing the present invention, have the advantages that：
Due to the use of in main microprocessor, multiple channel units and channel unit photoelectric isolation communication circuit and from microprocessor,
Main microprocessor by photoelectric isolation communication circuit to from microprocessor send parameter setting instruction, thereby realize electric appliance every
From with insulation, safety to tester and equipment when improving test non-isolated power supply, as a result of channel separation skill
Art, when having prevented separate unit electronic load while having tested more non-isolated power supplies be tested power supply between be easy to happen interfere with each other or
The possibility of short circuit, improves the reliability of system operation；In same electronic load, number of channels can pass through identical channel
Unit carries out arbitrary extension, effectively reduces equipment input cost；So which raises the safety of test non-isolated power supply, being
Reliability of operation of uniting is higher, cost is relatively low.
Description of the drawings
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technology description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention without having to pay creative labor, may be used also for those of ordinary skill in the art
With obtain other attached drawings according to these attached drawings.
Fig. 1 is the circuit diagram of conventional non-isolated LED drive power；
Fig. 2 is the circuit block diagram of conditional electronic load；
Fig. 3 be in multichannel isolated form electronic load of the present invention and Test System On Power Aging one embodiment multichannel every
The structural schematic diagram of release electronic load；
Fig. 4 is the circuit diagram of photoelectric isolation communication circuit in the embodiment；
Fig. 5 is the circuit diagram of channel separation power supply circuit in the embodiment；
Fig. 6 is the structural schematic diagram of Test System On Power Aging in the embodiment.
Specific implementation mode
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation describes, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
In multichannel isolated form electronic load of the present invention and Test System On Power Aging embodiment, multichannel isolated form
The structural schematic diagram of electronic load is as shown in Figure 3.In Fig. 3, which includes main microprocessor 1, string
Four channel units 3 are depicted as an example in mouthfuls 2 and multiple channel units 3, Fig. 3, in fact, multichannel isolated form electricity
The number of the included channel unit 3 of son load can accordingly increase or decrease the number of channel unit 3 as needed, such as：
The number of channel unit 3 can be two, three, five, six or more, that is to say, that the number of channel unit 3 is at least
Two.In the present embodiment, serial ports 2 uses RS485 communication interfaces, and certainly, under some cases of the present embodiment, serial ports 2 also may be used
To select other types, such as select RS232 communication interfaces.
In the present embodiment, main microprocessor 1 is communicated by serial ports 2 and host computer (not shown), receives host computer hair
The control instruction come or by data back to host computer.Main microprocessor is also connect with multiple channel units 3, channel unit 3
Including photoelectric isolation communication circuit 31, from microprocessor 32, high speed D/A converter 33, band carry mode switching circuit 34, switch drives
Dynamic circuit 35, switching tube Q, current detection circuit 36, voltage detecting circuit 37, speed A/D converter 38 and inspection leakage resistance R, master are micro-
Processor 1 sends parameter setting instruction by photoelectric isolation communication circuit 31 to from microprocessor 32, from microprocessor 32 and height
The connection of fast D/A converter 33 is arranged for controlling high speed D/A converter 33 according to parameter setting instruction with the current value or voltage carried
Value executes various drawings and carries Modal action, and speed A/D converter 38 is coordinated to be AD converted, with the defeated of load mode switching circuit 34
Enter end to connect with the output end of high speed D/A converter 33, output end is connected by one end of switch driving circuit 35 and switching tube Q
It connects, the other end of switching tube Q is connect with inspection leakage resistance R, and the other end of switching tube Q is electric with detection resistance R and current detecting respectively
Road 36 connects, and current detection circuit 36 also connect with speed A/D converter 38, the current value of tested power supply for that will detect is sent out
It is sent to speed A/D converter 38, voltage detecting circuit 37 connect with speed A/D converter 38, tested power supply for that will detect
Output voltage values are sent to speed A/D converter 38, and speed A/D converter 38 carries out analog-to-digital conversion to current value and output voltage values
After be sent to from microprocessor 32.Namely current detection circuit 36 and voltage detecting circuit 37 measure be tested power supply respectively in real time
Current value and output voltage values, and the current value of measurement and output voltage values are finally returned into main microprocessor 1, then by
Main microprocessor 1 is sent to host computer by serial ports 2 and is shown.
In the present embodiment, switching tube Q is metal-oxide-semiconductor, and the grid of metal-oxide-semiconductor is connect with switch driving circuit 35, the drain electrode of metal-oxide-semiconductor
Connect with the anode of tested power supply (anode of specifically tested power input interface), the source electrode of metal-oxide-semiconductor by examine leakage resistance R and
Cathode (cathode of specifically tested power input interface) connection of tested power supply.
It is noted that in the present embodiment, which further includes matrix keyboard 4 and liquid crystal
Display screen 5, matrix keyboard 4 and liquid crystal display 5 are connect with main microprocessor 1, wherein matrix keyboard 4 refers to for inputting operation
It enables, the current value and output voltage values of above-mentioned measurement are sent to liquid crystal display 5 by main microprocessor 1 and are shown.Work as application
When power source aging system or test system, it may be unnecessary to which matrix keyboard 4 and liquid crystal display 5 are directly communicated with host computer.
The present embodiment increases by one by the way that photoelectric isolation communication circuit 31 is added on the basis of conditional electronic load circuit
For microprocessor as host (i.e. main microprocessor 1), microprocessor originally serves as slave (i.e. from microprocessor 32), overcomes
Conditional electronic is supported on compatibility not high problem when in face of power supply product various in style, when as applied to non-isolated power supply
Many deficiencies are used for the problems such as load flexibility and utilization rate be not high when multiple power specification, and cost is relatively low, have multiple logical
Road, and between channel independently of one another, pass through photoelectricity without electric loop, main microprocessor 1 and between microprocessor 32 completely
Isolation communicating circuit 31 is communicated, and supports that arbitrary channel is in parallel under arbitrary patterns, the multichannel isolated form electronic load is not
But non-isolated power supply is can be applied to, equally applicable to isolated supplies, when applied to small-power power, each channel is independent
It uses, when the output power of tested power supply is more than the input power in single channel, multiple channels can be selected according to actual conditions
It is used in parallel to improve utilization rate of equipment and installations.So which raises the safety of test non-isolated power supply, the reliabilities of system operation
It is higher, cost is relatively low.
Fig. 4 is the structural schematic diagram of photoelectric isolation communication circuit in the present embodiment, in Fig. 4, the photoelectric isolation communication circuit
Including the first photoelectrical coupler U1, the second photoelectrical coupler U2, the first current-limiting resistance R1, the second pull-up resistor R2, third pull-up
Resistance R3 and the 4th current-limiting resistance R4, the first photoelectrical coupler U1 include the first light emitting diode and the first phototriode, the
Two photoelectrical coupler U2 include the second light emitting diode and the second phototriode, and main microprocessor 1 includes serial ports transmitting terminal
UART_TX and serial ports receiving terminal UART_RX includes serial ports transmitting terminal UART_TX and serial ports receiving terminal UART_ from microprocessor 32
The serial ports transmitting terminal UART_TX of RX, main microprocessor 1 are connect with the cathode of the first light emitting diode, the first light emitting diode
Anode is connect with the first current-limiting resistance R1, the collector of the first phototriode and the serial ports receiving terminal from microprocessor 32
The collector of UART_RX connections, the first phototriode also passes through third pull-up resistor R3 connection power supply VCC, the first light
The emitter of quick triode is grounded, and the cathode of serial ports transmitting terminal UART_TX and the second light emitting diode from microprocessor 32 connect
It connects, the anode of the second light emitting diode passes through the 4th current-limiting resistance R4 connections power supply VCC, the current collection of the second phototriode
Pole is connect with the serial ports receiving terminal UART_RX of main microprocessor 1 and the second pull-up resistor R2 respectively, the hair of the second phototriode
Emitter grounding.The self character of photoelectrical coupler is utilized in the photoelectric isolation communication circuit 31, both realized main microprocessor 1 with
Data transmission between microprocessor 32, and achieved the purpose that electrical isolation and insulation.
In the present embodiment, which further includes channel separation power supply circuit, circuit diagram
As shown in Figure 5.In Fig. 5, which includes PWM controller, isolating transformer T and power supply unit, and isolation becomes
Depressor T includes input winding and multiple output windings, and four output windings are depicted in Fig. 5, and the one end and PWM for inputting winding are controlled
One end of device processed connects, and the other end of the other end and PWM controller that input winding connects, and power supply unit includes multiple supplied for electronic
Unit, in the present embodiment, the quantity for subelement of powering is identical as the quantity of channel unit, that is, the quantity of power supply subelement is
Four.Power supply subelement includes diode and electrolytic capacitor, the anode connection of each one end for exporting winding and diode, two poles
The cathode of pipe is connect with the anode and power supply of electrolytic capacitor respectively, and the cathode of each other end for exporting winding and electrolytic capacitor is equal
Ground connection.Four power supply subelements are depicted in Fig. 5, first power supply subelement includes the first diode D1 and the first electrolytic capacitor
C1, second power supply subelement include the second diode D2 and the second electrolytic capacitor C2, and third power supply subelement includes third
Diode D3 and third electrolytic capacitor C3, the 4th power supply subelement includes the 4th diode D4 and the 4th electrolytic capacitor C4；Its
In, one end of first output winding is connect with the anode of the first diode D1, and the cathode of the first diode D2 is respectively with first
The anode of electrolytic capacitor C1 is connected with the first power supply Vcc1, the other end and the first electrolytic capacitor C1 of first output winding
Cathode be grounded GND1；One end of second output winding is connect with the anode of the second diode D2, the second diode D2's
Cathode respectively with the second electrolytic capacitor C2 anode and the second power supply Vcc2 connect, second export winding the other end with
The cathode of second electrolytic capacitor C2 is grounded GND2；One end of third output winding is connect with the anode of third diode D3,
The cathode of third diode D3 is connect with the anode and third power supply Vcc3 of third electrolytic capacitor C3 respectively, third output
The other end of winding and the cathode of third electrolytic capacitor C3 are grounded GND3；4th one end for exporting winding and the 4th diode
The anode of D4 connects, and the cathode of the 4th diode D4 connects with the anode of the 4th electrolytic capacitor C4 and the 4th power supply Vcc4 respectively
It connects, the cathode of the 4th other end for exporting winding and the 4th electrolytic capacitor C4 are grounded GND4.In the present embodiment, each channel
Working power by the different winding powers of auxiliary isolating transformer T, electrical between each winding be entirely isolated and insulate
's.
In the present embodiment, which further includes address code configuration switch 6, the address
Code configuration switch 6 is connect with main microprocessor 1, for address coding to be arranged.The multichannel isolated form electronic load also wraps
Radiator fan 7 and control circuit 8 are included, radiator fan 7 is connect with main microprocessor 1, and control circuit 8 connect with radiator fan 7, uses
In being turned on and off for control radiator fan 7.The multichannel isolated form electronic load further includes heatsink temperature detection circuit 9,
Heatsink temperature detection circuit 9 connect with main microprocessor 1, the temperature for detecting cooling fin.
The present embodiment further relates to a kind of Test System On Power Aging, and structural schematic diagram is as shown in Figure 6.In Fig. 6, the power supply
Aging testing system includes host computer, interface convertor, communication bus, power supply unit, multiple electronic loads and multiple tested
Power supply, host computer are connect with interface convertor, and interface convertor is connect by communication bus with multiple electronic loads, power supply supply
Device is connect respectively with multiple electronic loads, for being powered, and in the present embodiment, the number of electronic load is four, is tested electricity
The number in source is 16, and electronic load is set there are four channel (CH1, CH2, CH3, CH4), and each channel is all connected with one and is tested
Power supply, that is, each electronic load are all connected with four tested power supplys, electronic load be above-mentioned multichannel in the present embodiment every
Release electronic load.In the present embodiment, interface convertor is used for the conversion between RS485 communication interfaces and RS232 communication interfaces,
Communication bus is RS485 communication buses, and power supply unit supply is direct current 12D voltages.The Test System On Power Aging also wraps
Switching surge controller and AC power are included, which is 85Vac-265Vac.Interface convertor also passes through communication bus
It is connect with switching surge controller, switching surge controller is also connect with all tested power supplys.Host computer is on communication bus
All electronic loads status information of tested power supply for uniformly carrying out parameter setting, while each electronic load being uploaded and refer to
Mark information is analyzed, stored and is shown, and generates test data report and data graphs etc. by host computer.The power source aging
Test system realizes large batch of power supply for power supply manufacturing firm and is carried out at the same time burn-in test, effectively increases production efficiency.
The Test System On Power Aging is not only applicable to isolated power supply, is equally applicable to non-isolated power supply.
In short, in the present embodiment, the invention have CC (constant current)/CV (constant pressure)/CR (permanent resistance)/CP (invariable power)/
Five kinds of stand-alone modes of LED and its mixed mode of intercombination.Under arbitrary patterns, the arbitrary parallel connection of interchannel is supported, with full
The power supply test demand of sufficient different capacity section improves the utilization rate and cost performance of equipment.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all essences in the present invention
With within principle, any modification, equivalent replacement, improvement and so on should all be included in the protection scope of the present invention god.
Claims (10)
1. a kind of multichannel isolated form electronic load, which is characterized in that including main microprocessor, serial ports and multiple channel units,
The main microprocessor is communicated by the serial ports and host computer, and the main microprocessor also connects with the multiple channel unit
Connect, the channel unit include photoelectric isolation communication circuit, from microprocessor, high speed D/A converter, band carry mode switching circuit,
Switch driving circuit, switching tube, current detection circuit, voltage detecting circuit, speed A/D converter and inspection leakage resistance, the master are micro-
Processor sends parameter setting instruction to described by the photoelectric isolation communication circuit from microprocessor, described from microprocessor
It is connect with the high speed D/A converter, for controlling the high speed D/A converter setting with load according to the parameter setting instruction
Current value or voltage value, the input terminal that the band carries mode switching circuit are connect with the output end of the high speed D/A converter,
Output end is connect by the switch driving circuit with one end of the switching tube, the other end of the switching tube respectively with it is described
Inspection leakage resistance is connected with current detection circuit, and the current detection circuit is also connect with the speed A/D converter, for that will examine
The current value for the tested power supply surveyed is sent to the speed A/D converter, the voltage detecting circuit and the speed A/D converter
It connects, for the output voltage values of the tested power supply of detection to be sent to the speed A/D converter, the high-speed AD turns
Parallel operation is described from microprocessor to being sent to after the current value and output voltage values progress analog-to-digital conversion.
2. multichannel isolated form electronic load according to claim 1, which is characterized in that the photoelectric isolation communication circuit
Including the first photoelectrical coupler, the second photoelectrical coupler, the first current-limiting resistance, the second pull-up resistor, third pull-up resistor and
Four current-limiting resistances, first photoelectrical coupler include the first light emitting diode and the first phototriode, second photoelectricity
Coupler includes the second light emitting diode and the second phototriode, and the main microprocessor includes that serial ports transmitting terminal and serial ports connect
Receiving end, it is described from microprocessor include serial ports transmitting terminal and serial ports receiving terminal, the serial ports transmitting terminal of the main microprocessor and institute
The cathode connection of the first light emitting diode is stated, the anode of first light emitting diode is connect with first current-limiting resistance, institute
The collector for stating the first phototriode is connect with described from the serial ports receiving terminal of microprocessor, first phototriode
Collector also connects power supply by the third pull-up resistor, and the emitter ground connection of first phototriode is described
It is connect from the serial ports transmitting terminal of microprocessor with the cathode of second light emitting diode, the anode of second light emitting diode
The power supply is connected by the 4th current-limiting resistance, the collector of second phototriode is micro- with the master respectively
The serial ports receiving terminal of processor and the connection of the second pull-up resistor, the emitter ground connection of second phototriode.
3. multichannel isolated form electronic load according to claim 2, which is characterized in that further include channel separation power supply electricity
Road, the channel separation power supply circuit include PWM controller, isolating transformer and power supply unit, and the isolating transformer includes
Input winding and multiple output windings, one end of the input winding is connect with one end of the PWM controller, the other end and
The other end of the PWM controller connects, and said supply unit includes multiple power supply subelements, and the power supply subelement includes two
One end of pole pipe and electrolytic capacitor, the output winding is connect with the anode of the diode, the cathode difference of the diode
It is connect with the anode of the electrolytic capacitor and the power supply, the other end of the output winding and bearing for the electrolytic capacitor
Extremely it is grounded.
4. the multichannel isolated form electronic load according to claims 1 to 3 any one, which is characterized in that the switch
Pipe is metal-oxide-semiconductor, and the grid of the metal-oxide-semiconductor is connect with the switch driving circuit, the drain electrode of the metal-oxide-semiconductor and the tested power supply
Anode connection, the source electrode of the metal-oxide-semiconductor connect by the inspection leakage resistance with the cathode of the tested power supply.
5. multichannel isolated form electronic load according to claim 1, which is characterized in that further include and the main microprocessor
Device connection, the matrix keyboard for inputting operation instruction, and connect with the main microprocessor, for showing the current value
With the liquid crystal display of output voltage values.
6. multichannel isolated form electronic load according to claim 1 or 5, which is characterized in that further include micro- with the master
Processor connection, the address code configuration switch for address coding to be arranged.
7. multichannel isolated form electronic load according to claim 1 or 5, which is characterized in that further include radiator fan and
Control circuit, the radiator fan are connect with the main microprocessor, and the control circuit connect with the radiator fan, is used for
Control being turned on and off for the radiator fan.
8. multichannel isolated form electronic load according to claim 7, which is characterized in that further include heatsink temperature detection
Circuit, the heatsink temperature detection circuit connect with the main microprocessor, the temperature for detecting cooling fin.
9. a kind of Test System On Power Aging, which is characterized in that including host computer, interface convertor, communication bus, power supply supply
Device, multiple electronic loads and multiple tested power supplys, the host computer are connect with the interface convertor, and the interface convertor is logical
It crosses the communication bus to connect with multiple electronic loads, the power supply unit connects with multiple electronic loads respectively
It connects, for being powered, the electronic load is equipped with multiple channels, and each channel is all connected with a tested power supply, described
Electronic load is any one multichannel isolated form electronic load in the claim 1 to 8.
10. Test System On Power Aging according to claim 9, which is characterized in that further include switching surge controller and
AC power, the interface convertor are also connect by the communication bus with the switching surge controller, the switch punching
Controller is hit also to connect with all tested power supplys.
Priority Applications (1)
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| CN106405438A (en) * | 2016-10-12 | 2017-02-15 | 合肥大族科瑞达激光设备有限公司 | High-temperature aging energy-saving system for laser power supply |
| CN110967548B (en) * | 2018-09-29 | 2022-03-04 | 株洲中车时代电气股份有限公司 | Program-controlled variable resistor device with current detection function and working method |
| CN109085443B (en) * | 2018-10-29 | 2020-08-21 | 泰华智慧产业集团股份有限公司 | Power adapter rated life testing method |
| CN113589041A (en) * | 2021-06-22 | 2021-11-02 | 苏州浪潮智能科技有限公司 | Interface power supply signal test fixture, integrity test system and integrity test method |
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