CN105467168B - 一种设有陶瓷针盘的测试座 - Google Patents
一种设有陶瓷针盘的测试座 Download PDFInfo
- Publication number
- CN105467168B CN105467168B CN201510960341.8A CN201510960341A CN105467168B CN 105467168 B CN105467168 B CN 105467168B CN 201510960341 A CN201510960341 A CN 201510960341A CN 105467168 B CN105467168 B CN 105467168B
- Authority
- CN
- China
- Prior art keywords
- dials
- probe
- probe groups
- pedestal
- ceramic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510960341.8A CN105467168B (zh) | 2015-12-21 | 2015-12-21 | 一种设有陶瓷针盘的测试座 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510960341.8A CN105467168B (zh) | 2015-12-21 | 2015-12-21 | 一种设有陶瓷针盘的测试座 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN105467168A CN105467168A (zh) | 2016-04-06 |
CN105467168B true CN105467168B (zh) | 2018-06-08 |
Family
ID=55605091
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201510960341.8A Expired - Fee Related CN105467168B (zh) | 2015-12-21 | 2015-12-21 | 一种设有陶瓷针盘的测试座 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN105467168B (zh) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101105506A (zh) * | 2006-07-13 | 2008-01-16 | 旺矽科技股份有限公司 | 高频探针卡 |
CN101387656A (zh) * | 2007-09-13 | 2009-03-18 | 加比尔电路公司 | 柔性测试夹具 |
CN202119805U (zh) * | 2011-05-17 | 2012-01-18 | 苏州市科林源电子有限公司 | 一种pcb板测试的复合汽缸治具 |
CN103091522A (zh) * | 2013-02-27 | 2013-05-08 | 上海华力微电子有限公司 | 一种兼容高低温测试的探针卡 |
CN205246710U (zh) * | 2015-12-21 | 2016-05-18 | 深圳市邦乐达科技有限公司 | 一种设有陶瓷针盘的测试座 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4695447B2 (ja) * | 2005-06-23 | 2011-06-08 | 株式会社日本マイクロニクス | プローブ組立体およびこれを用いた電気的接続装置 |
-
2015
- 2015-12-21 CN CN201510960341.8A patent/CN105467168B/zh not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101105506A (zh) * | 2006-07-13 | 2008-01-16 | 旺矽科技股份有限公司 | 高频探针卡 |
CN101387656A (zh) * | 2007-09-13 | 2009-03-18 | 加比尔电路公司 | 柔性测试夹具 |
CN202119805U (zh) * | 2011-05-17 | 2012-01-18 | 苏州市科林源电子有限公司 | 一种pcb板测试的复合汽缸治具 |
CN103091522A (zh) * | 2013-02-27 | 2013-05-08 | 上海华力微电子有限公司 | 一种兼容高低温测试的探针卡 |
CN205246710U (zh) * | 2015-12-21 | 2016-05-18 | 深圳市邦乐达科技有限公司 | 一种设有陶瓷针盘的测试座 |
Also Published As
Publication number | Publication date |
---|---|
CN105467168A (zh) | 2016-04-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP02 | Change in the address of a patent holder | ||
CP02 | Change in the address of a patent holder |
Address after: 518108 6013, floor 6, building 2, Huike Industrial Park, No.1, industrial Second Road, Shilong community, Shiyan street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: SHENZHEN BONRDA TECHNOLOGY Co.,Ltd. Address before: 518000 Guangdong city of Shenzhen province Baoan District Shiyan Street Community in paddy field huilongda Industrial Park plant on the eastern side of building B3 Patentee before: SHENZHEN BONRDA TECHNOLOGY Co.,Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180608 Termination date: 20211221 |