CN105466577B - The measuring device and method of perfect vortex beams topology charge values based on Intensity Analysis - Google Patents
The measuring device and method of perfect vortex beams topology charge values based on Intensity Analysis Download PDFInfo
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- CN105466577B CN105466577B CN201610030465.0A CN201610030465A CN105466577B CN 105466577 B CN105466577 B CN 105466577B CN 201610030465 A CN201610030465 A CN 201610030465A CN 105466577 B CN105466577 B CN 105466577B
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- 238000004458 analytical method Methods 0.000 title claims abstract description 15
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- 230000009466 transformation Effects 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 4
- 230000010363 phase shift Effects 0.000 claims description 4
- 230000008569 process Effects 0.000 claims description 4
- 210000001747 pupil Anatomy 0.000 claims description 4
- 238000002834 transmittance Methods 0.000 claims description 4
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
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Abstract
The measuring device and method of perfect vortex beams topology charge values based on Intensity Analysis are related to the manipulation of particle light and optical testing art, including a continuous-wave laser;The direction of advance that the continuous-wave laser sends out light beam is equipped with pinhole filter, light beam direction of advance after pinhole filter is equipped with convex lens I, aperture I successively, the polarizer and reflective spatial light modulator, the light beam generated after reflective spatial light modulator reflects, analyzer, aperture II, convex lens II and CCD camera are equipped in its direction of advance successively, the positive and negative level-one of diffraction interference imaging in CCD camera that black grid generate in spatial light modulator is made by phase compensation, interference fringe image is transferred to computer and is handled.This programme does not need to be split light, and saves external intervention optical element, simplifies light path;Realize the measurement of integer rank vortex beams topology charge values;Have many advantages, such as principle is succinct, of low cost, parameter can real-time online adjust and easily operated.
Description
Technical field
The present invention relates to the manipulation of particle light and optical testing art, specifically a kind of perfect whirlpools based on Intensity Analysis
Revolve the measuring device and measuring method of light beam topological charge value.
Background technology
Perfect vortex beams magnet ring optical fiber excitation orbital angular momentum pattern, optics trapping, manipulate fine particle, optical tweezer and
Light spanner etc. has a wide range of applications.2013, Andrey S.Ostrovsky et al. proposed the concept of perfect vortex,
The vortex beams bright ring radius is independent of topological charge values [Opt.Lett.38,534,2013], but this method is vortexed with perfect
Light beam can generate the additional spuious ring of light.2015, Pravin Vaity etc. to Bessel-Gauss beams by being Fourier
Transformation is vortexed [Opt.Lett., 40,597,2015] so as to obtain the integer rank perfection without the additional ring of light.The topology of vortex beams
Lotus carries optical information amount and can provide the particle manipulating more to become more meticulous, becomes the numerous researchers of vortex optical field and competitively studies
Hot subject.
The measuring method of vortex beams mainly has interferometry and diffractometry.Wherein, P.Vaity is utilized and is tilted biconvex mirror
Michelson interferometer optical path measures integer rank and is vortexed [Opt.Lett.37,1301,2012], interferes bright fringes quantity by number
Can measure topology charge values is the vortex beams within 14;And typical Diffractometry method has delthyrium diffraction approach, this method can
Measure the topological charge values [Opt.Lett.36,787,2011] within 7.
Above research is all the measurement to vortex beams topological charge.And perfect vortex beams bright ring radius is independent of topology
Charge values, therefore how to measure perfect vortex beams arbitrary integer rank topology charge values using simple and effective experimental provision is the neck
The problem urgently to be resolved hurrily that domain faces.
Invention content
The present invention solves the deficiency of above-mentioned technical problem, provides a kind of device for measuring perfect vortex beams topology charge values
And method, this method by using Fourier transformation translation so that save external intervention optical element (Dove prism and phase
Answer auxiliary element), measurement perfection vortex beams arbitrary integer rank topology charge values that can be easy.
The used to solve above-mentioned technical problem technical solution of the present invention is:Perfect vortex beams based on Intensity Analysis
The measuring device of topological charge values, including a continuous-wave laser;The direction of advance that the continuous-wave laser sends out light beam is equipped with
Pinhole filter, the light beam direction of advance after pinhole filter are equipped with convex lens I, aperture I, the polarizer and reflection successively
Formula spatial light modulator, the light beam generated after reflective spatial light modulator reflects are equipped with analyzing in direction of advance successively
Device, aperture II, convex lens II and CCD camera make the diffraction of black grid generation in spatial light modulator just by phase compensation
Negative one grade interference imaging in CCD camera, interference fringe image are transferred to computer and are handled.
The reflective spatial light modulator, CCD camera are connect respectively with computer;The pinhole filter with it is convex
Distance between lens I is the focal length of convex lens I;The reflective spatial light modulator is placed in the front focal plane of convex lens II
On;The CCD camera is placed on the back focal plane of convex lens II.
Using the measuring method of the vortex beams topological charge value measurement mechanism of Intensity Analysis, include the following steps:
Step 1: using holographic technique is calculated, by carrying out phase-modulation to the vortex beams for passing through axicon lens, with plane
Wave interference is formed in plot of light intensity write-in reflective spatial light modulator;Detailed process is as follows:
The electric field of plane wave is expressed as:
Ep=E0exp(-ikz)
Wherein, E0Represent oscillator intensity, k represents wave number, and z represents propagation distance;
The electric field of the vortex beams impinged perpendicularly on axicon lens is expressed as:
Wherein, A0For amplitude constant, w0For waist radius, m is topological charge number, round numbers;J is imaginary unit;
The complex amplitude transmittance function of axicon lens is:
In formula, n is axicon lens Refractive Index of Material, and α is the cone angle of axicon lens;K is wave number, and R is axicon lens pupil radius;
Vortex beams are after axicon lens with plane wave interference and carrying out dephased COMPLEX AMPLITUDE and being:
By E1Plot of light intensity write-in spatial light modulator in;
Step 2: opening the power supply of continuous-wave laser, the light beam that continuous-wave laser is sent out enters pinhole filter, so
It is collimated by convex lens I, the light beam after collimation becomes linearly polarized light after aperture I, the polarizer, is radiated at Reflective spatial
On optical modulator;
Step 3: the light beam being radiated on reflective spatial light modulator is used for diffraction reconstruction Bessel-Gauss beams;Spread out
The Bessel-Gauss beams of reproduction are penetrated after analyzer and aperture II, are radiated at progress Fourier's change on convex lens II
Change the perfect vortex beams of generation;
Step 4: after the perfect vortex beams are imaged in CCD camera, by adjusting phase shift factor so that by counting
The positive and negative level-one perfection vortex for calculating the generation of holographic technique diffraction is interfered.Interference pattern is subsequently divided using computer
Analysis;
Step 5: it is analyzed from interference pattern:The spiral bright fringes distribution of interference has circular symmetry, then utilizes formula
M=n/2 acquires the topological charge values of vortex beams, wherein, m is topological charge values, and n is spiral bright fringes number.
Advantageous effect:Compared with prior art, the present invention does not need to be split light, and saves external intervention optics member
Part (Dove prism and corresponding auxiliary element), simplifies light path;Realize the measurement of integer rank vortex beams topology charge values;The present invention
Device have many advantages, such as principle is succinct, of low cost, parameter can real-time online adjust and easily operated.
Description of the drawings
Fig. 1 is the schematic diagram of device of perfect vortex beams generation device of the invention.
It is marked in figure:001st, laser, 002, pinhole filter, 003, convex lens I, 004, aperture I, 005, be polarized
Device, 006, reflective spatial light modulator, 007, analyzer, 008, aperture II, 009, convex lens II, 010, CCD camera,
011st, computer.
Fig. 2 is the positive and negative 1 grade of interference strength of perfect vortex beams that the topological charge values of computer record are respectively 3,4,9,10
Figure, wherein, intermediate bright spot is diffraction zero-level speck.
Specific embodiment
As shown in the figure, the measuring device of the perfect vortex beams topology charge values based on Intensity Analysis, swashs including a continuous wave
Light device 001;The direction of advance that the continuous-wave laser 001 sends out light beam is equipped with pinhole filter 002, through pinhole filter
Light beam direction of advance after 002 is equipped with convex lens I 003, aperture I 004, the polarizer 005 and reflection type spatial light tune successively
Device 006 processed, the light beam that generates after the reflection of reflective spatial light modulator 006 are equipped with analyzer in direction of advance successively
007th, aperture II 008, convex lens II 009 and CCD camera 010 make black grid in spatial light modulator 006 by phase compensation
The positive and negative level-one of diffraction of generation interference imaging, interference fringe image in CCD camera 010 are transferred at computer 011
Reason.
The reflective spatial light modulator 006, CCD camera 010 are connect respectively with computer 011;The pin hole
Distance between wave filter 002 and convex lens I 003 is the focal length of convex lens I 003;The reflective spatial light modulator 006 is put
In on the front focal plane of convex lens II 009;The CCD camera 010 is placed on the back focal plane of convex lens II 009.
Using the measuring method of the vortex beams topological charge value measurement mechanism of Intensity Analysis, include the following steps:
Step 1: using holographic technique is calculated, by carrying out phase-modulation to the vortex beams for passing through axicon lens, with plane
Wave interference is formed in plot of light intensity write-in reflective spatial light modulator 006;Detailed process is as follows:
The electric field of plane wave is expressed as:
Ep=E0exp(-ikz)
Wherein, E0Represent oscillator intensity, k represents wave number, and z represents propagation distance;
The electric field of the vortex beams impinged perpendicularly on axicon lens is expressed as:
Wherein, A0For amplitude constant, w0For waist radius, m is topological charge number, round numbers;J is imaginary unit;
The complex amplitude transmittance function of axicon lens is:
In formula, n is axicon lens Refractive Index of Material, and α is the cone angle of axicon lens;K is wave number, and R is axicon lens pupil radius;
Vortex beams are after axicon lens with plane wave interference and carrying out dephased COMPLEX AMPLITUDE and being:
By E1Plot of light intensity write-in spatial light modulator 006 in;
Step 2: opening the power supply of continuous-wave laser 001, the light beam that continuous-wave laser 001 is sent out enters pin hole filter
Wave device 002, then planoconvex lens I 003 collimate, the light beam after collimation becomes linear polarization after aperture I 004, the polarizer 005
Light is radiated on reflective spatial light modulator 006;
Step 3: the light beam being radiated on reflective spatial light modulator 006 is used for diffraction reconstruction Bessel-Gauss beams
Beam;The Bessel-Gauss beams of diffraction reconstruction are radiated at convex lens II 009 after analyzer 007 and aperture II 008
The upper perfect vortex beams of progress Fourier transformation generation;
Step 4: after the perfect vortex beams are imaged in CCD camera 010, by adjusting phase shift factor so that by
The positive and negative level-one perfection vortex for calculating the generation of holographic technique diffraction is interfered.After being carried out using computer 011 to interference pattern
Continuous analysis;
Step 5: it is analyzed from interference pattern:The spiral bright fringes distribution of interference has circular symmetry, then utilizes formula
M=n/2 acquires the topological charge values of vortex beams, wherein, m is topological charge values, and n is spiral bright fringes number.
Embodiment one
As shown in Figure 1, the measuring device of the perfect vortex beams topology charge values based on Intensity Analysis, including a continuous wave
Laser 001, continuous-wave laser 001 selects wavelength as 534nm in the embodiment, and power is the solid state laser of 50mW;It should
The light beam that continuous-wave laser 001 is sent out enters pinhole filter 002, and then planoconvex lens I 003 collimate, the light beam after collimation
Become linearly polarized light after aperture I 004, the polarizer 005, be radiated on reflective spatial light modulator 006;
The light beam that generates after the reflection of reflective spatial light modulator 006 is equipped with analyzer in direction of advance successively
007th, aperture II 008, convex lens II 009 and CCD camera 010 make black grid in spatial light modulator 006 by phase compensation
The positive and negative level-one of diffraction of generation interference imaging, interference fringe image in CCD camera 010 are transferred at computer 011
Reason;
The reflective spatial light modulator 006, CCD camera 010 are connect respectively with computer 011;The pin hole
Distance between wave filter 002 and convex lens I 003 is the focal length of convex lens I 003;The reflective spatial light modulator 006 is put
In on the front focal plane of convex lens II 009;The CCD camera 010 is placed on the back focal plane of convex lens II 009.
Using the measuring method of the vortex beams topological charge value measurement mechanism of Intensity Analysis, include the following steps:
Step 1: using holographic technique is calculated, by carrying out phase-modulation to the vortex beams for passing through axicon lens, with plane
Wave interference is formed in plot of light intensity write-in reflective spatial light modulator 006;Detailed process is as follows:
The electric field of plane wave is expressed as:
Ep=E0exp(-ikz)
Wherein, E0Represent oscillator intensity, k represents wave number, and z represents propagation distance;
The electric field of the vortex beams impinged perpendicularly on axicon lens is expressed as:
Wherein, A0For amplitude constant, w0For waist radius, m is topological charge number, round numbers;J is imaginary unit;
The complex amplitude transmittance function of axicon lens is:
In formula, n is axicon lens Refractive Index of Material, and α is the cone angle of axicon lens;K is wave number, and R is axicon lens pupil radius;
Vortex beams are after axicon lens with plane wave interference and carrying out dephased COMPLEX AMPLITUDE and being:
By E1Plot of light intensity write-in spatial light modulator 006 in.
Step 2: opening the power supply of continuous-wave laser 001, the light beam that continuous-wave laser 001 is sent out enters pin hole filter
Wave device 002, then planoconvex lens I 003 collimate, the light beam after collimation becomes linear polarization after aperture I 004, the polarizer 005
Light is radiated on reflective spatial light modulator 006;
Step 3: the light beam being radiated on reflective spatial light modulator 006 is used for diffraction reconstruction Bessel-Gauss beams
Beam;The Bessel-Gauss beams of diffraction reconstruction are radiated at convex lens II 009 after analyzer 007 and aperture II 008
The upper perfect vortex beams of progress Fourier transformation generation;
Step 4: after the perfect vortex beams are imaged in CCD camera 010, by adjusting phase shift factor so that by
The positive and negative level-one perfection vortex for calculating the generation of holographic technique diffraction is interfered.After being carried out using computer 011 to interference pattern
Continuous analysis;
Step 5: it is analyzed from interference pattern:The spiral bright fringes distribution of interference has circular symmetry, then utilizes formula
M=n/2 acquires the topological charge values of vortex beams, wherein, m is topological charge values, and n is spiral bright fringes number;Fig. 2 is tests
To default topological charge values be respectively 3,4,9,10 positive and negative level-one perfection vortex interference experiment figures, it is bright by the spiral shape in several figures
Striped, bright fringes number are respectively 6,8,18,20, and it is 3,4,9,10 to substitute into formula m=n/2 and acquire topological charge, so as to demonstrate
This method can realize the measurement of integer rank perfection vortex beams topology charge values.
The present invention does not need to be split light, and saves external intervention optical element (Dove prism and corresponding auxiliary member
Part), simplify light path;Realize the measurement of integer rank vortex beams topology charge values;Apparatus of the present invention are succinct, at low cost with principle
Honest and clean, parameter can real-time online adjust and it is easily operated the advantages that.
Claims (1)
1. the measuring method of the perfect vortex beams topology charge values based on Intensity Analysis, the measuring device packet used in the measuring method
Include a continuous-wave laser (001);The direction of advance that the continuous-wave laser (001) sends out light beam is equipped with pinhole filter
(002), the light beam direction of advance after pinhole filter (002) is equipped with convex lens I (003), aperture I (004) successively, rises
Inclined device (005) and reflective spatial light modulator (006), the light beam generated after reflective spatial light modulator (006) reflection,
Analyzer (007), aperture II (008), convex lens II (009) and CCD camera (010) are equipped in its direction of advance successively,
The positive and negative level-one of diffraction of black grid generation in reflective spatial light modulator (006) is made in CCD camera (010) by phase compensation
Interference imaging, interference fringe image are transferred to computer (011) and are handled;
The reflective spatial light modulator (006), CCD camera (010) are connect respectively with computer (011);The needle
The distance between hole wave filter (002) and convex lens I (003) are the focal length of convex lens I (003);The reflection type spatial light
Modulator (006) is placed on the front focal plane of convex lens II (009);The CCD camera (010) is placed in convex lens II (009)
Back focal plane on;It is characterized in that:Step is as follows:
Step 1: using holographic technique is calculated, by carrying out phase-modulation by the vortex beams of axicon lens, being done with plane wave
It relates to be formed in plot of light intensity write-in reflective spatial light modulator;Detailed process is as follows:
The electric field of plane wave is expressed as:
Ep=E0exp(-ikz)
Wherein, E0Represent oscillator intensity, k represents wave number, and z represents propagation distance;
The electric field of the vortex beams impinged perpendicularly on axicon lens is expressed as:
Wherein, A0For amplitude constant, w0For waist radius, m is topological charge number, round numbers;J is imaginary unit;
The complex amplitude transmittance function of axicon lens is:
In formula, n is axicon lens Refractive Index of Material, and α is the cone angle of axicon lens;K is wave number, and R is axicon lens pupil radius;
Vortex beams are after axicon lens with plane wave interference and carrying out dephased COMPLEX AMPLITUDE and being:
By E1Plot of light intensity write-in spatial light modulator in;
Step 2: opening the power supply of continuous-wave laser, the light beam that continuous-wave laser is sent out enters pinhole filter, Ran Houjing
Convex lens I collimates, and the light beam after collimation becomes linearly polarized light after aperture I, the polarizer, is radiated at reflection type spatial light tune
On device processed;
Step 3: the light beam being radiated on reflective spatial light modulator is used for diffraction reconstruction Bessel-Gauss beams;Diffraction is again
Existing Bessel-Gauss beams are radiated at progress Fourier transformation life on convex lens II after analyzer and aperture II
Into perfect vortex beams;
Step 4: after the perfect vortex beams are imaged in CCD camera, by adjusting phase shift factor so that complete by calculating
The positive and negative level-one perfection vortex of breath technology diffraction generation is interfered, and subsequent analysis is carried out to interference pattern using computer;
Step 5: it is analyzed from interference pattern:The spiral bright fringes distribution of interference has circular symmetry, then utilizes formula m=
N/2 acquires the topological charge values of vortex beams, wherein, m is topological charge values, and n is spiral bright fringes number.
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