CN105453164B - The luminance deviation compensation equipment of display and compensation method - Google Patents

The luminance deviation compensation equipment of display and compensation method Download PDF

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Publication number
CN105453164B
CN105453164B CN201480042124.4A CN201480042124A CN105453164B CN 105453164 B CN105453164 B CN 105453164B CN 201480042124 A CN201480042124 A CN 201480042124A CN 105453164 B CN105453164 B CN 105453164B
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voltage
image element
organic electroluminescence
current
oled
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CN105453164A (en
Inventor
李正哲
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Na Wobi Kolon Inc
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Na Wobi Kolon Inc
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Priority claimed from KR1020130086744A external-priority patent/KR20150011595A/en
Priority claimed from KR1020130149266A external-priority patent/KR20150064481A/en
Application filed by Na Wobi Kolon Inc filed Critical Na Wobi Kolon Inc
Publication of CN105453164A publication Critical patent/CN105453164A/en
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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G09G3/3258—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the voltage across the light-emitting element
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809—Several active elements per pixel in active matrix panels
    • G09G2300/0842—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809—Several active elements per pixel in active matrix panels
    • G09G2300/0842—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
    • G09G2300/0861—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor with additional control of the display period without amending the charge stored in a pixel memory, e.g. by means of additional select electrodes
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809—Several active elements per pixel in active matrix panels
    • G09G2300/0842—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
    • G09G2300/0861—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor with additional control of the display period without amending the charge stored in a pixel memory, e.g. by means of additional select electrodes
    • G09G2300/0866—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor with additional control of the display period without amending the charge stored in a pixel memory, e.g. by means of additional select electrodes by means of changes in the pixel supply voltage
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
    • G09G2320/0295—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel by monitoring each display pixel
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/043—Preventing or counteracting the effects of ageing
    • G09G2320/045—Compensation of drifts in the characteristics of light emitting or modulating elements
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/06—Adjustment of display parameters
    • G09G2320/0693—Calibration of display systems

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Control Of El Displays (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

The present invention relates to one kind to compensate equipment, compensation equipment replacement luminance deviation caused by OLED long-time use, and the compensation equipment includes：Driving transistor (112), there is first electrode, second electrode and gate electrode；First voltage source (VDD), it is connected with the first electrode of the driving transistor (112)；Organic electroluminescence device (114), there is the anode electrode being connected with the second electrode of the driving transistor (112)；The second voltage source (Vss)；Selecting switch (115), the cathode electrode of the organic electroluminescence device (114) is set to be used to selectively connect to the second voltage source (Vss) or current sink (160)；And current measurement circuit (140), the electric current that the current sink (160) are flowed to from the first voltage source (VDD) is measured when applying test voltage (Vdata) on the gate electrode in the driving transistor (112).

Description

The luminance deviation compensation equipment of display and compensation method
Technical field
The present invention relates to a kind of luminance deviation of display to compensate equipment and compensation method, and more particularly, relates to And use luminance deviation of the organic electroluminescence device as the organic electroluminescence device of the display device of the pixel of display Compensate equipment and compensation method.
Background technology
Recently, it is used as the organic of the pixel of display using organic electroluminescence device (hereinafter referred to as " organic EL device ") Electroluminescent display (hereinafter also referred to as " OLED ") causes extensive concern.Organic electroluminescence used herein Luminescent device is light and thin as the OLED of luminescent device, and has outstanding brightness than other displays Characteristic and viewing angle characteristic, and be therefore expected to turn into flat-panel display device of future generation.
Organic electroluminescence device has a configuration that：Organic luminous layer including organic compound, which is inserted into, to be formed Between a pair of electrodes being made up of anode and negative electrode on the transparency carrier of such as glass, and it is that such a light sets It is standby：Wherein hole and electronics are injected into organic luminous layer from this to electrode, and these holes and electronics are wherein again With reference to produce exciton, so as to lose light caused by excitation state by being emitted in exciton to perform display etc..
Organic luminous layer is the film layer made of organic material, wherein the color of the light sent and converting the current to The conversion efficiency of light is determined by the composition for forming the organic material of organic luminous layer, and different organic materials is produced with mutual The light of the color differed.
However, when long-time uses display, organic material performance reduces (degraded) and therefore luminous efficiency Reduce, so as to shorten the life-span of display.In this case, for example, according to the color of the light sent, different organic materials May be with different rate reduction performances, and the performance reduction of color may also be different.
Additionally, it is known that a variety of pixels for including of display may not with mutually the same rate reduction performance, therefore, The difference that performance reduces speed causes uneven display.
First, the reason for this performance reduces may include, due to the resistance value of long-term use of display display itself Increase and the reduction of luminous efficiency.If organic electroluminescence device is luminous for a long time, the resistance value of the device will gradually increase Add.In addition, a variety of organic electroluminescence devices that display includes each has different glow frequencies, and therefore, accumulation Fluorescent lifetime should be different.Therefore, if driving display for a long time, then will production between organic electroluminescence device The deviation of raw resistance value, therefore produce the deviation of luminosity so that across the screen there may be brightness irregularities or again Picture.
Another reason for performance reduces is due to the thin film transistor (TFT) (TFT) to form pixel, particularly driving transistor, The intensity decreases of the light sent with the passage of usage time caused by performance reduction caused by threshold voltage increase, wherein The increase of the threshold voltage of transistor is also different between multiple transistors in display.
Meanwhile as solving asking as described above caused by performance caused by long-term use of display reduces The technology of topic, patent document 1 disclose a kind of technology.
Fig. 1 be a diagram that the circuit diagram of the configuration of the drive circuit for display disclosed in patent document 1.
As shown in figure 1, the conventional drive circuit for display has image element circuit 60, it includes selection transistor 90th, driving transistor 70 and organic electroluminescence device 50, and including first voltage source 14, make first voltage source 14 with driving First switch S1 that the first electrode of transistor 70 is selectively connected, its anode are connected with the second electrode of driving transistor 70 On organic electroluminescence device 50, the second voltage source 15 and organic electroluminescence device 50 is selected with the second voltage source 15 The second switch S2 connected to property.
In addition, the conventional drive circuit for display includes the extraction being connected with the second electrode of driving transistor 70 Transistor 80, current source 16, make current source 16 with draw transistor 80 second electrode be selectively connected the 3rd switch S3, Current sink 17, the 4th switch S4 for making current sink 17 be selectively connected with drawing the second electrode of transistor 80 And tension measuring circuit 18, the tension measuring circuit are connected with when in driving transistor with drawing the second electrode of transistor 80 Voltage is measured when applying test voltage on 70 gate electrode.
Tension measuring circuit 18 includes being used for analog-digital converter 18a, the place that the magnitude of voltage of measurement is converted into data signal The memory 18c of device 18b and the magnitude of voltage of storage measurement is managed, and passes through multiplexer 40 and multiple extraction transistors 80 Second electrode connection on to sequentially read out the voltage Vout of image element circuit 60.
Processor 18b is connected by digital analog converter 18e with the data wire of image element circuit 60, for data signal to be changed Into analog signal to provide predetermined data value to data wire.In addition, processor 18b receives the display number from input terminal input According to Data, to compensate change described below, so as to which the data of compensation are supplied into data wire.
Next, it will be briefly described a kind of method for being used to compensate the characteristic variations of display disclosed in patent document 1.
First, the switch S4 of first switch S1 and the 4th are closed, and open the switch S3 of second switch S2 and the 3rd, so as to, The voltage for the second electrode for drawing transistor 80 is measured using current measurement circuit 18, driving transistor 70 is represented so as to obtain First signal V1 of characteristic.
Fig. 1 illustrates the only one pixel of multiple pixels of display, but includes for display all multiple First signal of each pixel of measurement.
For example, before image element circuit 60 is used for into display, that is to say, that in driving transistor making due to display With and performance reduce before, measure side the first signal V1, and store it in memory 18c as first object believe Number.Hereafter, it is used for display by the scheduled time and after performance reduction in image element circuit, as described above same procedure The first signal is measured again, and is stored it in memory 18c.
Next, opening the switch S4 of first switch S1 and the 4th, and the switch S3 of second switch S2 and the 3rd are closed, so as to The voltage for the second electrode for drawing transistor 80 is measured using current measurement circuit 18, organic electroluminescence is represented so as to obtain The secondary signal V2 of the characteristic of part 50.
The secondary signal V2 of all multiple each pixels of measurement included for display.Similar to the first letter Number, using before display, that is to say, that organic electroluminescence device 50 due to the use of display and performance reduces it It is preceding and organic electroluminescence device be used as display pass through by the scheduled time and performance reduce after, measure secondary signal respectively V2 is to be stored in memory 18c.
Next, carry out the change of the characteristic of compensation drive circuit by using the change of the first signal and secondary signal.
In addition, patent document 2 discloses a kind of voltage sensing circuit including transistor and a kind of display, the voltage sense Slowdown monitoring circuit senses the voltage on a surface of each organic electroluminescence device of OLED to produce feedback signal, The display calculates the thermal compensation signal of each organic electroluminescence device and is applied to thermal compensation signal each to be had for driving To compensate the change of the output of each organic electroluminescence device in the data of organic electroluminescence devices.
Represented however, patent document 1 individually measures because the performance of the driving transistor in each image element circuit drops First signal V1 of characteristic variations caused by low and the representative characteristic caused by the performance of organic electroluminescence device reduces The secondary signal V2 of change characteristic variations.Accordingly, there exist the problem of be to measure caused by the use of display characteristic to become The step of change, is complicated and cumbersome, and needs the change of plenty of time measurement characteristicses.
In addition, for the change of measurement characteristicses, four switches, multiplexers of each pixel and first to fourth switch 40 need to draw transistor, and need single current source so that special caused by the use of display for measuring Property change circuit configuration may be very complicated, the problem of this is caused is that the aperture ratio of display reduces and the brightness of display Reduce.Especially, it is more obvious in the transparent OLED that these problems light in the both direction of display.
In addition, the performance that patent document 2 does not account for driving transistor reduces, and the use that this is due to display causes One of characteristic the reason for reducing, and be not therefore fully solved that caused by long-term use of display performance reduces asks Topic.
In addition, it is necessary to the voltage sensing circuit including transistor is provided separately, voltage sensing circuit sensing organic electroluminescence To produce feedback signal, this causes the aperture ratio of display to reduce and luminance-reduction for the voltage on one surface of luminescent device Problem.
[association area file]
[patent document]
Patent document 1：International publication number WO2009/002406
Patent document 2：The uncensored patent publication No. 2007-514966 of Japan
The content of the invention
Technical problem
In view of situation as described above, it is an object of the invention to provide a kind of luminance deviation of display compensation equipment and Compensation method, luminance deviation compensation equipment are measured due to driving transistor simultaneously by simply configuring with single step Characteristic variations caused by reducing and the characteristic variations caused by organic electroluminescence device performance reduces, while have relative In the simpler circuit configuration for measurement characteristicses change of prior art.
Technical scheme
In order to realize purpose as described above, according to one aspect, there is provided a kind of luminance deviation of OLED Equipment is compensated, including：Driving transistor, it has first electrode, second electrode and gate electrode；First voltage source, it is and described The first electrode connection of driving transistor；Organic electroluminescence device, have and be connected with the second electrode of the driving transistor Anode electrode；The second voltage source；Selecting switch, it is configured to the cathode electrode selectivity of the organic electroluminescence device Ground is connected to the second voltage source or current sink (current sink)；And current measurement circuit, it is configured to work as When applying test voltage on the gate electrode of the driving transistor, measurement flows to the electric current from the first voltage source and inhaled Receive the electric current of device.
According on the other hand, there is provided a kind of luminance deviation compensation equipment of OLED, the luminance deviation Compensating equipment includes multiple image element circuits, first voltage source and the second voltage source of n rows × m row, wherein the multiple pixel is electric The each of road includes：Driving transistor；Organic electroluminescence device, there is a terminal being connected with the first voltage source, Apply the voltage from the first voltage source on one terminal when the driving transistor is opened；And read brilliant Body pipe, when the driving transistor is closed, the reading transistor is selectively turned on in the organic electroluminescence device A terminal on apply voltage, the luminance deviation compensation equipment includes：Current sink；Selecting switch, be configured to by Another terminal of the organic electroluminescence device is used to selectively connect to the second voltage source or the current sink； And current measurement circuit, it is configured to measure from the first voltage when applying test voltage in the driving transistor Source stream to the organic electroluminescence device electric current, and when the reading transistor is opened measurement from the reading crystal Pipe flows to the electric current of the organic electroluminescence device.
In order to realize purpose as described above, according on the other hand, there is provided a kind of to be set by the compensation of above-mentioned luminance deviation The standby method for carrying out luminance deviation compensation, including：The selecting switch is set to be switched to the current sink side；Pass through the electricity Flow measurement circuitry measures the electric current that the current sink is flowed to from the first voltage source；And mended based on measured electric current Repay the luminance deviation of the OLED.
According on the other hand, there is provided a kind of side that equipment progress luminance deviation compensation is compensated by above-mentioned luminance deviation Method, including：Third step, measure characteristic in the OLED due to the use of the OLED and Performance reduce before the multiple image element circuit it is each in the driving transistor grid-source voltage and described have The driving voltage of organic electroluminescence devices；Four steps, the characteristic in the OLED is measured due to described organic The use of active display and performance reduce after the multiple image element circuit it is each in the driving transistor grid The driving voltage of pole-source voltage and the organic electroluminescence device；And the 5th step, based on respectively in third step and The multiple image element circuit measured in four steps it is each in the grid-source voltage of the driving transistor and described The driving voltage of organic electroluminescence device calculate the multiple image element circuit it is each in the driving transistor threshold value The driving voltage changing value of voltage change and the organic electroluminescence device.
Beneficial effect
According to the present invention it is possible to determined simultaneously by single current measurement special caused by driving transistor performance reduces Property change and due to organic electroluminescence device performance reduce caused by characteristic variations, so as to simplify measurement due to display Use caused by characteristic variations step while, shorten measurement characteristicses and change spent time.
In addition, according to the present invention, by making the common cathode of each image element circuit be used to selectively connect to the second voltage source Or the selecting switch of current sink can simply perform and be converted into measurement pattern, and it thus be accordingly used in the spy of measurement display Property change circuit configuration can be simplified so that need not substantially be used for measurement characteristicses change extra configuration, so as to Simplify the construction of the configuration of the characteristic variations of measurement display, without substantially reducing aperture ratio.
Brief description of the drawings
Fig. 1 be a diagram that the circuit diagram of the configuration of the drive circuit for conventional display；
Fig. 2 is the circuit diagram for schematically illustrating the configuration of 1 display according to an embodiment of the invention；
Fig. 3 be a diagram that the main of 1 specific image element circuit and luminance deviation compensation device according to an embodiment of the invention The circuit diagram of configuration；
Fig. 4 is the flow chart of the order of according to an embodiment of the invention 1 luminance deviation compensation method；
Fig. 5 is the circuit diagram for schematically illustrating the configuration of 2 display according to an embodiment of the invention；
Fig. 6 be a diagram that the main of 2 specific image element circuit and luminance deviation compensation device according to an embodiment of the invention The circuit diagram of configuration；
Fig. 7 is the flow chart of the order of according to an embodiment of the invention 2 luminance deviation compensation method；
Fig. 8 be a diagram that for measuring each picture before according to an embodiment of the invention 2 display performance reduction The stream of the order of the method for the grid-source voltage of the driving transistor of plain circuit and the driving voltage of organic electroluminescence device Cheng Tu；
Fig. 9 be a diagram that for measuring each picture after according to an embodiment of the invention 2 display performance reduction The stream of the order of the method for the grid-source voltage of the driving transistor of plain circuit and the driving voltage of organic electroluminescence device Cheng Tu.
Embodiment
The preferred embodiments of the present invention are described in detail hereinafter with reference to accompanying drawing.
1. embodiment 1
Fig. 2 is the circuit diagram for schematically illustrating the configuration of 1 display according to an embodiment of the invention.
As shown in Fig. 2 according to the display of embodiment 1 include display unit 100, controller 120, gate drivers 130, Data driver 150, anode driver 170, selecting switch 115, current sink 160, analog-digital converter 142 and digital-to-analogue conversion Device 145.
Display unit 100 includes multiple gate line Lg1 to Lgn (n be integer) more than or equal to 2, parallel separately from each other set The multiple data wire Ld1 to Ldm (m is the integer more than or equal to 2) put and multiple anode line La1 to Lan.Multiple gate lines Lg1 to Lgn and multiple anode line La1 to Lan be arranged in parallel separately from each other.In addition, multiple data wire Ld1 to Ldm and multiple grid Polar curve Lg1 to Lgn and multiple anode line La1 to Lan intersects.
Each image element circuit Px (i, j) (i=1 to n, j=1 to m, wherein m and n are natural number respectively) is arranged on multiple grid Each crosspoint intersected with each other polar curve Lg1 to Lgn and multiple data wire Ld1 to Ldm.Multiple image element circuit P (i, j) are arranged to The matrix shape (m be natural number respectively with n) of n rows × m row is to form display unit 100.
Each image element circuit P (i, j) explained below detailed configuration.
Multiple image element circuit P (i, j) of display unit 100 are connected to gate drivers by gate line Lg1 to Lgn respectively 130, data driver 150 is connected to by data wire Ld1 to Ldm, anode driver is connected to by anode line La1 to Lan 170。
Controller 120 produces the signal and data for driving display unit 100 according to received image signal Data Signal, and caused signal and data-signal are respectively supplied to gate drivers 130 and data driver 150.
Gate drivers 130 are connected with gate line Lg1 to Lgn, and according to signal that grid impulse is suitable to make a reservation for Sequence is fed to each gate line Lg1 to Lgn.
Data driver 150 is connected with data wire Ld1 to Ldm, and is supplied data-signal by data wire Ld1 to Ldm It should sent out to pixel to be driven in the image element circuit P (i, j) being supplied with the gate line Lg1 to Lgn of signal Light.
Anode driver 170 passes through anode line La1 to Lan output voltages VHighOr VLowVoltage signal to image element circuit P (i, j).Voltage VLowBe be used to making organic electroluminescence device 114 in each image element circuit P (i, j) write handle when at In the voltage of non-luminescent state.In addition, voltage VHighIt is to be used to make the organic electroluminescence in each image element circuit P (i, j) Part 114 is in the voltage of luminance.
However, if it is desired to can not separately installed anode driver 13, and can use simultaneously multiple pixels electricity The so-called public anode for applying anode voltage on road P (i, j) anode line La1 to Lan replaces it.
Selecting switch 115 makes the cathode side of image element circuit P (i, j) explained below organic electroluminescence device 114 Current sink 160 or the second voltage source Vss are used to selectively connect to, and when the brightness of measurement the following description of the present invention is inclined When poor, the negative electrode of each organic electroluminescence device 114 is connected with the side of current sink 160, and when as typical display When device operates, the negative electrode of each organic electroluminescence device 114 is connected with the second voltage source Vss, and can be in controller Its operation is performed under 120 control.
One terminal of current sink 160 is connected with selecting switch 115, and another terminal passes through analog-digital converter 142 are connected with controller 120.It is connected to image element circuit P's (i, j) by selecting switch 115 when predetermined data value is applied to When on the data wire Ldj of the negative electrode of organic electroluminescence device 114, there is the electric current flowing of predetermined value.Electric current explained below Measuring circuit 140.
Next, it will be described in the configuration of image element circuit P (i, j) and luminance deviation compensation equipment.Fig. 3 be a diagram that root According to embodiments of the invention 1 image element circuit and luminance deviation compensation device main configuration circuit diagram.
As shown in figure 3, organic electroluminescence device 114, driving crystal are included according to the image element circuit P (i, j) of embodiment 1 Pipe 112, switching transistor 111 and capacitor 113.
The each of transistor 111 and 112 includes first electrode, second electrode and gate electrode.
The first electrode of driving transistor 112 in each image element circuit P (i, j) and first voltage source VDD and electric capacity In another terminal connection of device 113.Here, first voltage source VDD can be by with single anode driver 170 The voltage source that anode driver 170 in display is supplied, and work as and be used as supplying anode voltage to multiple image element circuit P simultaneously During the anode line La1 to Lan of (i, j) so-called public anode, first voltage source VDD can be the voltage for public anode Source.
In addition, the second electrode of driving transistor 112 is connected with the anode of organic electroluminescence device 114, and it is organic The negative electrode of electroluminescent device 114 is optionally connected by selecting switch 115 with the second voltage source Vss or current sink 160 Connect.In addition, the gate electrode of driving transistor 112 is connected with switching transistor 111, and will be supplied by data wire Ldj Data are selectively supplied to driving transistor 112.
The gate electrode of switching transistor 111 is connected by gate line Lgi with gate drivers 130, and by from grid The scanning signal (row selection signal) that driver 130 is supplied opens first electrode, so as to will enter into each data wire Ldj's Picture signal Data is output to the gate electrode of driving transistor 112 and a terminal of capacitor 113.
The negative electrode of organic electroluminescence device 114 is optionally connected to the second voltage source Vss or electricity by selecting switch 115 Absorber 160 is flowed, and when as typical display operation, the negative electrode and second voltage of organic electroluminescence device 114 Source Vss is in the state being connected to each other, and when the luminance deviation of the measurement present invention, the negative electrode of organic electroluminescence device 114 The state being connected to each other is in current sink 160.
As shown in Fig. 2 in the display according to embodiment 1, using so-called common cathode, wherein n rows × m is arranged more On the negative electrode of individual image element circuit P (i, j) is connected to each other.Common cathode passes through a selecting switch 115 and a second voltage source In Vss connections.
Current measurement circuit 140 includes being used for analog-digital converter 142, the control that current measurement value is converted into data signal Device 120 and processor 141, wherein the data signal from analog-digital converter 142 is transferred to processor 141.
In addition, current measurement circuit 140 further comprises memory 144, for storing current measurement value, if it is desired, Low pass filter 143 can also be included.
Current measurement circuit 140 is selectively connected to display unit by current sink 160 and selecting switch 115 The common cathode of 100 multiple image element circuit P (i, j), and sequentially read out and flow through each of multiple image element circuit P (i, j) Electric current.
In addition, processor 141 is connected by digital analog converter 145 with data wire Ldj, and when the brightness of the measurement present invention During deviation, predetermined data value is supplied by data wire Ldj.
In addition, processor 141 receives picture signal Data to realize luminance compensation described below by input terminal Compensation.Therefore, when as typical display operation, offset data is fed to image element circuit P (i, j) by data wire Ldj.
In the display of Fig. 2 diagrams, controller 120 also performs the function of the processor 141 of current measurement circuit 140, But not limited to this, and included controller 120 can be used as single part.
Next, before the operation of description embodiment 1, the concept according to the compensation of the luminance deviation of embodiment 1 will be described.
As described above, threshold caused by the driving transistor performance reduction that may be present included due to each image element circuit The rise of threshold voltage and the voltage change caused by the internal resistance change of organic electroluminescence device, are due to that organic light emission shows The reason for showing luminance-reduction caused by the use of device.
The basic conception of the present invention is the brightness of organic luminescent device and flows through each pixel electricity of OLED The magnitude of current on road is relevant, and the change of the voltage caused by the internal resistance change of organic electroluminescence device is once all mended Repay so that the magnitude of current for flowing through each image element circuit of OLED is controlled as being applied to keep suitable brightness Value, so as to compensate the luminance-reduction caused by the long-term use of OLED.
In addition, in OLED, according to the difference of each glow frequency of multiple image element circuits, You Jifa Material of photosphere etc., the reduction amount of the brightness of each image element circuit may be different.Therefore, it is necessary to be directed to multiple image element circuits It is each individually perform by controlling electricity come compensation brightness deviation.
In addition, in order to control the magnitude of current for each image element circuit for flowing through OLED, in display due to aobvious Show the use of device before causing performance to reduce, for example, before OLED is used as display, measurement is flowed through each The current value of image element circuit, and the current value measured is configured to reference current value.Then, in display due to aobvious using this Show the device scheduled time and measurement after performance reduces occurs and flows through the current value of each image element circuit, and be based on reference current value Measured value after compensation performance reduction.
It is described below the operation of the present invention.Fig. 4 is according to an embodiment of the invention 1 luminance deviation compensation method The flow chart of order.
First, after selecting switch 115 is switched to the side (step S11) of current sink 160, by predetermined test voltage Vdata is applied on data wire Ldj (step S12), and activates the gate line Lgi (step S13) of selection.
Here, step S12 and S13 order can be overturned mutually.That is, activate selection gate line Lgi it Afterwards, predetermined test voltage Vdata can be applied on data wire Ldj.In fact, two steps can be held when synchronized with each other OK.
Thus, image element circuit P (i, j) switching transistor 111 is opened, so as to the test electricity being applied on gate line Lgi Pressure Vdata is output on the gate electrode of driving transistor 112 and a terminal of capacitor 113.
Next, when applying anode voltage from first voltage source VDD (step S14), electric current passes through driving transistor 112 Current sink 160 is flowed to from first voltage source VDD with organic electroluminescence device 114, and is surveyed by current measurement circuit 140 The electric current is measured, that is, flows through image element circuit P (i, j) electric current, and the current value measured is stored in (step in memory 144 S15)。
For example, when display unit 100 has multiple image element circuits of n rows × m row, held respectively for multiple image element circuits Row flows through the measurement of the electric current of image element circuit.Therefore, in step s 16, it is determined whether remaining image element circuit to be measured.
In step s 16, if it is determined that image element circuit (the step S16 of the remaining current value to be measured for flowing through image element circuit In be), then flow returns to step S12, and therefore repeat step S12 is to S16, and in step s 16, if it is determined that The image element circuit (no in step S16) of the no longer remaining current value to be measured for flowing through image element circuit, then flow proceeds to step Rapid S17.
As the method for each current value for measuring the multiple image element circuits for flowing through n rows × m row, there may be logical The method of the electric current of multiple image element circuits of space sequence of unit measurement n rows × m row, and pass through column unit proceeding measurement n rows The method of the electric current of multiple image element circuits of × m row.
When measuring current value by row sequence of unit, in fig. 2, for example, first when gate line activates, by picture Each upper order of plain circuit P (1,1), P (1,2) ... and P (1, m) data wire Ld1, data wire Ld2... and data wire Ldm Ground applies test voltage Vdata to be sequentially measured the current value for each image element circuit for flowing through the first row, can then proceed in The electric current for each image element circuit for flowing through the second row, the third line ... and line n is sequentially measured with above description identical method Value.
Alternatively, when by column unit proceeding measurement current value, in fig. 2, for example, first, when in number According on line Ld1 apply test voltage Vdata to activate gate line Lg1, Lg2... and Lgn when, order image element circuit P (1, 1), grid is sequentially applied on P (2,1) ... and P (n, 1) gate line Lg1, gate line Lg2... and each of gate line Lgn Signal, so as to measure the electric current of each image element circuit of first row.It is then possible to pass through method order same as described above Secondary series, the current value for each image element circuit that the 3rd row ... n-th arrange are flowed through in ground measurement.
In addition, in the foregoing description, describe start from the image element circuit P (1,1) of the first row first row and n rows × The proceeding measurement for the current value that the image element circuit P (n, m) of m row terminates, but not limited to this, and the proceeding measurement of current value can With since any one of multiple image element circuits of n rows × m row.N rows × m row are flowed through importantly, all to measure and store Multiple image element circuits each current value.
Meanwhile as described above, before using OLED, that is to say, that in OLED performance Before reduction, the current value that each image element circuit is flowed through in measurement in advance is used to compensate because long-term use of organic luminescent device causes Luminance deviation, the value measured in advance is stored as target current value, then, pre- timing is used in OLED Between after, that is to say, that after the reduction of OLED performance, it is necessary to according to the survey of the same procedure of the measuring method Measure and store these current values.
In this case, in the measurement before and after the reduction of OLED performance, should use each other Identical test voltage Vdata.
Next, the measured value before the reduction of OLED performance, i.e. target current value, show with organic light emission Show that the measured value after the reduction of device performance is compared to each other to compare the electric current before and after OLED performance reduces The change of value, so as to the change (step S17) of calculating current value.
Calculating can be performed by any method known in the art, the change of the current value of calculating is converted into being used to pass through Method as known in the art maintains each drive being maintained at required by required brightness of multiple image element circuits of display unit 100 Offset voltage (offset voltage) value of the gate electrode of dynamic transistor 112, the value then changed can be searched for example The form of table is stored in memory 144.However, not limited to this, by offset voltage computational algorithm be stored in memory 144 with Look-up table is substituted, and as needed, the algorithm can be based on and calculate offset voltage.
In addition, the offset voltage calculated is provided as threshold value electricity of the disposable all compensation due to driving transistor 112 Luminance deviation caused by the change of pressure and due in each image element circuit P (i, j) the performance of organic electroluminescence device 114 drop The data of the change of current value caused by low.
Specifically, for example, offset voltage is supplied into controller 120.Controller 120 is based on being directed to multiple image element circuits Each calculating the picture signal Data that is inputted by input terminal of offset compensation, and by the view data of compensation Data is supplied to each image element circuit.Even if thereby, it is possible to long-term due to OLED in OLED Using and performance reduce when no luminance-reduction and brightness irregularities display are provided.
2. embodiment 2
It is described below embodiments of the invention 2.Fig. 5 is to schematically illustrate according to an embodiment of the invention 2 to have The circuit diagram of the configuration of machine active display.
As shown in figure 5, display unit 200, selecting switch 215, electric current are included according to the OLED of embodiment 2 Absorber 260, current measurement circuit 240, changing value compensating unit 220 and data driver 250.Although not shown in Fig. 5, have Machine active display includes known part, for example, apply the gate drivers of selection signal on each gate line Lgi, from Anode driver on first voltage source VDD supply driving voltages to each anode line Lai, controls each unit of display Controller etc..
Display unit 200 includes multiple gate line Lg1 to Lgn (n be integer) more than or equal to 2, parallel to each other respectively set The multiple data wire Ld1 to Ldm (m is the integer more than or equal to 2) put and multiple anode line La1 to Lan.It is parallel to each other respectively Multiple gate line Lg1 to Lgn and multiple anode line La1 to Lan are set.In addition, multiple data wire Ld1 to Ldm and multiple grids Line Lg1 to Lgn and multiple anode line La1 to Lan intersects.
Each image element circuit Px (i, j) (i=1 to n, j=1 to m, wherein m and n are natural number respectively) is arranged on multiple grid Polar curve Lg1 to Lgn and multiple data wire Ld1 to Ldm each each crosspoint intersected with each other, and multiple image element circuit P (i, j) is arranged to the matrix shapes (m be natural number respectively with n) of n rows × m row to form display unit 200.
In addition, each of multiple image element circuit P (i, j) has read line Lri, and it is described in detail below including reading The configuration of line Lri each image element circuit P (i, j).
Multiple image element circuit P (i, j) of display unit 200 are connected to gate drivers by gate line Lg1 to Lgn respectively 230, data driver 250 is connected to by data wire Ld1 to Ldm, anode driver is connected to by anode line La1 to Lan 270。
Data driver 250 be used for by multiple data wire Ldj supply view data Data to multiple image element circuit P (i, J) each.In addition, in the present invention, it is brilliant measuring driving for each image element circuit P (i, j) for compensation brightness deviation During the threshold voltage variation value of body pipe 212 and the driving voltage changing value of organic electroluminescence device 214, data driver is used In supply test voltage Vdata to driving transistor 212 and each of transistor 216 is read, will be described in more detail below.
Selecting switch 215 is selectively connected the cathode side of image element circuit P (i, j) organic electroluminescence device 214 It is brilliant when measuring driving for each image element circuit P (i, j) to current sink 260 or the second voltage source Vss explained below The threshold voltage variation value of body pipe 212 and the driving voltage changing value of organic electroluminescence device 214 are described below to compensate During luminance deviation, the negative electrode of each organic electroluminescence device 214 is set to be connected to the side of current sink 260, and work as and be used as allusion quotation During the display operation of type, the negative electrode of each organic electroluminescence device 214 is set to be connected to the second voltage source Vss.It can control These operations are performed under the control of device (not shown) processed.
One terminal of current sink 260 is connected with selecting switch 215, and another terminal passes through current measurement electricity Road 240 is connected with changing value compensating unit 220.Pixel is connected to by selecting switch 215 when predetermined data value is applied to When on the data wire Ldj of the negative electrode of circuit P (i, j) organic electroluminescence device 214, have predetermined value electric current flowing to show Show each image element circuit P (i, j) of unit 200.
In addition to gate drivers, it is known that part be not directed to idea of the invention, and therefore by needs In the range of necessary part is only described to understand the present invention, other parts are not described.
In addition, current measurement circuit 240 includes current measuring unit 242, analog-digital converter 243, changing value computing unit 241 and memory 244, it is described in detail below.
Next, it will be described in the configuration of image element circuit P (i, j) and luminance deviation compensation equipment.Fig. 6 be a diagram that root According to embodiments of the invention 2 image element circuit and luminance deviation compensation device main configuration circuit diagram.
As shown in fig. 6, organic electroluminescence device 214, driving are included according to each image element circuit P (i, j) of embodiment 2 Transistor 212, switching transistor 211, transistor 216 and capacitor 213 are read, wherein transistor 211,212 and 216 is each With first electrode, second electrode and gate electrode.
The gate electrode of switching transistor 211 is connected by gate line Lgi with gate drivers (not shown), and first Electrode is connected to data wire Ldj, and second electrode is connected on the gate terminal of driving transistor 212.Therefore, by from grid The scanning signal (row selection signal) of driver supply opens switching transistor 211, so as to will enter into each data wire Ldj Picture signal data (or test voltage Vdata) be output to driving transistor 212 gate electrode and one of capacitor 213 Terminal.
The first electrode of driving transistor 212 in each image element circuit P (i, j) and first voltage source VDD and electric capacity Another terminal connection of device 213.Here, first voltage source VDD can be by aobvious with anode driver (not shown) Show the voltage source of the anode driver supply in device, and for supplying anode voltage to multiple image element circuit P (i, j) simultaneously Anode line La1 to Lan so-called public anode in the case of, can be the voltage source for public anode.
In addition, the second electrode of driving transistor 212 is connected with the anode of organic electroluminescence device 214, and have The negative electrode of organic electroluminescence devices 214 by selecting switch 215 optionally with the second voltage source Vss or current sink 260 Any one connection.In addition, the gate electrode of driving transistor 212 is connected with switching transistor 211, and data will be passed through The picture signal Data (or test voltage Vdata) of line Ldj supplies is selectively supplied to driving transistor 212.
The gate electrode for reading transistor 216 is connected to reading driver (not shown), first electrode by read line Lri The first electrode of data wire Ldj and switching transistor 211 is connected to, second electrode is connected to the second electricity of driving transistor 212 Pole and the anode terminal of organic electroluminescence device 214.By being opened from the selection signal for reading the supply of driver (not shown) Transistor is read, so as to will enter into the sun that data wire Ldj test voltage Vdata is fed to organic electroluminescence device 214 Extreme son.
Here, the gate drivers of known OLED, which can also perform optionally driving, reads transistor The function of 216 reading driver, and can be set further independent of gate drivers and read driver.Work as raster data model When device also performs the function of reading driver, it is sufficient to by optionally selecting switch transistor 211 and read appointing for transistor 216 The switching function of one is added on known gate drivers.
As shown in figure 5, in the display according to embodiment 2, using so-called common cathode, wherein n rows × m is arranged more On the negative electrode of individual image element circuit P (i, j) is connected to each other, and common cathode passes through a selecting switch 215 and one second electricity Potential source Vss connections.
Current measurement circuit 240 includes：Current measuring unit 242, absorbed for measuring via selecting switch 215 and electric current Device 260 flows through the electric current of each image element circuit P (i, j)；Analog-digital converter 243, for the mould for measuring current measuring unit 242 Intend signal and be converted into data signal；Changing value computing unit 241, for below will by more each image element circuit P (i, j) Characteristic value before and after the display performance of description reduces calculates changing value；And for storing depositing for these characteristic values Reservoir 244.
By this configuration, current measurement circuit 240 is optionally connected by current sink 260 and selecting switch 215 It is connected to the common cathode of multiple image element circuit P (i, j) of display unit 200, and the sequentially excessively multiple image element circuit P of reading flow Each electric current of (i, j), so as to calculate the threshold voltage variation value of driving transistor 212 explained below and organic electroluminescence The driving voltage changing value of luminescent device 214.
The driving crystal that changing value compensating unit 220 calculates changing value computing unit 241 based on methods as described below The threshold voltage variation value of pipe 212 and the driving voltage changing value of organic electroluminescence device 214, which increase to, passes through input terminal The picture signal Data of input, and the every of display unit 200 is supplied to by digital analog converter 245 and data wire Ldj Individual image element circuit P (i, j).
Digital analog converter 245 by be fed to from changing value compensating unit 220 display unit 200 each image element circuit P (i, J) numerical data is converted into analogue data.
Although not illustrated in detail in Fig. 5 and Fig. 6, the control of all operationss of organic electroluminescence device known to control Device processed can also perform the function of changing value compensating unit 220, and changing value compensating unit can also match somebody with somebody independently of controller Put.
Next, before the operation of description embodiment 2, the concept according to the compensation of the luminance deviation of embodiment 2 will be described.
As also described above, it is understood that there may be the driving transistor performance that is included due to each image element circuit reduce caused by The rise of threshold voltage and the driving voltage change caused by the internal resistance change of organic electroluminescence device, are due to organic Caused by the use of active display the reason for luminance-reduction.
The basic conception of the present invention is the brightness of organic luminescent device and flows through each pixel electricity of OLED The magnitude of current on road is relevant, and the change of the voltage caused by the internal resistance change of organic electroluminescence device is once all mended Repay so that the magnitude of current for flowing through each image element circuit of OLED is controlled as being applied to keep suitable brightness Value, so as to compensate the luminance-reduction caused by the long-term use of OLED.
In addition, in OLED, according to various variables, for example, each luminous frequency of multiple image element circuits The difference of rate, material of organic luminous layer etc., the reduction amount of the brightness of each image element circuit may be different.Therefore, it is necessary to Each for multiple image element circuits individually performs compensation brightness deviation.
In addition, in order to control the magnitude of current for each image element circuit for flowing through OLED, in display due to aobvious Show the use of device before causing performance to reduce, for example, before OLED is used as display, measurement is when each The grid-source voltage and organic electroluminescence device of driving transistor on image element circuit during the test voltage of application predetermined value Driving voltage, due to being reduced using the display scheduled time and performance before display performance reduction and in display Afterwards, the grid-source voltage and Organic Electricity of the driving transistor in each image element circuit are measured respectively under the same conditions The driving voltage of electroluminescence device, and the threshold voltage variation value and Organic Electricity of the result compensation for drive transistor based on measurement The driving voltage changing value of electroluminescence device.
It is described below the operation of the present invention.Fig. 7 is according to an embodiment of the invention 2 luminance deviation compensation method The flow chart of order.
As shown in fig. 7, first, measure multiple pixels of the display unit 200 before the reduction of OLED performance Circuit it is each in driving transistor 212 grid-source voltage VGS21With the driving voltage of organic electroluminescence device 214 VOLED1, and the result measured is stored in each corresponding memory 244 with multiple image element circuits (step S21).
Here, the measurement before the reduction of OLED performance can be used as display in OLED Performed under original state before, can OLED operation by using the pre- timing of the OLED Between and stable opportunity performs, and can be performed on other opportunitys.
Hereinafter, it will be described in the driving of each image element circuit in measuring process S21 before display performance reduction The method of the grid-source voltage of transistor and the driving voltage of organic electroluminescence device.Fig. 8 be a diagram that for measuring The gate-to-source of the driving transistor of each image element circuit before 2 display performance reduces according to an embodiment of the invention The flow chart of the order of the method for the driving voltage of voltage and organic electroluminescence device.
First, selecting switch 215 is switched to the side (step S31) of current sink 260 to open from measurement result selection Image element circuit P (i, j) switching transistor 211 and driving transistor 212, and close and read transistor 216 (step S32).
Next, apply the test voltage Vdata (step S33) of predetermined value on the image element circuit P (i, j) of selection.Will It is assumed hereinafter that lower description embodiment 2：Using 5V as test voltage Vdata.
Here, gate drivers apply row selection signal to open on the image element circuit P (i, j) of selection gate terminal Switching transistor 211.Because switching transistor 211 is opened, so driving transistor 212 is also opened, to be existed by data wire Ldj Apply the test voltage Vdata of predetermined value on the gate electrode of driving transistor 212 and a terminal of capacitor 213 (in reality Apply in example 2 is 5V).
Next, when applying anode voltage from first voltage source VDD, there is be worth with test voltage Vdata corresponding Electric current IOLED1Flowed to by driving transistor 212, organic electroluminescence device 214 and selecting switch 215 from first voltage source VDD Current sink 260.Hereafter, current measuring unit 242 measures this electric current, that is, flows through the image element circuit P (i, j) of selection electric current IOLED1, and the current value of measurement is converted into by digital value by analog-digital converter 243, (step is then store in memory 244 Rapid S34).
In example 2, when applying 5V on a terminal in the gate electrode of driving transistor 212 and capacitor 213 During test voltage Vdata of the voltage as predetermined value, it is assumed that flow through image element circuit P (i, j) organic electroluminescence device 214 Electric current IOLED1, i.e. the electric current I of the measurement of current measuring unit 242OLED1For 1 μ A.In the following description, the μ A of current value 1 are referred to as " reference current ".
Here, flow through the electric current I of the image element circuit P (i, j) of selection organic electroluminescence device 214OLED1For containing for 1 μ A Meaning is, for convenience of describing, specific one image element circuit P in multiple image element circuits of n rows × m row of display unit 200 (i, J) current value is described as an example, and from other image element circuits outside the specific image element circuit P (i, j) The current value of measurement can be equal to or different from that the current value of the specific image element circuit P (i, j), and this can be equally apply in The grid voltage V of driving transistor 212G, source voltage VSWith grid-source voltage VGSAnd organic electroluminescence device 214 Driving voltage VOLEDOn, it is described below.
Here, it is applied to the survey of the gate electrode of driving transistor 212 and the predetermined value on a terminal of capacitor 213 Try the anode voltage that voltage Vdata (being in example 2 5V) is different from applying from first voltage source VDD.
Next, closing switch transistor 211 and driving transistor 212, and open and read (the step of transistor 216 S35) with the application test voltage Vdata (step S36) on organic electroluminescence device 214.
In this case, the test voltage Vdata being applied on organic electroluminescence device 214 be make have with step The image element circuit P (i, j) for flowing through selection measured in rapid S34 electric current IOLED1The electric current of identical value (is in example 21 μ A image element circuit P (i, j) voltage corresponding to) flowing to, and the magnitude of voltage is measured in step S36.In the embodiment 2 it is assumed that The voltage measured in step S36 is 2V.
Next, flow proceeds to step S37 to calculate the image element circuit P (i, j) of selection driving crystal based on result The grid-source voltage V of pipe 212GS21The driving voltage of corresponding organic electroluminescence device 214 with image element circuit P's (i, j) VOLED1.In example 2, due to the operation electric current I in image element circuit P (i, j)OLED1For 1 μ A when driving transistor 212 grid Pole tension VGIt is 5V and source voltage VSFor 2V, grid-source voltage VGS21Become 3V and organic electroluminescence device 214 Driving voltage VOLED1Become 2V.These values be stored in corresponding image element circuit corresponding in memory 244.
For example, when display unit 200 has multiple image element circuits of n rows × m row, multiple image element circuits should be directed to Each measurement for all performing the electric current for flowing through image element circuit.Therefore, in step S38, it is determined whether remaining picture to be measured Plain circuit.
In step S38, if it is determined that image element circuit (the step S38 of the remaining current value to be measured for flowing through image element circuit In be), then flow returns to step S32, and therefore for next image element circuit repeat step S32 to S38, and In step S38, if it is determined that the image element circuit of the no longer remaining current value to be measured for flowing through image element circuit is (in step S38 It is no), then flow terminates.
As the grid-source voltage for measuring the driving transistor 212 in each image element circuit of n rows × m row VGS21With the driving voltage V of organic electroluminescence device 214OLED1Method, there may be by row sequence of unit measure n rows × The method of multiple image element circuits of m row, and the method for multiple image element circuits by column unit proceeding measurement n rows × m row.
For example, in Figure 5, can be according to image element circuit P (1,1), pixel when measuring current value by row sequence of unit The image element circuit of circuit (1,2) ... and image element circuit P (1, m) proceeding measurement the first row, then can be sequentially measured second The image element circuit of row, the third line ... and line n.
Alternatively,, can be according to pixel when by column unit proceeding measurement current value for example, in Figure 5 Circuit P (1,1), image element circuit (2,1) ... and image element circuit P (n, 1) proceeding measurement first row image element circuit, then can be with It is sequentially measured the image element circuit of secondary series, the 3rd row ... and the n-th row.
In addition, in the foregoing description, describe start from the image element circuit P (1,1) of the first row first row and n rows × The proceeding measurement for the current value that the image element circuit P (n, m) of m row terminates, but not limited to this, and the proceeding measurement of current value can With since any one of multiple image element circuits of n rows × m row.Important thing is all to measure n rows × m row multiple Image element circuit it is each in driving transistor 212 grid-source voltage VGS21With the driving of organic electroluminescence device 214 Voltage VOLED1, and store the voltage of measurement corresponding with each image element circuit.
Referring again to Fig. 7, multiple image element circuits of the display unit 200 after the reduction of OLED performance are measured It is each in driving transistor 212 grid-source voltage VGS22With the driving voltage of organic electroluminescence device 214 VOLED2, and the result measured is stored in each corresponding memory 244 with multiple image element circuits (step S22).
Here, the measurement after the reduction of OLED performance makes a reservation in OLED as display Performed after time, and the arrangement of time measured can consider the characteristic when OLED because organic light emission shows Show the long-term use of device and suitably determined in the case of performance reduction.In addition, during the life-span of OLED, Measurement frequency can be only once, or twice, or more time.In other words, during the life-span of OLED, compensation Luminance deviation can perform only once caused by OLED performance reduces, or two or more times.Can root According to the arrangement of time for needing suitably to determine the measurement after performance reduces and frequency.
Hereinafter, each pixel electricity of the measurement in step S22 after display performance reduction is described in detail in reference picture 9 The method of the grid-source voltage of the driving transistor on road and the driving voltage of organic electroluminescence device.Fig. 9 be a diagram that survey The grid of the driving transistor of each image element circuit of the amount after according to an embodiment of the invention 2 display performance reduces- The flow chart of the order of the method for the driving voltage of source voltage and organic electroluminescence device.
First, selecting switch 215 is switched to the side (step S41) of current sink 260, is then turned on the image element circuit of selection P (i, j) switching transistor 211 and driving transistor 212, and close and read transistor 216 (step S42).Here, property In measurement before reducing, step S41 and S42 are performed according to step S31 and S32 identical method.
Next, in driving transistor 212 apply test voltage Vdata, test voltage Vdata make have with step The reference current (being in example 21 μ A) that performance in S43 measures when being measured before reducing in step S34 is identical Value electric current IOLED2The image element circuit P (i, j) of selection is flowed to, and measures the voltage.Will be it is assumed hereinafter that lower description be implemented Example 2：The specific pixel circuit P (i, j) of selection test voltage Vdata is 5.2V.
Next, switching transistor 211 and driving transistor 212 in closing the image element circuit P (i, j) of selection, and Open read transistor 216 (step S44), then in step S45, measurement make have with before performance reduces in step The electric current I of reference current (being in example 21 μ A) the identical value measured in S34OLEDFlow to image element circuit P (i, j) survey Voltage Vdata is tried, and measures the value.In the embodiment 2 it is assumed that the test voltage Vdata of measurement is 2V.
Next, flow proceeds to step S46 to calculate the image element circuit P (i, j) of selection driving based on the above results The grid-source voltage V of transistor 212GS22With the driving of the organic electroluminescence device 214 of corresponding image element circuit P (i, j) Voltage VOLED2.In example 2, due to the grid voltage V of driving transistor 212GIn image element circuit P (i, j) operation electric current IOLED2To be 5.2V and source voltage V during 1 μ ASFor 2V, grid-source voltage VGS22Become 3.2V and organic electroluminescent The driving voltage V of device 214OLED2Become 2V.These values be stored in corresponding image element circuit corresponding in memory 244.
For example, when display unit 200 has multiple image element circuits of n rows × m row, held respectively for multiple image element circuits Row flows through the measurement of the electric current of image element circuit.Therefore, in step S47, it is determined whether remaining image element circuit to be measured.
In step S47, if it is determined that residue needs to measure the image element circuit (step for the current value for flowing through image element circuit In S47 is), then flow returns to step S42, and is therefore directed to next image element circuit repeat step S42 to S47, And in step S47, if it is determined that no longer remaining image element circuit (the step S47 for needing to measure the current value for flowing through image element circuit In it is no), then flow terminates.
It is multiple according to the proceeding measurement after performance reduction is performed in identical method before performance reduces with as described above Image element circuit it is each in driving transistor 212 grid-source voltage VGS22With the driving of organic electroluminescence device 214 Voltage VOLED2Method.
Referring again to Fig. 7, calculate multiple image element circuits for measuring in the step s 21 it is each in driving transistor 212 Grid-source voltage VGS21With the driving voltage V of organic electroluminescence device 214OLED1It is multiple with being measured in step S22 Image element circuit it is each in driving transistor 212 grid-source voltage VGS22With the driving of organic electroluminescence device 214 Voltage VOLED2Between difference come calculate the threshold voltage variation value Δ th of each image element circuit P (i, j) and driving voltage change It is worth Δ VOLED, the threshold voltage variation value Δ th and driving voltage changing value Δ V of calculatingOLEDSumming value (Δ th+ Δs VOLED) deposit Storage is used as offset voltage (step S23) in memory 244.
In example 2, the driving transistor measured due to being directed to specific image element circuit P (i, j) in the step s 21 212 grid-source voltage VGS21For 3V, the driving voltage V of organic electroluminescence device 214OLED1For 2V, and in step The grid-source voltage V of the driving transistor 212 measured in S22GS22For 3.2V, the driving electricity of organic electroluminescence device 214 Press VOLED2Become+2V (3.2V -3.0V=+2V), driving electricity for 2V, the threshold voltage variation value Δ th of the specific image element circuit Press changing value Δ VOLEDBecome 0V (2V -2V=0V), and be used as threshold voltage variation value Δ th and driving voltage changing value Δ VOLEDSumming value (Δ th+ Δs VOLED) image element circuit P (i, j) offset voltage become+2V.
In addition, for other image element circuits outside specific image element circuit P (i, j), threshold is calculated by the same way Threshold voltage changing value Δ th and driving voltage changing value Δ VOLED, and the threshold voltage variation value Δ th of each image element circuit and Driving voltage changing value Δ VOLEDSumming value (Δ th+ Δs VOLED) it is arranged to the offset voltage of the image element circuit, and be stored in In memory 244 corresponding with each image element circuit.
Next, in step s 24, selecting switch 215 is switched to the second voltage source Vss sides in step S23, and will The offset voltage obtained in step S23 is provided to changing value compensating unit 220, and changing value compensating unit from memory 244 220 are increased to picture signal Data (that is, the Data+ Δs Vth+ Δs of each image element circuit inputted by input terminal VOLED), and each corresponding image element circuit is provided it to drive OLED, so as to compensation brightness deviation. Therefore, though OLED due to OLED long-term use and performance reduce when, the organic light emission Display may be used as no luminance-reduction and the display of brightness irregularities.
[description of reference numerals]
P (i, j) image element circuit
111,211 switching transistors
112,212 driving transistors
113,213 capacitors
114,214 organic electroluminescence devices
115,215 selecting switch
120 controllers
130 gate drivers
VDD first voltage sources
Vss the second voltage sources
140,240 current measurement circuits
142 analog-digital converters
144,244 memories
145,245 digital analog converters
150 data drivers
160,260 current sinks
216 read transistor
220 changing value compensating units
242 current measuring units

Claims (15)

1. a kind of luminance deviation compensation equipment of OLED, including：
Driving transistor, there is first electrode, second electrode and gate electrode；
First voltage source, it is connected with the first electrode of the driving transistor；
Organic electroluminescence device, there is the anode electrode being connected with the second electrode of the driving transistor；
The second voltage source；
Selecting switch, it is configured to make the cathode electrode of the organic electroluminescence device to be used to selectively connect to second electricity Potential source or current sink；And
Current measurement circuit, it is configured to measure from institute when applying test voltage on the gate electrode in the driving transistor State the electric current that first voltage source flows to the current sink.
2. luminance deviation according to claim 1 compensates equipment, wherein, the OLED includes n rows × m row Multiple image element circuits, and the multiple image element circuit it is each in organic electroluminescence device cathode electrode pass through it is mutual Common cathode electrode even is selectively connected to the selecting switch.
3. luminance deviation according to claim 1 compensates equipment, wherein, the current measurement circuit includes analog-to-digital conversion Device.
4. luminance deviation according to claim 3 compensates equipment, wherein, the current measurement circuit also includes LPF Device.
5. a kind of luminance deviation by according to any one of Claims 1-4 compensates equipment and carries out luminance deviation benefit The method repaid, including：
The selecting switch is set to be switched to the current sink side；
The electric current that the current sink is flowed to from the first voltage source is measured by the current measurement circuit；And
Luminance deviation based on OLED described in measured current compensation.
6. luminance deviation compensation method according to claim 5, wherein, the step of measuring the circuit, includes：
First step, performed before the OLED is used as display；And
Second step, it is used as performing after the display scheduled time in the OLED, and
In the step of compensation brightness deviation, the current value measured in the first step is configured to reference current value to incite somebody to action The current value measured in the second step is compared with the reference current value, so as to compensation brightness deviation.
7. luminance deviation compensation method according to claim 6, further comprises：
Comparative result based on the current value measured in the first step and the second step calculates the driving crystal The offset voltage of pipe, wherein the offset voltage of the driving transistor is stored with form of look.
8. luminance deviation compensation method according to claim 7, wherein, by being input to based on the offset compensation Picture signal in the OLED performs the compensation of the luminance deviation.
9. a kind of luminance deviation compensation equipment of OLED, the OLED include the multiple of n rows × m row Image element circuit, first voltage source and the second voltage source, wherein, each of the multiple image element circuit includes：Driving transistor；Have Organic electroluminescence devices, there is a terminal being connected with the first voltage source, with when the driving transistor is opened Apply the voltage from the first voltage source on one terminal；And transistor is read, when the driving transistor is closed The reading transistor is selectively turned on to apply electricity on one terminal of the organic electroluminescence device when closing Pressure, the luminance deviation compensation equipment include：
Current sink；
Selecting switch, it is configured to another terminal of the organic electroluminescence device being used to selectively connect to described second Voltage source or the current sink；And
Current measurement circuit, it is configured to measure from the first voltage when applying test voltage in the driving transistor Source stream to the organic electroluminescence device electric current, and when the reading transistor is opened measurement from the reading crystal Pipe flows to the electric current of the organic electroluminescence device.
10. luminance deviation according to claim 9 compensates equipment, wherein, the current measurement circuit includes：
Current measuring unit, it is configured to measure the electric current for flowing through the organic electroluminescence device；And
Change value calculation apparatus, be configured to calculate the driving crystal based on the current value measured by the current measuring unit The driving voltage of the grid-source voltage of pipe and the organic electroluminescence device.
11. luminance deviation according to claim 10 compensates equipment, wherein, the OLED characteristic by In the OLED use and performance reduce before and the OLED characteristic due to described The use of OLED and performance perform the survey of the grid-source voltage and the driving voltage respectively after reducing Amount, and the change value calculation apparatus is based further on the grid-source voltage after the performance reduces and institute State driving voltage and the grid-source voltage before performance reduction and the driving voltage calculate respectively it is described The threshold voltage variation value of driving transistor and the driving voltage changing value of the organic electroluminescence device.
12. luminance deviation according to claim 11 compensates equipment, in addition to：Compensation device,
Wherein, the change value calculation apparatus is configured to the threshold voltage variation value and the driving voltage changing value The compensation device is supplied to as offset voltage, and the offset voltage is increased to picture signal by the compensation device To drive the OLED.
13. a kind of method that equipment progress luminance deviation compensation is compensated by luminance deviation according to claim 9, bag Include：
Third step, the OLED characteristic due to the OLED use and performance reduce Measure before the multiple image element circuit it is each in the driving transistor grid-source voltage and the organic electroluminescence The driving voltage of luminescent device；
Four steps, the OLED characteristic due to the OLED use and performance reduce Measure afterwards the multiple image element circuit it is each in the driving transistor grid-source voltage and the organic electroluminescence The driving voltage of luminescent device；And
5th step, the institute in each based on the multiple image element circuit measured respectively in third step and four steps The driving voltage of the grid-source voltage and the organic electroluminescence device of stating driving transistor calculates the multiple pixel electricity Road it is each in the driving transistor threshold voltage variation value and the organic electroluminescence device driving voltage become Change value.
14. luminance deviation compensation method according to claim 13, in addition to：
6th step, the threshold voltage variation value and the driving voltage changing value calculated in the 5th step is asked With, to calculate each offset voltage of the multiple image element circuit, and the offset voltage increased to be applied to it is described Picture signal on image element circuit drives the OLED.
15. the luminance deviation compensation method according to claim 13 or 14, wherein, the third step includes：
The selecting switch is set to be switched to the current sink side；
It is predetermined to apply in the driving transistor by opening the driving transistor and closing the reading transistor The test voltage of size flows through the first electric current of the organic electroluminescence device to measure；
Worked as and the first size of current phase to measure by closing the driving transistor and opening the reading transistor The second same electric current is applied to the voltage on the reading transistor when flowing to the organic electroluminescence device；And
The gate-to-source value of the driving transistor and the Organic Electricity are calculated based on the test voltage and the voltage applied The driving voltage of electroluminescence device.
CN201480042124.4A 2013-07-23 2014-07-22 The luminance deviation compensation equipment of display and compensation method Expired - Fee Related CN105453164B (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
KR1020130086744A KR20150011595A (en) 2013-07-23 2013-07-23 Apparatuse and method for compensation luminance difference of display device
KR10-2013-0086744 2013-07-23
KR1020130149266A KR20150064481A (en) 2013-12-03 2013-12-03 Apparatuse and method for compensation luminance difference of display device
KR10-2013-0149266 2013-12-03
PCT/KR2014/006648 WO2015012566A1 (en) 2013-07-23 2014-07-22 Brightness deviation compensation apparatus and compensation method of display device

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