CN105453164A - Brightness deviation compensation apparatus and compensation method of display device - Google Patents

Brightness deviation compensation apparatus and compensation method of display device Download PDF

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Publication number
CN105453164A
CN105453164A CN201480042124.4A CN201480042124A CN105453164A CN 105453164 A CN105453164 A CN 105453164A CN 201480042124 A CN201480042124 A CN 201480042124A CN 105453164 A CN105453164 A CN 105453164A
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China
Prior art keywords
voltage
electroluminescence device
image element
organic electroluminescence
driving transistors
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CN201480042124.4A
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Chinese (zh)
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CN105453164B (en
Inventor
李正哲
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Na Wobi Kolon Inc
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Na Wobi Kolon Inc
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Priority claimed from KR1020130086744A external-priority patent/KR20150011595A/en
Priority claimed from KR1020130149266A external-priority patent/KR20150064481A/en
Application filed by Na Wobi Kolon Inc filed Critical Na Wobi Kolon Inc
Publication of CN105453164A publication Critical patent/CN105453164A/en
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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G09G3/3258—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the voltage across the light-emitting element
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809—Several active elements per pixel in active matrix panels
    • G09G2300/0842—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809—Several active elements per pixel in active matrix panels
    • G09G2300/0842—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
    • G09G2300/0861—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor with additional control of the display period without amending the charge stored in a pixel memory, e.g. by means of additional select electrodes
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
    • G09G2300/0809—Several active elements per pixel in active matrix panels
    • G09G2300/0842—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
    • G09G2300/0861—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor with additional control of the display period without amending the charge stored in a pixel memory, e.g. by means of additional select electrodes
    • G09G2300/0866—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor with additional control of the display period without amending the charge stored in a pixel memory, e.g. by means of additional select electrodes by means of changes in the pixel supply voltage
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/02—Improving the quality of display appearance
    • G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
    • G09G2320/0295—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel by monitoring each display pixel
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/043—Preventing or counteracting the effects of ageing
    • G09G2320/045—Compensation of drifts in the characteristics of light emitting or modulating elements
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/06—Adjustment of display parameters
    • G09G2320/0693—Calibration of display systems

Abstract

The present invention relates to a compensation apparatus, which compensates for a brightness deviation due to use of an organic light emitting display device for a long time, comprising: a driving transistor (112) having a first electrode, a second electrode and a gate electrode; a first voltage source (VDD) connected to the first electrode of the driving transistor (112); an organic electroluminescence device (114) having an anode electrode connected to the second electrode of the driving transistor (112); a second voltage source (Vss); a selection switch (115) for selectively connecting a cathode electrode of the organic electroluminescence device (114) between the second voltage source (Vss) and a current sink (160); and a current measurement circuit (140) for measuring the current flowing from the first voltage source (VDD) to the current sink (160) when a test voltage (Vdata) is applied to the gate electrode of the driving transistor (112).

Description

The luminance deviation compensation equipment of display and compensation method
Technical field
The present invention relates to a kind of luminance deviation compensation equipment and compensation method of display, and more particularly, relate to and use organic electroluminescence device as the luminance deviation compensation equipment of the organic electroluminescence device of the display device of the pixel of display and compensation method.
Background technology
Recently, organic electroluminescence device (hereinafter referred to as " organic EL device ") is used to cause pay close attention to widely as the display of organic electroluminescence (hereinafter also referred to as " organic light emitting display ") of the pixel of display.Use organic electroluminescence device as the organic light emitting display light weight of luminescent device herein and thin, and than other displays, there is outstanding light characteristic and viewing angle characteristic, and be therefore expected to become flat-panel display device of future generation.
Organic electroluminescence device has so a kind of structure: the organic luminous layer including organic compounds be inserted into be formed in such as glass transparency carrier on the pair of electrodes be made up of anode and negative electrode between, and be so a kind of luminaire: wherein hole and electronics are injected into organic luminous layer from this to electrode, and these holes and electronics recombine to produce exciton wherein, thus the light produced during by being emitted in exciton and losing excited state performs display etc.
Organic luminous layer is the thin layer be made up of organic material, the color of the light wherein sent and conversion efficiency electric current being converted to light are determined by the composition of the organic material forming organic luminous layer, and different organic materials produces the light with mutually different color.
But when long-time use display, organic material performance reduces (degraded) and therefore luminescence efficiency reduces, thus shortens the life-span of display.In this case, such as, according to the color of the light sent, different organic materials may with different rate reduction performances, and the performance of color reduce also may be different.
In addition, the multiple pixel possibility that known display comprises can not with mutually the same rate reduction performance, and therefore, the difference of performance changing down causes uneven display.
First, the reason that this performance reduces may comprise, due to the resistance value increase of Long-Time Service display display self and the reduction of luminescence efficiency.If organic electroluminescence device is luminous for a long time, the resistance value of this device will increase gradually.In addition, each of the multiple organic electroluminescence device that display comprises has different glow frequencies, and therefore, the fluorescent lifetime of accumulation should be different.Therefore, if long-time driving display, so between organic electroluminescence device by producing the deviation of resistance value, therefore produce the deviation of luminosity, make may produce brightness irregularities or afterimage across the screen.
The Another reason that performance reduces is the thin film transistor (TFT) (TFT) owing to forming pixel, particularly driving transistors, along with the passage of service time, performance reduces the intensity reduction that the threshold voltage caused increases the light sent caused, wherein also different between multiple transistors of the increase of the threshold voltage of transistor in display.
Meanwhile, as solve the performance caused due to Long-Time Service display reduce caused by the technology of problem as above, patent document 1 discloses a kind of technology.
Fig. 1 be a diagram that the circuit diagram for the configuration of the driving circuit of display disclosed in patent document 1.
As shown in Figure 1, driving circuit for the routine of display has image element circuit 60, it comprises selects transistor 90, driving transistors 70 and organic electroluminescence device 50, and comprise the first voltage source 14, the first switch S 1 of being connected with making the first Electrode selectivity of the first voltage source 14 and driving transistors 70, its anode and organic electroluminescence device 50, second voltage source 15 on the second Electrode connection of driving transistors 70 and second switch S2 that organic electroluminescence device 50 is optionally connected with the second voltage source 15.
In addition, driving circuit for the routine of display comprise with the extraction transistor 80 of the second Electrode connection of driving transistors 70, current source 16, make current source 16 with draw transistor 80 the second Electrode selectivity be connected the 3rd switch S 3, current sink 17, make current sink 17 and the second Electrode selectivity ground the 4th switch S 4 that is connected and the tension measuring circuit 18 of drawing transistor 80, the second Electrode connection of this tension measuring circuit and extraction transistor 80 is with the measuring voltage when the gate electrode at driving transistors 70 applying test voltage.
Tension measuring circuit 18 comprises analog to digital converter 18a, processor 18b for the magnitude of voltage of measurement being converted to digital signal and stores the storer 18c of the magnitude of voltage measured, and by multiplexer 40 and the second Electrode connection of multiple extraction transistor 80 sequentially to read the voltage Vout of image element circuit 60.
Processor 18b is connected with the data line of image element circuit 60 by digital to analog converter 18e, for digital signal being converted to simulating signal to provide predetermined data value to data line.In addition, processor 18b receives the display data Data from input terminal input, to compensate change described below, thus the data of compensation is supplied to data line.
Next, the method for a kind of characteristic variations for compensating display disclosed in patent document 1 will briefly be described.
First, close the first switch S 1 and the 4th switch S 4, and open second switch S2 and the 3rd switch S 3, thus, use current measurement circuit 18 to measure the voltage of second electrode of drawing transistor 80, thus obtain the first signal V1 representing the characteristic of driving transistors 70.
Fig. 1 illustrates an only pixel of multiple pixels of display, but the first signal of each pixel of all multiple measurement comprised for display.
Such as, before image element circuit 60 is used for display, that is, before performance reduces driving transistors due to the use of display, measure side first signal V1, and be stored in storer 18c as first object signal.After this, image element circuit be used for display after a predetermined time and performance reduce after, same procedure measures the first signal again as described above, and is stored in storer 18c.
Next, open the first switch S 1 and the 4th switch S 4, and close second switch S2 and the 3rd switch S 3, thus use current measurement circuit 18 to measure the voltage of second electrode of drawing transistor 80, thus obtain the secondary signal V2 representing the characteristic of organic electroluminescence device 50.
For the secondary signal V2 of each pixel of all multiple measurement that display comprises.Be similar to the first signal, before use display, that is, before performance reduces organic electroluminescence device 50 due to the use of display and at organic electroluminescence device, be used as display after performance reduces by the schedule time, measure secondary signal V2 respectively to be stored in storer 18c.
Next, the change by using the change of the first signal and secondary signal to carry out the characteristic of compensation drive circuit.
In addition, patent document 2 discloses and a kind ofly comprises the voltage sensing circuit of transistor and a kind of display, the surperficial voltage of of each organic electroluminescence device of this voltage sensing circuit sensing organic light emitting display is to produce feedback signal, and this display calculates the compensating signal of each organic electroluminescence device and is applied to by compensating signal for driving in the data of each organic electroluminescence device to compensate the change of the output of each organic electroluminescence device.
But patent document 1 is individually measured representative due to the performance of the driving transistors in each image element circuit and is reduced the characteristic variations that the first signal V1 of the characteristic variations caused and the performance represented due to organic electroluminescence device reduce the secondary signal V2 of the characteristic variations caused.Therefore, Problems existing is, the step measuring the characteristic variations that the use due to display causes is complicated and loaded down with trivial details, and needs the change of plenty of time measurement characteristics.
In addition, in order to the change of measurement characteristics, four switches of each pixel and first to fourth switch, multiplexer 40 need to draw transistor, and need independent current source, make the Circnit Layout for measuring the characteristic variations caused due to the use of display may be very complicated, this problem caused is, the aperture of display is than reducing and the brightness of display reduction.Especially, more obvious in the transparent organic light emitting display that these problems are luminous in the both direction of display.
In addition, patent document 2 does not consider that the performance of driving transistors reduces, and one of this reason that to be the characteristic caused due to the use of display reduce, and so there is no to solve completely the problem that the performance that causes due to Long-Time Service display reduces.
In addition, need to provide separately the voltage sensing circuit comprising transistor, the surperficial voltage of this voltage sensing circuit sensing one of organic electroluminescence device is to produce feedback signal, and this causes the aperture of display than reducing and the problem of brightness reduction.
[association area file]
[patent document]
Patent document 1: international publication number WO2009/002406
Patent document 2: Japanese uncensored patent publication No. 2007-514966
Summary of the invention
Technical matters
Consider situation as above, the object of this invention is to provide a kind of luminance deviation compensation equipment and compensation method of display, described luminance deviation compensation equipment is measured by simple configuration and single step simultaneously and is reduced due to driving transistors performance the characteristic variations that causes and reduce the characteristic variations caused due to organic electroluminescence device performance, has the Circnit Layout that for measurement characteristics change simpler relative to prior art simultaneously.
Technical scheme
In order to realize object as above, according to one side, provide a kind of luminance deviation compensation equipment of organic light emitting display, comprising: driving transistors, it has the first electrode, the second electrode and gate electrode; First voltage source, with the first Electrode connection of described driving transistors; Organic electroluminescence device, has the anode electrode with the second Electrode connection of described driving transistors; Second voltage source; Selector switch, is configured to the cathode electrode of described organic electroluminescence device is optionally connected to described second voltage source or current sink (currentsink); And current measurement circuit, be configured to measure the electric current flowing to described current sink from described first voltage source when the gate electrode at described driving transistors applying test voltage.
According to another aspect, provide a kind of luminance deviation compensation equipment of organic light emitting display, described luminance deviation compensation equipment comprise n capable × multiple image element circuits of m row, the first voltage source and the second voltage source, wherein said each of multiple image element circuit comprises: driving transistors; Organic electroluminescence device, has the terminal be connected with described first voltage source, applies the voltage from described first voltage source when described driving transistors is opened on a described terminal; And reading transistor, when described driving transistors is closed, described reading transistor optionally opens to apply voltage on a terminal of described organic electroluminescence device, and described luminance deviation compensation equipment comprises: current sink; Selector switch, is configured to another terminal of described organic electroluminescence device to be optionally connected to described second voltage source or described current sink; And current measurement circuit, be configured to measure the electric current flowing to described organic electroluminescence device from described first voltage source when applying test voltage on described driving transistors, and measure the electric current flowing to described organic electroluminescence device from described reading transistor when described reading transistor is opened.
In order to realize object as above, according on the other hand, providing a kind of method of being carried out luminance deviation compensation by above-mentioned luminance deviation compensation equipment, comprising: making described selector switch be switched to described current sink side; The electric current flowing to described current sink from described first voltage source is measured by described current measurement circuit; And based on the luminance deviation of organic light emitting display described in measured current compensation.
According to another aspect, provide a kind of method of being carried out luminance deviation compensation by above-mentioned luminance deviation compensation equipment, comprise: third step, measure characteristic in described organic light emitting display due to the use of described organic light emitting display performance reduce before described multiple image element circuit each in the grid-source voltage of described driving transistors and the driving voltage of described organic electroluminescence device; 4th step, measure characteristic in described organic light emitting display due to the use of described organic light emitting display performance reduce after described multiple image element circuit each in the grid-source voltage of described driving transistors and the driving voltage of described organic electroluminescence device; And the 5th step, based on the described multiple image element circuit measured in third step and the 4th step respectively each in the grid-source voltage of described driving transistors and the driving voltage of described organic electroluminescence device calculate described multiple image element circuit each in the threshold voltage variation value of described driving transistors and the driving voltage changing value of described organic electroluminescence device.
Beneficial effect
According to the present invention, can determine to reduce due to driving transistors performance the characteristic variations that causes and reduce the characteristic variations caused due to organic electroluminescence device performance by single current measurement simultaneously, thus while the step of the characteristic variations caused due to the use of display at simplified measurement, shorten measurement characteristics and change the time spent.
In addition, according to the present invention, can be performed simply by the selector switch making the common cathode of each image element circuit optionally be connected to the second voltage source or current sink and convert measurement pattern to, and the Circnit Layout therefore for measuring the characteristic variations of display can be simplified, make the additional configuration that there is no need in fact measurement characteristics change, thus the structure of the configuration of the characteristic variations of simplified measurement display, and do not reduce aperture ratio in fact.
Accompanying drawing explanation
Fig. 1 be a diagram that the circuit diagram of the configuration of the driving circuit for conventional display;
Fig. 2 is the circuit diagram of the configuration of the display schematically illustrated according to embodiments of the invention 1;
Fig. 3 be a diagram that the circuit diagram according to the concrete image element circuit of embodiments of the invention 1 and the main configuration of luminance deviation compensation system;
Fig. 4 is the process flow diagram of the order of luminance deviation compensation method according to embodiments of the invention 1;
Fig. 5 is the circuit diagram of the configuration of the display schematically illustrated according to embodiments of the invention 2;
Fig. 6 be a diagram that the circuit diagram according to the concrete image element circuit of embodiments of the invention 2 and the main configuration of luminance deviation compensation system;
Fig. 7 is the process flow diagram of the order of luminance deviation compensation method according to embodiments of the invention 2;
Fig. 8 be a diagram that the process flow diagram for measuring in the order according to the grid-source voltage of driving transistors of each image element circuit before the display performance reduction of embodiments of the invention 2 and the method for the driving voltage of organic electroluminescence device;
Fig. 9 be a diagram that the process flow diagram for measuring in the order according to the grid-source voltage of driving transistors of each image element circuit after the display performance reduction of embodiments of the invention 2 and the method for the driving voltage of organic electroluminescence device.
Embodiment
The preferred embodiments of the present invention are described in detail hereinafter with reference to accompanying drawing.
1. embodiment 1
Fig. 2 is the circuit diagram of the configuration of the display schematically illustrated according to embodiments of the invention 1.
As shown in Figure 2, display unit 100, controller 120, gate drivers 130, data driver 150, anode driver 170, selector switch 115, current sink 160, analog to digital converter 142 and digital to analog converter 145 is comprised according to the display of embodiment 1.
Display unit 100 comprise multiple gate line Lg1 to Lgn (n be more than or equal to 2 integer), multiple data line Ld1 to Ldm of be arrangeding in parallel separately from each other (m be more than or equal to 2 integer) and multiple anode line La1 to Lan.Multiple gate line Lg1 to Lgn and multiple anode line La1 to Lan be arranged in parallel separately from each other.In addition, multiple data line Ld1 to Ldm intersects with multiple gate line Lg1 to Lgn and multiple anode line La1 to Lan.
Each image element circuit Px (i, j) (i=1 to n, j=1 to m, wherein m and n is natural number respectively) is arranged on multiple gate line Lg1 to Lgn and multiple data line Ld1 to Ldm each point of crossing intersected with each other.Multiple image element circuit P (i, j) be arranged to n capable × m row matrix shape (m and n is natural number respectively) to form display unit 100.
The detailed configuration of each image element circuit P (i, j) below will be described.
Multiple image element circuit P (i, j) of display unit 100 are connected to gate drivers 130 respectively by gate line Lg1 to Lgn, be connected to data driver 150, be connected to anode driver 170 by anode line La1 to Lan by data line Ld1 to Ldm.
Controller 120 produces signal and the data-signal for driving display unit 100 according to received image signal Data, and the signal produced and data-signal are fed to gate drivers 130 and data driver 150 respectively.
Gate drivers 130 is connected with gate line Lg1 to Lgn, and according to signal, grid impulse is fed to each gate line Lg1 to Lgn with predefined procedure.
Data driver 150 is connected with data line Ld1 to Ldm, and by data line Ld1 to Ldm, data-signal is fed to pixel to be driven to be positioned at the luminescence of the image element circuit P (i, j) on the gate line Lg1 to Lgn being supplied with signal.
Anode driver 170 is by anode line La1 to Lan output voltage V highor V lowvoltage signal to image element circuit P (i, j).Voltage V lowthe voltage for making the organic electroluminescence device 114 in each image element circuit P (i, j) be in non-luminescent state when writing process.In addition, voltage V highthe voltage for making the organic electroluminescence device 114 in each image element circuit P (i, j) be in luminance.
But, if needed, anode driver 13 can not be installed separately, and replace it at the upper so-called public anode applying anode voltage of the anode line La1 to Lan of multiple image element circuit P (i, j) while of can using.
Selector switch 115 makes the following image element circuit P (i that will describe, the cathode side of organic electroluminescence device 114 j) is optionally connected to current sink 160 or the second voltage source V ss, and when measuring the luminance deviation of the following description of the present invention, the negative electrode of each organic electroluminescence device 114 is connected with current sink 160 side, and when as typical display operation, the negative electrode of each organic electroluminescence device 114 is connected with the second voltage source V ss, and can perform its operation under the control of controller 120.
A terminal of current sink 160 is connected with selector switch 115, and another terminal is connected with controller 120 by analog to digital converter 142.When on the data line Ldj that predetermined data value is applied to the negative electrode of the organic electroluminescence device 114 being connected to image element circuit P (i, j) by selector switch 115, there is the current flowing of predetermined value.Below current measurement circuit 140 will be described.
Next, the configuration of image element circuit P (i, j) and luminance deviation compensation equipment will be described in detail.Fig. 3 be a diagram that the circuit diagram according to the image element circuit of embodiments of the invention 1 and the main configuration of luminance deviation compensation system.
As shown in Figure 3, organic electroluminescence devices 114, driving transistors 112, switching transistor 111 and capacitor 113 is included according to the image element circuit P (i, j) of embodiment 1.
The each of transistor 111 and 112 comprises the first electrode, the second electrode and gate electrode.
First electrode of the driving transistors 112 in each image element circuit P (i, j) and another connecting terminals of the first voltage source V DD and capacitor 113 connect.At this, first voltage source V DD can be the voltage source that the anode driver 170 in the display by having independent anode driver 170 is supplied, and when being used as to supply anode voltage to multiple image element circuit P (i simultaneously, during the so-called public anode of anode line La1 to Lan j), the first voltage source V DD can be the voltage source for public anode.
In addition, the second electrode of driving transistors 112 is connected with the anode of organic electroluminescence device 114, and the negative electrode of organic electroluminescence device 114 is optionally connected with the second voltage source V ss or current sink 160 by selector switch 115.In addition, the gate electrode of driving transistors 112 is connected with switching transistor 111, and the data selection supplied by data line Ldj is fed to driving transistors 112.
The gate electrode of switching transistor 111 is connected with gate drivers 130 by gate line Lgi, and open the first electrode by the sweep signal (row selection signal) of supplying from gate drivers 130, thus the picture signal Data being input to each data line Ldj is outputted to the gate electrode of driving transistors 112 and a terminal of capacitor 113.
The negative electrode of organic electroluminescence device 114 is optionally connected to the second voltage source V ss or current sink 160 by selector switch 115, and when as typical display operation, negative electrode and the second voltage source V ss of organic electroluminescence device 114 are in the state be connected to each other, and when measuring luminance deviation of the present invention, negative electrode and the current sink 160 of organic electroluminescence device 114 are in the state be connected to each other.
As shown in Figure 2, according in the display of embodiment 1, adopt so-called common cathode, wherein n capable × on the negative electrode of multiple image element circuit P (i, j) of m row is connected to each other.Common cathode is connected with a second voltage source V ss by a selector switch 115.
Current measurement circuit 140 comprises analog to digital converter 142, controller 120 and processor 141 for current measurement value being converted to digital signal, and the digital signal wherein from analog to digital converter 142 is transferred to processor 141.
In addition, current measurement circuit 140 comprises storer 144 further, for storaging current measured value, if needed, can also comprise low-pass filter 143.
Current measurement circuit 140 is optionally connected to multiple image element circuit P (i of display unit 100 by current sink 160 and selector switch 115, j) common cathode, and sequentially read each electric current flowing through multiple image element circuit P (i, j).
In addition, processor 141 is connected with data line Ldj by digital to analog converter 145, and when measuring luminance deviation of the present invention, supplies predetermined data value by data line Ldj.
In addition, processor 141 receives picture signal Data to realize the compensation of luminance compensation described below by input terminal.Therefore, when as typical display operation, offset data is fed to image element circuit P (i, j) by data line Ldj.
In the illustrated display of Fig. 2, controller 120 also performs the function of the processor 141 of current measurement circuit 140, but is not limited thereto, and included controller 120 can as independent parts.
Next, before the operation describing embodiment 1, the concept compensated will be described according to the luminance deviation of embodiment 1.
As mentioned above, the driving transistors performance comprised due to each image element circuit that may exist reduces the rising of the threshold voltage caused and changes the change in voltage caused due to the internal resistance of organic electroluminescence device, is the reason that the brightness caused due to the use of organic light emitting display reduces.
Key concept of the present invention is that the brightness of organic luminescent device is relevant with the magnitude of current of each image element circuit flowing through organic light emitting display, and the change that the internal resistance due to organic electroluminescence device changes the voltage caused once all is compensated, the magnitude of current of each image element circuit flowing through organic light emitting display is controlled as be applicable to the value keeping suitable brightness, thus the brightness that the Long-Time Service due to organic light emitting display causes can be compensated reduces.
In addition, in organic light emitting display, according to the difference of each glow frequency, the material etc. of organic luminous layer of multiple image element circuit, the reducing amount of the brightness of each image element circuit may be different.Therefore, each independent execution for multiple image element circuit is needed to carry out compensated for brightness deviations by controlling electricity.
In addition, in order to control the magnitude of current of each image element circuit flowing through organic light emitting display, before display causes performance reduction due to the use of display, such as, before organic light emitting display is used as display, measure the current value flowing through each image element circuit, and the current value measured is configured to reference current value.Then, occur to measure the current value flowing through each image element circuit after performance reduces owing to using this display schedule time at display, and the measured value after reducing based on reference current value compensation performance.
Next operation of the present invention will be described.Fig. 4 is the process flow diagram of the order of luminance deviation compensation method according to embodiments of the invention 1.
First, after selector switch 115 is switched to current sink 160 side (step S11), predetermined test voltage Vdata is applied on data line Ldj (step S12), and activates the gate line Lgi (step S13) selected.
At this, the order of step S12 and S13 can be put upside down mutually.That is, after activating the gate line Lgi selected, predetermined test voltage Vdata can be applied on data line Ldj.In fact, two steps can perform time synchronized with each other.
Thus, the switching transistor 111 of image element circuit P (i, j) is opened, thus the test voltage Vdata be applied on gate line Lgi outputs on the gate electrode of driving transistors 112 and a terminal of capacitor 113.
Next, when applying anode voltage from the first voltage source V DD (step S14), electric current flows to current sink 160 by driving transistors 112 and organic electroluminescence device 114 from the first voltage source V DD, and measure this electric current by current measurement circuit 140, namely image element circuit P (i is flow through, j) electric current, and the current value measured is stored in (step S15) in storer 144.
Such as, when display unit 100 have n capable × m row multiple image element circuit time, perform the measurement of the electric current flowing through image element circuit respectively for multiple image element circuit.Therefore, in step s 16, determine whether to remain image element circuit to be measured.
In step s 16, if determine to remain the image element circuit (being in step S16) flowing through the current value of image element circuit to be measured, so flow process turns back to step S12, and therefore repeat step S12 to S16, and in step s 16, if determine no longer to remain the image element circuit (no in step S16) flowing through the current value of image element circuit to be measured, so flow process proceeds to step S17.
As for measure flow through n capable × method of each current value of multiple image element circuits of m row, can exist by row sequence of unit measure n capable × method of electric current of multiple image element circuits of m row, and by column unit proceeding measurement n capable × method of the electric current of multiple image element circuits of m row.
When measuring current value by row sequence of unit, in fig. 2, such as, first when gate line activates, by at image element circuit P (1,1), P (1,2) ... with P (1, m) data line Ld1, data line Ld2... and data line Ldm each on sequentially apply the current value that test voltage Vdata sequentially measures each image element circuit flowing through the first row, then can according to describe above identical method and sequentially measure and flow through the second row, the third line ... with the current value of each image element circuit of n-th line.
Alternatively, when by column unit proceeding measurement current value, in fig. 2, such as, first, when applying test voltage Vdata to activate gate line Lg1, Lg2... and Lgn on data line Ld1, at image element circuit P (1,1), the P (2,1) of order ... with P (n, 1) gate line Lg1, gate line Lg2... and gate line Lgn each on sequentially apply signal, thus measure the electric current of each image element circuit of first row.Then, secondary series, the 3rd row can be flow through by sequentially measuring with method identical as mentioned above ... the current value of each image element circuit of the n-th row.
In addition, in the foregoing description, describe the image element circuit P (1 from the first row first row, 1) start and n capable × m row image element circuit P (n, the proceeding measurement of the current value m) terminated, but be not limited thereto, and the proceeding measurement of current value can capable from n × m row multiple image element circuits any one.Importantly, all measure and store flow through n capable × each current value of multiple image element circuits of m row.
Simultaneously, as mentioned above, before use organic light emitting display, that is, before organic light emitting display performance reduces, measurement in advance flows through the current value of each image element circuit for compensating the luminance deviation because Long-Time Service organic luminescent device causes, this value measured in advance is stored as target current value, then, after organic light emitting display uses the schedule time, that is, after organic light emitting display performance reduces, need measure according to the same procedure with this measuring method and store these current values.
In this case, in the measurement before and after organic light emitting display performance reduces, mutually the same test voltage Vdata should be used.
Next, measured value before organic light emitting display performance reduces, i.e. target current value, the change of the current value before and after the organic light emitting display performance that mutually compares the measured value after reducing with organic light emitting display performance reduces, thus the change of calculating current value (step S17).
Calculating can be performed by any method known in the art, each offset voltage (offsetvoltage) value remaining on the gate electrode of driving transistors 112 required by required brightness that the change of current value calculated converts multiple image element circuits for being maintained display unit 100 by method as known in the art to, the value then changed can such as be stored in storer 144 in the form of a lookup table.But, be not limited thereto, offset voltage computational algorithm is stored in alternative look-up table in storer 144, and as required, offset voltage can be calculated based on this algorithm.
In addition, the offset voltage calculated is provided as luminance deviation that disposable whole compensation causes due to the change of the threshold voltage of driving transistors 112 and reduces the data of the change of the current value caused due to organic electroluminescence device 114 performance in each image element circuit P (i, j).
Specifically, such as, offset voltage is supplied to controller 120.The picture signal Data that controller 120 is inputted by input terminal based on the offset compensation of each calculating for multiple image element circuit, and the view data Data of compensation is supplied to each image element circuit.Even if there is no brightness reduction and brightness irregularities display thereby, it is possible to provide when performance reduces due to the Long-Time Service of organic light emitting display in organic light emitting display.
2. embodiment 2
Next embodiment of the present invention will be described 2.Fig. 5 is the circuit diagram of the configuration of the organic light emitting display schematically illustrated according to embodiments of the invention 2.
As shown in Figure 5, display unit 200, selector switch 215, current sink 260, current measurement circuit 240, changing value compensating unit 220 and data driver 250 is comprised according to the organic light emitting display of embodiment 2.Although not shown in Fig. 5, organic light emitting display comprises known parts, such as, each gate line Lgi applies the gate drivers selecting signal, supply driving voltage to the anode driver each anode line Lai from the first voltage source V DD, control the controller etc. of each unit of display.
Display unit 200 comprise multiple gate line Lg1 to Lgn (n be more than or equal to 2 integer), multiple data line Ld1 to Ldm of being set parallel to each other respectively (m be more than or equal to 2 integer) and multiple anode line La1 to Lan.Be set parallel to each other multiple gate line Lg1 to Lgn and multiple anode line La1 to Lan respectively.In addition, multiple data line Ld1 to Ldm intersects with multiple gate line Lg1 to Lgn and multiple anode line La1 to Lan.
Each image element circuit Px (i, j) (i=1 to n, j=1 to m, wherein m and n is natural number respectively) be arranged on each point of crossing each intersected with each other of multiple gate line Lg1 to Lgn and multiple data line Ld1 to Ldm, and multiple image element circuit P (i, j) be arranged to n capable × m row matrix shape (m and n is natural number respectively) to form display unit 200.
In addition, each of multiple image element circuit P (i, j) has reading line Lri, and will describe the configuration comprising each image element circuit P (i, j) of reading line Lri in detail below.
Multiple image element circuit P (i, j) of display unit 200 are connected to gate drivers 230 respectively by gate line Lg1 to Lgn, be connected to data driver 250, be connected to anode driver 270 by anode line La1 to Lan by data line Ld1 to Ldm.
Data driver 250 is for supplying each to multiple image element circuit P (i, j) of view data Data by multiple data line Ldj.In addition, in the present invention, in order to compensated for brightness deviations, for each image element circuit P (i, j) during measuring the threshold voltage variation value of driving transistors 212 and the driving voltage changing value of organic electroluminescence device 214, data driver, for supplying test voltage Vdata to driving transistors 212 with read each of transistor 216, below will be described in detail.
Selector switch 215 makes image element circuit P (i, the cathode side of organic electroluminescence device 214 j) is optionally connected to following by the current sink 260 of description or the second voltage source V ss, when for each image element circuit P (i, when the driving voltage changing value of the threshold voltage variation value and organic electroluminescence device 214 of j) measuring driving transistors 212 is to compensate luminance deviation described below, the negative electrode of each organic electroluminescence device 214 is made to be connected to current sink 260 side, and when as typical display operation, the negative electrode of each organic electroluminescence device 214 is made to be connected to the second voltage source V ss.These operations can be performed under the control of a controller (not shown).
A terminal of current sink 260 is connected with selector switch 215, and another terminal is connected with changing value compensating unit 220 by current measurement circuit 240.Image element circuit P (i is connected to by selector switch 215 when predetermined data value is applied to, time on the data line Ldj of the negative electrode of organic electroluminescence device 214 j), there is each image element circuit P (i, j) of current flowing to display unit 200 of predetermined value.
Except gate drivers, known parts are not directly involved in main idea of the present invention, and therefore only describe necessary part to understand the present invention by the scope needed, and do not describe other parts.
In addition, current measurement circuit 240 comprises current measuring unit 242, analog to digital converter 243, changing value computing unit 241 and storer 244, below will describe in detail.
Next, the configuration of image element circuit P (i, j) and luminance deviation compensation equipment will be described in detail.Fig. 6 be a diagram that the circuit diagram according to the image element circuit of embodiments of the invention 2 and the main configuration of luminance deviation compensation system.
As shown in Figure 6, according to each image element circuit P (i of embodiment 2, j) include organic electroluminescence devices 214, driving transistors 212, switching transistor 211, read transistor 216 and capacitor 213, wherein each of transistor 211,212 and 216 has the first electrode, the second electrode and gate electrode.
The gate electrode of switching transistor 211 is connected with gate drivers (not shown) by gate line Lgi, and the first Electrode connection is to data line Ldj, and the second Electrode connection is on the gate terminal of driving transistors 212.Therefore, by sweep signal (row selection signal) the opening switch transistor 211 supplied from gate drivers, thus the picture signal data (or test voltage Vdata) being input to each data line Ldj is outputted to the gate electrode of driving transistors 212 and a terminal of capacitor 213.
First electrode of the driving transistors 212 in each image element circuit P (i, j) is connected with another terminal of the first voltage source V DD and capacitor 213.At this, first voltage source V DD can be the voltage source of the anode driver supply in the display by having anode driver (not shown), and for supplying anode voltage to multiple image element circuit P (i simultaneously, when the so-called public anode of anode line La1 to Lan j), it can be the voltage source for public anode.
In addition, the second electrode of driving transistors 212 is connected with the anode of organic electroluminescence device 214, and the negative electrode of organic electroluminescence device 214 is optionally connected with any one of the second voltage source V ss or current sink 260 by selector switch 215.In addition, the gate electrode of driving transistors 212 is connected with switching transistor 211, and the picture signal Data supplied by data line Ldj (or test voltage Vdata) is optionally fed to driving transistors 212.
The gate electrode reading transistor 216 is connected to reading driver (not shown) by reading line Lri, first Electrode connection to the first electrode of data line Ldj and switching transistor 211, second electrode of the second Electrode connection to driving transistors 212 and the anode terminal of organic electroluminescence device 214.By reading transistor from the selection unblanking reading the supply of driver (not shown), thus the test voltage Vdata being input to data line Ldj is fed to the anode terminal of organic electroluminescence device 214.
At this, the gate drivers of known organic light emitting display also can perform the function optionally driving the reading driver reading transistor 216, and can arrange reading driver independent of gate drivers further.When gate drivers also perform read the function of driver time, be enough to optionally selector switch transistor 211 and the switching function of any one that reads transistor 216 to add on known gate drivers.
As shown in Figure 5, according in the display of embodiment 2, adopt so-called common cathode, wherein n capable × m row multiple image element circuit P (i, j) on negative electrode is connected to each other, and common cathode is connected with a second voltage source V ss by a selector switch 215.
Current measurement circuit 240 comprises: current measuring unit 242, for measuring the electric current flowing through each image element circuit P (i, j) via selector switch 215 and current sink 260; Analog to digital converter 243, converts digital signal to for the simulating signal measured by current measuring unit 242; Changing value computing unit 241, for calculating changing value following by the eigenwert before and after the reduction of the display performance of description by more each image element circuit P (i, j); And for storing the storer 244 of these eigenwerts.
By this configuration, current measurement circuit 240 is optionally connected to multiple image element circuit P (i of display unit 200 by current sink 260 and selector switch 215, j) common cathode, and sequentially reading flow crosses multiple image element circuit P (i, j) each electric current, thus calculate following by the threshold voltage variation value of driving transistors 212 of description and the driving voltage changing value of organic electroluminescence device 214.
The threshold voltage variation value of the driving transistors 212 that changing value computing unit 241 calculates based on method described below by changing value compensating unit 220 and the driving voltage changing value of organic electroluminescence device 214 are increased to the picture signal Data inputted by input terminal, and each image element circuit P (i, j) of display unit 200 is supplied to by digital to analog converter 245 and data line Ldj.
The digital data conversion of each image element circuit P (i, j) being fed to display unit 200 from changing value compensating unit 220 is become simulated data by digital to analog converter 245.
Although do not illustrate in detail in Fig. 5 and Fig. 6, the controller controlling all operations of known organic electroluminescence device also can perform the function of changing value compensating unit 220, and changing value compensating unit also can configure independent of controller.
Next, before the operation describing embodiment 2, the concept compensated will be described according to the luminance deviation of embodiment 2.
Also described above, the driving transistors performance comprised due to each image element circuit that may exist reduces the rising of the threshold voltage caused and changes the driving voltage change caused due to the internal resistance of organic electroluminescence device, is the reason that the brightness caused due to the use of organic light emitting display reduces.
Key concept of the present invention is that the brightness of organic luminescent device is relevant with the magnitude of current of each image element circuit flowing through organic light emitting display, and the change that the internal resistance due to organic electroluminescence device changes the voltage caused once all is compensated, the magnitude of current of each image element circuit flowing through organic light emitting display is controlled as be applicable to the value keeping suitable brightness, thus the brightness that the Long-Time Service due to organic light emitting display causes can be compensated reduces.
In addition, in organic light emitting display, according to various variable, such as, the difference of each glow frequency of multiple image element circuit, the material etc. of organic luminous layer, the reducing amount of the brightness of each image element circuit may be different.Therefore, each independent execution compensated for brightness deviations for multiple image element circuit is needed.
In addition, in order to control the magnitude of current of each image element circuit flowing through organic light emitting display, before display causes performance reduction due to the use of display, such as, before organic light emitting display is used as display, measure the grid-source voltage of driving transistors when applying the test voltage of predetermined value on each image element circuit and the driving voltage of organic electroluminescence device, owing to using after this display schedule time and performance reduce before display performance reduces and at display, measure the grid-source voltage of the driving transistors in each image element circuit and the driving voltage of organic electroluminescence device at identical conditions respectively, and based on the threshold voltage variation value of result compensation for drive transistor measured and the driving voltage changing value of organic electroluminescence device.
Next operation of the present invention will be described.Fig. 7 is the process flow diagram of the order of luminance deviation compensation method according to embodiments of the invention 2.
As shown in Figure 7, first, measure multiple image element circuits of display unit 200 before organic light emitting display performance reduces each in the grid-source voltage V of driving transistors 212 gS21with the driving voltage V of organic electroluminescence device 214 oLED1, and in the result measured is stored in multiple image element circuit each corresponding storer 244 (step S21).
At this, perform under the original state that measurement before organic light emitting display performance reduces can be used as before display in organic light emitting display, can perform by using this organic light emitting display schedule time and stable opportunity in the operation of organic light emitting display, and can perform on other opportunitys.
Below, by the grid-source voltage of driving transistors of each image element circuit in detailed description measuring process S21 before display performance reduces and the method for the driving voltage of organic electroluminescence device.Fig. 8 be a diagram that the process flow diagram for measuring in the order according to the grid-source voltage of driving transistors of each image element circuit before the display performance reduction of embodiments of the invention 2 and the method for the driving voltage of organic electroluminescence device.
First, selector switch 215 is switched to current sink 260 side (step S31) to open the image element circuit P (i selected from measurement result, j) switching transistor 211 and driving transistors 212, and close reading transistor 216 (step S32).
Next, at the upper test voltage Vdata (step S33) applying predetermined value of the image element circuit P (i, j) selected.Under following hypothesis, embodiment 2 will be described: adopt 5V as test voltage Vdata.
At this, gate drivers applies row selection signal with opening switch transistor 211 on the gate terminal of the image element circuit P (i, j) selected.Because switching transistor 211 is opened, so driving transistors 212 is also opened, to be applied the test voltage Vdata (in example 2 for 5V) of predetermined value on the gate electrode of driving transistors 212 and a terminal of capacitor 213 by data line Ldj.
Next, when applying anode voltage from the first voltage source V DD, there is the electric current I of the value corresponding with test voltage Vdata oLED1current sink 260 is flow to from the first voltage source V DD by driving transistors 212, organic electroluminescence device 214 and selector switch 215.After this, current measuring unit 242 measures this electric current, namely flows through the electric current I of the image element circuit P (i, j) of selection oLED1, and convert the current value of measurement to digital value by analog to digital converter 243, be then stored in (step S34) in storer 244.
In example 2, when applying the test voltage Vdata of 5V voltage as predetermined value on the gate electrode of driving transistors 212 and a terminal of capacitor 213, the electric current I of the organic electroluminescence device 214 flowing through image element circuit P (i, j) is supposed oLED1, i.e. the electric current I of current measuring unit 242 measurement oLED1be 1 μ A.In the following description, current value 1 μ A is called as " reference current ".
At this, flow through the electric current I of the organic electroluminescence device 214 of the image element circuit P (i, j) of selection oLED1being the connotation of 1 μ A is, for convenience of describing, the n of display unit 200 is capable × multiple image element circuits of m row in specific one image element circuit P (i, j) current value is described as an example, and from removing this specific image element circuit P (i, j) current value that other image element circuits outside are measured can equal or be different from the current value of this specific image element circuit P (i, j), and this similarly can be applied in the grid voltage V of driving transistors 212 g, source voltage V swith grid-source voltage V gSand the driving voltage V of organic electroluminescence device 214 oLEDon, below will be described.
At this, the test voltage Vdata (being 5V in example 2) being applied to the predetermined value on the gate electrode of driving transistors 212 and a terminal of capacitor 213 is different from the anode voltage applied from the first voltage source V DD.
Next, closing switch transistor 211 and driving transistors 212, and open reading transistor 216 (step S35) to apply test voltage Vdata (step S36) on organic electroluminescence device 214.
In this case, the test voltage Vdata be applied on organic electroluminescence device 214 makes to have and the electric current I flowing through the image element circuit P (i, j) of selection measured in step S34 oLED1the electric current (being 1 μ A in example 2) of identical value flows to the voltage of corresponding image element circuit P (i, j), and in step S36, measure this magnitude of voltage.In example 2, suppose that the voltage measured in step S36 is 2V.
Next, flow process proceeds to step S37 to calculate the grid-source voltage V of the driving transistors 212 of the image element circuit P (i, j) selected based on result gS21with the driving voltage V of the organic electroluminescence device 214 of the correspondence of image element circuit P (i, j) oLED1.In example 2, due to the operating current I at image element circuit P (i, j) oLED1the grid voltage V of driving transistors 212 when being 1 μ A gbe 5V and source voltage V sfor 2V, grid-source voltage V gS21become 3V and the driving voltage V of organic electroluminescence device 214 oLED1become 2V.These values are stored in the storer 244 corresponding with corresponding image element circuit.
Such as, when display unit 200 have n capable × m row multiple image element circuit time, the measurement of the electric current of image element circuit should be flow through for each whole execution of multiple image element circuit.Therefore, in step S38, determine whether to remain image element circuit to be measured.
In step S38, if determine to remain the image element circuit (being in step S38) flowing through the current value of image element circuit to be measured, so flow process turns back to step S32, and therefore repeat step S32 to S38 for next image element circuit, and in step S38, if determine no longer to remain the image element circuit (no in step S38) flowing through the current value of image element circuit to be measured, so flow process terminates.
As for measure n capable × each image element circuit of m row in the grid-source voltage V of driving transistors 212 gS21with the driving voltage V of organic electroluminescence device 214 oLED1method, can exist by row sequence of unit measure n capable × method of multiple image element circuits of m row, and by column unit proceeding measurement n capable × method of multiple image element circuits of m row.
Such as, in Figure 5, when measuring current value by row sequence of unit, can according to image element circuit P (1,1), image element circuit (1,2) ... (1, the image element circuit of proceeding measurement the first row m), then can sequentially measure the second row, the third line ... with the image element circuit of n-th line with image element circuit P.
Alternatively, such as, in Figure 5, when by column unit proceeding measurement current value, can according to image element circuit P (1,1), image element circuit (2,1) ... with image element circuit P (n, 1) image element circuit of proceeding measurement first row, then sequentially can measure secondary series, the 3rd row ... with the image element circuit of the n-th row.
In addition, in the foregoing description, describe the image element circuit P (1 from the first row first row, 1) start and n capable × m row image element circuit P (n, the proceeding measurement of the current value m) terminated, but be not limited thereto, and the proceeding measurement of current value can capable from n × m row multiple image element circuits any one.Important thing is, all measure n capable × multiple image element circuits of m row each in the grid-source voltage V of driving transistors 212 gS21with the driving voltage V of organic electroluminescence device 214 oLED1, and store the voltage of the measurement corresponding with each image element circuit.
Refer again to Fig. 7, measure multiple image element circuits of display unit 200 after organic light emitting display performance reduces each in the grid-source voltage V of driving transistors 212 gS22with the driving voltage V of organic electroluminescence device 214 oLED2, and in the result measured is stored in multiple image element circuit each corresponding storer 244 (step S22).
At this, measurement after organic light emitting display performance reduces performs after organic light emitting display is used as the display schedule time, and the arrangement of time of measuring suitably can be determined when considering when due to the Long-Time Service of organic light emitting display, performance reduces the characteristic of organic light emitting display.In addition, at the life period of organic light emitting display, survey frequency can be only once, or twice, or more time.In other words, at the life period of organic light emitting display, compensate and only can perform once because organic light emitting display performance reduces the luminance deviation caused, or twice or more time.Suitably can determine arrangement of time and the frequency of the measurement after performance reduces as required.
Below, the grid-source voltage of driving transistors of each image element circuit and the method for the driving voltage of organic electroluminescence device measured in step S22 after display performance reduces is described in detail with reference to Fig. 9.Fig. 9 be a diagram that the process flow diagram of the order of the grid-source voltage of driving transistors of each image element circuit and the method for the driving voltage of organic electroluminescence device measured after reducing according to the display performance of embodiments of the invention 2.
First, selector switch 215 is switched to current sink 260 side (step S41), then open switching transistor 211 and the driving transistors 212 of the image element circuit P (i, j) of selection, and close reading transistor 216 (step S42).At this, in the measurement before performance reduces, perform step S41 and S42 according to the method identical with S32 with step S31.
Next, driving transistors 212 applies test voltage Vdata, the electric current I of the value that the reference current (being 1 μ A in example 2) measured in step S34 when test voltage Vdata measures before making to have and reducing with the performance in step S43 is identical oLED2flow to the image element circuit P (i, j) of selection, and measure this voltage.By under following hypothesis, embodiment 2 is described: the test voltage Vdata of specific pixel circuit P (i, j) of selection is 5.2V.
Next, close the image element circuit P (i selected, j) switching transistor 211 in and driving transistors 212, and open and read transistor 216 (step S44), then in step S45, measure make to have to reduce with in performance before the electric current I of the identical value of the reference current (being 1 μ A in example 2) measured in step S34 oLEDflow to the test voltage Vdata of image element circuit P (i, j), and measure this value.In example 2, suppose that the test voltage Vdata of measurement is 2V.
Next, flow process proceeds to step S46 to calculate the grid-source voltage V of the driving transistors 212 of the image element circuit P (i, j) selected based on the above results gS22with the driving voltage V of the organic electroluminescence device 214 of the image element circuit P (i, j) of correspondence oLED2.In example 2, due to the grid voltage V of driving transistors 212 gat the operating current I of image element circuit P (i, j) oLED2be 5.2V when being 1 μ A and source voltage V sfor 2V, grid-source voltage V gS22become 3.2V and the driving voltage V of organic electroluminescence device 214 oLED2become 2V.These values are stored in the storer 244 corresponding with corresponding image element circuit.
Such as, when display unit 200 have n capable × m row multiple image element circuit time, perform the measurement of the electric current flowing through image element circuit respectively for multiple image element circuit.Therefore, in step S47, determine whether to remain image element circuit to be measured.
In step S47, if determine to remain the image element circuit (being in step S47) needing to measure and flow through the current value of image element circuit, so flow process turns back to step S42, and therefore repeat step S42 to S47 for next image element circuit, and in step S47, need to measure the image element circuit (no in step S47) flowing through the current value of image element circuit if determine no longer to remain, so flow process terminates.
According to method identical before performance reduces described above perform after performance the reduces multiple image element circuit of proceeding measurement each in the grid-source voltage V of driving transistors 212 gS22with the driving voltage V of organic electroluminescence device 214 oLED2method.
Refer again to Fig. 7, calculate the multiple image element circuits measured in the step s 21 each in the grid-source voltage V of driving transistors 212 gS21with the driving voltage V of organic electroluminescence device 214 oLED1with the multiple image element circuits measured in step S22 each in the grid-source voltage V of driving transistors 212 gS22with the driving voltage V of organic electroluminescence device 214 oLED2between difference calculate threshold voltage variation value Δ th and the driving voltage changing value Δ V of each image element circuit P (i, j) oLED, the threshold voltage variation value Δ th of calculating and driving voltage changing value Δ V oLEDsumming value (Δ th+ Δ V oLED) be stored in storer 244 as bucking voltage (step S23).
In example 2, the grid-source voltage V of driving transistors 212 owing to measuring for specific image element circuit P (i, j) in the step s 21 gS21for 3V, the driving voltage V of organic electroluminescence device 214 oLED1for 2V, and the grid-source voltage V of the driving transistors 212 measured in step S22 gS22for 3.2V, the driving voltage V of organic electroluminescence device 214 oLED2for 2V, the threshold voltage variation value Δ th of this specific image element circuit becomes+2V (3.2V – 3.0V=+2V), driving voltage changing value Δ V oLEDbecome 0V (2V – 2V=0V), and as threshold voltage variation value Δ th and driving voltage changing value Δ V oLEDsumming value (Δ th+ Δ V oLED) the bucking voltage of image element circuit P (i, j) become+2V.
In addition, for other image element circuits outside specific image element circuit P (i, j), calculated threshold voltage change Δ th and driving voltage changing value Δ V by the same way oLED, and the threshold voltage variation value Δ th of each image element circuit and driving voltage changing value Δ V oLEDsumming value (Δ th+ Δ V oLED) be arranged to the bucking voltage of this image element circuit, and be stored in the storer 244 corresponding with each image element circuit.
Next, in step s 24 which, selector switch 215 is switched to the second voltage source V ss side in step S23, and the bucking voltage obtained in step S23 is provided to changing value compensating unit 220 from storer 244, and changing value compensating unit 220 is increased to picture signal Data (that is, the Data+ Δ Vth+ Δ V of each image element circuit inputted by input terminal oLED), and the image element circuit providing it to each correspondence is to drive organic light emitting display, thus compensated for brightness deviations.Therefore, even if when due to the Long-Time Service of organic light emitting display, performance reduces organic light emitting display, this organic light emitting display can as the display not having brightness reduction and brightness irregularities.
[description of reference numerals]
P (i, j) image element circuit
111,211 switching transistors
112,212 driving transistorss
113,213 capacitors
114,214 organic electroluminescence devices
115,215 selector switch
120 controllers
130 gate drivers
VDD first voltage source
Vss second voltage source
140,240 current measurement circuits
142 analog to digital converters
144,244 storeies
145,245 digital to analog converters
150 data drivers
160,260 current sinks
216 read transistor
220 changing value compensating units
242 current measuring units

Claims (16)

1. a luminance deviation compensation equipment for organic light emitting display, comprising:
Driving transistors, has the first electrode, the second electrode and gate electrode;
First voltage source, with the first Electrode connection of described driving transistors;
Organic electroluminescence device, has the anode electrode with the second Electrode connection of described driving transistors;
Second voltage source;
Selector switch, is configured to make the cathode electrode of described organic electroluminescence device optionally be connected to described second voltage source or current sink; And
Current measurement circuit, is configured to measure the electric current flowing to described current sink from described first voltage source when the gate electrode at described driving transistors applying test voltage.
2. luminance deviation compensation equipment according to claim 1, wherein, described organic light emitting display comprise n capable × m row multiple image element circuits, and described multiple image element circuit each in organic electroluminescence device cathode electrode by interconnection common cathode Electrode selectivity be connected to described selector switch.
3. luminance deviation compensation equipment according to claim 1, wherein, described current measurement circuit comprises analog to digital converter.
4. luminance deviation compensation equipment according to claim 3, wherein, described current measurement circuit also comprises low-pass filter.
5. carried out a method for luminance deviation compensation by the luminance deviation compensation equipment according to any one in Claims 1-4, comprising:
Described selector switch is made to be switched to described current sink side;
The electric current flowing to described current sink from described first voltage source is measured by described current measurement circuit; And
Based on the luminance deviation of organic light emitting display described in measured current compensation.
6. luminance deviation compensation method according to claim 5, wherein, the step measuring described circuit comprises:
First step, performed before described organic light emitting display is used as display; And
Second step, performs after described organic light emitting display is used as the display schedule time, and
In the step of compensated for brightness deviations, the current value measured in described first step is configured to reference current value the current value measured in described second step and described reference current value to be compared, thus compensated for brightness deviations.
7. luminance deviation compensation method according to claim 6, comprises further:
Comparative result based on the current value measured in described first step and described second step calculates the offset voltage of described driving transistors, and the offset voltage of wherein said driving transistors stores with form of look.
8. luminance deviation compensation method according to claim 7, wherein, by performing the compensation of described luminance deviation based on the described offset compensation picture signal be input in described organic light emitting display.
9. a luminance deviation compensation equipment for organic light emitting display, this organic light emitting display comprise n capable × multiple image element circuits of m row, the first voltage source and the second voltage source, wherein, described each of multiple image element circuit comprises: driving transistors; Organic electroluminescence device, has the terminal be connected with described first voltage source, to apply the voltage from described first voltage source on a described terminal when described driving transistors is opened; And reading transistor, when described driving transistors is closed, described reading transistor optionally opens to apply voltage on a described terminal of described organic electroluminescence device, and described luminance deviation compensation equipment comprises:
Current sink;
Selector switch, is configured to another terminal of described organic electroluminescence device to be optionally connected to described second voltage source or described current sink; And
Current measurement circuit, be configured to measure the electric current flowing to described organic electroluminescence device from described first voltage source when applying test voltage on described driving transistors, and measure the electric current flowing to described organic electroluminescence device from described reading transistor when described reading transistor is opened.
10. luminance deviation compensation equipment according to claim 9, wherein, described current measurement circuit comprises:
Current measuring unit, is configured to measure the electric current flowing through described organic electroluminescence device; And
Changing value calculation element, is configured to calculate the grid-source voltage of described driving transistors and the driving voltage of described organic electroluminescence device based on the current value measured by described current measuring unit.
11. luminance deviation compensation equipments according to claim 10, wherein, before performance reduces due to the use of described organic light emitting display for the characteristic of described organic light emitting display and in the characteristic of described organic light emitting display, due to the use of described organic light emitting display, performance performs the measurement of described grid-source voltage and described driving voltage respectively after reducing, and described changing value calculation element calculates the threshold voltage variation value of described driving transistors and the driving voltage changing value of described organic electroluminescence device respectively based on the described grid-source voltage after reducing in described performance and described driving voltage and the described grid-source voltage before described performance reduces and described driving voltage further.
12. luminance deviation compensation equipments according to claim 11, also comprise: compensation system,
Wherein, described changing value calculation element be configured to using described threshold voltage variation value and described driving voltage changing value and be supplied to described compensation system as bucking voltage, and described bucking voltage is increased to picture signal to drive described organic light emitting display by described compensation system.
13. 1 kinds are carried out the method for luminance deviation compensation by luminance deviation compensation equipment according to claim 9, comprising:
Third step, described organic light emitting display characteristic multiple image element circuit described in the pre-test of performance reduction due to the use of described organic light emitting display each in the grid-source voltage of described driving transistors and the driving voltage of described organic electroluminescence device;
4th step, the characteristic of described organic light emitting display due to the use of described organic light emitting display performance measure after reducing described multiple image element circuit each in the grid-source voltage of described driving transistors and the driving voltage of described organic electroluminescence device; And
5th step, based on the described multiple image element circuit measured in third step and the 4th step respectively each in the grid-source voltage of described driving transistors and the driving voltage of described organic electroluminescence device calculate described multiple image element circuit each in the threshold voltage variation value of described driving transistors and the driving voltage changing value of described organic electroluminescence device.
14. luminance deviation compensation methodes according to claim 13, also comprise:
6th step, to the described threshold voltage variation value calculated in described 5th step and the summation of described driving voltage changing value, to calculate each bucking voltage of described multiple image element circuit, and described bucking voltage is increased to is applied to picture signal on described image element circuit to drive described organic light emitting display.
15. luminance deviation compensation methodes according to claim 13 or 14, wherein, described third step comprises:
Described selector switch is made to be switched to described current sink side;
The first electric current flowing through described organic electroluminescence device is measured with the test voltage applying pre-sizing on described driving transistors by opening described driving transistors and closing described reading transistor;
The voltage be applied to when the second electric current identical with described first size of current flows to described organic electroluminescence device on described reading transistor is measured by closing described driving transistors and opening described reading transistor; And
The gate-to-source value of described driving transistors and the driving voltage of described organic electroluminescence device is calculated based on described test voltage and the voltage applied.
16. luminance deviation compensation methodes according to claim 13 or 14, wherein, described 4th step comprises:
Described selector switch is made to be switched to described current sink side;
By opening described driving transistors and closing described reading transistor, when four electric current identical when the current value size had with flow through described organic electroluminescence device during the grid-source voltage measuring described driving transistors in described third step flows to described organic electroluminescence device, measure the test voltage be applied on described driving transistors;
The voltage be applied to when the 4th electric current identical with described 3rd size of current flows to described organic electroluminescence device on described reading transistor is measured by closing described driving transistors and opening described reading transistor; And
The gate-to-source value of described driving transistors and the driving voltage of described organic electroluminescence device is calculated based on described test voltage and the voltage applied.
CN201480042124.4A 2013-07-23 2014-07-22 The luminance deviation compensation equipment of display and compensation method Expired - Fee Related CN105453164B (en)

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