CN105444708B - 用于在位置测量装置中修正误差的方法 - Google Patents

用于在位置测量装置中修正误差的方法 Download PDF

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Publication number
CN105444708B
CN105444708B CN201510614273.XA CN201510614273A CN105444708B CN 105444708 B CN105444708 B CN 105444708B CN 201510614273 A CN201510614273 A CN 201510614273A CN 105444708 B CN105444708 B CN 105444708B
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correction value
value
correction
measurer
adjusting point
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CN105444708A (zh
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约尔格·德雷谢尔
乌尔里希·比希尔迈耶
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Dr Johannes Heidenhain GmbH
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Dr Johannes Heidenhain GmbH
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/008Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 with calibration coefficients stored in memory
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
CN201510614273.XA 2014-09-23 2015-09-23 用于在位置测量装置中修正误差的方法 Active CN105444708B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102014219188.2 2014-09-23
DE102014219188.2A DE102014219188A1 (de) 2014-09-23 2014-09-23 Verfahren zur Fehlerkorrektur in Positionsmesseinrichtungen

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CN105444708A CN105444708A (zh) 2016-03-30
CN105444708B true CN105444708B (zh) 2018-02-13

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CN201510614273.XA Active CN105444708B (zh) 2014-09-23 2015-09-23 用于在位置测量装置中修正误差的方法

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US (1) US10060772B2 (enExample)
EP (1) EP3001151B1 (enExample)
JP (1) JP6487302B2 (enExample)
CN (1) CN105444708B (enExample)
DE (1) DE102014219188A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102016222275A1 (de) * 2016-11-14 2018-05-17 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Verfahren zum Betreiben einer Positionsmesseinrichtung
CN108038331B (zh) * 2017-12-27 2022-11-11 重庆工商职业学院 一种基于云计算的高精度温度数据校正方法
CN112697186B (zh) * 2019-10-23 2022-03-25 上海微电子装备(集团)股份有限公司 测量校正装置和测量校正方法
WO2022107421A1 (ja) * 2020-11-20 2022-05-27 パナソニックIpマネジメント株式会社 エンコーダ及び情報処理方法
DE102021121869A1 (de) 2021-08-24 2023-03-02 Schaeffler Technologies AG & Co. KG Verfahren zur Kalibrierung und/oder Linearisierung eines Positionssensors; Positionssensor; Hinterachslenkung; Fahrzeug; Computerprogramm

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4462083A (en) * 1980-06-30 1984-07-24 Dr. Johannes Heidenhain Gmbh Method of interval interpolation
EP1403625A1 (de) * 2002-09-25 2004-03-31 Siemens Aktiengesellschaft Kalibriergenerator mit Speicher ( Schwingungsmessung )
CN1894557A (zh) * 2003-12-16 2007-01-10 特里伯耶拿有限公司 探测仪器的校准
CN1947062A (zh) * 2004-02-23 2007-04-11 Asml荷兰有限公司 基于散射测量数据确定工艺参数值的方法
US8064974B2 (en) * 2000-08-31 2011-11-22 Tyco Healthcare Group Lp Method and circuit for storing and providing historical physiological data
CN103365246A (zh) * 2012-04-05 2013-10-23 菲迪亚股份公司 用于数控机床的误差校正的装置
CN103591913A (zh) * 2013-11-18 2014-02-19 沈阳黎明航空发动机(集团)有限责任公司 一种五坐标测量机综合误差校准方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE58904087D1 (de) * 1989-07-21 1993-05-19 Heidenhain Gmbh Dr Johannes Verfahren zum interpolieren von positionsmesssignalen.
JPH08201110A (ja) * 1995-01-30 1996-08-09 Sony Magnescale Inc 内挿装置
DE102005043569A1 (de) * 2005-09-12 2007-03-22 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US7619207B2 (en) 2006-11-08 2009-11-17 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4462083A (en) * 1980-06-30 1984-07-24 Dr. Johannes Heidenhain Gmbh Method of interval interpolation
US8064974B2 (en) * 2000-08-31 2011-11-22 Tyco Healthcare Group Lp Method and circuit for storing and providing historical physiological data
EP1403625A1 (de) * 2002-09-25 2004-03-31 Siemens Aktiengesellschaft Kalibriergenerator mit Speicher ( Schwingungsmessung )
CN1894557A (zh) * 2003-12-16 2007-01-10 特里伯耶拿有限公司 探测仪器的校准
CN1947062A (zh) * 2004-02-23 2007-04-11 Asml荷兰有限公司 基于散射测量数据确定工艺参数值的方法
CN103365246A (zh) * 2012-04-05 2013-10-23 菲迪亚股份公司 用于数控机床的误差校正的装置
CN103591913A (zh) * 2013-11-18 2014-02-19 沈阳黎明航空发动机(集团)有限责任公司 一种五坐标测量机综合误差校准方法

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Publication number Publication date
JP6487302B2 (ja) 2019-03-20
EP3001151A1 (de) 2016-03-30
US10060772B2 (en) 2018-08-28
CN105444708A (zh) 2016-03-30
JP2016070930A (ja) 2016-05-09
US20160084685A1 (en) 2016-03-24
EP3001151B1 (de) 2017-06-14
DE102014219188A1 (de) 2016-03-24

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