CN105425096A - Display device and test method - Google Patents
Display device and test method Download PDFInfo
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- CN105425096A CN105425096A CN201510944817.9A CN201510944817A CN105425096A CN 105425096 A CN105425096 A CN 105425096A CN 201510944817 A CN201510944817 A CN 201510944817A CN 105425096 A CN105425096 A CN 105425096A
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- pin position
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- link block
- detection signal
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Abstract
The invention discloses a display device, comprising a display panel, at least a connecting module and a control module. The connecting module is coupled to the display panel and comprises a plurality of pins, the pins comprise input pins and output pins, and the input pins are electrically coupled to the output pins. The control module is used for receiving detection signals and input voltage. When the control module receives detection signals, the control module is used for transmitting the detection signals to the input pins; and when the control module receives detection signals returned by the output pins, the control module provides input voltage to a power wafer according to the returned detection signals.
Description
Technical field
The present invention has about a kind of display technique, and relates to a kind of display device and method of testing especially.
Background technology
When manufacturing display device, once complete thin membrane flip chip encapsulation (ChiponFilm, COF) processing procedure, then need to test the function of display device.In time testing, need control panel to be connected with web joint by winding displacement, and after winding displacement is connected with web joint, judge that whether the situation that couples of winding displacement and web joint is normal by the mode of manual confirmation.
If artificial judgment mistake, then winding displacement and the abnormal of web joint couple situation, and the oblique cutting situation of the pin position of such as winding displacement and web joint, can be present in display device.So, in time testing, by the pin position (pin) causing voltage to be supplied to dislocation, cause damage of product, and great amount of cost need be spent to keep in repair.
As can be seen here, obviously still there is inconvenience and defect, and have much room for improvement in above-mentioned existing mode.In order to solve the problem, association area there's no one who doesn't or isn't seeks solution painstakingly, but does not develop suitable solution yet for a long time.
Summary of the invention
Summary of the invention aims to provide the simplification summary of this disclosure, possesses basic understanding to make reader to this disclosure.This summary of the invention is not the complete overview of this disclosure, and its purpose is not being pointed out the key/critical element of the embodiment of the present invention or defining scope of the present invention.
One of content of the present invention object is providing a kind of display device and method of testing, uses the problem improving prior art.
For reaching above-mentioned purpose, a technology aspect of content of the present invention is about a kind of display device.This display device comprises display panel, at least one link block and control module.Link block is coupled to display panel, and link block comprises multiple pin position, and above-mentioned pin position comprises input pin position and output pin position, and input pin position is electrically coupled to output pin position.Control module is in order to receive detection signal and input voltage.When control module receives detection signal, then control module is in order to be sent to input pin position by detection signal.When control module receives the detection signal of output pin position passback, then control module gives power wafers according to this passback detection signal to provide input voltage.
For reaching above-mentioned purpose, a technology aspect again of content of the present invention is about a kind of method of testing.This method of testing couples situation in order to the link block of test display apparatus and winding displacement group.Method of testing comprises and connects winding displacement group and link block; There is provided detection signal to control module, control module couples winding displacement group; Detection signal is sent to link block by winding displacement group; And when control module by winding displacement group receive link block passback detection signal become enable signal, then control module gives power wafers according to enable signal to provide input voltage.
Therefore, according to technology contents of the present invention, the embodiment of the present invention is by providing a kind of display device and method of testing, use and improve when the function of display device is tested, due to abnormal between winding displacement and web joint couple (the pin position oblique cutting of such as winding displacement and web joint) cause voltage be supplied to mistake pin position (pin), cause the problem of damage of product.
After consulting following description, persond having ordinary knowledge in the technical field of the present invention when essence spirit of the present invention and other goals of the invention can be understood easily, and the technology used in the present invention means with implement aspect.
Accompanying drawing explanation
For above and other object of the present invention, feature, advantage and embodiment can be become apparent, being described as follows of institute's accompanying drawings:
Fig. 1 is the schematic diagram illustrating a kind of display device according to embodiments of the invention.
Fig. 2 A is the detailed circuit schematic illustrating a kind of link block as shown in Figure 1 and winding displacement group according to embodiments of the invention.
Fig. 2 B is the detailed circuit schematic illustrating a kind of link block as shown in Figure 1 and winding displacement group according to further embodiment of this invention.
Fig. 3 is the detailed circuit schematic illustrating a kind of enable circuit as shown in Figure 1 according to embodiments of the invention.
Fig. 4 is the detailed circuit schematic illustrating a kind of testing circuit as shown in Figure 1 according to embodiments of the invention.
Fig. 5 is the detailed circuit schematic illustrating a kind of testing circuit as shown in Figure 1 according to embodiments of the invention.
Fig. 6 is the detailed circuit schematic illustrating a kind of protection circuit as shown in Figure 1 according to embodiments of the invention.
According to usual operating type, in figure, various feature and element are not drawn to scale, and its drafting mode is to present specific features related to the present invention and element in optimal manner.In addition, graphic of difference, similar elements/components is censured with same or analogous component symbol.
Wherein, Reference numeral:
100: display device 140: control module
110: display panel 141: input end
120: link block 142: enable circuit
122: the first link blocks 143: power wafers
124: the second link block 144: the first testing circuits
130: winding displacement group 145: detection module
132: the first winding displacement 146: the second testing circuits
134: the second winding displacements 148: protection circuit
Embodiment
In order to make describing of this disclosure more detailed and complete, hereafter have been directed to enforcement aspect of the present invention and specific embodiment proposes illustrative description; But this not implements or uses the unique forms of the specific embodiment of the invention.Cover in embodiment multiple specific embodiment feature and in order to construction and these specific embodiments of operation method step with its sequentially.But, other specific embodiments also can be utilized to reach identical or impartial function and sequence of steps.
Unless this instructions separately has definition, the implication of science and technology vocabulary used herein and persond having ordinary knowledge in the technical field of the present invention understand with usual meaning identical.In addition, when getting along well context conflict, this instructions singular noun used contains the complex number type of this noun; And during plural noun used, also contain the odd number type of this noun.
In addition, about " coupling " used herein, can refer to two or multiple element mutually directly make entity or in electrical contact, or mutually indirectly put into effect body or in electrical contact, also can refer to two or multiple element mutual operation or action.
Fig. 1 is the schematic diagram illustrating a kind of display device according to embodiments of the invention.As shown in the figure, display device 100 comprises display panel 110, link block 120, winding displacement group 130 and control module 140.Control module 140 couples situation in order to what test above-mentioned link block 120 and winding displacement group 130.This control module 140 is coupled to link block 120 by winding displacement group 130.Control module 140 is in order to receive detection signal DE and input voltage vin.If control module 140 receives detection signal DE, and detection signal DE is sent to link block 120 by winding displacement group 130, and control module 140 receives the detection signal DE of link block 120 passback by winding displacement group 130, then represent that link block 120 is normal with the situation that couples of winding displacement group 130, such as, between link block 120 and winding displacement group 130, there is no the out-of-alignment situation of pin position (pin) oblique cutting or pin position.Now, control module 140 to produce enable signal EN, and gives power wafers 143 according to enable signal EN to provide input voltage vin according to the detection signal DE of passback.In an embodiment, above-mentioned power wafers 143 in order to power supply to the inner member of display device 100, to perform follow-up test flow process.
Thus, the mechanism due to the display device 100 of the embodiment of the present invention can judge that whether link block 120 is normal with the situation that couples of winding displacement group 130, if link block 120 normally just can perform subsequent operation with the situation that couples of winding displacement group 130.Therefore, can improve when the function of display device is tested, due to abnormal between winding displacement and web joint couple (the pin position oblique cutting of such as winding displacement and web joint or dislocation) cause voltage to be supplied to the pin position of mistake, cause the problem of damage of product.
In an embodiment, control module 140 comprises input end 141 and enable circuit 142.Enable circuit 142 is coupled to power wafers 143, and in order to receive input voltage vin by input end 141.Enable circuit 142, after receiving input voltage vin, does not provide input voltage vin to power wafers 143 immediately, until after enable circuit 142 receives enable signal EN, enable circuit 142 just provides input voltage vin to power wafers 143.
In embodiment, control module 140 more comprises detection module 145, this detection module 145 in order to receive and send and according to link block 120 return detection signal DE, with output enable signal EN.In another embodiment, control module 140 more comprises protection circuit 148, this protection circuit 148 in order to receive detection signal DE and guard signal EP, and according to guard signal EP with output enable signal EN.When protection circuit 148 receives detection signal DE, then protection circuit 148 stops output enable signal EN in order to transmit detection signal DE to link block 120.It should be noted that; if control module 140 receives guard signal EP; then control module 140 can according to guard signal EP to carry out the monomer test of control module 140 itself; if so control module 140 receives detection signal DE; then represent to test link block 120 and winding displacement group 130 couple situation; now protection circuit 148 can stop output enable signal EN to enable circuit 142, and the enable signal EN that control module 140 is recovered to be produced according to detection module 145 by enable circuit 142 is to provide input voltage vin to the mechanism of power wafers 143.
Fig. 2 A is the detailed circuit schematic illustrating a kind of link block as shown in Figure 1 and winding displacement group according to embodiments of the invention.As shown in the figure, link block 120 comprises multiple pin position Pin11 ~ Pin1N, pin position Pin11 and pin position Pin1N are configured at the relative both sides (as left side and right side) of link block 120 respectively, but do not limit, and pin position Pin11 can be but is not limited to directly be electrically coupled to pin position Pin1N.Comparatively speaking, winding displacement group 130 comprises multiple pin position Pin21 ~ Pin2N, and pin position Pin21 and pin position Pin2N are configured at the relative both sides (as left side and right side) of winding displacement group 130 respectively, but do not limit.If control module 140 receives detection signal DE, then detection signal DE is sent to the pin position Pin11 of link block 120 by control module 140 by the pin position Pin21 of winding displacement group 130.If the detection signal DE that the pin position Pin1N that control module 140 receives link block 120 by the pin position Pin2N of winding displacement group 130 returns, then represent link block 120 and winding displacement group 130 to couple situation normal, such as, there is no oblique cutting situation between the pin position of link block 120 and winding displacement group 130, therefore, the detection signal DE that the pin position Pin21 that the pin position Pin11 of link block 120 can receive winding displacement group 130 sends, and the state of pin position Pin1N is electrically coupled to based on the pin position Pin11 of link block 120, detection signal DE is made to be passed to pin position Pin1N by the pin position Pin11 of link block 120, accordingly, the detection signal DE that the pin position Pin1N that control module 140 is able to receive link block 120 by the pin position Pin2N of winding displacement group 130 returns.Now, control module 140 to produce enable signal EN, and gives power wafers 143 according to enable signal EN to provide input voltage vin according to detection signal DE.
Fig. 2 B is the detailed circuit schematic illustrating a kind of link block as shown in Figure 1 and winding displacement group according to further embodiment of this invention.As shown in the figure, in the present embodiment, link block 120 can comprise the first link block 122 and the second link block 124.First link block 122 is coupled to display panel 110, and the first link block 122 comprises multiple pin position Pin11 ~ Pin1N, pin position Pin11 is configured at the relative both sides of the first link block 122 respectively with pin position Pin1N, but do not limit, in addition, the pin position Pin11 of the first link block 122 can be but is not limited to directly be electrically coupled to the pin position Pin1N of the first link block 122.Moreover, second link block 124 is coupled to display panel 110, and the second link block 124 comprises multiple pin position Pin31 ~ Pin3N, pin position Pin31 is configured at the relative both sides of the second link block 124 respectively with pin position Pin3N, but do not limit, in addition, the pin position Pin31 of the second link block 124 can be but is not limited to directly be electrically coupled to the pin position Pin3N of the second link block 124.
In one embodiment, winding displacement group 130 comprises the first winding displacement 132 and the second winding displacement 134.First winding displacement 132 comprises multiple pin position Pin21 ~ Pin2N, above-mentioned pin position Pin21 and pin position Pin2N are configured at the relative both sides (as left side and right side) of the first winding displacement 132 respectively, but do not limit, and the pin position Pin21 of the first winding displacement 132 can in order to be coupled to the pin position Pin11 of the first link block 122, and the pin position Pin2N of the first winding displacement 132 can in order to be coupled to the pin position Pin1N of the first link block 122.Moreover, second winding displacement 134 comprises multiple pin position Pin41 ~ Pin4N, pin position Pin41 is configured at the relative both sides of the second winding displacement 134 respectively with pin position Pin4N, but do not limit, and the pin position Pin41 of the second winding displacement 134 can in order to be coupled to the pin position Pin31 of the second link block 124, and the pin position Pin4N of the second winding displacement 134 can in order to be coupled to the pin position Pin3N of the second link block 124.
If control module 140 receives detection signal DE, then detection signal DE is sent to the pin position Pin11 of the first link block 122 by control module 140 by the pin position Pin21 of the first winding displacement 132.If the detection signal DE that the pin position Pin1N that control module 140 receives the first link block 122 by the pin position Pin2N of the first winding displacement 132 returns, then represent the first link block 122 and the first winding displacement 132 to couple situation normal, such as there is no the situation of pin position oblique cutting or dislocation between the first link block 122 and the first winding displacement 132, therefore, the detection signal DE that the pin position Pin21 that the pin position Pin11 of the first link block 122 can receive the first winding displacement 132 sends, and the state of pin position Pin1N is electrically coupled to based on the pin position Pin11 of the first link block 122, detection signal DE is made to be passed to pin position Pin1N by the pin position Pin11 of the first link block 122, accordingly, the detection signal DE that the pin position Pin1N that control module 140 is able to receive the first link block 122 by the pin position Pin2N of the first winding displacement 132 returns, now, control module 140 continues pin position Pin31 detection signal DE being sent to the second link block 124 by the pin position Pin41 of the second winding displacement 134.If the detection signal DE that the pin position Pin3N that control module 140 receives the second link block 124 by the pin position Pin4N of the second winding displacement 134 returns, then represent the second link block 124 and the second winding displacement 134 to couple situation normal, such as there is no the situation of pin position oblique cutting or dislocation between the second link block 124 and the second winding displacement 134, therefore, the detection signal DE that the pin position Pin41 that the pin position Pin31 of the second link block 124 can receive the second winding displacement 134 sends, and the state of pin position Pin3N is electrically coupled to based on the pin position Pin31 of the second link block 124, detection signal DE is made to be passed to pin position Pin3N by the pin position Pin31 of the second link block 124, accordingly, the detection signal DE that the pin position Pin3N that control module 140 is able to receive the second link block 124 by the pin position Pin4N of the second winding displacement 134 returns, now, control module 140 according to detection signal DE to produce enable signal EN, and give power wafers 143 according to enable signal EN to provide input voltage vin.
Fig. 3 is the detailed circuit schematic illustrating a kind of enable circuit 142 as shown in Figure 1 according to embodiments of the invention.As shown in the figure, enable circuit 142 comprises switch T1 and control module T2.The first end S of switch T1 in order to receive input voltage vin, and is coupled to a resistance-capacitance (RC) circuit, and the second end D of switch T1 is coupled to power wafers 143.Control module T2 is coupled to the control end G of switch T1.Control module T2 according to enable signal EN with opening switch T1, in order to do making switch T1 according to input voltage vin to provide output voltage Vout to power wafers 143.In addition, the first end D of control module T2 is coupled to the control end G of switch T1, and the control end G of control module T2 is in order to receive enable signal EN, and the second end S of control module T2 is by resistance R ground connection.
In one embodiment, the detection module 145 shown in Fig. 1 comprises the first testing circuit 144 and the second testing circuit 146, illustrate respectively into Fig. 4 and Fig. 5 and illustrate as after.Fig. 4 is the detailed circuit schematic illustrating a kind of testing circuit as shown in Figure 1 according to embodiments of the invention.As shown in the figure, the first testing circuit 144 in order to receive and the detection signal DE returned according to the pin position Pin3N (referring to Fig. 2 B) of the second link block 124, with output enable signal EN.In one embodiment, the first testing circuit 144 comprises switch T1 and control module T2.The first end S of switch T1 is in order to receive detection signal DE, and the second end D of switch T1 is coupled to enable circuit 142.Control module T2 is coupled to the control end G of switch T1, and the detection signal DE that control module T2 returns according to the pin position Pin3N (referring to Fig. 2 B) of the second link block 124 is with opening switch T1, in order to do making switch T1 output detections signal DE using as enable signal EN.In addition, the first end D of control module T2 is coupled to the control end G of switch T1, and the control end G of control module T2 in order to receive detection signal DE, and is coupled to a resistance-capacitance (RC) circuit, and the second end S of control module T2 is by resistance R ground connection.
Fig. 5 is the detailed circuit schematic illustrating a kind of testing circuit as shown in Figure 1 according to the embodiment of the present invention.As shown in the figure, the detection signal DE that second testing circuit 146 returns in order to the pin position Pin1N (referring to Fig. 2 B) receiving the first link block 122, and the pin position Pin31 (referring to Fig. 2 B) transmitting detection signal DE to the second link block 124.In one embodiment, the second testing circuit 146 comprises switch T1 and control module T2.The detection signal DE that the first end S of switch T1 returns in order to the pin position Pin1N (referring to Fig. 2 B) receiving the first link block 122, the second end D of switch T1 is coupled to the pin position Pin31 (referring to Fig. 2 B) of the second link block 124.Control module T2 is coupled to the control end G of switch T1, and the detection signal DE that control module T2 returns according to the pin position Pin1N (referring to Fig. 2 B) of the first link block 122 is with opening switch T1, in order to do the pin position Pin31 (referring to Fig. 2 B) making switch T1 output detections signal DE to the second link block 124.In addition, the first end D of control module T2 is coupled to the control end G of switch T1, and the control end G of control module T2 in order to receive detection signal DE, and is coupled to a resistance-capacitance (RC) circuit, and the second end S of control module T2 is by resistance R ground connection.
Fig. 6 is the detailed circuit schematic illustrating a kind of protection circuit as shown in Figure 1 according to the embodiment of the present invention.As shown in the figure, protection circuit 148 comprises switch T1 and control module T2.The first end S of switch T1 is in order to receive guard signal EP, and the second end D of switch T1 is coupled to enable circuit 142.Control module T2 is coupled to the control end G of switch T1, and control module T2 according to guard signal EP with opening switch T1, in order to do making switch T1 output protection signal EP to become enable signal EN.If the control end G of switch T1 receives detection signal DE, then switch T1 closes to stop output enable signal EN according to detection signal DE.In addition, the first end D of control module T2 is coupled to the control end G of switch T1, and the control end G of control module T2 is in order to receive guard signal EP, and the second end S of control module T2 is by resistance R ground connection.
In one embodiment, the embodiment of the present invention proposes a kind of method of testing, and this method of testing couples situation in order to the link block of test display apparatus and winding displacement group, and method of testing comprises: connect winding displacement group and link block; There is provided a detection signal to control module; Detection signal is sent to link block by winding displacement group; And when control module by winding displacement group receive link block passback detection signal become enable signal, then control module gives power wafers according to enable signal to provide input voltage.
Being convenient to for making method of testing understand, seeing also Fig. 1 and Fig. 2 A.First, winding displacement group 130 and link block 120; There is provided a detection signal DE to control module; By control module 140, detection signal DE is sent to the pin position Pin11 (referring to Fig. 2 A) of link block 120 by winding displacement group 130; And the detection signal DE to be returned by the pin position Pin1N (referring to Fig. 2 A) that winding displacement group 130 receives link block 120 when control module 140 becomes enable signal EN, then control module 140 gives power wafers 143 according to enable signal EN to provide input voltage vin.
In another embodiment, see also Fig. 1, method of testing more comprises: control module 140 is after receiving input voltage vin, input voltage vin is not provided to give power wafers 143 immediately, until after control module 140 receives enable signal EN, enable circuit 142 provides input voltage vin to give power wafers 143.
In an embodiment again, refer to Fig. 2 B, link block 120 comprises the first link block 122 and the second link block 124.First link block 122 comprises multiple pin position Pin11 ~ Pin1N, pin position Pin11 is configured at the relative both sides of the first link block 122 respectively with pin position Pin1N, but do not limit, and the pin position Pin11 of the first link block 122 can be but is not limited to directly be electrically coupled to the pin position Pin1N of the first link block 122.Second link block 124 comprises multiple pin position Pin31 ~ Pin3N, pin position Pin31 is configured at the relative both sides of the second link block 124 respectively with pin position Pin3N, but do not limit, and the pin position Pin31 of the second link block 124 can be but is not limited to directly be electrically coupled to the pin position Pin3N of the second link block 124.Above-mentioned method of testing comprises: when control module 140 receives detection signal DE, then detection signal DE is sent to the pin position Pin11 of the first link block 122 by control module 140 by the first winding displacement 132, as the detection signal DE that control module 140 is returned by the pin position Pin1N that the first winding displacement 132 receives the first link block 122, then detection signal DE is sent to the pin position Pin31 of the second link block 124 by control module 140 again by the second winding displacement 134, the detection signal DE returned by the pin position Pin3N that the second winding displacement 134 receives the second link block 124 when control module 140 is using as enable signal EN, then control module 140 gives power wafers 143 according to enable signal EN to provide input voltage vin.
From the invention described above embodiment, application the present invention has following advantages.The embodiment of the present invention is by providing a kind of display device method of testing, use and improve when the function of display device is tested, due to abnormal between winding displacement and link block couple (the pin position oblique cutting of such as winding displacement and link block) cause voltage be supplied to mistake pin position, cause the problem of damage of product.
Although disclose specific embodiments of the invention in embodiment above; so itself and be not used to limit the present invention; persond having ordinary knowledge in the technical field of the present invention; not departing from principle of the present invention and spirit when; when carrying out various change and modification to it, therefore protection scope of the present invention is when being as the criterion with the subsidiary claim person of defining.
Claims (14)
1. a display device, is characterized in that, comprises:
One display panel;
At least one link block, is coupled to this display panel, and wherein this link block comprises multiple pin position, and those pin positions comprise an input pin position and an output pin position, and this input pin position is electrically coupled to this output pin position; And
One control module, in order to receive a detection signal and an input voltage, wherein when this control module receives this detection signal, then this control module is in order to be sent to this input pin position by this detection signal, and when this control module receives this detection signal of this output pin position passback, then this control module gives a power wafers according to this passback detection signal to provide this input voltage.
2. display device according to claim 1, is characterized in that, separately comprises at least one winding displacement group, in order to be coupled between this at least one link block and this control module.
3. display device according to claim 2, is characterized in that, this control module comprises:
One enable circuit, in order to receive this input voltage, wherein this enable circuit gives this power wafers according to an enable signal to provide this input voltage.
4. display device according to claim 3, is characterized in that, this enable circuit comprises:
One switch, its first end is in order to receive this input voltage, and its second end is coupled to this power wafers; And
One control module, is coupled to this switch, and wherein this control module is according to this enable signal to open this switch, gives this power wafers in order to do making this switch according to this input voltage to provide this output voltage.
5. display device according to claim 3, is characterized in that, this control module more comprises:
One first testing circuit, in order to receive and this detection signal returned according to this output pin position of this link block, becomes this enable signal to export this detection signal.
6. display device according to claim 5, is characterized in that, this first testing circuit comprises:
One switch, its first end is in order to receive this detection signal, and its second end is coupled to this enable circuit; And
One control module, is coupled to this switch, and wherein this detection signal of returning according to this output pin position of this control module is to open this switch, exports this detection signal to become this enable signal in order to do making this switch.
7. display device according to claim 5, is characterized in that, this at least one link block comprises:
One first link block, is coupled to this display panel, has this input pin position and this output pin position; And
One second link block, is coupled to this display panel, and wherein this second web joint comprises multiple pin position, and those pin positions comprise one second input pin position and one second output pin position, and this second input pin position connects and is electrically coupled to this second output pin position.
8. display device according to claim 7, is characterized in that, this control module more comprises:
One protection circuit; in order to receive this detection signal and a guard signal; and according to this guard signal to export this enable signal, wherein when this protection circuit receives this detection signal, then this protection circuit also stops exporting this enable signal to this second input pin position in order to transmit this detection signal.
9. display device according to claim 8, is characterized in that, this protection circuit comprises:
One switch, its first end is in order to receive this guard signal, and its second end is coupled to this enable circuit; And
One control module; be coupled to this switch, wherein this control module is according to this guard signal to open this switch, exports this this guard signal to become this enable signal in order to do making this switch; if wherein this switch receives this detection signal, then this switch cuts out according to this detection signal.
10. display device according to claim 8, is characterized in that, this control module more comprises:
One second testing circuit, in order to receive this detection signal of this second output pin position passback of this second link block, and transmits this detection signal this input pin position to this first link block.
11. display device according to claim 10, is characterized in that, this second testing circuit comprises:
One switch, its first end is in order to receive this detection signal of this second output pin position passback, and its second end is coupled to this input pin position of this first link block; And
One control module, is coupled to this switch, and wherein this detection signal of returning according to this second output pin position of this control module is to open this switch, exports this detection signal this input pin position to this first link block in order to do making this switch.
12. display device according to claim 7, is characterized in that, this at least one winding displacement group comprises:
One first winding displacement, comprise multiple pin position, those pin positions comprise one first input pin position and one first output pin position, wherein this first input pin position of this first winding displacement is in order to be coupled to this input pin position of this first link block, and this first output pin position of this first winding displacement is in order to be coupled to this output pin position of this first link block; And
One second winding displacement, comprise multiple pin position, those pin positions comprise one second input pin position and one second output pin position, wherein this second input pin position of this second winding displacement is in order to be coupled to this second input pin position of this second link block, and this second output pin position of this second winding displacement is in order to be coupled to this second output pin position of this second link block.
13. 1 kinds of method of testings, is characterized in that, couple situation in order to a link block of test display apparatus and a winding displacement group, and wherein this method of testing comprises:
Connect this winding displacement group and this link block;
There is provided detection signal to control module, this control module couples this winding displacement group;
This detection signal is sent to this link block by this winding displacement group; And
This detection signal receiving the passback of this link block by this winding displacement group when this control module becomes an enable signal, then this control module gives a power wafers according to this enable signal to provide an input voltage.
14. method of testings according to claim 13, is characterized in that, this control module, after receiving this input voltage, gives this power wafers according to this enable signal to provide this input voltage.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510944817.9A CN105425096B (en) | 2015-12-16 | 2015-12-16 | display device and test method |
| TW105102238A TWI569020B (en) | 2015-12-16 | 2016-01-25 | Displaying device and testing method thereof |
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|---|---|---|---|
| CN201510944817.9A CN105425096B (en) | 2015-12-16 | 2015-12-16 | display device and test method |
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| CN105425096B CN105425096B (en) | 2018-05-18 |
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| CN201510944817.9A Expired - Fee Related CN105425096B (en) | 2015-12-16 | 2015-12-16 | display device and test method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108513084A (en) * | 2018-06-29 | 2018-09-07 | 青岛海信电器股份有限公司 | A kind of LCD TV circuit system and LCD TV |
| CN113050317A (en) * | 2021-03-08 | 2021-06-29 | Tcl华星光电技术有限公司 | Panel driving circuit and display device |
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| CN101609635A (en) * | 2009-07-24 | 2009-12-23 | 友达光电（苏州）有限公司 | Liquid crystal panel test module and failure mode analysis method for liquid crystal panel |
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| CN103617772A (en) * | 2013-11-12 | 2014-03-05 | 华映视讯（吴江）有限公司 | Display panel and testing method thereof |
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| CN103559856B (en) * | 2013-10-17 | 2016-03-30 | 友达光电(厦门)有限公司 | The recognition system of the factory source of display panel and display panel and method |
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| CN1917005A (en) * | 2006-09-07 | 2007-02-21 | 友达光电股份有限公司 | Display device and its enable circuit |
| CN101609635A (en) * | 2009-07-24 | 2009-12-23 | 友达光电（苏州）有限公司 | Liquid crystal panel test module and failure mode analysis method for liquid crystal panel |
| CN102269788A (en) * | 2010-06-03 | 2011-12-07 | 英业达股份有限公司 | Host device and plugging state detection method thereof |
| CN102411236A (en) * | 2010-09-26 | 2012-04-11 | 立景光电股份有限公司 | Test method for liquid crystal display panel |
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| CN103617772A (en) * | 2013-11-12 | 2014-03-05 | 华映视讯（吴江）有限公司 | Display panel and testing method thereof |
| CN104460065A (en) * | 2014-11-27 | 2015-03-25 | 友达光电股份有限公司 | Liquid crystal display and test circuit thereof |
| CN105096810A (en) * | 2015-09-23 | 2015-11-25 | 京东方科技集团股份有限公司 | Driving component and display device |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108513084A (en) * | 2018-06-29 | 2018-09-07 | 青岛海信电器股份有限公司 | A kind of LCD TV circuit system and LCD TV |
| CN108513084B (en) * | 2018-06-29 | 2020-12-04 | 海信视像科技股份有限公司 | Liquid crystal display television circuit system and liquid crystal display television |
| CN113050317A (en) * | 2021-03-08 | 2021-06-29 | Tcl华星光电技术有限公司 | Panel driving circuit and display device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105425096B (en) | 2018-05-18 |
| TWI569020B (en) | 2017-02-01 |
| TW201723496A (en) | 2017-07-01 |
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