CN102411236A - Test method for liquid crystal display panel - Google Patents
Test method for liquid crystal display panel Download PDFInfo
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- CN102411236A CN102411236A CN2010102933876A CN201010293387A CN102411236A CN 102411236 A CN102411236 A CN 102411236A CN 2010102933876 A CN2010102933876 A CN 2010102933876A CN 201010293387 A CN201010293387 A CN 201010293387A CN 102411236 A CN102411236 A CN 102411236A
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Abstract
The invention relates to a test method for a liquid crystal display panel. The liquid crystal display panel comprises a plurality of pixels and a test pad, wherein the pixels are arranged at staggered joints of first to third data lines and a plurality of scanning lines. The test method for the liquid crystal display panel comprises the following steps: driving all the scanning lines, so as to conduct liquid crystal capacitances of the pixels to the first to third data lines; respectively providing a first test voltage and a second test voltage to a first data line and a second data line, wherein the first test voltage is different from the second test voltage; floating the first data line; and testing the floated first data line by the test pad, thereby judging if the liquid crystal capacitances of the pixels electrically connected with the first data line and the second data line are in electrical connection.
Description
Technical field
The present invention relates to a kind of method of testing, and be particularly related to a kind of method of testing of display panels.
Background technology
(Liquid Crystal on Silicon panel, LCOS) panel is the liquid crystal panel of a kind of framework on Silicon Wafer (silicon wafer) to liquid crystal on silicon.In addition, the LCOS panel not only possesses the little advantage of volume, also has good resolution, therefore is widely used in all types of liquid crystal projectors.
On overall architecture; The LCOS panel is the thin film transistor (TFT) that replaces conventional liquid crystal with metal oxide semiconductor transistor (MOS transistor); And pixel electrode (pixel electrode) is to be main with metal material, so the LCOS panel is the liquid crystal panel that belongs to a kind of reflection-type.For the liquid crystal panel of reflection-type, high reflectance will help to promote the optical efficiency of panel.Therefore, on practical layout, the spacing of pixel certainly will be more little good more in the LCOS panel, to promote the reflectivity of LCOS panel.
Yet,, will be accompanied by the pixel electrode short risk along with diminishing of distance between the pixel.To this kind situation, manufacturer after the assembling of LCOS panel is accomplished, just finds the unusual of LCOS panel through the picture of lighting often.Thus, not only increase the production time of panel, more increased the weight of the production cost of panel.Therefore, how when Silicon Wafer dispatches from the factory, detecting the pixel electrode problem of short-circuit immediately, has been that LCOS panel institute in test has faced a big problem.
Summary of the invention
The present invention provides a kind of method of testing of display panels, is applicable to the silica-based liquid crystal panel with colored filter, and in order to reduce the production cost of panel.
The present invention provides a kind of method of testing of display panels, is applicable to the silica-based liquid crystal panel that adopts look preface method, and in order to reduce the production time of panel.
The present invention provides a kind of method of testing of display panels, is applicable to the silica-based liquid crystal panel that adopts look preface method, and in order to when Silicon Wafer dispatches from the factory, can detect the problem of liquid crystal capacitance incorrect link.
The present invention proposes a kind of method of testing of display panels; Wherein silica-based liquid crystal panel comprises a plurality of pixels and a testing cushion; These pixels are arranged on the staggered place of first to the 3rd data wiring and plurality of scanning wirings; And the method for testing of said display panels comprises the following steps: to drive each scan wiring, with the liquid crystal capacitance conducting to the first of these pixels to the 3rd data wiring; First test voltage and second test voltage to the first data wiring and second data wiring are provided respectively, and wherein first test voltage is not equal to second test voltage; With the first data wiring suspension joint; And, measure first data wiring of suspension joint through testing cushion, whether the liquid crystal capacitance that is electrically connected to judgement in the pixel of first data wiring and second data wiring is electrical connected.
In one embodiment of this invention, the method for testing of above-mentioned display panels also comprises: provide first test voltage to the three data wirings; With the 3rd data wiring suspension joint; And, measure the 3rd data wiring of suspension joint through testing cushion, whether the liquid crystal capacitance that is electrically connected to judgement in the pixel of the 3rd data wiring and second data wiring is electrical connected.
The present invention proposes the method for testing of another kind of display panels; Wherein silica-based liquid crystal panel comprises a plurality of pixels and a plurality of testing cushion; Each pixel comprises a pre-charging capacitor, an impact damper and a liquid crystal capacitance separately; These pixels electrically connect one scan distribution, and show distribution and many data wirings, and the method for testing of display panels comprises the following steps: the impact damper of each pixel of forbidden energy; The driven sweep distribution with show distribution, with the liquid crystal capacitance of these pixels and pre-charging capacitor conducting to data wiring; Transmit the odd number bar data wiring in first test voltage to these data wirings, and transmit the even number bar data wiring in second test voltage to these data wirings, wherein second test voltage is not equal to first test voltage; With said odd number bar data wiring or said even number bar data wiring suspension joint; And whether odd number bar data wiring or even number bar data wiring through partial test pad measurement suspension joint are electrical connected to judge the liquid crystal capacitance in these pixels.
The present invention proposes the method for testing of another display panels; Wherein silica-based liquid crystal panel comprises a M pixel and a testing cushion; Each pixel comprises a pre-charging capacitor, an impact damper and a liquid crystal capacitance separately; These pixels electrically connect M bar scan wiring, the M bar shows a distribution and a data wiring, and M is not less than 2 integer, and the method for testing of display panels comprises the following steps: the impact damper of each pixel of forbidden energy; Liquid crystal capacitance in j the pixel and pre-charging capacitor are charged to first test voltage, and j is the positive integer less than M; Liquid crystal capacitance and pre-charging capacitor in (j+1) individual pixel are charged to second test voltage, and wherein first test voltage is not equal to second test voltage; During driving (j+1) bar scan wiring and (j+1) bar demonstration distribution, the impact damper in j pixel of activation, and suspension joint data wiring; And, during driving (j+1) bar scan wiring and (j+1) bar demonstration distribution,, whether be electrical connected to judge the liquid crystal capacitance in j pixel and (j+1) individual pixel through the data wiring of testing cushion measurement suspension joint.
Based on above-mentioned, the present invention charges to different test voltages respectively with pixel, and the partial data distribution is switched to floating.By this, whether the measuring voltage that obtains through the data wiring of measuring suspension joint can form wrong connection in order to the liquid crystal capacitance of differentiating in the pixel in response to the short circuit of pixel electrode.In addition, method of testing of the present invention can detect the problem of liquid crystal capacitance incorrect link before panel is still unassembled, therefore can reduce the production time and the production cost of panel.
For letting the above-mentioned feature and advantage of the present invention can be more obviously understandable, hereinafter is special lifts embodiment, and conjunction with figs. elaborates as follows.
Description of drawings
Fig. 1 is the method for testing process flow diagram according to the display panels of one embodiment of the invention.。
Fig. 2 is the structural representation according to the silica-based liquid crystal panel with colored filter of one embodiment of the invention.。
Fig. 3 is the schematic layout pattern in order to the electric pole plate of the liquid crystal capacitance of key diagram 2.
Fig. 4 is the method for testing process flow diagram according to the display panels of another embodiment of the present invention.
Fig. 5 is the structural representation according to the silica-based liquid crystal panel of the employing look preface method of one embodiment of the invention.
Fig. 6 is the structural representation according to the silica-based liquid crystal panel of the employing look preface method of another embodiment of the present invention.
Fig. 7 is the method for testing process flow diagram according to the display panels of another embodiment of the present invention.
[main element symbol description]
S111～S116, S121～S124: in order to each steps flow chart of the embodiment of key diagram 1
200,500: silica-based liquid crystal panel
210,511～512: switch unit
220,521～522: testing cushion
SW21～SW23, SW51～SW52: switch
P21～P26, P51～P54: pixel
DL21～DL23: data wiring
SL21～SL22: scan wiring
CDL: shared distribution
CL21～CL26, CL51～CL54: liquid crystal capacitance
M21～M26, M511～M513, M521～M523, M531～M533, M541～M543: pixel switch
R11, R12, R21, R22, R31, R32, G11, G12, G21, G22, B11, B12, B21, B22: metal electrode
R3, R51, R52: dead resistance
S410～S450: in order to each steps flow chart of the embodiment of key diagram 4
CP51～CP54: pre-charging capacitor
501～504: impact damper
530,540: current path
S710～S750: in order to each steps flow chart of the embodiment of key diagram 7
Embodiment
Fig. 1 is the method for testing process flow diagram according to the display panels of one embodiment of the invention.Wherein, the described method of testing of Fig. 1 is to be example with silica-based liquid crystal panel with colored filter (color filter), and therefore before key diagram 1 embodiment, the structure that below will just have earlier the silica-based liquid crystal panel of colored filter describes.
Fig. 2 is the structural representation according to the silica-based liquid crystal panel with colored filter of one embodiment of the invention.With reference to Fig. 2, silica-based liquid crystal panel 200 comprises a plurality of pixel P21～P26, a plurality of switch SW 21～SW23, a switching unit 210 and a testing cushion 220.The top of pixel P21～P26 is provided with a colored filter (not showing) separately, for example: corresponding respectively red, green and blue three colored filters of pixel P21～P23.In addition, pixel P21～P26 is arranged on the staggered place of first to the 3rd data wiring DL21～DL23 and plurality of scanning wirings SL21～SL22.Switch SW 21～SW23 is electrically connected to first to the 3rd data wiring DL21～DL23, so whether the conducting of switch SW 21～SW23 will determine whether suspension joint (floating) of first to the 3rd data wiring DL21～DL23.Switch unit 210 can be with one of them conducting to the testing cushion 220 of first to the 3rd data wiring DL21～DL23, so that pixel P21～P26 is measured.
In addition, pixel P21～P26 comprises a liquid crystal capacitance and a pixel switch separately.For example, pixel P21 comprises liquid crystal capacitance CL21 and pixel switch M21.On practical layout, the electric pole plate of liquid crystal capacitance CL21～CL26 all is arranged on same circuit layer.For instance, Fig. 3 is the schematic layout pattern in order to the electric pole plate of the liquid crystal capacitance of key diagram 2.With reference to Fig. 3, metal electrode R11, G11, B11 are respectively the electric pole plate of liquid crystal capacitance CL21～CL23, and metal electrode R12, G12, B12 then are respectively the electric pole plate of liquid crystal capacitance CL24～CL26.In addition, along with the reduction of distance between pixel P21～P26, two adjacent metal electrodes may short circuits and are electrical connected.For example, the incorrect link that pixel electrode caused of short circuit possibly form a dead resistance R3 between metal electrode G11 and B11, and then causes metal electrode G11 and B11 to be electrical connected.
In order when Silicon Wafer dispatches from the factory, to detect the pixel electrode problem of short-circuit immediately, just the problem of liquid crystal capacitance incorrect link below will explain how silica-based liquid crystal panel shown in Figure 2 200 is tested with the process flow diagram of Fig. 1.Please at the beginning, shown in step S111, will drive each scan wiring simultaneously with reference to Fig. 1 and Fig. 2.For example, will provide high voltage to scan wiring SL21～SL22 this moment, with the pixel switch M21～M26 among switch on pixel P21～P26.Relatively, the liquid crystal capacitance CL21～CL26 among pixel P21～P26 is with being electrically connected to corresponding data wiring respectively.
Then, shown in step S112, the liquid crystal capacitance of these pixels is charged to a common voltage.For instance, this moment, shared distribution CDL will be in order to transmitting common voltage, and through switch SW 21～SW23 the time or conducting in regular turn, first to the 3rd data wiring DL21～DL23 will simultaneously or receive common voltage in regular turn.By this, the liquid crystal capacitance CL21～CL26 among pixel P21～P26 can be reset to common voltage earlier.Afterwards, shown in step S113 and step S114, one first test voltage to the first data wiring and the 3rd data wiring will be provided, and one second test voltage to the second data wiring is provided, wherein first test voltage is not equal to second test voltage.
For instance; Panel driver this moment (not showing) will be with reference to a test pattern (pattern); For example: FF/00/FF, and export in regular turn first test voltage (for example: 5V), second test voltage (for example: 10V), first test voltage (for example: 5V) to shared distribution CDL.By this; Conducting in regular turn along with switch SW 21～SW23; The liquid crystal capacitance CL21 that is electrically connected to the first data wiring DL21 (for example: 5V) will charge to first test voltage; The liquid crystal capacitance CL22 that is electrically connected to the second data wiring DL22 will charge to second test voltage, and (for example: 10V), and the liquid crystal capacitance CL23 that is electrically connected to the 3rd data wiring DL23 (for example: 5V) will charge to first test voltage.
Moreover, shown in step S115 and step S116,, and pass through first data wiring and the 3rd data wiring that testing cushion is measured suspension joint with first data wiring and the 3rd data wiring suspension joint, whether be electrical connected to judge the liquid crystal capacitance in these pixels by this.For instance, this moment will be not actuating switch SW21 and SW23, the first data wiring DL21 and the 3rd data wiring DL23 are maintained the state of suspension joint.When metal electrode G11 and B11 incorrect link (as shown in Figure 3), liquid crystal capacitance CL22 will be electrically connected to liquid crystal capacitance CL23 through dead resistance R3.And know that the liquid crystal capacitance CL22 that is positioned at second row this moment has the different voltages with different level with the liquid crystal capacitance CL23 that is positioned at the third line, thus liquid crystal capacitance CL22 and CL23 will in response to electric charge share effect and cause its voltage level to change.
Relatively, when switch unit 210 is electrically connected to the 3rd data wiring DL23 of suspension joint with testing cushion 220, can measure a measuring voltage.Through the comparison of the measuring voltage and first test voltage, can differentiate liquid crystal capacitance CL22 that is positioned at second row and the liquid crystal capacitance CL23 that is positioned at the third line and whether be electrical connected.Wherein, when measuring voltage and first test voltage are unequal, then represent the voltage level of liquid crystal capacitance CL22 and CL23 to change, be electrical connected with the liquid crystal capacitance CL23 that is positioned at the third line so decidable is positioned at the liquid crystal capacitance CL22 of second row.Relatively, when measuring voltage equates with first test voltage, then represent the voltage level of liquid crystal capacitance CL22 and CL23 not change, be not electrical connected with the liquid crystal capacitance CL23 that is positioned at the third line so decidable is positioned at the liquid crystal capacitance CL22 of second row.
Similarly, through the switching of switch unit 210, testing cushion 220 can be electrically connected to the first data wiring DL21 of suspension joint, and then measure another measuring voltage.At this moment; Has the different voltages with different level owing to be positioned at the liquid crystal capacitance CL21 of first row with the liquid crystal capacitance CL22 that is positioned at second row; Therefore through the comparison of another measuring voltage and first test voltage, also can differentiate liquid crystal capacitance CL21 that is positioned at first row and the liquid crystal capacitance CL22 that is positioned at second row and whether be electrical connected.Wherein, the liquid crystal capacitance CL21 that is positioned at first row promptly is be electrical connected liquid crystal capacitance to the first data wiring DL21, the corresponding relation of liquid crystal capacitance and data wiring by that analogy.
Further, as shown in Figure 3, based on the arrangement mode of metal electrode, the situation of metal electrode incorrect link comprises: R11 connects G11, G11 connects B11 and R11 connects B11.That is to say that the situation of liquid crystal capacitance incorrect link comprises: the incorrect link of the incorrect link of the liquid crystal capacitance of the incorrect link of the liquid crystal capacitance of first row and second row, second row and the third line and the liquid crystal capacitance of first row and the third line.Wherein, step S111～S116 has detected the incorrect link of incorrect link and second row with the liquid crystal capacitance of the third line of first row and the liquid crystal capacitance of second row.Therefore, below will explain about of the test of first row through step S121～S124 with the incorrect link of the liquid crystal capacitance of the third line.
Please continue with reference to Fig. 1 and Fig. 2, shown in step S121, when carrying out the test of another incorrect link, can the liquid crystal capacitance of these pixels be charged to common voltage again.For instance, shared distribution CDL will transmit common voltage once more this moment, and pass through the switching of switch SW 21～SW23, and the liquid crystal capacitance CL21～CL26 among pixel P21～P26 will be reset to common voltage.Then, shown in step S122, with first test voltage and second test voltage to the, three data wirings and first data wiring are provided respectively.
For instance; Panel driver this moment (not showing) will be with reference to another test pattern; For example: FF/FF/00, and export in regular turn first test voltage (for example: 5V), first test voltage (for example: 5V), with second test voltage (for example: 10V) to shared distribution CDL.By this; Conducting in regular turn along with switch SW 21～SW23; Liquid crystal capacitance CL21, the CL22 that is electrically connected to the first data wiring DL21 and the second data wiring DL22 will charge to first test voltage, and (for example: 5V), and the liquid crystal capacitance CL23 that is electrically connected to the 3rd data wiring DL23 (for example: 10V) will charge to second test voltage.
Moreover, shown in step S123 and step S124,, and pass through first data wiring that testing cushion is measured suspension joint with the first data wiring suspension joint, whether be electrical connected to judge the liquid crystal capacitance that is positioned at first row and the third line by this.For instance, through the switching of switch unit 210, testing cushion 220 can be electrically connected to the first data wiring DL21 of suspension joint, and then measure another measuring voltage.At this moment; Has the different voltages with different level owing to be positioned at the liquid crystal capacitance CL21 of first row with the liquid crystal capacitance CL23 that is positioned at the third line; Therefore through the comparison of the another measuring voltage and first test voltage, can differentiate liquid crystal capacitance CL21 that is positioned at first row and the liquid crystal capacitance CL23 that is positioned at the third line and whether be electrical connected.
Fig. 4 is the method for testing process flow diagram according to the display panels of another embodiment of the present invention.Wherein, the described method of testing of Fig. 4 is to be example with the silica-based liquid crystal panel that adopts look preface method (color sequential), and just the display panel of present embodiment is to utilize light emitting diode (light-emitting diodes) to produce backlight.Therefore, before key diagram 4 embodiment, below will just adopt the structure of the silica-based liquid crystal panel of look preface method to describe earlier.
Fig. 5 is the structural representation according to the silica-based liquid crystal panel of the employing look preface method of one embodiment of the invention.With reference to Fig. 5, silica-based liquid crystal panel 500 comprises a plurality of pixel P51～P54, a plurality of switch SW 51～SW52, a plurality of switch unit 511～512 and a plurality of testing cushion 521～522.Pixel P51～P54 adopts precharge mechanism, so each pixel comprises a pre-charging capacitor, a liquid crystal capacitance, an impact damper and two pixel switches.For instance, pixel P51 comprises pre-charging capacitor CP51, liquid crystal capacitance CL51, impact damper 501 and two pixel switch M512 and M513.In addition, in order to control two pixel switches under the precharge mechanisms respectively, each pixel is electrically connected to one scan distribution, respectively and shows a distribution and a data wiring.For example, pixel P51 is electrically connected to scan wiring SL51, shows distribution PL51 and data wiring DL51.
In addition, in order directly to measure the change in voltage of liquid crystal capacitance when the test pixel, each pixel also comprises the pixel switch between the output terminal that is electrically connected at data wiring and impact damper.For instance, pixel P51 is except comprising two pixel switch M512 and the M513, also comprise another pixel switch M511 that wherein pixel switch M511 is electrically connected between the output terminal of data wiring DL51 and impact damper 501.Moreover for test pixel, an end of each data wiring can be electrically connected to a switch, and its other end can be electrically connected to a testing cushion through a switching unit.For example, the end of data wiring DL51 is electrically connected to switch SW 51, and its other end is electrically connected to testing cushion 521 through switch unit 511.
On practical layout, the electric pole plate of liquid crystal capacitance CL51～CL54 all is arranged on same layout layers, and its electric pole plate presents the arrangement of matrix pattern.Therefore, the combination of liquid crystal capacitance incorrect link for example comprises: the incorrect link of the liquid crystal capacitance in the incorrect link of the liquid crystal capacitance in the adjacent pixels of the left and right sides and the neighbouring pixel.For instance; As shown in Figure 5; The incorrect link that pixel electrode caused of short circuit possibly form a dead resistance R51 between liquid crystal capacitance CL53 and CL54, and then causes two adjacent pixel P53 of the left and right sides and liquid crystal capacitance CL53 among the P54 and the incorrect link of CL54.Fig. 6 is the structural representation according to the silica-based liquid crystal panel of the employing look preface method of another embodiment of the present invention; As shown in Figure 6; The incorrect link that pixel electrode caused of short circuit also possibly form a dead resistance R52 between liquid crystal capacitance CL51 and CL53, and then causes two neighbouring pixel P51 and liquid crystal capacitance CL51 among the P53 and the incorrect link of CL53.
Below please be simultaneously with reference to Fig. 4 and Fig. 5, about the test of the liquid crystal capacitance in the adjacent pixels of the left and right sides.Shown in step S410, in the process of the incorrect link of testing liquid crystal capacitance, the impact damper of each pixel will be by forbidden energy.For instance, the impact damper 501～504 among pixel P51～P54 this moment will can not be activated.In addition, shown in step S420, scan wiring will be driven with the demonstration distribution.For instance, will provide this moment high voltage to scan wiring SL51～SL52 and demonstration distribution PL1～PL52, with each pixel switch among switch on pixel P51～P54.By this, the liquid crystal capacitance CL51～CL54 among pixel P51～P54 and pre-charging capacitor CP51～CP54 are with being electrically connected to corresponding data wiring respectively.
Then; Shown in step S430; Transmit first test voltage odd number bar data wiring in the bar data wiring at the most, and transmit the even number bar data wiring in second test voltage to said many data wirings, wherein second test voltage is not equal to first test voltage.For instance, this moment switch SW 51 with SW52 with conducting, with cause panel driver (not showing) transmit respectively first test voltage (for example: 0V) with second test voltage (for example: 6V) give data wiring DL51 and DL52.By this, the liquid crystal capacitance CL53 that is electrically connected to data wiring DL51 will charge to first test voltage (for example: 0V), and the liquid crystal capacitance CL54 that is electrically connected to data wiring DL52 (for example: 6V) will charge to second test voltage.
Moreover; Shown in step S440 and step S450; With odd number bar data wiring or even number bar data wiring suspension joint, and measure the odd number bar data wiring or the even number bar data wiring of suspension joint, to judge the liquid crystal capacitance incorrect link whether in the adjacent pixels of the left and right sides through the partial test pad.For instance, if data wiring DL51 is maintained at the state of suspension joint, then through the switching of switch unit 511, testing cushion 521 can be electrically connected to the data wiring DL51 of suspension joint through switch unit 511, and then measure a measuring voltage.
And know that the liquid crystal capacitance CL53 that is positioned at first row has the different voltages with different level with the liquid crystal capacitance CL54 that is positioned at second row.Therefore, when forming dead resistance R51, shown in current path 530, will produce electric charge through dead resistance R51 between liquid crystal capacitance CL53 and the CL54 and share, and then cause the voltage level of liquid crystal capacitance CL53 to change when the pixel electrode short circuit.By this, when data wiring DL51 was maintained at the state of suspension joint, through the comparison of the measuring voltage and first test voltage, whether the liquid crystal capacitance that can differentiate in the adjacent pixels of the left and right sides was electrical connected.
Wherein, when measuring voltage and first test voltage were unequal, then the decidable liquid crystal capacitance CL53 that is positioned at first row was electrical connected with the liquid crystal capacitance CL54 that is positioned at second row.Relatively, when measuring voltage equated with first test voltage, then decidable was positioned at the liquid crystal capacitance CL53 of first row and is positioned at the second capable liquid crystal capacitance CL54 and is not electrical connected.Relatively; When data wiring DL52 is maintained at the state of suspension joint; Can obtain measuring voltage through the data wiring DL52 that measures suspension joint, and can be through the comparison of the measuring voltage and second test voltage, whether the liquid crystal capacitance of differentiating in the adjacent pixels of the left and right sides is electrical connected.
Fig. 7 is the method for testing process flow diagram according to the display panels of another embodiment of the present invention.Wherein, the described method of testing of Fig. 7 is to be example with the silica-based liquid crystal panel that adopts look preface method, and in order to test the incorrect link of the liquid crystal capacitance in the neighbouring pixel.Therefore, below please be simultaneously with reference to Fig. 6 and Fig. 7, about the test of the liquid crystal capacitance in the neighbouring pixel, and following will be that example describes with M pixel P51 and the P53 that is electrically connected to data wiring DL51, wherein M equals 2.
Shown in step S710, in the process of the incorrect link of testing liquid crystal capacitance, at the beginning, the impact damper of each pixel will be by forbidden energy.For instance, at the initial stage of test liquid crystal capacitance, the impact damper 501～504 among pixel P51～P54 will can not be activated.In addition, shown in step S720, liquid crystal capacitance in j the pixel and pre-charging capacitor are charged to first test voltage, j is the positive integer less than M.
For instance, be example with the 1st pixel P51, will provide this moment high voltage to scan wiring SL51 and demonstration distribution PL1, with the pixel switch M511～M513 among the switch on pixel P51.In addition, switch SW 51 (for example: 6V) to data wiring DL51 transmits first test voltage with conducting to cause panel driver (not showing).By this; Pixel switch M511～the M513 of conducting can be with from first test voltage of data wiring DL51 (for example: 6V) be sent to liquid crystal capacitance CL51 and pre-charging capacitor CP51, and then cause liquid crystal capacitance CL51 and pre-charging capacitor CP51 (for example: 6V) to charge to first test voltage.In other words, the thin portion flow process of step S720 comprises: drive j bar scan wiring and j bar and show distribution; And, transmit first test voltage to data wiring.
Then, shown in step S730, liquid crystal capacitance and pre-charging capacitor in (j+1) individual pixel are charged to second test voltage, wherein first test voltage is not equal to second test voltage.
For instance, after the 1st pixel P51 charged, will charge to next pixel P53.At this moment, with driven sweep wiring SL 52 and demonstration distribution PL52, remaining scan wiring is not then driven with the demonstration distribution.By this, the pixel switch M531～M533 among the pixel P53 will be switched on.In addition, panel driving can (for example: 0V) to data wiring DL51 transmit second test voltage through the switch SW 51 of conducting.By this, (for example: 0V) will be sent to liquid crystal capacitance CL53 and pre-charging capacitor CP53, and then cause liquid crystal capacitance CL53 and pre-charging capacitor CP53 (for example: 0V) to charge to second test voltage from second test voltage of data wiring DL51.In other words, the thin portion flow process of step S730 comprises: drive (j+1) bar scan wiring and (j+1) bar and show distribution; And, transmit second test voltage to data wiring.
Moreover, shown in step S740, during driving (j+1) bar scan wiring and (j+1) bar demonstration distribution, the impact damper in j pixel of activation, and suspension joint data wiring.For instance, during driven sweep wiring SL 52 and demonstration distribution PL52, the impact damper 501 among the last pixel P51 can be enabled, and passes through the not conducting of switch SW 51, and data wiring DL51 will be switched to floating.That is to say that during driven sweep wiring SL 52 and demonstration distribution PL52, pixel P53 can charge, and will drive the impact damper 501 among the pixel P51 afterwards, and suspension joint data wiring DL51.
In addition, shown in step S750, during driving (j+1) bar scan wiring and (j+1) bar demonstration distribution,, whether be electrical connected to judge the liquid crystal capacitance in j pixel and (j+1) individual pixel through the data wiring of testing cushion measurement suspension joint.For instance, through the switching of switch unit 511, testing cushion 521 can be electrically connected to the data wiring DL51 of suspension joint through switch unit 511, and then measure a measuring voltage.And know that the liquid crystal capacitance CL51 that is positioned at first row has the different voltages with different level with the liquid crystal capacitance CL53 that is positioned at secondary series.Therefore; As shown in Figure 6, when forming dead resistance R52, shown in current path 540 when the pixel electrode short circuit; Driven impact damper 501 will cause liquid crystal capacitance CL51 to share with the electric charge between the CL53 through dead resistance R52, and then cause the voltage level of liquid crystal capacitance CL53 to change.By this, through the comparison of the measuring voltage and second test voltage, whether the liquid crystal capacitance that can differentiate in the neighbouring pixel is electrical connected.
Wherein, when measuring voltage and second test voltage are unequal, then represent the voltage level of liquid crystal capacitance CL53 to change, be electrical connected with the liquid crystal capacitance CL53 that is positioned at secondary series so decidable is positioned at the liquid crystal capacitance CL51 of first row.Relatively, when measuring voltage equates with second test voltage, then represent the voltage level of liquid crystal capacitance CL53 not change, be not electrical connected with the liquid crystal capacitance CL53 that is positioned at secondary series so decidable is positioned at the liquid crystal capacitance CL51 of first row.
In sum, the present invention charges to different test voltages respectively with pixel, and the partial data distribution is switched to floating.By this, whether the measuring voltage that obtains through the data wiring of measuring suspension joint can form wrong connection in order to the liquid crystal capacitance of differentiating in the pixel in response to the short circuit of pixel electrode.In addition, method of testing of the present invention can detect the problem of liquid crystal capacitance incorrect link immediately when Silicon Wafer dispatches from the factory, and therefore can reduce the production time and the production cost of panel.
Though the present invention with embodiment openly as above; Right its is not that those skilled in the art are not breaking away from the spirit and scope of the present invention in order to qualification the present invention; When doing a little change and retouching, so protection scope of the present invention is as the criterion when looking the appended claims person of defining.
Claims (11)
1. the method for testing of a display panels; Wherein this display panels comprises a plurality of pixels and a testing cushion; These pixels are arranged on the staggered place of one first to 1 the 3rd data wiring and plurality of scanning wirings, and the method for testing of this display panels comprises:
Drive each these scan wiring, with the liquid crystal capacitance conducting of these pixels to this first to the 3rd data wiring;
One first test voltage and one second test voltage to this first data wiring and this second data wiring are provided respectively, and wherein this first test voltage is not equal to this second test voltage;
With this first data wiring suspension joint; And
Measure this first data wiring of suspension joint through this testing cushion, whether the liquid crystal capacitance that is electrically connected to judgement in these pixels of this first data wiring and this second data wiring is electrical connected.
2. the method for testing of display panels as claimed in claim 1 also comprises:
Provide this first test voltage to the 3rd data wiring;
With the 3rd data wiring suspension joint; And
Measure the 3rd data wiring of suspension joint through this testing cushion, whether the liquid crystal capacitance that is electrically connected to judgement in these pixels of the 3rd data wiring and this second data wiring is electrical connected.
3. the method for testing of display panels as claimed in claim 1 also comprises:
The liquid crystal capacitance of these pixels is charged to a common voltage.
4. the method for testing of display panels as claimed in claim 3 also comprises:
The liquid crystal capacitance of these pixels is charged to this common voltage again;
Provide this first test voltage and this second test voltage to this first data wiring and the 3rd data wiring respectively;
With this first data wiring suspension joint; And
Measure this first data wiring of suspension joint through this testing cushion, whether the liquid crystal capacitance that is electrically connected to judgement in these pixels of this first data wiring and the 3rd data wiring is electrical connected.
5. the method for testing of display panels as claimed in claim 1; Wherein measure this first data wiring of suspension joint, be electrically connected to the step whether liquid crystal capacitance in these pixels of this first data wiring and this second data wiring be electrical connected with judgement and comprise through this testing cushion:
This testing cushion is electrically connected to this first data wiring of suspension joint, to measure a measuring voltage;
This measuring voltage and this first test voltage are compared, whether equate with this first test voltage to differentiate this measuring voltage;
When this measuring voltage and this first test voltage are unequal, judge that then the liquid crystal capacitance in these pixels that are electrically connected to this first data wiring and this second data wiring is electrical connected; And
When this measuring voltage equates with this first test voltage, judge that then the liquid crystal capacitance in these pixels be electrically connected to this first data wiring and this second data wiring does not electrically link to each other.
6. the method for testing of a display panels; Wherein this display panels comprises a plurality of pixels and a plurality of testing cushion; Each these pixel comprises a pre-charging capacitor, an impact damper and a liquid crystal capacitance separately; These pixels electrically connect one scan distribution, and show distribution and many data wirings, and the method for testing of this display panels comprises:
This impact damper of each these pixel of forbidden energy;
Drive this scan wiring and this demonstration distribution, with these liquid crystal capacitances of these pixels and these pre-charging capacitor conductings to these data wirings;
Transmit the odd number bar data wiring in one first test voltage to these data wirings, and transmit the even number bar data wiring in one second test voltage to these data wirings, wherein this second test voltage is not equal to this first test voltage;
With said odd number bar data wiring or said even number bar data wiring suspension joint; And
Whether said odd number bar data wiring or said even number bar data wiring through these testing cushion measurement suspension joints of part are electrical connected to judge these liquid crystal capacitances in these pixels.
7. the method for testing of display panels as claimed in claim 6; Wherein measure the said odd number bar data wiring or the said even number bar data wiring of suspension joint through these testing cushion of part, the step that whether is electrical connected with these liquid crystal capacitances of judging in these pixels comprises:
These testing cushion of part are electrically connected to said odd number bar data wiring or said even number bar data wiring, to measure a plurality of measuring voltages;
One by one with these measuring voltages and this first test voltage or this second test voltage compares, whether equate with this first test voltage with one of them that differentiate these measuring voltages;
When one of them and this first test voltage of these measuring voltages or this second test voltage were unequal, then these liquid crystal capacitances in these pixels of decision section were electrical connected; And
When these measuring voltages all are equal to this first test voltage or this second test voltage, judge that then these liquid crystal capacitances in these pixels electrically do not link to each other.
8. the method for testing of a display panels; Wherein this display panels comprises a M pixel and a testing cushion; Each these pixel comprises a pre-charging capacitor, an impact damper and a liquid crystal capacitance separately; These pixels electrically connect M bar scan wiring, the M bar shows a distribution and a data wiring, and M is not less than 2 integer, and the method for testing of this display panels comprises:
This impact damper of each these pixel of forbidden energy;
This liquid crystal capacitance in j the pixel and this pre-charging capacitor are charged to one first test voltage, and j is the positive integer less than M;
This liquid crystal capacitance in j+1 the pixel and this pre-charging capacitor are charged to one second test voltage, and wherein this first test voltage is not equal to this second test voltage;
During driving j+1 bar scan wiring and j+1 bar demonstration distribution, this impact damper in j pixel of activation, and this data wiring of suspension joint; And
Drive j+1 bar scan wiring and j+1 bar show distribution during, through this data wiring of this testing cushion measurement suspension joint, whether be electrical connected to judge these liquid crystal capacitances in j pixel and j+1 the pixel.
9. the method for testing of display panels as claimed in claim 8 wherein comprises the step that this liquid crystal capacitance in j the pixel and this pre-charging capacitor charge to this first test voltage:
Drive j bar scan wiring and j bar and show distribution; And
Transmit this first test voltage to this data wiring.
10. the method for testing of display panels as claimed in claim 8 wherein comprises the step that this liquid crystal capacitance in j+1 the pixel and this pre-charging capacitor charge to this second test voltage:
Drive j+1 bar scan wiring and j+1 bar and show distribution; And
Transmit this second test voltage to this data wiring.
11. the method for testing of display panels as claimed in claim 8, wherein through this data wiring of this testing cushion measurement suspension joint, the step that whether is electrical connected with these liquid crystal capacitances of judging in j pixel and the j+1 pixel comprises:
This testing cushion is electrically connected to this data wiring of suspension joint, to measure a measuring voltage;
This measuring voltage and this second test voltage are compared, whether equate with this second test voltage to differentiate this measuring voltage;
When this measuring voltage and this second test voltage are unequal, judge that these liquid crystal capacitances in j pixel and j+1 the pixel are electrical connected; And
When this measuring voltage equates with this second test voltage, judge that j pixel electrically do not link to each other with these liquid crystal capacitances in j+1 the pixel.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010293387.6A CN102411236B (en) | 2010-09-26 | 2010-09-26 | Test method for liquid crystal display panel |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201010293387.6A CN102411236B (en) | 2010-09-26 | 2010-09-26 | Test method for liquid crystal display panel |
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| CN102411236B CN102411236B (en) | 2014-11-05 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105425096A (en) * | 2015-12-16 | 2016-03-23 | 友达光电（苏州）有限公司 | Display device and test method |
| CN107942186A (en) * | 2017-09-07 | 2018-04-20 | 友达光电股份有限公司 | Detection method and display panel |
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| JPH11133370A (en) * | 1997-10-30 | 1999-05-21 | Sharp Corp | Matrix type liquid crystal display device and its short-circuit defect inspecting method |
| CN1881389A (en) * | 2005-06-13 | 2006-12-20 | 索尼株式会社 | Liquid-crystal display device, defective pixel examination method, defective pixel examination program, and storage medium |
| CN101231834A (en) * | 2007-01-26 | 2008-07-30 | 索尼株式会社 | Driver and driving method, and display device |
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| JPH11133370A (en) * | 1997-10-30 | 1999-05-21 | Sharp Corp | Matrix type liquid crystal display device and its short-circuit defect inspecting method |
| CN1881389A (en) * | 2005-06-13 | 2006-12-20 | 索尼株式会社 | Liquid-crystal display device, defective pixel examination method, defective pixel examination program, and storage medium |
| CN101231834A (en) * | 2007-01-26 | 2008-07-30 | 索尼株式会社 | Driver and driving method, and display device |
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| CN105425096A (en) * | 2015-12-16 | 2016-03-23 | 友达光电（苏州）有限公司 | Display device and test method |
| CN105425096B (en) * | 2015-12-16 | 2018-05-18 | 友达光电（苏州）有限公司 | display device and test method |
| CN107942186A (en) * | 2017-09-07 | 2018-04-20 | 友达光电股份有限公司 | Detection method and display panel |
| CN107942186B (en) * | 2017-09-07 | 2020-06-05 | 友达光电股份有限公司 | Detection method and display panel |
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| Publication number | Publication date |
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| CN102411236B (en) | 2014-11-05 |
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