CN105388437A - Method for testing waveform capture rate of digital storage oscilloscope - Google Patents
Method for testing waveform capture rate of digital storage oscilloscope Download PDFInfo
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- CN105388437A CN105388437A CN201510673105.8A CN201510673105A CN105388437A CN 105388437 A CN105388437 A CN 105388437A CN 201510673105 A CN201510673105 A CN 201510673105A CN 105388437 A CN105388437 A CN 105388437A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention relates to the technical field of an oscilloscope, and particularly to a method for testing a waveform capture rate of a digital storage oscilloscope. The method for testing the waveform capture rate of the digital storage oscilloscope according to the invention is used for testing the waveform capture rate of the digital storage oscilloscope by means of an adjustable double-pulse waveform. The method of the invention settles a problem of quantitatively testing the waveform capture rate through an external characteristic and can effectively test the waveform capture rate of the digital storage oscilloscope.
Description
Technical field
The present invention relates to oscillograph technical field, particularly relate to a kind of method of testing of digital storage oscilloscope waveform capture rate.
Background technology
Utilizing digital storage oscilloscope to carry out in waving map research, waveform capture rate is the important indicator weighing its data acquisition performance.Nearly ten years, the waveform capture rate of digital storage oscilloscope is greatly improved.If the oscillographic waveform capture rate coverage of digital phosphor series of Imtech of the U.S. is from 3600wfms/s to 300000wfms/s; The waveform capture rate of the Infiniium90000A series high-performance digital storage oscilloscope of Agilent company is up to 400000wfms/s.External Ge great instrument supplier all using waveform capture rate as one of most important index of high-end oscillograph product.Although oscillographic supplier gives the waveform capture rate of respective product, this index can only be determined by testing or calculating by designer usually.And at present relevant by this finger calibration method of external characteristics quantitative test and document less.For this problem, herein by describing the relation of waveform capture rate with " Dead Time ", utilizing theory of random processes to catch the accidental signal of transient state to oscillograph and analyzing, propose a kind of measuring and calculation method of waveform capture rate and carried out testing authentication.
Summary of the invention
The present invention devises a kind of method of testing of digital storage oscilloscope waveform capture rate, and the method preferentially can record the waveform capture rate of digital storage oscilloscope.
To achieve these goals, the present invention adopts following technical scheme: a kind of method of testing of digital storage oscilloscope waveform capture rate, comprises the steps:
(1) two pulse signal W1 and W2 are set, wherein the pulse width of pulse signal W1 is less than the pulse width of pulse signal W2, pulse signal W1 and W2 is combined into a dipulse signal W, in dipulse signal W, pulse signal W1 is front, W2 is rear, and the time interval between the rising edge of W1 and W2 is T0;
(2) tested oscillograph is set for the highest real-time sampling rate and without interpolation gear, or to arrange tested oscillograph be the highest given in product index waveform capture rate state; Be adjusted to the amplitude of being convenient to observe, triggering mode is normal, and burst types is edge, and slope is rising edge, display mode infinite persistence;
(3) output of proving installation is first closed before test; Start and gather, enter after wait trigger state until oscillograph, signal W is input in tested oscillograph, observes tested waveform viewing area;
(4) first set less time interval T0, in waveform viewing area, only have a pulse signal W1; Then increase T0 gradually, repeat step (3), until there are two pulse signal W1 and W2 overlaped in tested waveform viewing area, now can determine critical point T0min value, its inverse is exactly tested oscillographic waveform capture rate.
The method of testing of digital storage oscilloscope waveform capture rate of the present invention, adjustable double pulse waveform is utilized to test the method for testing of digital storage oscilloscope waveform capture rate, solve the problem by external characteristics quantitative test waveform capture rate, can effectively measure digital storage oscilloscope waveform capture rate.
Accompanying drawing explanation
Fig. 1 is the relation of waveform capture rate and " Dead Time ";
Fig. 2 is dipulse signal schematic representation;
Fig. 3 is that dipulse signal produces schematic diagram;
Fig. 4 is the dipulse waveform captured.
Embodiment
Below in conjunction with embodiment, technical scheme of the present invention is described in detail.
A method of testing for digital storage oscilloscope waveform capture rate, comprises the steps:
(1) two pulse signal W1 and W2 are set, wherein the pulse width of pulse signal W1 is less than the pulse width of pulse signal W2, pulse signal W1 and W2 is combined into a dipulse signal W, in dipulse signal W, pulse signal W1 is front, W2 is rear, and the time interval between the rising edge of W1 and W2 is T0;
(2) tested oscillograph is set for the highest real-time sampling rate and without interpolation gear, or to arrange tested oscillograph be the highest given in product index waveform capture rate state; Be adjusted to the amplitude of being convenient to observe, triggering mode is normal, and burst types is edge, and slope is rising edge, display mode infinite persistence;
(3) output of proving installation is first closed before test; Start and gather, enter after wait trigger state until oscillograph, signal W is input in tested oscillograph, observes tested waveform viewing area;
(4) first set less time interval T0, in waveform viewing area, only have a pulse signal W1; Then increase T0 gradually, repeat step (3), until there are two pulse signal W1 and W2 overlaped in tested waveform viewing area, now can determine critical point T0min value, its inverse is exactly tested oscillographic waveform capture rate.
Test philosophy of the present invention: oscillographic waveform acquisition is controlled by trigger pip, the time interval between the twice effective triggering in front and back is " Dead Time ", as Fig. 1.
As shown in Figure 2, test signal by one section comparatively burst pulse W1 and a section comparatively broad pulse W2 form, the rising edge of two pulses correspond to trigger position t1 and t2 of waveform, and the time interval T0 between t1 and t2 is adjustable.When T0 is less than oscillographic " Dead Time ", system can only gather display burst pulse W1; When T0 is greater than " Dead Time ", system can gather display burst pulse shape W1, can gather again display broad pulse W2; When T0 is just for can observe the critical point of two pulse form W1 and W2 simultaneously, the time that now T0 is corresponding is oscillographic " Dead Time ".
In order to observe conveniently, the pulse signal that two pulsewidths do not wait is set, clearly can judge that pulse W2 occurs and absent variable critical point, this critical point has just specified and has once gathered the required shortest time, its scope be from first rising edge of a pulse to second rising edge of a pulse, i.e. time interval T 0min.Now, T0min is the shortest time of two effective trigger points, and the shortest time that namely oscillograph Acquire and process is once required, its inverse is unit interval oscillographic maximum waveform capture rate.
The generation device of test signal of the present invention by a narrow-pulse generator, width pulse generator, one or and an impact damper form, see Fig. 3.The input end Datain of pulse producer needs to arrange some parameter values to test signal: the interval T 0 etc. between pulsewidth size, rising edge of a pulse.Clkin is input clock signal, and ENB is enable signal.
When enable effective time, narrow-pulse generator exports the pulse signal of a specified pulse width immediately, simultaneously, width pulse generator starts counting, when counter counts counts to T0 time of specifying, module exports the pulse signal of a specified pulse width, and two paths of signals passes through or door merges the dipulse signal generating rising edge difference T0, the dipulse test waveform namely required for this testing experiment.Export termination impact damper, be used for drive singal.
During test, tested oscillograph is connected with the pulse output end of test module.Oscillograph is set and is the highest real-time sampling rate and without interpolation gear or to arrange oscillograph be the highest given in product index waveform capture rate state.Be adjusted to suitable amplitude, be namely convenient to the amplitude of observing, triggering mode is normal, and burst types is edge, and slope is rising edge, display mode infinite persistence.The output of proving installation is first closed before test.Start and gather, enter after wait trigger state until oscillograph, open the output switch of proving installation, observe tested waveform viewing area.
First, set less time interval T0, in waveform viewing area, only have a burst pulse; Then, conditioning signal generator, increases T0 gradually, re-starts above-mentioned test, until the signal collected as shown in Figure 4, namely has two pulses overlaped in waveform viewing area.Now can determine T0min value during critical point, its inverse is exactly tested oscillographic waveform capture rate.
Claims (1)
1. a method of testing for digital storage oscilloscope waveform capture rate, is characterized in that, comprises the steps:
(1) two pulse signal W1 and W2 are set, wherein the pulse width of pulse signal W1 is less than the pulse width of pulse signal W2, pulse signal W1 and W2 is combined into a dipulse signal W, in dipulse signal W, pulse signal W1 is front, W2 is rear, and the time interval between the rising edge of W1 and W2 is T0;
(2) tested oscillograph is set for the highest real-time sampling rate and without interpolation gear, or to arrange tested oscillograph be the highest given in product index waveform capture rate state; Be adjusted to the amplitude of being convenient to observe, triggering mode is normal, and burst types is edge, and slope is rising edge, display mode infinite persistence;
(3) output of proving installation is first closed before test; Start and gather, enter after wait trigger state until oscillograph, signal W is input in tested oscillograph, observes tested waveform viewing area;
(4) first set less time interval T0, in waveform viewing area, only have a pulse signal W1; Then increase T0 gradually, repeat step (3), until there are two pulse signal W1 and W2 overlaped in tested waveform viewing area, now can determine critical point T0min value, its inverse is exactly tested oscillographic waveform capture rate.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106772185A (en) * | 2017-01-11 | 2017-05-31 | 深圳市鼎阳科技有限公司 | It is a kind of for the sigtnal interval of oscillograph or periodicity detection methods and device |
| CN109085403A (en) * | 2017-06-14 | 2018-12-25 | 北京普源精电科技有限公司 | A kind of method of adjustment and digital oscilloscope of undulating path |
| CN110989767A (en) * | 2018-12-12 | 2020-04-10 | 苏州普源精电科技有限公司 | Interpolation method and device |
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| CN101281224A (en) * | 2008-04-18 | 2008-10-08 | 电子科技大学 | Method for testing digital oscilloscope waveform capturing rate |
| US20140188419A1 (en) * | 2012-10-22 | 2014-07-03 | University Of Electronic Science And Technology Of China | Method for measuring the waveform capture rate of parallel digital storage oscilloscope |
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2015
- 2015-10-13 CN CN201510673105.8A patent/CN105388437A/en active Pending
Patent Citations (2)
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| CN101281224A (en) * | 2008-04-18 | 2008-10-08 | 电子科技大学 | Method for testing digital oscilloscope waveform capturing rate |
| US20140188419A1 (en) * | 2012-10-22 | 2014-07-03 | University Of Electronic Science And Technology Of China | Method for measuring the waveform capture rate of parallel digital storage oscilloscope |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106772185A (en) * | 2017-01-11 | 2017-05-31 | 深圳市鼎阳科技有限公司 | It is a kind of for the sigtnal interval of oscillograph or periodicity detection methods and device |
| CN106772185B (en) * | 2017-01-11 | 2020-03-10 | 深圳市鼎阳科技股份有限公司 | Signal interval or period detection method and device for oscilloscope |
| CN109085403A (en) * | 2017-06-14 | 2018-12-25 | 北京普源精电科技有限公司 | A kind of method of adjustment and digital oscilloscope of undulating path |
| CN109085403B (en) * | 2017-06-14 | 2021-07-30 | 北京普源精电科技有限公司 | Waveform channel adjusting method and digital oscilloscope |
| CN110989767A (en) * | 2018-12-12 | 2020-04-10 | 苏州普源精电科技有限公司 | Interpolation method and device |
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Application publication date: 20160309 |