CN101281224B - Method for testing digital oscilloscope waveform capturing rate - Google Patents
Method for testing digital oscilloscope waveform capturing rate Download PDFInfo
- Publication number
- CN101281224B CN101281224B CN2008100442482A CN200810044248A CN101281224B CN 101281224 B CN101281224 B CN 101281224B CN 2008100442482 A CN2008100442482 A CN 2008100442482A CN 200810044248 A CN200810044248 A CN 200810044248A CN 101281224 B CN101281224 B CN 101281224B
- Authority
- CN
- China
- Prior art keywords
- pulses
- digital oscilloscope
- waveform
- capture rate
- time interval
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Abstract
The invention discloses a test method of digital oscilloscope waveform capture rate, including: 1, inputting a double pulse signal to a digital oscilloscope, wherein, the waveforms of the two pulses are different, and the trigger time interval between them can be continuously adjustable, the time interval between the two pulses can display the two pulses simultaneously; 2, continuously regulating(shortening or increasing) the time interval between the two pulses until the second pulse of the two pulses just clears away or appears, at this point, the inverse number of the time interval between the two pulses is the maximum waveform number that can be captured by the digital oscilloscope, namely the waveform capture rate. The invention adopts the periodic double pulse signal, and continuously regulates (shortens or increases) the time interval between the two pulses of the double pulse signal until the second pulse of the two pulses just clears away or appears, thereby the waveform capture rate (namely the inverse number of the time interval between the two pulses at the critical point) can be obtained, and the waveform capture rate of the digital oscilloscope can be commendably tested or verified.
Description
Technical field
The present invention relates to the method that a kind of digital oscilloscope relevant technologies index is tested, specifically, relate to a kind of method of testing of digital oscilloscope waveform capturing rate.
Background technology
So-called " wave capture rate " just is meant the waveform number of times that digital oscilloscope is caught and shown in the unit interval.
Analog oscilloscope be a kind of in real time, oscillograph intuitively, its wave capture rate is the highest, this is that digital oscilloscope can not be compared.But analog oscilloscope has a very big defective, and the waveform that is exactly gained can not store, and this has caused very big difficulty to analysis waveform.And the bandwidth of analog oscilloscope is very limited, is blank out to the shape information before triggering.These deficiencies analog oscilloscope just lose the reason of position of mainstream.
Digital storage oscilloscope relies on the method for digital sample storage to solve the deficiency of analog oscilloscope in storage, and can analyze Wave data, has pre-triggering and back to trigger the function that accurate Shi Ji etc. are advanced.But the wave capture rate of digital storage oscilloscope usually is to have caught 1 screen waveform but to have lost 1000 amplitude wave shapes far away from analog oscilloscope, and very big defective is arranged in the seizure of details.And general digital storage oscilloscope is because its sampling number is limited and do not have a variation of brightness degree, make a lot of waveform details to show, though some general digital oscilloscope may have two or more luminance levels, but this is the difference on the relative meaning, add the limited display resolution of digital oscilloscope, it does not still reach the display effect of analog oscilloscope.
What the difference of digital three-dimensional oscillograph and general digital storage oscilloscope was that its shows is the three-dimensional information of waveform: time, amplitude, and time dependent amplitude distribution situation.
The digital three-dimensional oscillograph has been gathered the advantage of analog oscilloscope and general digital storage oscilloscope, can store and analysis waveform, and its 3-D view Presentation Function and parallel imaging processing technology have improved the wave capture rate of digital oscilloscope greatly, the three-dimensional imaging function is equivalent to the sunset glow of analog oscilloscope, describes the track of waveform with different Show Colors.
U.S. Imtech product digital fluorescence oscilloscope (DPO) is a kind of digital three-dimensional oscillograph, and when solving dead-time problem, the mode of employing " adopting soon " improves the capture rate of waveform, and method is to use special-purpose ASIC---DPX
TMCarry out parallel processing, thereby liberated CPU, shortened Dead Time.Adopting soon under the pattern, buffer depth is 26bit, and promptly each point can write down up to 64000000 times.But under this mode of operation, maximum sampling rate and memory depth all are restricted, and are lower than oscillographic high target.In addition, also do not allow back convergent-divergent, measurement and waveform computing automatically caught in long wave shape record.
Though the digital three-dimensional oscillograph has reduced oscillographic Dead Time, no matter the dead band has and lacks more, its existence is inevitable for the digital three-dimensional oscillograph.And for the digital three-dimensional oscillograph of emphasizing to catch details, maximum wave capture rate also is an important index, and the height of wave capture rate determines the degree that this oscillograph is caught signal message.
In a word, as shown in Figure 1, no matter digital oscilloscope is digital three-dimensional oscillograph or general digital oscilloscope, at first waveform is gathered, and acquisition time is T
1, afterwards the Wave data of gathering is carried out signal Processing, take CPU time, during this period of time in oscillograph can't signal acquisition, be called the dead band, because Dead Time T
2Existence, digital oscilloscope can't very be caught all signals.
The refresh rate of digital oscilloscope liquid crystal display is generally all below 100Hz, and the wave capture rate is general all high many than this, such as 1000wfms/s.So high wave capture rate, topmost purpose, be with the details of waveform particularly accident store, when being necessary, analyze after waveform accessed.If burr drops in the Dead Time between the sampling, will miss it in the time of collection.Along with the raising of wave capture rate, Dead Time shortens gradually, finds that the chance of burr will increase.
The wave capture rate is important techniques index of digital oscilloscope, and the height of wave capture rate determines the degree that this oscillograph is caught signal message.Therefore, it is very necessary need testing the oscillographic wave capture rate of numeral.
Summary of the invention
The object of the present invention is to provide a kind of method of testing of digital oscilloscope waveform capturing rate, to obtain this digital oscilloscope important techniques index of digital oscilloscope waveform capturing rate.
For achieving the above object, the method for testing of digital oscilloscope waveform capturing rate of the present invention may further comprise the steps:
The dipulse signal of a, input one-period property carries out the digital oscilloscope of capture rate test to needs, constitute the waveform difference of two pulses of this dipulse signal, and between triggered time at interval adjustable continuously, the time interval between the dipulse satisfies and can simultaneously two pulses that constitute this dipulse signal be shown;
B, the continuous triggered time interval of adjusting between two pulses shortening or increase this dipulse signal of described formation, second pulse just disappears or occurs in two pulses that constitute this dipulse signal, the maximum waveform quantity that triggered time between two pulses of this dipulse signal of formation of this moment inverse at interval can be caught for this digital oscilloscope, i.e. wave capture rate.
The present invention is by periodic dipulse signal, and the continuous triggered time interval of adjusting between two pulses shortening or increase this dipulse signal of described formation, just disappear or occur second pulse, it is the triggered time inverse at interval between two pulses at critical place, promptly obtain the wave capture rate, test or verified the wave capture rate of digital oscilloscope well.
Generally, test signal generation device of periodic dipulse signal demand of the present invention, this device is under the given working method and Shi Ji of digital oscilloscope, set the waveform width of this periodic dipulse signal according to time base, so that observation, simultaneously, can also constantly adjust between two pulses shortening or increase this dipulse signal triggered time at interval.In addition, the time interval between the dipulse of this device generation is satisfied test request;
Description of drawings
Fig. 1 is digital oscilloscope waveform acquisition and processing synoptic diagram;
Fig. 2 is a kind of embodiment schematic diagram of the method for testing of wave capture rate of the present invention;
Fig. 3 is the programmable test signal generation device under the embodiment shown in Figure 2;
Fig. 4 is digital oscilloscope wave form varies figure under the embodiment shown in Figure 2.
Embodiment
Below in conjunction with accompanying drawing, the preferred embodiments of the present invention is described.What need point out is that although similar parts appear in the different accompanying drawings, they are endowed similar Reference numeral.In the following description, when perhaps the detailed description of known function that adopts and design can desalinate subject content of the present invention, these were described in here and will be left in the basket.
Fig. 1 is digital oscilloscope waveform acquisition and processing synoptic diagram.Among the figure, digital oscilloscope is at first gathered waveform, and acquisition time is T
1The Wave data of gathering is carried out signal Processing after the digital oscilloscope, mileage word oscillograph can't signal acquisition during this period of time, and Dead Time is T
2
Fig. 2 is a kind of embodiment schematic diagram of the method for testing of wave capture rate of the present invention.In the present embodiment, the periodic dipulse signal of input is W by one section than the narrow/wide degree
1First pulse and one section broad, width be W
2Second pulse form, the rising edge correspondence of two pulses the trigger position t of waveform
1And t
2, t
1And t
2Between time interval T, promptly the triggered time between two pulses is adjustable at interval.
In addition, need to prove, need be with between the dipulse, promptly width is W
1, width is W
2Two pulses form dipulses and next width is W
1, width is W
2Two pulses form time interval between the dipulses and adjust or be set at and satisfy and can simultaneously two pulses be shown.If oscillograph has provided the wave capture rate, then can be set at wave capture rate inverse, i.e. the one screen data more longer time interval of needed shortest time twice of oscillograph collection can guarantee that two pulses normally show successively.If oscillograph does not provide the wave capture rate, then only pre-estimate, adjust then.Simply can be set is a higher value, can guarantee that like this it can not influence the demonstration and the test of two pulses.
Equally, if oscillograph does not provide the wave capture rate, the interval T of the triggered time between two pulses between at interval only pre-estimated, and constantly adjusts then to obtain.
Referring to Fig. 2, the digital oscilloscope collection is once caught, and is the waveform of a period of time before and after the trigger point, mainly by the pre-triggering degree of depth and storage depth decision.Time period between twice collection in front and back is Dead Time T
2
Owing to the triggered time between two pulses is adjustable at interval, constantly shorten interval T, because Dead Time T
2Existence, when will inevitably cause second pulse just to arrive, digital oscilloscope does not also have enough time to handle the data of first pulse that collects, Dead Time T
2Will be with the trigger point of second rising edge of a pulse correspondence, i.e. t
2The triggering of position masks, because the waveform of back satisfies trigger condition never again, so second pulse will can not be caught in.
Can clearly judge second pulse by this visual result occurs and absent variable critical point, when this critical point produces, oscillograph is that the reason owing to the dead band causes second waveform not show, this critical point has indicated just and has finished the once required shortest time of collection so, scope is from the triggered time interval T between first rising edge of a pulse to the second rising edge of a pulse, at this moment, the triggered time interval T is for showing two pulse the shortest needed triggered time interval T
Min
At this moment, the shortest triggered time interval T
MinBe exactly the shortest time of two effective trigger points, just oscillograph is gathered a screen needed shortest time of data, and its inverse promptly is the maximum waveform quantity that the unit interval oscillograph can be caught.Promptly
P
max＝1/T
min
P
MaxCapture rate for digital oscilloscope.
This testing scheme need insert the square-wave signal of a dipulse, and the characteristics of this signal are, pulsewidth is adjustable, and the distance between two rising edge of a pulses is adjustable.In view of the above, this signal can pass through to produce with lower device:
Fig. 3 is the programmable test signal generation device under the embodiment shown in Figure 2.In the present embodiment, as shown in the figure, the test signal generation device is by a narrow-pulse generator G
1, a width pulse generator G
2, one or an OR
1With an impact damper B
1Form.Pulse producer G
1, G
2Input end Datain be need be to test signal, some values that promptly periodic dipulse signal is provided with: two pulsewidth sizes, the interval T between two rising edge of a pulses.Clkin is an input clock signal, and ENB is an enable signal.
When enabling ENB when effective, narrow-pulse generator G
1Export the pulse signal of a specified pulse width immediately, meanwhile, width pulse generator begins counting, when the counter meter arrives the time T of appointment, and width pulse generator G
2The pulse signal of a specified pulse width of output, two paths of signals pass through or door OR
1Generated the dipulse signal of rising edge T interval time after the merging, i.e. the present invention tests needed dipulse signal, and output meets an impact damper B
1, be used for driving this dipulse signal.
Fig. 4 is digital oscilloscope wave form varies figure under the embodiment shown in Figure 2.In the present embodiment, comprising:
1, the probe with the survey digital oscilloscope is connected with the pulse output end of test signal generation device, the measured number oscillograph is adjusted under the highest working method of capture rate and the Shi Ji state, and be adjusted to suitable amplitude, time basic gear according to this moment, regulate two different in width pulses of test signal generation device output, the waveform when making it be fit to this under base gear is observed;
2, the triggering mode of digital oscilloscope is arranged to " normally ", adjusts the triggered time interval T between two rising edge of a pulses, make trigger point t
1With trigger point t
2Can both triggered as normal, on oscillograph, demonstrate the waveform shown in Fig. 4-a;
3, constantly shorten the triggered time interval T, up to the waveform shown in Fig. 4-b just occurring, at this moment, because the dead band is with trigger point t
2Masked, Dead Time one mistake, trigger condition do not satisfy, and therefore second at large receiving can not be revealed;
Triggered time between two pulses of this dipulse signal of formation of this moment is spaced apart the shortest, promptly the shortest triggered time interval T
MinThe maximum waveform quantity that can catch for this digital oscilloscope of inverse.
Promptly
P
max＝1/T
min
P
MaxCapture rate for digital oscilloscope.
Test case
We use Imtech's model as the DPO digital fluorescence oscilloscope of TDS3052B as a test case, the nominal value of its wave capture rate is 3600wfm/s.By estimation, can draw the triggered time interval T between the rising edge of two pulses of test signal, promptly trigger interval is about 278us, and we are arranged on 300us with the time interval between the rising edge of two pulses
It is that rapid triggering (adopting soon) pattern and Gao Shiji state are under the 10ns/div that the measured number oscillograph is adjusted to the highest working method of capture rate, and is adjusted to suitable amplitude, and according to the time base gear of this moment, we are with the width W of first pulse
1Be set at 8ns, the width W of second pulse
2Be set at 16ns.
Yet, do not demonstrate the situation of two pulse aliasings of anticipation on this digital oscilloscope, be the pulse of 8ns and pulsewidth only occurred, illustrate that at this moment second pulse is not triggered.
Triggered time interval T between the rising edge of two pulses of continuous increase, we find that the situation of aliasing has appearred in waveform in T=346us.Two pulses have all been caught by this digital oscilloscope, and the maximum wave capture rate of this digital oscilloscope is P so
Max=1/T
Min=2890wfm/s.
Another test case is that the sampling rate of general source company (Rigol) is 400MSps, and the maximum wave capture rate of its nominal is a digital storage oscilloscope of 1000wfm/s.We the time base be arranged to 20ns/div since the time base expansion, in order to observe waveform better, with first pulse width W
1Be arranged to 16ns, second pulse width W
2Set 32ns for.Through test repeatedly, from two pulses occurring to the critical point that a pulse only occurs, T=1.004ms, its maximum wave capture rate should be P so
Max=1/T
Min=996wfm/s, with nominal value conform to fine.
Although above the illustrative embodiment of the present invention is described; but should be understood that; the invention is not restricted to the scope of embodiment; to those skilled in the art; as long as various variations appended claim limit and the spirit and scope of the present invention determined in; these variations are conspicuous, and all utilize innovation and creation that the present invention conceives all at the row of protection.
Claims (3)
1. the method for testing of a digital oscilloscope waveform capturing rate is characterized in that, may further comprise the steps:
The dipulse signal of a, input one-period property carries out the digital oscilloscope of capture rate test to needs, constitute the waveform difference of two pulses of this dipulse signal, and between triggered time at interval adjustable continuously, the time interval between the dipulse satisfies and can simultaneously two pulses that constitute this dipulse signal be shown;
B, the continuous triggered time interval of adjusting between two pulses shortening or increase this dipulse signal of described formation, second pulse just disappears or occurs in two pulses that constitute this dipulse signal, the maximum waveform quantity that triggered time between two pulses of this dipulse signal of formation of this moment inverse at interval can be caught for this digital oscilloscope, i.e. wave capture rate.
2. method of testing according to claim 1 is characterized in that, described dipulse signal is formed than burst pulse and one section broad pulse by one section.
3. method of testing according to claim 1, it is characterized in that, described digital oscilloscope is adjusted under the highest working method of capture rate and the Shi Ji state, and be adjusted to suitable amplitude, time basic gear according to this moment, import two different in width pulses, the waveform when making two different in width pulses be fit to this under base gear is observed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008100442482A CN101281224B (en) | 2008-04-18 | 2008-04-18 | Method for testing digital oscilloscope waveform capturing rate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008100442482A CN101281224B (en) | 2008-04-18 | 2008-04-18 | Method for testing digital oscilloscope waveform capturing rate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101281224A CN101281224A (en) | 2008-10-08 |
| CN101281224B true CN101281224B (en) | 2011-06-01 |
Family
ID=40013782
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008100442482A Expired - Fee Related CN101281224B (en) | 2008-04-18 | 2008-04-18 | Method for testing digital oscilloscope waveform capturing rate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101281224B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10119997B2 (en) | 2015-06-30 | 2018-11-06 | University Of Electronic Science And Technology Of China | Method for measuring the waveform capture rate of a digital storage oscilloscope based on average dead time measurement |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102539865B (en) * | 2010-12-31 | 2015-05-20 | 北京普源精电科技有限公司 | Method for combining automatically-adjusted storage depth and fixedly-selected storage depth |
| US9886419B2 (en) * | 2012-07-26 | 2018-02-06 | Tektronix, Inc. | System for improving probability of transient event detection |
| CN102890258B (en) * | 2012-10-22 | 2014-06-25 | 电子科技大学 | Method for testing capture rate of parallel-structure digital storage oscilloscope |
| CN103869127B (en) * | 2012-12-12 | 2018-01-16 | 北京普源精电科技有限公司 | A kind of digital oscilloscope with track display function |
| CN105044642B (en) * | 2015-06-30 | 2017-10-31 | 电子科技大学 | Average waveform capture rate method of testing based on random signal |
| CN105388437A (en) * | 2015-10-13 | 2016-03-09 | 江苏绿扬电子仪器集团有限公司 | Method for testing waveform capture rate of digital storage oscilloscope |
| US10365300B2 (en) * | 2016-02-05 | 2019-07-30 | Tektronix, Inc. | Trigger on final occurrence |
| CN106291349B (en) * | 2016-08-17 | 2018-09-25 | 中国电子科技集团公司第四十一研究所 | The test method of microwave components switch response time based on frequency conversion square-wave signal |
| CN108132373B (en) * | 2017-12-20 | 2020-04-28 | 福建利利普光电科技有限公司 | Processing method for oscilloscope knob operation moving effect |
| CN109142835B (en) * | 2018-06-26 | 2020-04-14 | 电子科技大学 | Data acquisition system with waveform multi-frame recording function |
| CN108776249B (en) * | 2018-06-26 | 2020-04-14 | 电子科技大学 | Oscillograph recorder with double capturing functions |
| CN110806501A (en) * | 2019-11-12 | 2020-02-18 | 南京宏泰半导体科技有限公司 | Waveform measuring method |
| CN110836993B (en) * | 2019-11-14 | 2021-01-26 | 电子科技大学 | FPGA-based random equivalent acquisition system |
| CN112636721B (en) * | 2020-12-01 | 2024-03-15 | 西安现代控制技术研究所 | Variable-interval laser narrow pulse combined capturing system and method |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB954890A (en) * | 1960-04-01 | 1964-04-08 | Marconi Instruments Ltd | Improvements in or relating to testing equipment for cathode ray oscilloscopes |
| US3573618A (en) * | 1968-05-27 | 1971-04-06 | William G Dilley | Solid-state characteristic curve tracer attachment for oscilloscopes |
-
2008
- 2008-04-18 CN CN2008100442482A patent/CN101281224B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB954890A (en) * | 1960-04-01 | 1964-04-08 | Marconi Instruments Ltd | Improvements in or relating to testing equipment for cathode ray oscilloscopes |
| US3573618A (en) * | 1968-05-27 | 1971-04-06 | William G Dilley | Solid-state characteristic curve tracer attachment for oscilloscopes |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10119997B2 (en) | 2015-06-30 | 2018-11-06 | University Of Electronic Science And Technology Of China | Method for measuring the waveform capture rate of a digital storage oscilloscope based on average dead time measurement |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101281224A (en) | 2008-10-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101281224B (en) | Method for testing digital oscilloscope waveform capturing rate | |
| CN102890258B (en) | Method for testing capture rate of parallel-structure digital storage oscilloscope | |
| EP2343557B1 (en) | Dynamic oscilloscope triggering | |
| EP1287370A2 (en) | Ate timing measurement unit and method | |
| CN108776249B (en) | Oscillograph recorder with double capturing functions | |
| US20150066409A1 (en) | Real-time Oscilloscope For Generating a Fast Real-time Eye Diagram | |
| US8731857B2 (en) | Method and apparatus for generating a gated density bitmap | |
| CN108387838A (en) | The method of chip detecting method, device, chip and design chips | |
| CN105510664A (en) | Automatic setting method of digital oscilloscope | |
| CN102331524A (en) | Density trace measurement and triggering in frequency domain bitmaps | |
| CN101261300A (en) | Method for measuring digital storage oscillographs storage depth | |
| CN103809002A (en) | Control method for automatic setting of digital fluorescence oscilloscope | |
| CN105388437A (en) | Method for testing waveform capture rate of digital storage oscilloscope | |
| CN101666819B (en) | Digital oscilloscope signal equivalent sampling method | |
| US10119997B2 (en) | Method for measuring the waveform capture rate of a digital storage oscilloscope based on average dead time measurement | |
| CN105629062B (en) | A kind of frequency detecting method of variable frequency sine-wave | |
| Bodoh et al. | Improving the DLS Workflow | |
| CN103790099B (en) | Adopt the control circuit of sound effect and examination of explore ground radar pavement disease and there is the checkout gear of this control circuit | |
| CN105044642B (en) | Average waveform capture rate method of testing based on random signal | |
| CN108663306A (en) | A kind of flow cytometry device and compensation method | |
| CN111707922B (en) | System and method for testing pulse-triggered deep energy level transient spectrum | |
| CN103592487A (en) | Peak detection device for meeting glitch capturing requirement of oscilloscope | |
| CN101308174A (en) | Wavelet transform signal frequency spectrum measuring analytical method adopting variable band-width parameter | |
| CN103323638A (en) | Multifunctional digital scope meter | |
| Kazazi et al. | Simultaneous recording of cn tower lightning current and channel luminosity |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110601 Termination date: 20140418 |