CN105304548A - 晶圆夹盘 - Google Patents
晶圆夹盘 Download PDFInfo
- Publication number
- CN105304548A CN105304548A CN201510668908.4A CN201510668908A CN105304548A CN 105304548 A CN105304548 A CN 105304548A CN 201510668908 A CN201510668908 A CN 201510668908A CN 105304548 A CN105304548 A CN 105304548A
- Authority
- CN
- China
- Prior art keywords
- chuck
- wafer
- wafer chuck
- clamping hole
- chuck seat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
Abstract
本发明涉及夹盘技术领域,尤其是一种晶圆夹盘,包括夹盘座,所述夹盘座中间设有圆形夹孔,夹孔周边套由橡胶套,所述夹盘座底部设有防震垫脚,侧面设有可伸缩的工件台。本发明可对晶圆进行固定方便测量,并且提供稳定支撑,确保数据准确。
Description
技术领域
本发明涉及夹盘技术领域,尤其是一种晶圆夹盘。
背景技术
现有的晶圆都是拿在手上进行测量,操作时不方便。
发明内容
为了克服现有的技术的不足,本发明提供了一种晶圆夹盘。
本发明解决其技术问题所采用的技术方案是:一种晶圆夹盘,包括夹盘座,所述夹盘座中间设有圆形夹孔,夹孔周边套由橡胶套,所述夹盘座底部设有防震垫脚,侧面设有可伸缩的工件台。
本发明的有益效果是,本发明可对晶圆进行固定方便测量,并且提供稳定支撑,确保数据准确。
附图说明
下面结合附图和实施例对本发明进一步说明。
图1是本发明的主视图。
图2是本发明的侧视图。
图中1、夹盘座,2、夹孔,3、橡胶套,4、防震脚垫,5、工件台。
具体实施方式
如图1-2是本发明的结构示意图,一种晶圆夹盘,包括夹盘座1,所述夹盘座1中间设有圆形夹孔2,夹孔2周边套由橡胶套3,所述夹盘座1底部设有防震垫脚4,侧面设有可伸缩的工件台5。本发明可对晶圆进行固定方便测量,并且提供稳定支撑,确保数据准确。
Claims (1)
1.一种晶圆夹盘,包括夹盘座(1),其特征是,所述夹盘座(1)中间设有圆形夹孔(2),夹孔(2)周边套由橡胶套(3),所述夹盘座(1)底部设有防震垫脚(4),侧面设有可伸缩的工件台(5)。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510668908.4A CN105304548A (zh) | 2015-10-13 | 2015-10-13 | 晶圆夹盘 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510668908.4A CN105304548A (zh) | 2015-10-13 | 2015-10-13 | 晶圆夹盘 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN105304548A true CN105304548A (zh) | 2016-02-03 |
Family
ID=55201625
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201510668908.4A Pending CN105304548A (zh) | 2015-10-13 | 2015-10-13 | 晶圆夹盘 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN105304548A (zh) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5046909A (en) * | 1989-06-29 | 1991-09-10 | Applied Materials, Inc. | Method and apparatus for handling semiconductor wafers |
US6514776B1 (en) * | 1999-06-24 | 2003-02-04 | Kumiko Yanagi | Instrument and method for measuring contamination of wafer surface |
CN103187346A (zh) * | 2011-12-29 | 2013-07-03 | 无锡华润华晶微电子有限公司 | 用于夹持晶圆以对其进行腐蚀的夹具 |
-
2015
- 2015-10-13 CN CN201510668908.4A patent/CN105304548A/zh active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5046909A (en) * | 1989-06-29 | 1991-09-10 | Applied Materials, Inc. | Method and apparatus for handling semiconductor wafers |
US6514776B1 (en) * | 1999-06-24 | 2003-02-04 | Kumiko Yanagi | Instrument and method for measuring contamination of wafer surface |
CN103187346A (zh) * | 2011-12-29 | 2013-07-03 | 无锡华润华晶微电子有限公司 | 用于夹持晶圆以对其进行腐蚀的夹具 |
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Legal Events
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
WD01 | Invention patent application deemed withdrawn after publication | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20160203 |