CN105301375A - General testing system for module type electronic products - Google Patents
General testing system for module type electronic products Download PDFInfo
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- CN105301375A CN105301375A CN201410249432.6A CN201410249432A CN105301375A CN 105301375 A CN105301375 A CN 105301375A CN 201410249432 A CN201410249432 A CN 201410249432A CN 105301375 A CN105301375 A CN 105301375A
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Abstract
The present invention provides a general testing system for module type electronic products including a testing software, a housing, a main control panel arranged in the housing, a switching panel, a back panel, a power panel, and at least one testing instrument unit panel. The main control panel, the switching panel and the back panel are connected orderly in the bidirectional communication mode; the back panel connects various testing instrument unit panels separately; and the power panel connects various board cards separately. The general testing system for module type electronic products can complete the testing for a plurality of parallel testing channel module type electronic products simultaneously, and has simple testing, high testing efficiency, accurate testing result, high expandability and low maintenance cost.
Description
Technical field
The present invention relates to testing apparatus technical field, particularly relate to a kind of universal test system for module class electronic product.
Background technology
Along with the progress of science and technology and the development of production, people propose more and more higher requirement to electronic surveying.The particularly widespread use of robot calculator, causes a succession of reaction deeply in every field.Content measurement is increasingly sophisticated, and test job amount sharply increases, and also increasingly improves the demand of testing apparatus in function, performance, test speed, test accuracy etc.And the test of current module class electronic product on the market cannot meet typical products in mass production test, tester needs frequently to change module, operational testing software, and test station automatic test degree is lower, testing cost higher and test period is longer, has a strong impact on product delivery cycle.
Therefore, be necessary for prior art not enough, provide a kind of module class electronic product universal test system very important to overcome above-mentioned defect.
Summary of the invention
For solving the problem, the invention provides a kind of universal test system for module class electronic product, comprising testing software, housing, the master control board be arranged in housing, power board, backboard, power panel, at least one testing instrument unit plate; Described master control board, power board, backboard in turn two-way communication connect, and backboard is connected with each testing instrument unit plate, and power panel is connected with each board;
Described testing software is used for calling sample data file to corresponding tested module according to testing process, and receives the final execution result that described tested module returns, and net result and sample data file is compared and judge that whether test result is correct;
Described master control board is used for testing results software;
Power board is used for the exchanges data of system;
Backboard is used for being fixedly connected with of board;
Power panel is used for carrying out AC-DC conversion, powers to each board isolated from power;
Testing instrument unit plate comprises testing tool mainboard, integration test interface, interface adaptation board, adopts integration test interface to connect between testing tool mainboard and interface adaptation board; Interface adaptation board completes the electric adaptation of many types of tested module and is connected, and testing tool mainboard completes the process of tested module testing process and the data communication with testing software.
Further, testing tool mainboard comprises control treatment module, logic processing module, backplane interface and integration test interface;
Control treatment module mainly realizes procotol process and passage bridge;
Logic processing module realizes the interface sequence logical transition of tested module, realizes multiplexed design according to software and hardware resources;
Backplane interface adopts standard chips I/O mouth to be connected with backboard, can realize the exchange of testing instrument unit;
Integration test interface is connected with interface adaptation board, comprises the I/O mouth of multi-signal type, for the expansion of interface adaptation board.
Preferably, each board described arranges successively in turn, is arranged in housing by slide rail.
Preferably, board front panel is often opened with locking device.
Preferably, testing instrument unit plate is connected with backboard by backplane interface, and described backplane interface adopts standard chips I/O mouth to be connected with backboard.
Preferably, also comprise blower fan plate, described blower fan plate is arranged in lower housing portion and/or rear portion, in drawing and pulling type, for heat radiation.
Preferably, also comprise back up pad, described back up pad is arranged on lower housing portion, in drawing and pulling type, for extract out time be that tested module provides a supporting role.
Beneficial effect of the present invention is:
According to tested module testing requirement, realize USB, RS232, RS422, I by interface adaptation board
2the electrical connection of the interface module electronic product such as C, PCI, PCI-E, HsBus, XAUI, SGMII, the test of multiple concurrent testing channel module electronic product can be completed simultaneously, test easy, testing efficiency is high, test result is accurate, extensibility is high and maintenance cost is low.
Accompanying drawing explanation
Fig. 1 is general frame figure of the present invention.
Fig. 2 is structural representation of the present invention.
Fig. 3 is testing instrument unit plate schematic diagram of the present invention.
Fig. 4 is software flow schematic diagram of the present invention.
In figure: 100 be testing software, 200 be housing, 201 be blower fan plate, 202 be back up pad, 300 be system board, 301 be master control board, 302 be power board, 303 be backboard, 304 be power panel, 400 be testing instrument unit plate, 401 be testing tool mainboard, 402 be interface adaptation board, 403 be DSP processing module, 404 be FPGA processing module, 405 be backplane interface, 406 be integration test interface, 500 for tested module.
Embodiment
Be described principle of the present invention and feature below in conjunction with accompanying drawing, example, only for explaining the present invention, is not intended to limit scope of the present invention.
Fig. 1 is general frame figure of the present invention, Figure 2 shows that schematic appearance.The present invention includes testing software 100, housing 200, the system board 300 be arranged in housing 200, power panel 304, at least one testing instrument unit plate 400, described system board 300 comprises master control board 301, power board 302, backboard 303; Described master control board 301, power board 302, backboard 303 communicate to connect in turn, and backboard 303 is connected with each testing instrument unit plate 400;
Described housing 200 is main bodys of hardware board carrying, can adapt to desktop and added application.Described housing 200 adopts 19 inches of added structural designs, height 6U.
Testing software 100 sends test command to corresponding tested module for calling sample data file according to testing process, and receive the final execution result that described tested module returns, and net result and sample data file are compared judge that whether test result is correct.
Master control board 301 is for running described testing software 100, and described software is installed in master control board 301.Described master control board 301 adopts the design of COM-E module loading plate, and described COM-E module according to the smoothing upgrading of user's tested module, can meet module performance test design needs.
Backboard 303 is for the connection of board.
Power board 302 adopts gigabit exchange chip to realize, and is the switching centre of complete machine, and all boards carry out star-like exchanges data by power board 302.
Described power panel 304 adopts direct current-48V Power supply, powers to each board isolated from power.
Described testing instrument unit plate 400 comprises testing tool mainboard 401, integration test interface, interface adaptation board 402, adopt integration test interface to connect between testing tool mainboard 401 and interface adaptation board 402, testing instrument unit plate 400 realizes flexible plug on housing 200 and replacing by guide rail.
Each board above-mentioned arranges successively in turn, all adopts slide rail form to be arranged in housing 200, is convenient for changing.Often open board front panel with locking device, come off for preventing board and be also furnished with gib screw, test interface all designs at testing instrument unit plate 400 front panel, facilitates the access of tested module 500.For ensureing reliable connection, all boards all utilize back panel connector and backboard to carry out Hard link.
Introduce testing instrument unit plate 400 in detail below.
Fig. 3 is module class electronic product universal test system testing instrument unit plate schematic diagram of the present invention, described testing instrument unit plate 400, it is the main test processes unit of tested module, one end is connected to housing 200 by backboard 303, the other end connects tested module 500 by the test interface of its front panel, can change flexibly in housing 200.
Testing instrument unit plate 400 is provided with testing tool mainboard 401 and interface adaptation board 402.
Described testing tool mainboard 401 mainly completes process and the system data communication process of tested module testing process, is provided with control treatment module 403, logic processing module 404, backplane interface 405 and integration test interface 406.
Control treatment module 403 mainly realizes procotol process and passage bridge.
Logic processing module realizes the interface sequence logical transition of tested module 500, can realize multiplexed design according to software and hardware resources.
Backplane interface 405 adopts standard chips I/O mouth to be connected with backboard 303, can realize the exchange of testing instrument unit 400, and backplane interface 405 will be expanded from now on for realizing, and comprise multichannel differential signal, be convenient to the expansion of each board transfer rate from now on.
Integration test interface 406 is connected with interface adaptation board 402, for adapting to the expansion of interface adaptation board 402, meets the adaptability of tested module 500.
Comprise the I/O mouth of multi-signal type in integration test interface 406, be convenient to the test of all kinds of test signal.
The interface that described interface adaptation board 402 completes each generic module is adaptive, due to all kinds of module interface huge number, interface is tight, probe cannot be used to test, adopt interface adaptation board to complete adaptation, in grafting serviceable life to after date, only need the connector on more alias adaptation board 402 top or direct more alias adaptation board 402, maintenance can be made very quick, and cost is lower.
Preferably, the present invention also comprises blower fan plate 201, and described blower fan plate 201 is arranged in housing 200 bottom and/or rear portion, adopts drawing and pulling type modular design, for dispelling the heat in test platform voltage source full load situation.
Preferably, also comprise back up pad 202, described back up pad 202 also adopts drawing and pulling type modular design, and housing 200 bottom is arranged, and can provide a supporting role when it is extracted out for tested module 500.
Fig. 4 is module class electronic product universal test system software flow schematic diagram of the present invention, for adapting to the batch testing of multiple module electronic product, the transmission adopting sample data file to carry out testing in testing software 100 and reception judge, testing software 100 needs to select different testing apparatus after starting, after determining tested module successful connection, operating personnel just can select corresponding test item to test, testing software 100 calls sample data file according to testing process and sends test command to corresponding tested module, and receive the final execution result that described tested module returns, and net result and sample data file are compared judge that whether test result correct.
Module class electronic product universal test system of the present invention, during detection, module class electronic product is plugged on testing instrument unit plate 400 anterior, start testing software 100, test command is sent by network, start all kinds of testing instrument unit plate 400 synchronously to test, the concurrent synchronism detection of multichannel can be realized.
Beneficial effect of the present invention is:
According to tested module testing requirement, realize USB, RS232, RS422, I by interface adaptation board
2the electrical connection of the interface module electronic product such as C, PCI, PCI-E, HsBus, XAUI, SGMII, the test of multiple concurrent testing channel module electronic product can be completed simultaneously, test easy, testing efficiency is high, test result is accurate, extensibility is high and maintenance cost is low.
Claims (7)
1. for a universal test system for module class electronic product, it is characterized in that, comprise testing software, housing, the master control board be arranged in housing, power board, backboard, power panel, at least one testing instrument unit plate; Described master control board, power board, backboard in turn two-way communication connect, and backboard is connected with each testing instrument unit plate, and power panel is connected with each board;
Described testing software is used for calling sample data file to corresponding tested module according to testing process, and receives the final execution result that described tested module returns, and net result and sample data file is compared and judge that whether test result is correct;
Described master control board is used for testing results software;
Power board is used for the exchanges data of system;
Backboard is used for being fixedly connected with of board;
Power panel is used for carrying out AC-DC conversion, powers to each board isolated from power;
Testing instrument unit plate comprises testing tool mainboard, integration test interface, interface adaptation board, adopts integration test interface to connect between testing tool mainboard and interface adaptation board; Interface adaptation board completes the electric adaptation of many types of tested module and is connected, and testing tool mainboard completes the process of tested module testing process and the data communication with testing software.
2. a kind of universal test system for module class electronic product as claimed in claim 1, it is characterized in that, testing tool mainboard comprises control treatment module, logic processing module, backplane interface and integration test interface;
Control treatment module mainly realizes procotol process and passage bridge;
Logic processing module realizes the interface sequence logical transition of tested module, realizes multiplexed design according to software and hardware resources;
Backplane interface adopts standard chips I/O to be connected with backboard, can realize the exchange of testing instrument unit;
Integration test interface is connected with interface adaptation board, comprises the I/O mouth of multi-signal type, for the expansion of interface adaptation board.
3. a kind of universal test system for module class electronic product as claimed in claim 1 or 2, it is characterized in that, each board described arranges successively in turn, is arranged in housing by slide rail.
4. a kind of universal test system for module class electronic product as claimed in claim 3, is characterized in that, often open board front panel with locking device.
5. a kind of universal test system for module class electronic product as described in claim 1 or 2 or 4, it is characterized in that, testing instrument unit plate is connected with backboard by backplane interface, and described backplane interface adopts standard chips I/O mouth to be connected with backboard.
6. a kind of universal test system for module class electronic product as described in claim 1 or 2 or 4, is characterized in that, also comprise blower fan plate, described blower fan plate is arranged in lower housing portion and/or rear portion, in drawing and pulling type, for heat radiation.
7. a kind of universal test system for module class electronic product as described in claim 1 or 2 or 4, it is characterized in that, also comprise back up pad, described back up pad is arranged on lower housing portion, in drawing and pulling type, for extract out time be that tested module provides a supporting role.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410249432.6A CN105301375A (en) | 2014-06-06 | 2014-06-06 | General testing system for module type electronic products |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410249432.6A CN105301375A (en) | 2014-06-06 | 2014-06-06 | General testing system for module type electronic products |
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| CN105301375A true CN105301375A (en) | 2016-02-03 |
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| CN201410249432.6A Pending CN105301375A (en) | 2014-06-06 | 2014-06-06 | General testing system for module type electronic products |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106054062A (en) * | 2016-08-03 | 2016-10-26 | 胜克公司 | Head of automatic test machine and automatic test machine with head |
| CN106597169A (en) * | 2016-12-26 | 2017-04-26 | 广州山锋测控技术有限公司 | Measuring apparatus for electronic equipment |
| CN109425796A (en) * | 2017-08-30 | 2019-03-05 | 中兴通讯股份有限公司 | A kind of backboard tooling test macro |
| CN110597131A (en) * | 2019-09-20 | 2019-12-20 | 中国核动力研究设计院 | Vibration line spectrum active control system based on shared memory |
| CN111999640A (en) * | 2020-07-22 | 2020-11-27 | 国营芜湖机械厂 | Circuit board testing system based on cabinet and testing method thereof |
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| CN101753317A (en) * | 2008-12-17 | 2010-06-23 | 研祥智能科技股份有限公司 | Micro TCA exchange platform |
| CN201796117U (en) * | 2010-08-06 | 2011-04-13 | 上海宏测半导体科技有限公司 | Microsoft transaction server (MTS) universal bus integrated circuit testing system |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101753317A (en) * | 2008-12-17 | 2010-06-23 | 研祥智能科技股份有限公司 | Micro TCA exchange platform |
| CN201796117U (en) * | 2010-08-06 | 2011-04-13 | 上海宏测半导体科技有限公司 | Microsoft transaction server (MTS) universal bus integrated circuit testing system |
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| 郭元兴 等: "基于AXIe 架构的通用测试平台设计", 《通信技术》 * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106054062A (en) * | 2016-08-03 | 2016-10-26 | 胜克公司 | Head of automatic test machine and automatic test machine with head |
| CN106597169A (en) * | 2016-12-26 | 2017-04-26 | 广州山锋测控技术有限公司 | Measuring apparatus for electronic equipment |
| CN109425796A (en) * | 2017-08-30 | 2019-03-05 | 中兴通讯股份有限公司 | A kind of backboard tooling test macro |
| CN109425796B (en) * | 2017-08-30 | 2021-09-07 | 中兴通讯股份有限公司 | Backplate frock test system |
| CN110597131A (en) * | 2019-09-20 | 2019-12-20 | 中国核动力研究设计院 | Vibration line spectrum active control system based on shared memory |
| CN111999640A (en) * | 2020-07-22 | 2020-11-27 | 国营芜湖机械厂 | Circuit board testing system based on cabinet and testing method thereof |
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Application publication date: 20160203 |
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