CN105278579B - Rack cabinet air inlet temperature correction method based on node power consumption - Google Patents
Rack cabinet air inlet temperature correction method based on node power consumption Download PDFInfo
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- CN105278579B CN105278579B CN201510814247.1A CN201510814247A CN105278579B CN 105278579 B CN105278579 B CN 105278579B CN 201510814247 A CN201510814247 A CN 201510814247A CN 105278579 B CN105278579 B CN 105278579B
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- 238000012937 correction Methods 0.000 title claims abstract description 20
- 238000000034 method Methods 0.000 title abstract description 8
- 230000009183 running Effects 0.000 claims abstract description 10
- 238000002715 modification method Methods 0.000 claims description 10
- 230000007613 environmental effect Effects 0.000 claims description 3
- 238000012360 testing method Methods 0.000 claims description 3
- 238000012544 monitoring process Methods 0.000 abstract description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
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Abstract
The invention particularly relates to a method for correcting the air inlet temperature of a Rack cabinet based on node power consumption. According to the method for correcting the air inlet temperature of the Rack cabinet based on the node power consumption, each node of the Rack cabinet is respectively in different running power consumption, the deviation between the ambient temperature of each node and the reading value of an air inlet temperature sensor is respectively tested, the difference value between the ambient temperature and the reading value of the air inlet temperature sensor is used as a correction coefficient, and then the corresponding relation between the obtained correction coefficient and the node power consumption is written into a BMC chip; and in the running process of the Rack cabinet, the BMC chip calls a corresponding correction coefficient according to the real-time node power consumption to correct the air inlet temperature value. The method for correcting the inlet air temperature of the Rack cabinet based on the node power consumption is different from a method for correcting the inlet air temperature of a common Rack cabinet by a fixed coefficient, but the influence of the node power consumption on temperature deviation is considered, different correction coefficients are set according to the actual running power consumption of the node, and the accuracy of the Rack cabinet on monitoring the environment temperature under different running working conditions is guaranteed.
Description
Technical field
It is more particularly to a kind of based on node power consumption the present invention relates to Rack equipment cabinet server product technical field of heat dissipation
Rack rack inlet air temperatures modification methods.
Background technology
With the fast development of cloud computing, the Rack equipment cabinet server products of radiating and centrally connected power supply are concentrated to arise at the historic moment.
The maintainability for concentrating radiating that fan will certainly be brought to need simple and fast.
In Rack racks, environment temperature when being run for real-time watch device, can each node mainboard it is close
The position of air intake vent integrates a temperature sensor.But influenceed due to being generated heat by mainboard, mainboard is arranged on close to inlet air
This temperature sensor feedback value of the position of mouth is often higher than actual environment temperature value.After this problem is realized, it is
Temperature sensor is allowed truly to reflect environment temperature, the measure that technical staff uses under normal conditions tested according to laboratory
As a result, feedback temperature value is modified by software.Specifically, exactly subtract on the basis of this temperature sensor feedback value
Fall a fixed correction factor.
However, the caloric value of mainboard is not unalterable, but influenceed vary at any time by node power consumption.
When node power consumption is higher, mainboard caloric value will become big therewith, and the value of feedback of temperature sensor and ambient temperature deviation are also
It is relatively bigger.When node power consumption is relatively low, mainboard caloric value diminishes therewith, the value of feedback and ambient temperature deviation of temperature sensor
With regard to relatively smaller.So should change for the correction factor for repairing inlet air temperatures with the difference of node power consumption, fixed
Correction factor can only ensure readings precision of the node in respective nodes power consumption, when node power consumption value changes, deviation pole
Easily exceed tolerance band.
Influenceed changing at any time by node power consumption with ambient temperature deviation for the value of feedback of said temperature sensor,
The problem of causing Rack rack inlet air temperatures deviations larger, the present invention devise a kind of Rack rack inlet airs based on node power consumption
Temperature correction.The present invention is different from usual Rack racks in the method for fixed coefficient amendment inlet air temperatures, and allows for
Influence of the node power consumption to temperature deviation, different correction factors is set according to the actual motion power consumption of node, ensures that temperature passes
Sensor can accurately reflect environment temperature in all operating modes.
The content of the invention
A kind of the defects of present invention is in order to make up prior art, there is provided simple efficiently Rack machines based on node power consumption
Cabinet inlet air temperatures modification method.
The present invention is achieved through the following technical solutions:
A kind of Rack rack inlet air temperatures modification methods based on node power consumption, it is characterised in that:In each of Rack racks
Power consumption monitor and inlet air temperatures sensor are set respectively on individual node, and set an environment temperature to pass on the outside of each node
Sensor is used to test real-time environment temperature;
Different pressure is applied to each node of Rack racks respectively, so as to be at different operation power consumptions, point
The environment temperature of each node and the deviation of inlet air temperatures sensor readings are not tested, and are sensed with environment temperature and inlet air temperatures
Then the corresponding relation of the correction factor of gained and node power consumption is written to BMC cores by the difference of device readings as correction factor
Piece;
In Rack rack runnings, the power consumption monitor and inlet air temperatures sensor respectively run real time node
Power consumption and inlet air temperatures input BMC chip, BMC chip according to corresponding to being transferred real time node power consumption correction factor to inlet air temperatures
Value is modified.
The environment temperature sensor is arranged on the outside of node, at node air intake vent 1cm.
In Rack rack runnings, the BMC chip of all nodes is by revised inlet air temperatures value on Rack racks
Input rack RMC, RMC average to the inlet air temperatures value of all nodes, and using the average value as current environmental temperature.
The beneficial effects of the invention are as follows:The Rack rack inlet air temperatures modification methods based on node power consumption, different from logical
Normal Rack racks allow for influence of the node power consumption to temperature deviation in the method for fixed coefficient amendment inlet air temperatures, root
Different correction factors is set according to the actual motion power consumption of node, ensure that Rack racks under different operating conditions to environment temperature
Spend the precision of monitoring.
Brief description of the drawings
Accompanying drawing 1 is the Rack rack inlet air temperatures modification method schematic diagrames of the invention based on node power consumption.
Embodiment
In order that technical problems, technical solutions and advantages to be solved are more clearly understood, tie below
Drawings and Examples are closed, the present invention will be described in detail.It should be noted that specific embodiment described herein is only used
To explain the present invention, it is not intended to limit the present invention.
The Rack rack inlet air temperatures modification methods based on node power consumption, set respectively on each node of Rack racks
Power consumption monitor and inlet air temperatures sensor are put, and sets an environment temperature sensor to be used to test reality on the outside of each node
When environment temperature;
Different pressure is applied to each node of Rack racks respectively, so as to be at different operation power consumptions, point
The environment temperature of each node and the deviation of inlet air temperatures sensor readings are not tested, and are sensed with environment temperature and inlet air temperatures
Then the corresponding relation of the correction factor of gained and node power consumption is written to BMC cores by the difference of device readings as correction factor
Piece;
In Rack rack runnings, the power consumption monitor and inlet air temperatures sensor respectively run real time node
Power consumption and inlet air temperatures input BMC chip, BMC chip according to corresponding to being transferred real time node power consumption correction factor to inlet air temperatures
Value is modified.
The environment temperature sensor is arranged on the outside of node, at node air intake vent 1cm.
In Rack rack runnings, the BMC chip of all nodes is by revised inlet air temperatures value on Rack racks
Input rack RMC, RMC average to the inlet air temperatures value of all nodes, and using the average value as current environmental temperature.
Claims (3)
- A kind of 1. Rack rack inlet air temperatures modification methods based on node power consumption, it is characterised in that:In each of Rack racks Power consumption monitor and inlet air temperatures sensor are set respectively on node, and set an environment temperature to sense on the outside of each node Device is used to test real-time environment temperature;Different pressure is applied to each node of Rack racks respectively, so as to be at different operation power consumptions, surveyed respectively The environment temperature of each node and the deviation of inlet air temperatures sensor readings are tried, and is read with environment temperature and inlet air temperatures sensor Then the corresponding relation of the correction factor of gained and node power consumption is written to BMC chip by the difference of value as correction factor;In Rack rack runnings, real time node is run power consumption by the power consumption monitor and inlet air temperatures sensor respectively BMC chip is inputted with inlet air temperatures, BMC chip correction factor according to corresponding to being transferred real time node power consumption enters to inlet air temperatures value Row amendment.
- 2. the Rack rack inlet air temperatures modification methods according to claim 1 based on node power consumption, it is characterised in that:Institute Environment temperature sensor is stated on the outside of node, at node air intake vent 1cm.
- 3. the Rack rack inlet air temperatures modification methods according to claim 1 based on node power consumption, it is characterised in that: In Rack rack runnings, revised inlet air temperatures value is inputted rack by the BMC chip of all nodes on Rack racks RMC, RMC average to the inlet air temperatures value of all nodes, and using the average value as current environmental temperature.
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CN201510814247.1A CN105278579B (en) | 2015-11-23 | 2015-11-23 | Rack cabinet air inlet temperature correction method based on node power consumption |
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CN201510814247.1A CN105278579B (en) | 2015-11-23 | 2015-11-23 | Rack cabinet air inlet temperature correction method based on node power consumption |
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Families Citing this family (9)
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CN105486426B (en) * | 2016-02-15 | 2018-05-04 | 浪潮电子信息产业股份有限公司 | Inlet air temperature detection implementation method |
CN105698967B (en) * | 2016-02-15 | 2018-04-06 | 浪潮电子信息产业股份有限公司 | Method for detecting inlet air temperature of rack product |
CN106502349A (en) * | 2016-10-31 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of air intake vent temperature correction based on GPU power consumptions and ring temperature |
CN107504426A (en) * | 2017-08-30 | 2017-12-22 | 上海汽车集团股份有限公司 | LED car lamp module cooling control method and device |
TWI671629B (en) * | 2018-12-15 | 2019-09-11 | 英業達股份有限公司 | Rack and electronic device set in the rack test system and method thereof |
CN109981366A (en) * | 2019-03-28 | 2019-07-05 | 苏州浪潮智能科技有限公司 | A kind of alarm method that server sensor readings is extremely fault-tolerant |
CN111706539B (en) * | 2020-06-09 | 2022-03-01 | 深圳市汇川技术股份有限公司 | Method and device for regulating and controlling rotating speed of motor fan and readable storage medium |
CN112200998A (en) * | 2020-09-30 | 2021-01-08 | 四川瑞霆电力科技有限公司 | Early fire early warning method and system applied to power equipment and storage medium thereof |
CN116437649B (en) * | 2023-06-13 | 2023-09-22 | 浙江德塔森特数据技术有限公司 | Machine room safety operation and maintenance method and device based on blockchain and readable storage medium |
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CN102348365A (en) * | 2010-08-03 | 2012-02-08 | 联想(北京)有限公司 | Method and device for regulating temperature of cabinet and cabinet |
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