TWI671629B - Rack and electronic device set in the rack test system and method thereof - Google Patents

Abstract

A cabinet and a test system and method for an electronic device installed in the cabinet. The test server converts data from the stand-alone test information into a stand-alone test information suitable for the cabinet, and the test server transmits the cabinet test information to the RMC of the corresponding cabinet. Board card, or transmitting the stand-alone test information for the rack to the corresponding electronic device through the connection node of the corresponding rack, so that the RMC board will perform the rack test for the rack based on the rack test information, and the electronic device will be based on the stand-alone for the rack The test information performs a stand-alone test of the electronic device, thereby achieving the technical effect of providing both a cabinet and an electronic device installed in the cabinet for testing.

Description

Cabinet and test system and method for electronic devices arranged in cabinet

A test system and method thereof, in particular, a test server that converts data of a single machine test information into a single machine test information suitable for a cabinet, so that both the cabinet and the electronic devices installed in the cabinet can test And its methods.

Cabinets provide the setting of electronic devices to save the space for the installation of electronic devices. The test of cabinets is generally to test the control, connection of the electronic devices, the functions of the cabinet itself, etc. The tests of the cabinet do not include the installation in the cabinet. Testing of electronic devices. Testing of electronic devices requires additional testing.

As for the test of the cabinet and the test of the electronic device, because of different system architecture concepts, the test of the cabinet and the test method of the electronic device are different, that is, the test of the electronic device cannot be performed through the cabinet.

In summary, it can be known that in the prior art, there has been a problem that a cabinet and an electronic device installed in the cabinet must be tested separately for a long time. Therefore, it is necessary to propose improved technical means to solve this problem.

In view of the problem in the prior art that the cabinet and the electronic device installed in the cabinet need to be tested separately, the present invention discloses a cabinet and a test system and method for the electronic device installed in the cabinet, wherein:

The cabinet disclosed in the present invention and a test system for an electronic device disposed in the cabinet include a cabinet and a test server. The test server further includes a receiving module, a cabinet information module, a device information module, a query module, Conversion module and transmission module.

The cabinet has multiple connection nodes and remote monitoring boards (RMC boards) that are electrically connected to the corresponding electronic devices. The connection nodes are tested and controlled through the RMC boards. The RMC boards will perform cabinet test based on the cabinet test information. , The electronic device performs a stand-alone test of the electronic device according to the stand-alone test information applicable to the cabinet.

The receiving module of the test server is used to receive the cabinet test instruction or the stand-alone test instruction; the cabinet information module of the test server is used to obtain the cabinet information according to the cabinet test instruction or the cabinet serial number in the stand-alone test instruction; the test server The device information module of the server is used to obtain the MAC information of the corresponding electronic device from the connected node when the receiving module receives the single-machine test command; the query module of the test server is used to query the cabinet test command and the cabinet information. Corresponding cabinet test information, or query the corresponding stand-alone test information according to the stand-alone test instruction and the MAC information of the electronic device; the conversion module of the test server is used to convert the data of the stand-alone test information to convert it into a suitable cabinet The stand-alone test information of the test server; and the transmission module of the test server is used to transmit the rack test information to the RMC board of the corresponding rack, or to transmit the stand-alone test information applicable to the rack to the corresponding electronic device through the connection node of the corresponding rack.

The cabinet and the testing method of the electronic device disposed in the cabinet disclosed in the present invention include the following steps:

First, provide a cabinet with multiple connection nodes and remote monitoring boards (RMC boards) that are electrically connected to the corresponding electronic devices. The connection nodes are tested and controlled through the RMC board; then, test for the connection with the cabinet is provided. Server; then, the test server receives the cabinet test instruction or the stand-alone test instruction; then, the test server obtains the cabinet information according to the cabinet test instruction or the cabinet serial number in the stand-alone test instruction; then, when the test server receives the stand-alone test When instructed, the test server obtains the MAC information of the corresponding electronic device from the connected node; then, the test server queries the corresponding cabinet test information based on the cabinet test instruction and the cabinet information, or queries the stand-alone test instruction and the MAC information of the electronic device. Output the corresponding stand-alone test information; then, the test server converts the stand-alone test information to convert it into stand-alone test information suitable for the cabinet; then, the test server sends the cabinet test information to the corresponding RMC board card, or Transmission through the connection node of the corresponding cabinet Single cabinet corresponding to the test information to the electronic device; Next, the board will be the RMC test cabinet rack cabinet according to the test information; Finally, the electronic device will be based on a single test rack suitable for the information of stand-alone test electronics.

The system and method disclosed in the present invention are as above. The difference from the prior art is that when the test server receives a cabinet test instruction or a stand-alone test instruction, it obtains cabinet information according to the cabinet test instruction or the cabinet serial number in the stand-alone test instruction. The test server converts the data from the stand-alone test information to the stand-alone test information suitable for the cabinet. The test server sends the cabinet test information to the RMC board of the corresponding cabinet, or transmits the The stand-alone test information is sent to the corresponding electronic device, so that the RMC board will perform the cabinet test of the cabinet according to the cabinet test information, and the electronic device will perform the stand-alone test of the electronic device according to the stand-alone test information applicable to the cabinet.

Through the above technical means, the present invention can achieve the technical effect of providing both a cabinet and an electronic device installed in the cabinet to be tested.

In the following, the embodiments of the present invention will be described in detail with reference to the drawings and examples, so as to fully understand and implement the implementation process of how the present invention applies technical means to solve technical problems and achieve technical effects.

In the following, an embodiment will be used to explain the operation system and method of the present invention, and please refer to "Figure 1", "Figure 2A", "Figure 2B" and "Figure 3" at the same time. "Figure 1" shows a system block diagram of a cabinet according to the present invention and a test system for electronic devices installed in the cabinet; "Figure 2A" and "Figure 2B" show a cabinet for the present invention and electronic devices installed in the cabinet. Method flow chart of the test method; "Figure 3" shows the system architecture diagram of the cabinet and the test method of the electronic device installed in the cabinet according to the present invention.

The cabinet disclosed in the present invention and a test system for an electronic device disposed in the cabinet include a cabinet 10 and a test server 20, and the test server 20 further includes a receiving module 21, a cabinet information module 22, and a device information module. 23. Inquiry module 24, conversion module 25, and transmission module 26.

The cabinet 10 is provided with a plurality of connection nodes 13 and remote monitoring boards (RMC boards) 12 which are electrically connected to corresponding electronic devices 11. The connection nodes 13 are tested and controlled through the RMC boards 12, and the RMC boards 12 are based on Cabinet test information Performs a cabinet test of cabinet 10, and the electronic device 11 performs a stand-alone test of the electronic device 11 according to the stand-alone test information applicable to the cabinet (step 101).

The test server 20 establishes a connection with the cabinet through a wired transmission method or a wireless transmission method (step 102). The foregoing wired transmission method is, for example, a cable network, a fiber optic network, etc., and the foregoing wireless transmission method is: Wi -Fi, mobile communication network, etc., are for illustration purposes only, and do not limit the application scope of the present invention.

The receiving module 21 of the test server 20 receives the cabinet test instruction from the operation interface provided by the test server 20 (step 103), and the cabinet information module 22 of the test server 20 obtains the cabinet according to the cabinet serial number in the cabinet test instruction. Information (step 104), the cabinet information is, for example, the model of the cabinet, the information of the RMC board 12 and the serial number of the connection node 13, etc., which are merely examples for illustration and are not intended to limit the application scope of the present invention.

The query module 24 of the test server 20 is used to query the corresponding cabinet test information according to the cabinet test instruction and the cabinet information (step 106), and the transmission module 26 of the test server 20 is used to transmit the cabinet test information to the corresponding cabinet 10 of the RMC board 12 (step 108), so that the RMC board 12 of the rack 10 performs the rack test of the rack 10 according to the rack test information (step 109).

The receiving module 21 of the test server 20 receives the stand-alone test instruction from the operation interface provided by the test server 20 (step 103), and the cabinet information module 22 of the test server 20 obtains the cabinet according to the cabinet serial number in the stand-alone test instruction. Information (step 104).

The device information module 23 of the test server 20 obtains the MAC information corresponding to the electronic device 11 from the connection node 13 of the cabinet 10 (step 105), and the query module 24 of the test server 20 is used according to the stand-alone test instruction and the electronic device. The MAC information of 11 queries the corresponding stand-alone test information (step 106), and the conversion module 25 of the test server 20 converts the data of the stand-alone test information to convert it to stand-alone test information suitable for the cabinet (step 107). The transmission module 26 of the server 20 transmits the stand-alone test information applicable to the cabinet to the corresponding electronic device 11 through the connection node 13 of the corresponding cabinet (step 108), whereby the electronic device 11 performs electronic processing based on the stand-alone test information applicable to the cabinet. Stand-alone test of device 11 (step 110).

The electronic device 11 is controlled and started through the RMC board 12 and then performs the stand-alone test of the electronic device 11 according to the stand-alone test information applicable to the cabinet. The test server further passes the STU console 31 corresponding to the cabinet to enable the RMC board 12 will perform the cabinet test of the cabinet according to the cabinet test information. The conversion module 25 converts the stand-alone test information into the cabinet data structure to convert it to the stand-alone test information suitable for the cabinet. The receiving module 21 further includes receiving from the RMC board 12 The real-time test data or test result data is displayed through the display module 27 included in the test server 20.

In summary, it can be seen that the difference between the present invention and the prior art lies in that when the test server receives a cabinet test instruction or a stand-alone test instruction, it obtains cabinet information according to the cabinet test instruction or the cabinet serial number in the stand-alone test instruction to test the servo. The device converts the stand-alone test information into data that is suitable for the stand-alone test. The test server sends the stand-test information to the RMC board of the corresponding rack, or transmits the stand-alone test for the rack through the connection node of the corresponding rack. The information is sent to the corresponding electronic device, so that the RMC board performs the cabinet test of the cabinet according to the cabinet test information, and the electronic device performs the stand-alone test of the electronic device according to the stand-alone test information applicable to the cabinet.

This technical method can solve the problem that the cabinet and the electronic device installed in the cabinet have to be tested separately, so as to achieve the technical effect that the cabinet and the electronic device installed in the cabinet can be tested.

Although the embodiments disclosed in the present invention are as described above, the content is not intended to directly limit the patent protection scope of the present invention. Any person with ordinary knowledge in the technical field to which the present invention pertains may make some changes in the form and details of implementation without departing from the spirit and scope disclosed by the present invention. The scope of patent protection of the present invention must still be defined by the scope of the attached patent application.

10‧‧‧ Cabinet

11‧‧‧Electronic device

12‧‧‧RMC board

13‧‧‧ connected nodes

20‧‧‧test server

21‧‧‧Receiving module

22‧‧‧ Cabinet Information Module

23‧‧‧Device Information Module

24‧‧‧Query Module

25‧‧‧ Conversion Module

26‧‧‧Transfer Module

27‧‧‧Display Module

31‧‧‧STU console

Step 101‧‧‧ provides a cabinet with multiple connection nodes and RMC boards electrically connected to corresponding electronic devices. The connection nodes are tested and controlled through the RMC board

Step 102‧‧‧ Provide a test server connected to the cabinet

Step 103‧‧‧ The test server receives a cabinet test command or a stand-alone test command

Step 104‧‧‧ The test server obtains cabinet information according to the cabinet test instruction or the cabinet serial number in the stand-alone test instruction.

Step 105‧‧‧test server obtains the MAC information of the corresponding electronic device from the connected node

Step 106‧‧‧ The test server queries the corresponding cabinet test information according to the cabinet test instruction and the cabinet information, or queries the corresponding single machine test information according to the single machine test instruction and the MAC information of the electronic device.

Step 107‧‧‧ The test server converts the stand-alone test information into data for conversion to stand-alone test information suitable for the cabinet

Step 108‧‧‧ The test server transmits the test information of the cabinet to the RMC board of the corresponding cabinet, or transmits the stand-alone test information applicable to the cabinet to the corresponding electronic device through the connection node of the corresponding cabinet.

Step 109‧‧‧RMC board will test the cabinet according to the cabinet test information

Step 110‧‧‧ The electronic device performs a stand-alone test of the electronic device according to the stand-alone test information applicable to the cabinet

FIG. 1 is a system block diagram of a cabinet according to the present invention and a test system for an electronic device disposed in the cabinet. FIG. 2A and FIG. 2B are flowcharts illustrating a method of a method for testing a cabinet and an electronic device disposed in the cabinet according to the present invention. FIG. 3 is a system architecture diagram of a cabinet according to the present invention and a testing method for an electronic device disposed in the cabinet.

Claims (10)

A cabinet and a test system for an electronic device disposed in the cabinet include: a cabinet having a plurality of connection nodes electrically connected to corresponding electronic devices and a remote monitoring board (RMC board), the connection Nodes are tested and controlled through the RMC board. The RMC board performs cabinet test of the cabinet according to a cabinet test information, and the electronic device performs the electronics according to a stand-alone test information applicable to the cabinet. Stand-alone test of the device; and a test server connected to the cabinet, the test server further comprising: a receiving module for receiving a cabinet test command or a stand-alone test command; A cabinet information module for obtaining cabinet information according to the cabinet test instruction or a cabinet serial number in the stand-alone test instruction; a device information module for when the receiving module receives the stand-alone test instruction When obtaining the MAC information of the corresponding electronic device from the connection node; a query module for using the cabinet test instruction and the cabinet To query the corresponding cabinet test information, or to query the corresponding stand-alone test information according to the stand-alone test instruction and the MAC information of the electronic device; a conversion module for data on the stand-alone test information To convert the stand-alone test information suitable for the cabinet; and a transmission module for transmitting the cabinet test information to the RMC board corresponding to the cabinet, or through a connection corresponding to the cabinet The node transmits the stand-alone test information applicable to the cabinet to the corresponding electronic device. For example, the cabinet and the electronic device testing system provided in the cabinet according to item 1 of the scope of the patent application, wherein the electronic device is controlled and started through the RMC board, and then is based on the stand-alone test information applicable to the cabinet. A stand-alone test of the electronic device is performed. According to the cabinet described in item 1 of the scope of patent application and the test system for the electronic devices installed in the cabinet, the test server further passes the STU console corresponding to the cabinet so that the RMC board will The cabinet test information is used to perform the cabinet test of the cabinet. According to the cabinet described in item 1 of the scope of the patent application, and a test system for an electronic device provided in the cabinet, wherein the conversion module converts the stand-alone test information into a cabinet data structure to convert into a Stand-alone test information. According to the cabinet and the electronic device testing system installed in the cabinet according to item 1 of the scope of patent application, the receiving module further includes receiving an instant test data or a test result data from the RMC board and passing A display module included in the test server displays the real-time test data or the test result data. A test method for a cabinet and an electronic device disposed in the cabinet includes: providing a cabinet having a plurality of connection nodes electrically connected to corresponding electronic devices and an RMC board card, wherein the connection nodes pass through the RMC board card Test and control; provide a test server connected to the cabinet; the test server receives a cabinet test instruction or a stand-alone test instruction; the test server is based on the cabinet test instruction or the Cabinet information in a stand-alone test instruction obtains cabinet information; when the test server receives the stand-alone test instruction, the test server obtains MAC information of a corresponding electronic device from the connection node; the test server is based on The cabinet test instruction and the cabinet information query for a corresponding cabinet test information, or according to the stand-alone test instruction and the MAC information of the electronic device for querying a corresponding stand-alone test information; the test server refers to the The stand-alone test information performs data conversion to be converted into the stand-alone test information applicable to the cabinet; The test server transmits the cabinet test information to the RMC board corresponding to the cabinet, or transmits the stand-alone test information applicable to the cabinet to the corresponding electronic device through a connection node corresponding to the cabinet; the RMC board The card performs a cabinet test of the cabinet according to the cabinet test information; and the electronic device performs a single machine test of the electronic device according to the single machine test information applicable to the cabinet. For example, the method for testing a cabinet and an electronic device installed in the cabinet according to item 6 of the scope of the patent application, wherein the electronic device is controlled and started through the RMC board, and then is based on the stand-alone test information applicable to the cabinet. A stand-alone test of the electronic device is performed. According to the method for testing a cabinet and an electronic device provided in the cabinet according to item 6 of the scope of patent application, wherein the test server further passes the STU console corresponding to the cabinet so that the RMC board will The cabinet test information is used to perform the cabinet test of the cabinet. According to the method for testing a cabinet and an electronic device installed in the cabinet according to item 6 of the scope of the patent application, wherein the conversion module converts the stand-alone test information into a cabinet data structure to convert into a cabinet suitable for the cabinet. Stand-alone test information. According to the method for testing a cabinet and an electronic device provided in the cabinet according to item 6 of the scope of the patent application, the receiving module further includes receiving an instant test data or a test result data from the RMC board and passing A display module included in the test server displays the real-time test data or the test result data.