CN105225699B - A kind of Temperature Control Type test system for storage device - Google Patents
A kind of Temperature Control Type test system for storage device Download PDFInfo
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- CN105225699B CN105225699B CN201510553296.4A CN201510553296A CN105225699B CN 105225699 B CN105225699 B CN 105225699B CN 201510553296 A CN201510553296 A CN 201510553296A CN 105225699 B CN105225699 B CN 105225699B
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Abstract
The present invention relates to a kind of Temperature Control Type test system for storage device, including temperature control to test cavity, at least one piece of unit of testing and controlling being placed in the temperature control test cavity body, the refrigerating/heating device for producing high temperature or low temperature in the temperature control test cavity body, the test cavity being disposed adjacent with the temperature control test cavity body and be placed in the test system that the test cavity is used to control the refrigerating/heating device and the unit of testing and controlling.Using technical scheme, by the way that storage device test interface is fixed in unit of testing and controlling, and drawing data storage interface by cable at the back side of storage device test interface makes it directly be plugged on the mainboard of test main frame, test board transfer is needed not move through so as to the data-signal of storage device, make the transmission of memory data signal more stable, substantially increase the reliability and standard of test.
Description
Technical field
The invention belongs to control application field, more particularly to a kind of Temperature Control Type test system for storage device.
Background technology
In recent years, as technology is increasingly mature, storage device (solid state hard disc, USB flash disk etc.) obtains extensively should in consumption market
With, and the special dimensions such as industry, military affairs are gradually deep into from consumer field.Height of the market of these special dimensions to solid state hard disc
Low temperature environment adaptability, reliability, break-make electrical testing (power cycle) etc. propose higher requirement, also cause solid
The attention of state hard disk manufacture producer.Flash memory (flash) supply and its manufacturing technology due to solid state hard disc are all by external a small number of
There is the problems such as purchase is difficult and limit is sold in several producer's controls, the flash chip of specific use, wide temperature so that hard disk manufacture factory
Family not only needs to do high-low-temperature environmental testing in production, it is also necessary to the high/low temperature screening produced in batches, greatly increases
The difficulty of test and complexity of storage test equipment.
In the prior art, the test to storage device is generally connected on test computer, the testing results in computer is tested
Program, which is realized, knows disk, formatting, initialization, read or write speed, continuous physical read-write, totally power cycle, the test item such as erasing
Mesh, so as to judge whether storage device performance meets standard.But storage device manufacturer is general lack of special in the prior art
High and low-temperature apparatus, storage device high/low temperature test generally use standard high-low temperature test chamber add it is external test computer side
It method, will be storage devices under being placed in high-low temperature test chamber, data extension line is drawn from chamber with testing computer phase
Connection.There is operating difficulties in this method, arrangement is in disorder, test panel quantity is few, efficiency is low, it is obvious to be not suitable for production in enormous quantities etc.
Drawback.Although also there is Special high-low temperature equipment in the prior art, and only through high-low temperature test chamber and multiple test computers
Simple integrator, although having obtained certain improvement in integrated operation performance, the problems such as extension to line arrangement, test panel
In-depth study is not carried out, problems also be present, so as to influence the precision and efficiency of storage device test.
Referring to Fig. 1, the connection block diagram of storage device high/low temperature test system in the prior art is shown, on measurement circuit plate
It is used to connect the storage device interface being storage devices under provided with multiple, now by taking the hard disk of SATA interface as an example, with tested SATA
The SATA hard disc interface that hard disk is connected is fixed on measurement circuit plate in a welding manner, while is set in measurement circuit plate
SATA signaling interfaces and power supply signal interface, the SATA interface and power supply for making itself and computer main board by data wire and power line connect
Mouth is connected, then arranges that circuit is connected with SATA hard disc Interface Electrical on measurement circuit plate.In the connected mode, computer main board
SATA signals by measurement circuit plate carry out signal transfer after be connected again with tested hard disk, cause hard disc data signal to decline
Subtract, so as to influence the reliability of test and standard.
Therefore for drawbacks described above present in currently available technology, it is necessary to be studied in fact, to provide a kind of scheme,
Solves defect present in prior art.
The content of the invention
Regarding the issue above, the present invention provides one kind is applied to, various storage devices, test panel quantity are more, imitate
Rate is high, is adapted to produce the Temperature Control Type test system tested in enormous quantities.
To reach above-mentioned purpose, present invention employs following technical proposal：
A kind of Temperature Control Type test system for storage device, including temperature control test cavity, are placed in the temperature control test cavity
Internal at least one piece of unit of testing and controlling, for producing refrigeration/system of high temperature or low temperature in the temperature control test cavity body
Thermal, the test cavity being disposed adjacent with the temperature control test cavity body and be placed in the test cavity be used to controlling it is described
The test system of refrigerating/heating device and the unit of testing and controlling, wherein,
The test system includes an at least test main frame, and the test main frame mainboard is provided with multiple first data storages
Interface；
The unit of testing and controlling includes at least one storage device test for being connected with tested storage device
Interface and control circuit board, the unit of testing and controlling are connected with the test main frame, for receiving the test main frame
Control signal, data-signal and power supply signal；The storage device test interface is fixed in the unit of testing and controlling, and it is just
Face is provided with the standard interface to be fastened with tested storage device, and its back side is directly provided with the letter being connected with the standard interface
Number extended line, the part for being used to receive data-signal in the signal extended line other end are provided with the second data storage interface, institute
State corresponded between the first data storage interface and the second data storage interface connection make the storage device test interface with
The test main frame is directly connected to；The part for being used to receive power supply signal in the signal extended line other end is provided with storage power supply
Interface, the storage power interface are connected with the control circuit board and are controlled by the control circuit board.
Preferably, the first data storage interface is carried or by the mainboard in itself by the test main frame mainboard
Multiple PCI-E slots grafting data storage Interface Expanding cards extend to obtain.
Preferably, the refrigerating/heating device is arranged on the top of the temperature control experiment cavity.
Preferably, the test system is tested with temperature control experiment cavity or so setting, more of the test system
Main frame is corresponded and is substantially in the same horizontal position with the polylith unit of testing and controlling in the temperature control test cavity body.
Preferably, the unit of testing and controlling also includes multiple baffle plates, and the baffle plate is used to fix the storage device survey
Try mouth and the control circuit board.
Preferably, it is additionally provided with dividing plate between the temperature control experiment cavity and the test cavity.
Preferably, the temperature control experiment cavity is additionally provided with the multiple and survey on the inwall of the test cavity side
Try the wire hole of cavity connection, the chi of the connecting line between the wire hole and the test system and the unit of testing and controlling
It is very little to be adapted.
Preferably, adiabatic clay is additionally provided with the wire hole, the adiabatic clay is used to close the temperature control test cavity
Space between the outconnector of body and the wire hole.
Preferably, in addition to the test main frame normal temperature test section being connected, the normal temperature test section are arranged on institute
On the side door for stating test cavity, and it is provided with multiple storage device test interfaces being connected with the test system.
Preferably, the storage device test interface is in SATA interface, SAS interfaces, PCI-E interface or USB interface
One or several kinds combination；The first data storage interface or the second data storage interface are SATA interface, SAS connects
Any of mouth, PCI-E interface or USB interface；Between the control circuit board and the test main frame by SATA, SAS,
The data/address bus such as PCI-E, UART or USB are connected.
Compared with prior art, the advantage of the invention is that：
1st, a kind of Temperature Control Type test system for storage device of the invention, by the way that storage device test interface is fixed
In unit of testing and controlling (rather than storage device test interface is welded on test board in the prior art), and in storage device
Data storage interface is drawn in the back side of test interface by cable makes it directly be plugged on the mainboard of test main frame, so as to store
Data-signal needs not move through test board transfer, makes the transmission of memory data signal more reliable and stable, substantially increases test
Reliability and standard.
2nd, by PCI-E interface come extension storage test interface, so that separate unit test main frame can test storage device
Quantity greatly increases, and reduces equipment volume and simplifies internal arrange.
3rd, control circuit board is using sealing in and going out logic chip realization extension control, so as to realize multiple power supplies control.
Brief description of the drawings
Fig. 1 is the wiring connection figure of prior art storage device high/low temperature test system.
Fig. 2 is the Facad structure block diagram provided by the present invention for the Temperature Control Type test system of storage device.
Fig. 3 is the internal structure block diagram provided by the present invention for the Temperature Control Type test system of storage device.
Fig. 4 is the connection diagram provided by the present invention for the Temperature Control Type test system of storage device.
Fig. 5 is the connection signal of unit of testing and controlling in the Temperature Control Type test system provided by the present invention for storage device
Figure.
Fig. 6 is the theory diagram of control circuit board in the Temperature Control Type test system provided by the present invention for storage device.
Fig. 7 is the connection figure of the power protection chip in control circuit board provided by the invention.
Embodiment
It is the specific embodiment of invention and with reference to accompanying drawing below, technical scheme is further described, but
The present invention is not limited to these embodiments.
After the defects of prior art storage device high/low temperature test system is present is furtherd investigate, it is a discovery of the invention that existing
The storage device interface of standard is used in technology, its front is with being storage devices under the standard interface being connected, and the back side is
Needle interface is arranged, for storage device interface to be fixed on into measurement circuit plate with welding manner；Exactly employ prior art this
The usual connected mode of kind, makes data-signal need by measurement circuit plate transfer, so as to cause the decay of data-signal, and
Data-signal (SATA data) is all high-frequency data signal, and any faint signal attenuation may all cause error in data, cause
Test result is inaccurate.
The defects of for prior art, referring to Fig. 2, Fig. 3 and Fig. 4, it show a kind of temperature for storage device of the invention
The connection block diagram of control formula test system, including temperature control are tested cavity 1, are arranged on chamber door for observing temperature control experiment cavity
1 observation window 6, at least unit of testing and controlling 2 being placed in temperature control experiment cavity 1, for being produced in temperature control experiment cavity 1
The refrigerating/heating device 3 of high temperature or low temperature, with the temperature control test cavity 4 that is disposed adjacent of experiment cavity 1 and being placed in test chamber
Body 4 is used for the test system 5 for controlling refrigerating/heating device 3 and unit of testing and controlling 2, wherein,
Test system 5 includes an at least test main frame 51, and the mainboard of test main frame 51 is provided with the multiple first storage numbers
According to interface, the first data storage interface is usually any of SATA interface, SAS interfaces, PCI-E interface or USB interface；
Test system 5 also includes input peripheral 52 (keyboard, mouse etc.), display 53, testing and control panel 54 and used
The KVM switcher of a display 53 and input peripheral 52 is shared in more test main frames 51.
Referring to Fig. 5, unit of testing and controlling in the Temperature Control Type test system provided by the present invention for storage device is shown
Connection diagram, unit of testing and controlling 2 include it is at least one be used for be connected with tested storage device storage device survey
Try mouth 21 and control circuit board (not showed that in Fig. 2 and Fig. 3), tested storage device is directly plugged on storage device test
On interface 21；Unit of testing and controlling 2 is connected by connection cables with test main frame 51, for receiving the control of test main frame 51
Signal, data-signal and power supply signal, accordingly, connection cables include control signal wire, data signal line and power signal line.
The power supply that power supply signal connects test main frame 51 provides power supply power supply for unit of testing and controlling 2, and data-signal is tested for transmitting
The storage information of storage device, control signal are used for testing and control (such as break-make electrical testing), and control circuit board receives the control
Signal simultaneously completes the power supply to being tested storage device.Storage device test interface 21 is fixed in unit of testing and controlling 2,
Its front is provided with the standard interface to be fastened with tested storage device, and its back side is directly provided with the letter being connected with standard interface
Number extended line, the cable that the signal extended line other end is used to receive data-signal are provided with the second data storage interface, and second stores
Data-interface connection corresponding with the first data storage interface, is in SATA interface, SAS interfaces, PCI-E interface or USB interface
It is any；First data storage interface and the second data storage interface make storage device test interface 21 and test after being connected together
Main frame 51 is directly connected to；The cable that the signal extended line other end is used to receive power supply signal is provided with storage power interface, power supply letter
The other end of number line is provided with storage power interface, and storage power interface is connected with control circuit board and is controlled by control circuit
Plate.
The present invention by storage device test interface 21 is fixed in unit of testing and controlling 2 (rather than in the prior art will
Storage device test interface 21 is welded on test board), and drawn and deposited by cable at the back side of storage device test interface 21
Storage data-interface makes it directly be plugged on the mainboard of test main frame 51, so as to which memory data signal is needed not move through in test board
Turn, make the transmission of memory data signal more reliable and stable, substantially increase the reliability and standard of test.
Because the memory interface (such as SATA interface) that prior art carries using only test computer main board is set as storage
Standby test interface 21, the memory interface limited amount generally carried (typically within 10), in order to increase the survey of integral device
Examination disk quantity and be forced to increase excessive test computer, cause that equipment volume is huge, internal arrangement is complicated, maintenance difficult.
In order to solve the above-mentioned technical problem, the present invention proposes a kind of technical side by PCI-E slot expansion memory interfaces
Case.Generally, there are multiple PCI-E slots on the mainboard of test main frame 51, pass through multiple PCI-E slots grafting on the mainboard
Data storage Interface Expanding card extension storage interface.Such as can be with the multiple PCI- of grafting by PCI-E slot expansions SATA interface
E-SATA adapters, a PCI-E slot can expand to 4,8 or 16 SATA interfaces, so that separate unit test master
51 testable storage device of machine is up to more than 20.
In the above-mentioned technical solutions, control circuit board is used for the control signal for receiving test main frame 51 and completed to tested
The power supply of storage device, therefore the design of control circuit board is very crucial.Referring to Fig. 6, use provided by the invention is shown
The theory diagram of control circuit board in the Temperature Control Type test system of storage device, control circuit board include and the phase of test main frame 51
The power interface and communication interface of connection, the main control chip for testing and control, ON-OFF control circuit and multiple slave voltages
Interface, power interface provide power supply for accessing power supply for control circuit board；Communication interface is used to enter with test main frame 51
Row data communication receives the control signal of test main frame 51；Main control chip receives control signal and sends control according to the control signal
System instructs, a pair of the storage power interface 1 on ON-OFF control circuit control slave voltage interface and storage device test interface 21
Should, ON-OFF control circuit controls the energization and power-off of slave voltage interface according to control instruction, and then realizes to tested storage
The power on/off of equipment automatically controls.
In a preferred embodiment, main control chip is single-chip microcomputer, specially model PIC16F688 technical grade list
Piece machine.Communication interface is UART interface, and test main frame 51 is communicated according to the serial port communicating protocol of agreement, and receives control
Signal (bit information).
Due to the I/O port limited amount of single-chip microcomputer, in order to control multichannel to be tested the break-make electrical testing of storage device, switch
Control circuit includes the logic chip that multi-disc is sealed in and gone out, and main control chip is connected by internal data bus with ON-OFF control circuit
Connect.Preferably, the logic chip model 74HC595 technical grade chips for sealing in and going out.Single-chip microcomputer with SPI serial communication modes,
Bit information is issued into 74HC595 chips, serial control signal is converted to parallel control signal by 74HC595 chips, so as to realize
Multichannel slave voltage controls, and compensate for main control chip I/O port lazy weight.
In a preferred embodiment, ON-OFF control circuit also includes power protection chip, participates in Fig. 7, show this
The connection figure of the power protection chip in the control circuit board provided is invented, each slave voltage interface connects a piece of power protection
Chip.Preferably, power protection chip model TPS22980 technical grade chips.TPS22980 chips include an Enable Pin, electricity
Source input and power output end, wherein, power input is connected with storage power interface, power output end and slave voltage
Interface, Enable Pin are connected with 74HC595 chips, indirect controlled and main control chip.When Enable Pin is high level, power input
With power output end electrically conducting, now, slave voltage interface out-put supply signal provides power supply for tested storage device；Make
When energy end is low level, power input and power output end are in off state, now, slave voltage interface non-transformer signal
Output, it is off-position to be tested storage device.
In a preferred embodiment, unit of testing and controlling 2 also includes multiple gears being arranged in temperature control experiment cavity 1
Plate (does not show that) that baffle plate is used for fixed memory device test interface 21 and control circuit board in Fig. 2 and Fig. 3.Baffle plate is provided with
Storage device test interface 21 is set to expose the positive groove of baffle plate while provided with for fixed screw fixing hole, storage device survey
Mouth 21 of trying is the female seat with screw fixed bit, and storage device test interface 21 is fixed on into baffle plate by tightening screw.Equally,
The fixing hole for control circuit board to be fixed on to the baffle plate back side is additionally provided with baffle plate.
In a preferred embodiment, it is additionally provided with dividing plate 7 between temperature control experiment cavity 1 and test cavity 4.Dividing plate 7 rises
To heat-blocking action, ensure that the high and low temperature environment of temperature control experiment cavity 1 does not interfere with the normal work of test system 5 in test cavity 4
Make.
In a preferred embodiment, temperature control experiment cavity 1 is additionally provided with multiple on the inwall of test cavity 4 side
With the wire hole 8 that connect of test cavity 4, the wire hole 8 is for connecting test main frame 51 and the cable 9 of unit of testing and controlling 2
Cabling, in order to ensure thermal insulation and seal, the chi of the connecting line between wire hole 8 and test system 5 and unit of testing and controlling 2
It is very little to be adapted.
In a preferred embodiment, adiabatic clay is additionally provided with wire hole 8, adiabatic clay is used to close temperature control experiment
Space between cavity 1 and wire hole 8.Ensure that the high and low temperature environment of temperature control experiment cavity 1 does not interfere with to test in test cavity 4
The normal work of system 5.
In a preferred embodiment, in addition to normal temperature test section, normal temperature test section are arranged on the side door of test cavity 4
On, and it is provided with multiple storage device test interfaces 21 being connected with test system 5.So as to meet a variety of different tests
It is required that.
The high-low temperature test chamber of prior art, refrigerating/heating device 3 generally set the lower section for stating temperature control experiment cavity 1, but
Connect provided by the present invention for the temperature control experiment cavity 1 of the Temperature Control Type test system of storage device provided with more than 100 storage tests
Mouthful, if refrigerating/heating device 3 is arranged below, operation inconvenience will be operationally caused during layer storage test interface；Together
When storage device test interface 21 will become longer with the connecting line of test main frame 51, cause data-signal to decay, so as to influence to survey
The accuracy of test result.
In a preferred embodiment, for the wiring reduced between test main frame 51 and unit of testing and controlling 2 as far as possible
Length, ensure the normal transmission of data-signal.Test system 5 is set with temperature control experiment cavity 1 or so, more of test system 5
Test main frame 51 corresponds with the polylith unit of testing and controlling 2 in temperature control experiment cavity 1 and is substantially at the same horizontal position
On.
In a preferred embodiment, test system also includes the network switch, realizes the multiple computers of internal system
Networking centralized Control, while can also be used to be connected with remote control center, enable a system to networking extension.
The explanation of above example is only intended to help the method and its core concept for understanding the present invention.It should be pointed out that pair
For those skilled in the art, under the premise without departing from the principles of the invention, the present invention can also be carried out
Some improvement and modification, these are improved and modification is also fallen into the protection domain of the claims in the present invention.
The foregoing description of the disclosed embodiments, professional and technical personnel in the field are enable to realize or using the present invention.
A variety of modifications to these embodiments will be apparent for those skilled in the art, defined in the present invention
General Principle can realize in other embodiments without departing from the spirit or scope of the present invention.Therefore, this hair
Bright these embodiments being not intended to be limited to shown in the present invention, and be to fit to special with principles of this disclosure and novelty
The consistent most wide scope of point.
Claims (10)
1. a kind of Temperature Control Type test system for storage device, it is characterised in that including temperature control experiment cavity, be placed in the temperature
Control at least one piece of unit of testing and controlling in test cavity body, for producing high temperature or low temperature in the temperature control test cavity body
Refrigerating/heating device, the test cavity being disposed adjacent with the temperature control test cavity body and being placed in the test chamber body is used for
The test system of the refrigerating/heating device and the unit of testing and controlling is controlled, wherein,
The test system includes an at least test main frame, and the test main frame mainboard connects provided with multiple first data storages
Mouthful；
The unit of testing and controlling includes at least one storage device test interface for being connected with tested storage device
And control circuit board, the unit of testing and controlling are connected with the test main frame, for receiving the control of the test main frame
Signal, data-signal and power supply signal；The storage device test interface is fixed in the unit of testing and controlling, and its front is set
There is the standard interface to be fastened with tested storage device, its back side is directly provided with prolonging with the signal that the standard interface is connected
Long line, the part that the signal extended line other end is used to receive data-signal are provided with the second data storage interface, and described first
Connection is corresponded between data storage interface and the second data storage interface makes the storage device test interface and the survey
Examination main frame is directly connected to；The part for being used to receive power supply signal in the signal extended line other end is provided with storage power interface,
The storage power interface is connected with the control circuit board and is controlled by the control circuit board.
2. the Temperature Control Type test system according to claim 1 for storage device, it is characterised in that first storage
Data-interface is carried or by multiple PCI-E slots grafting data storage on the mainboard in itself by the test main frame mainboard
Interface Expanding card extends to obtain.
3. the Temperature Control Type test system according to claim 1 or 2 for storage device, it is characterised in that the refrigeration/
Heating combined equipment is arranged on the top of the temperature control experiment cavity.
4. the Temperature Control Type test system according to claim 3 for storage device, it is characterised in that the test system
Cavity or so is tested with the temperature control to set, it is more in more test main frames of the test system and the temperature control test cavity body
Block unit of testing and controlling is corresponded and is substantially in the same horizontal position.
5. the Temperature Control Type test system according to claim 4 for storage device, it is characterised in that the testing and control
Unit also includes multiple baffle plates, and the baffle plate is used to fix the storage device test interface and the control circuit board.
6. the Temperature Control Type test system according to claim 4 for storage device, it is characterised in that the temperature control experiment
Dividing plate is additionally provided between cavity and the test cavity.
7. the Temperature Control Type test system according to claim 4 for storage device, it is characterised in that the temperature control experiment
Cavity is additionally provided with multiple wire holes connected with the test cavity, the outlet on the inwall of the test cavity side
The size of connecting line between hole and the test system and the unit of testing and controlling is adapted.
8. the Temperature Control Type test system according to claim 7 for storage device, it is characterised in that in the wire hole
Be additionally provided with adiabatic clay, the adiabatic clay be used to closing the temperature control experiment cavity outconnector and the wire hole it
Between space.
9. the Temperature Control Type test system according to claim 4 for storage device, it is characterised in that also include with it is described
The normal temperature test section that test main frame is connected, the normal temperature test section are arranged on the side door of the test cavity, and provided with more
The individual storage device test interface being connected with the test system.
10. the Temperature Control Type test system according to claim 1 for storage device, it is characterised in that the storage is set
Standby test interface is one or several kinds of combinations in SATA interface, SAS interfaces, PCI-E interface or USB interface；Described first
Data storage interface or the second data storage interface are appointing in SATA interface, SAS interfaces, PCI-E interface or USB interface
It is a kind of；It is connected between the control circuit board and the test main frame by SATA, SAS, PCI-E, UART or usb data bus
Connect.
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| CN201510553296.4A CN105225699B (en) | 2015-09-01 | 2015-09-01 | A kind of Temperature Control Type test system for storage device |
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| CN1979198A (en) * | 2005-12-06 | 2007-06-13 | 鸿富锦精密工业（深圳）有限公司 | Detecting system and method for input/output board |
| CN101923505A (en) * | 2009-06-09 | 2010-12-22 | 英业达股份有限公司 | Test system and method of peripheral component interconnection rapid slot |
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| CN204904845U (en) * | 2015-09-01 | 2015-12-23 | 杭州华澜微电子股份有限公司 | A control by temperature change formula test system for storage device |
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|---|---|---|---|---|
| TWI273264B (en) * | 2005-06-22 | 2007-02-11 | Via Tech Inc | Test system and method |
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|---|---|---|---|---|
| CN1979198A (en) * | 2005-12-06 | 2007-06-13 | 鸿富锦精密工业（深圳）有限公司 | Detecting system and method for input/output board |
| CN101923505A (en) * | 2009-06-09 | 2010-12-22 | 英业达股份有限公司 | Test system and method of peripheral component interconnection rapid slot |
| CN102467431A (en) * | 2010-11-19 | 2012-05-23 | 鸿富锦精密工业（深圳）有限公司 | SATA interface test device and test method thereof |
| CN204904845U (en) * | 2015-09-01 | 2015-12-23 | 杭州华澜微电子股份有限公司 | A control by temperature change formula test system for storage device |
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