CN207397720U - A kind of test box and test system - Google Patents
A kind of test box and test system Download PDFInfo
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- CN207397720U CN207397720U CN201721682817.7U CN201721682817U CN207397720U CN 207397720 U CN207397720 U CN 207397720U CN 201721682817 U CN201721682817 U CN 201721682817U CN 207397720 U CN207397720 U CN 207397720U
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- babinet
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- state disk
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Abstract
The utility model embodiment, which discloses a kind of test box and test system, wherein test box, to be included：Babinet, connection unit and controller, babinet is interior to be equipped with temperature detecting unit and heating unit；Connection unit is arranged in babinet, for being connected respectively with host computer and solid state disk to be measured, solid state disk to be measured is connected at host computer and is tested；Controller is connected respectively with temperature detecting unit and heating unit.The working condition of heating unit is controlled, it can be achieved that intending real use environment in cabinet in cabinet inner module by setting heating unit and temperature detecting unit in babinet, and by controller；Further, solid state disk to be measured can be connected at host computer by being arranged on the in vivo connection unit of case and tested, thus the test of solid state disk to be measured can carry out in the ambient chassis of simulation, the environment of test is more in line with the normal use environment of solid state disk, so as to improve the accuracy to solid state disk to be measured test.
Description
Technical field
The utility model is related to test equipment technical field more particularly to a kind of test box and test systems.
Background technology
Solid state disk (Solid State Drives) referred to as consolidates disk, and is made with solid-state electronic storage chip array
Into hard disk, be made of control unit and storage unit (FLASH chip, dram chip).
Solid state disk needs to carry out a series of test before listing of dispatching from the factory, wherein being tested there are one test for Boing
(readwrite tests).Solid state disk is is connected by specific process with host computer (computer), the prolonged read-write process of simulation, with
Detect the performance of solid state disk.
At present, the Boing tests of solid state disk using being tested at normal temperatures, however solid state disk really makes
During, the temperature of local environment (in computer housing) is but often higher than room temperature, therefore is carried out using existing method
Boing tests can not simulate the true use environment of solid state disk, the result for causing test is inaccurate.
Utility model content
The utility model embodiment proposes a kind of test box and test system, to improve solid state disk Boing tests
Accuracy.
On the one hand, the utility model embodiment proposes a kind of test box, including：
Babinet, the babinet is interior to be equipped with temperature detecting unit and heating unit；
Connection unit, the connection unit be arranged on the babinet in, the connection unit for respectively with host computer and
Solid state disk connection to be measured, is connected to the host computer to test by the solid state disk to be measured；And
Controller is connected respectively with the temperature detecting unit and the heating unit, for being examined according to the temperature
The testing result of unit is surveyed to control the working condition of the heating unit.
Its further technical solution is that the connection unit includes：Pinboard, the pinboard include a bottom plate and
At least one solid state disk card slot on the bottom plate.
Its further technical solution is to further include：Supporting rack, support frame as described above are fixed in the babinet；It is described
At least provided with a pinboard on supporting rack.
Its further technical solution is that the test box includes multiple support frames as described above, and multiple support frames as described above are mutual
It is arranged in parallel.
Its further technical solution is to be formed with outlet hole on the babinet, with so that the connection unit is to described
The outer extraction wire of babinet.
Its further technical solution is that the temperature detecting unit is temp probe.
Its further technical solution is that the heating unit is heater strip.
Its further technical solution is that the controller is programmable logic controller (PLC).
On the other hand, the utility model embodiment proposes a kind of test system, including：
Host computer；And
Test box, the test box include：
Babinet；Temperature detecting unit and heating unit are equipped in the babinet；
Connection unit；The connection unit be arranged on the babinet in, the connection unit is connected with host computer, and be used for
Solid state disk connection to be measured, is connected to the host computer to test by the solid state disk to be measured；And
Controller；It is connected respectively with the temperature detecting unit and the heating unit, for being examined according to the temperature
The testing result of unit is surveyed to control the working condition of the heating unit.
Its further technical solution is to further include display device, and the display device is connected with the host computer.
By the technical solution of application the utility model embodiment, heating unit and temperature detection are set in babinet
Unit, and the working condition of heating unit is controlled, it can be achieved that intending real use environment in cabinet in cabinet inner module by controller；
Further, solid state disk to be measured can be connected at host computer by being arranged on the in vivo connection unit of case and tested, by
The test of this solid state disk to be measured can carry out in the ambient chassis of simulation, and it is normal that the environment of test is more in line with solid state disk
Use environment, so as to improve the accuracy to solid state disk to be measured test.
Description of the drawings
In order to illustrate more clearly of the utility model embodiment technical solution, make required in being described below to embodiment
Attached drawing is briefly described, it should be apparent that, the accompanying drawings in the following description is some embodiments of the utility model, for
For those of ordinary skill in the art, without creative efforts, other are can also be obtained according to these attached drawings
Attached drawing.
Fig. 1 is a kind of structure diagram for test box that the utility model embodiment provides；
Fig. 2 is a kind of another structure diagram for test box that the utility model embodiment provides；
Fig. 3 is the structure diagram of pinboard in Fig. 1；
Fig. 4 is a kind of schematic block diagram for test box that the utility model embodiment provides；And
Fig. 5 is a kind of schematic block diagram for test system that the utility model embodiment provides.
Reference numeral
1st, babinet；2nd, supporting rack；3rd, pinboard；4th, temperature detecting unit；5th, heating unit；6th, controller；7 outlet holes；
10th, test box；20th, host computer；30th, display device；31st, solid state disk card slot；32nd, bottom plate.
Specific embodiment
The following is a combination of the drawings in the embodiments of the present utility model, the technical solution in embodiment is carried out clear, complete
Ground describes, and similar reference numerals represent similar component in attached drawing.Obviously, will be described below embodiment is only this practicality
New part of the embodiment, instead of all the embodiments.Based on the embodiment in the utility model, ordinary skill people
Member's all other embodiments obtained without creative efforts belong to the model of the utility model protection
It encloses.
It should be appreciated that ought use in this specification and in the appended claims, term " comprising " and "comprising" instruction
Described feature, entirety, step, operation, the presence of element and/or component, but it is not precluded from one or more of the other feature, whole
Body, step, operation, element, component and/or its presence or addition gathered.
It is it is also understood that specific merely for the sake of describing in this utility model embodiment term used in the description
The purpose of embodiment and be not intended to limit the utility model embodiment.Such as in the utility model embodiment specification and appended power
As used in sharp claim, other situations unless the context is clearly specified, otherwise " one " of singulative, "one"
And "the" is intended to include plural form.
Referring to Fig. 1 and Fig. 4, a kind of test box 10 of the utility model embodiment proposition, as shown in the figure, the test box 10 wraps
Babinet 1, connection unit and controller 6 are included, each component is described below：
Babinet 1, internal is the region for carrying out solid state disk test.In order to simulate real ambient chassis, improve and survey
The accuracy of examination in the utility model embodiment, sets heating unit 5 in the inside of babinet 1, can be carried by heating unit 5
Temperature in high babinet 1, to simulate the hot environment in cabinet.Meanwhile it for the temperature in monitoring box body 1, is set in babinet 1
Temperature detecting unit 4 is put, temperature detecting unit 4 can detect the temperature in babinet 1, user is facilitated to understand in real time in babinet 1 in real time
Temperature.
Controller 6, controller 6 are connected respectively with heating unit 5 and temperature detecting unit 4, for according to the temperature
The testing result of detection unit controls the heating unit.Controller 6 is the control core of test box 10, plays control heating
The effect of the working condition of unit 5.Specifically, user sets target temperature on controller 6 in advance, and controller 6 is real-time afterwards
The temperature that temperature detecting unit 4 detects is obtained, when the temperature got is less than target temperature, the control heating of controller 6 is single
Member 5 works, to promote the temperature in babinet 1；When the temperature got is more than or equal to target temperature, controller 6 controls
Heating unit 5 is stopped, and is target temperature so as to maintain the temperature of babinet 1.It should be noted that setting target temperature
Purpose is the true environment of the simulation cabinet in babinet 1, and target temperature is usually set to 50~80 DEG C.
Connection unit, connection unit be arranged on babinet 1 in, connection unit for respectively with host computer and solid state disk to be measured
Connection, solid state disk to be measured is connected at host computer and is tested.It should be noted that the test to solid state disk to be measured
It needs solid state disk to be measured being connected with host computer, however in practical operation, it is not easy to host computer being put into babinet 1, is
This, sets connection unit in babinet 1, and in test, connection unit is connected simultaneously with host computer and solid state disk.Pass through company
Order member, solid state disk can be normally linked into host computer, and complete the process of test.
By the technical solution of application the present embodiment, heating unit 5 and temperature detecting unit 4 are set in babinet 1,
And the working condition of heating unit 5 is controlled, it can be achieved that simulating real use environment in cabinet in babinet 1 by controller 6；Into
One step, solid state disk to be measured can be connected at host computer and tested by the connection unit being arranged in babinet 1, thus
The test of solid state disk to be measured can carry out in the ambient chassis of simulation, and the environment of test, which is more in line with solid state disk, normally to be made
With environment, so as to improve the accuracy to solid state disk to be measured test.
Referring to Fig. 1 and with reference to Fig. 3, in some embodiments, such as the present embodiment, connection unit includes pinboard 3, switching
Plate 3 is used to be connected with host computer.Pinboard 3 includes a bottom plate 32 and multiple solid state disk card slots 31 on bottom plate 32.
Or in other embodiments, an individual solid state disk card slot 31 is set on bottom plate 32.It is set on bottom plate 32 multiple solid
State hard disk card slot 31 so that the test of multiple solid state disks can be carried out at the same time, improve the efficiency of test.
Further, multiple solid state disk card slots 31 are uniformly distributed on bottom plate 32, beneficial to the uniform of temperature.
It should be noted that when pinboard 3 is connected with host computer, by solid state disk to be measured insertion solid state disk card slot 31
Afterwards, you can solid state disk to be measured is connected to host computer, and then the process that can be tested.
Further, pinboard 3 is PCB adapter board 3.
Further, test box 10 further includes supporting rack 2, and supporting rack 2 is fixed in babinet 1.Supporting rack 2 is equipped with more
A pinboard 3.Or in other embodiments, a pinboard 3 is separately provided on supporting rack 2.By setting support in babinet 1
Frame 2 places pinboard 3.Pinboard 3 is fixedly connected with supporting rack 2, such as is connected by fastener.
Further, test box 10 includes multiple supporting racks 2, and multiple supporting racks 2 are arranged in parallel.Supporting rack 2 is mutual
It is arranged in parallel, is conducive to the uniform of heat in babinet 1.
Further, the spacing between supporting rack 2 is identical.
Referring to Fig. 2, in some embodiments, such as the present embodiment, outlet hole 7 is formed on babinet 1, with for connection
Unit is to 1 outer extraction wire of babinet.Connection unit needs are connected with the host computer outside babinet 1, so as to set outlet on babinet 1
Hole 7, the conducting wire that connection unit is drawn are connected to through outlet hole 7 at host computer.
In some embodiments, such as the present embodiment, temperature detecting unit 4 is specially temp probe.Temp probe can be examined
Temperature in measuring tank body 1, and by testing result real-time Transmission to controller 6.
Further, heating unit 5 is heater strip, and heater strip is connected with controller 6, and is heated in controller 6.
Further, controller 6 is programmable logic controller (PLC), is commonly called as PLC controller.Controller 6 is to the behaviour of each device
Control process can be by carrying out configuration realization to controller 6, and the configuration process of controller 6 is well known to those skilled in the art, right
This is repeated no more.
Referring to Fig. 5 and Fig. 1 and Fig. 4 is combined, the utility model embodiment proposes a kind of test system, including host computer
20 and test box 10.
Host computer 20, arranged on the outside of test box 10, convenient for optimization and upgrading of the user to the test system of host computer 20.With
Family can carry out the operation (software upgrading or hardware replacement) of test system optimization upgrading outside test box 10, improve user behaviour
The convenience of work.
Test box 10 includes：Babinet 1, connection unit and controller 6.
Babinet 1, internal is the region for carrying out solid state disk test.In order to simulate real ambient chassis, improve and survey
The accuracy of examination in the utility model embodiment, sets heating unit 5 in the inside of babinet 1, can be carried by heating unit 5
Temperature in high babinet 1, to simulate the hot environment in cabinet.Meanwhile it for the temperature in monitoring box body 1, is set in babinet 1
Temperature detecting unit 4 is put, temperature detecting unit 4 can detect the temperature in babinet 1, user is facilitated to understand in real time in babinet 1 in real time
Temperature.
Controller 6, controller 6 is is connected with heating unit 5 and temperature detecting unit 4 respectively, for according to the temperature
The testing result of detection unit is spent to control the heating unit.Controller 6 is the control core of test box 10, plays control and adds
The effect of the working condition of hot cell 5.Specifically, user sets target temperature on controller 6 in advance, and controller 6 is real afterwards
When obtain the temperature that detects of temperature detecting unit 4, when the temperature got is less than target temperature, the control heating of controller 6
Unit 5 works, to promote the temperature in babinet 1；It is being more than or equal to target when the temperature got is less than target temperature
During temperature, controller 6 controls heating unit 5 to be stopped, and is target temperature so as to maintain the temperature of babinet 1.It needs to illustrate
, the purpose of target temperature is set as the true environment of the simulation cabinet in babinet 1, and target temperature is usually set to 50~80
℃。
Connection unit；Connection unit is arranged in babinet 1, and connection unit is connected with host computer 20, and is used for and solid-state to be measured
Hard disk connects, and solid state disk to be measured is connected at host computer 20 and is tested.It should be noted that solid state disk to be measured
Test need solid state disk to be measured being connected with host computer 20, however in practical operation, be not easy to host computer 20 being put into
In babinet 1, for this purpose, setting connection unit in babinet 1, in test, connection unit is hard with host computer 20 and solid-state simultaneously
Disk connects.By connection unit, solid state disk can be normally linked into host computer 20, and completes the process of test.
By the technical solution of application the present embodiment, heating unit 5 and temperature detecting unit 4 are set in babinet 1,
And the working condition of heating unit 5 is controlled, it can be achieved that simulating real use environment in cabinet in babinet 1 by controller 6；Into
One step, solid state disk to be measured can be connected at host computer 20 and tested by the connection unit being arranged in babinet 1, by
The test of this solid state disk to be measured can carry out in the ambient chassis of simulation, and it is normal that the environment of test is more in line with solid state disk
Use environment, so as to improve the accuracy to solid state disk to be measured test.
Referring to Fig. 5, in some embodiments, such as the present embodiment, test system further includes display device 30, display device
30 are connected with host computer 20.The result that display device 30 is tested for display.
In some embodiments, such as the present embodiment, host computer 20 be computer, test of the host computer 20 to solid state disk
Process can realize that the test software is well known to those skilled in the art, to this no longer by the test software on host computer 20
It repeats.
In the above-described embodiments, all emphasize particularly on different fields to the description of each embodiment, be not described in some embodiment
Part, may refer to the associated description of other embodiment.
Obviously, those skilled in the art can carry out the utility model various modification and variations without departing from this practicality
New spirit and scope.In this way, these modifications and variations of even the utility model belong to the utility model claims and
Within the scope of its equivalent technologies, then the utility model is also intended to comprising including these modification and variations.
The above is specific embodiment of the present utility model, but the scope of protection of the utility model is not limited to
This, in the technical scope that any one skilled in the art discloses in the utility model, can readily occur in various etc.
The modifications or substitutions of effect, these modifications or substitutions should be covered within the scope of the utility model.Therefore, this practicality is new
The protection domain of type should be subject to the protection scope in claims.
Claims (10)
1. a kind of test box, which is characterized in that including：
Babinet, the babinet is interior to be equipped with temperature detecting unit and heating unit；
Connection unit, the connection unit are arranged in the babinet, the connection unit for respectively with host computer and to be measured
Solid state disk connects, and the solid state disk to be measured is connected to the host computer to test；And
Controller is connected respectively with the temperature detecting unit and the heating unit, for according to the temperature detection list
The testing result of member controls the working condition of the heating unit.
2. test box according to claim 1, which is characterized in that the connection unit includes：Pinboard, the pinboard
Solid state disk card slot including a bottom plate and on the bottom plate.
3. test box according to claim 2, which is characterized in that further include：Supporting rack, support frame as described above are fixed at institute
It states in babinet；At least provided with a pinboard on support frame as described above.
4. test box according to claim 3, it is characterised in that：The test box includes multiple support frames as described above, multiple
Support frame as described above is arranged in parallel.
5. test box according to claim 1, it is characterised in that：Outlet hole is formed on the babinet, with for described
Connection unit extraction wire outside the babinet.
6. test box according to claim 1, it is characterised in that：The temperature detecting unit is temp probe.
7. test box according to claim 1, it is characterised in that：The heating unit is heater strip.
8. test box according to claim 1, it is characterised in that：The controller is programmable logic controller (PLC).
9. a kind of test system, which is characterized in that including：
Host computer；And
Test box, the test box include：
Babinet；Temperature detecting unit and heating unit are equipped in the babinet；
Connection unit；The connection unit be arranged on the babinet in, the connection unit is connected with host computer, and be used for it is to be measured
Solid state disk connects, and the solid state disk to be measured is connected to the host computer to test；And
Controller；It is connected respectively with the temperature detecting unit and the heating unit, for according to the temperature detection list
The testing result of member controls the working condition of the heating unit.
10. test system according to claim 9, which is characterized in that further include display device, the display device and institute
State host computer connection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721682817.7U CN207397720U (en) | 2017-12-06 | 2017-12-06 | A kind of test box and test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721682817.7U CN207397720U (en) | 2017-12-06 | 2017-12-06 | A kind of test box and test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207397720U true CN207397720U (en) | 2018-05-22 |
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ID=62324167
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721682817.7U Active CN207397720U (en) | 2017-12-06 | 2017-12-06 | A kind of test box and test system |
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| Country | Link |
|---|---|
| CN (1) | CN207397720U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021018201A1 (en) * | 2019-07-30 | 2021-02-04 | 华为技术有限公司 | Testing fixture |
| CN113405755A (en) * | 2021-08-20 | 2021-09-17 | 深圳泰思特半导体有限公司 | High-precision test system of solid state disk |
-
2017
- 2017-12-06 CN CN201721682817.7U patent/CN207397720U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021018201A1 (en) * | 2019-07-30 | 2021-02-04 | 华为技术有限公司 | Testing fixture |
| CN113405755A (en) * | 2021-08-20 | 2021-09-17 | 深圳泰思特半导体有限公司 | High-precision test system of solid state disk |
| CN113405755B (en) * | 2021-08-20 | 2021-11-16 | 深圳泰思特半导体有限公司 | High-precision test system of solid state disk |
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