CN105195439A - Precision measuring machine for small chips - Google Patents
Precision measuring machine for small chips Download PDFInfo
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- CN105195439A CN105195439A CN201510621203.7A CN201510621203A CN105195439A CN 105195439 A CN105195439 A CN 105195439A CN 201510621203 A CN201510621203 A CN 201510621203A CN 105195439 A CN105195439 A CN 105195439A
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Abstract
The invention relates to a precision measuring machine for small chips and belongs to the technical field of electronic temperature-measuring device testing. The precision measuring machine comprises a testing control circuit and a rotary testing disc arranged on a machine body obliquely, a moon-shaped plate forming a chip receiver is mounted on the lower portion of the testing disc, and the testing disc is provided with chip accommodating holes distributed circumferentially and uniformly. Chip accommodating segments capable of accommodating the small chips are arranged in the fronts of the chip accommodating holes, and ventilation segments with the hole diameter smaller than those of the chip accommodating segments are arranged at the bottoms of the chip accommodating holes. A testing arm is mounted on one side of the testing disc, and a probe with a testing head mounted at the tip is arranged at the end of the testing arm. A discharge seat is fixed in front of the upper portion of the testing disc and is provided with graded discharge holes corresponding to the chip accommodating holes in position, blowing holes corresponding to the discharge holes in position are mounted behind the testing disc, guide pipes leading to a graded chip collection bin are mounted in front of the discharge holes, and the testing head is connected with a controlled end of each blowing nozzle control valve through a testing control circuit. The precision measuring machine for the small chips has the advantages that testing efficiency is improved greatly, testing precision is guaranteed beneficially and chip pass rate is increased.
Description
Technical field
The present invention relates to a kind of checkout equipment of temperature sensor, especially a kind of little chip accurate measurement machine, belongs to electronic temperature measurement device technical field of measurement and test.
Background technology
The temperature-sensitive chip that area is less than 0.5x0.5mm is the core component of various temperature measuring type electronic product, and manufacture process needs under 25 DEG C ± 0.5 DEG C condition, carry out accurate resistance and measures sorting.This resistance stepping test experienced by the process of manual test, semi-automatic test and full-automatic testing.Wherein full-automatic testing records the stepping parameter of chip by the senser element of test control circuit, relends and helps manipulator to be discharged in corresponding container by chip according to stepping parameter.
The automatic sorting test exemplary apparatus of prior art is application number 201110268725.5, disclosed in the Chinese patent of title " automatic sorting instrument for resistance chip ", this automatic sorting instrument comprises support and testing circuit, the platform of support is equipped with the dish type feed mechanism be made up of rotation vibration feeding disc and tangential blow tank, the outlet positioned beneath of blow tank is by the flat Moving parameter mechanism sending guide rail to form of V-arrangement splicing groove and docking, putting down send the bottom land of the upper surface of guide rail and V-arrangement splicing groove to have the continuous vertical guide groove matched with resistance chip thickness, the flat guide rail port of export that send of Moving parameter mechanism settles the clamping testing agency be positioned on support, clamping testing agency is made up of lifter plate and a pair clamp detection contact being placed in level deciliter movement on lifter plate, and the signal output part of clamp detection contact connects the signal input part of testing circuit.Although the contact that this automatic sorting instrument achieves small temperature-sensitive chip detects sorting automatically, compared with semiautomatic equipment, efficiency improves greatly.But along with the development of science and technology and the continuous increase of temperature-sensitive chip output, show following weak point gradually: 1) owing to adopting monolithic clamping test, therefore production efficiency is subject to a definite limitation, is difficult to meet mass production needs; 2) chip electrode face subject to damage when shaking translation and moving, affects resistance accuracy of detection and the product percent of pass (often only having about 70%) of chip, constrains the wilderness demand meeting market further.
Summary of the invention
The object of the invention is to: the weak point existed for above-mentioned prior art, propose a kind of under guarantee measuring accuracy prerequisite, the little chip accurate measurement machine of efficiency and chip detection quality can be significantly improved further.
In order to reach above object, little chip accurate measurement machine basic technical scheme of the present invention is: comprise test control circuit, also comprise tilting rotary test dish on fuselage, the moon-shaped plate forming splicing pond is equipped with in the bottom of described test panel, and described test panel has the materials-containing hole of circumference uniform distribution; The front portion of described materials-containing hole is the appearance material section can holding little chip, and bottom is that aperture is less than the ventilation section holding material section; Described test panel while be equipped with test arm, the end of described test arm has the chaining pin of most advanced and sophisticated installation testing head; Fixing discharge seat on front side of the top of described test panel, described discharge seat has stepping tap that can be corresponding with materials-containing hole position, the rear side of described test panel is equipped with the blowing nozzle of the corresponding described tap of position difference, and the front side of described tap is equipped with the passage towards stepping collecting bin respectively; Described measuring head connects the controlled end of each blowing nozzle on-off valve respectively by test control circuit.
During work, test panel, in driven by motor rotary course, makes materials-containing hole receive the chip to be tested in splicing pond one by one and be with it to rotate, and when through chaining pin, the stepping parameter of chip is recorded; When this chip continues to rotate to corresponding stepping tap correspondence position with test panel, the controlled unlatching of control valve of corresponding blowing nozzle, so this chip transports to corresponding stepping collecting bin after being blown into passage.The materials-containing hole soared afterwards enters splicing pond again, readmits chip to be tested.
Compared with prior art, the rotation of test panel of the present invention achieves follow-on test piecewise, and therefore efficiency improves greatly, can meet mass-produced test needs, and the rotation of chip is carried not only steadily reliably, is convenient to control, and is conducive to ensureing measuring accuracy; Simultaneously and air-blowing discharge all can not produce mechanical damage to chip, improve chip yield.
The present invention further improves, the rotating shaft of described test panel is coaxially connected with the rotating shaft of servomotor by shaft coupling, the rotating shaft rear end of described servomotor is connected grating disc, the alignment sensor of perception grating disc transposition is equipped with in described servomotor side, described alignment sensor connects detectable signal input corresponding to test control circuit, the controlled end of the transposition control output servomotor of described test control circuit.Can realize the test that pauses instantaneously like this, thus test result more accurately and reliably.
It is that described test arm is placed on the test bench of test panel that the present invention further improves; Described test bench is fixed on fuselage, and lifting driving cylinder is housed; Described test arm forms lifting moving pair by the perforation of self with the guide pillar be arranged on test bench, and drives the piston rod of cylinder to be connected with lifting; The elevating control of described test control circuit exports the controlled end that termination lifting drives cylinder.Can engaged test be realized like this, guarantee the accurately reliable of test result.
Accompanying drawing explanation
Below in conjunction with accompanying drawing, the present invention is further illustrated.
Fig. 1 is the complete machine perspective view (remove and discharge seat) of the embodiment of the present invention one.
Fig. 2 is test panel in Fig. 1 embodiment, the perspective view of discharging seat, mechanism for testing part.
Fig. 3 is the structural representation of test panel in Fig. 1 embodiment.
Fig. 4 is the perspective view of test panel and mechanism for testing in Fig. 1 embodiment.
Fig. 5 is the perspective view of driving mechanism on rear side of test panel in Fig. 1 embodiment.
Fig. 6 is the perspective view of code-disc part in Fig. 1 embodiment.
Detailed description of the invention
Embodiment one
The little chip accurate measurement machine basic structure of the present embodiment as shown in Figure 1, comprises the PLC test control circuit be arranged in fuselage 1 top controller 2, tilting rotatable test panel 3 on front side of the middle part of fuselage 1.The loading hopper 5 being fixed on controller 2 side is equipped with in the top of test panel 3, and the transparent moon-shaped plate 4 forming splicing pond is equipped with in test panel 3 bottom, is therefore convenient to reinforced observation.1-1 in Fig. 1 is the position in storehouse door collecting the little chipset feed bin of stepping respectively.
Test panel 3, see Fig. 3, has the materials-containing hole 3-1 of circumference uniform distribution.The stepped hole that the ventilation section that each materials-containing hole is anterior the appearance material section and bottom of holding little chip to be measured is formed, hold the internal diameter of material section and the envelope circular diameter adaptation of little chip, therefore can hold little chip, the internal diameter of ventilation section is less than and holds material section, because which form the step blocking little chip.
As shown in Figure 2, Figure 4 shows, test panel 3 the test arm 7 be placed on test bench 6 is housed, test bench 6 is fixed on fuselage, be equipped with lifting drive cylinder.The end of test arm 7 has the chaining pin 12 of most advanced and sophisticated installation testing head, and the position of chaining pin 12 is relative with the materials-containing hole 3-1 on test panel 3.Test arm 7 forms lifting moving pair by the perforation of self with the guide pillar 13 be arranged on test bench, and drive the piston rod of cylinder 14 to be connected with lifting, therefore test arm 7 can, under lifting drives the driving of cylinder 14, drive chaining pin 12 close to or away from the materials-containing hole 3-1 of test panel 3.
As shown in Figure 2, fixingly on front side of the top of test panel 3 discharge seat 9, this discharge seat 9 has can be corresponding with materials-containing hole 3-1 position four stepping tap 9-1.The rear side of test panel 3 is equipped with the blowing nozzle of the corresponding each tap 9-1 of position difference, and each blowing nozzle is controlled by respective on-off valve (not shown) respectively.The front side of each tap 9-1 is equipped with the passage 11 towards stepping collecting bin 8 respectively.
In order to guarantee measuring accuracy further, the little chip accurate measurement facility of the present embodiment have instant static to test and off-position closed loop control function.As shown in Figure 5 and Figure 6, the rotating shaft 3-2 of test panel 3 is coaxially connected by the rotating shaft of shaft coupling 10 with servomotor 15, and the rotating shaft rear end of servomotor 15 is connected grating disc 16, and servomotor 15 side is equipped with can the alignment sensor 17 of perception grating disc 16 transposition.
The measuring head of chaining pin 12 and alignment sensor 17 connect detectable signal input corresponding to test control circuit respectively, the controlled end that the corresponding control output end of test control circuit connects the on-off valve controlled end of each blowing nozzle respectively, lifting drives cylinder controlled end and servomotor 15, therefore can accurate assignment test also stepping accurately and reliably.
During test, little chip to be measured is fallen in splicing pond from loading hopper, when the test panel tilted rotates, the drive little chip of a slice fallen in it goes to below the chaining pin of test arm by each materials-containing hole, alignment sensor after tested control circuit control servomotor accurately suspends, lifting drives the controlled chaining pin that orders about of cylinder to decline and touch little chip testing face and record return after its stepping parameter, open its on-off valve when servomotor arrives corresponding blowing nozzle according to this little chip of stepping state modulator, had by this little chip passage to blow in the stepping collecting bin of correspondence.
Experiment shows, the present embodiment has following remarkable advantage:
1) driven by servomotor test panel, rotate flexibly, closed-loop control is located, reliably accurately;
2) chip enters the blanking storehouse of inclining test dish automatically, simple and ingenious structure;
3) cylinder controls chaining pin, can ensure to contact well with little chip, test accurately;
4) precise positioning combines with reliable measurements, and test panel rotation process continuance test, ensure that and efficiently, accurately test;
5) the automatic stepping of air-blowing, avoids mechanical damage, and product percent of pass can reach more than 90%.
In addition to the implementation, the present invention can also have other embodiments.All employings are equal to the technical scheme of replacement or equivalent transformation formation, all drop on the protection domain of application claims.
Claims (4)
1. a little chip accurate measurement machine, comprises test control circuit, it is characterized in that: also comprise tilting rotary test dish on fuselage, and the moon-shaped plate forming splicing pond is equipped with in the bottom of described test panel, and described test panel has the materials-containing hole of circumference uniform distribution; The front portion of described materials-containing hole is the appearance material section can holding little chip, and bottom is that aperture is less than the ventilation section holding material section; Described test panel while be equipped with test arm, the end of described test arm has the chaining pin of most advanced and sophisticated installation testing head; Fixing discharge seat on front side of the top of described test panel, described discharge seat has stepping tap that can be corresponding with materials-containing hole position, the rear side of described test panel is equipped with the blowing nozzle of the corresponding described tap of position difference, and the front side of described tap is equipped with the passage towards stepping collecting bin respectively; Described measuring head connects the controlled end of each blowing nozzle control valve respectively by test control circuit.
2. little chip accurate measurement machine according to claim 1, it is characterized in that: the rotating shaft of described test panel is coaxially connected with the rotating shaft of servomotor by shaft coupling, the rotating shaft rear end of described servomotor is connected grating disc, the alignment sensor of perception grating disc transposition is equipped with in described servomotor side, described alignment sensor connects detectable signal input corresponding to test control circuit, the controlled end of the transposition control output servomotor of described test control circuit.
3. little chip accurate measurement machine according to claim 2, is characterized in that: described test arm is placed on the test bench of test panel; Described test bench is fixed on fuselage, and lifting driving cylinder is housed; Described test arm forms lifting moving pair by the perforation of self with the guide pillar be arranged on test bench, and drives the piston rod of cylinder to be connected with lifting; The elevating control of described test control circuit exports the controlled end that termination lifting drives cylinder.
4. little chip accurate measurement machine according to claim 3, is characterized in that: described moon-shaped plate transparent material is made.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510621203.7A CN105195439A (en) | 2015-09-25 | 2015-09-25 | Precision measuring machine for small chips |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510621203.7A CN105195439A (en) | 2015-09-25 | 2015-09-25 | Precision measuring machine for small chips |
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| CN105195439A true CN105195439A (en) | 2015-12-30 |
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| CN201510621203.7A Pending CN105195439A (en) | 2015-09-25 | 2015-09-25 | Precision measuring machine for small chips |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105798979A (en) * | 2016-04-25 | 2016-07-27 | 安徽安美半导体有限公司 | Novel rib cutting machine |
| CN106623007A (en) * | 2016-11-17 | 2017-05-10 | 南阳理工学院 | Automatic photoresistor testing and sorting machine |
| CN111948513A (en) * | 2020-07-24 | 2020-11-17 | 武汉锐科光纤激光技术股份有限公司 | Chip temperature control equipment |
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| CN104084382A (en) * | 2014-07-16 | 2014-10-08 | 苏州迪纳精密设备有限公司 | Parallel test sorting equipment of rotating disc type microphone |
| CN104741326A (en) * | 2015-04-14 | 2015-07-01 | 东莞市台工电子机械科技有限公司 | Fully automatic SMD LED disc-type spectrophotometer and operating method thereof |
| CN205020421U (en) * | 2015-09-25 | 2016-02-10 | 南京时恒电子科技有限公司 | Little chip precision measurement machine |
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2015
- 2015-09-25 CN CN201510621203.7A patent/CN105195439A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06190344A (en) * | 1992-10-31 | 1994-07-12 | Taiyo Yuden Co Ltd | Carrying and discharging device for cylindrical part |
| CN1320063A (en) * | 1999-06-25 | 2001-10-31 | 电子科学工业公司 | Electronic compound handle |
| CN101823056A (en) * | 2010-04-09 | 2010-09-08 | 福建省德传电子科技有限公司 | Full-automatic microphone testing machine |
| CN103149227A (en) * | 2013-03-15 | 2013-06-12 | 中国工程物理研究院机械制造工艺研究所 | Precise main body movement device for high-resolution powder diffractometer |
| CN104084382A (en) * | 2014-07-16 | 2014-10-08 | 苏州迪纳精密设备有限公司 | Parallel test sorting equipment of rotating disc type microphone |
| CN104741326A (en) * | 2015-04-14 | 2015-07-01 | 东莞市台工电子机械科技有限公司 | Fully automatic SMD LED disc-type spectrophotometer and operating method thereof |
| CN205020421U (en) * | 2015-09-25 | 2016-02-10 | 南京时恒电子科技有限公司 | Little chip precision measurement machine |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105798979A (en) * | 2016-04-25 | 2016-07-27 | 安徽安美半导体有限公司 | Novel rib cutting machine |
| CN106623007A (en) * | 2016-11-17 | 2017-05-10 | 南阳理工学院 | Automatic photoresistor testing and sorting machine |
| CN106623007B (en) * | 2016-11-17 | 2020-08-11 | 南阳理工学院 | Automatic photosensitive resistance test sorting machine |
| CN111948513A (en) * | 2020-07-24 | 2020-11-17 | 武汉锐科光纤激光技术股份有限公司 | Chip temperature control equipment |
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Application publication date: 20151230 |